The MPC7455 and MPC7445 are implementations of the
PowerPC™ microprocessor family of reduced instruction set
computer (RISC) microprocessors. This document is primarily
concerned with the MPC7455; however, unless otherwise noted,
all information here also applies to the MPC7445. This document
describes pertinent electrical and physical characteristics of the
MPC7455. For functional characteristics of the processor, refer to
the MPC7450 RISC Microprocessor Family User’s Manual. To
locate any published updates for this document, refer to the
website at http://www.freescale.com.
The MPC7455 is the thir d implementation o f the fourth g eneration
(G4) microprocess ors from Freescale. The MPC7455 imple ments
the full PowerPC 32-bit architecture and is targeted at networking
and computing systems applications. The MPC7455 consists of a
processor core, a 256-Kbyte L2, and an internal L3 tag and
controller which support a glueless backside L3 cache through a
dedicated high-ba ndwidth interface. The MPC7445 is identical to
the MPC7455 except it does not support the L3 cache int erface.
The core is a high-performance superscalar design supporting a double-precision floating-point unit and a SIMD
multimedia unit. The memory storage subsyste m supports the MPX bus protocol and a subset of the 60x bus protocol
to main m emory a nd other system r esources. The L3 in terface supports 1 or 2 Mbytes of external SRAM for L3
cache data.
Note that the MPC7455 is footprint-compatible with the MPC7450 and MPC7451, and the MPC7445 is
footprint-co mpatible with the MPC7441.
2Features
This section summarizes features of the MPC7455 implementation of the PowerPC architecture.
Major features of the MPC7455 are as follows:
•High-performance, superscalar microprocessor
— As many as four instructions can be fetched from the instruction cache at a time
— As many as thr ee inst ruct i on s ca n be disp atch ed to the issue queu e s at a time
— As many as 12 instructions can be in the instruction queue (IQ)
— As many as 16 instructions can be at some stage of execution simultaneously
— Single-cycle execution for most instructions
— One instruction per clock cy cle thr oughput for most instructions
— Seven-stage pipeline control
•Eleven independent exec ution units and three register fil es
— Branch processing unit (BPU) features static and dynamic branch predi ction
– 128-entry (32-set, four-way set-associative) branch target instruction cache (BTIC), a cache of
branch instru ctions that ha ve been encounter ed in branc h/loop code sequ ences. If a ta rget inst ruction
is in the BTIC, it is fetched into the instruction queue a cycle sooner than it can be made available
from the instruction cache. Typically, a fetch that hits the BTIC provides the first four instructions
in the target stre am.
– 2048-entry bran ch history table (BHT) with two bits per entry for four leve ls of
prediction—not-ta ken, strongly not-taken, ta ken, and strongly taken
– Up to three outstanding spe culative branches
– Branch instructions that do not update the count register (CTR) or link register (LR) are often
removed from the instructi on stream.
– Eight-entry link register stack to predict the target address of Branch Conditional to Link Register
(bclr) instru cti ons
— Four integer units (IUs) that share 32 GPRs for integer operands
– Three identical I Us (IU1a , IU1 b, an d IU1c) can execute all integer instructions except multiply,
divide, and move to/from special-purpose register instructions
– IU2 executes misc ellaneous instruction s inc luding the CR logi cal oper ations, integer multiplica tion
and division instructions, and move to/from special-pu rpose register instructions
— Five-stag e FP U and a 32- en try FPR file
– Fully IEEE 754-1985-compliant FPU for both single- and double-precision operations
– Supports non-IEEE mode for time-critical operations
– Hardware support for de normalized numbers
– Thirty-two 64-bit FPRs for single- or double-precision operands
— Four vector units and 32-entry vector register file (VRs)
– Vector permute unit (VPU)
– Ve ctor integ er unit 1 (VIU1) handles short-latenc y AltiVec™ integer ins tructions, s uch as vect or add
instructions (vaddsbs, vaddshs, and vaddsws, for example)
– Vector integer unit 2 (VIU2) handles longer -latency AltiVec integer instruction s, suc h as vector
multiply add instruct ions (vmhaddshs, vmhraddshs, and vmladduhm, for example)
– Vector floating-point unit (VFPU)
— Three-stage load/store unit (LSU)
– Supports integer, floating-point, and vector instructi on load/store traffic
– Four-entry vector touch queue (VTQ) supports all four architected AltiVec data stream operations
– Three-cycle GPR and AltiVec load latency (byte, half -word, word, vector) with one-cycle
throughput
– Four-cyc le FPR load latency (single, double) with one-cycle throughput
– No additional delay for misaligned access within double-word boundary
– Dedicated ad der calculates effec tiv e add ress es (EA s )
– Supports store gat hering
– Performs alignmen t, nor malization, and precision conversion for floating-poi nt data
– Executes cache control and TLB instructions
– Performs alignmen t, z ero pa dding, and sign extension for integer data
– Supports hits under mis ses (multiple outstanding misses)
– Supports both big- and little-endian modes, including misaligned little-endian accesses
•Three issue queues FIQ, VIQ, and GIQ can accept as many as one, two, and three instru ctions, respect ively ,
in a cycle. Instruct io n disp a tc h requi re s the follo w ing:
— Instructions can be dis patched only from the three lowest IQ entries—IQ0, IQ1, and IQ2
— A maximum of three instructions can be dispa tched to the issue queues per clock cycle
— Space mus t be avai l abl e in the CQ fo r an instr u ction to disp at ch (t h is inclu des ins tru ct io ns tha t are
assigned a space in the CQ but not in an issue queue)
•Dispatch unit
— Decode/dispatch stage fully decodes each instruction
•Completion unit
— The completion unit retire s an instruction from the 16-entry comple tion queue (CQ) when all
instructions ahead of it have been completed, the instructi on has finishe d execution , and no exceptions
are pending.
— Guarantees sequentia l pr ogramming model (precise exception model)
— Monitors all dispatche d instructions and retires them in orde r
— Tracks unr esolved branches and flushes inst ructions after a mispredicted branc h
— Retires as many as three instructions per clock cycle
•Separate on-chip L1 instruction and data caches (Harvard architecture)
— 32-Kbyte, eight-way set-associative instruc tion and data caches
— Pseudo least-recently-used (PLRU) replacement algorithm
— 32-byte (eight-wor d) L1 cache block
— Physically indexed/physical tags
— Cache write-back or write-through operation programmable on a per-page or per-block basis
— Instruction cac he can provide four instructions per clock cycle; data cache can provide four words per
clock cycle
— Caches can be disabled in softwar e
— Caches can be locked in software
— MESI data cache coherency maintained in hardware
— Separate copy of data cache tags for efficient snooping
— Parity support on cache and tags
— No snooping of instruction cac he except for icbi instruction
— Data cache supports AltiVec LRU and transient instructions
— Critical double- and/or quad-word forwarding is performed as needed. Critical quad-word forwarding
is used for AltiVec loads and instruction fetches. Other accesses use critical double -word forwarding.
•Level 2 (L2) cac he interface
— On-chip, 256-Kbyte, ei ght-way set-associative unif ied instruction and data cache
— Fully pipelined to provi de 32 bytes per clock cycle to the L1 caches
— A total nine-cycle load lat en cy for an L1 data cache mis s that hits in L2
— PLRU replacement algorithm
— Cache write-back or write-through operation programmable on a per-page or per-block basis
— 64-byte, two-sectored line size
— Parity support on cache
•Level 3 (L3) cache interface (not implemented on MPC7445)
— Provides critical double-word forwarding to the requesting unit
— Internal L 3 cach e co ntr oller and tags
— External data SRAMs
— Support for 1- and 2-Mbyte L3 caches
— Cache write-back or write-through operation programmable on a per-page or per-block basis
— 64-byte (1M) or 128-byte (2M) sector ed line size
— Private memory capability for half (1-Mbyte minimum) or all of the L3 SRAM space
— Supports MSUG2 dual data rate (DDR) synchronous Burst SRAMs, PB2 pipelin ed synchronous Burst
SRAMs, and pipelined (register-register) late write synchronous Burst SRAMs
— Supports parity on cache and tags
— Configurable core-to-L3 frequency divisors
— 64-bit external L3 data bus sustains 64 bits per L3 clock cycle
•Separate memory management units (MMUs) for instructions and data
— 52-bit virtual address; 32- or 36-bit physical address
— Address translation f or 4-Kbyte pages, variable-sized blocks, and 256-Mbyte segments
— Memory programmable a s write-back/write-through, caching-inhibited/caching-allowed, and m emory
coherency enforced /memory co herency not enforced on a page or block basis
— Separate IBATs and DBATs (eight each) also defined as SPRs
— Separate instruc tion and data translation lookasi de buffers (TLBs)
– Both TLBs are 128-entry, two-way set-associative, and use LRU replacement algorithm
– TLBs are hardware - or softwar e-reloa dable (that is, on a TLB miss a page table search is pe rformed
in hardware or by system software)
•Efficient data flow
— Although the VR/LSU interface is 128 bits, the L1/L2/L3 bus interface allows up to 256 bits
— The L1 data cache is fully pipelined to provide 128 bits/cycle to or from the VRs
— L2 cache is ful ly pipel in ed to pro vide 2 5 6 bits pe r proc es so r cloc k cycl e t o the L1 cac h e
— As many as eight outstanding, out-of-order, cache misses are allowed between the L1 data cache and
L2/L3 bus
— As many as 16 out-of-order transactions can be present on the MPX bus
— Store mer ging for multiple store misses to the same line. Only coherency action taken (address-only)
for store misses merge d to all 32 bytes of a cache block (no data tenure needed).
