The MCF51JM128 is a member of the ColdFire family of
32-bit reduced instruction set computing (RISC)
microprocessors. This document provides an overview of the
MCF51JM128 series, focusing on its highly integrated and
diverse feature set.
The MCF51JM128 series is based on the V1 ColdFire core
and operates at processor core speeds up to 50.33 MHz. As
part of Freescale’s Controller Continuum
upgrade for designs based on the MC9S08JM60 series of 8-bit
microcontrollers.
®
, it is an ideal
Document Number: MCF51JM128
Rev. 4, 05/2012
MCF51JM128
The MCF51JM128 features the following functional units:
• V1 ColdFire core with background debug module
• Up to 128 KB of flash memory
• Up to 16 KB of static RAM (SRAM)
• Multipurpose clock generator (MCG)
• Dual-role Universal Serial Bus On-The-Go device
(USBOTG)
• Controller-area network (MSCAN)
• Cryptographic acceleration unit (CAU)
• Random number generator accelerator (RNGA)
• Analog comparators (ACMP)
• Analog-to-digital converter (ADC) with up to 12 channels
Up to 16 pins on Ports A, H, and J are shared with the ColdFire Rapid GPIO module.
1.2Block Diagram
Figure 1 shows the connections between the MCF51JM128 series pins and modules.
Figure 1. MCF51JM128 Block Diagram
MCF51JM128 ColdFire Microcontroller, Rev. 4
Freescale Semiconductor4
MCF51JM128 Family Configurations
1.3Features
Table 2 describes the functional units of the MCF51JM128 series.
Table 2. MCF51JM128 Series Functional Units
UnitFunction
CF1CORE (V1 ColdFire core)Executes programs and interrupt handlers
BDM (background debug module)Provides a single-pin debugging interface (part of the V1 ColdFire core)
DBG (debug)Provides debugging and emulation capabilities (part of the V1 ColdFire core)
SYSCTL (system control)Provides LVD, COP, external interrupt request, and so on
FLASH (flash memory)Provides storage for program code and constants
RAM (random-access memory)Provides storage for program code, constants, and variables
RGPIO (rapid general-purpose input/output)Allows I/O port access at CPU clock speeds
VREG (voltage regulator)Controls power management throughout the device
USBOTG (USB On-The-Go)Supports the USB On-The-Go dual-role controller
ADC (analog-to-digital converter)Measures analog voltages at up to 12 bits of resolution
TPM1, TPM2 (timer/pulse-width modulators)Provide a variety of timing-based features
CF1_INTC (interrupt controller)Controls and prioritizes all device interrupts
CAU (cryptographic acceleration unit)Co-processor support for DES, 3DES, AES, MD5, and SHA-1
RNGA (random number generator accelerator)32-bit random number generator that complies with FIPS-140
RTC (real-time counter)Provides a constant-time base with optional interrupt
ACMP (analog comparator)Compares two analog inputs
CMT (carrier modulator timer)Infrared output used for the Remote Controller
IIC1, IIC2 (inter-integrated circuits)Supports the standard IIC communications protoc ol
KBI (keyboard interrupt)Provides pin interrupt capabilities
MCG (multipurpose clock generator)Provides clocking options for the device, including a phase-locked loop (PLL)
and frequency-locked loop (FLL) for multiplying slower reference clock
sources
XOSC (crystal oscillator)Supports low/high range crystals
CAN (controller area network)Supports standard CAN communications protocol
SCI1, SCI2 (serial communications interfaces)Serial communications UARTs that can support RS-232 and LIN protocols
SPI1, SPI2 (serial peripheral interfaces)Provide a 4-pin synchronous serial interface
MCF51JM128 ColdFire Microcontroller, Rev. 4
Freescale Semiconductor5
MCF51JM128 Family Configurations
1.3.1Feature List
•32-bit Version 1 ColdFire Central Processor Unit (CPU)
— Up to 50.33 MHz at 2.7 V – 5.5 V
— Performance (Dhrystone 2.1):
– 0.94 Dhrystone 2.1 MIPS per MHz when running from in tern al RAM
– 0.76 Dhrystone 2.1 MIPS per MHz when running from flash
— Implements Instruction Set Revision C (ISA_C)
— Supports up to 30 peripheral interrupt requests and seven software interrupts
•On-chip memory
— Up to 128 KB Flash memory with read/program/erase over full operating voltage and temperature range
— Up to 16 KB static random access memory (RAM)
— Security circuitry to prevent unauthorized access to RAM and flash contents
•Power-saving modes
— Two low-power stop plus wait modes
— Peripheral clock enable register can disable clocks to unused modules, thereby reducing currents; this behavior
allows clocks to remain enabled to specific perhipherals in Stop3 mode
— Very lower power real-time counter for use in run, wait, and stop modes with internal and external clock sources
•Four Clock Source Options
— Oscillator (XOSC) — Loop-control Pierce oscillator; crystal or ceramic resonator range of 31.25 kHz to 38.4 kHz
or 1 MHz to 16 MHz
— FLL/PLL controlled by internal or external reference
— Trimmable internal reference allows 0.2% resolution and 2% deviation
•System protection features
— W atchdog computer operating properly (COP) reset with option to run from dedicated 1 kHz internal clock source
or bus clock
— Low-voltage detection with reset or interrupt; selectable trip points
— Illegal opcode and illegal address detection with programmable reset or exception response
— Flash block protection
•Debug support
— Single-wire Background debug interface
— 4 Program Counters plus two address (optional data) breakpoint registers with programmable 1- or 2-level trigger
response
— 64-entry processor status and debug data trace buffer with programmable start/stop conditions
•Universal Serial Bus (USB) On-The-Go dual-role controller
— Full-speed USB device controller
– Fully compliant with USB specificatio n 1.1 and 2.0
– 16 bidirectional endpoints, with double buffering to provide the maximum throughput
– Supports control, bu lk, interrupt, and isochronous endpoints
– Supports bus-powered capabi lit y with low-power consumption
— Full-speed / low-speed host controller
– Host mode allows control, bulk, interrupt, and isochronous transfers
