Fairchild Semiconductor SI9934DY Datasheet

Si9934DY
Dual P-Channel 2.5V Specified PowerTrench

MOSFET
Si9934DY
January 2001
This P-Channel 2.5V specified MOSFET is a rugged gate version of Fairchild Semiconductor’s advanced PowerTrench process. It has been optimized for power management applications with a wide range of gate drive voltage (2.5V – 12V).
Applications
Load switch
Motor drive
DC/DC conversion
Power management
D1
D
D1
D
D2
D
D2
D
SO-8
Pin 1
SO-8
S2
Absolute Maximum Ratings T
G1
G
S1
S
G2
S
S
=25oC unless otherwise noted
A
Features
–5 A, –20 V, R R
Extended V
Low gate charge
High performance trench technology for extremely
low R
High power and current handling capability
GSS
DS(ON)
5 6 7 8
= 50 m @ VGS = –4.5 V
DS(ON)
= 74 m @ VGS = –2.5 V
DS(ON)
range (±12V) for battery applications
4
Q1
Q2
3 2 1
Symbol Parameter Ratings Units
V
DSS
V
GSS
I
D
P
D
TJ, T
STG
Drain-Source Voltage Gate-Source Voltage Drain Current – Continuous (Note 1a)
– Pulsed Power Dissipation for Dual Operation 2 Power Dissipation for Single Operation (Note 1a) 1.6
(Note 1b) (Note 1c)
Operating and Storage Junction Temperature Range –55 to +175
–20 ±12
–5
–30
1
0.9
V V A
W
°C
Thermal Characteristics
R
θJA
R
θJC
Thermal Resistance, Junction-to-Ambient (Note 1a) 78 Thermal Resistance, Junction-to-Case (Note 1) 40
Package Marking and Ordering Information
Device Marking Device Reel Size Tape width Quantity
9934 Si9934DY 13’’ 12mm 2500 units
2001 Fairchild Semiconductor International
°C/W °C/W
Si9934DY Rev A(W)
Si9934DY
Electrical Characteristics T
= 25°C unless otherwise noted
A
Symbol Parameter Test Conditions Min Typ Max Units Off Characteristics
BV
DSS
BVDSST
J
I
DSS
I
GSSF
I
GSSR
Drain–Source Breakdown Voltage Breakdown Voltage Temperature
Coefficient Zero Gate Voltage Drain Current Gate–Body Leakage, Forward Gate–Body Leakage, Reverse
V
= 0 V, ID = –250 µA
GS
ID = –250 µA, Referenced to 25°C V
= –16 V, VGS = 0 V –1
DS
V
= –12 V, VDS = 0 V –100 nA
GS
V
= 12 V, VDS = 0 V 100 nA
GS
–20 V
–16
mV/°C
On Characteristics (Note 2)
V
GS(th)
VGS(th)T
J
R
DS(on)
I
D(on)
g
FS
= VGS, ID = –250 µA
Gate Threshold Voltage Gate Threshold Voltage
V
DS
ID = –250 µA, Referenced to 25°C
Temperature Coefficient
V
= –4.5 V, ID = –5 A
Static Drain–Source On–Resistance
On–State Drain Current
GS
= –2.5 V, ID = –3 A
V
GS
= –4.5 V, ID = –5, TJ=125°C
V
GS
V
= –4.5 V, VDS = –5 V –15 A
GS
Forward Transconductance VDS = –5 V, ID = –5 A 13 S
–0.6 –1.0 –1.5 V
3
36 56 49
50 74 80
mV/°C
m
Dynamic C haracteristics
C
iss
C
oss
C
rss
Input Capacitance 1015 pF Output Capacitance 446 pF Reverse Transfer Capacitance
V
= –10 V, V
DS
f = 1.0 MHz
GS
= 0 V,
118 pF
Switching Characteristics (Note 2)
V
= –5 V, ID = –1 A,
t t t t Q Q Q
d(on)
r
d(off)
f
Turn–On Delay Time 11 20 ns Turn–On Rise Time 18 32 ns Turn–Off Delay Time 34 55 ns Turn–Off Fall Time
g
gs
gd
Total Gate Charge 9.7 16 nC Gate–Source Charge 2.2 nC Gate–Drain Charge
DD
= –4.5 V, R
V
GS
V
= –5 V, ID = –5 A,
DS
= –4.5 V
V
GS
GEN
= 6
34 55 ns
2.4 nC
Drain–Source Diode Characteristics and Maximum Ratings
I
S
V
SD
Maximum Continuous Drain–Source Diode Forward Current Drain–Source Diode Forward
VGS = 0 V, IS = –1.3 A (Note 2) –0.7 –1.2 V
Voltage
Notes:
1. R
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of
θJA
the drain pins. R
is guaranteed by design while R
θJC
is determined by the user's board design.
θCA
–1.3
µA
A
a) 78°C/W when
mounted on a
0.5in2 pad of 2 oz copper
Scale 1 : 1 on letter size paper
2. Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0%
b) 125°C/W when
mounted on a
0.02 in2 pad of 2 oz copper
c) 135°C/W when
mounted on a minimum pad.
Si9934DY Rev A(W)
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