— Three-entry finish ed store queue and five-entry comple ted store queue between the LSU and the L1 data
cache
— Separate additiona l queues for eff icie nt buffe ring of outbound dat a (such as castout s and write through
stores) from the L1 data cache and L2 cache
•Multiprocessing support features include the following:
— Hardware-enforc ed, MESI cache coherency protocols for data cache
— Load/store with reserva tion instruction pair for at omic memory ref erences, semaphores, and other
multiprocessor ope rations
•Power and thermal management
— 1.3-V proces s or co re
— The following three power-saving modes are available to the system:
– Nap—Instruction fetching is halted. Only those clocks for the time base, decrementer, and JTAG
logic remain runn ing. The part goes into the doze state to snoop memory opera tions on the bus and
then back to nap using a QREQ
/QACK processor- system handshake protocol.
– Sleep—Power consump tion is f urthe r reduce d by di sabling b us snoo ping, le aving onl y the PLL in a
locked and running state. All internal functional units are disabled.
– Deep sleep—When the part is in the sleep state, the system can disable the PLL. The system can then
disable the SYSCLK source for greater system power savings. Power-on reset procedures for
restarting and relocking the PLL must be followed on exiting the deep sleep state.
Comparison with the MPC7400, MPC7410, MPC7450, MPC7451, and MPC7441
•Performance monitor can be used to help debug syst em designs and improve software efficiency
•In-system testabi lity and debugging features through JTAG boundary-scan capability
•Testability
— LSSD scan design
— IEEE 1149.1 JTAG interface
— Array built-in self test (ABIST)—factory test only
•Reliability and serviceability
— Parity checking on system bus and L3 cache bus
— Parity check in g on the L 2 and L3 cach e tag arrays
3Comparison with the MPC7400, MPC7410, MPC7450,
MPC7451, and MPC7441
Table 1 compares the key features of the MPC7455 with the key features of the earlier MPC7400, MPC7410,
MPC7450, MPC7451, and MPC7441. To achieve a higher frequency, the number of logic levels per cycle is
reduced. Also, to achieve this higher frequency, the pipeline of the MPC7455 is extended (compared to the
MPC7400), while maintaining the same level of performance as measured by the number of instructions executed
per cycle (IPC).
3. Private memory feature not implemented on MPC7400.
MPC7450/MPC7451/
MPC7441
2
MPC7400/MPC7410
only (see off-chip cache
support below)
2Mbytes
3
4General Parameters
The following list provide s a summary of the general parameters of the MPC7455:
T echnology0.18 µm CMOS, six-layer metal
2
Die size8.69 mm × 12.17 mm (106 mm
Trans istor count33 million
Logic designFully-static
PackagesMPC7445: Surface mount 360 ceramic ball grid array (CBGA)
MPC7455: Surface mount 483 ceramic ball gr id array (CBGA)
Core power supply1.3 V ± 50 mV DC nominal
I/O power supply1.8 V ± 5% DC, or
This section provides the AC and DC electrical specifications and thermal c haracteristics for the MPC7455.
5.1DC Electrical Characteristics
The tables in this section describe the MPC7455 DC electrical characteristics. Table 2 provides the absolute
maximum ratings.
Table 2. Absolute Maximum Ratings
CharacteristicSymbolMaximum ValueUnitNotes
1
Core supply voltageV
PLL supply voltageAV
Processor bus supply voltageBVSEL = 0OV
BVSEL = HRESET
L3 bus supply voltageL3VSEL = ¬HRESET
or OV
DD
OVDD –0.3 to 2.7V3, 7
GV
L3VSEL = 0GV
L3VSEL = HRESET
or GV
DD
GVDD –0.3 to 2.7V3, 10
Input voltageProcessor busV
L3 busV
JTAG signalsV
Input voltageProcessor busV
JTAG signalsV
Storage temperature rangeT
DD
DD
–0.3 to 1.95V3, 6
DD
DD
DD
in
in
in
in
in
stg
–0.3 to 1.95V4
–0.3 to 1.95V4
–0.3 to 1.65V3, 8
–0.3 to 1.95V3, 9
–0.3 to OVDD + 0.3V2, 5
–0.3 to GVDD + 0.3V2, 5
–0.3 to OVDD + 0.3V
–0.3 to OVDD + 0.3V2, 5
–0.3 to OVDD + 0.3V
–55 to 150°C
Notes:
1. Functional and tested operating conditions are given in Tab le 4. Absolute maximum ratings are stress ratings only,
and functional operation at the maximums is not guaranteed. Stresses beyond those listed may affect device
reliability or cause permanent damage to the device.
2. Caution: Vin must not exceed OV
3. Caution: OV
/GVDD must not exceed VDD/AVDD by more than 2.0 V during normal operation; this limit may be
DD
or GVDD by more than 0.3 V at any time including during power-on reset.
DD
exceeded for a maximum of 20 ms during power-on reset and power-down sequences.
4. Caution: V
/AVDD must not exceed OVDD/GVDD by more than 1.0 V during normal operation; this limit may be
DD
exceeded for a maximum of 20 ms during power-on reset and power-down sequences.
5. V
may overshoot/undershoot to a voltage and for a maximum duration as shown in Figure 2.
in
6. BVSEL must be set to 0, such that the bus is in 1.8 V mode.
7. BVSEL must be set to HRESET
8. L3VSEL must be set to ¬HRESET
or 1, such that the bus is in 2.5 V mode.
(inverse of HRESET), such that the bus is in 1.5 V mode.
9. L3VSEL must be set to 0, such that the bus is in 1.8 V mode.
Figure 2 shows the undershoot and overshoot voltage on the MPC7455.
OVDD/GVDD + 20%
OVDD/GVDD + 5%
OVDD/GV
GND – 0.3 V
GND – 0.7 V
DD
V
V
GND
IH
IL
Not to Exceed 10%
of t
SYSCLK
Figure 2. Overshoot/Undershoot Voltage
The MPC7455 provides several I/O voltages to support both compatibility with existing systems and migration to
future systems. The MPC7455 core voltage must always be provided at nominal 1.3 V (see Table 4 f or actual
recommended core voltage ). Voltage to the L3 I/Os and processor inte rfa ce I/Os are provided through separate sets
of supply pins and may be provided at the voltages shown in Table 3. The input voltage threshold for each bus is
selected by sampling the state of the voltage select pins at the negation of the signal HRESET. The output voltage
will swing from GND to the maximum voltage applied to the OVDD or GVDD power pins.
Table 3. Input Threshold Voltage Setting
BVSEL Signal
01.8 V01.8 V1, 4
¬HRESET
HRESET
12.5 V12.5 V1
Notes:
1. Caution: The input threshold selection must agree with the OV
2. To select the 2.5-V threshold option for the processor bus, BVSEL should be tied to HRESET
change state together. Similarly, to select 2.5 V for the L3 bus, tie L3VSEL to HRESET
for selecting this mode of operation.
3. Applicable to L3 bus interface only. ¬HRESET
4. If used, pulldown resistors should be less than 250 Ω.
1. Junction temperature is a function of on-chip power dissipation, package thermal resistance, mounting site (board)
temperature, ambient temperature, airflow, power dissipation of other components on the board, and board thermal
resistance.
2. Per SEMI G38-87 and JEDEC JESD51-2 with the single-layer board horizontal.
3. Per JEDEC JESD51-6 with the board horizontal.
4. Thermal resistance between the die and the printed-circuit board per JEDEC JESD51-8. Board temperature is
measured on the top surface of the board near the package.
5. Thermal resistance between the die and the case top surface as measured by the cold plate method
(MIL SPEC-883 Method 1012.1) with the calculated case temperature. The actual value of R
for the part is less
θJC
than 0.1°C/W.
6. Refer to Section 9.8, “Thermal Management Information,” for more details about thermal management.
Table 6 provides the DC electrical characteristics for the MPC7455.
Table 6. DC Electrical Specifications
At recommended oper ating conditions. See Ta bl e 4 .
Table 7. Power Consumption for MPC7455 (continued)
Processor (CPU) Frequency
UnitNotes
733 MHz867 MHz933 MHz1 GHz
Typical7.67.67.67.6W1, 3
Deep Sleep Mode (PLL Disabled)
Typical7.37.37.37.3W1, 3
Notes:
1. These values apply for all valid processor bus and L3 bus ratios. The values do not include I/O supply power (OVDD
and GV
power. Worst case power consumption for AV
2. Maximum power is measured at nominal V
sequence of instructions which keep the execution units, with or without AltiVec, maximally busy.
3. Typical power is an average value measured at the nominal recommended V
while running a typical code sequence.
4. Doze mode is not a user-definable state; it is an intermediate state between full-power and either nap or sleep mode.
As a result, power consumption for this mode is not tested.
) or PLL supply power (AVDD). OVDD and GVDD power is system dependent, but is typically <5% of VDD
DD
< 3 mW.
