Freescale 33886 Technical Data

Freescale Semiconductor

Technical Data

5.0 A H-Bridge

The 33886 is a monolithic H-Bridge ideal for fractional horsepower
DC-motor and bi-directional thrust solenoid control. The IC
incorporates internal control logic, charge pump, gate drive, and low
R
continuous inductive DC load currents up to 5.0 A. Output loads can
be pulse width modulated (PWM-ed) at frequencies up to 10 kHz.

overtemperature conditions. Two independent inputs control the two
half-bridge totem-pole outputs. Two disable inputs force the H-Bridge
outputs to tri-state (exhibit high impedance).

-40°C
up to 40 V with derating of the specifications. The IC is available in a
surface mount power package with exposed pad for heatsinking.

Features

• Similar to the MC33186DH1 with Enhanced Features

• 5.0 V to 40 V Continuous Operation

•120 mΩ R

• TTL / CMOS Compatible Inputs

• PWM Frequencies up to 10 kHz

• Active Current Limiting via Internal Constant OFF-Time PWM (with

• Output Short Circuit Protection

• Undervoltage Shutdown

• Fault Status Reporting

• Pb-Free Packaging Designated by Suffix Code VW

MOSFET output circuitry. The 33886 is able to control

DS(ON)

A Fault Status output reports undervoltage, short circuit, and

The 33886 is parametrically specified over a temperature range of

≤ T

≤ 125°C, 5.0 V ≤ V+ ≤ 28 V. The IC can also be operated

A

H-Bridge MOSFETs

DS(ON)

Temperature-Dependent Threshold Reduction)

Document order number: MC33886

ORDERING INFORMATION

Device

MC33886DH/R2

MC33886VW/R2

Rev 7.0, 07/2005

33886

H-BRIDGE

VW SUFFIX (Pb-free)

DH SUFFIX

98ASH70702A

20-TERMINAL HSOP

Temperature

Range (T

- 40°C to 125°C 20 HSOP

)

A

Package

5.0 V

IN

OUT

MCU

OUT

OUT

OUT

Figure 1. 33886 Simplified Application Diagram

© Freescale Semiconductor, Inc., 2005. All rights reserved.

C

FS

IN1

IN2
D1

D2

CP

V+

33886

V+

OUT1

MOTOR

OUT2

PGND

AGND

INTERNAL BLOCK DIAGRAM

INTERNAL BLOCK DIAGRAM

C

C

CP

CP

Charge

Charge

Pump

Pump

V

V+

PWR

IN1
IN2

D1
D2

FS

80 µA

80 uA

(each)

25 uA

25 µA

5.0 V

5.0 V

Regulator

Regulator

Gate Drive

Gate Drive

Over-

Control

Over-

temperature

temperature

Logic

Undervoltage

Undervoltage

Figure 2. 33886 Simplified Internal Block Diagram

Curre n t Li m it,

Current Limit,

Overcurrent

Short Circuit

Sense

Sense Circuit

Ci rcuit

PGNDAGND

OUT 1

OUT 2

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Analog Integrated Circuit Device Data

2 Freescale Semiconductor

TERMINAL CONNECTIONS

TERMINAL CONNECTIONS

DNCAGND

IN2

D1

CCP

V+

OUT2

OUT2

D2

PGND

PGND

FS

IN1

V+

V+

OUT1

OUT1

DNC

PGND

PGND

1

2

3

4

5

6

7

8

9

10

20

19

18

17

16

15

14

13

12

11

Figure 3. 33886 Terminal Connections

Table 1. 33886 Terminal Definitions

A functional description of each terminal can be found in the Functional Terminal Description section beginning on page

Terminal

Number

1 AGND Analog Ground

2 FS Fault Status for H-

Terminal

Name

Formal Name Definition

Low-current analog signal ground.

Open drain active Low Fault Status output requiring a pull-up resistor to 5.0 V.

Bridge

15.

3 IN1 Logic Input Control 1

4, 5, 16 V+ Positive Power Supply

6, 7 OUT1 H-Bridge Output 1

8, 20 DNC Do Not Connect

9 –12 PGND Power Ground

13 D2 Disable 2

14, 15 OUT2 H-Bridge Output 2

17 CCP Charge Pump Capacitor

18 D1 Disable 1

19 IN2 Logic Input Control 2

True logic input control of OUT1 (i.e., IN1 logic High = OUT1 logic High).

Positive supply connections.

Output 1 of H-Bridge.

Either do not connect (leave floating) or connect these terminals to ground in the
application. They are test mode terminals used in manufacturing only.

Device high-current power ground.

Active Low input used to simultaneously tri-state disable both H-Bridge outputs. When
D2

is logic Low, both outputs are tri-stated.

Output 2 of H-Bridge.

External reservoir capacitor connection for internal charge pump capacitor.

Active High input used to simultaneously tri-state disable both H-Bridge outputs. When
D1 is logic High, both outputs are tri-stated.

True logic input control of OUT2 (i.e., IN2 logic High = OUT2 logic High).

33886

Analog Integrated Circuit Device Data
Freescale Semiconductor 3

MAXIMUM RATINGS

MAXIMUM RATINGS

Table 2. Maximum Ratings

All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or

permanent damage to the device.

