Foss Infratec 1241 Service Manual

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Infratec™ 1241 Grain Analyzer

Service Manual

1001 5015 / Rev. 4

Infratec™ 1241 Grain Analyzer

Information may be changed or updated without notice. The latest version is found at www.foss.dk.

Rev. Date of Issue Revised Material

1 2011-03-18 First issue

2 2012-11-09 Service procedure updated

3 2015-05-18 General update

4 2016-09-26 Minor changes in section 1, 4 and 5

Service Manual 1001 5015 / Rev. 4

Infratec™ 1241 Grain Analyzer

Table of Contents

1 Important Instructions .............................. 1:1

1.1 General ........................................................................ 1:1

1.2 Service Documents ................................................... 1:1

1.3 Self-Service Support ................................................. 1:1

1.4 Contacting Customer Support ............................... 1:1

1.5 ESD Information ........................................................ 1:1

1.6 Precautions ................................................................. 1:2

2 Technical Description................................. 2:1

2.1 History ......................................................................... 2:1

2.2 Component Descriptions ......................................... 2:3

2.2.1 PC-Module ..................................................................... 2:4

2.2.2 Processor Board ............................................................ 2:5

2.2.3 DSP Board ...................................................................... 2:6

2.2.4 CompactFlash Disk ........................................................ 2:8

2.2.5 Monochromator ........................................................... 2:8

2.2.6 Lamp Module .............................................................. 2:10

2.2.7 Detector ...................................................................... 2:11

2.2.8 Power Supply .............................................................. 2:12

2.2.9 LCD Display ................................................................. 2:14

2.2.10 Display Interconnection Board .................................. 2:15

2.2.11 Electronic ID ................................................................ 2:15

2.2.12 TWM (Optional) .......................................................... 2:16

2.2.13 STM (Optional) ............................................................ 2:18

2.2.14 Remote I/O (Optional) ................................................ 2:19

2.3 Software Description ............................................. 2:22

3 Installation ................................................. 3:1

3.1 General ........................................................................ 3:1

3.2 Installation of Test Weight Module on

Infratec 1241 Generation 2 ..................................... 3:1

3.2.1 Preparation of the Infratec for assembly .................... 3:1

3.2.2 Preparation of the Test Weight Module for assembly 3:4

3.2.3 Final assembly of Infratec and Test Weight Module into a

complete assembly ....................................................... 3:6

3.3 Installation of Test Weight Module on

Infratec 1241 Generation 3 ................................... 3:10

3.4 Installation of Sample Transport Module ......... 3:21

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Infratec™ 1241 Grain Analyzer

3.5 Mosaic Connection .................................................. 3:22

4 Diagnostics and Troubleshooting .............4:1

4.1 General ......................................................................... 4:1

4.1.1 Poor Results ................................................................... 4:2

4.1.2 User Problems ................................................................ 4:2

4.1.3 Poor Calibrations ........................................................... 4:2

4.1.4 Outliers .......................................................................... 4:2

4.1.5 Poor Reference Data ..................................................... 4:3

4.1.6 Instrument Problems ..................................................... 4:4

4.1.7 I2C Trouble Shooting .................................................... 4:4

4.2 Service Menu ............................................................ 4:10

4.3 Quality Control ......................................................... 4:12

4.3.1 Self-test ........................................................................ 4:12

4.3.2 Clean Measuring Unit ................................................. 4:19

4.3.3 Audit Log ..................................................................... 4:19

4.3.4 Software Error Log ...................................................... 4:19

4.3.5 Hardware Error Log .................................................... 4:20

4.3.6 Export Logs and Configuration .................................. 4:20

4.3.7 Wavelength Stability .................................................. 4:20

4.3.8 Lamp Check ................................................................. 4:20

4.4 Automatic Tests ....................................................... 4:21

4.4.1 Detector ....................................................................... 4:21

4.4.2 Monochromator .......................................................... 4:22

4.4.3 I/0 (Input/Output) ........................................................ 4:23

4.5 Manual Tests ............................................................. 4:25

4.5.1 Detector ....................................................................... 4:25

4.5.2 Monochromator .......................................................... 4:25

4.5.3 Measuring Unit ........................................................... 4:26

4.5.4 Display ......................................................................... 4:26

4.5.5 Scan .............................................................................. 4:26

4.5.6 Test Weight ................................................................. 4:27

4.5.7 Sample Transport Module .......................................... 4:27

4.6 Manual Analysis ....................................................... 4:28

4.6.1 Settings ........................................................................ 4:28

4.6.2 Fill Sample Cell ............................................................ 4:28

4.6.3 Scan .............................................................................. 4:28

4.6.4 Offset ........................................................................... 4:28

4.6.5 Empty Sample Cell ...................................................... 4:28

4.6.6 Flush Sample Cell ........................................................ 4:28

4.7 Instrument Info ........................................................ 4:29

4.7.1 Hardware ..................................................................... 4:29

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4.7.2 Software ...................................................................... 4:29

4.7.3 BIOS ............................................................................. 4:29

4.7.4 Monochromator Constants ........................................ 4:29

4.7.5 Operating Temperature ............................................. 4:29

4.7.6 Volume Information ................................................... 4:29

4.7.7 Voltage Information ................................................... 4:29

4.8 Clone Instrument .................................................... 4:29

4.9 Settings ..................................................................... 4:30

4.9.1 Default Settings .......................................................... 4:30

4.9.2 Scan Mode (Standard) ................................................ 4:30

4.10 Read Disk ................................................................... 4:30

4.11 Error Codes in Software Log (SL) and Hardware

Log (HL) ...................................................................... 4:31

4.11.1 Error 4, Grating Motor Error ...................................... 4:33

4.11.2 Error 22, MU/TWM Data Range Error ........................ 4:33

4.11.3 Error 32, Speckle Signal Blocked ................................ 4:33

4.11.4 Error 128, Path Length Error ...................................... 4:34

4.11.5 Error 512, Speckle Function Error .............................. 4:34

4.11.6 Error 16384, Strain Gauge Failure (Load Cell) ........... 4:34

4.11.7 Error 32768, Hardware Error ...................................... 4:34

4.11.8 Error 33292, Reference Scan too low ........................ 4:35

4.11.9 Error 33293, Too few valid Sub samples collected ... 4:35

4.11.10 Error 33294, Monochromator Shutter not able

to move ....................................................................... 4:35

4.12 Hardware Error Log (xxxxxxxx.HL) ..................... 4:36

4.12.1 Error Word .................................................................. 4:36

4.12.2 Commands .................................................................. 4:37

4.12.3 Status Word 1 ............................................................. 4:41

4.12.4 Status Word 2 ............................................................. 4:42

4.12.5 Error Word 1 ............................................................... 4:43

4.12.6 Error Word 2 ............................................................... 4:44

4.12.7 Error Word 3 ............................................................... 4:45

4.12.8 Error Word 4 bit encoding (0x0108) .......................... 4:45

4.12.9 DSP Version ................................................................. 4:45

4.13 Export Logs and Configuration ........................... 4:46

5 Service and Maintenance .......................... 5:1

5.1 Special Tools ............................................................... 5:1

5.2 Service Procedures .................................................... 5:1

5.2.1 Replacement of Display Kit .......................................... 5:1

5.2.2 Replacement of Keyboard Overlay .............................. 5:7

5.2.3 Replacement of Detector Unit Complete .................... 5:8

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Infratec™ 1241 Grain Analyzer

5.2.4 Replacement of Monochromator Complete ............... 5:9

5.2.5 Replacement of Halogen Lamp for Monochromator 5:11

5.2.6 Use of the Aperture Kit (p/n 60023539) .................... 5:13

5.2.7 Replacement of Power Supply Board ........................ 5:16

5.2.8 Replacement of Interface Complete .......................... 5:18

5.2.9 Replacement of PC Module Complete w/o

Flash Disc ..................................................................... 5:23

5.2.10 Replacement of DSP Board ......................................... 5:29

5.2.11 Replacement of Compact Flash Disc .......................... 5:35

5.3 Measuring Unit ......................................................... 5:36

5.3.1 General ........................................................................ 5:36

5.3.2 Replacement of Measuring Unit Complete ............... 5:36

5.3.3 Replacement of Upper Solenoid ................................ 5:38

5.3.4 Replacement of Lower Solenoid ................................ 5:39

5.3.5 Replacement of Lower Linkage Shutter Assembly ... 5:40

5.3.6 Replacement of Upper Linkage Shutter Assembly ... 5:41

5.3.7 Replacement of Connection PCB Complete .............. 5:42

5.3.8 Replacement of Measuring Unit PCB ......................... 5:43

5.3.9 Replacement of Variable Motor ................................ 5:44

5.3.10 Replacement of Conveyor Motor ............................... 5:45

5.3.11 Replacement of Cell Wall Front with Speckle

Emitter PCB .................................................................. 5:46

5.3.12 Replacement of Cell Block Complete and Path Length

Encoder ........................................................................ 5:47

5.3.13 Replacement of Cell Cover Outer .............................. 5:48

5.3.14 Checking movement of the Variable Cell .................. 5:49

5.3.15 Drawer Sensor Cable, rerouting ................................. 5:50

5.4 Test Weight Module ................................................ 5:52

5.4.1 Replacement of Test Weight Balance Complete ....... 5:52

5.4.2 Replacement of Wiper Arm Complete ...................... 5:53

5.4.3 Replacement of TWM PCB .......................................... 5:56

5.4.4 Replacement of Wiper/Shutter Motor ....................... 5:58

5.4.5 Replacement of Locking Guide .................................. 5:61

5.4.6 Checking/Adjusting TWM Level Sensors .................... 5:63

5.5 Sample Transport Module ..................................... 5:65

5.5.1 Replacement of Cuvette Glass Kit .............................. 5:65

5.5.2 Replacement of STM Cuvette Cam Thread ................ 5:66

5.5.3 Checking STM Cuvette Cam Thread ........................... 5:69

5.6 Corrective Maintenance Procedures ................... 5:70

5.6.1 Cable Stalk Kit ............................................................. 5:70

5.6.2 Lamp Holder ................................................................ 5:70

5.6.3 DSP board .................................................................... 5:70

5.6.4 TWM PCB ..................................................................... 5:70

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Infratec™ 1241 Grain Analyzer

5.7 Preventive Maintenance Procedures .................. 5:72

5.7.1 Measuring Unit Adjustment of Path Length ............ 5:72

5.7.2 TWM Balance Calibration .......................................... 5:74

5.7.3 TWM balance Control ................................................ 5:77

6 Technical Specifications............................. 6:1

7 Schematics .................................................. 7:1

8 Document References................................ 8:1

Service Manual 1001 5015 / Rev. 4

Infratec™ 1241 Grain Analyzer

Service Manual 1001 5015 / Rev. 4

Infratec™ 1241 Grain Analyzer

1 Important Instructions

1.1 General

This Service Manual contains descriptions, installation instructions, maintenance instructions, troubleshooting, specifications and schematics for the Infratec™ 1241 ISW 5.xx. Service of Infratec™ 1241 should only be done by authorized personnel.

NOTE: This manual covers the Infratec 1241 Generation 2 and 3 only. For reference to the Infratec 1241 Generation 1 and Infratec 1256 use Service Manual p/n 10012177.

1.2 Service Documents

This Service Manual is a part of the Service USB (if available) which contains the complete support documentation for this product. The Service USB may contain additional information in the form of animations for the purpose of illustrating and explaining e.g. working principles, process flows and service and adjustment procedures. See also section 8 Document References for an overview of User and Service Documentation.

1.3 Self-Service Support

The Customer Support Toolbox (CST) on FOSS EXTRAnet (www.foss.dk) contains all available support information. Please visit the CST at regular intervals for latest updates of documents and software.

1.4 Contacting Customer Support

For support on this product, please contact the responsible Technical Support engineer at FOSS or file a support request in the Global HelpDesk on FOSS EXTRAnet.

1.5 ESD Information

Parts of this instrument, e.g. PCBs, are sensitive to Electro Static Discharge (ESD). All sensitive parts should be handled using ESD protection.

Follow these rules for effective ESD protection:

• Handle all ESD sensitive parts with an ESD wrist band connected to earth.

• Transport all ESD sensitive parts in ESD protected bags or boxes.

• Check your ESD protection at regular intervals to secure its function and quality.

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Infratec™ 1241 Grain Analyzer

8000189a

The following ESD protection material is available from FOSS:

• 436220 Field-ESD service kit including wrist band

• 463238 Blue table mat with wrist strap and ground wire

• 436246 Coiled wire, 360 cm with stretch-wrist band

• 436261 Wrist-strap tester

Fig. 1:1 ESD equipment

1.6 Precautions

The layout of safety symbols used in this manual is described below. Symbols are used whenever a safety related message is written to warn the reader of potential hazards.

Safety Symbols

Explanation of safety symbols used in this manual:

Symbol Description

General hazard.

Electrical shock hazard.

Hot surface.

Heavy object.

Safety Terminology

Explanation of safety terms used in this manual.

Term Description

Warning Danger to human safety.

Caution Danger to product performance/operation.

Note Important supplementary information.