DD
(see Table 4) while running an entirely cache-resident, contrived
DD
(see Table 4) and 65°C in a system
DD
5.2AC Electrical Characteristics
This section provides the AC electrical characteristics for the MPC7455. After fabrication, functional parts are
sorted by maximum processor core frequ ency as shown in Section 5.2.1, “Clock AC Specifications,” and tested for
conformance to the AC specifications for that frequency. The processor core frequency is determined by the bus
(SYSCLK) frequency and the settings of the PLL_CFG[0:4] signals. Parts are sold by maximum processor core
frequency; see Se ction 11, “Ordering Informati on .”
5.2.1 Clock AC Specifications
Table 8 provides the clock AC timing specifications as defined in Figure 3.
Table 8. Clock AC Timing Specifications
At recommended oper ating conditions. See Ta bl e 4 .
Table 8. Clock AC Timing Specifications (continued)
At recommended oper ating conditions. See Ta bl e 4 .
Maximum Processor Core Frequency
CharacteristicSymbol
UnitNotes733 MHz867 MHz933 MHz1 GHz
MinMaxMinMaxMinMaxMinMax
SYSCLK jitter—± 150—± 150—± 150—± 150ps4, 6
Internal PLL relock time—100—100—100—100 µs5
Notes:
1. Caution: The SYSCLK frequency and PLL_CFG[0:4] settings must be chosen such that the resulting SYSCLK
(bus) frequency, CPU (core) frequency, and PLL (VCO) frequency do not exceed their respective maximum or
minimum operating frequencies. Refer to the PLL_CFG[0:4] signal description in Section 9.1, “PLL Configuration,”
for valid PLL_CFG[0:4] settings.
2. Rise and fall times for the SYSCLK input measured from 0.4 to 1.4 V.
3. Timing is guaranteed by design and characterization.
4. This represents total input jitter—short term and long term combined—and is guaranteed by design.
5. Relock timing is guaranteed by design and characterization. PLL-relock time is the maximum amount of time
required for PLL lock after a stable V
and SYSCLK are reached during the power-on reset sequence. This
DD
specification also applies when the PLL has been disabled and subsequently re-enabled during sleep mode. Also
note that HRESET
must be held asserted for a minimum of 255 bus clocks after the PLL-relock time during the
power-on reset sequence.
6. The SYSCLK driver’s closed loop jitter bandwidth should be <500 kHz at –20 dB. The bandwidth must be set low
to allow cascade connected PLL-based devices to track SYSCLK drivers with the specified jitter.
Figure 3 provides the SYSCLK input timing diagram.
Table 9. Processor Bus AC Timing Specifications 1 (continued)
At recommended oper ating conditions. See Ta bl e 4 .
ParameterSymbol
All Speed Grades
2
MinMax
UnitNotes
SYSCLK to ARTRY/SHD0/SHD1 high impedance after
precharge
t
KHARPZ
—2t
SYSCLK
3, 5,
6, 7
Notes:
1. All input specifications are measured from the midpoint of the signal in question to the midpoint of the rising edge of the input
SYSCLK. All output specifications are measured from the midpoint of the rising edge of SYSCLK to the midpoint of the signal
in question. All output timings assume a purely resistive 50-Ω load (see Figure 4). Input and output timings are measured at
the pin; time-of-flight delays must be added for trace lengths, vias, and connectors in the system.
2. The symbology used for timing specifications herein follows the pattern of t
t
(reference)(state)(signal)(state)
for outputs. For example, t
symbolizes the time input signals (I) reach the valid state (V)
IVKH
(signal)(state)(reference)(state)
relative to the SYSCLK reference (K) going to the high (H) state or input setup time. And t
KHOV
for inputs and
symbolizes the time from
SYSCLK(K) going high (H) until outputs (O) are valid (V) or output valid time. Input hold time can be read as the time that the
input signal (I) went invalid (X) with respect to the rising clock edge (KH) (note the position of the reference and its state for
inputs) and output hold time can be read as the time from the rising edge (KH) until the output went invalid (OX).
3. t
is the period of the external clock (SYSCLK) in ns. The numbers given in the table must be multiplied by the period of
sysclk
SYSCLK to compute the actual time duration (in ns) of the parameter in question.
4. According to the bus protocol, TS
before returning to high impedance as shown in Figure 6. The nominal precharge width for TS
than the minimum t
SYSCLK
is driven only by the currently active bus master. It is asserted low then precharged high
is 0.5 × t
SYSCLK
, that is, less
period, to ensure that another master asserting TS on the following clock will not contend with the
precharge. Output valid and output hold timing is tested for the signal asserted. Output valid time is tested for precharge. The
high-impedance behavior is guaranteed by design.
5. Guaranteed by design and not tested.
6. According to the bus protocol, ARTRY
AACK
. Bus contention is not an issue because any master asserting ARTRY will be driving it low. Any master asserting it low
in the first clock following AACK
cycle after the assertion of AACK
impedance as shown in Figure 6 before the first opportunity for another master to assert ARTRY
can be driven by multiple bus masters through the clock period immediately following
will then go to high impedance for one clock before precharging it high during the second
. The nominal precharge width for ARTRY is 1.0 t
; that is, it should be high
SYSCLK
. Output valid and output
hold timing is tested for the signal asserted. The high-impedance behavior is guaranteed by design.
7. According to the MPX bus protocol, SHD0
is the same as ARTRY
, that is, the signal is high impedance for a fraction of a cycle, then negated for up to an entire cycle
(crossing a bus cycle boundary) before being three-stated again. The nominal precharge width for SHD0
t
8. BMODE
. The edges of the precharge vary depending on the programmed ratio of core-to-bus (PLL configurations).
SYSCLK
[0:1] and BVSEL are mode select inputs and are sampled before and after HRESET negation. These paramenters
and SHD1 can be driven by multiple bus masters beginning the cycle of TS. Timing
and SHD1 is 1.0
represent the input setup and hold times for each sample. These values are guaranteed by design and not tested. These
inputs must remain stable after the second sample. See Figure 5 for sample timing.
Figure 4 provides the AC test load for the MPC7455.
The L3_CLK frequency is programmed by the L3 configuration register (L3CR[6:8]) core-to-L3 divisor ratio. See
Table 18 for example core and L3 frequencies at var ious divisor s. Table 10 provides the potential range of L3_CLK
output AC timing specifications as defined in Figure 7.
The maximum L3_CLK frequency is the core frequency divided by two. Given the high core frequencies available
in the MPC7455, however, most SRAM designs will be not be a ble to operate in this mode usi ng cur rent te chnology
and, as a result, will sel ect a gr eater c ore-to-L3 div isor to provi de a long er L3_CLK perio d for re ad and write a ccess
to the L3 SRAMs. Therefore, the typical L3_CLK frequency shown in Table 10 is considered to be the practical
maximum in a typical system. The maximum L3_CLK frequency for any application of the MPC7455 will be a
function of the AC timings of the MPC7455, the AC timings for the SRAM, bus loading, and printed-circuit board
trace length, and may be greater or less tha n the value given in Table 10.
Freescale is similarly limited by system constraints and cannot perform tests of the L3 interface on a socketed part
on a functional tester at the maximum frequencies of Table 10. Therefore, functional operation and AC timing
information are test ed at core-to-L3 divisors which resul t in L3 frequencies at 200 MHz or less.
Table 10. L3_CLK Output AC Timing Specifications
At recommended oper ating conditions. See Ta bl e 4 .
All Speed Grades
ParameterSymbol
MinTypMax
UnitNotes
L3 clock frequencyf
L3 clock cycle timet
L3 clock duty cyclet
L3 clock output-to-output skew (L1_CLK0 to
L1_CLK1)
L3 clock output-to-output skew (L1_CLK[0:1]
to L1_ECHO_CLK[2:3])
L3 clock jitter——±50ps5
Notes:
1. The maximum L3 clock frequency will be system dependent. See Section 5.2.3, “L3 Clock AC Specifications,” for
an explanation that this maximum frequency is not functionally tested at speed by Freescale.
2. The nominal duty cycle of the L3 output clocks is 50% measured at midpoint voltage.
3. Maximum possible skew between L3_CLK0 and L3_CLK1. This parameter is critical to the address and control
signals which are common to both SRAM chips in the L3.
4. Maximum possible skew between L3_CLK0 and L3_ECHO_CLK1 or between L3_CLK1 and L3_ECHO_CLK3 for
PB2 or late write SRAM. This parameter is critical to the write data signals which are separately latched onto each
SRAM part by these pairs of signals.
5. Guaranteed by design and not tested. The input jitter on SYSCLK affects L3 output clocks and the L3
address/data/control signals equally and, therefore, is already comprehended in the AC timing and does not have
to be considered in the L3 timing analysis. The clock-to-clock jitter shown here is uncertainty in the internal clock
period caused by supply voltage noise or thermal effects. This must be accounted for, along with clock skew, in
any L3 timing analysis.
The MPC7455 L3 interface supports three different types of SRAM: source-synchronous, double data rate (DDR)
MSUG2 SRAM, late write SRAMs, and pipeline burst (PB2) SRAMs. Each requir es a different protocol on the L3
interface and a dif fere nt routing of the L3 clock si gnals. The type of SRAM is programmed in L3CR[22: 23] and the
MPC7455 then follows the appropriate protocol for that type. The designer must connect and route the L3 signals
appropriately fo r each type of SRAM. Following are some observations about the chip-to-SRAM interface.
