This document contains detailed information on power
considerations, DC/AC electrical characteristics, and AC timing
specifications for the MPC866/859 family (refer to Table 1 for a
list of devices). The MPC866P is the superset device of the
MPC866/859 family.This document describe s pertinent electrical
and physical characteristics of the MPC8245. For functional
characteristics of the processor, refer to the MPC866 PowerQUICC Family Users Manual (MPC866UM/D).
1Overview
The MPC866/859 is a derivative of Freesca le’s MPC860
PowerQUICC™ family of devices. It is a versatile single-chip
integrated mic roprocessor and per ipher al combin ation th at can be
used in a variety of controller applications and communications
and networking systems. The MPC866/859/859DSL provides
enhanced ATM func tionality over that of other ATM- enable d
members of the MPC860 family.
Table 1 shows the functionality supported by the members of the MPC866/859 family.
2Features
Table 1. MPC866 Family Functionality
CacheEthernet
Par t
Instruction Data 10T10/100
MPC866P 16 Kbytes8 KbytesUp to 4 1 4 2
MPC866T 4 Kbytes4 KbytesUp to 4 1 4 2
MPC859P16 Kbytes8 Kbytes1112
MPC859T 4 Kbytes4 Kbytes1112
MPC859DSL4 Kbytes4 Kbytes111
MPC852T
1
On the MPC859DSL, the SCC (SCC1) is for ethernet only. Also, the MPC859DSL does not support the Time Slot
Assigner (TSA).
2
On the MPC859DSL, the SMC (SMC1) is for UART only.
3
For more details on the MPC852T, please refer to the
3
4 KBytes4 Kbytes2121
MPC852T Hardware Specifications.
SCC SMC
1
1
2
The following list summarize s the key MPC866/859 features:
•Embedded single-issue , 32- bit PowerPC™ core (implementing the PowerPC architecture) with
thirty-two 32-bit general-purpose registers (GPRs)
— The core performs branch predi ct ion with conditional prefetch, without conditional execution
— 4- or 8-Kbyte data cache and 4- or 16-Kbyte instruction cache (see Table 1)
– 16-Kbyte instruction cache (MPC866P and MPC859P) is four-way, set-associative with 256 sets;
4-Kbyte instruction cache (MPC866T, MPC859T, and MPC859DSL) is two-wa y, set- associative
with 128 sets.
– 8-Kbyte data cache (MPC866P and MPC859P) is two-way, set-associative with 256 sets; 4-Kbyte
data cache(MPC866T, MPC859T, and MPC859DSL) is two-way, set-associative with 128 sets.
– Cache coherency for both instruction and data caches is maintained on 128-bit (4-word) cache
blocks
– Caches are physic ally addresse d, implement a least rec ently used (LRU) replacement a lgorithm, and
are lockable on a cache block basis.
— MMUs with 32-entry TLB, fully associative instruction and data TLBs
— MMUs support multiple page sizes of 4, 16, and 512 Kbytes, and 8 Mbytes; 16 virtual address spaces
and 16 protection groups.
— Advanced on-chip-emulation debug mode
•The MPC866/859 provides enhanced ATM functionality over that of the MPC860 SAR. The MPC866/859
adds major new features avail able in 'enhanced SAR' (ESAR) mode, including the following:
— Improved operation, administration, and maintenance (OAM) support
— OAM performance monitoring (PM) support
— Multiple APC priority leve ls available to support a range of traff ic pace requirements
MPC866/MPC859 Hardware Specifications, Rev. 2
2Freescale Semiconductor
— ATM port-to-port switching capability without the need for RAM-based microcode
— Simultaneous MII (10/100Ba se-T) and UTOPIA (half-duplex) capability
— Optional statistical cell counters per PHY
— UTOPIA level 2 compliant inte rface with added FIFO buffering to reduce the total cell transmission
time. (The earlier UTOPIA level 1 specification is also supported.)
– Multi-PHY support on the MPC866, MPC859P, and MPC859T
– Four PHY support on the MPC866/859
2
— Parameter RAM for both SPI and I
C can be relocated without RAM-based microcode
— Supports full- duplex UTOPI A both master (ATM side) and slave ( PHY side) oper ation using a 'split ' bus
— AAL2/VBR functionality is ROM-res ident.
•Up to 32-bit data bus (dynamic bus sizing for 8, 16, and 32 bits)
•Thirty-two address lines
•Memory controller (eight banks)
— Contains complete dynamic RAM (DRAM) controller
— Each bank can be a chi p select or RAS
to support a DRAM bank
— Up to 30 wait states programmable per memory bank
— Glueless interfa ce to page mode/EDO/S DRAM, SRAM, EPROMs, flash EPROMs, and other memory
devices.
— DRAM controller programmable to support most size and speed memory interfaces
— Four CAS
lines, four WE lines, and one OE line
— Boot chip-select avai lable at reset (options for 8-, 16-, or 32-bit memory)
— Variable block sizes (32 Kbytes–256 Mbytes)
— Selectable write protection
— On-chip bus arbitrat ion logic
•General-purpose timers
— Four 16-bit timers casca dable to be two 32-bit timers
— Gate mode can enab l e/d isa b le coun t ing
— Interrupt can be masked on reference match and event capture
•Fast Ethernet controller (FEC)
— Simultaneous MII (10/100Ba se-T) and UTOPIA operation when using the UTOPIA multip lexed bus
•System integration unit (SIU)
— Bus monitor
— Software watchdog
— Periodic interrupt timer (PIT)
— Low-power stop mode
— Clock synthesizer
— Decrementer and time base from the PowerPC architecture
— Reset controller
— IEEE 1149.1 test access port (JTAG)
Features
MPC866/MPC859 Hardware Specifications, Rev. 2
Freescale Semiconductor3
Features
•Interrupts
— Seven external interrupt request (IRQ) l ines
— T welve port pins with interrupt capability
— The MPC866P and MPC866T have 23 internal interrupt sour ces; the MPC859P, MPC859T, and
MPC859DSL have 20 internal interru pt sources.
— Programmable priority between SCCs (MPC866P and MPC866T)
— Programmable highest pri ority request
— Supports continuous mode tr ansmission and reception on all serial channe ls
— Up to 8-Kbytes of dual-port RAM
— MPC866P and MPC866T have 16 serial DMA (SDMA) channels; MPC859P, MPC859T, and
MPC859DSL have 10 serial DMA (SDMA) channels.
— Three para lle l I/O regist ers with ope n -drai n capab i lity
•Four baud rate generators
— Independent (can be connected to any SCC or SMC)
— Allow changes during operation
— Autobaud support option
•MPC866P and MPC866T have four SCCs (serial communication controller); MPC859P, MPC859T, and
MPC859DSL have one SCC; and SCC1 on MPC859DSL supports Ethernet only.
— Serial ATM capability on all SCCs
— Optional UTOPIA port on SCC4
— Ethernet/IEEE 802.3 optional on SCC1–4, supporting full 10-Mbps operation
— HDLC/SDLC
— HDLC bus (implements an HDLC-based local area network (LAN))
— Asynchronous HDLC to support PPP (point-to-point protocol)
— AppleTalk
— Universal asynchro nous receiver transmitter (UART)
— Synchronous UART
— Serial infrared (Ir DA)
— Binary synchronous communication (BISYNC)
— T otally transparent (bit str eams)
— T otally transparent (fra me based with optional cyclic redundancy check (CRC)
•Two SMCs (serial management channels) (MPC859DSL has one SMC (SMC1) for UART.)
— UART
— Transparent
— General circuit interface (GCI) controller
— Can be connected to the time-division multiplexed (TDM) channels
MPC866/MPC859 Hardware Specifications, Rev. 2
4Freescale Semiconductor
Features
•One serial peripheral interface (SPI)
— Supports master and slave modes
— Supports multiple-m aster operation on the same bus
2
•One inter-i ntegrated circuit (I
C) port
— Supports master and slave modes
— Multiple-master en vironment support
•Time slot assigner (TSA) (MPC859DSL does not have TSA.)