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Infratec™ 1241 Grain Analyzer

2 Technical Description

2.1 History

The Infratec 1241 was first launched in the year 2000. It was then equipped with a black & white display and a diskette drive as means of importing and exporting data to the instrument. These instruments are now referred to as Generation 1.

In 2007 the Infratec 1241 was hardware and software wise redesigned. It was then equipped with a color display and USB ports for importing and exporting data. The "Basic concept" was also introduced which made it possible to limit the amount of calibrations on the instrument and thus reduce the selling price. These instruments are now referred to as Generation 2.

In 2010 the exterior was redesigned to match the EyeFoss image analyzer design. Few internal parts where altered. These instruments are now referred to as Generation 3.

Model Display Data ISW version

Generation 1 Black & white Diskette 3.xx

Generation 2 Color USB 5.xx

Generation 3 Color USB 5.xx

The Infratec 1256 is electronically and technology wise almost identical to the 1241. Over the years different hardware and software features have been continuously

introduced, e.g. TCP/IP, calculated constituents. Many of these can be added to older instruments. Upgrade of ISW is always free of charge.

The Basic Concept

Model # of allowed AppM's # of allowed parameters

Full Many Many

Basic 1 One Three

Basic 2 Two Three per AppM

Basic 3 One Six

Basic 4 Two Four per AppM

Basic 5 Five Four per AppM

Basic 6 Six Four per AppM

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Infratec™ 1241 Grain Analyzer

Related Information

Service personnel should be familiar with the following documentation:

• User Manual; for function descriptions, maintenance and operating instructions

• Spare Parts Manual; for spare part illustrations and spare part numbers

• Quick Guide; for a quick start instruction

Also see chapter 8 Document References.

Abbreviations

Explanation of abbreviations used in this manual.

ADC Analog to Digital Converter

DIB Display Interconnection Board

DSP Digital Signal Processing

EID Electronic ID

GA Grain Analyzer

I2C Standardised serial interface (Inter Integrated Communication)

I/O Input/Output

ISW Instrument Software

LIMS Laboratory Information and Management System

MU Measuring Unit

OS Operating System

PCB Printed Circuit Board

PSM Power Supply Module

RTOS Real Time Operating System

STM Sample Transport Module, optional

TWM Test Weight Module, optional

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Infratec™ 1241 Grain Analyzer

2.2 Component Descriptions

Compatibility with previous version

Module Compatible Comments

PSU Yes All versions Detector Yes All versions Monochromator Yes All versions MU Yes All versions TWM Yes All versions (TN 1234) STM Yes LCD Display No See Spare Parts Manual PC module

DSP PC- board Compact Flash Floppy disk

No No No No/Yes No

Requires OS vers 5.01 or higher Requires OS vers 5.01 or higher Dependency. Requires ISW 5.xx

Disabled in BIOS, USB Floppy disk support Cable Stalk No Interface No USB Chassis Yes

System Overview

Fig. 2:1

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Infratec™ 1241 Grain Analyzer

2.2.1 PC-Module

The PC-module is a PC104 embedded hardware platform with QNX real-time operating system (RTOS). PC104 is a popular standardized form-factor for small computing modules typically used in embedded system. A system composed of PC/ 104 modules is often referred to as a "stack".

The PC module "stack" assembly consists of:

• Mounting plate

• Processor board, that acts as a controller for the peripheral components

• DSP board, that acts as an extension Processor board and is also used as an I/O system

Communication between the PC-module and the instrument modules is routed via the DSP board I

C bus, which is a simple standard 2-wire connection where the DSP

acts as the master device.

NOTE: Due to the QNX software platform, USB plug & play is not supported. An USB-floppy drive solution may however work.

Fig. 2:2 PC-Module

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Infratec™ 1241 Grain Analyzer

2.2.2 Processor Board

The processor board is a single board processor (SBC) with an onboard CPU processor. Processor board acts as a controller for the peripheral components. The processor board communicates with the DSP board via the PC/104 bus.

The processor board has three main interfaces:

• DSP board PC/104 bus

• TFT LCD display

• Connectors to chassis Interface panel, providing access to external keyboard, USB, comm. ports, LAN etc

Fig. 2:3 Processor Board

CN3 Printer Interface (LPT1) CN15 LAN/Ethernet Interface CN5 USB Interface (0&1) CN18 Keyboard/Bar code Interface CN12 LCD Display CN19 COM1 Interface CN13 COM2 Interface CN20 CRT Monitor Interface

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Infratec™ 1241 Grain Analyzer

The Processor Board has replaceable external CMOS battery.

Fig. 2:4 Processor Board

2.2.3 DSP Board

The DSP module is accessed from the ISW via the PC/104 bus interface (P3) and acts as slave under the ISW.

The DSP software acts as an extension of th e ISW and is also used as an I/O system. The PC-module makes it possible for the ISW to have control over the different HW modules.

There is no ROM memory on the DSP Board. For this reason, the DSP software is uploaded from the processor board by ISW during start-up. The ISW installation package contains and installs the latest and matching DSP software version.

The DSP has an I2C bus interface, implemented as a SW driver in the DSP software and is used for communication between devices inside the instrument. I wire serial bus, as shown in

Fig. 2:5.

Fig. 2:5

C is a two-

There are a number of on board LEDs on the DSP Board. These LEDs provide information as to the status of the DSP Board.

LED Function Color

D3 Power On Green, constant

D4 DSP-ISW communication Red, flashing when active

D1 DSP running Red, constant after boot-up

2:6 Service Manual 1001 5015 / Rev. 4

Monochromator motor direction

Red, blinking

Infratec™ 1241 Grain Analyzer

Fig. 2:6 DSP Board

P1 Keypad P13 Detector P3 PC/104 Bus P14 I2C Bus P6 Power Supply P15 I2C Bus P7 Inverter Interface Board D1 DSP running (red LED) P8 Monochromator D2 Monochromator (red LED) P9 Monochromator D3 Power On (green LED) P12 Monochromator D4 I2C communication (red LED)

DSP Board

From Designation To

P1 Keypad overlay P3 PC/104 Bus Interface Processor Board P6 Power Supply Power Supply Board (P7) P7 Backlight Power Display Interconnection Board P8 Encoder Connector Monochromator P9 Grating Motor Connector Monochromator P12 Shutter Board Connector Monochromator P13 Detector Signal Detector P14 I2C Bus Measuring Unit

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Infratec™ 1241 Grain Analyzer

P15 I2C Bus Power Supply Board

2.2.4 CompactFlash Disk

Type II CompactFlash™ Memory The CompactFlash memory is preinstalled with latest OS version and ISW software.

As spare part it is available as Basic 1 configuration only. The Flash Disk is an electronic memory mounted in a slot on the Processor Board.

Due to market conditions you may find different sizes in the instruments over the years. There is no problem upgrading the Flash Disk to a larger size. The disk is partitioned in three parts, 5 Mb for the operative system, 5 Mb for ISW. The remaining space is for data.

The Basic Concept

Model # of allowed AppM's # of allowed parameters

Full Many Many

Basic 1 One Three

Basic 2 Two Three per AppM

Basic 3 One Six

Basic 4 Two Four per AppM

Basic 5 Five Four per AppM

Basic 6 Six Four per AppM

2.2.5 Monochromator

The Monochromator is developed and manufactured by FOSS. It is to be considered a closed, factory calibrated box. There is under no circumstance any reason to open it for maintenance, inspection or other purpose. On the contrary an opened monochromator will not be covered by warranty, neither will it be accepted in the exchange part system. The monochromator is the only spare part in the Infratec that is enrolled on the spare part exchange system.

In the Infratec the monochromation of the "white light" from the lamp is done before the sample. This technology is called pre-dispersive monochromation. This is optimal when using transmission of light through the sample, e.g. for grain analysis. A disadvantage of this technology is that the system becomes very sensitive to stray light from the environment, e.g. sunlight and fluorescent light from the ceiling.

In the Infratec the light from the light source (the instrument lamp) is transported in an optic fiber bundle into the heart of the monochromator. This fiber bundle consists of thousands of randomized fibers. A lamp change will therefore not affect the output of the fiber bundle and thus makes it un-necessary to linearize after the lamp is change. The fibre optic cables are sensitive to sharp bends and should be treated with care.

Inside the monochromator the lamp light is split up (monochromated) in a diffraction grating. The grating is turned by a motor so that only one wavelength is exiting the monochromator at any given time. The grating is producing a spectrum covering the wavelength range from 570 to 1100 nm. The bandwidth is 7 nm.

At the out put there is a second fiber bundle to transport the monochrome light over to the right side of the instrument where the sample cell is located.

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Infratec™ 1241 Grain Analyzer

Before the monochromator output there is a shutter with 3 positions, Open, Closed and Filter. The closed position is used to block the light during the offset measurement which is done prior to scanning the sample. Open position is used during the sample scanning and Filter position is used during performance tests to determine the wavelength accuracy compared to the factory status.

The monochromator is supplied with an EEPROM which stores the O- and Pconstants. These constants are obtained from the factory calibration and cannot be altered or re-calibrated in the field. The EEPROM resides on a PCB underneath the monochromator base plate. This PCB is therefore a unique part dedicated for each monochromator and cannot be changed.

NOTE: The Monochromator is sealed and it is absolutely forbidden to open it by other than FOSS personnel.

Fig. 2:7

1 Lamp fiber 4 Output fiber 2 Grating 5 Motor/Encoder 3 Shutter 6 PCB with EEPROM

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Infratec™ 1241 Grain Analyzer

2.2.6 Lamp Module

The Infratec 1241 light source solution is accommodated in a heat sink aluminium housing. It has no internal electronics other than the power supply cable and light bulb. The module includes:

• Aluminium housing as heat sink

•Lamp Holder

•Lamp

• Aperture (if applicable)

• Optic Fibre connection

Lamp holder

Three versions of lamp holders have been manufactured for Infratec 1241. The latest version, introduced 2008-10-17, has socket screw terminals to secure firm contact. See picture below. Previous versions are exposed to oxidation coating causing bad contact between lamp and terminals. It is recommended to replace the previous versions with P/N 10013351 which is the latest version (see picture below).

Infratec 1241, InfraXact and FoodScan analysers all have the same lamp holder.

Fig. 2:8 Lamp Holder

Lamp source

The halogen lamp is FOSS custom manufactured and can not be substituted with regular lamps. Use P/N 60023564 to order.

Aperture

Exchangeable apertures are used to adjust the amount of light admitted to the monochromator inlet fibre. Monochromator replacement requires that light intensity is checked due to dispersion variation in the Monochromator Optical Fiber.

Exchangeable apertures are available in fixed openings of 5, 5.5, 6, 6.5, 7 and 7.5 mm diameter. An Aperture Kit (P/N 60023539) with a full range of apertures is supplied with replacement monochromators. Please refer to TN1355 for replacement instructions.

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Infratec™ 1241 Grain Analyzer

2.2.7 Detector

The detector converts light energy input to digital data output. It is constructed in a sealed and shielded box with a window for light input and a connector for digital input and output. The analog electronics inside the box are galvanic isolated (opto coupled) from all I/O signals.

The detector and the DSP communicate with each other in two ways. The I2C bus is used to transfer commands from the DSP to the detector, while a high speed serial channel is used to transfer data from the detector's A/D converter.

The detector module has an I2C expander on board that is accessed from the DSP and is used to set the detector gain to values specified by the ISW. It also has a temperature sensor from which ISW reads current temperature inside the detector and it's accessed via the I

An E2PROM onboard the detector module contains the detector constants (e.g. serial number).

C interface as well.

Fig. 2:9 Detector Block Diagram

1 Front end optics 6 I/O expander for control signals 2 Large area silicon detector diode 7 Temperature sensor

Pre-amplifier stage 1 with selecta-

ble gain Pre-amplifier stage 2 with selecta-

ble gain

5 16 bit 100 ksamp/sec A/D-converter

Service Manual 1001 5015 / Rev. 4 2:11

EEPROM for calibration data stor-

age

9 Isolated DC/DC converter

Infratec™ 1241 Grain Analyzer

2.2.8 Power Supply

The Power Supply takes the 24V AC power it receives from the transformer and converts it to a variety of DC voltages (+ 5.5V, +5V, +12V, -12V, and +10.5V). These voltages are used by a variety of instrument components, including the PC module, measuring unit, lamp, display, and optional equipment (TWM, STM etc.).

The Power Supply receives command signals from the DSP Board via the I2C bus.

C decoder processes these signals and controls the lamp and display

The I accordingly. For example, the lamp and display backlight can be placed in power saving stand-by modes, the display itself can be extinguished during certain sequences such as the initial instrument boot-up procedure.

Fig. 2:10 Power Supply Block Diagram

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Infratec™ 1241 Grain Analyzer

Fig. 2:11 Power Supply Board

J1 LCD Backlight P8 Measuring Unit Power J3 LCD F1 Fuse 6.3 AT M J6 I2C Bus F2 Fuse 1.25 AT T J7 Remote I/O Power (optional) F3 Fuse 4.0 AT P1 From Transformer F4 Fuse 500 mAT P5 Lamp F6 Fuse 4.0 AT P7 DSP Board Power

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Infratec™ 1241 Grain Analyzer

2.2.9 LCD Display

The display is a 6.4 inch color active matrix LCD module, VGA 640 x 480 pixel resolution, incorporating amorphous silicon TFT (Thin Film Transistor). It is composed of a color TFT-LCD panel, driver ICs, control circuits, power circuits and a backlight unit.