•The routing for the point-t o-point signals (L3_CLK[0:1], L3DATA[0:63], L3DP[0:7], and
L3_ECHO_CLK[0:3]) to a par ticular SRAM should be dela y matched. If ne cessary , t he length of tr aces can
be altered in order to intentionally skew the timing and provide additional setup or hold time margin.
•For a 1-Mbyte L3, use address bits 16:0 (bit 0 is LSB).
•No pull-up resistors are required for the L3 interface.
•For high speed operations, L3 interface address and control signals should be a ‘T’ with minimal stubs to
the two loads; data and clock signals should be point-to-point to their single load. Figure 8 shows the AC
test load for the L3 interface.
Output
Z0 = 50 Ω
R
= 50 Ω
L
GVDD/2
Figure 8. AC Test Load for the L3 Interface
In general, if rout ing is short, dela y-matched, and desi gned for incident wave reception and minimal ref lection, the re
is a high probability that the AC timing of the MPC7455 L3 interface will meet the maximum frequency operation
of appropriately chosen SRAMs. This is despite the pessimistic, guard-banded AC specifications (see Table 12,
Table 13, and Table 14), the limitations of functional testers described in Section 5.2.3, “L3 Clock AC
Specifications
,” and the uncertainty of clocks and signals which inevitably make worst-case critical path timing
More specifically, certain signals within groups should be delay-matched with others in the same group while
intergroup routing is less critical. Only the address and control signals are common to both SRAMs and additional
timing margin is avail able for these signals. The double-clocked data signals are grouped with individual cloc ks as
shown in Figure 9 or Figure 11, depending on the type of SRAM. For example, for the MSUG2 DDR SRAM (see
Figure 9); L3DA TA[0:31], L3DP[0:3], a nd L3_CLK[0] f orm a closely coupled group of outputs f rom the MPC7455;
while L3DATA[0:15], L3DP[0:1], and L3_ECHO_CLK[0] form a closely coupled group of inputs.
The MPC7450 RISC Micr opr oc essor Family User’s Manual refers to logical settings called ‘sample points’ used in
the synchronization of reads from the receive FIFO. The computation of the correct value for this setting is
system-dependent and is described in the MPC7450 RISC Microprocessor Family User’s Manual. Three
specifications are used in this calculation and are given in Table 11. It is essential that all three specifications are
included in the calculations to determine the sample points, as incorrect settings can result in errors and
unpredictable beh avior. For more information, see the MPC7450 RISC Micr oprocessor Family User’s Manual.
Table 11. Sample Points Calculation Parameters
ParameterSymbolMaxUnitNotes
Delay from processor clock to internal_L3_CLKt
Delay from internal_L3_CLK to L3_CLK
Delay from L3_ECHO_CLK
Notes:
1. This specification describes a logical offset between the internal clock edge used to launch the L3 address and
control signals (this clock edge is phase-aligned with the processor clock edge) and the internal clock edge used to
launch the L3_CLK
SRAM within a valid address window and provide adequate setup and hold time. This offset is reflected in the L3
bus interface AC timing specifications, but must also be separately accounted for in the calculation of sample points
and, thus, is specified here.
2. This specification is the delay from a rising or falling edge on the internal_L3_CLK signal to the corresponding rising
or falling edge at the L3CLK
3. This specification is the delay from a rising or falling edge of L3_ECHO_CLK
from the FIFO.
n
to receive latcht
n
signals. With proper board routing, this offset ensures that the L3_CLKn edge will arrive at the
n
pins.
n
output pinst
AC
CO
ECI
n
to data valid and ready to be sampled
3/4t
3ns2
3ns3
L3_CLK
1
5.2.4.1 L3 Bus AC Specifications for DDR MSUG2 SRAMs
When using DDR MSUG2 SRAMs at the L3 interface, the parts should be connected as shown in Figure 9.
Outputs from the MPC7455 are actually launched on the edges of an internal clock phase-aligned to SYSCLK
(adjusted for core and L3 frequency divisors). L3_CLK0 and L3_CLK1 are this inter nal clock output with 90° phase
delay, so outputs are shown synchronous to L3_CLK0 and L3_CLK1. Output valid times are typically negative
when referenced to L3_CLKn because the data is launched one-quar ter period before L3_CLKn to provide adequate
setup time at the SRAM after the delay-matched address, control, data, and L3_CLKn signals have propagated
across the printed-wiring board.
Inputs to the MPC7455 are source-synchr onous with the CQ clock generated by the DDR MSUG2 SRAMs. These
CQ clocks are received on the L3_ECHO_CLKn inputs of the MPC7455. An internal circuit delays the incoming
L3_ECHO_CLKn signal such that it is positi oned withi n the valid da ta window a t the inter nal receiving latches. This
delayed clock is used to capture the data into these latches which comprise the receive FIFO. This clock is
asynchronous to all other processor cl ocks. This latched data is subs equently rea d out of the FIFO synchronou sly to
the processor clock. The time between writing and reading the data is set by the using the sample point settings
defined in the L3CR register.
1. Rise and fall times for the L3_CLK output are measured from 20% to 80% of GV
DD
.
2. For DDR, all input specifications are measured from the midpoint of the signal in question to the midpoint voltage of the rising
or falling edge of the input L3_ECHO_CLK
3. For DDR, the input data will typically follow the edge of L3_ECHO_CLK
n
(see Figure 10). Input timings are measured at the pins.
n
as shown in Figure 10. For consistency with other
input setup time specifications, this will be treated as negative input setup time.
4. t
/4 is one-fourth the period of L3_CLKn. This parameter indicates that the MPC7455 can latch an input signal that is
L3_CLK
valid for only a short time before and a short time after the midpoint between the rising and falling (or falling and rising) edges
of L3_ECHO_CLK
n
at any frequency.
5. All output specifications are measured from the midpoint voltage of the rising (or for DDR write data, also the falling) edge
of L3_CLK to the midpoint of the signal in question. The output timings are measured at the pins. All output timings assume
a purely resistive 50-Ω load (see Figure 8).
6. For DDR, the output data will typically lead the edge of L3_CLK
n
as shown in Figure 10. For consistency with other output
valid time specifications, this will be treated as negative output valid time.
7. t
/4 is one-fourth the period of L3_CLKn. This parameter indicates that the specified output signal is actually launched
L3_CLK
by an internal clock delayed in phase by 90°. Therefore, there is a frequency component to the output valid and output hold
times such that the specified output signal will be valid for approximately one L3_CLK period starting three-fourths of a clock
prior to the edge on which the SRAM will sample it and ending one-fourth of a clock period after the edge it will be sampled.
8. These configuration bits allow the AC timing of the L3 interface to be altered via software. L3OH0 = L2CR[12],
L30H1 = L3CR[12]. Revisions of the MPC7455 not described by this document may implement these bits differently. See
Section 11.1, “Part Numbers Fully Addressed by This Document,” and Section 11.2, “Part Numbers Not Fully Addressed by
This Document,” for more information on which devices are addressed by this document.
Figure 10 shows the L3 bus timing diagrams for the MPC7455 interfaced to MSUG2 SRAMs.
Outputs
L3_CLK[0,1]
ADDR, L3CNTL
L3DATA WRITE
Note: t
L3CHDV
and t
L3CLDV
time before the clock edge.
Inputs
L3_ECHO_CLK[0,1,2,3]
L3 Data and Data
Parity Inputs
Note: t
L3DVEH
and t
L3DVEL
time after the clock edge.
Figure 10. L3 Bus Timing Diagrams for L3 Cache DDR SRAMs
VM
t
L3CHOV
t
L3CHDV
t
L3CHDX
VM
t
L3CHOZ
t
L3CHOX
VMVMVM
t
L3CLDV
t
L3CLDZ
t
L3CLDX
VM = Midpoint Voltage (GVDD/2)
as drawn here will be negative numbers, that is, output valid time will be
VM
t
t
L3DVEH
t
L3DXEH
L3DVEL
VM = Midpoint Voltage (GV
VM
DD
/2)
VMVMVM
t
L3DXEL
as drawn here will be negative numbers, that is, input setup time will be
5.2.4.2 L3 Bus AC Specifications for PB2 and Late Write SRAMs
When using PB2 or late write SRAMs at the L3 interface, the parts should be connected as shown in Figure 11.
These SRAMs are synchronous to the MPC7455; one L3_CLKn signal is output to each SRAM to latch address,
control, and writ e data. Rea d data is launched by the S RAM synchronous to the delayed L3_C LKn signal it received.
The MPC7455 needs a copy of that delayed clock which launched the SRAM read data to know when the returning
data will be valid. Therefore, L3_ECHO_CLK1 and L3_ECHO_CLK3 must be routed halfway to the SRAMs and
then returned to the MPC7455 inputs L3_ECHO_CLK0 and L3_ECHO_CLK2, respectively. Thus,
L3_ECHO_CLK0 and L3_ECHO_CLK2 are phase-aligned with the input clock received at the SRAMs. The
MPC7455 will latch the incoming data on the ris ing edge of L3_ECHO_CLK0 and L3_ECHO_CLK2.