Rating Symbol Value Unit

Supply Voltage

Input Voltage

Status Output

FS

Continuous Current

(1)

(2)

(3)

ESD Voltage for DH Package

Human Body Model

Machine Model

(4)

(5)

ESD Voltage for VW Package

Human Body Model

Machine Model

(4)

(5)

Storage Temperature

Ambient Operating Temperature

(7)

Operating Junction Temperature

Terminal Soldering Temperature

(8)

DH Suffix

VW (Pb-Free Suffix)

Approximate Junction-to-Board Thermal Resistance (and Package
Dissipation = 6.0 W)

(9)

V+ 40 V

V

V

I

OUT

V

ESD1

V

ESD2

V

ESD1

V

ESD2

T

STG

T

T

T

SOLDER

IN

FS

A

J

-0.1 to 7.0 V

7.0 V

5.0 A

(6)

±2000

±200

±2000

±200

-65 to 150 °C

-40 to 125 °C

-40 to 150 °C

220

260

R

JB

θ

~5.0

V

V

°C

°C/W

Notes

1. Exceeding the input voltage on IN1, IN2, D1, or D2

2. Exceeding the pull-up resistor voltage on the open drain FS

3. Continuous current capability so long as junction temperature is ≤ 150

4. ESD1 testing is performed in accordance with the Human Body Model (C

5. ESD2 testing is performed in accordance with the Machine Model (C

may cause a malfunction or permanent damage to the device.

terminal may cause permanent damage to the device.

°C.

ZAP

= 200 pF, R

ZAP

= 100 pF, R

ZAP

= 1500 Ω).

ZAP

= 0 Ω).

6. All terminals are capable of Human Body Model ESD voltages of ±2000 V with two exceptions pertaining only to the DH suffix package:
to PGND is capable of ±1500 V and (2) OUT1 to AGND is capable of ±1000 V.

(1) D2

7. The limiting factor is junction temperature, taking into account the power dissipation, thermal resistance, and heatsinking.

8. Terminal soldering temperature limit is for 10 seconds maximum duration. Not designed for immersion soldering. Exceeding these limits

may cause malfunction or permanent damage to the device.

9. Exposed heatsink pad plus the power and ground terminals comprise the main heat conduction paths. The actual R

(junction-to-PC

θ

JB

board) values will vary depending on solder thickness and composition and copper trace.

33886

Analog Integrated Circuit Device Data

4 Freescale Semiconductor

STATIC ELECTRICAL CHARACTERISTICS

STATIC ELECTRICAL CHARACTERISTICS

Table 3. Static Electrical Characteristics

Characteristics noted under conditions 5.0 V ≤ V+ ≤ 28 V and -40°C ≤ TA ≤ 125°C unless otherwise noted. Typical values noted
reflect the approximate parameter mean at T

Characteristic Symbol Min Typ Max Unit

Power Supply

Operating Voltage Range

Standby Supply Current

V

= 5.0 V, I

EN

OUT

Threshold Supply Voltage

Switch-OFF

Switch-ON

Hysteresis

CHARGE PUMP

(10)

= 0 A

= 25°C under nominal conditions unless otherwise noted.

A

V+ 5.0 – 40 V

I

Q (standby)

––20

V+

(thres-OFF)

V+

(thres-ON)

V+

(hys)

4.15

4.5

150

4.4

4.75

–

4.65

5.0

–

mA

V

V

mV

Charge Pump Voltage

V+ = 5.0 V

8.0 V ≤ V+ ≤ 40 V

V

- V +

CP

3.35

–

–

–

–

20

CONTROL INPUTS

Input Voltage (IN1, IN2, D1, D2)

Threshold High

Threshold Low

Hysteresis

Input Current (IN1, IN2, D1)

VIN = 0 V

D2

Input Current

(12)

V D2 = 5.0 V

(11)

V

V

V

HYS

I

IN

I

D2

IH

IL

3.5

–

0.7

1.0

–

–

–

1.4

–

-200 -80 –

–25100

Notes

10. Specifications are characterized over the range of 5.0 V ≤ V+ ≤ 28 V. Operation > 28 V will cause some parameters to exceed listed
min/max values. Refer to typical operating curves to extrapolate values for operation > 28 V but ≤ 40 V.

11. Inputs IN1, IN2, and D1 have independent internal pull-up current sources.

12. The D2

input incorporates an active internal pull-down current sink.

V

V

µA

µA

33886

Analog Integrated Circuit Device Data
Freescale Semiconductor 5

STATIC ELECTRICAL CHARACTERISTICS

Table 3. Static Electrical Characteristics

Characteristics noted under conditions 5.0 V
reflect the approximate parameter mean at T

Characteristic Symbol Min Typ Max Unit

POWER OUTPUTS (OUT1, OUT2)

Output-ON Resistance

5.0 V ≤ V+ ≤ 28 V, TJ = 25°C

8.0 V ≤ V+

5.0 V ≤ V+

≤ 28 V, TJ = 150°C

≤ 8.0 V, TJ = 150°C

(13)

≤ V+ ≤ 28 V and -40°C ≤ T

= 25°C under nominal conditions unless otherwise noted.