Other features include a wide viewing angle with the best angle at 6 o'clock, high contrast, anti glare polarizing filter, normally white display mode that produces natural colors.

The display needs voltage from three sources to be operational:

• 5VDC from the Processor Board (the display on/off signal)

• Display backlight from the Display Interconnection Board

• Contrast voltage

The LCD Display is not repairable, it has to be replaced if a failure occurs. The keypad is a passive matrix (7´4) with an LED power indicator. It is sometimes

here referred to as the keypad overlay.

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Infratec™ 1241 Grain Analyzer

2.2.10 Display Interconnection Board

The Display Interconnection Board is connecte d between the Power Supply Board, DSP Board and the Display. It functions as a switch whereby ISW controls LCD Backlight and LCD Display by on/off function.

Fig. 2:12 Inverter Interface Board

JP1 I2C Bus JP2 LCD Display

The Display Interconnection Board is powered by DSP Board P7 sock et.

NOTE: Backlight. Actually 600 V AC, supplied by a DC/AC converter.

Fig. 2:13

DIB

Connector Designation To / From

JP1/1-4 +5V, GND, +12V DSP Board (P7) JP1/5 Not used JP1/6-7 LCD Backlight On/Off Power Supply Board (J1) JP1/8 LCD On/Off Power Supply Board (J3) JP2 Output 600 VAC LCD Display

2.2.11 Electronic ID

The Electronic ID is installed as factory standard and enables the extended wavelength range needed for predictions in the area 570 nm - 850 nm.

The effective wavelength range of the instrument will be 570 nm-1098 nm. This range will be activated when using an Application Model with extended range.

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Infratec™ 1241 Grain Analyzer

2.2.12 TWM (Optional)

Test Weight Unit (TWU)

The device which performs the actual weighing of the sample. It consists of the following basic items;

• A load cell (balance).

• Control electronics PCB. Referred to as the TWM PCB.

• A wiper arm to level of the cuvette.

• Level sensor to detect when the cuvette is full.

• A shutter to allow emptying of the cuvette after measurement.

Fig. 2:14 Test Weight Module

See the Spare Part manual for more detailed information on available spare parts.

Test Weight Module (TWM)

TWM is the terminology used for the entire assembly, including the TWU and chassis. This module is an optional device that can be fitted to any existing Infratec

1241. To measure the test weight of a sample the used Application model must have support for the TWM.

The Infratec software (ISW) will during boot-up detect if a TWM is electrically connected to the instrument.

The TWM is connected to the Infratec through the TWM power/ communication cable and the drawer sensor cable. The TWM power/ communication cable can be connected in either of the two optional contacts on the Measuring Unit. The TWM then receives commands from the ISW. The weight is mathematically converted to a density and the completed result is presented on the display as a bulk density.

The instrument handles both metric units and imperial units making it possible to present test weight in both kg/hl and lbs/bu. More information can be found in the User Manual for Infratec 1241 Modules, p/n 60043623.

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Infratec™ 1241 Grain Analyzer

The TWU is designed to receive sample from the Infratec in small sub-samples into a measurement cuvette. The surface of the measurement cuvette is then skimmed flat with a wiper arm and the measurement taken.

The TWU then discharges the sample into the sample drawer. The commands to operate the TWU originate from the DSP board. All commands come over the I2C serial bus. The I2C is a 2-wire serial bus consisting of data and clock. There are two buses of this type on the TWU PCB, one to the DSP and the other to the EEPROM.

The EEPROM fitted on the TWM PCB is provided to hold the mass calibration constants. The control of the wiper arm is done with a step motor with an encoder. At start-up the wiper arm moves between the physical end positions. Then a couple of pulses are taken away in each end. The calculated positions are HOME and FAR positions.

Below is a description of the weighing process for Infratec 1241 Test Weight Module:

1. Activate the Test Weight Unit.

Check in the User menu under Application models/Test Weight/Setup/General settings, that "Enabled" is set to ON.

2. Choose an Application model that include test weighing. It's important that the

twm.ini file is included. It is also possible to create a new Application model. Go into the User menu and choose Application models/Test Weight/Setup/Test Weight Models.

3. Pour the sample into the hopper.

4. Press the analyse button (or use F´9 on the external keyboard)

The empty weight of the test cell is first measured. Then the conveyor in the Infratec Measuring Unit deposits sub-samples in the sample cell, where NIT analysis takes place. After analysis of each sub-sample, the bottom shutter of the sample cell opens, depositing the grain in the cuvette of the Test Weight Unit. A level sensor detects when the TWU cuvette has been filled and analysis of the remaining NIT sub-samples are temporarily halted. A wiper arm levels off the test cell to ensure proper cell packing and consistent sample volume. The weight of the grain in the test cell is then determined as the difference between the full measurement and the empty measurement after which the Infratec makes all necessary calculations and adjustments. The shutter at the bottom of the test cell is then opened, allowing the grain to fall into the sample collection drawer, and the analysis of the remaining NIT subsamples is resumed. The grain from these sub-samples simply passes directly through the TWU cuvette).

5. The NIT results, along with test weight, are then presented on the LCD display

of the Infratec.

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Infratec™ 1241 Grain Analyzer

2.2.13 STM (Optional)

The Sample Transport Module is an optional device used for samples that are not fit to be taken through the Measuring Unit sample cell, e.g. moist samples or even liquids. Such samples may be green-malt, beer, boiled rice etc. Several different cuvette models and sizes are available for different kinds of sample types.

The STM consist hardware wise of an Elevator Unit which includes a motor that drives the sample cuvette down in front of the detector and electronics to communicate commands to the DSP. The position of the cuvette is detected by two magnet sensors in the elevator unit.

Electrically the STM is connected to either of the two ports on the measuring Unit. For installation and usage see the User Manual for Infratec 1241 Modules, p/n

60043623

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Infratec™ 1241 Grain Analyzer

2.2.14 Remote I/O (Optional)

Introduction

This document describes the I/O Interface and specifies the physical interfaces used for connecting it to an Infratec 1241 or Infratec 1256. The Infratec is assumed to be prepared for this hardware such that the back plate has got place for a High Density DSUB15 connector for this purpose.

Connections

The I/O Board has three different interfaces:

• The 5-pin I2C/Power interface. The cable connecting to this interface has a 4way , 2-wire I²C connector that sh ould be connected to an available I²C connector inside the Infratec 1241/1256. The 4-way, 3-wire power connector should be connected to an available power connector inside the Infratec 1241/1256.

• The 3-pin sensor interface could be used for connecting a "trigger"-sensor inside the instrument.

• The 15-pin High Density DSUB15 is the interface to the outside world and is mounted on the I/O Board and should be fastened at the back of the instrument.

Fig. 2:15 I/O Board

1 I2C/Power interface (P3) 3 DSUB15 interface (P1) 2 Sensor interface (P2)

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Infratec™ 1241 Grain Analyzer

Pin description

Item Pin Name Description

1 SDA I²C Serial Data

2 SCL I²C Clock I2C/ Power

3 GND

4 5V

5 12V

1 12V 12V supply to external sensor

Sensor

DSUB15

2 Trigger IN Trigger input used to start analysis

3 GND GND to external sensor

1 IO0 - Busy

2 IO1 - Connected

3 IO7 - Trigger Trigger input used to start analysis

4 IO6 - Reserved Not used

5 GND

6 IO2 - AM Selection 0

7 IO3 - AM Selection 1

8 IO4 - AM Selection 2

9 IO5 - AM Selection 3

10 GND GND to external sensor

11 12V Output 12V supply to external sensor

12 NC NC

Indicates that the Infratec 1241/1256 is busy analysing

Indicates that the Infratec 1241/1256 is connected

Bit 0 of the 4 bit nibble used for selecting the application model

Bit 1 of the 4 bit nibble used for selecting the application model

Bit 2 of the 4 bit nibble used for selecting the application model

Bit 3 of the 4 bit nibble used for selecting the application model

13 NC NC

14 NC NC

15 10-24V Input External power 10-24V for opto-couplers

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Infratec™ 1241 Grain Analyzer

Hardware

The hardware of the I/O Board is basically an I²C controlled 8 bit I/O expander where 2 pins are allocated as outputs (IO0, IO1) and 6 pins as inputs (IO2-IO7). All I/O:s are protected with opto-couplers and the external part of the opto-couplers are powered with 12/24V from the outside.

One pin on the connector is connected to the Infratec 1241/1256 12V supply to enable connection of an external sensor without extra hardware.

Software

The functionalities for the I/O Board require at least ISW 3.40. In this version there are however some bugs regarding the statuses 'Busy' (not reported correct at all times) and 'Connected' (not enabled). This will be fixed in ISW 3.41 that will be released in 2006.

Fig. 2:16

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Infratec™ 1241 Grain Analyzer

2.3 Software Description

The operative system used in the instrument is QNX which is a commercial Unixlike real-time operating system (RTOS), aimed primarily at the embedded systems market.

The DSP software acts as an extension of the instrument software (ISW) and is located as an IO module to the PC board. The DSP software is accessed via the standard PC/104 bus on the PC board. The DSP module makes it possible for the ISW to have control over the different components of the instrument. This document describes the interface (IF 1) between the ISW (SW 1) and the DSP software (SW 2).

Fig. 2:17

SW 1: Instrument software system (ISW) (10008304)

PC-software located in the instrument. It contains functions for analysing samples, predicting results, creating scan files for mathematical treatment.

SW 2: DSP software system (10008494 & 10014320)

Software located in the DSP. Containing functions for Detector, Monochromator, MU, TWM and PSM communication.

SW 3: Monochromator microcontroller software

PIC microcontroller software to control the monochromator shutter functions and the E2PROM access on the monochromator board

The O and P constants are stored together with the monochromator module serial number in an E2PROM onboard the monochromator PCB.

SW 4: Measuring Unit (MU) microcontroller software

PIC microcontroller software to control the MU functions.

SW 5: Test Weight Module (TWM) microcontroller software

PIC microcontroller software to control the TWM functions.

SW 6: Electronic ID (EID) microcontroller software

PIC microcontroller software to control the EID functions.

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Infratec™ 1241 Grain Analyzer

SW 7: Sample Transport Module (STM) microcontroller software

PIC microcontroller software to control the STM functions.

IF 1: Instrument Software/DSP gen II (10014320)

Interface between the Instrument software and the DSP software.

IF 2: DSP/Monochromator

I2C interface between the DSP and the monochromator microcontroller.

IF 3: DSP/Detector Module

I2C interface between the DSP and the detector module E2PROM, I2C expander and temperature sensor.

IF 4: DSP/MU

I2C interface between the DSP and the MU microcontroller and temperature sensor.

IF 5: DSP/PSM

I2C interface between the DSP and the PSM I2C expander. The signals used to adjust the contrast of the display, the display on/off function, to

set the display backlight on/off and the monochromator lamp in standby mode is sent to the power supply module via the i2C bus interface. This connector is identical to the connector interfacing the STM.

IF 6: DSP/TWM

I2C interface between the DSP and the TWM microcontroller via the MU board.

IF 7: DSP/Hopper Temp.

I2C interface between the DSP and the hopper temperature sensor via the MU board.

IF 8: DSP/EID

I2C interface between the DSP and the EID microcontroller via the MU board.

IF 9: DSP/STM

I2C interface between the DSP and the STM microcontroller via the MU board.

IF 10: DSP/Remote IO

I2C interface between the DSP and the IO expander circuit on the remote IO board via the MU board.

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Infratec™ 1241 Grain Analyzer

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Infratec™ 1241 Grain Analyzer

FOSS TECATOR

3 Installation

3.1 General

See User Manual - Infratec™ 1241 Grain Analyzer. Information about installation of Sample Transport Module and Flour Module can be

found in User Manual - Infratec™ 1241 Modules, P/N 60043623.

Site Preparation

The site preparation is intended to be carried out prior to the installation of the instrument at the customer site. The site preparation documents can be found at FOSS Intranet – Customer Support Toolbox.

Filling Out Installation Documents

Each instrument is delivered with an Owners Guide binder where you will find all installation documents to be filled out.

3.2 Installation of Test Weight Module on Infratec 1241 Generation 2

The installation of the Test Weight Module occurs in the three steps:

1. Preparation of the Infratec for assembly

2. Preparation of the Test Weight Module for assembly

3. Final ass embly of Infratec and Test Weight Module into a complete assembly

3.2.1 Preparation of the Infratec for assembly

To prepare the Infratec for assembly to the Test Weight Module, perform the following steps:

1. Remove the screw on the back of the instrument's lower right hand side using a

3 mm (2,5 mm for later models) allen wrench, see

Fig. 3:1 below.

Fig. 3:1 Screw on backside of instrument

Service Manual 1001 5015 / Rev. 4 3:1

Infratec™ 1241 Grain Analyzer

3 2

1241298a

2. Disconnect the collection drawer sensor cable connector (1) from the Measuring Unit, see

Fig. 3:2 below.

