This hardware specification contains detailed informatio n on
power considerations, DC/AC electrical characteristics, and AC
timing specifications for the MPC875/MPC870. The CPU on the
MPC875/MPC870 is a 32-bit PowerPC™ core that incorporates
memory management units (MMUs) and instruction and data
caches and that implements the PowerPC instruction set. This
hardware specification covers the following topics:
1Overview
The MPC875/MPC870 is a versatile single-chip integrated
microprocessor and peripheral combination that can be used in a
variety of controller applications and communications and
networking systems. The MPC875/MPC870 provides enhanced
ATM functionality over that of other ATM-enabled members of
the MPC860 family.
The MPC875/870 is comprised of three modules that each use the 32-bit internal bus: a MPC8xx core, a system
integration unit (SIU), and a communications processor module (CPM).
The following list summarizes the key MPC875/870 features:
•Embedded MPC8xx core up to 133 MHz
•Maximum frequency operation of the external bus is 80 MHz (in 1:1 mode)
— The 133-MHz core frequency supports 2:1 mode only.
— The 66-/80-MHz core frequencies support both the 1:1 and 2:1 modes.
•Single-issue, 32-bit core (compatible with the PowerPC architecture definition) with thirty-two 32-bit
general-purpose registers (GPRs)
— The core performs branch prediction with conditional prefetch and without conditional execution.
— 8-Kbyte data cache and 8-Kbyte instruction cache (see Table 1)
– Instruction cache is two-way, set-associative with 256 sets in 2 blocks
– Data cache is two-way, set-associative with 256 sets
– Cache coherency for both instruction and data caches is maintained on 128-bit (4-word) cache
blocks.
– Caches are physi cally addresse d, implement a leas t recentl y used (LRU) repl acement algori thm, and
are lockable on a cache block basis.
— MMUs with 32-entry TLB, fully associative instruction and data TLBs
— MMUs support multiple page sizes of 4, 16, and 512 Kbytes, and 8 Mbytes; 16 virtual address spaces
and 16 protection groups
— Advanced on-chip emulation debug mode
•Up to 32-bit data bus (dynamic bus sizing for 8, 16, and 32 bits)
•32 address lines
•Memory controller (eight banks)
— Contains complete dynamic RAM (DRAM) controller
— Each bank can be a chip select or RAS
— Up to 30 wait states programmable per memory bank
— Glueless interface to DRAM, SIMMS, SRAM, EPROMs, Flash EPROMs, and other memory devices
— DRAM controller programmable to support most size and speed memory interfaces
— Four CAS
lines, four WE lines, and one OE line
to support a DRAM bank.
MPC875/MPC870 Hardware Specifications, Rev. 3.0
2PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
Features
— Boot chip-select available at reset (options for 8-, 16-, or 32-bit memory)
— Variable block sizes (32 Kbyte–256 Mbyte)
— Selectable write protection
— On-chip bus arbitration logic
•General-purpose timers
— Four 16-bit timers or two 32-bit timers
— Gate mode can enable/disable counting.
— Interrupt can be masked on reference match and event capture
•Two fast Ethernet controllers (FEC)—Two 10/100 Mbps Ethernet/IEEE 802.3 CDMA/CS that
interface through MII and/or RMII interfaces
•System integration unit (SIU)
— Bus monitor
— Software watchdog
— Periodic interrupt timer (PIT)
— Clock synthesizer
— Decrementer and time base
— Reset controller
— IEEE 1149.1 test access port (JTAG)
•Security engine is optimized to handle all the algorithms associated with IPsec, SSL/TLS, SRTP,
802.11i, and iSCSI processing. Available on the MPC875, the security engine contains a
crypto-channel, a controller, and a set of crypto hardware accelerators (CHAs). The CHAs are:
— Data encryption standard execution unit (DEU)
– DES, 3DES
– Two key (K1, K2, K1) or three key (K1, K2, K3)
– ECB and CBC modes for both DES and 3DES
— Advanced encryption standard unit (AESU)
– Implements the Rinjdael symmetric key cipher
– ECB, CBC, and counter modes
– 128-, 192-, and 256-bit key lengths
— Message digest execution unit (MDEU)
– SHA with 160- or 256-bit message digest
– MD5 with 128-bit message digest
– HMAC with either algorithm
— Master/slave logic, w ith DMA
– 32-bit address/32- bit data
– Operation at 8xx bus frequency
– Integrated controller managing crypto-execution units
– Buffer size of 256 bytes for each execution unit, with flow control for large data sizes
•Interrupts
— Six external interrupt request (IRQ) lines
MPC875/MPC870 Hardware Specifications, Rev. 3.0
Freescale Semiconduc torPRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICE3
Features
— 12 port pins with interrupt capability
— 23 internal interrupt sources
— Programmable priority between SCCs
— Programmable highest priority request
•Communications processor module (CPM)
— RISC controller
— Communication-specifi c commands (for example,
RESTARTTRANSMIT)
GRACEFULSTOPTRANSMIT, ENTERHUNTMODE, and
— Supports continuous mode transmission and reception on all serial channels
— 8-Kbytes of dual-port RAM
— Several serial DMA (SDMA) channels to support the CPM
— Three parallel I/O registers with open-drain capability
•On-chip 16
× 16 multiply accumulate controller (MAC)
— One operation per clock (two-clock latency, one-clock blockage)
— MAC operates concurrently with other instructions
— FIR loop—Four clocks per four multiplies
•Four baud-rate generators
— Independent (can be connected to any SCC or SMC)
— Allows changes during operation
— Autobaud support option
•SCC (seria l communica tion controller)
— Ethernet/IEEE 802.3 optional on the SCC, supporting full 10-Mbps operation
— HDLC/SDLC
— HDLC bus (implements an HDLC-based local area network (LAN))
— Asynchronous HDLC to support point-to-point protocol (PPP)
—AppleTalk
— Universal asynchronous receiver transmitter (UART)
— Synchronous UART
— Serial infrared (IrDA)
— Binary synchronous communication (BISYNC)
— Totally transparent (bit streams)
— Totally transparent (frame based with optional cyclic redundancy check (CRC))
•Universal serial bus (USB)—Supports operatio n as a USB function end point, a USB host cont roller , or both
for testing purposes (loopback diagnostics)
— USB 2.0 full-/low-speed compatible
— The USB function mode has the following features:
– Four independent endpoints support control, bulk, interrupt, and isochronous data transfers.
MPC875/MPC870 Hardware Specifications, Rev. 3.0
4PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
– CRC16 generation and checking
– CRC5 checking
– NRZI encoding/decoding with bit stuffing
– 12- or 1.5-Mbps data rate
– Flexible data buffers with multiple buffe rs per frame
– Automatic retransmission upon transmit error
— The USB host controller has the following features:
– Supports control, bulk, interrupt, and isochronous data transfers
– CRC16 generation and checking
– NRZI encoding/decoding with bit stuffing
– Supports both 12- and 1. 5-Mbps data rates (automatic g eneration of preamble tok en and data
rate configuration). Note that low-speed operation requires an external hub.
– Flexible data buffers with multiple buffe rs per frame
– Supports local loopback mode for diagnostics (12 Mbps only)
•Serial peripheral inte rface (SPI)
— Supports master and slave modes
— Supports multiple-master operation on the same bus
•Inter-integrated circuit (I
2
C) port
— Supports master and slave modes
— Supports a multiple-master environment
•The MPC875 has a time-slot assigner (TSA) that supports one TDM bus (TDMb).
— Allows SCC and SMC to run in multiplexed and/or non-multiplexed operation
— Supports T1, CEPT, PCM highway, ISDN basic rate, ISDN primary rate, user defined
— 1- or 8-bit resolution
— Allows independent transmit and receive routing, frame synchronization, and clocking
— Allows dynamic changes
— Can be internally connected to two serial channels (one SCC and one SMC)
•PCMCIA interface
— Master (so cket) interface, release 2.1-compliant
— Supports one independent PCMCIA socket on the MPC875/MPC870
— 8 memory or I/O windows supported
•Debug interface
— Eight comparators: four operate on instruction address, two operate on data address, and two
operate on data
— Supports conditions: = ≠ < >
— Each watchpoint can generate a break point internally.
•Normal high and normal low power modes to conserve power
•1.8-V core and 3.3-V I/O operation with 5-V TTL compatibility
•The MPC875/870 comes in a 256-pin ball grid array (PBGA) package.
Features
MPC875/MPC870 Hardware Specifications, Rev. 3.0
Freescale Semiconduc torPRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICE5
Features
The MPC875 block diagram is shown in Figure 1.
Embedded
MPC8xx
Processor
Core
Fast Ethernet
Controller
DMAs
DMAs
DMAs
FIFOs
10/100
BaseT
Media Access
Control
MIII/RMII
Instruction
Bus
Load/Store
Bus
8-Kbyte
Instruction Cache
Instruction MMU
32-Entry ITLB
8-Kbyte
Data Cache
Data MMU
32-Entry DTLB
Parallel I/O
4 Baud Rate
Generators
Parallel Interface Port
Slave/Master IF
4
Timers
Timers
Controllers
32-Bit RISC Controller
Unified
Bus
Interrupt
and Program
ROM
System Interface Unit (SIU)
Bus Interface
Security Engine
Controller
Channel
8-Kbyte
Dual-Port RAM
Memory Controller
Internal
Unit
System Functions
PCMCIA-ATA Interface
External
Bus Interface
Unit
AESUDEUMDEU
Virtual IDMA
Serial DMAs
and
USB
SCC4
Time Slot Assigner
Serial Interface
Serial Interface
Figure 1. MPC875 Block Diagram
MPC875/MPC870 Hardware Specifications, Rev. 3.0
SPISMC1
I2C
6PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
The MPC870 block diagram is shown in Figure 2.