—2.0—2.0—2.0—2.0ns5
high
impedance: All
other outputs
Notes:
1. Rise and fall times for the L3_CLK output are measured from 20% to 80% of GV
DD
.
2. All input specifications are measured from the midpoint of the signal in question to the midpoint voltage of the rising edge of
the input L3_ECHO_CLK
3. All output specifications are measured from the midpoint voltage of the rising edge of L3_CLK
n
(see Figure 10). Input timings are measured at the pins.
n
to the midpoint of the signal
in question. The output timings are measured at the pins. All output timings assume a purely resistive 50-Ω load (see
Figure 10).
4. t
/4 is one-fourth the period of L3_CLKn. This parameter indicates that the specified output signal is actually launched
L3_CLK
by an internal clock delayed in phase by 90°. Therefore, there is a frequency component to the output valid and output hold
times such that the specified output signal will be valid for approximately one L3_CLK period starting three-fourths of a clock
prior to the edge on which the SRAM will sample it and ending one-fourth of a clock period after the edge it will be sampled.
5. Timing behavior and characterization are currently being evaluated.
6. These configuration bits allow the AC timing of the L3 interface to be altered via software. L3OH0 = L2CR[12],
L30H1 = L3CR[12]. Revisions of the MPC7455 not described by this document may implement these bits differently. See
Section 11.1, “Part Numbers Fully Addressed by This Document,” and Section 11.2, “Part Numbers Not Fully Addressed by
This Document,” for more information on which devices are addressed by this document.
Table 14. JTAG AC Timing Specifications (Independent of SYSCLK) 1 (continued)
At recommended oper ating conditions. See Ta bl e 4 .
ParameterSymbolMinMaxUnitNotes
Electrical and Thermal Characteristics
Valid times:
Boundary-scan data
TDO
Output hold times:
Boundary-scan data
TDO
TCK to output high impedance:
Boundary-scan data
TDO
t
JLDV
t
JLOV
t
JLDX
t
JLOX
t
JLDZ
t
JLOZ
4
4
TBD
TBD
3
3
20
25
TBD
TBD
19
9
ns4
ns4
ns4, 5
Notes:
1. All outputs are measured from the midpoint voltage of the falling/rising edge of TCLK to the midpoint of the signal
in question. The output timings are measured at the pins. All output timings assume a purely resistive 50-Ω load
(see Figure 13). Time-of-flight delays must be added for trace lengths, vias, and connectors in the system.
2. TRST
is an asynchronous level sensitive signal. The setup time is for test purposes only.
3. Non-JTAG signal input timing with respect to TCK.
4. Non-JTAG signal output timing with respect to TCK.
5. Guaranteed by design and characterization.
Figure 13provides the AC test load for TDO and the boundary-scan outputs of the MPC7455.
Output
Z0 = 50 Ω
R
= 50 Ω
L
OVDD/2
Figure 13. Alternate AC Test Load for the JTAG Interface
Figure 14 provides the JTAG clock input timing diagram.
Table 15. Pinout Listing for the MPC7445, 360 CBGA Package (continued)
Pinout Listings
Signal NamePin NumberActiveI/OI/F Select
1
Notes
TBENE1HighInputBVSEL
TBST
F11LowOutputBVSEL
TCKC6HighInputBVSEL
TDIB9HighInputBVSEL7
TDOA4HighOutputBVSEL
TEAL1LowInputBVSEL
TEST[0:3]A12, B6, B10, E10—InputBVSEL2
TEST[4]D10—InputBVSEL9
TMSF1HighInputBVSEL7
TRSTA5LowInputBVSEL7, 14
TS
L4LowI/OBVSEL8
TSIZ[0:2]G6, F7, E7HighOutputBVSEL
TT[0:4]E5, E6, F6, E9, C5HighI/OBVSEL
WTD3LowOutputBVSEL8
V
DD
H8, H10, H12, J7, J9, J11, J13, K8, K10,
—— N/A
K12, K14, L7, L9, L11, L13, M8, M10, M12
Notes:
1. OV
2. These input signals are for factory use only and must be pulled up to OV
supplies power to the processor bus, JTAG, and all control signals; and VDD supplies power to the processor
DD
core and the PLL (after filtering to become AV
(selects 1.8 V) or to HRESET
recommended value of V
(selects 2.5 V). If used, the pulldown resistor should be less than 250 Ω. For actual
or supply voltages see Table 4.
in
). To program the I/O voltage, connect BVSEL to either GND
DD
for normal machine operation.
DD
3. These signals are for factory use only and must be left unconnected for normal machine operation.
4. Ignored in 60x bus mode.
5. This signal selects between MPX bus mode (asserted) and 60x bus mode (negated) and will be sampled at
HRESET
6. This signal must be negated during reset, by pull-up to OV
going high.
or negation by ¬HRESET (inverse of HRESET), to
DD
ensure proper operation.
7. Internal pull-up on die.
8. These pins require weak pull-up resistors (for example, 4.7 kΩ) to maintain the control signals in the negated state
after they have been actively negated and released by the MPC7445 and other bus masters.
9. These input signals are for factory use only and must be pulled down to GND for normal machine operation.
10.This pin can externally cause a performance monitor event. Counting of the event is enabled via software.
11.Unused address pins must be pulled down to GND.
12.This test signal is recommended to be tied to HRESET
; however, other configurations will not adversely affect
performance.
13.These signals must be pulled down to GND if unused, or if the MPC7445 is in 60x bus mode.
14.This signal must be asserted during reset, by pull-down to GND or assertion by HRESET
[0:1]; and VDD supplies power to the processor core and the
). For actual recommended value of Vin or supply voltages, see Tab l e 4.
DD
(selects 1.5 V). If used, pulldown resistors should be less than 250 Ω.
or negation by ¬HRESET (inverse of HRESET), to
DD
; however, other configurations will not adversely affect
, even when the L3 interface is disabled or unused.
DD
—— N/A
for normal machine operation.
DD
(selects
(selects 2.5 V)
, to ensure proper
8Package Description
The followi ng sect i on s prov ide the pa ck age p ara meters and mech an ical d imen si o ns for the CBGA packag e.
8.1Package Parameters for the MPC7445, 360 CBGA
The pack age pa ramet ers are as pro vid ed in t he fol lowing list. The package ty pe is 2 5 × 25 mm , 360- lea d cer ami c
ball grid array (CBGA).
Package ou tlin e2 5 × 25 mm
Interconnects360 (19 × 19 ball array – 1)
Pitch1.27 mm (50 mil)
Minimum module height2.72 mm
Maximum module height3.24 mm
Ball diameter0.89 mm (35 mil)
Figure 23 shows the connectivity of the substrate capacitor pads for the MPC7455, 483 CBGA. All capacitors are
100 nF.
A1 Corner
1
Pad Number
C7-1C8-1C9-1
Capacitor
-1-2
C7-2
C6-2C5-2
C4-1C5-1C6-1
C4-2
C3-2C2-2C1-2
C3-1
C9-2C8-2
C10-1C11-1
C12-2C11-2C10-2
C1-1C2-1
C12-1
C1OV
C2V
C3OV
C4OV
C5V
C6OV
C7AV
C8OV
C9GV
C10GV
C11V
C12GV
DD
DD
DD
DD
DD
DD
DD
DD
DD
DD
DD
DD
GND
GND
GND
GND
GND
GND
GND
GND
GND
GND
GND
GND
Figure 23. Substrate Bypass Capacitors for the MPC7455, 483 CBGA
9System Design Information
This section provides system and thermal design recommendations for succ essful application of the MPC7455.
9.1PLL Configuration
The MPC7455 PLL is configured by the PLL_CFG[0:4] signals. For a given SYSCLK (bus) frequency, the PLL
configuration signals set the internal CPU and VCO frequency of operation. The PLL configuration for the
MPC7455 is shown in Table 17 for a set of ex ample fre quencies . In this ex ample, sh aded cells re present s ettings
that, for a given SYSCLK frequency, result in core and/or VCO frequencies that do not comply with the 1-GHz
column in Table 8. Note that these configurations were different in devices prior to Rev F; see Section 11.2, “Part
Numbers Not Fully Addressed by This Document,” for more information regarding documentation of prior
11110PLL offPLL off , no core c lo c k i ng occurs
Notes:
1. PLL_CFG[0:4] settings not listed are reserved.
2. The sample bus-to-core frequencies shown are for reference only. Some PLL configurations may select bus, core,
or VCO frequencies which are not useful, not supported, or not tested for by the MPC7455; see Section 5.2.1,
“Clock AC Specifications,” for valid SYSCLK, core, and VCO frequencies.
3. In PLL-bypass mode, the SYSCLK input signal clocks the internal processor directly and the PLL is disabled.
However, the bus interface unit requires a 2x clock to function. Therefore, an additional signal, EXT_QUAL, must
be driven at one-half the frequency of SYSCLK and offset in phase to meet the required input setup t
time t
(see Table 9). The result will be that the processor bus frequency will be one-half SYSCLK while the
IXKH
IVKH
and hold
internal processor is clocked at SYSCLK frequency. This mode is intended for factory use and emulator tool use
only.
Note: The AC timing specifications given in this document do not apply in PLL-bypass mode.