Fig. 3:2 Collection drawer sensor cable,

Measuring Unit Gen. I (left) and Measuring Unit Gen. II (right)

The next step requires that the instrument be tilted on its left side. Before this can be done, there must be adequate workbench space and a soft padding (or equivalent) must be laid where the instrument will be tilted on its side.

Warning

The tilting of the instrument must be performed by two persons.

3. Gently tilt the instrument and lay it to rest on its left side.

4. Remove the sample collec tion drawer from the instrument.

Caution

Open the right-hand door carefully when the instrument is in tilted position. The door may brake if incautios.

5. Lift the hopper section to its fully upright position and then open the right-hand door, see

Fig. 3:3 below.

Fig. 3:3 Right hand door opened

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Infratec™ 1241 Grain Analyzer

6. Remove the bottom pla t e by loosening the four screws with a 3 mm allen wrench, see Fig. 3:4 below.

Fig. 3:4 Bottom plate

7. Remove the collection drawer guides (two on each side ). This is done by unscrewing the screws with a 4 mm allen wrench, see

Fig. 3:5 below. Remount four short screws in the holes on the left side (the instrument side). This is to prevent dirt from getting into the Infratec.

Fig. 3:5 Collection drawer guides

8. Close the right-hand door and lower the hopper section to its fully closed position.

Service Manual 1001 5015 / Rev. 4 3:3

Infratec™ 1241 Grain Analyzer

3.2.2 Preparation of the Test Weight Module for assembly

To prepare the Test Weight Module for assembly, perform the following:

1. Place the Test Weight Module on a workbench. The workbench should be as level as possible. The workbench should also be as free from vibrations as possible.

2. Adjust the four feet under the plinth, see Fig. 3:6 below. Use a level guide to level the Test Weight Module.

Fig. 3:6 Adjustment of feet

3. Loosen the three letter screws on the Front Transport Securing Device, see Fig. 3:7 below. Store them in the extra holes on the Front Transport Securing Device.

Fig. 3:7 Letter screws on Front Transport Securing Device

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Infratec™ 1241 Grain Analyzer

4. Loosen the two letter screws on the Back Transport Securing Device and grip the Test Weight Module at the same time so that it will not fall, see below. Use the two letter screws to fasten the Front Transport Securing Device on the block situated behind the Test Weight Module.

Fig. 3:8 Screws on Back Transport Securing Device

Fig. 3:8

Warning

Never perform step 5 with the Back Transport Securing Device tightened.

5. Fasten the two allen screws hard with a 4 mm allen wrench, see Fig. 3:9 below. Grip the Test Weight Module at the same time so that you can feel that it is getting positioned.

Fig. 3:9 Allen screws

6. Use the enclosed labels to cover the two holes from the letter screws.

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Infratec™ 1241 Grain Analyzer

3.2.3 Final assembly of Infratec and Test Weight Module into a complete assembly

The Infratec and Test Weight Module should be assembled into a complete assembly as follows:

1. Tilt the Test Weight Module so that it can be introduced in the Infratec.

Caution

Extreme caution should be used when mounting the Test Weight Module to the Infratec. The test cell of the Test Weight Module is a very delicate and sensitive item. There should be no contact whatsoever with this item during the mounting process.

Caution

Open the right-hand door carefully when the instrument is in tilted position. The door may brake if incautios.

2. Lift the hopper section to its fully upright position and then open the right-hand

door.

3. Mount the screw on the back side of the Infratec using a 3 mm (2,5 mm for later

models) allen wrench, see

Fig. 3:10 Screw on back side of instrument

4. Mount the two screws located on either side of the collection drawer opening

using a 3 mm allen wrench, see

Fig. 3:10 below.

Fig. 3:11 below.

Fig. 3:11 Screws at collection drawer opening

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Infratec™ 1241 Grain Analyzer

5. Fasten the guiding bracket on the right side of the Test Weight Module. Use the holes market with arrows in bracket with two short screws using a 3 mm allen wrench.

Fig. 3:12 Guiding bracket hole

Fig. 3:12 below and Fig. 3:13 on page 3:7. Attach

Fig. 3:13 Guiding bracket hole

Caution

Steps 6-8 are extremly important for the instrument to be EMC approved.

6. To earth the TWM at least one of the holes marked with arrows in Fig. 3:14 below, has to be scraped. Use an 8 mm plane countersink.

7. Plane countersink the corresponding hole on the TWM.

Service Manual 1001 5015 / Rev. 4 3:7

Infratec™ 1241 Grain Analyzer

8. Position the cover plate assembly in the collection drawer opening of the Infratec, see

Fig. 3:14 below. Fasten the cover plate assembly with two long

screws using a 3 mm allen wrench.

Note: Fasten a toothed plate connector in the plane countersinked hole.

Fig. 3:14 Scrape at least one of these holes

9. Close the right-hand door and lower the hopper section to its fully closed position. Tilt the complete instrument back to upright position.

10. Mount the block ment to hold the Front Transport Securing device behind the TWM. Dry off the space behind the TWM with alcohol to make the selfadhering tape adhere better, see

Fig. 3:15 below.

Fig. 3:15 Self-adhering tape

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Infratec™ 1241 Grain Analyzer

3 2

1241298a

1. Drawer sensor cable

2. Optional

3. Optional

4. Hood temp sensor cable

11. Connect the drawer sensor cable and the Test Weight Module power cable to the Measuring Unit, see

Fig. 3:16 below. The Test Weight Module power cable can

be connected in either of the two optional contacts 2 or 3.

Fig. 3:16 Connections on the Measuring Unit,

Measuring Unit Gen. I (left) and Measuring Unit Gen. II (right)

12. Install the Test Weight ini-file. First of all put the diskette into the diskette holder of the instrument. From the User Menu, choose Read disk. The Test Weight inifile will be imported to the instrument, see User Manual.

13. Replace the sample collection drawer.

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Infratec™ 1241 Grain Analyzer

3.3 Installation of Test Weight Module on Infratec 1241 Generation 3

1. Remove the two plastic slides for the drawer. They should be moved to the

TWM later.

Fig. 3:17

2. Remove the metal plate covering the drawer sensor by loosen the four sc rews.

Fig. 3:18

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Infratec™ 1241 Grain Analyzer

Fig. 3:19

3. Turn the Infratec on the left side. Place some soft material on the table to prevent scratches.

Fig. 3:20

Service Manual 1001 5015 / Rev. 4 3:11

4. Remove three of the four feet.

Infratec™ 1241 Grain Analyzer

Fig. 3:21

5. Remove the two beams 1 and 2 by loosen the screws.

Fig. 3:22

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Infratec™ 1241 Grain Analyzer

6. Remove the bottom plate by removing the three screws 1. Keep the screws because they are needed later.

Fig. 3:23

7. Disconnect the drawer sensor and remove the sensor plate by removing the two screws 1.

Fig. 3:24

Service Manual 1001 5015 / Rev. 4 3:13

Infratec™ 1241 Grain Analyzer

8. Prepare the grain deflector (p/n 60039237) by putting the adhesive (p/n

10014399) on the outside of the right part of the deflector (see arrow below). It is used to hold it in place before it is fasten by the screws later in the assembly.

9. Mount the grain deflector at the front by using four screws (p/n 55320017). Just fix it don't fasten it yet.

Fig. 3:25

10. Put together the front cover (p/n 60034842) and cover bracket (p/n 60039398) by using the four screws (p/n 15320098).

Fig. 3:26

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Infratec™ 1241 Grain Analyzer

11. Fasten the cover plate to the deflector and adjust. Then fasten the screws holding the deflector.

Fig. 3:27

12. Use the three screws that were holding the bottom plate to cover the screw holes (one screw is not shown below).

Fig. 3:28

Service Manual 1001 5015 / Rev. 4 3:15

Infratec™ 1241 Grain Analyzer

13. Prepare the Test Weight Unit by mounting the two plastic slides from the Infratec.

Fig. 3:29

14. Transfer the drawer sensor from the holder that you have taken out from the Infratec (removed in step 7) to the holder for TWM (p/n 60039395). Put the sensor as much to the left as possible. Also put the rubber sealing (p/n 15420126) onto the left wing (see arrow below).

Fig. 3:30

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Infratec™ 1241 Grain Analyzer

15. Put in the holder into the TWM. Note that the cable from the drawer sensor should be placed between the rubber sealing and the chassis. Fasten with three screws (p/n 55320017).

Fig. 3:31

16. Loosen the three letter screws 1 on the Front Transport Securing Device. Store them in the extra holes on the Front Transport Securing Device.

Fig. 3:32

Service Manual 1001 5015 / Rev. 4 3:17

Infratec™ 1241 Grain Analyzer

17. Loosen the two letter screws 1 on the Back Transport Securing Device and grip

the Test Weight Module at the same time so that it will not fall. Store them as well in the holes in the Front Transport Securing Device.

Fig. 3:33

18. Fasten the two allen screws 1 hard with a 4 mm allen wrench. Grip the Test

Weight Module at the same time so that you can feel that it is getting centered.

Fig. 3:34

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Infratec™ 1241 Grain Analyzer

19. Use the enclosed labels 1 (p/n 10009083) to cover the two holes from the letter screws.

Fig. 3:35

20. Take the Test Weight Unit and connect it to the Infratec. Place the balance behind the deflector so that the level sensors don't touch the deflector.

Fig. 3:36

Service Manual 1001 5015 / Rev. 4 3:19

Infratec™ 1241 Grain Analyzer

21. Secure the TWM to the Infratec by using eight screws 1 (p/n 55320017) (six

screws are not shown below).

Fig. 3:37

22. Refit the two beams 1 and 2 and the three feet. Place the Infratec into standing

position.

Fig. 3:38

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Infratec™ 1241 Grain Analyzer

23. Connect the TWM to the measuring unit. Make sure that no cables are touching the balance.

Fig. 3:39

24. Swich on the Infratec.

25. Enable the TWM function of the Infratec 1241 according to User Manual Infratec 1241 Modules (p/n 60043623).

3.4 Installation of Sample Transport Module

Software Options

In the Service Menu there is an option in “3 Manual Tests” called “7 STM” which offers three options.

1. Position settings

2. Service

3. Exercise

Position settings can be used to run the cuvette holder up and down manually. It can also be used to step between the sub sample positions. It is easy to use and stops when it comes to the end position.

Service, displays the position sensors value and gives an option of running the motor Up/ Down/ Off.

Note: It will not stop in the end position so be very careful.

Exercise, will only continuously run the cuvette holder up and down, no real use for this option.

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Infratec™ 1241 Grain Analyzer

3.5 Mosaic Connection

Assigning Instrument type to Network

1. The instrument type must be assigned to the Network. Right click on Network Name. Select “Assign instrument types” from the context menu.

Fig. 3:40

2. Highlight the instrument type that should be assigned and click “OK”.

Fig. 3:41

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Infratec™ 1241 Grain Analyzer

Add New Group to Instrument type

3. Add an instrument group to the instrument type by right clicking on instrument type, select New Group from the context menu. In the example a New Group is added to Infratec 1241.

Fig. 3:42

4. New instrument group will show up:

Fig. 3:43

Service Manual 1001 5015 / Rev. 4 3:23

Infratec™ 1241 Grain Analyzer

5. Right click on the New instrument group and select Properties from the context menu.

Fig. 3:44

6. Give the Instrument group a new Name, for example customer name, site, factory or similar. Click OK.

Fig. 3:45

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Infratec™ 1241 Grain Analyzer

7. The new Instrument Group Name will appear under the instrument type.

Fig. 3:46

Connect Infratec 1241 to the Mosaic Server

Fig. 3:47

Service Manual 1001 5015 / Rev. 4 3:25

8. In analyze mode click on the Menu button. Select 1 Main Menu.

Fig. 3:48

Infratec™ 1241 Grain Analyzer

9. Enter password. The default password is “123456”.

Fig. 3:49

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Infratec™ 1241 Grain Analyzer

10. Select “5 Instrument Settings”.

11. Select “2 Setup”.

Fig. 3:50

12. Select “1 Communication”.

Fig. 3:51

Fig. 3:52

Service Manual 1001 5015 / Rev. 4 3:27

13. Select “2 LAN Settings”.

Infratec™ 1241 Grain Analyzer

Fig. 3:53

The customer IT department will assign if Static or Dynamic IP should be used. The IT department should also supply all information needed.

14. If the instrument will have a Static IP select “1 Static IP”. If using Dynamic IP please select “2 Dynamic IP”.

Fig. 3:54

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Infratec™ 1241 Grain Analyzer

15. Static IP: Enter at least the Instrument IP No., Subnet Mask and Gateway which the customer IT department has assigned for the instrument. Press Activate.

