Fairchild Semiconductor SFP9630 Datasheet

Advanced Power MOSFET
SFP9630
FEATURES
Avalanche Rugged Technology Rugged Gate Oxide Technology Lower Input Capacitance Improved Gate Charge Extended Safe Operating Area Lower Leakage Current : -10 µA (Max.) @ VDS = -200V Low R
: 0.581 (Typ.)
DS(ON)
Absolute Maximum Ratings
Characteristic Value UnitsSymbol
Drain-to-Source Voltage Continuous Drain Current (T Continuous Drain Current (T
=25oC)
C
=100oC)
C
Drain Current-Pulsed Gate-to-Source Voltage Single Pulsed Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Total Power Dissipation (T
=25oC)
C
Linear Derating Factor Operating Junction and Storage Temperature Range Maximum Lead Temp. for Soldering Purposes, 1/8 “ from case for 5-seconds
T
V
DSS
I
I
DM
V E
I
AR
E
dv/dt
P
, T
J
T
D
GS
AS
AR
D
STG
L
O O
O O O
BV R I
= -200 V
DSS
= 0.8
DS(on)
= -6.5 A
D
TO-220
1
2
3
1.Gate 2. Drain 3. Source
-200
-6.5
-4.0
1
2
1 1
3
-26
+
_
563
-6.5
-5.0
30
7.0
70
0.56
- 55 to +150
300
V A A
V
mJ
A
mJ
V/ns
W
W/
o
o
C
C
Thermal Resistance
R
θJC
R
θCS
R
θJA
©1999 Fairchi ld Semiconduc tor Corpor ation
Characteristic Max. UnitsSymbol Typ.
Junction-to-Case
Case-to-Sink
Junction-to-Ambient
--
0.5
--
1.79
--
62.5
o
C/W
Rev. B
SFP9630
P-CHANNEL
POWER MOSFET
Electrical Characteristics (T
CharacteristicSymbol
BV BV/∆T V
GS(th)
I
GSS
I
DSS
R
DS(on)
g
C
C
C
t
d(on)
t
d(off)
Q Q Q
Drain-Source Breakdown Voltage
DSS
Breakdown Voltage Temp. Coeff.
J
Gate Threshold Voltage Gate-Source Leakage , Forward Gate-Source Leakage , Reverse
Drain-to-Source Leakage Current
Static Drain-Source On-State Resistance Forward Transconductance
fs
Input Capacitance
iss
Output Capacitance
oss
Reverse Transfer Capacitance
rss
Turn-On Delay Time
t
Rise Time
r
Turn-Off Delay Time
t
Fall Time
f
Total Gate Charge
g
Gate-Source Charge
gs
Gate-Drain( “ Miller “ ) Charge
gd
=25oC unless otherwise specified)
C
Max. UnitsTyp.Min. Test Condition
V
-200
--
-2.0
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
-0.17
--
--
--
--
--
--
4.2 740 125
49 14 22 41 17 29
5.8
13.6
-4.0
-100 100
-100
--
--
-10
0.8
-­965 185
75 35 55 90 45 36
--
--
V
GS
o
I
V/
nA
µA
nC
=-250µA See Fig 7
C
D
V
V
DS
V
GS
V
GS
V
DS
V
DS
V
GS
V
DS
V
GS
pF
ns
See Fig 5
V
DD
=12
R
G
V
DS
I
=-6.5A
D
See Fig 6 & Fig 12
=0V,ID=-250µA
=-5V,ID=-250µA =-30V =30V =-200V =-160V,TC=125oC
=-10V,ID=-3.3A =-40V,ID=-3.3A
O O
4
4
=0V,VDS=-25V,f =1MHz
=-100V,ID=-6.5A,
See Fig 13
O
4
O
=-160V,VGS=-10V,
4
O
O
5
5
Source-Drain Diode Ratings and Characteristics
CharacteristicSymbol Max. UnitsTyp.Min. Test Condition
I
I
SM
V
t
Q
Notes ;
1
Repetitive Rating : Pulse Width Limited by Maximum Junction Temperature
O
2
O
L=20mH, I
3
O
I
SD
4
Pulse Test : Pulse Width = 250µs, Duty Cycle 2%
O
5
Essentially Independent of Operating Temperature
O
Continuous Source Current
S
Pulsed-Source Current Diode Forward Voltage
SD
Reverse Recovery Time
rr
Reverse Recovery Charge
rr
=-6.5A, VDD=-50V, RG=27Ω*, Starting TJ =25oC
AS
_
_
<
-6.5A, di/dt 400A/µs, VDDBV
<
_
<
, Starting TJ =25oC
DSS
--
--
--
160
0.96
-6.5
-26
-5.0
--
--
--
1
--
O
4
--
O
--
--
_
<
Integral reverse pn-diode
A
in the MOSFET
V
T
=25oC,IS=-6.5A,VGS=0V
J
ns
T
=25oC,IF=-6.5A
J
µC
/dt=100A/µs
di
F
O
4
P-CHANNEL
POWER MOSFET
Fig 1. Output Characteristics Fig 2. Transfer Characteristics
V
GS
Top : - 15 V
- 10 V
1
10
- 8.0 V
- 7.0 V
- 6.0 V
- 5.5 V
- 5.0 V Bottom : - 4.5 V
0
10
, Drain Current [A]
D
-I
-1
10
-1
10
-VDS , Drain-Source Voltage [V]
2.5
2.0
]
, [
1.5
DS(on)
R
1.0
Drain-Source On-Resistance
0.5
0.0 0 4 8 12 16 20 24
-ID , Drain Current [A]
V
GS
= -10 V
0
10
@ Notes :
1. 250
2. T
C
VGS = -20 V
s Pulse Test
µ
= 25 oC
1
10
@ Note : TJ = 25 oC
SFP9630
1
10
o
C
150
0
10
, Drain Current [A]
D
-I
- 55
25 oC
-1
10
2 4 6 8 10
-VGS , Gate-Source Voltage [V]
Fig 4. Source-Drain Diode Forward VoltageFig 3. On-Resistance vs. Drain Current
1
10
0
10
150 oC
, Reverse Drain Current [A]
DR
-I
-1
10
0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5
o
C
25
, Source-Drain Voltage [V]
-V
SD
@ Notes :
= 0 V
1. V
GS
2. V
= -40 V
DS
3. 250
s Pulse Test
@ Notes :
1. V
2. 250
µ
= 0 V
GS
s Pulse Test
µ
o
C
1500
C
1000
500
Capacitance [pF]
iss
C
oss
C
rss
0
0
10
-VDS , Drain-Source Voltage [V]
C
= Cgs+ Cgd ( Cds= shorted )
iss
C
= Cds+ C
oss
gd
C
= C
rss
gd
@ Notes :
1. V
2. f = 1 MHz
1
10
GS
= 0 V
Fig 6. Gate Charge vs. Gate-Source VoltageFig 5. Capacitance vs. Drain-Source Voltage
= -40 V
V
10
DS
V
= -100 V
DS
VDS = -160 V
5
, Gate-Source Voltage [V]
GS
-V
0
0 5 10 15 20 25 30
@ Notes : ID =-6.5 A
QG , Total Gate Charge [nC]
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