4. In PLL-off mode, no clocking occurs inside the MPC7455 regardless of the SYSCLK input.
The MPC7455 generates the clock for the external L3 synchronous data SRAMs by dividing the core clock
frequency of the MPC7455. The core-to-L3 frequency divisor for the L3 PLL is selected through the L3_CLK bits
of the L3CR register. Generally, the divisor must be chosen according to the frequency supported by the external
RAMs, the frequency of the MPC745 5 core, and timing ana lysis of the cir cuit board routing . Table 18 shows various
example L3 clock frequencie s that can be obtained for a given set of core frequencies.
Table 18. Sample Core-to-L3 Frequencies
Core Frequency
(MHz)
50025020016714312510083
53326621317815213310789
550
600
2
650
2
666
2
700
2
733
2
800
2
867
2
933
2
1000
Notes:
1. The core and L3 frequencies are for reference only. Note that maximum L3 frequency is design dependent. Some
examples may represent core or L3 frequencies which are not useful, not supported, or not tested for the MPC7455;
see Section 5.2.3, “L3 Clock AC Specifications,” for valid L3_CLK frequencies and for more information regarding
the maximum L3 frequency. Shaded cells do not comply with Table 10.
2. These core frequencies are not supported by all speed grades; see Table 8.
÷2÷2.5÷3÷3.5÷4÷5÷6
27522018315713811092
300240200171150120100
325260217186163130108
333266222190167133111
350280233200175140117
367293244209183147122
400320266230200160133
433347289248217173145
467373311266233187156
500400333285250200166
9.2PLL Power Supply Filtering
The AVDD power signal is provided on the MPC7455 to provide power to the clock generation PLL. To ensure
stability of the inte rnal cl ock, the power suppl ied to the AVDD input signal should be filt ered of any noise in the 500
kHz to 10 MHz resonant freque ncy range of the PLL. A circuit similar to the one shown in Figure24 using surface
mount capacitors with minimum effective series inductance (ESL) is recommended.
The circuit should be placed as close as possible to the AV
It is often possib le to route dire ctly fr om the c apacitor s to t he AVDD pin, which is o n the pe ripher y of t he 360 C BGA
footprint and very close to the periphery of the 483 CBGA footprint, without the inductance of vias.
pin to minimize noise coupled from nearby circuits.
DD
System Design Information
V
DD
10 Ω
AV
2.2 µF 2.2 µF
Low ESL Surface Mount Capacitors
GND
Figure 24. PLL Power Supply Filter Circuit
DD
9.3Decoupling Recommendations
Due to the MPC7455 dynamic power management feature, large address and data buses, and high operating
frequencies, the MPC7455 can generate transient power surges and high frequency noise in its power supply,
especially while drivi ng l ar ge capac iti ve loads. This nois e must be pre vented f rom reachin g othe r comp onents i n the
MPC7455 system, and the MPC7455 itself requires a clean, tightly regulated source of power. Therefore, it is
recommended that the system designer place at least one decoupling capacitor at each V
of the MPC7455. It is also recommended that these decoupling capacitors receive their power from separate V
OVDD/GVDD, and GND power planes in the PCB, utilizing short traces to minimize inductance.
These capacitors should have a value of 0.01 or 0.1 µF. Only ceramic surface mount technology (SMT) capacitors
should be used to minimize lead induc tance, prefe rably 0508 or 0603 o rientations whe re connectio ns are made along
the length of the part. Consistent with the recommendations of Dr. Howard Johnson in High Speed Digital Design:A Handbook of Black Magic (Prentice Hall, 1993) and contrary to previous recommendations for decoupling
Freescale micr oprocesso rs, multip le small capa citors of equa l value a re recommende d over using mult iple value s of
capacitance.
, OVDD, and GVDD pin
DD
DD
,
In addition, it is recommended that there be se veral bulk storage capacitors dis tributed around the PCB, feeding the
, GVDD, and OVDD planes, to enable quick recharging of the smaller chip capacitors. These bulk capacitors
V
DD
should have a low equivalent se ries resist ance (ESR) rating to en sure the quick r esponse t ime necessary . They should
also be connected to the power and ground planes through two vias to minimize inductance. Suggested bulk
capacitors: 100–330 µF (AVX TPS tantalum or Sanyo OSCON).
9.4Connection Recommendations
To ensure reliable operation, it is highly recommended to connect unused inputs to an appropriate signal level.
Unused active low i nputs should be tied to OVDD. Unused active high inputs should be connected to GND. All NC
(no-connect) sign als must remain unconnected.
Power and ground connections must be made to all external V
If the L3 interface is not used, GVDD should be connected to the OV
, OVDD, GVDD, and GND pins in the MPC7455.
DD
power plane, and L3VSEL should be
DD
connected t o BVS E L.
9.5Output Buffer DC Impedance
The MPC7455 processor bus and L3 I/O drivers are characterized over process, voltage, and temperature. To
measure Z
is varied until the pad volta ge is OV
The output impedance is the average of two components, the resistanc es of the pull- up and pull-down de vices. When
data is held low, SW2 is closed (SW1 is open), and R
then becomes the resistance of the pull-down devices. When data is held high, SW1 is closed (SW2 is open), and
, an external resistor is connected from the chip pad to OVDD or GND. Then, the value of each resistor
0
/2 (see Figure 25).
DD
is trimmed until the voltage at the pad equals OVDD/2. R
RP is trimmed unti l the vol tage at t he pad equals OVDD/2. RP then becomes the resistance of the pull-up devices. R
and RN are designed to be close to each other in value. Then, Z0 = (RP + RN)/2.
Table 19 summarizes the signal impedance results. The impedance increases with junction temperature and is
relatively unaf fected by bus voltage.
Table 19. Impedance Characteristics
VDD = 1.5 V, OVDD = 1.8 V ± 5%, Tj = 5°–85°C
ImpedanceProcessor BusL3 BusUnit
Z
Typical33–4234–42Ω
0
Maximum31–5132–44Ω
9.6Pull-Up/Pull-Down Resistor Requirements
The MPC7455 requires high-resistive (weak: 4.7-kΩ) pull-up resistors on several control pins of the bus interface
to maintain the control signals in the negated state after they have been actively negated and released by the
MPC7455 or other bus masters. These pins are: TS, ARTRY , SHDO, and SHD1.
Some pins des ignated as being for factory test must be pulled up to OV
or down to GND to ensure proper device
DD
operation. For the MPC7445, 360 BGA, the pi ns that mus t be pulled up to OVDD are: LSSD_MODE and TEST[0:3];
the pins that must be pulled down to GND are: L1_TSTCLK and TEST[4]. For the MPC7455, 483 BGA, the pins
that must be pulled up to OV
are: LSSD_MODE and TEST[0:5]; the pins that must be pulled down are:
DD
L1_TSTCLK and TEST[6]. The CKSTP_IN signal should likewise, be pulled up through a pull-up resistor (weak
or stronger: 4.7–1 kΩ) to prevent erroneous assertions of this signal
In addition, the MPC7455 has one open-drain style output that requires a pull-up resistor (weak or stronger:
4.7–1 kΩ) if it is used by the system. This pin is CKSTP_OUT
.
If pull-down resistors are used to configure BVSEL or L3VSEL, the resistors should be less than 250 Ω (see
Table 16). Because PLL_CFG[0:4] must remain stable during normal operation, strong pull-up and pull-down
resistors (1 kΩ or less) are recommended to configure these signals in order to protect against erroneous switching
due to ground bounce, power supply noise or noise coupling.
During inactive periods on the bus, the address and transfer attributes may not be driven by any master and may,
therefore, float in the high-impedance state for relatively long periods of time. Because the MPC7455 must
continually monitor these signals for snooping, this float condition may cause excessive power draw by the input
receivers on the MPC7455 or by other receive rs in the system. These signals c an be pulled up through weak (10-kΩ)
pull-up resistors by the system, address bus driven mode enabled (see the MPC7450 RISC Microporcessor FamilyUsers’ Manual for more information on this mode), or they may be otherwise driven by the system during inactive
periods of the bus to avoid this additional power draw. Preliminary studies have shown the additional power draw
by the MPC7455 input receivers to be negligible and, in a ny event, none of these measures are necessary for proper
device operation. The snooped address and transfer attribute inputs are: A[0:35], AP[0:4], TT[0:4], CI
.
GBL
, WT, and
If extended addressing is not used, A[0:3] are unused and must be pulled low to GND through weak pull-down
resistors. If the MPC7455 is in 60x bus mode, DTI[0:3] must be pulled low to GND through weak pull-down
resistors.
The data bus input receivers are normally turned off when no read operation is in progress and, therefore, do not
require pull-up resistors on the bus. Other data bus receivers in the system, however, may require pull-ups, or that
those signals be otherwise driven by the system during inactive periods by the system. The data bus signals are:
D[0:63] and DP[0:7].
If address or data parity is not used by the system, and the respective parity checking is disabled through HID0, the
input receivers for those pins are disabled, and those pins do not require pull-up resistors and should be left
unconnected by the system. If all parity generation is disabled through HID0, then all parity checking should also
be disabled through HID0, and all parity pins may be left unconnected by the system.
The L3 interface does not normally require pull-up resistors.