— OTG protocol logic
— On-chip USB transceiver
— On-chip 3.3 V USB regulator and pull-up resistors save system cost
MCF51JM128 ColdFire Microcontroller, Rev. 4
Freescale Semiconductor6
MCF51JM128 Family Configurations
•Controller area network (MSCAN)
— Implementation of the CAN protocol — Version 2.0A/B
— Five receive buffers with FIFO storage scheme
— Three transmit buffers with internal prioritization using a “local priority” concept
— Flexible maskable identifier filter programmable as 2x32-bit, 4x16-bit, or 8x8-bit
— Programmable wakeup functionality with integrated low-pass filter
— Programmable loopback mode supports self-test operation
— Programmable bus-off recovery functionality
— Internal timer for time-stamping of received and transmitted messages
•Cryptographic acceleration unit (CAU)
— Co-processor support of DES, 3DES, AES, MD5, and SHA-1
•Random number generator accelerator (RNGA)
— 32-bit random number generator that complies with FIPS-140
•Analog-to-digital converter (ADC)
— 12-channel, 12-bit resolution
— Output formatted in 12-, 10-, or 8-bit right-justified format
— Single or continuous conversion, and selectable asynchronous hardware conversion trigger
— Operation in Stop3 mode
— Automatic compare function
— Internal temperature sensor
•Analog comparators (ACMP)
— Selectable interrupt on rising edge, falling edge, or either rising or falling edges of comparator output
— Option to compare to fixed internal bandgap reference voltage
— Option to route output to TPM module
— Operation in Stop3 mode
•Inter-integrated circuit (IIC)
— Up to 100 kbps with maximum bus loading
— Multi-master operation
— Programmable slave address
— Supports broadcast mode and 10-bit address extension
•Serial communications interfaces (SCI)
— T wo SCIs with full-duplex, non-return-to-zero (NRZ) format
— LIN master extended break generation
— LIN slave extended break detection
— Programmable 8-bit or 9-bit character length
— Wake up on active edge
•Serial peripheral interfaces (SPI)
— Two serial peripheral interfaces with full-duplex or single-wire bidirectional
— Double-buffered transmit and receive
— Programmable transmit bit rate, phase, polarity, and Slave Select output
— MSB-first or LSB-first shifting
•Timer/pulse width modulator (TPM)
— 16-bit free-running or modulo up/down count operation
— Up to eight channels, where each channel can be an input capture, output compare, or edge-aligned PWM
— One interrupt per channel plus terminal count interrupt
MCF51JM128 ColdFire Microcontroller, Rev. 4
Freescale Semiconductor7
MCF51JM128 Family Configurations
•RTC
— 8-bit modulus counter with binary- or decimal-based prescaler
— External clock source for precise time base, time-of-day, calendar or task scheduling functions
— Free running on-chip low power os cil lator (1 kHz) for cyclic wake-up without external components
•Carrier modulator timer (CMT)
— carrier generator, modulator, and transmitter drive the infrared out (IRO) pin
— operation in independent high/low time control, baseband, FSK, and direct IRO control modes
•Input/Output
— 66 GPIOs
— Eight keyboard interrupt pins with selectable polarity
— Hysteresis and configurable pull-up device on all input pins; configurable slew rate and drive strength on all output
pins
— 16 bits of Rapid GPIO connected to the processor’s local 32-bit platform bus with set, clear, and faster toggle
functionality
1.4Part Numbers
Table 3. Orderable Part Number Summary
Freescale Part
Number
MCF51JM128EVLKMCF51JM128 ColdFire Microcontroller
with CAU and RNGA Enabled
MCF51JM128VLKMCF51JM128 ColdFire Microcontroller128 / 1680 LQFP–40 to +105 C
MCF51JM128EVLHMCF51JM128 ColdFire Microcontroller
with CAU and RNGA Enabled
MCF51JM128VLHMCF51JM128 ColdFire Microcontroller128 / 1664 LQFP–40 to +105 C
MCF51JM128EVQHMCF51JM128 ColdFire Microcontroller
with CAU and RNGA Enabled
MCF51JM128VQHMCF51JM128 ColdFire Microcontroller128 / 1664 QFP–40 to +105 C
MCF51JM128EVLDMCF51JM128 ColdFire Microcontroller
with CAU and RNGA Enabled
MCF51JM128VLDMCF51JM128 ColdFire Microcontroller128 / 1644 LQFP–40 to +105 C
MCF51JM64EVLKMCF51JM64 ColdFire Microcontroller
with CAU and RNGA Enabled
MCF51JM64VLKMCF51JM64 ColdFire Microcontroller64 / 1680 LQFP–40 to +105 C
MCF51JM64EVLHMCF51JM64 ColdFire Microcontroller
with CAU and RNGA Enabled
MCF51JM64VLHMCF51JM64 ColdFire Microcontroller6 4 / 1664 LQFP–40 to +105 C
Description
Flash / SRAM
(KB)
128 / 1680 LQFP–40 to +105 C
128 / 1664 LQFP–40 to +105 C
128 / 1664 QFP–40 to +105 C
128 / 1644 LQFP–40 to +105 C
64 / 1680 LQFP–40 to +105 C
64 / 1664 LQFP–40 to +105 C
PackageTemperature
MCF51JM64EVQHMCF51JM64 ColdFire Microcontroller
with CAU and RNGA Enabled
MCF51JM64VQHMCF51JM64 ColdFire Microcontroller64 / 1664 QFP–40 to +105 C
MCF51JM128 ColdFire Microcontroller, Rev. 4
64 / 1664 QFP–40 to +105 C
Freescale Semiconductor8
MCF51JM128 Family Configurations
Table 3. Orderable Part Number Summary (continued)
MCF51JM64EVLDMCF51JM64 ColdFire Microcontroller
with CAU and RNGA Enabled
MCF51JM64VLDMCF51JM64 ColdFire Microcontroller6 4 / 1644 LQFP–40 to +105 C
MCF51JM32EVLKMCF51JM32 ColdFire Microcontroller
with CAU and RNGA Enabled
MCF51JM32VLKMCF51JM32 ColdFire Microcontroller32 / 1680 LQFP–40 to +105 C
MCF51JM32EVLHMCF51JM32 ColdFire Microcontroller
with CAU and RNGA Enabled
MCF51JM32VLHMCF51JM32 ColdFire Microcontroller3 2 / 1664 LQFP–40 to +105 C
MCF51JM32EVQHMCF51JM32 ColdFire Microcontroller
with CAU and RNGA Enabled
MCF51JM32VQHMCF51JM32 ColdFire Microcontroller32 / 1664 QFP–40 to +105 C
MCF51JM32EVLDMCF51JM32 ColdFire Microcontroller
with CAU and RNGA Enabled
MCF51JM32VLDMCF51JM32 ColdFire Microcontroller3 2 / 1644 LQFP–40 to +105 C
This section contains electrical specification tables and reference timing diagrams for the MCF51JM128 microcontroller,
including detailed information on power considerations, DC/AC electrical characteristics, and AC timing specifications.