— Allows SCCs and SMCs to run in multiplexed and/or non-multiplexed operation
— Supports T1, CEPT, PCM highway, ISDN basic rate, ISDN primary rate, user -defined
— 1- or 8-bit resolution
— Allows independent transm it and receive routing, frame synchronization, and clocking
— Allows dynamic changes
— On MPC866P and MPC866T , can be internally connected to six serial channels (four SCCs and two
SMCs); on MPC859P and MPC859T, can be connected to three serial channe ls (one SCC and two
SMCs).
•Parallel interface port (PIP)
— Centronics interface support
— Supports fast connection between compatible ports on MPC866/859 or MC68360
•PCMCIA interface
— Master (socket) interface, compliant with PCI Local Bus Specification (Rev 2.1)
— Supports one or two PCMCIA sockets whether ESAR functio nality is enabled
— Eight memory or I/O windows supported
•Debug interface
— Eight comparators : four operate on instr uction add ress, two operate on data address, and two ope rate on
data.
— Supports conditions: = ≠ < >
— Each watchpoint can generate a breakpoint internally
•Normal high and normal low power modes to conserve power
•1.8 V core and 3.3 V I/O operation with 5-V TTL compatibility; refer to Table 6 for a listing of the 5-V
tolerant pins.
•357-pin plastic ball grid array (PBGA) package
•Operation up to 133 MHz
MPC866/MPC859 Hardware Specifications, Rev. 2
Freescale Semiconductor5
Features
The MPC866/859 is comprised of three modules that each use a 32-bit internal bus: MPC8xx core, system
integration unit (SIU), and communication processor module (CPM). The MPC866P block diagram is shown in
Figure 1. The MPC859P/859T/859DSL block diagram is shown in Figure 2.
Embedded
MPC8xx
Processor
Core
Fast Ethernet
Controller
DMAs
FIFOs
10/100
Base-T
Media Access
Control
MII
Instruction
Bus
Load/Store
Bus
Parallel I/O
4 Baud Rate
Generators
Parallel Interface Port
and UTOPIA
16-Kbyte
Instruction Cache
Instruction MMU
32-Entry ITLB
8-Kbyte
Data Cache
Data MMU
32-Entry DTLB
SCC1
Unified
Bus
4
Interrupt
Timers
Timers
Controllers
32-Bit RISC Controller
and Program
ROM
SCC3SCC4
Time SlotAssigner
Time Slot Assigner
System Interface Unit (SIU)
Bus Interface
8-Kbyte
Dual-Port RAM
Memory Controller
Internal
Unit
System Functions
PCMCIA/ATA Interface
External
Bus Interface
Unit
16 Virtual
Serial
and
2
Independent
DMA
Channels
I2CSPISMC2SMC1SCC2
Serial Interface
Figure 1. MPC866P Block Diagram
MPC866/MPC859 Hardware Specifications, Rev. 2
6Freescale Semiconductor
Embedded
MPC8xx
Processor
Core
Fast Ethernet
Controller
DMAs
FIFOs
10/100
Base-T
Media Access
Control
MII
Instruction
Bus
Load/Store
Bus
Parallel I/O
4 Baud Rate
Generators
Parallel Interface Port
and UTOPIA
†
4-Kbyte
Instruction Cache
Instruction MMU
32-Entry ITLB
†
4-Kbyte
Data Cache
Data MMU
32-Entry DTLB
4
Timers
Controllers
32-Bit RISC Controller
Timers
Unified
Bus
Interrupt
and Program
ROM
System Interface Unit (SIU)
Bus Interface
8-Kbyte
Dual-Port RAM
Memory Controller
Internal
External
Bus Interface
Unit
Unit
System Functions
PCMCIA/ATA Interface
10 Virtual
Serial
and
2
Independent
DMA
Channels
Features
SCC1
Time SlotAssigner
Time Slot Assigner*
I2CSPISMC2*SMC1
Serial Interface
†
The MPC859P has a 16-Kbyte instruction cache and a 8-Kbyte data cache.
* The MPC859DSL does not contain SMC2 nor the time slot assigner, and provides eight SDMA
controllers.
Figure 2. MPC859P/859T/MPC859DSL Block Diagram
MPC866/MPC859 Hardware Specifications, Rev. 2
Freescale Semiconductor7
Maximum Tolerated Ratings
3Maximum Tolerated Ratings
This section provides the maximum tolerated voltage and temperature ranges for the MPC866/859. Table 2 shows
the maximum tolerated ratings, and Table 3 shows the operating temperatures.
Table 2. Maximum Tolerated Ratings
RatingSymbolValueUnit
Supply voltage
Input voltage
Storage temperature rangeT
1
The power supply of the device must start its ramp from 0.0 V.
2
Functional operating conditions are provided with the DC electrical specifications in Tab l e 6 . Absolute maximum
ratings are stress ratings only; functional operation at the maxima is not guaranteed. Stress beyond those listed may
affect device reliability or cause permanent damage to the device. See page 15.
Caution: All inputs that tolerate 5 V cannot be more than 2.5 V greater than VDDH. This restriction applies to
power-up and normal operation (that is, if the MPC866/859 is unpowered, a voltage greater than 2.5 V must not be
applied to its inputs).
1
2
VDDH– 0.3 to 4.0V
VDDL– 0.3 to 2.0V
VDDSYN– 0.3 to 2.0V
Difference between VDDL to VDDSYN100mV
V
in
stg
GND – 0.3 to VDDHV
–55 to +150°C
Table 3. Operating Temperatures
RatingSymbolValueUnit
Temperature
Temperature (extended)T
1
Minimum temperatures are guaranteed as ambient temperature, TA. Maximum temperatures are guaranteed as
junction temperature, T
1
(standard)
T
A(min)
T
j(max)
A(min)
T
j(max)
.
j
0°C
95°C
–40°C
100°C
This device contains circ uitry protecting against damage due to high- sta tic voltage or electrical fiel ds; however, it
is advised that nor mal precautions be taken to avoid a pplication of any voltages highe r than maximum-rated voltag es
to this high -impedance circuit. Reliability of operation is enhanced if unused inputs are tied to an appropriate logic
voltage level (for exampl e, either GND or VDD).
MPC866/MPC859 Hardware Specifications, Rev. 2
8Freescale Semiconductor
Thermal Characteristics
4Thermal Characteristics
Table 4 shows the thermal characteristics for the MPC866/859.
Table 4. MPC866/859 Thermal Resistance Data
RatingEnvironmentSymbolValueUnit
Junction-to-ambient
1
Natural ConvectionSingle-layer board (1s)R
Four-layer board (2s2p)R
Airflow (200 ft/min)Single-layer board (1s)R
Four-layer board (2s2p)R
Junction-to-board
Junction-to-case
Junction-to-package top
4
5
6
Natural ConvectionΨ
Airflow (200 ft/min)Ψ
1
Junction temperature is a function of on-chip power dissipation, package thermal resistance, mounting site (board)
temperature, ambient temperature, airflow, power dissipation of other components on the board, and board thermal
resistance.
2
Per SEMI G38-87 and JEDEC JESD51-2 with the single-layer board horizontal.
3
Per JEDEC JESD51-6 with the board horizontal.
4
Thermal resistance between the die and the printed-circuit board per JEDEC JESD51-8. Board temperature is
measured on the top surface of the board near the package.
5
Indicates the average thermal resistance between the die and the case top surface as measured by the cold plate
method (MIL SPEC-883 Method 1012.1) with the cold plate temperature used for the case temperature. For exposed
pad packages where the pad would be expected to be soldered, junction-to-case thermal resistance is a simulated
value from the junction to the exposed pad without contact resistance.
6
Thermal characterization parameter indicating the temperature difference between package top and junction
temperature per JEDEC JESD51-2.
θJA
θJMA
θJMA
θJMA
R
θJB
R
θJC
JT
JT
2
3
3
3
37°C/W
23
30
19
13
6
2
2
MPC866/MPC859 Hardware Specifications, Rev. 2
Freescale Semiconductor9
Power Dissipation
5Power Dissipation
Table 5 shows power dissipation information. The modes are 1:1, where CPU and bus speeds are equal, and 2:1
mode, where CPU frequency is twice the bus speed.