Maximum Tolerated Ratings
Embedded
MPC8xx
Processor
Core
Fast Ethernet
Controller
DMAs
DMAs
FIFOs
10/100
BaseT
Media Access
Control
MIII / RMII
Instruction
Bus
Load/Store
Bus
8-Kbyte
Instruction Cache
Instruction MMU
32-Entry ITLB
8-Kbyte
Data Cache
Data MMU
32-Entry DTLB
Parallel I/O
4 Baud Rate
Generators
Parallel Interface Port
Slave/Master IF
4
Timers
Timers
Controllers
32-Bit RISC Controller
Unified
Bus
Interrupt
and Program
ROM
System Interface Unit (SIU)
Bus Interface
8-Kbyte
Dual-Port RAM
Memory Controller
Internal
Unit
System Functions
PCMCIA-ATA Interface
External
Bus Interface
Unit
Virtual IDMA and
Serial DMAs
USB
Serial Interface
Serial Interface
SPISMC1
I2C
Figure 2. MPC870 Block Diagram
3Maximum Tolerated Ratings
This section pro vides th e maximum tole rated vo ltage an d temperat ure range s for t he MPC875/8 70. Table 2
displays the maximum tolerated ratings, and Table 3 displays the operating temperatures.
MPC875/MPC870 Hardware Specifications, Rev. 3.0
Freescale Semiconduc torPRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICE7
Maximum Tolerated Ratings
Supply voltage
1
Table 2. Maximum Tolerated Ratings
RatingSymbolValueUnit
V
DDL
voltage)
(core
–0.3 to 3.4V
V
DDH
(I/O
–0.3 to 4V
voltage)
V
DDSYN
Difference
–0.3 to 3.4V
<100mV
between
and
V
DDL
V
DDSYN
Input voltage
Storage temperature rangeT
1
The power supply of the device must start its ramp from 0.0 V.
2
Functional ope rati ng co nditions are provid ed w ith t he D C electrical specific ati ons i n Table 6. Absolute maximum
2
V
in
stg
GND – 0.3 to
V
DDH
–55 to +150°C
ratings are stress ratings only ; functional op eration at t he maxima is not guaran teed. S tress bey ond those li sted may
affect device reliability or cause permanent damage to the device.
Caution: All inputs that tolerate 5 V cannot be more than 2.5 V greater than VDDH. This restriction applies to power
up and normal operation (tha t is, if the MPC87 5/870 is unp owered, a volt age gr eater than 2.5 V must not be applied
to its inputs).
Table 3. Operating Temperatures
RatingSymbolValueUnit
Temperature
Temperature (extended)T
1
Minimum temperature s are guar anteed a s ambient te mperatu re, TA. Maximum temperatu res are guaran teed as
junction temperature, T
1
(standard)
T
A(min)
T
j(max)
A(min)
T
j(max)
.
j
0°C
95°C
–40°C
100°C
V
This device contains circuitry protecting against damage due to high-static voltage or electrical fields; however, it
is advised that normal prec autions be taken to avoid applicat ion of any voltages higher than maxi mum-rated voltages
to this high-i mpeda nce ci rcuit. Reliabilit y o f oper ation is enhanced i f unus ed inputs are tied t o a n a ppropriate logic
voltage level (for example, either GND or V
MPC875/MPC870 Hardware Specifications, Rev. 3.0
8PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
DDH
).
Thermal Characteristics
4Thermal Characteristics
Table 4 shows the thermal characteristics for the MPC875/870.
Table 4. MPC875/870 Thermal Resistance Data
RatingEnvironmentSymbolValueUnit
Junction-to-ambient
1
Natural convectionSingle-layer board (1s)R
Four-layer board (2s2p)R
Airflow (200 ft/min)Single-layer board (1s)R
Four-layer board (2s2p)R
Junction-to-board
Junction-to-case
Junction-to-package top
4
5
6
Natural convectionΨ
Airflow (200 ft/min)Ψ
1
Junction temperature is a function of on-chip power dissi pa tion, packa ge ther mal resis tan ce, mounting sit e (boa rd)
temperature, ambi ent tem peratu re, airfl ow, power dissipation of o ther co mpone nt s o n the b oard, a nd boa rd therm al
resistance.
2
Per SEMI G38-87 and JEDEC JESD51-2 with the single-layer board horizontal.
3
Per JEDEC JESD51-6 with the board horizontal.
4
Thermal resista nce b etw ee n t he di e a nd the printed cir cuit b oard per JEDEC JESD51 -8. Boar d te mp era t ure is
measured on the top surface of the board near the package.
5
Indicates the average thermal resist an ce be tw een the di e a nd the case top surface as me as ured by th e c ol d pl ate
method (MIL SPEC-883 Method 1012.1) with the cold pl ate temperature us ed for the c ase temperature. F or exposed
pad packages whe re the pad would be expected to be s old ere d, junction-to-case therma l res is t an ce is a si mu lated
value from the junction to the exposed pad without contact resistance.
6
Thermal characteri zation parameter ind ic ati ng the te mp era ture difference b etwee n the package top an d the junction
temperature per JEDEC JESD51-2.
θJA
θJMA
θJMA
θJMA
R
θJB
R
θJC
2
3
3
3
43°C/W
29
36
26
20
10
JT
JT
2
2
5Power Dissipation
Table 5 provides information on power dissipation. The modes are 1:1, where CPU and bus speeds are
equal, and 2:1, where CPU frequency is twice bus speed.
Table 5. Power Dissipation (PD)
Die Revision
Bus
Mode
FrequencyTypical
66 MHz310390mW
1:1
0
80 MHz350430mW
2:1133 MHz430495mW
1
Typical power dissipation is measured at V
DDL
= V
DDSYN
= 1.8 V, and V
is at 3.3 V.
DDH
MPC875/MPC870 Hardware Specifications, Rev. 3.0
Freescale Semiconduc torPRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICE9
1
Maximum
2
Unit
DC Characteristics
2
Maximum power dissipation at V
The values in Table 5 represent V
include I/O power dissipation over V
widely by application due to buffer current, depending on external
circuitry.
DDL
= V
= 1.9 V, and V
DDSYN
is at 3.5 V.
DDH
NOTE
-based power diss ipati on an d d o not
DDL
. I/O power d issipation varies
DDH
The V
DDSYN
power dissipation is negligible.
6DC Characteristics
Table 6 provides the DC electrical characteristics for the MPC875/870.
T able 6. DC Electrical Specifications
CharacteristicSymbolMinMaxUnit
Operating voltag eV
V
Input high voltage (all inputs except EXTAL and EXTCLK)
Input low voltage
3
EXTAL, EXTCLK input high voltageV
Input leakage current, Vin = 5.5 V (except TMS, TRST, DSCK and
7.1Estimation with Junction-to-Ambient Thermal Resistance
An estimation of the chip junction temperature, TJ, in °C can be obtained from the following equation:
T
= TA + (R
J
θJA
× PD)
where:
T
= ambient temperature ºC
A
R
= package j unction-to-a mbient ther mal resistance (ºC/W)
θJA
P
= power dissipation in package
D
The junction-to-ambient thermal resistance is an industry standard value that provides a quick and easy
estimation of ther mal pe rf ormance. However , the answer is onl y an es timate; test cases have demonstrated
that errors of a factor of two (in the quantity T
) are possible.
J–TA
7.2Estimation with Junction-to-Case Thermal Resistance
Historically, thermal resistance has frequently been ex pressed as the sum of a junction-to-case thermal
resistance and a case-to-ambient thermal resistance:
R
θJA
= R
θJC
+ R
θCA
where:
R
= junction-to-ambient thermal resistance (ºC/W)
θJA
R
= junction-to-case thermal resistance (ºC/W)
θJC
R
= case-to-ambient thermal resistance (ºC/W)
θCA
is device-related and cannot be influenced by the user. The user adjusts the thermal environment to
R
θJC
affect the case-to-ambient thermal resistance, R
. For instance, the user can change the airflow around
θCA
the device, add a heat sink, change the mounting arrangement on the printed circuit board, or change the
thermal dissipation on the printed circuit board surrounding the device. This thermal model is most useful
for ceramic pack age s wi th heat sinks where some 90% of the heat flows th rou gh the case and the h eat sink
to the ambient environment. For most packages, a better model is required.
MPC875/MPC870 Hardware Specifications, Rev. 3.0
Freescale Semiconduc torPRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICE11
Thermal Calculation and Measuremen t
7.3Estimation with Junction-to-Board Thermal Resistance
A simple package thermal model that has demonstrated reasonable accuracy (about 20%) is a two-resistor model
consisting of a junc ti on-to- board and a ju nctio n-to- case t herma l res ista nce. The j unc tion- to-ca se the rmal re sist ance
covers the situ ation where a heat sink i s u sed or where a subst antia l am ount of heat is di ssipa ted from t he top of the
package. The junction-to-board thermal resistance describes the thermal performance when most of the heat is
conducted to the printed circuit board. It has been observed that the thermal performance of most plastic packages
and especially PBGA packa ges is st rongl y depende nt on the bo ard tempe ratur e. If the boa rd temper atur e is known,
an estimate of the junction temperature in the environment can be made using the following equation:
T
= TB + (R
J
where:
R
= junction-to-board thermal resistance (ºC/W)
θJB
T
= board temperature ºC
B
P
= power dissipation in package
D
If the board temperature is known and the heat loss from the package case to the air can be ignored, acceptable
predictions of junction temperature can be made. For this method to work, the board and board mounting must be
similar to the test board used to determine the junction-to-board thermal resistance, namely a 2s2p (board with a
power and a ground plane) and vias attaching the thermal balls to the ground plane.
θJB
× PD)
7.4Estimation Using Simulation
When the board temperatur e is not known, a therma l simulation of the appl ication is needed . The simple two-resistor
model can be used with the therma l simula tion of t he app licat ion [2] , or a more ac curate and co mple x model of the
package can be used in the thermal simulation.
7.5Experimental Determination
To determine the junction temperature of the device in the application after prototypes are available, the thermal
characterization parameter (Ψ
temperature at the top center of the package case using the following equation:
T
= TT + (ΨJT× PD)
J
where:
= thermal characterization parameter
Ψ
JT
T
= thermocouple temperature on top of package
T
P
= power dissipation in package
D
The thermal charact erization para meter is measured pe r the JESD51-2 spec ification publ ished by JEDEC using a 40
gauge type T thermocouple epoxied to the top center of the package case. The thermocouple should be positioned
so that the thermocouple junction rests on the package. A small amount of epoxy is placed over the thermocouple
junction and over about 1 mm of wire ex tending f rom the junc tion. The ther mocouple wire is plac ed flat a gainst th e
package case to avoid measurement errors caused by the cooling effects of the thermocouple wire.