A

≤ 125°C unless otherwise noted. Typical values noted

A

R

DS(ON)

–

–

–

120

–

–

mΩ

–

225

300

Active Current Limiting Threshold (via Internal Constant OFF-Time

(14)

PWM)

High-Side Short Circuit Detection Threshold

Low-Side Short Circuit Detection Threshold

Leakage Current

V

= V+

OUT

= GND

V

OUT

Output FET Body Diode Forward Voltage Drop

I

= 3.0 A

OUT

(15)

(16)

Switch-OFF

Thermal Shutdown

Hysteresis

FAULT STATUS

Fault Status Leakage Current

(17)

(18)

V FS = 5.0 V

Fault Status Set Voltage

(19)

I FS = 300 µA

I

LIM

I

SCH

I

SCL

I

OUT(leak)

V

F

T

LIM

T

HYS

I

FS(leak)

V

FS(LOW)

5.2 6.5 7.8

11 – –

8.0 – –

–

–

100

30

200

60

––2.0

175

–

15

–

–

–

––10

––1.0

µA

°C

µA

Notes

13. Output-ON resistance as measured from output to V+ and ground.

14. Product with date codes of December 2002, week 51, will exhibit the values indicated in this table. Product with earlier date codes may
exhibit a minimum of 6.0 A and a maximum of 8.5 A.

15. Outputs switched OFF with D1 or D2

.

16. Parameter is guaranteed by design but not production tested.

17. Fault Status output is an open drain output requiring a pull-up resistor to 5.0 V.

18. Fault Status Leakage Current is measured with Fault Status High and not set.

19. Fault Status Set Voltage is measured with Fault Status Low and set with I

= 300 µA.

FS

A

A

A

V

V

33886

Analog Integrated Circuit Device Data

6 Freescale Semiconductor

DYNAMIC ELECTRICAL CHARACTERISTICS

DYNAMIC ELECTRICAL CHARACTERISTICS

Table 4. Dynamic Electrical Characteristics

Characteristics noted under conditions 5.0 V ≤ V+ ≤ 28 V and -40°C ≤ TA ≤ 125°C unless otherwise noted. Typical values noted
reflect the approximate parameter mean at T

Characteristic Symbol Min Typ Max Unit

TIMING CHARACTERISTICS

OUT

(20)

(22)

(22)

= 3.0 A

(23)

PWM Frequency

Maximum Switching Frequency During Active Current Limiting

Output ON Delay

V+ = 14 V

Output OFF Delay

V+ = 14 V

Output Rise and Fall Time

V+ = 14 V, I

= 25°C under nominal conditions unless otherwise noted.

A

(21)

f

f

t

d

PWM

MAX

(ON)

––10kHz

––20kHz

––18

t

d (OFF)

––18

, t

t

f

r

2.0 5.0 8.0

µs

µs

µs

Output Latch-OFF Time

Output Blanking Time

Output FET Body Diode Reverse Recovery Time

Disable Delay Time

Short Circuit / Overtemperature Turn-

(25)

OFF Time

(26)

Power-OFF Delay Time

(24)

t

a

t

b

t

r r

t

d (disable)

t

FAULT

t

pod

15 20.5 26

12 16.5 21

100 – –

––8.0µs

–4.0–µs

–1.05.0ms

Notes

20. The outputs can be PWM controlled from an external source. This is typically done by holding one input high while applying a PWM
pulse train to the other input. The maximum PWM frequency obtainable is a compromise between switching losses and switching
frequency. Refer to Typical Switching Waveforms, Figures 10

through 17, pp. 10–11.

21. The Maximum Switching Frequency during active current limiting is internally implemented. The internal control produces a constant
OFF-time PWM of the output. The output load current effects the Maximum Switching Frequency.

22. Output Delay is the time duration from the midpoint of the IN1 or IN2 input signal to the 10% or 90% point (dependent on the transition
direction) of the OUT1 or OUT2 signal. If the output is transitioning High-to-Low, the delay is from the midpoint of the input signal to the
90% point of the output response signal. If the output is transitioning Low-to-High, the delay is from the midpoint of the input signal to
the 10% point of the output response signal. See Figure 4

23. Rise Time is from the 10% to the 90% level and Fall Time is from the 90% to the 10% level of the output signal. See Figure 6

, page 8.

, page 8.

24. Parameter is guaranteed by design but not production tested.

25. Disable Delay Time is the time duration from the midpoint of the D (disable) input signal to 10% of the output tri-state response. See

Figure 5

, page 8.

26. Increasing currents will become limited at I

state latch-OFF. See Figures 8
above 160

°C will cause the active current limiting to progressively “fold-back” (or decrease) to 2.5 A typical at 175°C where thermal

latch-OFF will occur. See Figure 7

and 9, page 9. Active current limiting will cause junction temperatures to rise. A junction temperature

, page 8.

. Hard shorts will breach the I

LIM

SCH

or I

limit, forcing the output into an immediate tri-

SCL

µs

µs

ns

33886

Analog Integrated Circuit Device Data
Freescale Semiconductor 7

TIMING DIAGRAMS

TIMING DIAGRAMS

5.0

)
V

(

2
N

I

,

1
N

I

V

0

V

)

PWR

V
(

2

,

1
T
U
O

V

0

5.0 V

50%

t

d(ON)

50%

90%

TIME

Figure 4. Output Delay Time

t

d(OFF)

10%

0 V

∞Ω

0 Ω

Figure 5. Disable Delay Time

V

)

PWR

V

(

2

,

1
T
U
O

V

0

90%

t

f

10%

10%

t

r

90%

Figure 6. Output Switching Time

)
A

(
T

6.5

6.6

N
E
R
R
U
C

T

2.5

U

CURRENT (A)