The electrical specifications are preliminary and are from previous designs or design simulations. These specifications may not
be fully tested or guaranteed at this early stage of the product life cycle. These specifications will, however, be met for
production silicon. Finalized specifications will be published after complete characterization and device qualifications have
been completed.
NOTE
The parameters specified in this data sheet supersede any values found in the module
specifications.
2.1Parameter Classification
The electrical parameters shown in this supplement are guaranteed by various methods. To give the customer a better
understanding the following classification is used and the parameters are tagged accordingly in the tables where appropriate:
Table 5. Parameter Classifications
P
Those parameters are guaranteed during production testing on each individual device.
Those parameters are achieved by the design characterization by measuring a
C
statistically relevant sample size across process variations.
Those parameters are achieved by design characterization on a small sample size from
T
typical devices under typical conditions unless otherwise noted. All values shown in the
typical column are within this category.
D
Those parameters are derived mainly from simulations.
NOTE
The classification is shown in the column labeled C in the parameter tables where
appropriate.
2.2Absolute Maximum Ratings
Absolute maximum ratings are stress ratings only, and functional operation at the maxima is not guaranteed. Stress beyond the
limits specified in Table 6 may affect device reliability or cause permanent damage to the device. For functional operating
conditions, refer to the remaining tables in this section.
This device contains circuitry protecting against damage due to high static voltage or electrical fields; however, it is advised
that normal precautions be taken to avoid application of any voltages higher than maximum-rated voltages to this
high-impedance circuit. Reliability of operation is enhanced if unused inputs are tied to an appropriate logic voltage level (for
instance, V
or VDD).
SS
MCF51JM128 ColdFire Microcontroller, Rev. 4
Freescale Semiconductor15
Preliminary Electrical Characteristics
Table 6. Absolute Maximum Ratings
RatingSymbolValueUnit
Supply voltageV
Input voltageV
Instantaneous maximum current Single pin limit
(applies to all port pins)1,2,
Maximum current into V
3
DD
Storage temperatureT
Maximum junction temperatureT
1
Input must be current limited to the value specified. To determine the value of the required
I
DD
In
I
D
DD
stg
J
current-limiting resistor, calculate resistance values f or positive (V
–0.3 to + 5.8V
– 0.3 to VDD + 0.3V
25mA
120mA
–55 to +150C
150C
) and negative (VSS) clamp
DD
voltages, then use the larger of the two resistance values.
2
All functional non-supply pins are internally clamped to VSS and VDD.
3
Power supply must maintain regulation within operating V
operating maximum current conditions. If positive injection current (V
range during instantaneous and
DD
> VDD) is greater than
In
IDD, the injection current may flow out of VDD and could result in external power supply going
out of regulation. Ensure external VDD load shunt current is greater than maximum injection
current. This is the greatest risk when the MCU is not consuming power. Examples: if no system
clock is present or if the clock rate is low, which would reduce overall power consumption.
2.3Thermal Characteristics
This section provides information about operating temperature range, power dissipation, and package thermal resistance. Power
dissipation on I/O pins is usually small compared to the power dissipation in on-chip logic and it is user-determined rather than
being controlled by the MCU design. To take P
pin voltage and V
or VDD and multiply by the pin current for each I/O pin. Except in cases of unusually high pin current
SS
(heavy loads), the difference between pin voltage and V
into account in power calculations, determine the difference between actual
I/O
or VDD is small.
SS
Table 7. Thermal Characteristics
RatingSymbolValueUnit
Operating temperature range (packaged)T
Thermal resistance
A
1,2,3,4
–40 to +105C
80-pin LQFP
1s
2s2p
52
40
64-pin LQFP
1s
2s2p
JA
65
47
C/W
64-pin QFP
1s
2s2p
54
40
44-pin LQFP
1s
2s2p
1
Junction temperature is a function of die size, on-chip power dissipation, package thermal
69
48
resistance, mounting site (board) temperature, ambient temperature, air flow, pow er dissipation
of other components on the board, and board thermal resistance.
2
Junction to Ambient Natural Convection
MCF51JM128 ColdFire Microcontroller, Rev. 4
Freescale Semiconductor16
3
1s - Single Layer Board, one signal layer
4
2s2p - Four Layer Board, 2 signal and 2 power layers
The average chip-junction temperature (TJ) in C can be obtained from:
Although damage from static discharge is much less common on these devices than on early CMOS circuits, normal handling
precautions should be used to avoid exposure to static discharge. Qualification tests are performed to ensure that these devices
can withstand exposure to reasonable levels of static without suffering any permanent damage.
All ESD testing is in conformity with CDF-AEC-Q00 Stress Test Qualification for Automotive Grade Integrated Circuits.
(http://www.aecouncil.com/) This device was qualified to AEC-Q100 Rev E.
A device is considered to have failed if, after exposure to ESD pulses, the device no longer meets the device specification
requirements. Complete DC parametric and functional testing is performed per the applicable device specification at room
temperature followed by hot temperature, unless specified otherwise in the device specification.