) can be use d to determine the junction temperature with a measurement of the
JT
MPC875/MPC870 Hardware Specifications, Rev. 3.0
12PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
Power Supply and Power Sequencing
7.6References
Semiconductor Equipment and Materials International(415) 964-5111
805 East Middlefield Rd
Mountain Vi ew, CA 94043
MIL-SPEC and EIA/JESD (JEDEC) specifications800-854-7179 or
(Available from Global Engineering Documents)303-397-7956
JEDEC Specifications http://www.jedec.org
1. C.E. Triplett and B. Joiner, “An Experimental Characterization of a 272 PBGA Within an Automotive
Engine Controller Module,” Proceedings of SemiTherm, San Diego, 1998, pp. 47-54.
2. B. Joiner and V. Adams , “Measur ement a nd Simul ation of Jun ction to Boar d Ther mal Re sistanc e and I ts
Application in Thermal Modeling,” Proceedings of SemiTherm, San Diego, 1999, pp. 212-220.
8Power Supply and Power Sequencing
This section provides design considerations for the MPC875/870 power supply. The MPC875/870 has a
core voltage (V
V
. The I/O section of the MPC875/870 is supplied with 3.3 V across V
DDH
The signals PA[0:3], PA[8:11], PB15, PB[24:25]; PB[28:31], PC[4:7], PC[12:13], PC15] PD[3:15], TDI,
TDO, TCK, TRST
greater than V
exceed 3.465 V. This restriction applies to power up/down and normal operation.
) and PLL voltage (V
DDL
DDSYN
), which both operate a t a lower voltage than t he I/O voltage
and VSS (GND).
DDH
, TMS, MII_TXEN, and MII_MDIO are 5-V tolerant. No input can be more than 2.5 V
. In addition, 5 V-tolerant pins cannot exceed 5.5 V, and remaining input pins cannot
DDH
One consequence of multiple power supplies is that when power is initially applied, the voltage rails ramp
up at different rates. The rates depend on the nature of the power supply, the type of load on each power
supply, and the manner in which different voltages are derived. The following restrictions apply:
•V
•V
must not exceed V
DDL
must not exceed 1.9 V, and V
DDL
DDH
during power up and power down.
must not exceed 3.465 V.
DDH
These cautions are necessary for the long-term reliability of the part. If they are violated, the electrostatic
discharge (ESD) protection di odes are forwa rd-biased, and excessive curren t can flow thr ough these dio des.
If the system power supply design does not control the voltage sequencing, the circuit shown in Figure 3
can be added to meet these requirements. The MUR420 Schottky diodes control the maximum potential
difference betwe en the ext ern al bus and core power supplie s on power up, and th e 1N5820 di odes reg ulate
the maximum potential difference on power down.
MPC875/MPC870 Hardware Specifications, Rev. 3.0
Freescale Semiconduc torPRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICE13
Mandatory Reset Configurations
V
DDH
MUR420
1N5820
V
DDL
Figure 3. Example Voltage Sequencing Circuit
9Mandatory Reset Configurations
The MPC875/870 requires a mandatory configuration during reset.
If hardware reset conf iguratio n word (HRCW) is enabl ed, the HRCW[DBGC] valu e needs to be se t to binar y X1 in
the HRCW and the SIUMCR[DBGC] should be pr ogram med with t he same va lue in the boo t code a fter reset . This
can be done by asserting the RSTCONF
If HRCW is disabled, the SIUMCR[DBGC] should be programmed with binary X1 in the boot code after reset by
negating the RSTCONF
during the HRESET assertion.
The MBMR[GPLB4DIS], PAPAR, PADIR, PBPAR, PBDIR, PCPAR, and PCDIR need to be configured with the
mandatory values in Table 7 in the boot code after the reset is negat ed.
during HRESET assertion.
Table 7. Mandatory Reset Configuration of MPC875/870
Register/ConfigurationField
HRCW
(Hardware reset configuration word)
SIUMCR
(SIU module configuration register)
MBMR
(Machine B mode register)
PAPAR
(Port A pin assignment register)
PADIR
(Port A data direction re gister)
PBPAR
(Port B pin assignment register)
PBDIR
(Port B data direction re gister)
PCPAR
(Port C pin assignment register)
Value
(binary)
HRCW[DBGC]X1
SIUMCR[DBGC]X1
MBMR[GPLB4DIS}0
PAPAR[5:9]
PAPAR[12:13]
PADIR[5:9]
PADIR[12:13]
PBPAR[14:18]
PBPAR[20:22]
PBDIR[14:8]
PBDIR[20:22]
PCPAR[4:5]
PCPAR[8:9]
PCPAR[14]
0
0
0
0
0
MPC875/MPC870 Hardware Specifications, Rev. 3.0
14PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
Layout Practices
Table 7. Mandatory Reset Configuration of MPC875/870 (continued)
Register/ConfigurationField
PCDIR
(Port C data direction register)
PDPAR
(Port D pin assignment register)
PDDIR
(Port D data direction register)
PCDIR[4:5]
PCDIR[8:9]
PCDIR[14]
PDPAR[3:7]
PDPAR[9:5]
PDDIR[3:7]
PDDIR[9:15]
Value
(binary)
0
0
0
10 Layout Practices
Each VDD pin on the MPC875/870 s hould be prov ided with a low-impedance p ath to the boa rd’ s supply . Each GND
pin should likewise be provid ed with a low-impe dance path to gr ound. The power su pply pins drive di stinct gro ups
of logic on chip. The V
located as close as possible to the four sides of the package. Each board designed should be characterized and
additional appropr iate decoupling cap aci tors should be used if required. The capacitor leads a nd ass oci at ed printed
circuit traces connecting to chip V
minimum, a four-layer board employing two inner layers as V
All output pins on the MPC875/870 have fast rise and fall times. Printed circuit (PC) trace interconnection length
should be minimized in order to minimize undershoot and reflections caused by these fast output switching times.
This recommendation particularly applies to the address and data buses. Maximum PC trace lengths of six inches
are recommended. Capacitan ce calculations sho uld consider all device loa ds as well as parasitic ca pacitances due to
the PC traces. Attention to proper PCB layout and bypassing becomes especially critical in systems with higher
capacitive loads bec ause these loads create hig her transient current s in the V
inputs or signals that will be inputs during reset. Special care should be taken to minimize the noise levels on the
PLL supply pins. For more information, please refer to Section 14.4.3, “Clock Synthesizer Power (V
V
SSSYN
, V
SSSYN1
),” of the MPC885 PowerQUICC Family User’s Manual.
power supply should be bypassed to ground using at l ea st fou r 0.1 -µF bypass capacitors
DD
and GND should be kept to less than half an inch per capacitor lead. At a
DD
and GND planes should be used.
DD
and GND circuits. Pull up all unused
DD
DDSYN
,
11Bus Signal Timing
The maximum bus speed supported by the MPC875/870 is 80 MHz. Higher-speed parts must be operated in
half-speed bus mode (fo r example, an MPC875/870 used at 133 MHz must be configured f or a 66 MHz bus). Table 8
shows the frequency ranges f or stand ar d part frequ encies in 1:1 bus mode , and Table 9 shows the frequency ranges
for standard part frequencies in 2:1 bus mode.
Table 8. Frequency Ranges for Standard Part Frequencies (1:1 Bus Mode)
Part Frequency66 MHz80 MHz
MinMaxMinMax
Core frequency4066.674080
Bus frequency4066.674080
MPC875/MPC870 Hardware Specifications, Rev. 3.0
15PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
Bus Signal Timing
Table 9. Frequency Ranges for Standard Part Frequencies (2:1 Bus Mode)
Part Frequenc y66 MHz80 MHz133 MHz
MinMaxMinMaxMinMax
Core frequency4066.67408040133
Bus frequency2033.3320402066
Table 10 provides the bus operation timing for the MPC875/870 at 33, 40, 66, and 80 MHz.
The timing for the MPC875/870 bus shown assumes a 50-pF load f or maximum delays and a 0-pF load for minimum
delays. CLKOUT assumes a 100-pF load maximum delay
Table 10. Bus Operation Timings
33 MHz40 MHz66 MHz80 MHz
NumCharacteristic
MinMaxMinMaxMinMaxMinMax
B1Bus period ( CLKOUT), see Table 8————————ns
Unit
B1aEXTCLK to CLKOUT phase skew - If
CLKOUT is an integer multiple of
EXTCLK, then the rising edge of EXTCLK
is aligned with th e rising edge of CLKO UT .
For a non-integer m ultiple of EXTCLK, this
synchronization is lost, and the rising
edges of EXTCLK and CLKOUT have a
continuously varying phase skew.