P

,

T
U

O

I

,

,

X
A

M

I

I

LIM

LIM

160 175

TJ, JUNCTION TEMPERATURE (oC)

Thermal Shutdown

Figure 7. Active Current Limiting Versus Temperature (Typical)

33886

Analog Integrated Circuit Device Data

8 Freescale Semiconductor

)

TIM

E

A
(

T
N
E
R
R
U
C

T
U
P
T

, CURRENT (A)

U
O

,

,

OUT

D

I

A
O

OUT

L

I

8.0

6.5

Diode Reverse

Re c o ve r y Sp i ke s

Load Capacitance and/or

Diode Reverse Recovery Spikes

I

Short Circuit Detect Threshold

SCL

Typ. Short Ckt. Detect Threshold

for Low-Side FETs

Typical Current Limiting Threshold

Typ. Curr ent Limit Threshold

PWM

Active

Current

Current

Limiting

Limiting

(See Figure 7)

(See Figure 6)

(See Figure 7)

Hard Short Detect an d Lat ch-OFF

Hard Short Detect and Latch-Off

0

N

I
C

I
G
O

L
,

n

N

I

N

I
C

I
G
O

L
,
1
D

N

I
C

I
G
O

L
,
2

D

T
U
O

C

I
G
O

L
,
S

SF I

F

[1]

[0]

[1]

[0]

[1]

[0]

[1]

[0]

IN2 or IN1

IN1 OR IN 2

IN1 or IN2

IN2

Ou tp u ts

Outputs

Tristated

Tri-stated

IN1 IN2

IN1

IN2

Outputs

Outputs

Tristated

Tri-stated

IN1 or IN2

IN2IN1

OR

IN2 or IN1

IN2 IN1OR

Outputs Operat ional

Outputs Operational

(per Input Contr ol Condition)

(per Input Control Condition)

Figure 8. Active Current Limiting Versus Time

OR IN1

)
A

(
T
N

E
R
R
U
C

T
U
P
T

, CURRENT (A)

U
O

,

OUT

D

I

A
O
L

I

8.0

6.5

t

a

I

Short Circuit Detect Threshold

Short Circuit Detect Threshold

Overcurrent Minimum Threshold

SCL

ta = Output Latch-OFF Time

ta= Tristate Output OFF Time

t

b

= Output Blanking Time

t

t

= Current Limit Blank Time

b

b

Typical Current

Typical PWM Load

Limiting Waveform

Current Limiting
Waveform

Hard Output

Hard Short Detect
Short Latch-OFF

Latch-Off Prevented During t

b

TIME

Figure 9. Active Current Limiting Detail

33886

Analog Integrated Circuit Device Data
Freescale Semiconductor 9

TYPICAL SWITCHING WAVEFORMS

TYPICAL SWITCHING WAVEFORMS

Important For all plots, the following applies:

• Ch2 = 2.0 A per division

•L

•L

•R

= 533 µH @ 1.0 kHz

LOAD

= 530 µH @ 10.0 kHz

LOAD

= 4.0 Ω

LOAD

Output Voltage

(OUT1)

I

OUT

Input Voltage

(IN1)

V+= 24 V f

=1.0 kHz Duty Cycle= 10%

PWM

Output Voltage

(OUT1)

I

OUT

Input Voltage

(IN1)

V+= 34 V f

=1.0 kHz Duty Cycle=90%

PWM

Figure 12. Output Voltage and Current vs. Input Voltage

at V+ = 34 V, PMW Frequency of 1.0 kHz,

and Duty Cycle of 90%, Showing Device in

Current Limiting Mode

Figure 10. Output Voltage and Current vs. Input Voltage

at V+ = 24 V, PMW Frequency of 1.0 kHz,

and Duty Cycle of 10%

Output Voltage

(OUT1)

I

OUT

Input Voltage

(IN1)

V+=24 V f

=1.0 kHz Duty Cycle= 50%

PWM

Output Voltage

(OUT1)

I

OUT

Input Voltage

(IN1)

V+=22 V f

=1.0 kHz Duty Cycle= 90%

PWM

Figure 13. Output Voltage and Current vs. Input Voltage

at V+

= 22 V, PMW Frequency of 1.0 kHz,

and Duty Cycle of 90%

Figure 11. Output Voltage and Current vs. Input Voltage

at V+

= 24 V, PMW Frequency of 1.0 kHz,

and Duty Cycle of 50%

33886

Analog Integrated Circuit Device Data

10 Freescale Semiconductor

TYPICAL SWITCHING WAVEFORMS

%

%

%

%

Output Voltage

(OUT1)

I

OUT

Input Voltage

(IN1)

V+=24 V f

=10 kHz Duty Cycle=50

PWM

Figure 14. Output Voltage and Current vs. Input Voltage

at V+

= 24 V, PMW Frequency of 10 kHz,

and Duty Cycle of 50%

Output Voltage

(OUT1)

I

OUT

Input Voltage

(IN1)

V+=12 V f

=20 kHz Duty Cycle= 50

PWM

Figure 16. Output Voltage and Current vs. Input Voltage

at V+

= 12 V, PMW Frequency of 20 kHz,

and Duty Cycle of 50% for a Purely Resistive Load

Output Voltage

(OUT1)