Table 8. ESD and Latch-up Test Conditions
ModelDescriptionSymbolValueUnit
Series ResistanceR11500
Human Body
Storage CapacitanceC100pF
Number of Pulse per pin–3
Latch-up
Freescale Semiconductor17
Minimum input voltage limit–2.5V
Maximum input voltage limit7.5V
MCF51JM128 ColdFire Microcontroller, Rev. 4
Preliminary Electrical Characteristics
Table 9. ESD and Latch-Up Protection Characteristics
NumRatingSymbolMinMaxUnit
1Human Body Model (HBM)V
2Charge Device Model (CDM)V
3Latch-up Current at T
= 105CI
A
HBM
CDM
LAT
+/– 2000—V
+/– 500—V
+/– 100—mA
2.5DC Characteristics
This section includes information about power supply requirements, I/O pin characteristics, and power supply current in various
operating modes.
Table 10. DC Characteristics
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
1
MaxUnit
—
—
—
—
V
—
—
—
—
1.5
1.5
0.8
0.8
V
1.5
1.5
0.8
0.8
100
mA
60
100
mA
60
Num CParameterSymbolMinTyp
1Operating voltage
2
2.7—5.5V
Output high voltage — Low Drive (PTxDSn = 0)
2P
Load
Load
Load
Load
= –4 mA
= –2 mA
= –2 mA
= –1 mA
5 V, I
3 V, I
5 V, I
3 V, I
Output high voltage — High Drive (PTxDSn = 1)
5 V, I
3 V, I
5 V, I
3 V, I
= –15 mA
Load
Load
Load
Load
= –8 mA
= –8 mA
= –4 mA
V
OH
VDD – 1.5
VDD –1.5
VDD – 0.8
– 0.8
V
DD
V
– 1.5
DD
–1.5
V
DD
VDD – 0.8
VDD – 0.8
Output low voltage — Low Drive (PTxDSn = 0)
5 V, I
3 V, I
5 V, I
3 V, I
3P
Load
Load
Load
Load
= 4mA
= 2 mA
= 2 mA
= 1 mA
V
OL
Output low voltage — High Drive (PTxDSn = 1)
Load
Load
Load
Load
for all ports
OH
= 15 mA
= 8 mA
= 8 mA
= 4 mA
5V3VI
OHT
—
5 V, I
3 V, I
5 V, I
3 V, I
4P Output high current — Max total I
—
5P Output low current — Max total I
for all ports
OL
5V3VI
OLT
—
—
6P Input high voltage; all digital inputs
V
= 5V
V
DD
= 3V
V
DD
IH
3.25
2.10
MCF51JM128 ColdFire Microcontroller, Rev. 4
—
—
—
V
—
Freescale Semiconductor18
Table 10. DC Characteristics (continued)
Preliminary Electrical Characteristics
Num CParameterSymbolMinTyp
7P Input low voltage; all digital inputs
V
= 5V
V
DD
IL
——
VDD = 3V
8P Input hysteresis; all digital inputsV
9P Input leakage current; input only pins
10P High Impedance (off-state) leakage current
11P Internal pullup resistors
12P Internal pulldown resistors
4
5
13Internal pullup resistor to USBDP (to V
3
USB33
3
|IOZ|—0.11A
R
R
)
Idle
R
Transmit
14C Input Capacitance; all non-supply pinsC
15D RAM retention voltage
6
V
16P POR rearm voltageV
17D POR rearm timet
V
V
18P
19P
Low-voltage detection threshold —
high range
Low-voltage detection threshold —
low range
V
V
V
DD
DD
DD
falling
rising
falling
VDD rising
V
20C
Low-voltage warning threshold —
high range 1
V
DD
falling
VDD rising
0.06 x V
hys
DD
|IIn|—0.11A
PU
PD
PUPD
In
RAM
POR
POR
LVD1
LVD0
LVW3
204565k
204565k
900
1425
1300
2400
—— 8pF
—0.61.0V
0.91.42.0V
10——s
3.9
4.0
2.48
2.54
4.5
4.6
4.0
4.1
2.56
2.62
4.6
4.7
1
MaxUnit
1.75
V
1.05
mV
1575
k
3090
V
4.1
4.2
V
2.64
2.70
V
4.7
4.8
5 V
3 V
V
V
V
LVW2
LVW1
LVW0
V
hys
4.2
4.3
2.84
2.90
2.66
2.72
—
—
4.3
4.4
2.92
2.98
2.74
2.80
100
60
V
4.4
4.5
V
3.00
3.06
V
2.82
2.88
mV
—
—
21
22
23C
24T
Low-voltage warning threshold —
high range 0
P
Low-voltage warning threshold
low range 1
P
Low-voltage warning threshold —
low range 0
Low-voltage inhibit reset/recover hysteresis
V
falling
DD
rising
V
DD
falling
V
DD
VDD rising
V
falling
DD
rising
V
DD
MCF51JM128 ColdFire Microcontroller, Rev. 4
Freescale Semiconductor19
Preliminary Electrical Characteristics
Typ i cal VOL vs. IOL AT V
DD
= 5V
0.00
0.10
0.20
0.30
0.40
0.50
0.60
0.70
0.80
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
I
OL
(mA)
V
OL
(v)
Hot (105°C)
Room ( 2 5 °C)
Cold (-40°C)
Typica l VOL vs. IOL AT VDD = 3V
0.00
0.20
0.40
0.60
0.80
1.00
1.20
1.40
012345678910111213
IOL (mA)
V
OL
(v)
Hot (105°C)
Room (25°C)
Cold (-40°C)
Typical VOL vs. I
OL
AT V
DD
V
0.00
0.10
0.20
0.30
0.40
0.50
0.60
0.70
0.80
0.90
012345
IOL (mA )
V
OL
(v)
H ot (105°C)
Room (25°C)
Cold (-40°C)
Typical V
OL
vs. IOL AT V
DD
= 3V
0.00
0.10
0.20
0.30
0.40
0.50
0.60
0.70
0.80
0.90
0123
IOL (mA)
V
OL
(v)
Hot (105°C)
Room (25°C)
Cold (-40°C)
1
Typical values are based on characterization data at 25C unless otherwise stated.
2
Operating voltage with USB enabled can be found in Section 2.14, “USB Electricals.”