B1bCLKOUT frequency jitter pea k-to -pe ak—1—1—1—1ns
B1cFrequency jitter on EXTCLK—0.50—0.50—0.50—0.50%
B1dCLKOUT phase jitter peak-to-peak
for OSCLK ≥ 15 MHz
CLKOUT phase jitter peak-to-peak
for OSCLK < 15 MHz
B2CLKOUT pulse width low
(MIN = 0.4
B3CLKOUT pulse width high
(MIN = 0.4
B4CLKOUT rise time —4.00—4.00—4.00—4.00ns
B5CLKOUT fall time—4.00—4.00—4.00—4.00ns
B7CLKOUT to A(0:31), BADDR(28:30),
RD/WR
(MIN = 0.25
× B1, MAX = 0.6 × B1)
× B1, MAX = 0.6 × B1)
, BURST, D(0:31) output hold
× B1)
–2+2–2+2–2+2–2+2ns
—4—4—4—4ns
—5—5—5—5ns
12.118.210.015.06.19.15.07.5ns
12.118.210.015.06.19.15.07.5ns
7.60—6.30—3.80—3.13—ns
B7aCLKOUT to TSIZ(0:1), REG, RSV, BDIP,
PTR output hold (MIN = 0.25
B7bCLKOUT to BR, BG, FRZ, VFLS(0:1),
VF(0:2) IWP(0:2), LWP(0:1), STS
hold (MIN = 0.25
16PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
× B1)
MPC875/MPC870 Hardware Specifications, Rev. 3.0
× B1)
output
7.60—6.30—3.80—3.13—ns
7.60—6.30—3.80—3.13—ns
Bus Signal Timing
NumCharacteristic
Table 10. Bus Operation Timings (continued)
33 MHz40 MHz66 MHz80 MHz
Unit
MinMaxMinMaxMinMaxMinMax
B8CLKOUT to A(0:31), BADDR(28:30)
RD/WR
(MAX = 0.25
B8aCLKOUT to TSIZ(0:1), REG, RSV, BDIP,
20PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
× B1 – 2.00)
× B1 – 3.00)
MPC875/MPC870 Hardware Specifications, Rev. 3.0
43.50—35.50—20.70—16.75—ns
8.40—6.40—2.70—1.70—ns
38.67—31.38—17.83—14.19—ns
Bus Signal Timing
NumCharacteristic
Table 10. Bus Operation Timings (continued)
33 MHz40 MHz66 MHz80 MHz
Unit
MinMaxMinMaxMinMaxMinMax
B31CLKOUT falling edge to CS valid, as
requested by control bit CST4 in the
corresponding word in the UPM
(MAX = 0.00
B31aCLKOUT falling edge to CS va lid , as
requested by control bit CST1 in the
corresponding word in the UPM
(MAX = 0.25
B31bCLKOUT rising edge to CS valid, as
requested by control bit CST2 in the
corresponding word in the UPM
(MAX = 0.00
B31cCLKOUT rising edge to CS valid, as
requested by control bit CST3 in the
corresponding word in the UPM
(MAX = 0.25
B31dCLKOUT falling edge to CS va lid , as
requested by control bit CST1 in the
corresponding word in the UPM EBDF = 1
(MAX = 0.375
B32CLKOUT falling edge to BS valid, as
requested by control bit BST4 in the
corresponding word in the UPM
(MAX = 0.00
× B1 + 6.00)
× B1 + 6.80)
× B1 + 8.00)
× B1 + 6.30)
× B1 + 6.6)
× B1 + 6.00)
1.506.001.506.001.506.001.506.00ns
7.60 14.30 6.30 13.00 3.80 10.50 3.13 10.00ns
1.508.001.508.001.508.001.508.00ns
7.60 13.80 6.30 12.50 3.80 10.00 3.139.40ns
13.30 18.00 11.30 16.00 7.60 12.30 4.69 11.30ns
1.506.001.506.001.506.001.506.00ns
B32aCLKOUT falling edge to BS valid, as
requested by control bit BST1 in the
corresponding word in the UPM, EBDF = 0
(MAX = 0.25
B32bCLKOUT rising edge to BS valid, as
requested by control bit BST2 in the
corresponding word in the UPM
(MAX = 0.00
B32cCLKOUT rising edge to BS valid, as
requested by control bit BST3 in the
corresponding word in the UPM
(MAX = 0.25
B32dCLKOUT falling edge to BS valid, as
requested by control bit BST1 in the
corresponding word in the UPM, EBDF = 1
(MAX = 0.375
B33CLKOUT falling edge to GPL valid, as
requested by control bit GxT4 in the
corresponding word in the UPM
(MAX = 0.00
× B1 + 6.80)
× B1 + 8.00)
× B1 + 6.80)
× B1 + 6.60)
× B1 + 6.00)
MPC875/MPC870 Hardware Specifications, Rev. 3.0
7.60 14.30 6.30 13.00 3.80 10.50 3.13 10.00ns
1.508.001.508.001.508.001.508.00ns
7.60 14.30 6.30 13.00 3.80 10.50 3.13 10.00ns
13.30 18.00 11.30 16.00 7.60 12.30 4.49 11.30ns
1.506.001.506.001.506.001.506.00ns
21PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
Bus Signal Timing
NumCharacteristic
Table 10. Bus Operation Timings (continued)
33 MHz40 MHz66 MHz80 MHz
Unit
MinMaxMinMaxMinMaxMinMax
B33aCLKOUT rising edge to GPL valid, as
requested by control bit GxT3 in the
corresponding word in the UPM
(MAX = 0.25
B34 A(0:31), BADDR(28:30), and D(0:31) to
CS
valid, as requested by control bi t CST4
in the corresponding word in the UPM
(MIN = 0.25
B34aA(0:31), BADDR(28:30), and D(0:31) to
CS
valid, as requested by control bi t CST1
in the corresponding word in the UPM
(MIN = 0.50
B34bA(0:31), BADDR(28:30), and D(0:31) to
CS
valid, as requested by CST2 in the
corresponding word in UPM
(MIN = 0.75
B35A(0:31), BADDR(28:30) to CS valid, as
requested by control bit BST4 in the
corresponding word in the UPM
(MIN = 0.25
B35aA(0:31), BADDR(28:30), and D(0:31) to
BS
valid, as requested by BST1 in the
corresponding word in the UPM
(MIN = 0.50
× B1 + 6.80)
× B1 - 2.00)
× B1 – 2.00)
× B1 – 2.00)
× B1 – 2.00)
× B1 – 2.00)
7.60 14.30 6.30 13.00 3.80 10.50 3.13 10.00ns
5.60—4.30—1.80—1.13—ns
13.20—10.50—5.60—4.25—ns
20.70—16.70—9.40—6.80—ns
5.60—4.30—1.80—1.13—ns
13.20—10.50—5.60—4.25—ns
B35bA(0:31), BADDR(28:30), and D(0:31) to
BS
valid, as requested by control bi t BST2
in the corresponding word in the UPM
(MIN = 0.75
B36A(0:31), BADDR(28:30), and D(0:31) to
GPL
valid, as requested by control bit
GxT4 in the corresponding word in the
UPM (MIN = 0.25
B37UPWAIT valid to CLKOUT falling edge 8
(MIN = 0.00
B38CLKOUT falling edge to UPWAIT valid
(MIN = 0.00 × B1 + 1.00)
B39AS valid to CLKOUT rising edge 9
(MIN = 0.00
B40A(0:31), TSIZ(0:1), RD/WR, BURST, valid
to CLKOUT rising edge
(MIN = 0.00 × B1 + 7.00)
B41TS valid to CLKOUT rising edge (setup
time) (MIN = 0.00
× B1 – 2.00)
× B1 – 2.00)
× B1 + 6.00)
× B1 + 7.00)
× B1 + 7.00)
MPC875/MPC870 Hardware Specifications, Rev. 3.0
20.70—16.70—9.40—7.40—ns
5.60—4.30—1.80—1.13—ns
6.00—6.00—6.00—6.00—ns
8
1.00—1.00—1.00—1.00—ns
7.00—7.00—7.00—7.00—ns
7.00—7.00—7.00—7.00—ns
7.00—7.00—7.00—7.00—ns
22PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
Bus Signal Timing
NumCharacteristic
Table 10. Bus Operation Timings (continued)
33 MHz40 MHz66 MHz80 MHz
Unit
MinMaxMinMaxMinMaxMinMax
B42CLKOUT rising edge to TS valid (hold
time) (MIN = 0.00
× B1 + 2.00)
B43AS negation to memory controller signals
2.00—2.00—2.00—2.00—ns
—TBD—TBD—TBD—TBDns
negation (MAX = TBD)
1
For part speeds above 50 MHz, use 9.80 ns for B11a.
2
The timing required fo r BR in put is rel ev ant w hen the M P C875 /870 is s ele cted to work with the i nter nal bus arbiter.
The timing for BG
3
For part speeds above 50 MHz, use 2 ns for B17.
4
The D(0:31) input timings B18 and B19 refer to the rising edge of the CLKOUT in which the TA input signal is ass erted.
5
For part speeds above 50 MHz, use 2 ns for B19.
6
The D(0:31) input timi ngs B20 an d B21 refer to the falling ed ge of th e C LK OUT. This timing is va li d on ly for r ead
input is relevant when the MPC875/870 is selected to work with the external bus arbiter.
accesses controlled by chip-selects under control of the user-programmable machine (UPM) in the memory
controller , for data bea ts where DL T3 = 1 in the RAM words. (This is only the case whe re data is latche d on the falling
edge of CLKOUT.)
7
The timing B30 refers to CS when ACS = 00 and to WE(0:3) when CSNT = 0.
8
The signal UPW AIT is consid ered asy nchronous t o the C LKOUT and synchro nized intern ally. The timings specified in
B37 and B38 are specified to enable the freeze of the UPM output signals as described in Figure 19.
9
The AS signal is c ons id ered a sy nc hro nou s to the CLKOUT. The timing B39 is sp ec ifi ed in o r der to allow the behavior
specified in Figure 22.
MPC875/MPC870 Hardware Specifications, Rev. 3.0
23PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
Bus Signal Timing
C
C
Figure 4 provides the control timing diagram.
.
LKOUT
Outputs
Outputs
Inputs
Inputs
2.0 V
B
2.0 V
0.8 V
0.8 V
A
B
2.0 V
0.8 V
2.0 V
0.8 V
2.0 V
0.8 V
C
0.8 V
A
D
2.0 V
0.8 V
2.0 V
2.0 V
0.8 V
2.0 V
0.8 V
D
C
2.0 V
0.8 V
AMaximum output delay specification
BMinimum output hold time
CMinimum input setup time specification
DMinimum input hold time specification
Figure 4. Control Timing
Figure 5 provides the timing for the external clock.
LKOUT
B1
B1
B4
B5
Figure 5. External Clock Timing
B3
B2
MPC875/MPC870 Hardware Specifications, Rev. 3.0
24PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
Bus Signal Timing
C
C
Figure 6 provides the timing for the synchronous output signals.
LKOUT
B8
B7B9
Output
Signals
B8a
Output
Signals
B8b
B7b
Output
Signals
B9B7a
Figure 6. Synchronous Output Signals Timing
Figure 7 provides the timing for the synchronous active pull-up and open-drain output signals.
LKOUT
B13
B12B11
TS
, BB
B13a
B11
TA, B I
TEA
B14
B12a
B15
Figure 7. Synchronous Active Pull-Up Resistor and Open-Drain Outputs Signals Timing
MPC875/MPC870 Hardware Specifications, Rev. 3.0
25PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
Bus Signal Timing
R
B
C
Figure 8 provides the timing for the synchronous input signals.
CLKOUT
B16
, BI
TA
B16a
TEA, KR,
ETRY, CR
B16b
B, BG, BR
B17
B17a
B17
Figure 8. Synchronous Input Signals Timing
Figure 9 provides normal case timing for in put dat a. It also appl ies t o normal r ead acc esses u nder the con trol o f the
user-programmable machine (UPM) in th e memory cont roller.