I

OUT

Input Voltage

(IN1)

V+=24 V f

=10 kHz Duty Cycle= 90

PWM

Figure 15. Output Voltage and Current vs. Input Voltage

at V+

= 24 V, PMW Frequency of 10 kHz,

and Duty Cycle of 90%

Output Voltage

(OUT1)

I

OUT

Input Voltage

(IN1)

V+= 12 V f

=20 kHz Duty Cycle=90

PWM

Figure 17. Output Voltage and Current vs. Input Voltage

at V+

= 12 V, PMW Frequency of 20 kHz,

and Duty Cycle of 90% for a Purely Resistive Load

33886

Analog Integrated Circuit Device Data
Freescale Semiconductor 11

TYPICAL SWITCHING WAVEFORMS

Table 5. Truth Table

The tri-state conditions and the fault status are reset using D1 or

D2. The truth table uses the following notations: L = Low,

H = High, X = High or Low, and Z = High impedance (all output power transistors are switched off).

Device State

D1 D2 IN1 IN2 FS OUT1 OUT2

Forward

Reverse

Freewheeling Low

Freewheeling High

Disable 1 (D1)

Disable 2 (D2

IN1 Disconnected

IN2 Disconnected

D1 Disconnected

D2 Disconnected

Undervoltage

Overtemperature

Short Circuit

Notes

27. In the case of an undervoltage condition, the outputs tri-state and the fault status is set logic Low. Upon undervoltage recovery, fault

28. When a short circuit or overtemperature condition is detected, the power outputs are tri-state latched-OFF independent of the input

)

(27)

(28)

(28)

status is reset automatically or automatically cleared and the outputs are restored to their original operating condition.

signals and the fault status flag is set logic Low.

LHHL H H L

LHLH H L H

LHLL H L L

LHHH H H H

HXXX L Z Z

XLXX L Z Z

LHZX H H X

LHXZ H X H

ZXXX L Z Z

XZXX L Z Z

XXXX L Z Z

XXXX L Z Z

XXXX L Z Z

Input Conditions

Fault Status

Flag

Output States

33886

Analog Integrated Circuit Device Data

12 Freescale Semiconductor

0.40

0.35

0.30

0.25

0.20

Ohms

0.15

0.10

ELECTRICAL PERFORMANCE CURVES

ELECTRICAL PERFORMANCE CURVES

0.05

0.0
59117131519 3733 35 3927 412917 21 23 25 31

Volts

Figure 18. Typical High-Side R

DS(ON)

Versus V+

0.13

0.128

0.126

Ohms

0.124

OHMS

0.122

0.12
59117131519 3733 35 3927 412917 21 23 25 31

Volts

V

PWR

Figure 19. Typical Low-Side R

Analog Integrated Circuit Device Data
Freescale Semiconductor 13

DS(ON)

Versus V+

33886

ELECTRICAL PERFORMANCE CURVES

9.0

8.0

7.0

6.0

5.0

OHMS

4.0

milli amperes

3.0

2.0

1.0

0.0
59117131519 3733 35 3927 412917 21 23 25 31

Volts

V

PWR

Figure 20. Typical Quiescent Supply Current Versus V+

33886

Analog Integrated Circuit Device Data

14 Freescale Semiconductor

FUNCTIONAL DESCRIPTION

INTRODUCTION

FUNCTIONAL DESCRIPTION

INTRODUCTION

Numerous protection and operational features (speed,
torque, direction, dynamic braking, and PWM control), in
addition to the 5.0 A current capability, make the 33886 a
very attractive, cost-effective solution for controlling a broad
range of fractional horsepower DC motors. A pair of 33886
devices can be used to control bipolar stepper motors in both
directions. In addition, the 33886 can be used to control
permanent magnet solenoids in a push-pull variable force
fashion using PWM control. The 33886 can also be used to
excite transformer primary windings with a switched square
wave to produce secondary winding AC currents.

As shown in Figure 2

, the 33886 is a fully protected monolithic H-Bridge

page 2
with Fault Status reporting. For a DC motor to run the input
conditions need be as follows: D1 input logic Low, D2 input
logic High, FS
and the other IN logic High to define output polarity. The
33886 can execute dynamic braking by simultaneously
turning on either both high-side
MOSFETs in the output H-Bridge; e.g., IN1 and IN2 logic
High or IN1 and IN2 logic Low.

The 33886 outputs are capable of providing a continuous
DC load current of 5.0 A from a 40 V V+ source. An internal
charge pump supports PWM frequencies up to 10 kHz. An

flag cleared (logic High), with one IN logic Low

, Simplified Internal Block Diagram,

MOSFETs or both low-side

external pull-up resistor is required for the open drain FS
terminal for fault status reporting.

Two independent inputs (IN1 and IN2) provide control of
the two totem-pole half-bridge outputs. Two disable inputs
(D1 and D2
impedance state (all H-Bridge switches OFF).

The 33886 has undervoltage shutdown with automatic
recovery, active current limiting, output short-circuit latch­OFF, and overtemperature latch-OFF. An undervoltage
shutdown, output short circuit latch-OFF, or overtemperature
latch-OFF fault condition will cause the outputs to turn OFF
(i.e., become high impedance or tri-stated) and the fault
output flag to be set Low. Either of the Disable inputs or V+
must be “toggled” to clear the fault flag.