3
Measured with V
4
Measured with V
5
Measured with V
6
This is the voltage below which the contents of RAM are not guaranteed to be maintained.
Data in Typical column was characterized at 5.0 V, 25C or is typical recommended value.
2
When MCG is configured for FEE or FBE mode, input clock source must be divisible using RDIV to within the range of 31.25 kHz
4
5
5
2
3
t
CSTL-LP
t
CSTL-HGO
t
CSTH-LP
t
CSTH-HGO
f
extal
—
—
—
—
0.03125
1
0
200
400
5
15
—
—
—
—
—
—
—
5
16
40
to 39.0625 kHz.
3
When MCG is configured for PEE or PBE mode, input clock source must be divisible using RDIV to within the range of 1 MHz
to 2 MHz.
4
This parameter is characterized and not tested on each device. Proper PC board-layout procedures must be followed to achieve
specifications.
5
4 MHz crystal
ms
MHz
MHz
MHz
MCF51JM128 ColdFire Microcontroller, Rev. 4
Freescale Semiconductor26
Preliminary Electrical Characteristics
2.10MCG Specifications
Table 16. MCG Frequency Specifications (Temperature Range = –40 to 125C Ambient)
Num CRatingSymbolMinTypical
C
DD
f
int_ft
int_ut
irefst
—32.768—kHz
31.25—39.0625kHz
—60100s
16—20
f
dco_ut
—19.92—
f
dco_DMX32
f
dco_res_t
f
dco_res_t
f
dco_t
f
dco_t
t
fll_acquire
t
pll_acquire
C
Jitter
6
vco
f
pll_jitter_625ns
D
lock
D
unl
fll_lock
pll_lock
loc_low
—0.10.2%f
—0.20.4%f
—
–1.0
—0.51%f
—— 1ms
—— 1ms
—0.020.2%f
7.0—55.0MHz
—0.5665—%f
1.49—2.98%
4.47—5.97%
——
——
(3/5) x f
int
1P
Internal reference frequency - factory trimmed at V
= 5 V and temperature = 25
C
2P Average internal reference frequency – untrimmed f
3T Internal reference startup timet
P
DCO output frequency
4
range - untrimmed
2
Low range (DRS=00)
PHigh range (DRS=10)48—60
P
DCO output frequency
5
6D
7D
8D
9D
Reference =32768Hz
and DMX32 = 1
PHigh range (DRS=10)—59.77—
Resolution of trimmed DCO output frequency at fixed
voltage and temperature (using FTRIM)
Resolution of trimmed DCO output frequency at fixed
voltage and temperature (not using FTRIM)
T otal de viation of trimmed DCO output frequency over
voltage and temperature
T otal de viation of trimmed DCO output frequency over
fixed voltage and temperature range of 0 – 70
10D FLL acquisition time
11D PLL acquisition time
12D
Long term Jitter of DCO output clock (averaged over
2ms interval)
5
2
Low range (DRS=00)
3
4
13D VCO operating frequencyf
14D Jitter of PLL output clock measured over 625 ns
15D Lock entr y frequency tolerance
16D Lock exit frequency tolerance
7
8
17D Lock time — F L Lt
18D Lock time — PL Lt
Loss of external clock minimum frequency – RANGE
19D
= 0f
1
MaxUnit
MHzPMid range (DRS=01)32—40
MHzPMid range (DRS=01)—39.85—
0.5
2%f
t
fll_acquire+
1075(1/fint_t
)
t
pll_acquire+
f
1075(1/
pll_r
ef)
——kHz
dco
dco
dco
dco
dco
pll
s
s
1
Data in Typical column was characterized at 5.0 V, 25C or is typical recommended value
2
The resulting bus clock frequency should not exceed the maximum specified bus clock frequency of the device.
3
This specification applies to any time the FLL reference source or reference divider is changed, trim value changed or
changing from FLL disabled (BLPE, BLPI) to FLL enabled (FEI, FEE, FBE, FBI). If a crystal/resonator is being used as the
reference, this specification assumes it is already running.
4
This specification applies to any time the PLL VCO divider or reference divider is changed, or changing from PLL disabled
(BLPE, BLPI) to PLL enabled (PBE, PEE). If a crystal/resonator is being used as the reference, this specification assumes
it is already running.
MCF51JM128 ColdFire Microcontroller, Rev. 4
Freescale Semiconductor27
Preliminary Electrical Characteristics
5
Jitter is the average deviation from the programmed frequency measured over the specified interval at maximum f
BUS
Measurements are made with the device powered by filtered supplies and clocked by a stable external clock signal. Noise
injected into the FLL circuitry via VDD and VSS and variation in crystal oscillator frequency increase the C
percentage for
Jitter
a given interval.
6
625 ns represents 5 time quanta for CAN applications, under worst case conditions of 8 MHz CAN bus clock, 1 Mbps CAN
bus speed, and 8 time quanta per bit for bit time settings. 5 time quanta is the minimum time between a synchronization edge
and the sample point of a bit using 8 time quanta per bit.
7
Below D
minimum, the MCG is guaranteed to enter lock. Above D
lock
maximum, the MCG will not enter lock. But if the
lock
MCG is already in lock, then the MCG may stay in lock.
8
Below D
minimum, the MCG will not exit lock if already in lock. Above D
unl
maximum, the MCG is guaranteed to exit lock.
unl
2.11AC Characteristics
This section describes ac timing characteristics for each peripheral system.
2.11.1Control Timing
Table 17. Control Timing
.