LKOUT
B16
B17
TA
B18
B19
D[0:31]
Figure 9. Input Data Timing in Normal Case
MPC875/MPC870 Hardware Specifications, Rev. 3.0
26PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
Bus Signal Timing
C
C
Figure 10 provides the timing for t he i nput data controlled b y th e UPM for data beats where DLT3 = 1 in the UPM
RAM words. (This is only the case where data is latched on the falling edge of CLKOUT.)
LKOUT
TA
B20
B21
D[0:31]
Figure 10. Input Data Timing when Controlled by UPM in the Memory Controller and DL T3 = 1
Figure 11 through Figure 14 provide the timing for the external bus read controlled by various GPCM factors.
LKOUT
B11B12
TS
B8
A[0:31]
B22
CSx
B25
OE
B28
WE[0:3]
D[0:31]
B23
B26
B19
B18
Figure 11. External Bus Read Timing (GPCM Controlled—ACS = 00)
MPC875/MPC870 Hardware Specifications, Rev. 3.0
27PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
35PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
Bus Signal Timing
C
C
Table 11 provides the interrupt timing for the MPC875/870.
Table 11. Interrupt Timing
NumCharacteristic
I39IRQ
I40IRQx hold time after CLKOUT2.00ns
I41IRQx pulse width low3.00ns
I42IRQx pulse width high3.00ns
I43IRQx edge-to-edge time4xT
1
The I39 and I40 tim ing s des cri be the tes tin g c on diti on s u nde r w hi ch the IRQ lines are tested when being defined as
level sensitive. The IRQ
to the CLKOUT.
The I41, I42, and I43 timings are specified to allow correct functioning of the IRQ lines detection circuitry and have
no direct relation with the total system interrupt latency that the MPC875/870 is able to support.
x valid to CLKOUT rising edge (setup time)6.00ns
lines are synchronized interna lly and do no t have to be assert ed or nega ted with refe rence
1
All Frequencies
MinMax
CLOCKOUT
Figure 24 provides the interrupt detection timing for the external level-sensitive lines.
LKOUT
I39
I40
Unit
—
x
IRQ
Figure 24. Interrupt Detection Timing for External Level Sensitive Lines
Figure 25 provides t he interrupt d etection timing for the ex ternal edge-s ensitive lines.
LKOUT
I41I42
IRQx
I43
I43
Figure 25. Interrupt Detection Timing for External Edge-Sensitive Lines
MPC875/MPC870 Hardware Specifications, Rev. 3.0
36PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
Bus Signal Timing
Table 12 shows the PCMCIA timing for the MPC875/870.
Table 12. PCMCIA Timing
33 MHz40 MHz66 MHz80 MHz
NumCharacteristic
MinMaxMinMaxMinMaxMinMax
Unit
A(0:31), REG
strobe asserted
P44
(MIN = 0.75 × B1 – 2.00)
A(0:31), REG
P45
negation
(MIN = 1.00 × B1 – 2.00)
CLKOUT to REG valid
P46
(MAX = 0.25
CLKOUT to REG invalid
P47
(MIN = 0.25
CLKOUT to CE1, CE2 asserted
P48
(MAX = 0.25
CLKOUT to CE1
P49
(MAX = 0.25
CLKOUT to PCOE
P50
P51
P52
assert time (MAX =
IOWR
0.00
× B1 + 11.00)
CLKOUT to PCOE, IORD, PCWE,
negate time (MAX =
IOWR
× B1 + 11.00)
0.00
CLKOUT to ALE assert time (MAX
= 0.25
valid to PCMCIA
1
valid to ALE
1
× B1 + 8.00)
× B1 + 1.00)
× B1 + 8.00)
, CE2 negated
× B1 + 8.00)
× B1 + 6.30)
, IORD, PCWE,
20.70—16.70—9.40—7.40—ns
28.30—23.00—13.20—10.50—ns
7.6015.606.3014.303.8011.803.1311.13ns
8.60—7.30—4.80—4.125—ns
7.6015.606.3014.303.8011.803.1311.13ns
7.6015.606.3014.303.8011.803.1311.13ns
—11.00—11.00—11.00—11.00ns
2.0011.002.0011.002.0011.002.0011.00ns
7.6013.806.3012.503.8010.003.139.40ns
CLKOUT to ALE negate time (MAX
P53
P54
P55
P56
1
PSST = 1. Otherwise add PSST times cycle time.
PSHT = 0. Otherwise add PSHT times cycle time.
These synchronous timing s defi ne wh en the WAITA
current cycle. The WAITA
See Chapter 16, “PCMCIA Interface,” in the MPC885 PowerQUICC Family User’s Manual.
37PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
× B1 + 8.00)
= 0.25
PCWE, IOWR negated to D(0:31)
1
invalid
WAITA and WAITB valid to
CLKOUT rising edge
(MIN = 0.00 × B1 + 8.00)
CLKOUT rising edge to W AIT A and
WAITB
2.00)
(MIN – = 0.25 × B1 – 2.00)
1
invalid1 (MIN = 0.00 × B1 +
assertion will be effective only if it is detected 2 cycles before the PSL timer expiration.
MPC875/MPC870 Hardware Specifications, Rev. 3.0
—15.60—14.30—11.80—11.13ns
5.60—4.30—1.80—1.125—ns
8.00—8.00—8.00—8.00—ns
2.00—2.00—2.00—2.00—ns
signals are detecte d in orde r to freez e (or rel ieve) t he PCMCIA
Bus Signal Timing
Figure 26 provides the PCMCIA access cycle timing for the external bus read.
CLKOUT
TS
P44
A[0:31]
REG
CE1/CE2
PCOE, IORD
ALE
D[0:31]
P46P45
P48P49
P53P52P52
P47
P51P50
Figure 26. PCMCIA Access Cycles Timing External Bus Read
B19B18
MPC875/MPC870 Hardware Specifications, Rev. 3.0
38PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
Bus Signal Timing
C
Figure 27 provides t he PCMCIA access cycle timing for the external bus write.
CLKOUT
TS
P44
A[0:31]
P46P45
REG
P48P49
CE1/CE2
PCWE, IOWR
P53P52P52
ALE
D[0:31]
Figure 27. PCMCIA Access Cycles Timing External Bus Write
Figure 28 provides the PCMCIA WAIT signals detection timing.
P47
P51P50
P54
B9B8
LKOUT
P55
P56
WAITA
Figure 28. PCMCIA WAIT Signals Detection Timing
MPC875/MPC870 Hardware Specifications, Rev. 3.0
39PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
Bus Signal Timing
C
Table 13 shows the PCMCIA port timing for the MPC875/870.
Figure 29 provides the PCMCIA output port timing for the MPC875/870.
CLKOUT
P57
Output
Signals
HRESET
P58
P2, OP3
Figure 29. PCMCIA Output Port Timing
Figure 30 provides the PCMCIA input port timing for the MPC875/870.
LKOUT
P59
P60
Input
Signals
Figure 30. PCMCIA Input Port Timing
MPC875/MPC870 Hardware Specifications, Rev. 3.0
40PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
Bus Signal Timing
Table 14 shows the debug port timing for the MPC875/870.
Table 14. Debug Port Timing
NumCharacteristic
All Frequencies
Unit
MinMax
D61DSCK cycle time3 × T
D62DSCK clock pulse width1.25 × T
D63DSCK rise and fall times0.003.00ns
D64DSDI input data setup time8.00ns
D65DSDI data hold time5.00ns
D66DSCK low to DSDO data valid0.0015.00ns
D67DSCK low to DSDO invalid0.002.00ns
CLOCKOUT
CLOCKOUT
Figure 31 provides the input timing for the debug port clock.
DSCK
D61
D61
D63
D62
D62
D63
Figure 31. Debug Port Clock Input Timing
Figure 32 provides the timing for the debug port.
—
—
DSCK
D64
D65
DSDI
D66
D67
DSDO
Figure 32. Debug Port Timings
MPC875/MPC870 Hardware Specifications, Rev. 3.0
41PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
Bus Signal Timing
Table 15 shows the reset timing for the MPC875/870.
T a b l e 15. Re se t Timing
33 MHz40 MHz66 MHz80 MHz
NumCharacteristic
MinMaxMinMaxMinMaxMinMax
Unit
CLKOUT to HRESET
impedance (MAX = 0.00 × B1 +
R69
20.00)
CLKOUT to SRESET high
R70
impedance (MAX = 0.00 × B1 +
20.00)
RSTCONF pulse width
R71
(MIN = 17.00 × B1)
R72——————————
Configuration data to HRESET
R73
rising edge setup time
(MIN = 15.00 × B1 + 50.00)
Configuration data to RSTCONF
rising edge setup time
R74
(MIN = 0.00 × B1 + 350.00)
Configuration data hold time after
R75
RSTCONF
(MIN = 0.00 × B1 + 0.00)
Configuration data hold time after
R76
HRESET
(MIN = 0.00 × B1 + 0.00)
HRESET
R77
asserted t o data out drive
(MAX = 0.00 × B1 + 25.00)
negation
negation
and RSTCONF
high
—20.00—20.00—20.00—20.00ns
—20.00—20.00—20.00—20.00ns
515.20—425.00—257.60—212.50—ns
504.50—425.00—277.30—237.50—ns
350.00—350.00—350.00—350.00—ns
0.00—0.00—0.00—0.00—ns
0.00—0.00—0.00—0.00—ns
—25.00—25.00—25.00—25.00ns
RSTCONF
high impedance
R78
(MAX = 0.00 × B1 + 25.00)
CLKOUT of last rising edge
before chip three-states
R79
HRESET to data out high
impedance
(MAX = 0.00 × B1 + 25.00)
DSDI, DSCK setup
R80
(MIN = 3.00 × B1)
DSDI, DSCK hold time
R81
(MIN = 0.00 × B1 + 0.00)
SRESET
rising edge for DSDI and DSCK
R82
sample (MIN = 8.00 × B1)
42PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
negated to data out
negated to CLKOUT
MPC875/MPC870 Hardware Specifications, Rev. 3.0
—25.00—25.00—25.00—25.00ns
—25.00—25.00—25.00—25.00ns
90.90—75.00—45.50—37.50—ns
0.00—0.00—0.00—0.00—ns
242.40—200.00—121.20—100.00—ns
Bus Signal Timing
D
Figure 33 shows the reset timing for the data bus configuration.