Table 5. Power Dissipation (PD)
Die RevisionBus Mode
01:1 50 MHz110140mW
2:166 MHz140160mW
1
Typical power dissipation at VDDL and VDDSYN is at 1.8 V. and VDDH is at 3.3 V.
2
Maximum power dissipation at VDDL and VDDSYN is at 1.9 V, and VDDH is at 3.465 V.
Values in Table 5 represent VDDL based powe r di ssipati on a nd
do not include I/O power dissipation over VDDH. I/O power
dissipation varies widely by application due to buffer current,
depending on external circuitry. The VDDSYN power
dissipation is negligi ble.
6DC Characteristics
CPU
Frequency
66 MHz150180mW
80 MHz170200mW
100 MHz210250mW
133 MHz260320mW
Typical
1
Maximum
2
NOTE
Unit
Table 6 shows the DC electrical characteristics for the MPC866/859.
Table 6. DC Electrical Specifications
CharacteristicSymbolMinMaxUnit
Operating voltageVDDL (core)1.71.9V
VDDH (I/O)3.1353.465V
1
1.71.9V
—100mV
Input high voltage (all inputs except EXTAL and
EXTCLK)
2
MPC866/MPC859 Hardware Specifications, Rev. 2
VDDSYN
Difference between
VDDL to VDDSYN
VIH2.03.465V
10Freescale Semiconductor
DC Characteristics
Table 6. DC Electrical Specifications (continued)
CharacteristicSymbolMinMaxUnit
Input low voltageVILGND0.8V
EXTAL, EXTCLK input high voltageVIHC0.7*(VDDH)VDDHV
Input leakage current, Vin = 5.5V (except TMS, TRST
DSCK and DSDI pins) for 5 Volts Tolerant Pins
For the fol lowing disc uss ions, PD = (VDDL x IDDL) + P I/O, where PI/ O is the po wer di ssipati on of the I /O driv ers.
The VDDSYN power dissipation is negligi ble.
7.1Estimation with Junction-to-Ambient Thermal Resistance
An estimation of the chip junction te mperature, TJ, in °C can be obtained from the equation:
The junction-to- ambient thermal resistance is an industry standard value that provides a quick and easy estimation
of thermal performance. However, the answer is only an estimate; test cases have demonstrated that errors of a factor
of two (in the quantity T
) are possible.
J-TA
7.2Estimation with Junction-to-Case Thermal Resistance
Historically, the thermal resi stance has f requently bee n expressed as the sum of a junction-to -case the rmal resist ance
and a case-to-ambient thermal resistance:
= R
R
θJA
where:
R
θJA
R
θJC
R
θCA
is device related and cannot be influenced by the user. The user adjusts the thermal environment to affec t the
R
θJC
case-to-am bient thermal resi s tan ce, R
heat sink, change the mounting arra ngement on the printed-circuit board, or change the thermal dissipation on the
printed-circ uit board surrounding the devic e. This thermal model is most useful fo r ceramic packages with heat sinks
where some 90% of the heat flows through the case and the heat sink to the ambient environment. For most
packages, a better model is required.
+ R
θJC
θCA
= junctio n - t o-am b ient th ermal res i s tanc e ( º C/W )
= junction-to-case thermal resistance (ºC/W)
= case-to-am bient ther mal resistance (ºC/W)
. For instance, the user can change the airflow around the device, add a
θCA
7.3Estimation with Junction-to-Board Thermal Resistance
A simple package thermal model that has demonstrated reasonable accuracy (about 20%) is a two-res istor model
consisting of a junction-t o-board and a junction-to -case thermal r esistance. Th e junction-to- case covers t he situ ation
where a heat sink is used or where a substantial amount of heat is dissipated from the top of the package. The
junction-to-board thermal resistance describes the thermal performance when most of the heat is conducted to the
printed-circ uit board. It has been observed that the thermal perfor mance of most plastic packages and especially
PBGA packages is strongly dependent on the board temperature; see Figure 3.
MPC866/MPC859 Hardware Specifications, Rev. 2
12Freescale Semiconductor
Thermal Calculation and Measurement
Figure 3. Effect of Board Temperature Rise on Thermal Behavior
If the board temperature is known, an estimate of the junction temperature in the environment can be made using
the following equatio n:
= TB +(R
T
J
θJB
x PD)
where:
= junction-to-board the rmal resistance (ºC/W)
R
θJB
= board temper atu re ºC
T
B
= power dissipation in package
P
D
If the board temperature is known and the heat loss from the package case to the air can be ignored, acceptable
predictions of junction temperature can be made. For this method to work, the board and board mounting must be
similar to the test board used to deter mine the junction-to-board thermal res istance, namely a 2s2p (board with a
power and a ground plane) and vias attaching the thermal balls to the ground plane.
7.4Estimation Using Simulation
When the boar d temperature is not known, a the rmal sim ulation of t he applic ation is needed. T he simple t wo-resistor
model can be use d with the thermal sim ulation of the application [2], or a more accurate and c omplex model of the
package can be used in the thermal simulation.
MPC866/MPC859 Hardware Specifications, Rev. 2
Freescale Semiconductor13
Thermal Calculation and Measurement
7.5Experimental Determination
To determine the junction temperature of the device in the application after prototypes are available, the thermal
characteriz at ion parameter (ΨJT) can be used to determine the junction temperature with a measurement of the
temperature at the top center of the package case using the following equation:
= TT +(ΨJT x PD)
T
J
where:
= thermal characteriz ation parameter
Ψ
JT
= thermocouple temperature on top of package
T
T
= power dissipation in package
P
D
The thermal characterization parameter is measured per JESD51-2 specification published by JEDEC using a 40
gauge type T thermocouple epoxie d to the top center of the package case. The thermocouple should be positi oned
so that the thermocouple junc tion rests on the package. A small amount of epoxy is placed over the thermocoup le
junction and over about 1 mm of wir e ext ending fr om the j unction. The thermoc ouple wire is pl aced flat again st the
package case to avoid measurement errors caused by cooling effects of the ther mocouple wire.
7.6References
Semiconductor Equipment and Materials International(415 ) 964-5111
805 East Middlefield Rd.
Mountain View, CA 94043
MIL-SPEC and EIA/JESD (JEDEC) specifications800-854-7179 or
(Available from Global Engine ering Documents)303-397-7956
JED E C Spec ifica t io ns h t t p://www.jedec.o r g
1. C.E. Triplett and B. Joiner, “An Experimental Characterization of a 272 PBGA Within an Automotive Engine
Controller Module,” Proceedings of SemiTherm, San Diego, 1998, pp. 47-54.
2. B. Joiner and V. Adams, “Measurement and Simulation of Junction to Board Thermal Resistance and Its
Application in Thermal Model ing,” Proceedings of SemiTherm, San Diego, 1999, pp. 212-220.
MPC866/MPC859 Hardware Specifications, Rev. 2
14Freescale Semiconductor
Power Supply and Power Sequencing
8Power Supply and Power Sequencing
This section provide s design considerations for the MPC866/ 859 power supply . The MPC866/859 has a core voltage
(VDDL) and PLL voltage (VDDSYN) that ope rates a t a lower voltage tha n th e I/O volta ge VDDH. The I /O sect ion
of the MPC866/859 is supplied with 3.3 V across VDDH and V
Signals PA[0:15], PB[14:31], PC[4:15], PD[3:15], TDI, TDO, TC K, TRST_B, TMS, MII_TXEN, and MII_MDIO
are 5-V tolerant. All inputs cannot be more than 2.5 V greater than VDDH. In addition, 5-V tolerant pins cann ot
exceed 5.5 V and the remaining input pins cannot exceed 3.465 V. This restriction applies to power up/down and
normal operation.
One consequence of multiple power supplies is that when power is initially applied the voltage rails ramp up at
different r ates. The rates depend on the nature of the power supply, the type of load on each power supply, and the
manner in which diffe rent voltages are derived. The following restrictions apply:
•VDDL must not exceed VDDH during power up and power down.