NumCParameterSymbolMinTyp
1Bus frequency (t
2
4
5
6
Internal low-power oscillator period
External reset pulse width
(t
= 1/f
cyc
Self_reset
Reset low drive
Active background debug mode latch setup time
Active background debug mode latch hold time
IRQ pulse width
7
Asynchronous path
Synchronous path
8KBIPx pulse width
Asynchronous path
Synchronous path
Port rise and fall time (load = 50 pF)
cyc
= 1/f
)
)f
Bus
2
2
3
2
3
4
Bus
t
LPO
t
extrst
t
rstdrv
t
MSSU
t
MSH
t
ILIH, tIHIL
t
ILIH, tIHIL
66 x t
1.5 x t
1.5 x t
dc—24MHz
7001300s
100—ns
cyc
500—ns
100—ns
100
cyc
100
cyc
Slew rate control disabled (PTxSE = 0) High drive
, t
9
Slew rate control enabled (PTxSE = 1) High drive
Slew rate control disabled (PTxSE = 0) Low drive
t
Rise
Fall
—
—
Slew rate control enabled (PTxSE = 1) Low drive
1
Typical values are based on characterization data at V
2
This is the shortest pulse guaranteed to be recognized as a reset pin request. Shorter pulses are not guaranteed to override
= 5.0V, 25C unless otherwise stated.
DD
1
MaxUnit
—ns
——ns
——ns
11
35
40
75
reset requests from internal sources.
3
This is the minimum pulse width guaranteed to pass through the pin synchronization circuitry. Shorter pulses may or may not
be recognized. In stop mode, the synchronizer is bypassed so shorter pulses can be recognized in that case.
4
Timing is shown with respect to 20% VDD and 80% VDD levels. Temperature range –40C to 105C.
ns
MCF51JM128 ColdFire Microcontroller, Rev. 4
Freescale Semiconductor28
Figure 10. Reset Timing
t
extrst
RESET PIN
t
IHIL
IRQ/KBIPx
t
ILIH
IRQ/KBIPx
t
TPMext
t
clkh
t
clkl
TPMxCLK
Figure 11. IRQ/KBIPx Timing
2.11.2Timer/PWM (TPM) Module Timing
Preliminary Electrical Characteristics
Synchronizer circuits determine the shortest input pulses that can be recognized or the fastest clock that can be used as the
optional external source to the timer counter. These synchronizers operate from the current bus rate clock.
Table 18. TPM Input Timing
NUMCFunctionSymbolMinMaxUnit
1—
2—
3D
4D
5D
External clock frequency
External clock period
External clock high time
External clock low time
Input capture pulse width
f
TPMext
t
TPMext
t
clkh
t
clkl
t
ICPW
dc
4—
1.5—
1.5—
1.5—
f
Bus
/4
MHz
t
cyc
t
cyc
t
cyc
t
cyc
Figure 12. Timer External Clock
MCF51JM128 ColdFire Microcontroller, Rev. 4
Freescale Semiconductor29
Preliminary Electrical Characteristics
t
ICPW
TPMxCHn
t
ICPW
TPMxCHn
2.11.3MSCAN
Table 19. MSCAN Wake-up Pulse Characteristics
Figure 13. Timer Input Capture Pulse
NumCParameterSymbolMinTyp
1D
2D
1
Typical values are based on characterization data at V
Table 20 and Figure 14 through Figure 17 describe the timing requirements for the SPI system.
Table 20. SPI Timing
No.CFunctionSymbolMinMaxUnit
Operating frequency
—D
1D
2D
3D
4D
5D
6D
7D
Master
Slave
SPSCK period
Master
Slave
Enable lead time
Master
Slave
Enable lag time
Master
Slave
Clock (SPSCK) high or low time
Master
Slave
Data setup time (inputs)
Master
Slave
Data hold time (inputs)
Master
Slave
Slave access time
f
op
t
SPSCK
t
Lead
t
Lag
t
WSPSCK
t
SU
t
HI
t
a
f
/2048
Bus
0
2
4
12
1
12
1
t
–30
cyc
t
– 30
cyc
15
15
0
25
—1t
f
Bus
f
Bus
2048
—
—
—
—
—
1024 t
—
—
—
—
—
/2
/4
cyc
Hz
t
cyc
t
cyc
t
SPSCK
t
cyc
t
SPSCK
t
cyc
ns
ns
ns
ns
ns
ns
cyc
8D
Slave MISO disable time
t
dis
—1t
cyc
Data valid (after SPSCK edge)
9D
Master
Slave
t
v
—
—
25
25
ns
ns
Data hold time (outputs)
10D
Master
Slave
t
HO
0
0
—
—
ns
ns
Rise time
11D
Input
Output
t
t
RO
RI
—
—
t
cyc
– 25
25
ns
ns
Fall time
12D
Input
Output
t
FI
t
FO
—
—
t
cyc
– 25
25
ns
ns
MCF51JM128 ColdFire Microcontroller, Rev. 4
Freescale Semiconductor31
Preliminary Electrical Characteristics
SPSCK
(OUTPUT)
SPSCK
(OUTPUT)
MISO
(INPUT)
MOSI
(OUTPUT)
SS
1
(OUTPUT)
MSB IN
2
BIT 6 . . . 1
LSB IN
MSB OUT
2
LSB OUT
BIT 6 . . . 1
(CPOL = 0)
(CPOL = 1)
NOTES:
2. LSBF = 0. For LSBF = 1, bit order is LSB, bit 1, ..., bit 6, MSB.
1. SS
output mode (DDS7 = 1, SSOE = 1).
1
23
4
5
6
910
11
12
4
9
SPSCK
(OUTPUT)
SPSCK
(OUTPUT)
MISO
(INPUT)
MOSI
(OUTPUT)
MSB IN
(2)
BIT 6 . . . 1
LSB IN
MASTER MSB OUT
(2)
MASTER LSB OUT
BIT 6 . . . 1
PORT DATA
(CPOL = 0)
(CPOL = 1)
PORT DATA
SS
(1)
(OUTPUT)