Fig. 3:55

16. Dynamic IP: Enter Instrument Name assign by Customer IT department. Press Activate.

Fig. 3:56

Service Manual 1001 5015 / Rev. 4 3:29

Infratec™ 1241 Grain Analyzer

17. Select “3 Network Information” to check the LAN settings is correct in Infratec.

Fig. 3:57

18. Select “2 LAN Settings”.

Fig. 3:58

19. Select “4 Mosaic Settings” to enter the Mosaic server settings.

Fig. 3:59

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Infratec™ 1241 Grain Analyzer

20. Type in the IP number to the Mosaic Server in Mosaic Host field. Remember that Infratec software cannot resolve DNS name, therefore use IP number to Mosaic server. Enter the right port for the Infratec to connect. Select Update type On Command or On Timer. Select OK. In selecting On Command the customer needs to go into menu to be able to synchronize, see next picture. Easiest way for the customer is to have Update Type On Timer.

Fig. 3:60

21. Select “5 Enable Mosaic Communication” to start synchronizing with the Mosaic System.

Fig. 3:61

Service Manual 1001 5015 / Rev. 4 3:31

Infratec™ 1241 Grain Analyzer

22. When the first synchronization is done with Mosaic server, the message “Instrument is waiting registration by Mosaic Manager” will appear if the synchronization was successful. Continue to register the instrument in Mosaic.

Fig. 3:62

Connect Infratec to Network in Mosaic

23. In Unassigned Instrument the newly synchronized Infratec 1241 will appear.

Fig. 3:63

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Infratec™ 1241 Grain Analyzer

24. Right click on the Instrument and select “Register…” from the context menu.

Fig. 3:64

25. Select the Network and Instrument group that the instrument should be assigned to and click OK.

Fig. 3:65

Service Manual 1001 5015 / Rev. 4 3:33

Fig. 3:66

Infratec™ 1241 Grain Analyzer

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Infratec™ 1241 Grain Analyzer

4 Diagnostics and Troubleshooting

4.1 General

As a Service technician you should try to gather as much information as possible before proceeding with a course of action when a customer calls to you with an instrument problem. The majority of problems that the customer experiences can be divided into two main categories, "poor" results or instrument faults. Instrument faults express themselves in error codes or that the instrument does not work at all.

Further, a problem reported may be a repeatable problem or an intermittent problem. The later requires more information to be pinpointed. You should then ask the user questions like;

• When in time did the problem occur first?

• How frequent is it?

• Did it occur in conjunction with any other event, e.g. relocating the instrument,

adding new hardware, adding new software etc?

• Has it escalated?

• Does the problem happen when certain events (keystrokes, selecting things etc)

happen?

• Try to think "outside the box" when you ask questions. Consider the

environment, e.g. vibrations, temperature, straylight, electricity, user log-in, time in the day/week or anything else relevant that may cross your mind.

• Has the user himself observed anything that is out of the ordinary?

Consider the first contact with the customer as a golden opportunity to get more information by asking questions like the ones above. A telephone call is a duplex communication and many times you will get closer to the root cause even if you may not be able to pinpoint the exact cause of the problem.

A very good way of getting closer to a solution is to learn how a working system behaves. Learn how "normal" logfiles and scans look like. Look at a normal startup and learn the procedure for the hardware like LED´s, beeps, hardware movements, soft ware messages etc. A deviation in this kind of information may also give clues to a solution.

Discussing "poor results" may be the most difficult situation due to the fact that the customer´s expectations can sometimes exceed the typical specified performance of the instrument. For NIR instruments, which always is an in-direct method of meas urement, you must consider the robustnes of the application, the sample itself and perhaps environmental influence. This without saying that the problem might be re lated to hardware or software in the system.

If you wan't to escalate a support incident to the 2nd line support please always add all the information you have gained during your first attempts to troubleshoot. Also describe the action you may have taken and the effect of those actions, if any. For the Infratec 1241 ALWAYS supply the

This chapter helps you to quickly find the explanation and likely cause to most of the error messages and faults. The beginning of the chapter includes questions that help you to sort out what kind of problem that has occurred.

complete set of log files from the instrument.

Service Manual 1001 5015 / Rev. 4 4:1

Infratec™ 1241 Grain Analyzer

4.1.1 Poor Results

The points listed below can be considered as a check list for trouble shooting “poor” results. The reasons for “poor” results can be divided into:

• User problems

• Poor calibrations

• Outliers

• Poor reference data

• Instrument problems (Time for cleaning? see User Manual)

4.1.2 User Problems

• Are they using the right calibration?

• Has there been an adjustment to the slope or intercept in the calibration?

• Are they sure that the moisture basis of the Infratec results is the same as that of the reference results?

• Do they use adjustment to dry content or constant moisture content?

• How many sub-samples are used?

4.1.3 Poor Calibrations

• Was the calibration developed for this type of sample?

• Was there sufficient data to develop the calibration?

• Was the calibration stabilised for instrument and temperature differences?

4.1.4 Outliers

Results with outliers should always be confirmed by a second analysis. A sample may be classified as an outlier for a number of reasons:

• The constituent concentration is outside of the calibration range.

• The sample is of a variety for which the NIT spectrum differs greatly from the samples in the calibration set.

• The product is analysed with wrong AM.

• There is too much foreign material in the sample.

• Movements of the sample during the scan.

• Too high absorbance.

• Packing of sample not good

For each constituent, an outlier will be displayed as a letter (A-E) and a number (1-5). The letter indicates what kind of outlier it is, as described below, and the number describes the severity (the higher the number, the stronger the outlier).

A-outlier (residual) and B-outlier (leverage)

An outlier denoted by the letters A and B indicate how closely the NIT spectra of the sample correlate with the spectra in the calibration set.

C-outlier (sub sample deviation)

An outlier denoted by the letter C indicates that the standard deviation between the sub predicted values from the individual sub samples is above the set limit.

D-outlier (out of range)

An outlier denoted by the letter D indicates that the low or high limit for the constituent has been exceeded by the predicted value of at least one of the sub samples. This means that it is possible to get a D-outlier even if the average result on the display is within the calibration range.

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Infratec™ 1241 Grain Analyzer

E-outlier (difference between sample and ambient temperature)

An outlier denoted by the letter E indicates that the difference between the sample temperature and the ambient temperature is outside the set limits.

Sensitivity of outlier detection The sensitivity for detection of outliers can be set in the instrument software, see User

Menu, Application Models®Setup®Outlier limits. For the outlier constants, it is im portant that a relevant value is set, so only real outliers will be indicated. If the value selected is too low, samples that are not real outliers will be indicated as such. If the value is set too high, some real outliers may be missed.

The sensitivity setting for C is the maximum acceptable standard deviation for each set of sub samples. The appropriate value for this parameter, as well as the appropri ate values for A and B parameters, are determined when the calibration is developed. Values for the A,B, and C constants will be recommended for AMs supplied by Foss Analytical.

The low and high limits for D should be set according to the range for each constituent in the actual AM.

The following are some questions that should be asked concerning the outlier:

• How many of the samples give outliers?

• In which positions are the outliers (A, B, C, D or E)?

• What is the value of the outlier (1-5)?

• Have they had outlier indications on that type of sample before?

• Are the outlier indications reproducible?

• Is the used calibration the correct one?

Conditions that will cause a sample to be flagged as an outlier

• Scan data does not fit with the calibration

• The sample differs from the typical samples in the calibration

• Standard deviation between sub-sample predictions outside preset limit

• Sample outside calibration range

Possible causes for outliers

• Wrong sample analysed

• Variety not included in the calibration

• Extreme chemical composition

• Impure sample (has too much foreign material)

• Instrument error

• Sample too hot or too cold (i.e. sample is frozen)

Corrective actions in the event of an outlier

• Re-run the analysis and verify it to be a true outlier

• Check to see if the sample meets any of the criteria mentioned in the section “Possible causes for outliers” above. If so, take corrective measures.

• Use reference method (Wet chemistry) instead

4.1.5 Poor Reference Data

• Which laboratory was used?

• Was more than one laboratory used, and if so, were there level differences?

• Are there systematic errors lab to lab bias?

• What reference method was used?

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Infratec™ 1241 Grain Analyzer

• Were determinations made induplicated?

• How was sample selection performed?

• Was grinding performed?

• What is the reference methods reproducibility?

• Is the moisture basis the same in the laboratory results as in the Infratec results?

4.1.6 Instrument Problems

• The Measuring Unit compartment of the instrument should be kept as clean as possible. Do not forget to sometimes also clean the Detector Window on the Cell House and the Cell Window. By cleaning the instrument regularly you avoid excessive dust build-up and thereby you lower the risk of stoppage. For cleaning instructions, see User Manual.

• Do they have a reference set of samples that they measure frequently on the instrument? This should be done to see if the instrument has changed! What changes?

• How is the sub-sample standard deviation for each constituent?

• Does it change during the day?

• Do the results drift during the day? If so, how much and does this occur every day?

4.1.7 I2C Trouble Shooting

Infratec 1241 is basically a PC with some extra hardware to perform analysis. The hardware is connected to the PC via a two-wire bus called the I2C. This is a Phillips developed bus.

All communication (commands, analytical data, error messages) is performed through the bus. equipment is separate but connected to the bus. When the extra modules are connected the bus will detect the extra nodes (addresses) and open up the software to control them.

The instrument software can be divided into three levels, not counting the BIOS and the operating system. The top level is the ISW (instrument Software), which is handling all information to for example the display. The DSP software is controlling the I2C communication as well as being a co processor for mathematical treatment of the data signal. In certain modules there are software (firm ware) controlling low level tasks like opening and closing the shutter in the Measuring Unit.

When the power is turned on the BIOS at the processor starts working. After some seconds there is a beep as in a normal PC and then the operative system QNX (UNIX type) starts working. After some initiation the ISW starts and the DSP software is down loaded from the flash disc to the DSP processor and starts to run. About this time the signal to turn on the display is sent to the power supply via the I2C bus and information starts to flow showing the start up procedure.

Fig. 4:1 shows the bus and all connected equipment. Note that some

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Infratec™ 1241 Grain Analyzer

This table gives the approximate times for these events.

Service Manual 1001 5015 / Rev. 4 4:5

Infratec™ 1241 Grain Analyzer

Processor

Module

PC/104

External PC

Modem

Printer

Com1

Com 2

LPT1

DSP

Module

Fan

Flash

disk

+5V

+12V

GND

Display

Keypad

PROCESSOR MODULE BLOCK DIAGRAM

IDE

1241026a

+5V

DECODE

CONTROL

LED

CONTROL

Monochromator

Detector

TWM

PSM

Onboard LED's

Detector

ADC

Mono-

chromator

grating

DSP

1241021a

I2C

PC/104

FILTER

STM

1241010b

If the bus is corrupted in any way, the communication will not work. It is therefore possible to have a black display, when the error is actually in the I2C commun ication.

1 Lamp 7 Sample Cuvette 2 Lamp fiber (input) 8 Detector 3 Monochromator 9 PC Module 4 Output fiber 10 USB input/output 5 Measuring Unit 11 Keyboard 6 Conveyor Belt 12 Display

Fig. 4:1 I2C Communication

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Infratec™ 1241 Grain Analyzer

Fig. 4:2 Troubleshooting the I2C communication

Service Manual 1001 5015 / Rev. 4 4:7

Infratec™ 1241 Grain Analyzer

Fig. 4:3 I2C Bus in Infratec 1241

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Infratec™ 1241 Grain Analyzer

The following troubleshooting scheme is suggested. Situation: A black display or an error log with information pointing in different direc-

tions.

1. Disconnect all external equipment (STM, TWM) if present.

2. Disconnect the i2c cable from the PSU, monochromator, detector and MU to the DSP board. Attach a jumper on the open connector on the Display interconnection board or use an external monitor. Start the instrument and if the display starts up you should get 4 beeps and the following error message:

Error in Power Supply 32768(0505)

and in the hardware error log:

HL/12416729/2010-04-07 07:09:02/Name=String, "8000 - 505/fc0/0/1/2000/ 0/0/503".

Any other error message indicates an error in the DSP board. If the display stays black go to step 8.

3. Reattach the PSU i2c cable, remove the jumper on the display interconnection board and restart the instrument. The following error message should appear:

Checking Monoch. Comm failed selftest.

and in the hardware error log:

HL/12416729/2010-04-07 07:11:29/Name=String, "8000 - 105/fc0/0/1/2800/ 0/0/503"

Any other error message indicates an error in the PSU. A black display at this stage indicates a faulty display or interconnection board.

4. Reattach the monoc i2c cable and restart the instrument. The following error message should appear:

Checking Detector Comm failed selftest.

and in the hardware error log:

HL/12416729/2010-04-07 07:23:27/Name=String, "8000 - 202/fc2/0/1/2000/ 0/0/503"

Any other error message indicates an error in the monocromator.

5. Reattach the detector i2c cable and restart the instrument. The following error message should appear:

Checking Ambient Sensor Comm failed selftest.

and in the hardware error log:

HL/12416729/2010-04-07 07:28:27/Name=String, "8000 - 12/fc3/0/1/2000/0/ 0/503"

Any other error message indicates an error in the detector.

6. Reattach the MU i2c cable and restart the instrument. If you get an error message at this stage disconnect the ambient senor and the E-id from the MU and restart the instrument.

7. Reconnec t STM and TWM one at a time if prese nt. Restart the instrument and check for errors.

8. Measure the voltage on the connection JP3 blue wire on the power supply. It should be more then 4V. If the voltage is over 4V and the display still is black there is a problem in the display or the display interconnection board.

