The SPT7863 is a 10-bit monolithic, low-cost, ultralowpower analog-to-digital converter capable of minimum
word rates of 40 MSPS. The on-chip track-and-hold function assures very good dynamic performance without the
need for external components. The input drive requirements are minimized due to the SPT7863’s low input
capacitance of only 5 pF.
Po wer dissipation is e xtremely lo w at only 160 mW typical
at 40 MSPS with a power supply of +5.0 V. The digital outputs are +3 V or +5 V, and are user selectable. The
APPLICATIONS
• All high-speed applications where low power
dissipation is required
• Video imaging
• Medical imaging
• Radar receivers
• IR imaging
• Digital communications
SPT7863 is pin-compatible with an entire family of 10-bit,
CMOS converters (SPT7835/40/50/55/60/61), which simplifies upgrades. The SPT7863 has incorporated proprietary circuit design and CMOS processing technologies to
achieve its adv anced performance. Inputs and outputs are
TTL/CMOS-compatible to interface with TTL/CMOS logic
systems. Output data f o rmat is straight binary.
The SPT7863 is available in 28-lead SOIC and 32-lead
small (7 mm square) TQFP packages over the commercial temperature range.
BLOCK DIAGRAM
Timing
and
1:16
Mux
P1
P2
.
.
.
P15
P16
A
CLK In
Enable
Data
Valid
Ref
IN
Control
In
ADC Section 1
T/H
ADC Section 2
.
.
.
ADC Section 15
ADC Section 16
T/H
Auto-
Zero
CMP
Auto-
Zero
CMP
Reference Ladder
11-Bit
SAR
DAC
11-Bit
SAR
11
DAC
11
11
11
.
.
.
V
REF
.
.
.
11
11
11-Bit
16:1
Mux/
Error
Correction
D10 Overrange
D9 (MSB)
D8
D7
D6
D5
D4
D3
D2
D1
D0 (LSB)
ABSOLUTE MAXIMUM RATINGS (Beyond which damage may occur)1 25 °C
Supply Voltages
AVDD......................................................................+6 V
Output
Digital Outputs ...................................................10 mA
DVDD.....................................................................+6 V
Temperature
Input Voltages
Analog Input .............................. –0.5 V to AVDD +0.5 V
..............................................................0 to AV
V
REF
CLK Input ............................................................... V
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications
are guaranteed. The Test Level column indicates the specific device testing actually performed during production and Quality Assurance inspection. Any blank section in the data
column indicates that the specification is not
tested at the specified condition.
LEVELTEST PROCEDURE
I100% production tested at the specified temperature.
II100% production tested at TA = +25 °C, and sample tested at the
specified temperatures.
IIIQA sample tested only at the specified temperatures.
IVParameter is guaranteed (but not tested) by design and characteri-
zation data.
VParameter is a typical value for information pur poses only.
VI100% production tested at TA = +25 °C. Parameter is guaranteed
over specified temperature range.
SPT7863
38/21/01
SPECIFICATION DEFINITIONS
APERTURE DELAY
Aperture delay represents the point in time, relative to the
rising edge of the CLOCK input, that the analog input is
sampled.
APERTURE JITTER
The variations in aperture delay for successive samples.
CLOCK DUTY CYCLE
Ratio of positive clock time (tCH) to total clock period (t
CLK
times 100%.
t
Duty Cycle =
t
CLK
CH
X 100%
DIFFERENTIAL GAIN (DG)
A signal consisting of a sine wave superimposed on various DC levels is applied to the input. Diff erential gain is the
maximum variation in the sampled sine wave amplitudes
at these DC levels.
DIFFERENTIAL PHASE (DP)
A signal consisting of a sine wave superimposed on various DC levels is applied to the input. Differential phase is
the maximum variation in the sampled sine wave phases
at these DC levels .
EFFECTIVE NUMBER OF BITS (ENOB)
SINAD = 6.02N + 1.76, where N is equal to the effective
number of bits.
SINAD – 1.76
N =
6.02
DIFFERENTIAL LINEARITY ERROR (DLE)
Error in the width of each code from its theoretical value.
(Theoretical = V
FS
/2N)
INTEGRAL LINEARITY ERROR (ILE)
Linearity error refers to the deviation of each individual
code (normalized) from a straight line drawn from –FS
through +FS. The deviation is measured from the edge of
each particular code to the true straight line.
)
OUTPUT DELAY
Time between the clock’s triggering edge and output data
valid.
OVERVOLTAGE RECOVERY TIME
The time required for the ADC to recover to full accuracy
after an analog input signal 125% of full scale is reduced
to 50% of the full-scale value.
SIGNAL-TO-NOISE RATIO (SNR)
The ratio of the fundamental sinusoid power to the total
noise power. Harmonics are excluded.
SIGNAL-TO-NOISE AND DISTORTION (SINAD)
The ratio of the fundamental sinusoid power to the total
noise and distortion power.
TOTAL HARMONIC DISTORTION (THD)
The ratio of the total power of the first 9 harmonics to the
power of the measured sinusoidal signal.
SPURIOUS FREE DYNAMIC RANGE (SFDR)
INPUT BANDWIDTH
Small signal (50 mV) bandwidth (3 dB) of analog input
stage.
The ratio of the fundamental sinusoidal amplitude to the
single largest harmonic or spurious signal.
SPT7863
48/21/01
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