The short circuit / overtemperature shutdown scheme is
unique and best described as using a junction temperature­dependent active current “fold back” protection scheme.
When a short circuit condition is experienced, the current
limited output is “ramped down” as the junction temperature
increases above 160°C, until at 175°C the current has
decreased to about 2.5 A. Above 175°C, overtemperature
shutdown (latch-OFF) occurs. This feature allows the device
to remain in operation for a longer time with unexpected
loads, while still retaining adequate protection for both the
device and the load.

) are for forcing the H-Bridge outputs to a high

FUNCTIONAL TERMINAL DESCRIPTION

POWER/ANALOG GROUNDS (PGND AND AGND)

Power and analog ground terminals. The power and
analog ground terminals should be connected together with a
very low impedance connection.

POSITIVE POWER SUPPLY (V+)

V+ terminals are the power supply inputs to the device. All
V+ terminals must be connected together on the printed
circuit board with as short as possible traces offering as low
impedance as possible between terminals.

V+ terminals have an undervoltage threshold. If the supply
voltage drops below a V+ undervoltage threshold, the output
power stage switches to a tri-state condition and the fault
status flag is set and the Fault Status terminal voltage
switched to a logic Low. When the supply voltage returns to a
level that is above the threshold, the power stage
automatically resumes normal operation according to the
established condition of the input terminals and the fault
status flag is automatically reset logic High.

FAULT STATUS (FS)

This terminal is the device fault status output. This output
is an active Low open drain structure requiring a pull-up
resistor to 5.0 V. Refer to Table 5,

Truth Table, page 12.

LOGIC INPUT 1, 2 AND DISABLE1, 2 (IN1, IN2, D1,
AND

D2)

These terminals are input control terminals used to control
the outputs. These terminals are 5.0 V CMOS-compatible
inputs with hysteresis. The IN1 and IN2 independently control
OUT1 and OUT2, respectively. D1 and D2
inputs used to tri-state disable the H-Bridge outputs.

When either D1 or D2
Low) in the disable state, outputs OUT1 and OUT2 are both
tri-state disabled; however, the rest of the device circuitry is
fully operational and the supply I
to a few milliamperes. Refer to Table 5,

Static Electrical Characteristics

is set (D1 = logic High or D2 = logic

Q (standby)

table, page 5.

are complimentary

current is reduced

Truth Table, and

33886

Analog Integrated Circuit Device Data
Freescale Semiconductor 15

FUNCTIONAL DESCRIPTION

FUNCTIONAL TERMINAL DESCRIPTION

H-BRIDGE OUTPUT 1, 2 (OUT1 AND OUT2)

These terminals are the outputs of the H-Bridge with
integrated output FET body diodes. The bridge output is
controlled using the IN1, IN2, D1, and D2
have active current limiting above 6.5 A. The outputs also
have thermal shutdown (tri-state latch-OFF) with hysteresis
as well as short circuit latch-OFF protection.

A disable timer (time t

) incorporated to detect currents

b

that are higher than active current limit is activated at each

inputs. The outputs

output activation to facilitate detecting hard output short
conditions (see Figure 9, page 9).

CHARGE PUMP CAPACITOR (CCP)

Charge pump output terminal. A filter capacitor (up to
33 nF) can be connected from the CCP terminal and PGND.
The device can operate without the external capacitor,

C

although the
the device to perform at maximum speed, timing, and PWM
frequency.

capacitor helps to reduce noise and allows

CP

33886

Analog Integrated Circuit Device Data

16 Freescale Semiconductor

FUNCTIONAL DEVICE OPERATION

FUNCTIONAL DEVICE OPERATION

FUNCTIONAL TERMINAL DESCRIPTION

SHORT CIRCUIT PROTECTION

If an output short circuit condition is detected, the power
outputs tri-state (latch-OFF) independent of the input (IN1
and IN2) states, and the fault status output flag is set logic
Low. If the D1 input changes from logic High to logic Low, or

D2 input changes from logic Low to logic High, the

if the
output bridge will become operational again and the fault
status flag will be reset (cleared) to a logic High state.

The output stage will always switch into the mode defined
by the input terminals (IN1, IN2, D1, and D2

), provided the
device junction temperature is within the specified operating
temperature.

ACTIVE CURRENT LIMITING

The maximum current flow under normal operating
conditions is internally limited to I
the maximum current value is reached, the output stages are
tri-stated for a fixed time (t

) of 20 µs typical. Depending on

a

the time constant associated with the load characteristics, the
current decreases during the tri-state duration until the next
output ON cycle occurs (see Figures 9
page 10, respectively).

The current limiting threshold value is dependent upon the
device junction temperature. When -40°C < TJ < 160°C, I
is between 5.2 A and 7.8 A. When T
current decreases linearly down to 2.5 A typical at 175°C.
Above 175°C the device overtemperature circuit detects T
and overtemperature shutdown occurs (see Figure 7
page 8). This feature allows the device to remain operational
for a longer time but at a regressing output performance level
at junction temperatures above 160°C.

(5.2 A to 7.8 A). When

LIM

and 12, page 9 and

exceeds 160°C, the I

J

LIM

LIM

LIM

,

OVERTEMPERATURE SHUTDOWN AND
HYSTERESIS

If an overtemperature condition occurs, the power outputs
are tri-state (latched-OFF) independent of the input signals
and the fault status flag is set logic Low.