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Infratec™ 1241 Grain Analyzer

4.2 Service Menu

In order to troubleshoot an instrument, Service technicians will have to access the Service Menu. The Service Menu assume a more detailed knowledge about the In fratec 1241 Grain Analyzer. The Service Menu is therefore password protected. Password is only given to personnel approved by FOSS.

Most of the headings in the Service Menu have sub menus, see menu structure on next page.

Service menu for Infratec 1241

Level 1 Level 2 Level 3 Level 4 Comments

1 Quality Control

1 Self Test

1 Run Self-Test Run a Self-Test

2 Export Copy Start-Up test result or

3 Print Print Start-Up test result or

2 Clean Measuring Unit

3 Audit Log View latest log by user

4 Software Error Log

5 Hardware Error Log

6 Export Logs and Configuration

7 Wavelength Stability

8 Lamp Check Checks the condition of the

Self-Test result to a USB stick

Self-Test result

Prepare the cell for cleaning

View latest Software Error Log

View latest Hardware Error Log

View error logs or copy them to a USB stick

Testing the Monochromator Wavelength Stability

Monochromator lamp

2 Automatic Tests

3 Manual Tests

1 Detector

2 Monochromator

3 I/O

1 Detector

2 Monochromator

1 ADC No Missing Codes

2 Offset with Empty Cell

1 Grating System

2 Air Stability

3 Shutter

4 Internal BG20

5 External BG20

6 Reference Scan

7 Encoder Information

1 COM 1

2 COM 2

3 Lpt 1

4 Keyboard

5 External Keyboard

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Infratec™ 1241 Grain Analyzer

Level 1 Level 2 Level 3 Level 4 Comments

3 Measuring Unit

1 Position Setting

2 Sensors

3 Set Ambient Temperature

4 Display

5 Scan

6 Test Weight Greyed out if not installed

1 Position Settings

2 Calibrate

1 Balance Control

2 Mass Calibration

3 Adjust Balance

3 Test Weight Cycle

4 AD Values

5 Flush

7 Sample Transport Module

1 Position Settings Possibility to manually posi-

2 Service Test of sensors and motor

3 Exercise

8 Bottle Unit Greyed out on 1241

1 Position settings Possibility to manually posi-

2 Sensors Possibility to check the Bot-

Greyed out if not installed

tion the Cuvette Holder

tion the Bottle Unit

tle Unit position sensors

4 Manual Analysis Lengths, Speeds, Shutter

1 Settings

2 Fill Sample Cell

3 Scan

4 Offset

5 Empty Sample Cell

6 Flush Sample Cell

5 Instrument Info

1 Hardware Instrument version of DSP,

2 Software Software version

3 Bios Bios version

4 Monochromator Constants

5 Operating Temperature

6 Volume Information

7 Voltage Information

6 Clone Instrument Export of configuration for

Positions etc. can be set manually from here

Monochromator, Detector etc.

The O- and P-constants

Min. and Max. operating temperature

View available space on the database disk

modem, menu and lan guage

Service Manual 1001 5015 / Rev. 4 4:11

Infratec™ 1241 Grain Analyzer

Level 1 Level 2 Level 3 Level 4 Comments

7 Settings

1 Default Settings Resets the instrument to its

2 Scan Mode (Standard)

default settings

8 Read Disk Read contents of USB stick

and install possible options e.g. AM-s or programs

4.3 Quality Control

4.3.1 Self-test

Fig. 4:4 Self-test sub-menus

When the instrument is powered-up or when manually chosen, a Self-test is executed. The different tests take place in the order as they are specified in this section.

Screen Display

The PC-board is not capable to send screen display to both LCD and CRT. The default screen mode is LCD.

The LCD backlight is intentionally disabled at boot-up. It is enabled at the end of th e DSP initialization where the PSU initialization activates the IIB..

For troubleshooting purpose you can bypass the disabled backlight buy shortcircuiting the jumper JP3 on the Display Interconnection Board.

PC Board System Test and Initialization

These routines test and initialize PC board hardware. If the routines encounter an error during the tests, you will either hear a few short beeps or see an error message on the screen. There are two kind s of errors: fatal and non-fatal. The system can usually continue the boot up sequence with non-fatal errors. Non-fatal error messages usual ly appear on the screen along with the following instructions:

Press <F1> to RESUME Write down the message and press the F1 key to continue the boot up sequence.

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Infratec™ 1241 Grain Analyzer

PC Module System configuration verification

These routines check the current system configuration against the values stored in the CMOS memory. If they do not match, the program outputs an error message. You will then need to run the BIOS setup program to set the configuration information in memory.

There are three situations in which you will need to change the CMOS settings:

1. You are starting your sys tem for the first time

2. You have changed the hardware attached to your system

3. The CMOS memory has lost power and the configuration information has been erased.

The PC-board memory has an external lithium battery backup for data retention.

Power-up beeper and DSP LEDs

When the instrument is powered-up, there is a beeper function to notify if a failure in the instrument software start-up routine, or DSP software loading, has occurred:

•1 beep OK

• 2 beeps Could not open DSP device

• 3 beeps DSP communication failure

• 4 beeps LCD display enable failure (see Trouble Shooting scheme)

LEDs on the DSP First the power (green) is lit. After some time the LED 1 is lit. The DSP software is

now running. When the DSP software is communicating the LED 4 is flashing rap idly. At this state the display should be lit. For more information regarding the DSP LEDs see Technical Description.

Communication

Communications between the instrument software and the DSP board are first checked when the instrument is powered-up. Failure in the instrument software to

DSP communication is notified by a beeper signal, as described above. Then the I

C communications from the DSP to each hardware module (Monochromator comm., Detector comm., Measuring Unit comm. and PSM comm.) are tested. The detector temperature sensor and the ambient temperature sensor (placed on the hood) are also tested and reported as “True” or “False”.

NOTE: The "1241xxxx" written on each line symbolise the serial number of the instrument.

Line description including typical value Units

SelfTest/1241xxxx/Monoch./SerialNumber=String, T9010017 SelfTest/1241xxxx/Monoch./Comm=Bool, True bool SelfTest/1241xxxx/Detector/SerialNumber=String, 00000015

Min. limit

Max. limit

SelfTest/1241xxxx/Detector/Comm=Bool, True bool SelfTest/1241xxxx/TempSensor/ Comm=Bool, True bool SelfTest/1241xxxx/MU/Comm=Bool, True bool SelfTest/1241xxxx/PSM/Comm=Bool, True bool

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Infratec™ 1241 Grain Analyzer

Checking hardware

The check of communication and hardware is separated.

Voltage check

After checking the PSU hardware, a voltage check is performed.

Line description including typical value Units

SELFTEST/12411615/VoltageTest/+5=Number,4.96 Volt 4.5 5.5 SELFTEST/12411615/VoltageTest/+5.5=Number,5.58 Volt 5.0 6.0 SELFTEST/12411615/VoltageTest/+12=Number,11.95 Volt 11.2 12.8 SELFTEST/12411615/VoltageTest/-12=Number,-11.84 Volt -12.8 -11.2 SELFTEST/12411615/VoltageTest/+10.5=Number,3.11 Volt 10.0 11.0 SELFTEST/12411615/VoltageTest/Contrast=Number,-30.75 Volt -25 -15 SELFTEST/12411615/VoltageTest/Input=Number,29,87 Volt 20 45 SELFTEST/12411615/VoltageTest/Passed=Bool,True bool

Min. limit

Max. limit

This check is using the same accuracy as the voltage display in the service menu 5.7.

Monochromator

Grating system

The grating system functionality test checks the functionality of the grating shaft encoder. The test results report the maximum (positive) and the minimum (negative) encoder unlinearity when the grating makes a complete scan, and the total difference (i.e. max-min). The number of encoder pulses to complete a single revolution (for

ward and reverse) of the grating is also recorded, along with the time to complete the scan. The following table lists the names, typical values and limits for the above pa rameters.

Line description including typical value Units

SelfTest/1241xxxx/Monoch. /SerialNumber=String, T9010017 SelfTest/1241xxxx/Monoch. /Min=Number, -1.2 % >-22% SelfTest/1241xxxx/Monoch. /Max=Number, 1.2 % <+22% SelfTest/1241xxxx/Monoch. /Diff=Number, 2.4 % 50% SelfTest/1241xxxx/Monoch. /PulseCount=Number, 2880 real 2800 3400 SelfTest/1241xxxx/Monoch. /CycleTime=Number, 2.605 S 2.000 3.000

Min. limit

Max. limit

Checksum test of monochromator EEPROM

This test validates O- and P-constants, serial number of the Monochromator and peak value for internal BG20 filter. If the checksum does not match what is stored in the EEPROM, an error occur and the instrument will be unable to analyse.

Line description including typical value Units

SelfTest/1241xxxx/Monoch. /Checksum=Bool, True bool

Min. limit

Max. limit

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Infratec™ 1241 Grain Analyzer

Detector

ADC No Missing Codes

This test checks the ADC unlinearity and the missing codes. The result is presented as "True" or "False".

Line description including typical value Units

SelfTest/1241xxxx/Detector/SerialNumber=String, 00000015 SelfTest/1241xxxx/Detector/ADCNo MissingCodes=Bool, True bool

Min. limit

Max. limit

Detector Offset Test

Measures the offset voltage at the ADC input with no light falling on the detector, e.g. monochromator shutter closed. The detector gain is stepped up from 1*1 to 1000*16 with the minimum, maximum, mean ADC signal and standard deviation re corded for each gain setting, as shown in the table below. The detector temperature is recorded together with the ADC data.

Service Manual 1001 5015 / Rev. 4 4:15

Infratec™ 1241 Grain Analyzer

Line description including typical value Units

SelfTest/1241xxxx/Detector/SerialNumber=String, 00000015

SelfTest/1241xxxx/Detector/gain1/Min=Number, 499 bits 5 SelfTest/1241xxxx/Detector/gain1/Max=Number, 500 bits SelfTest/1241xxxx/Detector/gain1/Mean=Number, 500 bits 50 2000 SelfTest/1241xxxx/Detector/gain1/StdDev=Number, 0.4943 bits 2.0 SelfTest/1241xxxx/Detector/gain1/Temp=Number, 24 real 0 60

SelfTest/1241xxxx/Detector/gain2/Min=Number, 499 bits 5 SelfTest/1241xxxx/Detector/gain2/Max=Number, 500 bits SelfTest/1241xxxx/Detector/gain2/Mean=Number, 500 bits 50 2000 SelfTest/1241xxxx/Detector/gain2/StdDev=Number, 0.4943 bits 2.0 SelfTest/1241xxxx/Detector/gain2/Temp=Number, 24 real 0 60

SelfTest/1241xxxx/Detector/gain3/Min=Number, 499 bits 5 SelfTest/1241xxxx/Detector/gain3/Max=Number, 500 bits SelfTest/1241xxxx/Detector/gain3/Mean=Number, 500 bits 50 2000 SelfTest/1241xxxx/Detector/gain3/StdDev=Number, 0.4943 bits 2.0 SelfTest/1241xxxx/Detector/gain3/Temp=Number, 24 real 0

Min. limit

Max. limit

Comments

SelfTest/1241xxxx/Detector/gain4/Min=Number, 499 bits 5 SelfTest/1241xxxx/Detector/gain4/Max=Number, 500 bits SelfTest/1241xxxx/Detector/gain4/Mean=Number, 500 bits 50 2000 SelfTest/1241xxxx/Detector/gain4/StdDev=Number, 0.4943 bits 2.0 SelfTest/1241xxxx/Detector/gain4/Temp=Number, 24 real 0 60

SelfTest/1241xxxx/Detector/gain5/Min=Number, 498 bits 5 SelfTest/1241xxxx/Detector/gain5/Max=Number, 502 bits SelfTest/1241xxxx/Detector/gain5/Mean=Number, 500 bits 50 2000 SelfTest/1241xxxx/Detector/gain5/StdDev=Number, 0.4943 bits 2.0 SelfTest/1241xxxx/Detector/gain5/Temp=Number, 24 real 0 60

SelfTest/1241xxxx/Detector/gain6/Min=Number, 498 bits 5 SelfTest/1241xxxx/Detector/gain6/Max=Number, 502 bits SelfTest/1241xxxx/Detector/gain6/Mean=Number, 500 bits 50 2000 SelfTest/1241xxxx/Detector/gain6/StdDev=Number, 0.4943 bits 2.0 SelfTest/1241xxxx/Detector/gain6/Temp=Number, 24 real 0 60

SelfTest/1241xxxx/Detector/gain7/Min=Number, 498 bits 5 SelfTest/1241xxxx/Detector/gain7/Max=Number, 502 bits SelfTest/1241xxxx/Detector/gain7/Mean=Number, 500 bits 50 2000 SelfTest/1241xxxx/Detector/gain7/StdDev=Number, 0.4943 bits 2.0 SelfTest/1241xxxx/Detector/gain7/Temp=Number, 24 real 0 60

The standard deviation should be max.(see highlighted values).

One measurement (with closed shutter and lamp turned off) per gain step is performed, where 5000 points are read.