HRESET
R71
R76
RSTCONF
R73
R74
[0:31] (IN)
R75
Figure 33. Reset Timing—Configuration from Data Bus
Figure 34 provides the reset timing for the data bus weak drive during configuration.
CLKOUT
HRESET
RSTCONF
[0:31] (OUT)
(Weak)
R69
R79
R77R78
Figure 34. Reset Timing—Data Bus Weak Drive During Configuration
MPC875/MPC870 Hardware Specifications, Rev. 3.0
43PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
IEEE 1149.1 Electrical Specifications
Figure 35 provides the reset timing for the debug port configuration.
CLKOUT
R70
R82
SRESET
R80R80
R81
DSCK, DSDI
R81
Figure 35. Reset Timing—Debug Port Configuration
12 IEEE 1149.1 Electrical Specifications
Table 16 provides the JTAG timings for the MPC875/870 shown in Figure 36 to Figure 39.
Table 16. JTAG Timing
All
NumCharacteristic
J82TCK cycle time100.00—ns
J83TCK clock pulse width measured at 1.5 V40.00—ns
J84TCK rise and fall times0.0010.00ns
J85TMS, TDI data setup time5.00—ns
J86TMS, TDI data hold time25.00—ns
J87TCK low to TDO data valid —27.00ns
J88TCK low to TDO data invalid 0.00—ns
J89TCK low to TDO high impedance —20.00ns
J90TRST
J91TRST setup time to TCK low40.00—ns
J92TCK falling edge to output valid—50.00ns
J93TCK falling edge to output valid out of high impedance—50.00ns
J94TCK falling edge to output high impedance—50.00ns
J95Boundary scan input valid to TCK rising edge50.00—ns
assert time100.00—ns
Frequencies
MinMax
Unit
J96TCK rising edge to boundary scan input invalid50.00—ns
MPC875/MPC870 Hardware Specifications, Rev. 3.0
44PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
IEEE 1149.1 Electrical Specifications
TCK
TCK
MS, TDI
J82J83
J82J83
J84J84
Figure 36. JTAG Test Clock Input Timing
J85
J86
J87
J88J89
TDO
TCK
TRST
Figure 37. JTAG Test Access Port Timing Diagram
J91
J90
Figure 38. JTAG TRST
Timing Diagram
MPC875/MPC870 Hardware Specifications, Rev. 3.0
45PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
CPM Electrical Characteristics
TCK
J92J94
Output
Signals
J93
Output
Signals
J95J96
Output
Signals
Figure 39. Boundary Scan (JTAG) Timing Diagram
13 CPM Electrical Characteristics
This section pr ovi des t he AC and DC electrical specifications for the communicat ions processor module (CPM ) of
the MPC875/870.
13.1 Port C Interrupt AC Electrical Specifications
Table 17 provides the timings for port C interrupts.
Table 17. Port C Interrupt Timing
NumCharacteristic
35Port C interrupt pulse width low (edge-triggered mode)55—ns
36Port C interrupt minimum time between active edges55—ns
Figure 40 shows the port C interrupt detection timing.
36
Port C
(Input)
35
Figure 40. Port C Interrupt Detection Timing
33.34 MHz
Unit
MinMax
MPC875/MPC870 Hardware Specifications, Rev. 3.0
46PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
CPM Electrical Characteristics
13.2 IDMA Controller AC Electrical Specifications
Table 18 provides the IDMA controller timings as shown in Figure 41 to Figure 44.
Table 18. IDMA Controller Timing
NumCharacteristic
All
Frequencies
MinMax
Unit
40DREQ
41DREQ hold time from clock high
42SDACK
43SDACK negation delay from clock low—12ns
44SDACK negation delay from TA low—20ns
45SDACK negation delay from clock high—15ns
46TA assertion to falling edge of the clock setup time (applies to external TA)7—ns
1
Applies to high-to-low mode (EDM=1)
(Output)
DREQ
(Input)
setup time to clock high7—ns
1
assertion delay from clock high—12ns
CLKO
41
40
TBD—ns
Figure 41. IDMA External Requests Timing Diagram
MPC875/MPC870 Hardware Specifications, Rev. 3.0
47PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
CPM Electrical Characteristics
(
(
(
(
(
(
(
CLKO
Output)
TS
Output)
R/W
Output)
42
DATA
TA
(Input)
SDACK
43
46
Figure 42. SDACK Timing Diagram—Peripheral Write, Externally-Generate d TA
CLKO
Output)
TS
Output)
R/W
Output)
DATA
TA
Output)
SDACK
4244
Figure 43. SDACK Timing Diagram—Peripheral Write, Internally-Generated TA
48PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
MPC875/MPC870 Hardware Specifications, Rev. 3.0
CPM Electrical Characteristics
(
(
(
(
CLKO
Output)
TS
Output)
R/W
Output)
DATA
TA
Output)
SDACK
4245
Figure 44. SDACK Timing Diagram—Peripheral Read, Internally-Generated TA
13.3 Baud Rate Generator AC Electrical Specifications
Table 19 provides the baud rate generator timings as shown in Figure 45.
Table 19. Baud Rate Generator Timing
All
NumCharacteristic
50BRGO rise and fall time —10ns
51BRGO duty cycle4060%
52BRGO cycle40—ns
50
BRGOX
51
52
50
51
Frequencies
MinMax
Unit
Figure 45. Baud Rate Generator Timing Diagram
49PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
MPC875/MPC870 Hardware Specifications, Rev. 3.0
CPM Electrical Characteristics
13.4 Timer AC Electrical Specifications
Table 20 provides the general-purpose timer timings as shown in Figure 46.
NumCharacteristic
Table 20. Timer Timi ng
All
Frequencies
MinMax
Unit
61TIN/TGATE
62TIN/TGATE low time1—clk
63TIN/TGATE high time2—clk
64TIN/TGATE cycle time3—clk
65CLKO low to TOUT valid325ns
56PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
CPM Electrical Characteristics
13.6 SCC in NMSI Mode Electrical Specifications
Table 22 provides the NMSI external clock timing.
Table 22. NMSI External Clock Timing
All Frequencies
NumCharacteristic
MinMax
100RCLK3 and TCLK3 width high
101 RCLK3 and TCLK3 width low1/SYNCCLK +5—ns
102 RCLK3 and TCLK3 rise/fall time—15.00ns
103 TXD3 active delay (from TCLK3 falling edge)0.0050.00ns
104RTS3 active/inactive delay (from TCLK3 falling edge)0.0050.00ns
105CTS3 setup time to TCLK3 rising edge5.00—ns
106RXD3 setup time to RCLK3 rising edge5.00—ns
107RXD3 hold time from RCLK3 rising edge
108 CD3 setup time to RCLK3 rising edge5.00—ns
1
The ratios SyncCLK/RCLK3 and SyncCLK/TCLK3 must be greater than or equal to 2.25/1.
2
Also applies to CD and CTS hold time when they are used as external sync signals.
1
2
1/SYNCCLK—ns
5.00—ns
Unit
Table 23 provides the NMSI internal clock timing.
Table 23. NMSI Internal Clo ck Timing
All Frequencies
NumCharacteristic
MinMax
100RCLK3 and TCLK3 frequency
102 RCLK3 and TCLK3 rise/fall time——ns
103 TXD3 active delay (from TCLK3 falling edge)0.0030.00ns
104RTS3 active/inactive delay (from TCLK3 falling edge)0.0030.00ns
105CTS3 setup time to TCLK3 rising edge40.00—ns
106RXD3 setup time to RCLK3 rising edge40.00—ns
107RXD3 hold time from RCLK3 rising edge
108CD3 setup time to RCLK3 rising edge40.00—ns
1
The ratios SyncCLK/RCLK3 and SyncCLK/TCLK3 must be greater or equal to 3/1.
2
Also applies to CD and CTS hold time when they are used as external sync signals
1
2
0.00SYNCCLK/3 MHz
0.00—ns
Unit
MPC875/MPC870 Hardware Specifications, Rev. 3.0
57PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
CPM Electrical Characteristics
Figure 52 through Figure 54 show the NMSI timings.
RCLK3
RxD3
(Input)
CD3
(Input)
CD3
YNC Input)
TCLK3
106
102
102
102101
100
107
108
107
Figure 52. SCC NMSI Receive Timing Diagram
102101
100
TxD3
(Output)
RTS3
(Output)
CTS3
(Input)
CTS3
(SYNC Input)
103
105
104
Figure 53. SCC NMSI Transmit Timing Diagram
104
107
MPC875/MPC870 Hardware Specifications, Rev. 3.0
58PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
CPM Electrical Characteristics
TCLK3
102
TxD3
(Output)
RTS3
(Output)
CTS3
(Echo Input)
102101
100
103
104
105
Figure 54. HDLC Bus Timing Diagram
13.7 Ethernet Electrical Specifications
Table 24 provides the Ethernet timings as shown in Figure 55 to Figure 57.
Table 24. Ethernet Timing
104107
All
NumCharacteristic
120CLSN width high40—ns
121RCLK3 rise/fall time —15ns
122RCLK3 width low40—ns
123RCLK3 clock period
124RXD3 setup time20—ns
125RXD3 hold time5—ns
126RENA active delay (from RCLK3 rising edge of the last data bit)10—ns
127RENA width low10 0—ns
128TCLK3 rise/fall time —15ns
129TCLK3 width low40—ns
130TCLK3 clock period
131TXD3 active delay (from TCLK3 rising edge)—50ns
132TXD3 inactive delay (from TCLK3 rising edge)6.550ns
1
1
Frequencies
MinMax
80120ns
99101ns
Unit
MPC875/MPC870 Hardware Specifications, Rev. 3.0
59PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
CPM Electrical Characteristics
Table 24. Ethernet Timing (continued)
NumCharacteristic
133TENA active delay (from TCLK3 rising edge)1050ns
134TENA inactive delay (from TCLK3 rising edge)1050ns
138CLKO1 low to SDACK asserted
139CLKO1 low to SDACK negated
1
The ratios SyncCLK/RCLK3 and SyncCLK/TCLK3 must be greater than or equal to 2/1.
2
SDACK is asserted whenever the SDMA writes the incoming frame DA into memory.