9.7JTAG Configuration Signals
Boundary-scan testing is enabled through the JTAG interface signals. The TRST signal is optional in the IEEE
1149.1 s pecif ication, bu t is provided o n a ll proce ssors that im plement the P owerPC arch itectur e. Whil e it i s pos sible
to force the TAP controller to the reset state using only the TCK and TMS signals, more reliable power-on reset
performance will be obtained if the TRST signal is asserted during power-on reset. Because the JTAG interface is
also used for accessing the common on-chip processor (COP) function, simply tying TRST
practical.
The COP fu nctio n of these pro cessors allow s a rem ote comp uter system (ty pically, a PC with ded ica ted hard war e
and debugging softwa re) to access and control the inter nal operations of the processor. The COP interface connects
primarily through the JTAG port of the processor, with some additional status monitoring signals. The COP port
requires the ability to independently assert HRESET
or TRST in order to fully control the processor. If the target
system has independent reset sources, such as voltage monitors, watchdog timers, power supply failures, or
push-button switch es, then the COP reset signals must be merged into these signa ls with logic.
to HRESET is not
The arrangement shown in Figure 26 allows the COP port to independently assert HRESET
or TRST , whi le ens uring
that the target can drive HRESET as well. If the JTAG interface and COP header will not be used, TRST should be
tied to HRE SET through a 0-Ω isolation resistor so that it is asserted when the system reset signal (HRESET) is
asserted, en suring th at the JTAG scan chain is in itialized du ring powe r-on. While Fr eescale recom mend s that the
COP header be designed int o the system as sh own in Figure 26, if this is not possibl e, the isol ation resistor wil l allow
future access to TRST
in the case where a JTAG interface may need to be wired onto t he system i n debug si tuations .
The COP header shown in Figure26 adds many benefits—breakpoints, watchpoints, register and memory
examination/modification, and other standard debugger features are possible through this interface—and can be as
inexpensive as an unpopulat ed footprint for a header to be added when needed.
The COP interface ha s a standard heade r for connection t o the tar get system, based on the 0. 025" square-post, 0.100"
centered header assembly (often called a Berg header). The connector typically has pin 14 removed as a connector
key.
There is no standardized way to number the COP header shown in Figure 26; consequently, many different pin
numbers have been observed from emulator vendors. Some are numbered top-to-bottom then left-to-right, while
others use left- to-right then top-to-bottom, while still others number the pins counter clockwise from pin 1 (as with
an IC). Regardless of the numbering, the signal placement recommended in Figure 26 is common to all known
emulators.
The QACK
signal shown in Figure 26 is usually connected to the PCI bridge chip in a system and is a n input to the
MPC7455 informing it th at it can go into the qui escent state . Under normal op eration this occ urs during a low-power
mode selection. In order for COP to work, the MPC7455 must see thi s signal asserted (pulled down). While shown
on the COP header, not all emulator products drive this signal. If the product does not, a pull-down resistor can be
populated to assert this signal. Additionally, some emulator products implement open-drain type outputs and can
only drive QACK
when it is not being driven by the tool. Note that the pull-up and pull-down resistors on the QACK
asserted; for these tools, a pull-up re sisto r can be implemented to ensur e this signal is de -ass erted
mutually exclu sive and it is never nec essary to pop ulate both in a system. To preserve correct powe r-down operation,
QACK should be merged via logic so that it also can be driven by the PCI bridge.
From Target
Board Sources
2
1
3
4
516
7
8
9
10
11
12
KEY
13
No Pin
15
16
COP Connector
Physical Pin Out
(if any)
Key
COP Header
SRESET
HRESET
QACK
13
11
4
VDD_SENSE
6
1
5
CHKSTP_OUT
15
2
14
CHKSTP_IN
8
TMS
9
TDO
1
TDI
3
TCK
7
QACK
2
10
12
16
HRESET
SRESET
TRST
NC
NC
2 kΩ
3
0 Ω
2 kΩ
10 kΩ
10 kΩ
5
10 kΩ
10 kΩ
10 kΩ
10 kΩ
10 kΩ
10 kΩ
4
SRESET
HRESET
OV
DD
OV
DD
OV
DD
OV
DD
TRST
OV
DD
OV
DD
CHKSTP_OUT
OV
DD
OV
DD
CHKSTP_IN
TMS
TDO
TDI
TCK
QACK
OV
DD
Notes:
1. RUN/STOP
, normally found on pin 5 of the COP header, is not implemented on the MPC7455. Co
pin 5 of the COP header to OVDD with a 10-kΩ pull-up resistor.
2. Key location; pin 14 is not physically present on the COP header.
3. Component not populated. Populate only if debug tool does not drive QACK
.
4. Populate only if debug tool uses an open-drain type output and does not actively de-assert QAC
5. If the JTAG interface is implemented, connect HRESET from the target source to TRST from the
header though an AND gate to TRST
of the part. If the JTAG interface is not implemented, co
HRESET from the target source to TRST of the part through a 0-Ω isolation reisistor.
This section provides thermal management information for the ceramic ball grid array (CBGA) package for
air-cooled applications. Proper thermal control design is primarily dependent on the system-level design—the heat
sink, airflow, and thermal interface material. To reduce the die-junction temperature, heat sinks may be attached to
the package by se veral met hods—spring c lip t o holes in the pr inted-ci rcui t board or package, a nd mounti ng clip a nd
screw a sse mb ly (s ee Figure 27); however, due to the potential large mass of the heat sink, attachment through the
printed-circuit board is suggested. If a spring clip is used, the spring force should not exceed 10 pounds.
Heat Sink
Heat Sink
Clip
Thermal Interface Material
Figure 27. Package Exploded Cross-Sectional View with Several Heat Sink Options
CBGA Package
Printed-Circuit Board
The board designer can choose between several types of heat sinks to place on the MPC7455. There are several
commercially available heat sinks for the MPC7455 provided by the following vendors:
Aavid Thermalloy603-224-9988
80 Commercial St.
Concord, NH 03301
Internet: www.aavidthermalloy.com
Alpha Novatech408-749-7601
473 Sapena Ct. #15
Santa Clara, CA 95054
Internet: www.alphanovatech.com
International Ele ctronic Research Corporati on (IERC)818-842-7277
413 North Moss St.
Burbank, CA 91502
Internet: www.ctscorp.com
T yco Electronics800-522-6752
Chip Coolers™
P.O. Box 3668
Harrisbur g, PA 17105-3668
Internet: www.chipcoolers.com
Ultimately, the final selection of an appropriate heat sink depends on many factors, such as thermal performance at
a given air velocity, spatial volume, mass, attachment method, assembly, and cost.
9.8.1Internal Package Conduction Resistance
For the exposed-die packaging technology, shown in Table 3, the intrinsic conduction thermal resistance paths are
as follows:
•The die junction-to-case (actually top-of-die since silicon die is exposed) thermal resistance
•The die junction-to-ba ll thermal resistance
Figure 28 depicts the primary heat transfer path for a package with an atta ched heat sink mounted to a print ed-circuit
board.
External Resistance
Heat Sink
Internal Resistance
Printed-Circuit Board
External Resistance
(Note the internal versus external package resistance.)
Figure 28. C4 Package with Heat Sink Mounted to a Printed-Circuit Board
RadiationConvection
Thermal Interface Material
Die/Package
Die Junction
Package/Leads
RadiationConvection
Heat generated on the active side of the chip is conducted through the silicon, then through the heat sink attach
material (or thermal inte r face material), and finally to the heat sink where it is removed by forced-air convection.
Because the silicon thermal resistance is quite small, for a first-order analysis, the temperature drop in the silicon
may be neglected. Thus, the thermal interface material and the heat sink conduction/co nvective thermal resis tances
are the dominant terms.
9.8.2 Thermal Interface Materials
A thermal interface material is recommended at the package lid-to-heat sink interface to minimize the thermal
contact resistance. For those applications where the heat sink is attached by spring clip mechanism, Figure 29 shows
the thermal performanc e of three th in-sheet thermal-i nterfa ce materia ls (sili cone, graphit e/ oil, fl oroether oil) , a bare
joint, and a joint with thermal grease a s a function of contact pressure. As shown, the performance of these ther mal
interface materials improves with increasing contact pressure. The use of thermal grease significantly reduces the
interface t hermal resistance. That is, the bare joint results in a thermal resi stance approximately se ven times greater
than the thermal grease joi nt.
Often, heat sinks are attached to the package by means of a spring clip to holes in the printed-circuit board (see
Figure 27). Therefore, the synthetic grease offers the best thermal performance, considering the low interface
pressure and is recommended due to the high power dissipation of the MPC7455. Of course, the selection of any
thermal inter face mate rial de pends o n many factor s—thermal performanc e requi rements , manufac turabili ty, service
temperature, dielectric properties, cost, etc.
Figure 29. Thermal Performance of Select Thermal Interface Material
The board designer can choose between several types of thermal interface. Heat sink adhesive materials should be
selected based on high conductivity, yet adequate mechanical strength to meet equipment shock/vibration
requirements. There are several commercially available thermal interfaces and adhesive materials provided by the
following vendors:
The Bergquist Company800-347-4572
th
18930 West 78
St.