•VDDL must not exceed 1.9 V and VDDH must not exceed 3.465 V.
These cautio ns are necessary for the long term reliability of the part. If they are viol ated, the electrostatic discharge
(ESD) protection diodes are forward-biased and excessive current can flow through these diodes. If the system
power supply design does not contr ol the voltage sequencing, the circuit shown in Figure 4 can be added to meet
these requirement s. The MUR420 Schottky diodes control the maximum potential differen ce between the external
bus and core power supplies on powerup and the 1N5820 diodes regulate the maximum potential difference on
powerdown.
(GND).
SS
VDDHVDDL
MUR420
1N5820
Figure 4. Example Voltage Sequencing Circuit
9Layout Practices
Each VDD pin on the MPC866/859 should be provided with a low-impedan ce path to the board’s supply.
Furthermore, ea ch GND pi n shou ld be provide d wit h a l ow-impeda nce pat h to gr ound. The p ower supply pins drive
distinct groups of logic on chip. The VDD power supply should be bypassed to ground using at least four 0.1 µF
bypass capacitors located as close as possible to the four sides of the package. Each board designed should be
characterized and additional appropriate decoupling capacitors should be used if required. The capacitor leads and
associated printed-circuit traces connecting to chip V
At a minimum, a four-layer board employing two inner layers as V
All output pins on the MPC866/859 have fast rise and fall times. Printed-circuit (PC) trace interconnection length
should be minimized in order to minimize undershoot and reflections caused by these fast output switching times.
and GND should be kept to less than 1/2” per capacito r lead.
DD
and GND planes should be used.
DD
MPC866/MPC859 Hardware Specifications, Rev. 2
Freescale Semiconductor15
Bus Signal Timing
This recommendation partic ularly applies to the address and data buses. Maximum PC trace le ngths of 6” are
recommended. Capacitance calculations should consider all device loads as well as parasitic capacitances due to the
PC traces. Attention to proper PCB layout and bypassing becomes especially crit ic al in systems with higher
capacitive loads because these loads create higher transient currents in the V
and GND circuits . Pull up all unused
DD
inputs or signals that will be inputs during reset. Special care should be taken to minimize the noise levels on the
PLL supply pins. For more information, please refer to Section 14.4.3, Clock Synthesizer Power (VDDSYN,
VSSSYN, VSSSYN1), in the MPC866 User’s Manual.
10Bus Signal Timing
The maximum bus speed supported by the MPC866/859 is 66 MHz. Higher-speed parts must be operated in
half-speed bus mode (for example , an MPC866/859 use d at 100 MHz must be configured for a 50-MHz bus).
Table 7 and Table 8 show the frequency ranges for standard part frequencies.
Table 7. Frequency Ranges for Standard Part Frequencies (1:1 Bus Mode)
Part Freq50 MHz66 MHz
MinMaxMinMax
Core 40504066.67
Bus 40504066.67
Table 8. Frequency Ranges for Standard Part Frequencies (2:1 Bus Mode)
Par t
Freq
Core 40 504066.674010040133.34
Bus 20252033.3320502066.67
50 MHz66 MHz100 MHz133 MHz
MinMaxMinMaxMinMaxMinMax
Table 9 shows the timings for the MPC866/859 at 33, 40, 50, and 66 MHz bus operation. The timing for the
MPC866/859 bus shown in this table assumes a 50-pF load for maximum delays and a 0-pF load for minimum
delays. CLKOUT assumes a 100-pF load maximum delay.
requested by control bit CST4 in the
corresponding word in the UPM (MAX
= 0.00 X B1 + 6.00)
B31a CLKOUT falling edge to CS
requested by control bit CST1 in the
corresponding word in the UPM (MAX
= 0.25 x B1 + 6.80)
B31b CLKOUT rising edge to CS
requested by control bit CST2 in the
corresponding word in the UPM (MAX
= 0.00 x B1 + 8.00)
B31c CLKOUT rising edge to CS
requested by control bit CST3 in the
corresponding word in the UPM (MAX
= 0.25 x B1 + 6.30)
valid, as
valid, as
valid , as
valid , as
38.67—31.38—24.50—17.83—ns
1.506.001.506.001.506.001.506.00ns
7.6014.306.3013.005.0011.803.8010.50ns
1.508.001.508.001.508.001.508.00ns
7.6013.806.3012.505.0011.303.8010.00ns
MPC866/MPC859 Hardware Specifications, Rev. 2
Freescale Semiconductor21
Bus Signal Timing
NumCharacteristic
Table 9. Bus Operation Timings (continued)
33 MHz40 MHz50 MHz66 MHz
Unit
MinMaxMinMaxMinMaxMinMax
B31d CLKOUT falling edge to CS valid, as
requested by control bit CST1 in the
corresponding word in the UPM EBDF
= 1 (MAX = 0.375 x B1 + 6.6)
B32 CLKOUT falling edge to BS
requested by control bit BST4 in the
corresponding word in the UPM (MAX
= 0.00 x B1 + 6.00)
B32a CLKOUT falling edge to BS
requested by control bit BST1 in the
corresponding word in the UPM, EBDF
= 0 (MAX = 0.25 x B1 + 6.80)
B32b CLKOUT rising edge to BS
requested by control bit BST2 in the
corresponding word in the UPM (MAX
= 0.00 x B1 + 8.00)
B32c CLKOUT rising edge to BS
requested by control bit BST3 in the
corresponding word in the UPM (MAX
= 0.25 x B1 + 6.80)
B32d CLKOUT falling edge to BS
requested by control bit BST1 in the
corresponding word in the UPM, EBDF
= 1 (MAX = 0.375 x B1 + 6.60)
valid, as
valid, as
valid, as
valid, as
valid- as
13.3018.0011.30 16.009.4014.107.6012.30ns
1.506.001.506.001.506.001.506.00ns
7.6014.306.3013.005.0011.803.8010.50ns
1.508.001.508.001.508.001.508.00ns
7.6014.306.3013.005.0011.803.8010.50ns
13.3018.0011.30 16.009.4014.107.6012.30ns
B33 CLKOUT falling edge to GPL
requested by control bit GxT4 in the
corresponding word in the UPM (MAX
= 0.00 x B1 + 6.00)
B33a CLKOUT rising edge to GPL
requested by control bit GxT3 in the
corresponding word in the UPM (MAX
= 0.25 x B1 + 6.80)
B34 A(0:31), BADDR(28:30), and D(0:31)
to CS
valid, as requested by control bit
CST4 in the corresponding word in the
UPM (MIN = 0.25 x B1 - 2.00)
B34a A(0:31), BADDR(28:30), and D(0:31)
to CS
valid, as requested by control bit
CST1 in the corresponding word in the
UPM (MIN = 0.50 x B1 – 2.00)
B34b A(0:31), BADDR(28:30), and D(0:31)
to CS
valid, as requested by CST2 in
the corresponding word in UPM (MIN =
0.75 x B1 – 2.00)
valid, as
valid, as
MPC866/MPC859 Hardware Specifications, Rev. 2
1.506.001.506.001.506.001.506.00ns
7.6014.306.3013.005.0011.803.8010.50ns
5.60—4.30—3.00—1.80—ns
13.20—10.50—8.00—5.60—ns
20.70—16.70—13.00—9.40—ns
22Freescale Semiconductor
NumCharacteristic
Bus Signal Timing
Table 9. Bus Operation Timings (continued)
33 MHz40 MHz50 MHz66 MHz
Unit
MinMaxMinMaxMinMaxMinMax
B35 A(0:31), BADDR(28:30) to CS valid, as
requested by control bit BST4 in the
corresponding word in the UPM (MIN =
0.25 x B1 – 2.00)
B35a A(0:31), BADDR(28:30), and D(0:31)
to BS
valid, as Requested by BST1 in
the corresponding word in the UPM
(MIN = 0.50 x B1 – 2.00)
B35b A(0:31), BADDR(28:30), and D(0:31)
to BS
valid, as requested by control bit
BST2 in the corresponding word in the
UPM (MIN = 0.75 x B1 – 2.00)
B36 A(0:31), BADDR(28:30), and D(0:31)
to GPL
valid as requested by control bit
GxT4 in the corresponding word in the
UPM (MIN = 0.25 x B1 – 2.00)
B37 UPWAIT valid to CLKOUT falling
B38 CLKOUT falling edge to UPWAIT
B39 AS
8
edge
(MIN = 0.00 x B1 + 6.00)
8
(MIN = 0.00 x B1 + 1.00)
valid
valid to CLKOUT rising edge 9 (MIN
= 0.00 x B1 + 7.00)
5.60—4.30—3.00—1.80—ns
13.20—10.50—8.00—5.60—ns
20.70—16.70—13.00—9.40—ns
5.60—4.30—3.00—1.80—ns
6.00—6.00—6.00—6.00—ns
1.00—1.00—1.00—1.00—ns
7.00—7.00—7.00—7.00—ns
B40 A(0:31), TSIZ(0:1), RD/WR
, BURST,
7.00—7.00—7.00—7.00—ns
valid to CLKOUT rising edge (MIN =
0.00 x B1 + 7.00)
B41 TS
valid to CLKOUT rising edge (setup
7.00—7.00—7.00—7.00—ns
time) (MIN = 0.00 x B1 + 7.00)
B42 CLKOUT rising edge to TS
valid (hold
2.00—2.00—2.00—2.00—ns
time) (MIN = 0.00 x B1 + 2.00)
B43 AS
negation to memory controller
—TBD—TBD—TBD—TBDns
signals negation (MAX = TBD)
1
For part speeds above 50 MHz, use 9.80 ns for B11a.