2
2
CLSN(CTS1)
(Input)
120
Frequencies
MinMax
—20ns
—20ns
Figure 55. Ethernet Collision Timing Diagram
All
Unit
RCLK3
RxD3
(Input)
RENA(CD3)
(Input)
121
121
124123
125
126
Figure 56. Ethernet Receive Timing Diagram
Last Bit
127
MPC875/MPC870 Hardware Specifications, Rev. 3.0
60PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
CPM Electrical Characteristics
TCLK3
TxD3
(Output)
TENA(RTS3)
(Input)
RENA(CD3)
(Input)
(NOTE 2)
128
131121
133134
NOTES:
Transmit clock invert (TCI) bit in GSMR is set.
1.
If RENA is negated before TENA or RENA is not asserted at all during transmit, then the
2.
CSL bit is set in the buffer descriptor at the end of the frame transmission.
128
129
132
Figure 57. Ethernet Transmit Timing Diagram
13.8 SMC Transparent AC Electrical Specifications
Table 25 provides the SMC transparent timings as shown in Figure 58.
T able 25. SMC Transp arent Timing
All
NumCharacteristic
150SMCLK clock period
151SMCLK width low50—ns
151ASMCLK width high50—ns
152SMCLK rise/fall time —15ns
153SMTXD active delay (from SMCLK falling edge)1050ns
154SMRXD/SMSYNC setup time20—ns
155RXD1/SMSYNC hold time5—ns
1
SyncCLK must be at least twice as fast as SMCLK.
1
Frequencies
MinMax
100—ns
Unit
MPC875/MPC870 Hardware Specifications, Rev. 3.0
61PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
CPM Electrical Characteristics
SMCLK
152
SMTXD
(Output)
SMSYNC
SMRXD
(Input)
NOTE:
This delay is equal to an integer number of character-length clocks.1.
152151
NOTE
154153
155
154
155
151
150
Figure 58. SMC Transparent Timing Diagram
13.9 SPI Master AC Electrical Specifications
Table 26 provides the SPI master timings as shown in Figure 59 and Figure 60.
Table 26. SPI Master Timing
All
NumCharacteristic
160MASTER cycle time41024t
161MASTER clock (SCK) high or low time2512t
162MASTER data setup time (inputs)15—ns
163Master data hold time (inputs)0—ns
164Master data valid (after SCK edge)—10ns
165Master data hold time (outputs)0—ns
166Rise time output—15ns
167Fall time output—15ns
Frequencies
MinMax
Unit
cyc
cyc
MPC875/MPC870 Hardware Specifications, Rev. 3.0
62PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
CPM Electrical Characteristics
SPICLK
(CI=0)
(Output)
161160
SPICLK
(CI=1)
(Output)
163
162
166167161
167
166
SPIMISO
(Input)
SPIMOSI
(Output)
SPICLK
(CI=0)
(Output)
SPICLK
(CI=1)
(Output)
SPIMISO
(Input)
msbDatalsbmsb
165164
167166
msblsbmsb
Data
Figure 59. SPI Master (CP = 0) Timing Diagram
166167161
161160
162
163
166
msbDatalsbmsb
167
165164
167166
SPIMOSI
(Output)
msblsbmsb
Data
Figure 60. SPI Master (CP = 1) Timing Diagram
MPC875/MPC870 Hardware Specifications, Rev. 3.0
63PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
CPM Electrical Characteristics
13.10SPI Slave AC Electrical Specifications
Table 27 provides the SPI slave timings as shown in Figure 61 and Figure 62.
Table 27. SPI Slave Timing
NumCharacteristic
All
Frequencies
MinMax
Unit
170Slave cycle time2—t
171Slave enable lead time15—ns
172Slave enable lag time15—ns
173Slave clock (SPICLK) high or low time1—t
174Slave sequential transfer delay (does not require deselect)1—t
175Slave data setup time (inputs)20—ns
176Slave data hold time (inputs)20—ns
177Slave access time—50ns
SPISEL
(Input)
171172
174
SPICLK
(CI=0)
(Input)
181182173
173170
SPICLK
(CI=1)
(Input)
177182
180
181
178
cyc
cyc
cyc
SPIMISO
(Output)
SPIMOSI
(Input)
175179
176182
msblsbmsb
DatamsblsbmsbUndef
181
Data
Figure 61. SPI Slave (CP = 0) Timing Diagram
MPC875/MPC870 Hardware Specifications, Rev. 3.0
64PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
CPM Electrical Characteristics
S
S
SPISEL
(Input)
171170
SPICLK
(CI=0)
(Input)
173
SPICLK
(CI=1)
(Input)
177182
173
180
172
174
181182
181
178
PIMISO
(Output)
175179
PIMOSI
(Input)
msb
176182
msblsb
Data
181
Data
lsbUndef
Figure 62. SPI Slave (CP = 1) Timing Diagram
13.11I2C AC Electrical Specifications
Table 28 provides the I2C (SCL < 100 KHz) timings.
Table 28. I2C Timing (SCL < 100 KHZ)
All
NumCharacteristic
200SCL clock frequency (slave)0100KHz
200SCL clock frequency (master)
202Bus free time between transmissions 4.7—µs
1
Frequencies
MinMax
1.5100KHz
msb
msb
Unit
203Low period of SCL4.7—µs
204High period of SCL4.0—µs
205Start condition setup time4.7—µs
206Start condition hold time4.0—µs
207Data hold time0—µs
208Data setup time250—ns
209SDL/SCL rise time —1µs
MPC875/MPC870 Hardware Specifications, Rev. 3.0
65PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
CPM Electrical Characteristics
Table 28. I2C Timing (SCL < 100 KHZ) (continued)
NumCharacteristic
210SDL/SCL fall time —300ns
211Stop condition setup time4.7—µs
1
SCL frequency is given by SCL = BRGCLK_frequency / ((BRG register + 3) × pre_scalar × 2).
The ratio SyncClk/(BRGCLK/pre_scalar) must be greater than or equal to 4/1.
Frequencies
MinMax
Table 29 provides the I2C (SCL > 100 KHz) timings.
Table 29. I2C Timing (SCL > 100 KHZ)
All Frequencies
NumCharacteristicExpression
MinMax
200SCL clock frequency (slave)fSCL0BRGCLK/48Hz
200SCL clock frequency (master)
1
fSCLBRGCLK/16512BRGCLK/48Hz
All
Unit
Unit
202Bus free time between transmissions —1/(2.2 × fSCL)—s
203Low period of SCL—1/(2.2 × fSCL)—s
204High period of SCL—1/(2.2 × fSCL)—s
205Start condition setup time—1/(2.2 × fSCL)—s
206Start condition hold time—1/(2.2× fSCL)—s
207Data hold time—0—s
208Data setup time—1/(40 × fSCL)—s
209SDL/SCL rise time ——1/(10 × fSCL)s
210SDL/SCL fall time——1/(33 × fSCL)s
211Stop condition setup time—1/2(2.2 × fSCL)—s
1
SCL frequency is give n by SCL = BrgClk_freq uency / ((BRG reg ister + 3)× pre_scalar × 2).
The ratio SyncClk/(Brg_Clk/pre_scalar) must be greater than or equal to 4/1.
MPC875/MPC870 Hardware Specifications, Rev. 3.0
66PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
USB Electrical Characteristics
Figure 63 shows the I2C bus timing.
SDA
202
205
SCL
206209211210
203
207
Figure 63. I2C Bus Timing Diagram
204
208
14 USB Electrical Characteristics
This section provides the AC timings for the USB interface.
14.1 USB Interface AC Timing Specifications
The USB Port uses the transmit clock on SCC1. Table 30 lists the USB interface timin gs.
Table 30. USB Interface AC Timing Specifications
NameCharacteristic
US1USBCLK frequency of operation
Low speed
Full speed
1
All Frequencies
MinMax
6
48
Unit
MHz
MHz
US4USBCLK duty cycle (measured at 1.5 V)4555%
1
USBCLK accuracy should be ± 500 ppm or better. USBCLK may be stopped to conserve power.
15 FEC Electrical Characteristics
This section provides the AC electrical specifications for the fast Ethernet controller (FEC). Note that the timing
specifications for the MII signals are independent of system clock frequency (part speed designation). Also, MII
signals use TTL signal levels compatible with devices operating at either 5.0 V or 3.3 V.
15.1 MII and Reduced MII Receive Signal Timing
The receiver functions correctly up to a MII_RX_CLK maximum frequency of 25 MHz +1%. The reduced MII
(RMII) receiver functions correctly up to a RMII_REFCLK maximum frequency of 50 MHz + 1%. There is no
minimum frequency requirement. In addition, the processor clock frequency must exceed the MII_RX_CLK
frequency – 1%.
MPC875/MPC870 Hardware Specifications, Rev. 3.0
67PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
FEC Electrical Characteristics
Table 31 provides information on the MII receive signal timing.
Table 31. MII Receive Signal Timing
NumCharacteristicMinMaxUnit
M1MII_RXD[3:0], MII_RX_DV, MII_RX_ER to MII_RX_CLK setup5—ns
M2MII_RX_CLK to MII_RXD[3:0], MII_RX_DV, MII_RX_ER hold5—ns
M3MII_RX_CLK pulse width high35%65%MII_RX_CLK period
M4MII_RX_CLK pulse width low35%65%MII_RX_CLK period
M1_R
M2_R
RMII_RXD[1:0], RMII_CRS_DV, RMII_RX_ERR to RMII_REFCLK
MII
setup
RMII_REFCLK to RMII_RXD[1:0], RMII_CRS_DV, RMII_RX_ERR
MII
hold
Figure 64 shows MII receive signal timing.
MII_RX_CLK (input)
MII_RXD[3:0] (inputs)
MII_RX_DV
MII_RX_ER
M1
Figure 64. MII Receive Signal Timing Diagram
4—ns
2—ns
M3
M4
M2
15.2 MII and Reduced MII Transmit Signal Timing
The transmitter functions correctly up to a MII_TX_CLK maximum frequency of 25 MHz + 1%. There is no
minimum frequency requirement. In addition, the processor clock frequency must exceed the MII_TX_CLK
frequency – 1%.
Table 32 provides information on the MII transmit signal timing.