To reset from this condition, D1 must change from logic
High to logic Low, or D2

must change from logic Low to logic
High. When reset, the output stage switches ON again,
provided that the junction temperature is now below the
overtemperature threshold limit minus the hysteresis.

Note Resetting from the fault condition will clear the fault

status flag.

MAIN DIFFERENCES COMPARED TO
MC33186DH1

• COD terminal has been removed. Terminal 8 is now a Do

Not Connect (DNC) terminal.

• Terminal 20 is no longer connected in the 20 HSOP

package. It is now a DNC terminal.

•R

transistor.

• Maximum temperature operation is now 160°C, as

minimum thermal shutdown temperature has increased.

• Current regulation limiting foldback is implemented above

160°C T

• Thermal resistance junction to case has been increased

from ~2.0°C/W to ~5.0°C/W.

max at TJ = 150°C is now 225 mΩ per each output

DS(ON)

.

J

33886

Analog Integrated Circuit Device Data
Freescale Semiconductor 17

FUNCTIONAL DEVICE OPERATION

PERFORMANCE

PERFORMANCE

The 33886 is designed for enhanced thermal
performance. The significant feature of this device is the
exposed copper pad on which the power die is soldered. This
pad is soldered on a PCB to provide heat flow to ambient and
also to provide thermal capacitance. The more copper area
on the PCB, the better the power dissipation and transient
behavior will be.

Example Characterization on a double-sided PCB:
bottom side area of copper is 7.8 cm
(see Figure 21

); grid array of 24 vias 0.3 mm in diameter.

Top Side

2

; top surface is 2.7 cm2

Bottom Side

Figure 21. PCB Test Layout

Figure 22 shows the thermal response with the device

soldered on to the test PCB described in Figure 21.

100

10

Rth (°C/W)

1

0,1

0,001 0,01 0,1 1 10 100 1000 10000

t, Time (s)

Figure 22. 33886 Thermal Response

33886

Analog Integrated Circuit Device Data

18 Freescale Semiconductor

TYPICAL APPLICATIONS

TYPICAL APPLICATIONS

A typical application schematic is shown in Figure 23. For
precision high-current applications in harsh, noisy

AGND

OUT1

PGND

environments, the V+ by-pass capacitor may need to be
substantially larger.

DC

MOTOR

V+

33886

V+

C

CP

33 nF

+

47 µF

OUT2

D2

D1

FS

IN1

IN2

IN2
IN1

FS
D1
D2

Figure 23. 33886 Typical Application Schematic

33886

Analog Integrated Circuit Device Data
Freescale Semiconductor 19

PACKAGING

PACKAGE DIMENSIONS

PACKAGING

PACKAGE DIMENSIONS

Important For the most current revision of the package, visit www.freescale.com and perform a keyword search on 98ASH70702A listed

below.

DH SUFFIX

VW (Pb-FREE) SUFFIX

20-TERMINAL HSOP

PLASTIC PACKAGE

98ASH70702A

ISSUE A

PIN ONE ID

GAUGE
PLANE

D2

A

bbb C

B

A2

18X

X 45

h

_

E2

1

e

20

D

e/2

10

11

EXPOSED
HEATSINK AREA

E1

Y

10X

E

M

bbb C

A

B

DATUM

H

PLANE

E3

D1

E4

BOTTOM VIEW

b1

c1

b

M

A

C

SEATING
PLANE

c

aaa C

SECTION W–W

L1

q

W

W

L

A1

A3

NOTES:

1. CONTROLLING DIMENSION: MILLIMETER.

2. DIMENSIONS AND TOLERANCES PER ASME
Y14.5M, 1994.

3. DATUM PLANE –H– IS LOCATED AT BOTTOM OF
LEAD AND IS COINCIDENT WITH THE LEAD
WHERE THE LEAD EXITS THE PLASTIC BODY AT
THE BOTTOM OF THE PARTING LINE.

4. DIMENSIONS D AND E1 DO NOT INCLUDE MOLD
PROTRUSION. ALLOWABLE PROTRUSION IS

0.150 PER SIDE. DIMENSIONS D AND E1 DO
INCLUDE MOLD MISMATCH AND ARE
DETERMINED AT DATUM PLANE –H–.

5. DIMENSION b DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE DAMBAR
PROTRUSION SHALL BE 0.127 TOTAL IN EXCESS
OF THE b DIMENSION AT MAXIMUM MATERIAL
CONDITION.

6. DATUMS –A– AND –B– TO BE DETERMINED AT
DATUM PLANE –H–.

7. DIMENSION D DOES NOT INCLUDE TIEBAR
PROTRUSIONS. ALLOWABLE TIEBAR
PROTRUSIONS ARE 0.150 PER SIDE.

MILLIMETERS

DIM MIN MAX

A 3.000 3.400
A1 0.100 0.300
A2 2.900 3.100
A3 0.00 0.100

D 15.800 16.000
D1 11.700 12.600
D2 0.900 1.100

E 13.950 14.450
E1 10.900 11.100
E2 2.500 2.700
E3 6.400 7.200
E4 2.700 2.900

L 0.840 1.100
L1 0.350 BSC

b 0.400 0.520
b1 0.400 0.482

c 0.230 0.320
c1 0.230 0.280

e 1.270 BSC

h ––– 1.100

q

0 8

__

aaa 0.200

bbb 0.100

(1.600)

DETAIL Y

33886

Analog Integrated Circuit Device Data

20 Freescale Semiconductor

ADDITIONAL DOCUMENTATION

ADDITIONAL DOCUMENTATION

THERMAL ADDENDUM - REVISION 2.0

THERMAL ADDENDUM - REVISION 2.0

5.0 A H-Bridge

Introduction

This thermal addendum is provided as a supplement to the MC33186
technical data sheet. The addendum provides thermal performance
information that may be critical in the design and development of system
applications. All electrical, application, and packaging information is provided
in the data sheet.