1. SS output mode (DDS7 = 1, SSOE = 1).
2. LSBF = 0. For LSBF = 1, bit order is LSB, bit 1, ..., bit 6, MSB.
NOTES:
2
1
12
11
3
44
11
12
5
6
910
Figure 14. SPI Master Timing (CPHA = 0)
Figure 15. SPI Master Timing (CPHA = 1)
MCF51JM128 ColdFire Microcontroller, Rev. 4
Freescale Semiconductor32
Figure 16. SPI Slave Timing (CPHA = 0)
SPSCK
(INPUT)
SPSCK
(INPUT)
MOSI
(INPUT)
MISO
(OUTPUT)
SS
(INPUT)
MSB IN
BIT 6 . . . 1
LSB IN
MSB OUT
SLAVE LSB OUT
BIT 6 . . . 1
(CPOL = 0)
(CPOL = 1)
NOTE:
SLAVE
SEE
NOTE
1. Not defined but normally MSB of character just received
1
2
3
4
5
6
7
8
9
10
11
12
4
11
12
10
SPSCK
(INPUT)
SPSCK
(INPUT)
MOSI
(INPUT)
MISO
(OUTPUT)
MSB IN
BIT 6 . . . 1
LSB IN
MSB OUT
SLAVE LSB OUT
BIT 6 . . . 1
SEE
(CPOL = 0)
(CPOL = 1)
SS
(INPUT)
NOTE:
SLAVE
NOTE
1. Not defined but normally LSB of character just received
1
2
3
4
5
6
7
8
910
11
12
4
11
12
Preliminary Electrical Characteristics
Freescale Semiconductor33
Figure 17. SPI Slave Timing (CPHA = 1)
MCF51JM128 ColdFire Microcontroller, Rev. 4
Preliminary Electrical Characteristics
2.13Flash Specifications
This section provides details about program/erase times and program-erase endurance for the Flash memory.
Program and erase operations do not require any special power sources other than the normal V
Table 21. Flash Characteristics
DD
supply.
9
4
4000
20,000
—
100,000
1
MaxUnit
t
t
t
t
—
cycles
—
NumCCharacteristicSymbolMinTyp
1
2
4
5
6
7
8
9C
Supply voltage for program/erase
Supply voltage for read operation
Internal FCLK frequency
2
Internal FCLK period (1/FCLK)
Byte program time (random location)
Byte program time (burst mode)
Page erase time
Mass erase time
3
(2)
Program/erase endurance
(2)
4
TL to TH = –40C to + 105C
(2)
T = 25C
10
1
Typical values are based on characterization data at V
2
The frequency of this clock is controlled by a software setting.
3
These values are hardware state machine controlled. User code does not need to count cycles. This information
Data retention
5
V
prog/erase
V
Read
f
FCLK
t
Fcyc
t
prog
t
Burst
t
Page
t
Mass
2.75.5V
2.75.5V
150200kHz
56.67s
10,000
—
t
D_ret
= 5.0 V, 25C unless otherwise stated.
DD
15100—years
supplied for calculating approximate time to program and erase.
4
Typical endurance for Flash was evaluated for this product family on the 9S12Dx64. For additional information on
how Freescale Semiconductor defines typical endurance, please refer to Engineering Bulletin EB619/D, Typical Endurance for Nonvolatile Memory.
5
Typical data retention values are based on intrinsic capability of the technology measured at high temperature and
de-rated to 25C using the Arrhenius equation. For additional information on how Freescale Semiconductor defines
typical data retention, please refer to Engineering Bulletin EB618/D, Typical Data Retention for Nonvolatile Memory .
Fcyc
Fcyc
Fcyc
Fcyc
2.14USB Electricals
The USB electricals for the USBOTG module conform to the standards documented by the Universal Serial Bus Implementers
Forum. For the most up-to-date standards, visit http://www.usb.org.
If the Freescale USBOTG implementation requires additional or deviant electrical characteristics, this space would be used to
communicate that information.
MCF51JM128 ColdFire Microcontroller, Rev. 4
Freescale Semiconductor34
Preliminary Electrical Characteristics
Table 22. Internal USB 3.3V Voltage Regulator Characteristics
SymbolUnitMinTypMax
Regulator operating voltage
Vreg output
Vusb33 input with internal Vreg
disabled
VREG Quiescent Current
V
regin
V
regout
V
usb33in
I
VRQ
V3.9—5.5
V33.33.6
V33.33.6
mA—0.5—
2.15EMC Performance
Electromagnetic compatibility (EMC) performance is highly dependant on the environment in which the MCU resides. Board
design and layout, circuit topology choices, location and characteristics of external components as well as MCU software
operation all play a significant role in EMC performance. The system designer should consult Freescale applications notes such
as AN2321, AN1050, AN1263, AN2764, and AN1259 for advice and guidance specifically targeted at optimizing EMC
performance.
2.15.1Radiated Emissions
Microcontroller radiated RF emissions are measured from 150 kHz to 1 GHz using the TEM/GTEM Cell method in accordance
with the IEC 61967-2 and SAE J1752/3 standards. The measurement is performed with the microcontroller installed on a
custom EMC evaluation board while running specialized EMC test software. The radiated emissions from the microcontroller
are measured in a TEM cell in two package orientations (North and East). For more detailed information concerning the
evaluation results, conditions and setup, please refer to the EMC Evaluation Report for this device.
MCF51JM128 ColdFire Microcontroller, Rev. 4
Freescale Semiconductor35
Mechanical Outline Drawings
3Mechanical Outline Drawings
3.180-pin LQFP
Figure 18. 80-pin LQFP Diagram - I
MCF51JM128 ColdFire Microcontroller, Rev. 4
Freescale Semiconductor36
Mechanical Outline Drawings
Figure 19. 80-pin LQFP Diagram - II
MCF51JM128 ColdFire Microcontroller, Rev. 4
Freescale Semiconductor37
Mechanical Outline Drawings
Figure 20. 80-pin LQFP Diagram - III
MCF51JM128 ColdFire Microcontroller, Rev. 4
Freescale Semiconductor38
3.264-pin LQFP
Mechanical Outline Drawings
Figure 21. 64-pin LQFP Diagram - I
MCF51JM128 ColdFire Microcontroller, Rev. 4
Freescale Semiconductor39
Mechanical Outline Drawings
Figure 22. 64-pin LQFP Diagram - II
MCF51JM128 ColdFire Microcontroller, Rev. 4
Freescale Semiconductor40
Mechanical Outline Drawings
Figure 23. 64-pin LQFP Diagram - III
MCF51JM128 ColdFire Microcontroller, Rev. 4
Freescale Semiconductor41
Mechanical Outline Drawings
3.364-pin QFP
Figure 24. 64-pin QFP Diagram - I
MCF51JM128 ColdFire Microcontroller, Rev. 4
Freescale Semiconductor42
Mechanical Outline Drawings
Figure 25. 64-pin QFP Diagram - II
MCF51JM128 ColdFire Microcontroller, Rev. 4
Freescale Semiconductor43
Mechanical Outline Drawings
Figure 26. 64-pin QFP Diagram - III
MCF51JM128 ColdFire Microcontroller, Rev. 4
Freescale Semiconductor44
3.444-pin LQFP
Mechanical Outline Drawings
Figure 27. 44-pin LQFP Diagram - I
MCF51JM128 ColdFire Microcontroller, Rev. 4
Freescale Semiconductor45
Mechanical Outline Drawings
Figure 28. 44-pin LQFP Diagram - II
MCF51JM128 ColdFire Microcontroller, Rev. 4
Freescale Semiconductor46
Mechanical Outline Drawings
Figure 29. 44-pin LQFP Diagram - III
MCF51JM128 ColdFire Microcontroller, Rev. 4
Freescale Semiconductor47
Revision History
4Revision History
This section lists major changes between versions of the MCF51JM128 Data Sheet document.