Table 32. MII Transmit Signal Timing
NumCharacteristicMinMaxUnit
M5MII_TX_CLK to MII_TXD[3:0], MII_TX_EN, MII_TX_ER invalid5—ns
M6MII_TX_CLK to MII_TXD[3:0], MII_TX_EN, MII_TX_ER valid—25ns
M7MII_TX_CLK pulse width high35%65%MII_TX_CLK period
M8MII_TX_CLK pulse width low35%65%MII_TX_CLK period
MPC875/MPC870 Hardware Specifications, Rev. 3.0
68PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
FEC Electrical Characteristics
Table 32. MII Transmit Signal Timing (continued)
NumCharacteristicMinMaxUnit
M20_R
M21_R
RMII_TXD[1:0], RMII_TX_EN to RMII_REFCLK setup 4—ns
MII
RMII_TXD[1:0], RMII_TX_EN data hold from RMII_REFCLK rising
MII
edge
Figure 65 shows the MII transmit signal timing diagram.
M7
MII_TX_CLK (input)
M5
MII_TXD[3:0] (outputs)
MII_TX_EN
MII_TX_ER
M6
Figure 65. MII Transmit Signal Timing Diagram
2—ns
M8
15.3 MII Async Inputs Signal Timing (MII_CRS, MII_COL)
Table 33 provides information on the MII async inputs signal timing.
Table 33. MII Async Inputs Signal Timing
NumCharacteristicMinMaxUnit
M9MII_CRS, MII_COL minimum pulse width1.5—MII_TX_CLK period
Figure 66 shows the MII asynchronous inputs signal timing diagram.
MII_CRS, MII_COL
M9
Figure 66. MII Async Inputs Timing Diagram
MPC875/MPC870 Hardware Specifications, Rev. 3.0
69PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
FEC Electrical Characteristics
15.4 MII Serial Management Channel Timing (MII_MDIO, MII_MDC)
Table 34 provides information on the MII serial management channel signal timing. The FEC functions correctly
with a maximum MDC frequency in excess of 2.5 MHz. The exact upper bound is under investigation.
Table 34. MII Serial Management Channel Timing
NumCharacteristicMinMaxUnit
M10MII_MDC falling edge to MII_MDIO output invalid (minimum
propagation delay)
M11MII_MDC falling edge to MII_MDIO output valid (max prop delay)—25ns
M12MII_MDIO (input) to MII_MDC rising edge setup10—ns
M13MII_MDIO (input) to MII_MDC rising edge hold0—ns
M14MII_MDC pulse width high40%60%MII_MDC period
M15MII_MDC pulse width low40%60%MII_MDC period
0—ns
Figure 67 shows the MII serial management channel timing diagram.
M14
MM15
MII_MDC (output)
M10
MII_MDIO (output)
M11
MII_MDIO (input)
M12
M13
Figure 67. MII Serial Management Channel Timing Diagram
MPC875/MPC870 Hardware Specifications, Rev. 3.0
70PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
Mechanical Data and Ordering Information
16 Mechanical Data and Ordering Information
Table 35 identifies the packages and operating frequencies available for the MPC875/870.
Table 35. Available MPC875/870 Packages/Frequencies
Package TypeTemperature (Tj) Frequency (MHz)Order Number
Plastic ball grid array
ZT suffix — Leaded
VR suffix — Lead-Free are available as needed
Plastic ball grid array
CZT suffix — Leaded
CVR suffix — Lead-Free are available as needed
0°C to 95°C66KMPC875ZT66
KMPC870ZT66
MPC875ZT66
MPC870ZT66
80KMPC875ZT80
KMPC870ZT80
MPC875ZT80
MPC870ZT80
133KMPC875ZT133
KMPC870ZT133
MPC875ZT133
MPC870ZT133
-40°C to 100°C66KMPC875CZT66
KMPC870CZT66
MPC875CZT66
MPC870CZT66
133KMPC875CZT133
KMPC870CZT133
MPC875CZT133
MPC870CZT133
16.1 Pin Assignments
Figure 68 shows the JEDEC pinout of the PBGA package as viewed from the top surface. For additional
information, see the MPC885 PowerQUICC Family User’s Manual.
NOTE
The pin numbering starts with B2 in order to conform to the JEDEC standard for
23-mm body size using a 16× 16 array.
MPC875/MPC870 Hardware Specifications, Rev. 3.0
71PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
80PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
Mechanical Data and Ordering Information
16.2 Mechanical Dimensions of the PBGA Package
Figure 69 shows the mechanical dimensions of the PBGA package.
NOTES:
1. ALL DIMENSIONS ARE IN MILLIMETERS.
2. INTERPRET DIMENSIONS AND TOLERANCES PER ASME Y14.5M—1994.
3. MAXIMUM SOLDER BALL DIAMETER MEASURED PARALLEL TO DATUM A.
4. DATUM A, THE SEATING PLANE, IS DEFINE D BY T H E SP H ERI C AL CR O W NS O F THE SOLDER BALLS.
Note: Solder sphere composition is 95.5%Sn 45%Ag 0.5%Cu for MPC875/870VRXXX.
Solder sphere composition is 62%Sn 36%Pb 2%Ag for MPC875/870ZTXXX.
Figure 69. Mechanical Dimensions and Bottom Surface Nomenclature of the PBGA Package
MPC875/MPC870 Hardware Specifications, Rev. 3.0
Freescale Semiconduc torPRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICE81
Document Revision History
17 Document Revision History
Table 37 lists significant changes between revisions of this hardware specification.
Table 37. Document Revision History
Revision
Number
02/2003Initial release.
0.13/2003Took out the time-slot assigner and changed the SCC for SCC3 to SCC4.
0.25/2003Changed the package drawin g, removed all refere nces to Data Parity. Changed the SPI
0.35/2003Made sure the pin types were correct. Changed the Features list to agree with the
0.45/2003Corrected the sign als that had overlines o n them. Made correcti ons on two pins that we re
0.55/2003Changed the pin descriptions for PD8 and PD9.
0.65/2003Changed a few typos. Pu t back the I2C. Pu t in the new rese t configuratio n, corrected th e
0.76/2003Changed the pin descriptions per the June 22 spec, removed Utopia from the pin
0.88/2003Added the reference to USB 2.0 to the Features list and removed 1.1 from USB on the
0.98/2003Changed the USB description to full-/low-speed compatible.
DateChanges
Master Timi ng Specs. 162 and 164. Added the RMII an d USB timing. Adde d the 80-MHz
timing.
MPC885.
typos.
USB timing.
descriptions, changed PADIR, PBDIR, PCDIR and PDDIR to be 0 in the Mandatory
Reset Config.
block diagrams.
1.09/2003Added t he DSP inform ation in the F eatures list.
Put a new sentence under Mechanical Dimensions.
Fixed table formatting.
Nontechnical edits.
Released to the external web.
1.110/2003Added TDMb to the MPC875 Features list, the MPC875 Block Diagram, added 13.5
Serial Interface AC Electrical Specifications, and removed TDMa from the pin
descriptions.
MPC875/MPC870 Hardware Specifications, Rev. 3.0
82PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICEFreescale Semiconduct or
Table 37. Document Revision History (continued)
Document Revision History
Revision
Number
2.012/2003Changed DBGC in the Mandatory Reset Configuration to X1.
3.01/07/2004
DateChanges
Changed the maximum operating frequency to 133 MHz.
Put the timing in the 80 MHz column.
Put in the orderable part numbers.
Rounded the timings to hundredths in the 80 MHz column.
Put the pin numbers in footnotes by the maximum currents in Table 6.
Changed 22 and 41 in the Timing.
Put TBD in the Thermal table.
• Added sentence to Spec B1A about EXTCLK and CLKOUT being in Alignment for
7/19/2004
Integer Values
• Added a footnote to Spec 41 specifying that EDM = 1
• Added the thermal numbers to Table 4.
• Added RMII1_EN under M1II_EN in Table 36 Pin Assignments
• Added a tablefootnote to Table 6 DC Electrical Specifications about meeting the VIL
Max of the I2C Sta nda rd
• Put the new part numbers in the Ordering Information Section
MPC875/MPC870 Hardware Specifications, Rev. 3.0
Freescale Semiconduc torPRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICE83
How to Reach Us:
USA/Europe/Locations Not Listed:
Freescale Semiconductor
Literature Distribution Center
P.O. Box 5405,
Denver, Colorado 80217
1-480-768-2130
(800) 521-6274
Japan:
Freescale Semiconductor Japan Ltd.
Technical Information Center
3-20-1, Minami-Azabu, Minato-ku
Tokyo 106-8573, Japan
81-3-3440-3569
Asia/Pacific:
Freescale Semiconductor Hong Kong Ltd.
2 Dai King Street
Tai Po Industrial Estate
Tai Po, N.T. Hong Kong
852-26668334
Home Page:
www.freescale.com
Information in this document is provided solely to enable system and software implementers to use
Freescale Semiconductor products. There are no express or implied copyright licenses granted
hereunder to design or fabricate any integrated circuits or integrated circuits based on the information
in this document.
Freescale Semiconductor reserves the right to make changes without further notice to any products
herein. Freescale Semiconductor makes no warranty, representation or guarantee regarding the
suitability of its products for any particular purpose, nor does Freescale Semiconductor assume any
liability arising out of the application or use of any product or circuit, and specifically disclaims any
and all liability, inclu ding without limitation consequential or incidental damages. “Typ ical” parameters
which may be provided in Freescale Semiconductor data sheets and/or specifications can and do
vary in different applications and actual performance may vary over time. All operating parameters,
including “Typicals” must be validated for each customer application by customer’s technical experts.
Freescale Semiconductor does not convey any license under its patent rights nor the rights of others.
Freescale Semiconductor products are not designed, intended, or authorized for use as components
in systems intended for surgical implant into the body, or other applications intended to support or
sustain life, or for any other application in which the failure of the Freescale Semiconductor product
could create a situation where personal injury or death may occur. Should Buyer purchase or use
Freescale Semiconductor products for any such unintended or unauthorized application, Buyer shall
indemnify and hold Freescale Semiconductor and its officers, employees, subsidiaries, affiliates, and
distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney
fees arising out of, directly or indirectly, any claim of personal injury or death associated with such
unintended or unauthorized use, even if such claim alleges that Freescale Semiconductor was
negligent regarding the design or manufacture of the part.
Learn More: For more information about Freescale Semiconductor products, please visit
www.freescale.com
Freescale™ and the Freescale logo are trademarks of Freescale Semiconductor, Inc. The described
product contains a PowerPC processor core. The PowerPC name is a trademark of IBM Corp. and
used under license. All other product or service names are the property of their respective owners.