The criteria for this test is that the mean value in all steps should be between 50-2000. Measurements are made in 15 steps.

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Infratec™ 1241 Grain Analyzer

Line description including typical value Units Min. Max. Comments

SelfTest/1241xxxx/Detector/gain8/Min=Number, 495 bits 5 SelfTest/1241xxxx/Detector/gain8/Max=Number, 505 bits SelfTest/1241xxxx/Detector/gain8/Mean=Number, 500 bits 50 2000 SelfTest/1241xxxx/Detector/gain8/StdDev=Number, 0.8220 bits 3.0 SelfTest/1241xxxx/Detector/gain8/Temp=Number, 24 real 0 60

SelfTest/1241xxxx/Detector/gain9/Min=Number, 495 bits 5 SelfTest/1241xxxx/Detector/gain9/Max=Number, 505 bits SelfTest/1241xxxx/Detector/gain9/Mean=Number, 500 bits 50 2000 SelfTest/1241xxxx/Detector/gain9/StdDev=Number, 0.8220 bits 3.0 SelfTest/1241xxxx/Detector/gain9/Temp=Number, 24 real 0 60

SelfTest/1241xxxx/Detector/gain10/Min=Number, 495 bits 5 SelfTest/1241xxxx/Detector/gain10/Max=Number, 505 bits SelfTest/1241xxxx/Detector/gain10/Mean=Number, 500 bits 50 2000 SelfTest/1241xxxx/Detector/gain10/StdDev=Number, 0.8848 bits 4.0 SelfTest/1241xxxx/Detector/gain10/Temp=Number, 24 real 0 60

SelfTest/1241xxxx/Detector/gain11/Min=Number, 492 bits 5 SelfTest/1241xxxx/Detector/gain11/Max=Number, 508 bits SelfTest/1241xxxx/Detector/gain11/Mean=Number, 500 bits 50 2000 SelfTest/1241xxxx/Detector/gain11/StdDev=Number, 1.0310 bits 5.0 SelfTest/1241xxxx/Detector/gain11/Temp=Number, 24 real 0 60

SelfTest/1241xxxx/Detector/gain12/Min=Number, 490 bits 5 SelfTest/1241xxxx/Detector/gain12/Max=Number, 525 bits SelfTest/1241xxxx/Detector/gain12/Mean=Number, 510 bits 50 2000 SelfTest/1241xxxx/Detector/gain12/StdDev=Number, 3.0721 bits 9.0 SelfTest/1241xxxx/Detector/gain12/Temp=Number, 24 real 0 60

SelfTest/1241xxxx/Detector/gain13/Min=Number, 525 bits 5 SelfTest/1241xxxx/Detector/gain13/Max=Number, 650 bits SelfTest/1241xxxx/Detector/gain13/Mean=Number, 575 bits 50 2000 SelfTest/1241xxxx/Detector/gain13/StdDev=Number, 6.1721 bits 17.0 SelfTest/1241xxxx/Detector/gain13/Temp=Number, 24 real 0 60

SelfTest/1241xxxx/Detector/gain14/Min=Number, 525 bits 5 SelfTest/1241xxxx/Detector/gain14/Max=Number, 750 bits SelfTest/1241xxxx/Detector/gain14/Mean=Number, 650 bits 50 2000 SelfTest/1241xxxx/Detector/gain14/StdDev=Number, 18.6891 bits 30.0 SelfTest/1241xxxx/Detector/gain14/Temp=Number, 24 real 0 60

The standard deviation should be max.(see highlighted values).

One measurement (with closed shutter and lamp turned off) per gain step is performed, where 5000 points are read.

The criteria for this test is that the mean value in all steps should be between 50-2000. Measurements are made in 15 steps.

SelfTest/1241xxxx/Detector/gain15/Min=Number, 500 bits 5 SelfTest/1241xxxx/Detector/gain15/Max=Number, 1000 bits SelfTest/1241xxxx/Detector/gain15/Mean=Number, 700 bits 50 2000 SelfTest/1241xxxx/Detector/gain15/StdDev=Number, 25.6891 bits 60.0 SelfTest/1241xxxx/Detector/gain15/Temp=Number, 24 real 0 60

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Infratec™ 1241 Grain Analyzer

Checksum test of detector EEPROM

This test validates the serial number and gain settings. If the checksum does not match what is stored in the EEPROM, an error occur and the instrument disables analysis

Line description including typical value Units

SelfTest/1241xxxx/Detector /Checksum=Bool, True bool

Min. limit

Max. limit

Air stability

This test checks the stability of the air reference scans after power-up. The test checks the level of the reference scan and reports test “Failed” if it is outside limits (15000<Max level<65280). If the test fails due to the reference scan limits, the result will only show one row displaying the ADC level.

The difference between two succeeding groups of 6 scans are calculated and should not exceed the limit 100. The first rows indicate the level of the reference scan at the start of the test, because the first differences are calculated against a zero value. If the difference is >100 another group of 6 scans are calculated against the previous group and again the difference should be below 100. There is always a 10 second delay be tween the groups. This continues until the difference is less than 100 or a time limit of 20 minutes is reached. The minimum number of steps is 13.

Line description including typical value Units Min. Max.

SelfTest/1241xxxx/Stability/1/MaxDiff=Number, 56532 bits 15000 65280* SelfTest/1241xxxx/Stability/1/MaxDiff=Number, 56512 bits 15000 65280 ...more bits 15000 65280 SelfTest/1241xxxx/Stability/2/MaxDiff=Number, 450 bits 100 SelfTest/1241xxxx/Stability/3/MaxDiff=Number, 225 bits 100 SelfTest/1241xxxx/Stability/4/MaxDiff=Number, 120 bits 100 SelfTest/1241xxxx/Stability/5/MaxDiff=Number, 90 bits 100

* Level of reference scan, calculated against zero vector.

Monochromator Wavelength Stability

Wavelength stability is measured by calculating the 2

absorbency peak from the internal BG20 filter. Measurements are made on ten subsamples. The mean value of the peaks is then compared to the one stored in the monochromator EEPROM. The mean, maximum, minimum, standard deviation and difference are displayed on the screen. The difference between the measured wavelength and the stored wavelength is presented as Peak

Diff. The maximum limit is +/- 1nm (one),

if the value is outside the limits, an error message is created.

Line description including typical value Units Min. Max.

SelfTest/1241xxxx/Monoch. /SerialNumber=String, T9010017 SelfTest/1241xxxx/Monoch. /I/Peak2Mean=Number, 879.82 real SelfTest/1241xxxx/Monoch. /I/Peak2Min=Number, 879.61 real SelfTest/1241xxxx/Monoch. /I/Peak2Max=Number, 879.90 real SelfTest/1241xxxx/Monoch. /I/Peak2Std=Number, 0.02 real -1nm +1nm SelfTest/1241xxxx/Monoch. /I/Peak2Diff=Number, 0.07 real -1nm +1nm

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Infratec™ 1241 Grain Analyzer

Test Results report

Once the Self-test is completed a report line is given the overall "Passed/Failed" status of each of the communication, monochromator, detector, air stability and monochromator wave length tests. The date and time of the Self-test is also shown. There will be a report on the screen with the test result as below.

The details from each test could be viewed by choosing one of the individual tests. When the Self-test is done at start-up, the test report will only be shown if one or more of the tests have "Failed". For detailed information of the Self-test, the test must be exported.

Line description including typical value Units Min. Max.

SelfTest/1241xxxx/Name=Date, 1999-12-16 16:43:31 date SelfTest/1241xxxx/MonochromatorTest=Bool, True bool SelfTest/1241xxxx/DetectorTest=Bool, True bool SelfTest/1241xxxx/StabilityTest/Number=Bool, True bool SelfTest/1241xxxx/WavelengthStabilityTest/Number=Bool, True bool

Fig. 4:5 Clean Measuring Unit

4.3.2 Clean Measuring Unit

Makes the instrument run a sequence for cleaning of the cell. This should be done on daily basis. This function can also be reached from the User Menu.

4.3.3 Audit Log

Displays the audit trail log. When choosing the Export Logs and configuration option an “1241xxxx.al“ file is created, see Appendix “Logs Description” in User Manual.

4.3.4 Software Error Log

Displays the software Error log. The information in the software log file is basically the messages that the operator sees on the display. The time stamps in this log can many times be matched to the timestamps in the hardware log and thus give more in formation when you are troubleshooting. Note that the software log information is always in English despite the selected language.

When choosing the Disk option an “xxxxxxxx.sl” file is created.

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Infratec™ 1241 Grain Analyzer

4.3.5 Hardware Error Log

Fig. 4:6

Displays the hardware Error log. When choosing the Disk option an “xxxxxxxx.h l” file is created. For decoding of the Hardware error log, see

4.12.

4.3.6 Export Logs and Configuration

Exports the record of errors that occurred during analysis, and the instrument configuration, to a USB memory stick. For decoding of the Export logs, see 4.13.

4.3.7 Wavelength Stability

Tests and displays the monochoromator wavelength stability, see 4.3.1.

4.3.8 Lamp Check

Displays the intensity of the lamp. Measured value is presented for gain 1x2.

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Infratec™ 1241 Grain Analyzer

4.4 Automatic Tests

From here all of the tests carried out in the Self-test routine can be executed individually. The test results are presented in the same way as described in section Self-test, with an option to save to disk.

Fig. 4:7 Automatic Tests

4.4.1 Detector

Fig. 4:8 Detector Tests

ADC No Missing Codes

Identical to the "ADC No Missing Codes" test carried out in the Self-test routine.

Offset with Empty Cell

Identical to the "Detector Offset" test carried out in the Self-test routine.

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Infratec™ 1241 Grain Analyzer

4.4.2 Monochromator

Fig. 4:9 Monochromator Tests

Grating System

Identical to the "Grating System" test carried out in the Self-test routine.

Air Stability

Almost identical to the "Air stability test" test carried out in the Self test routine, with one exception: This test has an option to break the test by using the Stop function that makes it possible to go on measuring stability after the test has passed. On the screen the maximum difference values are shown together with the incremental values and the scan peak value.

Shutter

The Shutter test consists of two parts: The first is checking the repeatability of the shutter positioning and the second is measuring the light leakage. For the shutter repeatability positioning, a reference scan is taken with the lamp on and shutter open. A new scan is taken after the shutter is closed. Then a third scan after the shutter is reopened again. The difference between the first and third scan has to be below limit. Failure can be viewed on screen and logged to Error log.

For the Light Leakage test the shutter is now closed again and a fourth scan is taken. The second and fourth scans must also be within limits. The max. and min. levels of the second and fourth scans must also be within limits. The lamp is then turned off (shutter still closed) and a fifth scan is taken. The differ ence between the fourth and fifth scan must be within limits. Failure can be viewed on screen and logged to Error log.

Line description including typical value Units Min. Max.

SelfTest/1241xxxx/Monoch./SerialNumber=String, T9010017 SelfTest/1241xxxx/Monoch./Ref/Max=Number, 56532 bits SelfTest/1241xxxx/Monoch./ShutterOpen/Diff=Number, 10 bits -100 100 SelfTest/1241xxxx/Monoch./ShutterClosed/Diff=Number, 15 bits -100 100 SelfTest/1241xxxx/Monoch./ShutterClosed/Level=Number, 510 bits 50 2000 SelfTest/1241xxxx/Monoch./ShutterLeakage/Diff=Number, 15 bits -100 100

Internal BG20

Identical to the "Monochromator Wavelength Stability" test carried out in the Selftest routine. The same limits are used.

External BG20

With this test it is possible to compare one master BG20 filter with the results from the internal BG20 filter test. Insert a permanent sample with a BG20 glass filter in

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Infratec™ 1241 Grain Analyzer

the measuring unit when prompt for. Ten sub samples are taken and the 2nd peak is detected and displayed on the screen.

Line description including typical value Units Min. Max.

SelfTest/1241xxxx/Monoch./SerialNumber=String, T9010017 SelfTest/1241xxxx/Monoch./E/Peak2Mean=Number, 879.82 real SelfTest/1241xxxx/Monoch./E/Peak2Min=Number, 879.61 real SelfTest/1241xxxx/Monoch./E/Peak2Max=Number, 879.90 real SelfTest/1241xxxx/Monoch./E/Peak2Std=Number, 0.02 real SelfTest/1241xxxx/Monoch./E/Peak2Diff=Number, 0.07 real

Reference Scan

A reference scan is taken and the maximum level of the scan is displayed. No software error indication on a scan level failure. The raw data values can be exported to disk by choosing the Disk option.

Line description including typical value Units Min. Max.

SelfTest/00000000/Monoch./Ref/Max=Number, 56532 Bits 30000 65536

4.4.3 I/0 (Input/Output)

Fig. 4:10 Input/Output Tests

COM1 / COM2 / LPT1

It is possible to test communication ports and parallel ports by using loop-back connectors.

1001 0301 Loop-back connector Serial 1001 0302 Loop-back connector Parallel (printer)

For COM 1 and COM2 always make sure that you use the standard (Default) settings for modem and serial line before starting this test. This is changed in User Menu: Instrument settings → View → Communication → Communication settings (1 Set Modem) (2 Set Serial). Choose “Default Modem RS232“ in Set Modem. Restart the instrument before starting the loop-back test. Choose “Default Direct RS232“ in Set Modem. Transmitted data values are 0x00-0xFF.