2
The timing required for BR input is relevant when the MPC866/859 is selected to work with the internal bus arbiter.
The timing for BG
3
For part speeds above 50 MHz, use 2 ns for B17.
4
The D(0:31) and DP(0:3) input timings B18 and B19 refer to the rising edge of CLKOUT, in which the TA input signal
input is relevant when the MPC866/859 is selected to work with the external bus arbiter.
is asserted.
5
For part speeds above 50 MHz, use 2 ns for B19.
6
The D(0:31) and DP(0:3) input timings B20 and B21 refer to the falling edge of CLKOUT. This timing is valid only for
read accesses controlled by chip-selects under control of the UPM in the memory controller, for data beats, where
DLT3 = 1 in the UPM RAM words. (This is only the case where data is latched on the falling edge of CLKOUT.)
7
The timing B30 refers to CS when ACS = 00 and to WE(0:3) when CSNT = 0.
MPC866/MPC859 Hardware Specifications, Rev. 2
Freescale Semiconductor23
Bus Signal Timing
8
The signal UPWAIT is considered asynchronous to CLKOUT and synchronized internally. The timings specified in
B37 and B38 are specified to enable the freeze of the UPM output signals as described in Figure 20.
9
The AS signal is considered asynchronous to CLKOUT. The timing B39 is specified in order to allow the behavior
specified in Figure 23.
Figure 5 shows the control timing diagram.
CLKOUT
Outputs
Outputs
Inputs
Inputs
2.0 V
B
2.0 V
0.8 V
A
B
2.0 V
0.8 V
0.8 V
2.0 V
0.8 V
C
2.0 V
0.8 V
0.8 V
A
D
2.0 V
0.8 V
2.0 V
2.0 V
0.8 V
2.0 V
0.8 V
D
C
2.0 V
0.8 V
AMaximum output delay specification
BMinimum output hold time
CMinimum input setup time specification
DMinimum input hold time specification
Figure 5. Control Timing
MPC866/MPC859 Hardware Specifications, Rev. 2
24Freescale Semiconductor
Figure 6 shows the timing for the external clock.
CLKOUT
Bus Signal Timing
B1
B1
B4
B5
Figure 6. External Clock Timing
Figure 7 shows the timing for the synchronous output signals.
CLKOUT
B8
B7B9
Output
Signals
B8a
Output
Signals
B8b
B3
B2
B9B7a
Output
Signals
B7b
Figure 7. Synchronous Output Signals Timing
MPC866/MPC859 Hardware Specifications, Rev. 2
Freescale Semiconductor25
Bus Signal Timing
Figure 8 shows the timing for the synchronous active pull-up and open-drain output signals.
CLKOUT
B13
B12B11
TS
, BB
B13a
B11aB12a
TA , BI
B14
B15
TEA
Figure 8. Synchronous Active Pull-Up Resistor and Open-Drain Output Signals Timing
Figure 9 shows the timing for the synchronous input signals.
CLKOUT
B16
, BI
TA
B16a
TEA, KR,
RETRY
, CR
B16b
BB, BG, BR
B17
B17a
B17
Figure 9. Synchronous Input Signals Timing
MPC866/MPC859 Hardware Specifications, Rev. 2
26Freescale Semiconductor
Bus Signal Timing
Figure 10 shows normal case timing for input data. It also applies to normal read accesses under the control of the
UPM in the memory controller.
CLKOUT
B16
B17
TA
B18
B19
D[0:31],
DP[0:3]
Figure 10. Input Data Timing in Normal Case
Figure 11 shows the timing for the input data controlled by the UPM for data beats where DLT3 = 1 in the UPM
RAM words. (This is only the case where data is latched on the fal ling edge of CLKOUT. )
CLKOUT
TA
B20
B21
D[0:31],
DP[0:3]
Figure 11. Input Data Timing when Controlled by UPM in the Memory Controller and DLT3 = 1
MPC866/MPC859 Hardware Specifications, Rev. 2
Freescale Semiconductor27
Bus Signal Timing
Figure 12 through Figure 15 show the timing for the external bus read controlled by various GPCM factors.
CLKOUT
B11B12
TS
B8
A[0:31]
CSx
OE
WE[0:3]
D[0:31],
DP[0:3]
B22
B25
B28
B23
B26
B19
B18
Figure 12. External Bus Read Timing (GPCM Controlled—ACS = 00)
MPC866/MPC859 Hardware Specifications, Rev. 2
28Freescale Semiconductor
CLKOUT
TS
A[0:31]
Bus Signal Timing
B11B12
B8
B22a
CSx
B25B24
OE
D[0:31],
DP[0:3]
B23
B26
B19B18
Figure 13. External Bus Read Timing (GPCM Controlled—TRLX = 0 or 1, ACS = 10)
CLKOUT
B11B12
TS
B22bB8
A[0:31]
B22cB23
CSx
B24aB25B26
OE
B19B18
D[0:31],
DP[0:3]
Figure 14. External Bus Read Timing (GPCM Controlled—TRLX = 0 or 1, ACS = 11)
MPC866/MPC859 Hardware Specifications, Rev. 2
Freescale Semiconductor29
Bus Signal Timing
CLKOUT
A[0:31]
B11B12
TS
B8
B23
B26
CSx
OE
D[0:31],
DP[0:3]
B22a
B27
B27a
B22b B22cB19B18
Figure 15. External Bus Read Timing (GPCM Controlled—TRLX = 0 or 1, ACS = 10, ACS = 11)
MPC866/MPC859 Hardware Specifications, Rev. 2
30Freescale Semiconductor
Bus Signal Timing
Figure 16 through Figure 18 show the timing for the external bus write controlle d by various GPCM factors.
CLKOUT
TS
A[0:31]
CSx
WE[0:3]
OE
D[0:31],
DP[0:3]
B11
B8
B22B23
B26
B12
B8B9
B30
B28B25
B29b
B29
Figure 16. External Bus Write Timing (GPCM Controlled—TRLX = 0 or 1, CSNT = 0)
Table 10 shows the interrupt timing for the MPC866/859.
Table 10. Interrupt Timing
NumCharacteristic
I39IRQ
I40IRQ
I41IRQ
I42IRQ
I43IRQ
1
The timings I39 and I40 describe the testing conditions under which the IRQ lines are tested when being defined as
level sensitive. The IRQ
to the CLKOUT.