Table 23. Changes Between Revisions
RevisionDescription
1Updated features list
Updated the figures Typical Low-side Drive (sink) characteristics – High Drive (PTxDSn = 1), Typi cal
characteristics – High Drive (PTxDSn = 1)
Added the figure Typical High-side Drive (source) characteristics – Low Drive (PTxDSn = 0)
Updated the table Supply Current Characteristics
Updated the table Oscillator Electrical Specifications (Temperature Range = –40 to 105×C Ambient)
Updated the table SPI Electrical Characteristic, DC Characteristics
2Updated the table Orderable Part Number Summary, DC Characteristics, and Supply Current
Characteristics
3Updated the table Orderable Part Number Summary, MCG Characteristics, SPI Characteristics, and
Supply Current Characteristics
Changed V
DDAD
to V
Updated the table Device comparison
4Added “RAM retention voltage” parameter in “DC Characteristics” table, alongwith a table note.
Added “Temp sensor voltage” parameter in “5 Volt 12-bit ADC Characteristics (V
)” table.
V
SSA
Added “ “Temp sensor slope” parameter in 5 Volt 12-bit ADC Characteristics (V
V
) table. Also, corrected unit of “Temp sensor voltage” parameter in 5 Volt 12-bit ADC
SSA
Characteristics (V
DDA
REFH
, V
= V
SSAD
DDA
to V
, V
SSA
REFL
= V
SSA
) table.
REFH
REFH
= V
= V
DDA
DDA
, V
, V
REFL
REFL
=
=
MCF51JM128 ColdFire Microcontroller, Rev. 4
Freescale Semiconductor48
How to Reach Us:
Home Page:
www.freescale.com
Web Support:
http://www.freescale.com/support
USA/Europe or Locations Not Listed:
Freescale Semiconductor, Inc.
Technical Information Center, EL516
2100 East Elliot Road
Tempe, Arizona 85284
1-800-521-6274 or +1-480-768-2130
www.freescale.com/support
Europe, Middle East, and Africa:
Freescale Halbleiter Deutschland GmbH
Technical Information Center
Schatzbogen 7
81829 Muenchen, Germany
+44 1296 380 456 (English)
+46 8 52200080 (English)
+49 89 92103 559 (German)
+33 1 69 35 48 48 (French)
www.freescale.com/support
Japan:
Freescale Semiconductor Japan Ltd. Headquarters
ARCO Tower 15F
1-8-1, Shimo-Meguro, Meguro-ku,
Tokyo 153-0064
Japan
0120 191014 or +81 3 5437 9125
support.japan@freescale.com
Asia/Pacific:
Freescale Semiconductor China Ltd.
Exchange Building 23F
No. 118 Jianguo Road
Chaoyang District
Beijing 100022
China
+86 10 5879 8000
support.asia@freescale.com
Information in this document is provided solely to enable system and
software implementers to use F reescale Se miconductor products . There are
no express or implied copyright licenses granted hereunder to design or
fabricate any integrated circ uits or in te g rated circuits based on the
information in this document.
Freescale Semiconductor reserves the right to mak e changes without further
notice to any products herein. F reescale Semico nductor mak es no warr anty,
representation or guarantee regarding the suitability of its products for any
particular purpose, nor does Freescale Semiconductor assume any liability
arising out of the application or use of any product or circuit, an d specif ically
disclaims any and all liability, including without limitation consequential or
incidental damages. “Typical” parameters that may be provided in Freescale
Semiconductor data sheets and/or spec ifications can and d o vary in diff erent
applications and actual performance may vary over time. All operating
parameters, including “Typicals”, must be validated for each customer
application by customer’s technical experts. Freescale Semiconductor does
not convey any license under its patent rights nor the rights of others.
Freescale Semiconduct or products are not des igned, intended, or a uthorized
for use as components in systems intended for surgical implant into the bo dy ,
or other applications intended to support or sustain life, or for any other
application in which the failure of the Freescale Semiconductor product could
create a situation where personal injury or death may occur. Should Buyer
purchase or use Freescale Semiconductor products for any such unintended
or unauthorized application, Buyer shall indemnify and hold Freescale
Semiconductor and its officers, employees, subsidiaries, affiliates, and
distributors harmless against all claims, costs , damages, and exp enses, and
reasonable attorney fees arising out of, directly or indirectly, any claim of
personal injury or death associated with such unintended or unauthorized
use, even if such claim al leges th at Freescale Semiconductor wa s negli gent
regarding the design or manufacture of the part.
Freescale Semiconductor Literature Distribution Center
1-800-441-2447 or +1-303-675-2140
Fax: +1-303-675-2150
LDCForFreescaleSemiconductor@hibbertgroup.com
Freescale™ and the Freescale logo are trademarks of Freescale
Semiconductor, Inc. The described product contains a PowerPC processor
core. The Pow erPC name is a tradem ark of IBM Corp. and used under li cense.
All other product or service names are the property of their respective o wners .