LPT1 One byte written and read back.

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Infratec™ 1241 Grain Analyzer

The test runs the ports individually as chosen in the "I/0" menu. If any error occur this is reported to screen and Error log.

Line description including typical value Units Min. Max.

SelfTest/00000000/PCBoard/COMParallel=Bool, True bool SelfTest/00000000/PCBoard/COM1Serial=Bool, True bool SelfTest/00000000/PCBoard/COM2Serial=Bool, True bool

Keyboard

The test is going through every key from upper left to down right by stating which key to press. When the correct key is pressed the next key is stated. If no key is detected within 10 seconds from last pressed key, the test aborts. If aborted, this will be logged to Error log with the message on which key that should be pressed when the sequence was aborted.

External Keyboard

The test shows which key on the external keyboard that is pressed at the moment. If no key is detected within 10 seconds after the last pressed key, the test aborts without any Error log message.

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Infratec™ 1241 Grain Analyzer

4.5 Manual Tests

To exercise all of the instrument low-level hardware commands. All the tests below are addressed one by one and performed in manual order.

Fig. 4:11 Manual Tests

4.5.1 Detector

Available options:

• Set Gain value

• Read Gain value

• Read detector temperature

Gain Pre Gain Main Gain Total Gain

1 1 1 1x1

2 1 2 1x2

3 1 4 1x4

4 1 8 1x8

5 1 16 1x16

6 31 1 31x1

7 31 2 31x2

8 31 4 31x4

9 31 8 31x8

10 31 16 31x16

11 1000 1 1000x1

12 1000 2 1000x2

13 1000 4 1000x4

14 1000 8 1000x8

15 1000 16 1000x16

4.5.2 Monochromator

Available options:

• Set shutter position

• Read shutter position

• Set lamp On/Off

• Set grating motor On/Off

Service Manual 1001 5015 / Rev. 4 4:25

4.5.3 Measuring Unit

Fig. 4:12 Measuring Unit Tests

Position Setting

Available options:

• Set path length

• Set bottom shutter Open/Closed

• Set top shutter Open/Closed

• Set conveyor belt On/Off

Infratec™ 1241 Grain Analyzer

Sensors

Available options:

• Read ambient temperature (Calculated using the ambient temp. sensor in the

hood together with the detector temp. sensor)

• Read speckle detectors

• Read drawer sensor

• Read internal temperature (Using the temp. sensor on the Measuring Unit board)

Set Ambient Temperature

Possibility to force the ambient temperature input to an arbitrary value. The ambient temperature value will return to real values if the "Set Ambient temperature" is set to "0.0" or if the "Default Settings" command is executed or if the instrument is restarted. Used to temporarily bypass the calculations mentioned under Position Settings and Sensors.

4.5.4 Display

Available options:

• Set display On/Off

• Set back-light On/Off

• Adjust display contrast value

4.5.5 Scan

To collect a scan with the present settings and return the maximum value together with the option to save scan data values on disk or cancel. The raw data values can be exported to disk by choosing the Disk option.

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Infratec™ 1241 Grain Analyzer

4.5.6 Test Weight

Fig. 4:13 Test Weight

Position Settings

This function is for testing of the Wiper, Shutter and Sensor.

Calibrate

– Balance Control; This function can also be reached from the User Menu. Instructions given on the display. – Mass Calibration; Instructions given on the display. Use two weights with good accuracy and two decimals. The result is stored in the EEPROM of the TWM. – Adjust Balance; Should only be used after discussion with Product specialist at FOSS.

Test Weight Cycle

This function runs a complete Test weight cycle (sequence) but with possibilities to check part sequences and continue. The raw data will be presented on the display to gether with the calculated value. It is possible to catch the sample in the cuvette and measure on another scale of sufficient accuracy.

AD Values

Continues reading of AD values with an interval of 10 seconds.

Flush

This function empties the hopper content into the drawer.

4.5.7 Sample Transport Module

Position Settings

Possibility to manually position the Cuvette Holder.

Service

Test of sensors and motor. Can be used to run the motor up and down.

Exercise

No use for this option on the field.

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Infratec™ 1241 Grain Analyzer

4.6 Manual Analysis

Fig. 4:14 Manual Analysis

4.6.1 Settings

The parameters used in the manual analysis sequence:

• Set path length

• Set fill speed

• Set flush speed

4.6.2 Fill Sample Cell

Fills the measuring unit sample cell at the speed pre-set in settings.

4.6.3 Scan

Collects a scan at a gain and a shutter position chosen in the window popped up when choosing Scan. When scanning is finished the maximum value of the scan will be displayed together with options to save the scan data values on Disk or Cancel.

4.6.4 Offset

Calculates the offset at the present gain. The gain can be set manually in Manual Tests→Detector. The offset value is displayed with the present settings, together with the maximum, minimum, standard deviation and detector tempera ture. There is an option to save the offset value to Disk or Cancel.

4.6.5 Empty Sample Cell

Empties the measuring unit sample cell.

4.6.6 Flush Sample Cell

Flushes the measuring unit sample cell and the hopper at the speed pre-set in settings.

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Infratec™ 1241 Grain Analyzer

4.7 Instrument Info

Fig. 4:15 Instrument Info

4.7.1 Hardware

Displays the following:

• DSP software version

• Monochromator software version and serial number

• Detector serial number

• Measuring unit software version

• Optional module and serial number

4.7.2 Software

Displays the different instrument software module versions.

4.7.3 BIOS

Displays the BIOS information.

4.7.4 Monochromator Constants

Displays the O- and P-constant and internal BG20 peak values on the screen.

4.7.5 Operating Temperature

Displays the min. and max. operating temperatures which the instrument is intended to work within. The digits can not be changed.

4.7.6 Volume Information

The Flash disk is partitioned in three parts, 5 Mb for the operative system, 5 Mb for the ISW. The remaining space is for data.

4.7.7 Voltage Information

See Voltage Check in section 4.3.1.

4.8 Clone Instrument

For copying of an instrument´s settings and transfer them to another instrument. Put a USB stick in the disk drive of the instrument which settings you wish to copy. After finished copying, put the USB stick in the other instrument and run function Read Disk. A script file will automatically adjust its settings to the ones on the USB stick. IP number and TWM calibration will only be cloned to disk (not copied to the next instrument). These settings has to be handled in other ways.

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Infratec™ 1241 Grain Analyzer

4.9 Settings

4.9.1 Default Settings

To be able to return to a normal instrument status the "Default Settings" command sets the instrument to the following status:

Monochromator lamp On Grating motor On Shutter Open Detector gain 1x1 Initialise Measuring Unit Set Ambient temperature 0.0

4.9.2 Scan Mode (Standard)

Switches to the extended wavelength mode. Allows measurement in the wavelength range 570 - 1100nm.

4.10 Read Disk

Imports updates and application models from a USB memory stick.

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Infratec™ 1241 Grain Analyzer

4.11 Error Codes in Software Log (SL) and Hardware Log (HL)

When reviewing the SL and HL log files it's a good idea to look at the two files simultaneously. Try to compare the entries using the time stamps. This way you will many times get a better understanding because you can see both what the customer reported (SL) and what command was sent at the same time. In the HL file you will also see the status reported back by the module that was addressed.

SL Error

HL Error

Message to the User (What possibly can be done before contacting Service)

Comments Note

32768 0x8000 Hardware error. See

4.11.7

33025 0×8101 Grating motor error. Monochromator Motor cannot

move.

33026 0×8102 Monochromator EEPROM er-

ror.

The Monochromator was not able to save constants in its EEPROM.

33027 0x8103 Monochromator EEPROM er-

Problems to read/write.

ror. 33028 0x8104 Detector EEPROM error. 33029 0x8105 Monochromator EEPROM er-

Data in PROM outside limits.

ror. 33283 0x8203 Offset (darkness) is too high.

Max offset error > 2000 bits. Make sure the right hand Door and the Hopper are closed and retry analysis.

33284 0x8204 Offset (darkness) is too low.

Contact support.

Min offset error < 50 bits in

offset.

33285 0x8205 Number of ADC reads in error 33287 0x8207 Overrun error The detector receives to much

light, it gets oversaturated.

Maybe there is a need for an

aperture, read more in section

5.2.6 and TN 1355.

33289 0x8209 Gain is stepped too far down

(i.e. Tries to go be low gain

1*1).

33291 0x820B Analysis cancelled, Max time

Instrument time out error. exceeded.

33292 0x820C Reference scan light level is

too low. Check the lamp and clean the Cell. More informa

Reference scan is below its

limits (<15000 at gain 1*1,

<30000 at gain 1*2). tion is to be found in User Manual

33293 0x820D Too few valid samples collect-

ed.

33294 0x820E Monoc shutter error Monochromator shutter cannot

move.

See

4.11.8

See

4.11.9 See

4.11.10

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Infratec™ 1241 Grain Analyzer

SL Error

HL Error

Message to the User (What possibly can be done before contacting Service)

Comments Note

33538 0x8302 TWM operation mode switch. 33539 0x8303 TWM EEPROM error Problems to read/write the data

in the PROM

33540 0x8304 TWM EEPROM error Slope data outside limits. try to

re calibrate the balance. 34050 0x8502 Lamp On/Off error. 34051 0x8503 Set display On/Off error. 34052 0x8504 Set back light On/Off error. 34053 0x8505 Set contrast On/Off error. 1 0x0001 Instrument communication er-

ror.

2 0x0002 Detector ADC error There is no signal from the De-

tector Board. 4 0x0004 Monochromator grating error. See

4.11.1

22 0x0016 Measuring Unit TWM data

range error (invalid data)

See

4.11.2

32 0x0020 Cell blocked error Sample Cell is dirty. Analysis

cancelled. Empty and clean the

See

4.11.3 Cell using the flush function on the Task Bar. More informa

tion is to be found in User Manual

64 0x0040 More sample required. More

sample is needed to fill up the

Displayed if the Application Model allows refill.

Sample Cell.

128 0x0080 Path Length error. See

4.11.4

512 0x0200 Speckle function error. See

4.11.5

1024 0x0400 Warning! Drawer not in place. If the drawer is in place and

you still get this warning, then check the Drawer sensor.

2048 0x0800 TWM shutter error. 4096 0x1000 TWM wiper error. 8192 0x2000 TWM not full. 16384 0x4000 TWM load cell error. See

4.11.6

32768 0x8000 TWM EEPROM error.

Failed to read Hopper temperature sensor.

4242 0x1092 User abort

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Foss Infratec 1241 Service Manual

Specifications and Main Features

Frequently Asked Questions

User Manual

1 Important Instructions

1.1 General

1.2 Service Documents

1.3 Self-Service Support

1.4 Contacting Customer Support

1.5 ESD Information

1.6 Precautions

2 Technical Description

2.1 History

2.2 Component Descriptions

2.2.1 PC-Module

2.2.2 Processor Board

2.2.3 DSP Board

2.2.4 CompactFlash Disk

2.2.5 Monochromator

2.2.6 Lamp Module

2.2.7 Detector

2.2.8 Power Supply

2.2.9 LCD Display

2.2.10 Display Interconnection Board

2.2.11 Electronic ID

2.2.12 TWM (Optional)

2.2.13 STM (Optional)

2.2.14 Remote I/O (Optional)

2.3 Software Description

3 Installation

3.1 General

3.2 Installation of Test Weight Module on Infratec 1241 Generation 2

3.2.1 Preparation of the Infratec for assembly

3.2.2 Preparation of the Test Weight Module for assembly

3.2.3 Final assembly of Infratec and Test Weight Module into a complete assembly

3.3 Installation of Test Weight Module on Infratec 1241 Generation 3

3.4 Installation of Sample Transport Module

3.5 Mosaic Connection

4 Diagnostics and Troubleshooting

4.1 General

4.1.1 Poor Results

4.1.2 User Problems

4.1.3 Poor Calibrations

4.1.4 Outliers

4.1.5 Poor Reference Data

4.1.6 Instrument Problems

4.1.7 I2C Trouble Shooting

4.2 Service Menu

4.3 Quality Control

4.3.1 Self-test

4.3.2 Clean Measuring Unit

4.3.3 Audit Log

4.3.4 Software Error Log

4.3.5 Hardware Error Log

4.3.6 Export Logs and Configuration

4.3.7 Wavelength Stability

4.3.8 Lamp Check

4.4 Automatic Tests

4.4.1 Detector

4.4.2 Monochromator

4.4.3 I/0 (Input/Output)

4.5 Manual Tests

4.5.1 Detector

4.5.2 Monochromator

4.5.3 Measuring Unit

4.5.4 Display

4.5.5 Scan

4.5.6 Test Weight

4.5.7 Sample Transport Module

4.6 Manual Analysis

4.6.1 Settings

4.6.2 Fill Sample Cell

4.6.3 Scan

4.6.4 Offset

4.6.5 Empty Sample Cell

4.6.6 Flush Sample Cell

4.7 Instrument Info

4.7.1 Hardware

4.7.2 Software

4.7.3 BIOS