The timings I41, I42, and I43 are specified to allow the correct function of the IRQ
no direct relation with the total system interrupt latency that the MPC866/859 is able to support.
x valid to CLKOUT rising edge (setup time)6.00—ns
x hold time after CLKOUT2.00—ns
x pulse width low3.00—ns
x pulse width high3.00—ns
x edge-to-edge time4xT
lines are synchronized internally and do not have to be asserted or negated with reference
1
All Frequencies
Unit
MinMax
CLOCKOUT
lines detection circuitry, and has
——
MPC866/MPC859 Hardware Specifications, Rev. 2
Freescale Semiconductor37
Bus Signal Timing
Figure 25 shows the interrupt detection timing for the external level-sensitive lines.
CLKOUT
I39
I40
IRQ
x
Figure 25. Interrupt Detection Timing for External Level Sensitive Lines
Figure 26 shows the interrupt detection timing for the external edge-sensitive lines.
CLKOUT
I41I42
x
IRQ
I43
Figure 26. Interrupt Detection Timing for External Edge Sensitive Lines
Table 11 shows the PCMCIA timing for the MPC866/859.
Table 11. PCMCIA Timing
33 MHz40 MHz50 MHz66 MHz
NumCharacteristic
MinMaxMinMaxMinMaxMinMax
A(0:31), REG
Strobe asserted
P44
– 2.00)
A(0:31), REG
P45
negation
CLKOUT to REG
P46
x B1 + 8.00)
CLKOUT to REG
P47
0.25 x B1 + 1.00)
CLKOUT to CE1
P48
(MAX = 0.25 x B1 + 8.00)
1
(MIN = 1.00 x B1 – 2.00)
valid to PCMCIA
1
(MIN = 0.75 x B1
valid to ALE
valid (MAX = 0.25
invalid (MIN =
, CE2 asserted
20.70—16.70—13.00—9.40—ns
28.30—23.00—18.00—13.20—ns
7.6015.606.3014.305.0013.003.8011.80ns
8.60—7.30—6.00—4.80—ns
7.6015.606.3014.305.0013.003.8011.80ns
I43
Unit
CLKOUT to CE1
P49
(MAX = 0.25 x B1 + 8.00)
38Freescale Semiconductor
, CE2 negated
MPC866/MPC859 Hardware Specifications, Rev. 2
7.6015.606.3014.305.0013.003.8011.80ns
NumCharacteristic
Bus Signal Timing
Table 11. PCMCIA Timing (continued)
33 MHz40 MHz50 MHz66 MHz
Unit
MinMaxMinMaxMinMaxMinMax
CLKOUT to PCOE
IOWR
P50
, IORD, PCWE,
assert time (MAX = 0.00 x
—11.00—11.00—11.00—11.00ns
B1 + 11.00)
CLKOUT to PCOE
IOWR
P51
, IORD, PCWE,
negate time (MAX = 0.00 x
2.0011.002.0011.002.0011.002.0011.00ns
B1 + 11.00)
CLKOUT to ALE assert time (MAX
P52
= 0.25 x B1 + 6.30)
CLKOUT to ALE negate time (MAX
P53
= 0.25 x B1 + 8.00)
, IOWR negated to D(0:31)
PCWE
P54
P55
1
invalid
WAITA
(MIN = 0.25 x B1 – 2.00)
and WAITB valid to
CLKOUT rising edge
1
(MIN = 0.00
7.6013.806.3012.505.0011.303.8010.00ns
—15.60—14.30—13.00—11.80ns
5.60—4.30—3.00—1.80—ns
8.00—8.00—8.00—8.00—ns
x B1 + 8.00)
2.00—2.00—2.00—2.00—ns
CLKOUT rising edge to WAITA
WAITB
P56
invalid1 (MIN = 0.00 x B1 +
and
2.00)
1
PSST = 1. Otherwise, add PSST times cycle time.
PSHT = 0. Otherwise, add PSHT times cycle time.
These synchronous timings define when the WAITx
current cycle. The WAITx
PCMCIA Interface in the
assertion will be effective only if it is detected 2 cycles before the PSL timer expiration. See
MPC866 PowerQUICC User’s Manual
signals are detected in order to freeze (or relieve) the PCMCIA
.
MPC866/MPC859 Hardware Specifications, Rev. 2
Freescale Semiconductor39
Bus Signal Timing
Figure 27 shows the PCM CI A access cy cle tim ing fo r the ext ern a l bus rea d .
CLKOUT
TS
P44
A[0:31]
REG
CE1/CE2
PCOE, IORD
ALE
D[0:31]
P46P45
P48P49
P53P52P52
P47
P51P50
Figure 27. PCMCIA Access Cycles Timing External Bus Read
B19B18
MPC866/MPC859 Hardware Specifications, Rev. 2
40Freescale Semiconductor
Figure 28 shows the PCM CI A access cy cle tim ing fo r the ext ern a l bus wri te .
CLKOUT
TS
P44
A[0:31]
Bus Signal Timing
P46P45
REG
P48P49
CE1/CE2
PCWE, IOWR
ALE
D[0:31]
Figure 28. PCMCIA Access Cycles Timing External Bus Write
Figure 29 shows the PCMCIA WAIT signals detection timing.
P47
P51P50
P53P52P52
B9B8
P54
CLKOUT
P55
P56
x
WAIT
Figure 29. PCMCIA WAIT Signals Detection Timing
MPC866/MPC859 Hardware Specifications, Rev. 2
Freescale Semiconductor41
Bus Signal Timing
Table 12 shows the PCMCIA port timing for the MPC866/859.
Table 12. PCMCIA Port Timing
33 MHz40 MHz50 MHz66 MHz
NumCharacteristic
MinMaxMinMaxMinMaxMinMax
Unit
CLKOUT to OPx, valid (MAX = 0.00 x B1
P57
+ 19.00)
HRESET
P58
0.75 x B1 + 3.00)
IP_Xx valid to CLKOUT rising edge (MIN
P59
= 0.00 x B1 + 5.00)
CLKOUT rising edge to IP_Xx invalid
P60
(MIN = 0.00 x B1 + 1.00)
1
OP2 and OP3 only.
negated to OPx drive 1(MIN =
—19.00—19.00—19.00—19.00ns
25.70—21.70—18.00—14.40—ns
5.00—5.00—5.00—5.00—ns
1.00—1.00—1.00—1.00—ns
Figure 30 shows the PCMCIA output port timing for the MPC866/859.
CLKOUT
P57
Output
Signals
HRESET
P58
OP2, OP3
Figure 30. PCMCIA Output Port Timing
Figure 31 shows the PCMCIA output port timing for the MPC866/859.
CLKOUT
P59
P60
Input
Signals
Figure 31. PCMCIA Input Port Timing
MPC866/MPC859 Hardware Specifications, Rev. 2
42Freescale Semiconductor
Table 13 shows the debug port timing for the MPC866/859.
Table 13. Debug Port Timing
NumCharacteristic
Bus Signal Timing
All Frequencies
Unit
MinMax
D61DSCK cycle time3xT
D62DSCK clock pulse width1.25xT
D63DSCK rise and fall times0.003.00ns
D64DSDI input data setup time8.00—ns
D65DSDI data hold time5.00—ns
D66DSCK low to DSDO data valid0.0015.00ns
D67DSCK low to DSDO invalid0.002.00ns
CLOCKOUT
CLOCKOUT
Figure 32 shows the input timing for the debug port clock.
DSCK
D61
D61
D63
D62
D62
D63
Figure 32. Debug Port Clock Input Timing
Figure 33 shows the timing for the debug port.
—
—
DSCK
D64
D65
DSDI
D66
D67
DSDO
Figure 33. Debug Port Timings
MPC866/MPC859 Hardware Specifications, Rev. 2
Freescale Semiconductor43
Bus Signal Timing
Table 14 shows the reset timing for the MPC866/859.