Packaging and Thermal Considerations

The MC33186 is offered in a 20 terminal HSOP exposed pad, single die
package. There is a single heat source (P), a single junction temperature
(T

), and thermal resistance (R

J

T

J

The stated values are solely for a thermal performance comparison of one
package to another in a standardized environment. This methodology is not
meant to and will not predict the performance of a package in an application­specific environment. Stated values were obtained by measurement and
simulation according to the standards listed below.

).

θJA

θJA

.

P

=

R

33886

20-TERMINAL

HSOP-EP

VW SUFFIX (Pb-free)

DH SUFFIX

98ASH70702A

20-TERMINAL HSOP

Note For package dimensions, refer to

the 33886 device data sheet.

Standards

Table 6. Thermal Performance Comparison

Thermal Resistance [°C/W]

(1)(2)

R

θJA

(2)(3)

R

θJB

(1)(4)

R

θJA

(5)

R

θJC

NOTES:

1.Per JEDEC JESD51-2 at natural convection, still air condition.

2.2s2p thermal test board per JEDEC JESD51-5 and JESD51-7.

3.Per JEDEC JESD51-8, with the board temperature on the center

trace near the center lead.

4.Single layer thermal test board per JEDEC JESD51-3 and

JESD51-5.

5.Thermal resistance between the die junction and the exposed
pad surface; cold plate attached to the package bottom side,
remaining surfaces insulated.

20

6.0

52

1.0

1.0

1.0

0.2

0.2

* All measurements
are in millimeters

Soldermast
openings

20 Terminal HSOP-EP

1.27 mm Pitch

16.0 mm x 11.0 mm Body

12.2 mm x 6.9 mm Exposed Pad

Thermal vias
connected to top
buried plane

Figure 24. Thermal Land Pattern for Direct Thermal

Attachment According to JESD51-5

33886

Analog Integrated Circuit Device Data
Freescale Semiconductor 21

ADDITIONAL DOCUMENTATION

THERMAL ADDENDUM - REVISION 2.0

A

DNCAGND
IN2
D1
C

CP

V+
OUT2
OUT2
D2
PGND

11

PGND

FS

IN1

V+

V+
OUT1
OUT1

DNC
PGND
PGND

1

2

3
4

5

6
7

8

9
10

20

19

18
17

16

15
14

13

12

33886 Terminal Connections

20-Terminal HSOP

1.27 mm Pitch

16.0 mm x 11.0 mm Body

12.2 mm x 6.9 mm Exposed Pad

Figure 25. Thermal Test Board

Device on Thermal Test Board

Material: Single layer printed circuit board

FR4, 1.6 mm thickness

Cu traces, 0.07 mm thickness

Outline: 80 mm x 100 mm board area,

including edge connector for thermal
testing

Area A: Cu heat-spreading areas on board

surface

Ambient Conditions: Natural convection, still air

Table 7. Thermal Resistance Performance

Thermal

Resistance

R

JA

θ

R

JS

θ

Area A (mm

2

) °C/W

0.0 52

300 36

600 32

0.0 10

300 7.0

600 6.0

R

is the thermal resistance between die junction and

JA

θ

ambient air.

R

is the thermal resistance between die junction and the

JS

θ

reference location on the board surface near a center lead of the
package (see

33886

Figure 25).

Analog Integrated Circuit Device Data

22 Freescale Semiconductor

60

]

50

40

ADDITIONAL DOCUMENTATION

THERMAL ADDENDUM - REVISION 2.0

100

10

1

Thermal Resistance [ºC/W

30

R

x

θ

JA

20

10

0

0 300 600

Heat spreading area A [mm²]

Figure 26. Device on Thermal Test Board R

R

x

θ

JA

θJA

Thermal Resistance [ºC/W]

0.1

1.00E-03 1.00E-02 1.00E-01 1.00E+00 1.00E+01 1.00E+02 1.00E+03 1.00E+04

Time(s)

Figure 27. Transient Thermal Resistance R

JA

θ

time[s]

Device on Thermal Test Board Area A = 600 (mm2)

33886

Analog Integrated Circuit Device Data
Freescale Semiconductor 23

REVISION HISTORY

REVISION HISTORY

Revision Date Description of Changes

7.0

7/2005

• Implemented Revision History page

• Added Thermal Addendum

• Converted to Freescale format

33886

Analog Integrated Circuit Device Data

24 Freescale Semiconductor

NOTES

NOTES

33886

Analog Integrated Circuit Device Data
Freescale Semiconductor 25

NOTES

NOTES

33886

Analog Integrated Circuit Device Data

26 Freescale Semiconductor

NOTES

NOTES

33886

Analog Integrated Circuit Device Data
Freescale Semiconductor 27

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MC33886
Rev 7.0
07/2005