Chanhassen, MN 55317
Internet: www.bergquistcompany.com
Chomerics, Inc.781-935-4850
77 Dragon Ct.
Woburn, MA 01888-4014
Internet: www.chomerics.com
Dow-Corning Corporation800-248-2481
Dow-Corning Electronic Materials
2200 W. Salzburg Rd.
Midland, MI 48686-0997
Internet: www.dow.com
Shin-Etsu MicroSi, Inc.888-642-7674
10028 S. 51st St.
Phoenix, AZ 85044
Internet: www.microsi.com
Thermagon Inc.888-246-9050
4707 Detroit Ave.
Cleveland, OH 44102
Internet: www.thermagon.com
The following section provide s a heat sink selection example using one of the commerci ally available heat sinks.
9.8.3 Heat Sink Selection Example
For preliminary heat sink sizing, the die-junction temperature can be expressed as follows:
= Ta + Tr + (R
T
j
θJC
+ R
θint
+ R
θsa
) × Pd
where:
is the die-junction temper ature
T
j
is the inlet cabinet ambient temperature
T
a
is the air temperature rise within the computer cabinet
T
r
is the junction-to-ca se thermal resistance
R
θJC
is the adhesive or interface material thermal resistance
R
θint
is the heat sink base-to-ambient thermal resistance
R
θsa
is the power dissipated by the device
P
d
During operation, the die-junction temperatures (T
) should be maintained less than the value specified in Table 4.
j
The temperature of air cooling the component greatly depends on the ambient inl et air tempera ture and the ai r
temperatu re r ise w ith in the el ectro n ic cabinet. A n el ect ron i c c ab ine t inl et -air t em p era t ur e (T
to 40°C. The air temperature rise within a cabinet (T
the therm al in t e r face mate rial ( R
a CBGA pack age R
= 0.1, and a typical power consumption (Pd) of 15.0 W, the following expression for Tj is
θJC
) is typically about 1.5°C/W. For example, assuming a Ta of 30°C, a T
θint
) may be in the range of 5° to 10°C. The thermal resistance of
r
) may ran ge fro m 3 0 °
a
of 5°C,
r
obtained:
Die-junction temperature:T
For this ex ample, a R
value of 3.1°C/W or less is required to maintain the die-junction temperature below the
θsa
= 30°C + 5°C + (0.1°C/W + 1.5°C/W + R
j
) × 15 W
θsa
maximum value of Table 4.
Though the die junction- to-ambient and the heat sink-to-ambient ther mal resistances are a common fi gure-of-merit
used for comparing the thermal performance of various microelectronic packaging technologies, one should
exercise caution when only using this metric in determining thermal management because no single parameter can
adequately desc ribe thr ee-dimens ional he at flow. The final die-junction operatin g temper ature is not on ly a fu nction
of the component-level thermal resistance, but the system-level design and its operating conditions. In addition to
the component's power consumption, a number of factors affect the final operating die-junction
temperature—airflow, board population (local heat flux of adjacent components), heat sink efficiency, heat sink
attach, heat sink placement, next-level interconnect technology, system air temperature rise, altitude, etc.
Due to the complexity and the many variations of system-level boundary conditions for today's microelectronic
equipment, the combined effects of the heat transfer mechanisms (radiation, convection, and conduction) may vary
widely . For these reasons, we recommend using conjuga te heat transfe r models for the board, as well as system-level
designs.
For system thermal mode ling, the MPC7445 and MPC7455 the rmal model is shown in Figure 30. Four volumes will
be used to represent this device. Two of the volumes, solder ball, and air and substrate, are modeled using the
package outline size of the package. The other two, die, and bump and underfill, have the same size as the die.
Dimensions for these volumes for the MPC7445 and MPC7455 are given in Figure 20 and Figure 22, respectively.
The silicon die should be modeled 9.10 × 12.25 × 0.74 mm wi th th e h eat s our ce ap p li ed as a uni form source at t h e
bottom of the volume. The bump and underfill layer is modeled as 9.10 × 12.25 × 0.069 mm (or as a collapsed
volume) with ort hotropic material properties: 0.6 W/(m • K) in the xy-plane and 2 W/(m • K) in the direction of the
z-axis. The substrate volume is 25 × 25 × 1.2 mm (MPC7445) or 29 × 29 × 1.2 m m (MP C7455), and this volume
has 18 W/(m • K) isotropic conductivity. The solder ball and air layer is modeled with the same horizontal
dimensions as the substrate and is 0.9 mm thick. It can also be modeled as a collapsed volume using orthotropic
material propert ies: 0.034 W/(m • K) in the xy-plane direction and 3. 8 W/(m • K) in the direction of the z-axis.
Die
z
Bump and Underfill
ConductivityValueUnit
Bump and Underfill
k
x
k
y
k
z
Substrate
k18
Solder Ball and Air
k
x
k
y
k
z
0.6W/(m • K)
0.6
2
0.034
0.034
3.8
Figure 30. Recommended Thermal Model of MPC7445 and MPC7455
1.1Removed reference to Note 4 for DTI signals in Ta bl e 1 5 and Table 16: these signals are unused in 60x
bus mode and must be pulled down (see Note 13); they are not ignored.
Improved precision of die and package dimensions in Figure 20 and Figure 21.
2Corrected entries in Table 17 for 33 MHz and 50 MHz bus frequencies with multipliers of 24x and higher.
Corrected typographical errors in heatsink selection example in Section 9.8.3, “Heat Sink Selection
Example.”
Removed erroneous instances of PLL_EXT signal name and changed remaining instances of
PLL_CFG[0:3] to PLL_CFG[0:4]. (These were artifacts from older revisions; see entry for Rev 1.0.)
Corrected erroneous instances (artifacts) mentioning 1.6 V core voltage. Core voltage for devices
completely covered by this revision (and revisions 1.
Corrected errors in PLL multipliers in Table 17: 32x and 25x are not supported ratios, 3x and 4x are
supported, 10.5x and 12.5x PLL settings were incorrect.
x)
of this document is 1.3 V.
Replaced notes at bottom of Tab le 1 7 (erroneously missing in revisions 1.
Updated coplanarity specifications in Figure 20 and Figure 21 from 0.2 mm to 0.15 mm.
3Added Revision G (Rev 3.4) devices to specifications.
Added new PowerPC trademarking information.
4Added substrate capacitor information in Section 8.3, “Substrate Capacitors for the MPC7445, 360
CBGA,” and Section 8.6, “Substrate Capacitors for the MPC7455, 483 CBGA.”
Clarified maximum and typical L3 clock frequency in Section 5.2.3, “L3 Clock AC Specifications”; typical
L3 frequency now stated as 250 MHz based on changes to L3 AC timing.
Significantly changed L3 AC timing in Tab l e 12 and Table 13. These changes reflect both updates
based on latest characterization and error corrections (effects of non-zero L3OH values were incorrectly
documented in earlier revisions of this document).
Clarified address bus pull-up resistor recommendations in Section 9.6, “Pull-Up/Pull-Down Resistor
Requirements.”
Added pull-up/pull-down recommendations for CKSTP_IN
“Pull-Up/Pull-Down Resistor Requirements.”
Modified Table 9, Figure 5, and Figure 6 to more accurately show when the mode select inputs
(BMODE
Figure 20 and Figure 22: Updated/corrected dimensions in mechanical drawings.
4.1Document tempate update.
[0:1], L3VSEL, BVSEL) are sampled and AC timing requirements.
and PLL_CFG[0:4] to Section 9.6,
x
).
11Ordering Information
Ordering information for the parts fully covered by this specification document is provided in Section 11.1, “Part
Numbers Fully Addressed by This Document.” Note that the individual part numbers correspond to a maximum
processor core frequency. For available frequencies, contact your local Freescale sales office. In addition to the
processor frequency, the part numbering scheme also includes an application modifier which may specify special
application conditions. Each part number also contains a revision level code which refers to the die mask revision
number. Sectio n 11.2, “Part Numbers Not Fully Addressed by This Document , ” lists the part number s which do not
fully conform to the specifications of this document. These special part numbers require an additional document
called a part number specification.
11.1 Part Numbers Fully Addressed by This Document
Table 21 provides the Freescale part numbering nomenclature for the MPC7455.
Table 21. Part Numbering Nomenclature
xx74x5xRXnnnnxx
Product
Code
2
XC
MCG: 3.4; PVR = 8001 0304
Notes:
1. Processor core frequencies supported by parts addressed by this specification only. Parts addressed by part
number specifications may support other maximum core frequencies.
2. The X prefix in a Freescale part number designates a “Pilot Production Prototype” as defined by Freescale SOP
3-13. These are from a limited production volume of prototypes manufactured, tested, and Q.A. inspected on a
qualified technology to simulate normal production. These parts have only preliminary reliability and
characterization data. Before pilot production prototypes may be shipped, written authorization from the customer
must be on file in the applicable sales office acknowledging the qualification status and the fact that product changes
may still occur while shipping pilot production prototypes.
Part
Identifier
7455
7445
Process
Descriptor
ARX=CBGA733
Package
Processor
Frequency
867
933
1000
Application
1
Modifier
L: 1.3 V ± 50 mV
0 to 105°C
Revision Level
F: 3.3; PVR = 8001 0303
11.2 Part Numbers Not Fully Addressed by This Document
Parts with application modifiers or revision levels not fully addressed in this specification document are described
in separate part number specifications which supplement and supersede this document; see Table 22 through
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