Table 14. Reset Timing
33 MHz40 MHz50 MHz66 MHz
NumCharacteristic
MinMaxMinMaxMinMaxMinMax
Unit
CLKOUT to HRESET
R69
(MAX = 0.00 x B1 + 20.00)
CLKOUT to SRESET
R70
(MAX = 0.00 x B1 + 20.00)
RSTCONF
R71
B1)
R72——————————
Configuration data to HRESET rising
R73
edge setup time (MIN = 15.00 x B1 +
50.00)
Configuration data to RSTCONF
edge setup time (MIN = 0.00 x B1 +
R74
350.00)
Configuration data hold time after
R75
RSTCONF
0.00)
Configuration data hold time after
R76
HRESET
0.00)
HRESET
data out drive (MAX = 0.00 x B1 +
R77
25.00)
pulse width (MIN = 17.00 x
negation (MIN = 0.00 x B1 +
negation (MIN = 0.00 x B1 +
and RSTCONF asserted to
high impedance
high impedance
rising
—20.00 —20.00 —20.00 —20.00 ns
—20.00 —20.00 —20.00 —20.00 ns
515.20 —425.00 —340.00 —257.60 —ns
504.50 —425.00 —350.00 —277.30 —ns
350.00 —350.00 —350.00 —350.00 —ns
0.00—0.00—0.00—0.00—ns
0.00—0.00—0.00—0.00—ns
—25.00 —25.00 —25.00 —25.00 ns
RSTCONF
R78
impedance (MAX = 0.00 x B1 + 25.00)
CLKOUT of last rising edge before chip
R79
three-states HRESET
impedance (MAX = 0.00 x B1 + 25.00)
R80DSDI, DSCK setup (MIN = 3.00 x B1)90.90—75.00—60.00—45.50—ns
DSDI, DSCK hold time (MIN = 0.00 x B1
R81
+ 0.00)
SRESET
R82
edge for DSDI and DSCK sample (MIN
= 8.00 x B1)
44Freescale Semiconductor
negated to data out high
to data out high
negated to CLKOUT rising
MPC866/MPC859 Hardware Specifications, Rev. 2
—25.00 —25.00 —25.00 —25.00 ns
—25.00 —25.00 —25.00 —25.00 ns
0.00—0.00—0.00—0.00—ns
242.40 —200.00 —160.00 —121.20 —ns
Figure 34 shows the reset timing for the data bus configura tion.
HRESET
R71
R76
RSTCONF
R73
R74
D[0:31] (IN)
R75
Figure 34. Reset Timing—Configuration from Data Bus
Figure 35 shows the reset timing for the data bus weak drive during configuration.
Bus Signal Timing
CLKOUT
HRESET
RSTCONF
D[0:31] (OUT)
(Weak)
R69
R79
R77R78
Figure 35. Reset Timing—Data Bus Weak Drive During Configuration
MPC866/MPC859 Hardware Specifications, Rev. 2
Freescale Semiconductor45
IEEE 1149.1 Electrical Specifications
Figure 36 shows the reset timing for the debug port configura tion.
CLKOUT
R70
R82
SRESET
R80R80
R81
DSCK, DSDI
R81
Figure 36. Reset Timing—Debug Port Configuration
11IEEE 1149.1 Electrical Specifications
Table 15 shows the JTAG timings for the MPC866/859 shown in Figure 37 through Figure 40.
Table 15. JTAG Timing
All Frequencies
NumCharacteristic
MinMax
J82TCK cycle time100.00—ns
J83TCK clock pulse width measured at 1.5 V40.00—ns
J84TCK rise and fall times0.0010.00ns
J85TMS, TDI data setup time5.00—ns
J86TMS, TDI data hold time25.00—ns
J87TCK low to TDO data valid —27.00ns
J88TCK low to TDO data invalid 0.00—ns
J89TCK low to TDO high impedance —20.00ns
J90TRST
J91TRST
J92TCK falling edge to output valid—50.00ns
J93TCK falling edge to output valid out of high impedance—50.00ns
J94TCK falling edge to output high impedance—50.00ns
J95Boundary scan input valid to TCK rising edge50.00—ns
assert time100.00—ns
setup time to TCK low40.00—ns
Unit
J96TCK rising edge to boundary scan input invalid50.00—ns
MPC866/MPC859 Hardware Specifications, Rev. 2
46Freescale Semiconductor
TCK
TCK
TMS, TDI
IEEE 1149.1 Electrical Specifications
J82J83
J82J83
J84J84
Figure 37. JTAG Test Clock Input Timing
J85
J86
J87
J88J89
TDO
TCK
TRST
Figure 38. JTAG Test Access Port Timing Diagram
J91
J90
Figure 39. JTAG TRST
Timing Diagram
MPC866/MPC859 Hardware Specifications, Rev. 2
Freescale Semiconductor47
CPM Electrical Characteristics
TCK
J92J94
Output
Signals
J93
Output
Signals
J95J96
Output
Signals
Figure 40. Boundary Scan (JTAG) Timing Diagram
12CPM Electrical Characteristics
This section provides the AC and DC electr ical specifications for the communicati ons processor module (CPM) of
the MPC866/859.
12.1 PIP/PIO AC Electrical Specifications
Table 16 shows the PIP/PIO AC timings as shown in Figure 41 through Figure 45.
Table 16. PIP/PIO Timing
All Frequencies
NumCharacteristic
MinMax
21Data-in setup time to STBI low0—ns
22Data-In hold time to STBI high2.5 – t3
23STBI pulse width1.5—clk
24STBO pulse width1 clk – 5ns—ns
25Data-out setup time to STBO low2—clk
26Data-out hold time from STBO high5—clk
27STBI low to STBO low (Rx interlock)—2clk
28STBI low to STBO high (Tx interlock)2—clk
29Data-in setup time to clock high15—ns
30Data-in hold time from clock high7.5—ns
31Clock low to data-out valid (CPU writes data, control, or direction)—25ns
U1UtpClk rise/fall time (Internal clock option) Output—4ns
Duty cycle5050%
Frequency—33MHz
U2UTPB, SOC, RxEnb
delay (and PHREQ and PHSEL active delay in MPHY mode)
U3UTPB, SOC, Rxclav and Txclav setup timeInput4—ns
, TxEnb, RxAddr, and TxAddr-active
Output216ns
U4UTPB, SOC, Rxclav and Txclav hold timeInput1—ns
Table 31. UTOPIA Master (Split Bus Mode) Electrical Specifications
NumSignal CharacteristicDirectionMinMaxUnit
U1UtpClk rise/fall time (Internal clock option)Output—4ns
Duty cycle5050%
Frequency—33MHz
U2UTPB, SOC, RxEnb
delay (PHREQ and PHSEL active delay in MPHY mode)
U3UTPB_Aux, SOC_Aux, Rxclav, and Txclav setup timeInput4—ns
U4UTPB_Aux, SOC_Aux, Rxclav, and Txclav hold timeInput1—ns
, TxEnb, RxAddr and TxAddr active
MPC866/MPC859 Hardware Specifications, Rev. 2
Output216ns
72Freescale Semiconductor
UTOPIA AC Electrical Specifications
Table 32. UTOPIA Slave (Split Bus Mode) Electrical Specifications
NumSignal CharacteristicDirectionMinMaxUnit
U1UtpClk rise/fall time (external clock option)Input—4ns
Duty cycle4060%
Frequency—33MHz
U2 UTPB, SOC, Rxclav and Txclav active delayOutput216ns
U3UTPB_AUX, SOC_Aux, RxEnb
setup time
U4UTPB_AUX, SOC_Aux, RxEnb
hold time
, TxEnb, RxAddr, and TxAddr
, TxEnb, RxAddr, and TxAddr
Figure 72 shows signal timings during UTOPI A receive operations.
U1
UtpClk
U2
PHREQn
U3U4
3
RxClav
RxEnb
UTPB
SOC
HighZ at MPHY
U2
2
Input4—ns
Input1—ns
U1
4
HighZ at MPHY
U3
3
U4
4
Figure 72. UTOPIA Receive Timing
MPC866/MPC859 Hardware Specifications, Rev. 2
Freescale Semiconductor73
FEC Electrical Characteristics
Figure 73 shows signal timings during UTOPI A transmi t operations.
U1
UtpClk
PHSELn
TxClav
TxEnb
UTPB
SOC
U1
1
U2
5
U3U4
3
HighZ at MPHYHigh-Z at MPHY
U2
2
U2
5
Figure 73. UTOPIA Transmit Timing
4
14FEC Electrical Characteristics
This section provides the AC electric al specifications for the fast Ethe rnet controller (FEC). Note that the timing
specifications for the MII signals are independent of system clock frequency (part speed designation). Also, MII
signals use TTL signal levels co mpatible with devices operating at either 5.0 or 3.3 V.
14.1 MII Receive Signal Timing (MII_RXD [3:0], MII_RX_DV,
MII_RX_ER, MII_RX_CLK)
The receiver f unctions corre ctly up to a MII_RX_CLK maximum frequency of 25 MHz + 1%. The re is no minim um
frequency requir ement. In addition, the processor clock fre quency must exceed the MII_RX_CLK freque ncy – 1%.
Table 33 shows the timings for MII receive signal.
Table 33. MII Receive Signal Timing
NumCharacteristicMinMaxUnit
M1MII_RXD[3:0], MII_RX_DV, MII_RX_ER to MII_RX_CLK setup5—ns
M2MII_RX_CLK to MII_RXD[3:0], MII_RX_DV, MII_RX_ER hold5—ns
M3MII_RX_CLK pulse width high35%65%MII_RX_CLK period
M4MII_RX_CLK pulse width low35%65%MII_RX_CLK period
Figure 74 shows the timings for MII receive signal.
MPC866/MPC859 Hardware Specifications, Rev. 2
74Freescale Semiconductor
MII_RX_CLK (input)
MII_RXD[3:0] (inputs)
MII_RX_DV
MII_RX_ER
FEC Electrical Characteristics
M3
M4
M1
M2
Figure 74. MII Receive Signal Timing Diagram
14.2 MII Transmit Signal Timing (MII_TXD[3:0], MII_TX_EN,
MII_TX_ER, MII_TX_CLK)
The transmitter funct ions correctly up to a MII_TX_CLK maximum frequency of 25 MHz +1%. There is no
minimum frequency requirement. In addition, the processor clock frequency must exceed the MII_TX_CLK
frequency - 1%.
Table 34 shows information on the MII transmit signal timing.
Table 34. MII Transmit Signal Timing
NumCharacteristicMinMaxUnit
M5MII_TX_CLK to MII_TXD[3:0], MII_TX_EN, MII_TX_ER
invalid
M6MII_TX_CLK to MII_TXD[3:0], MII_TX_EN, MII_TX_ER
valid
M7MII_TX_CLK pulse width high35%65%MII_TX_CLK period
M8MII_TX_CLK pulse width low35%65%MII_TX_CLK period
5—ns
—25—
MPC866/MPC859 Hardware Specifications, Rev. 2
Freescale Semiconductor75
FEC Electrical Characteristics
Figure 75 shows the MII transmit signal timing diagram.
M7
MII_TX_CLK (input)
M5
M8
MII_TXD[3:0] (outputs)
MII_TX_EN
MII_TX_ER
M6
Figure 75. MII Transmit Signal Timing Diagram
14.3 MII Async Inputs Signal Timing (MII_CRS, MII_COL)
Table 35 shows the timing for on the MII async inputs signal.
Table 35. MII Async Inputs Signal Timing
NumCharacteristicMinMaxUnit
M9MII_CRS, MII_COL minimum pulse width1.5—MII_TX_CLK period
Figure 76 shows the MII asynchronous inputs signal timing diagram.
MII_CRS, MII_COL
M9
Figure 76. MII Async Inputs Timing Diagram
14.4 MII Serial Management Channel Timing (MII_MDIO, MII_MDC)
Table 36 shows the timing for the MII serial management channel signal. The FEC functions correctly with a
maximum MDC frequency in excess of 2.5 MHz. The exact upper bound is under investigation.
Table 36. MII Serial Management Channel Timing
NumCharacteristicMinMaxUnit
M10MII_MDC falling edge to MII_MDIO output invalid (minimum
propagation delay)
0—ns
M11MII_MDC falling edge to MII_MDIO output valid (maximum
propagation delay)
M12MII_MDIO (input) to MII_MDC rising edge setup10—ns
MPC866/MPC859 Hardware Specifications, Rev. 2
76Freescale Semiconductor
—25ns
FEC Electrical Characteristics
Table 36. MII Serial Management Channel Timing
NumCharacteristicMinMaxUnit
M13MII_MDIO (input) to MII_MDC rising edge hold0—ns
M14MII_MDC pulse width high40%60%MII_MDC period
M15MII_MDC pulse width low40%60%MII_MDC period
Figure 77 shows the MII serial management channel timing diagram.
M14
MM15
MII_MDC (output)
M10
MII_MDIO (output)
MII_MDIO (input)
M11
M12
M13
Figure 77. MII Serial Management Channel Timing Diagram
MPC866/MPC859 Hardware Specifications, Rev. 2
Freescale Semiconductor77
Mechanical Data and Ordering Information
15Mechanical Data and Ordering Information
Table 37 shows information on the MPC866/859 derivative devices.
Table 37. MPC866/859 Derivatives
Number
Device
MPC866T4 10/100 MbpsYesYes4 Kbyte4 Kbytes
MPC866P4 10/100 MbpsYesYes16 Kbyte8 Kbytes
MPC859T1 (SCC1)10/100 MbpsYesYes4 Kbyte4 Kbytes
MPC859DSL1 (SCC1)10/100 MbpsNoUp to 4 addresses4 Kbyte4 Kbytes
1
Serial communications controller (SCC).
of
SCCs
1
Ethernet
Support
Multi-Channel
HDLC Support
ATM Support
InstructionData
Cache Size
Table 38 identifies the packages and operating frequencies orderable for the MPC866/859 derivative devices.
Package TypeTemperature (Tj)Frequency (MHz)Order Number
Plastic ball grid array
(ZP suffix)
Non lead free
Table 38. MPC866/859 Package/Frequency Orderable
0° to 95°C50MPC859DSLZP50A
66MPC859DSLZP66A
100MPC859PZP100A
MPC859TZP100A
MPC866PZP100A
MPC866TZP100A
Plastic ball grid array
(CZP suffix)
Non lead free
For more information on the printed-circuit board layout of the PBGA package, including thermal via design and
suggested pad layo ut, please refe r to Plastic Ball Grid Array App lication Note (order number: AN123 1/D) availabl e
from your local Freescale sales office. Figure 79 shows the mechanical dimensions of the PBGA package.
Note: Solder sphere composition for MPC866XZP, MPC859PZP, MPC859DSLZP, and MPC859TZP
is 62%Sn 36%Pb 2%Ag
Figure 79. Mechanical Dimensions and Bottom Surface Nomenclature of the PBGA Package
MPC866/MPC859 Hardware Specifications, Rev. 2
92Freescale Semiconductor
16Document Revision History
Table 40 lists significant changes between revisions of this doc ument.
Table 40. Document Revision History
Document Revision History
Revision
Number
05/2002Initial revision
111/2002Added the 5-V tolerant pins, new package dimensions, and other changes.
1.14/2003Added the Spec. B1d and changed spec. B1a. Added the Note Solder sphere
1.24/2003Added the MPC859P.
1.35/2003Changed the SPI Master Timing Specs. 162 and 164.
1.47-8/2003 • Added TxClav and RxClav to PB15 and PC15. Changed B28a through B28d and
1.53/14/2005 • Updated document template.
22/10/2006 • Updated orderable parts table.
DateSubstantive Changes
composition for MPC866XZP, MPC859DSLZP, and MPC859TZP is 62%Sn 36%Pb
2%Ag to Figure 15-79.
B29b to show that TRLX can be 0 or 1.
• Added nontechnical reformatting.
MPC866/MPC859 Hardware Specifications, Rev. 2
Freescale Semiconductor93
Document Revision History
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MPC866/MPC859 Hardware Specifications, Rev. 2
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Document Revision History
MPC866/MPC859 Hardware Specifications, Rev. 2
Freescale Semiconductor95
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