These N-Channel power MOSFETs are manufactured using the innovative UltraFET
cess technology achieves very low on-resistance per
silicon area, resulting in outstanding performance. This device is capable of withstanding high energy in the avalanche mode and the diode exhibits very low reverse
recovery time and stored charge. It was designed for use in
applications where power efficiency is important, such as
®
process. This advanced pro-
Applications
• Motor and Load Control
• Powertrain Management
Features
• 175°C Maximum Junction Temperature
• UIS Capability (Single Pulse and Repetitive Pulse)
• Ultra-Low On-Resistance r
= 0.016Ω, VGS = 10V
DS(ON)
switching regulators, switching convertors, motor drivers,
relay drivers, low-voltage bus switches, and power management in portable and battery-operated products.
D
G
S
TO-263AB
FDB Series
MOSFET Maximum RatingsT
= 25°C unless otherwise noted
C
D
G
S
SymbolParameterRatingsUnits
V
DSS
V
GS
Drain to Source Voltage60V
Gate to Source Voltage±20V
Drain Current
I
D
Continuous (T
Continuous (T
= 25oC, VGS = 10V)
C
= 125oC, VGS = 10V, R
C
= 43oC/W)5A
θJA
64A
PulsedFigure 4A
E
AS
P
D
, T
T
J
STG
Single Pulse Avalanche Energy (Note 1)250mJ
Power dissipation150W
o
Derate above 25
C1W/
Operating and Storage Temperature-55 to 175
o
C
o
C
Thermal Characteristics
R
θJC
R
θJA
R
θJA
This product has been designed to meet the extreme test conditions and environment demanded by the automotive industry. For a
copy of the requirements, see AEC Q101 at: http://www.aecouncil.com/
Reliability data can be found at: http://www.fairchildsemi.com/products/discrete/reliability/index.html.
All Fairchild Semiconductor products are manufactured, assembled and tested under ISO9000 and QS9000 quality systems
certification.
Thermal Resistance Junction to Case TO-2631
Thermal Resistance Junction to Ambient TO-26362
Thermal Resistance Junction to Ambient TO-263, 1in2 copper pad area43
75433S3HUFA75433S3STTO-263330mm24mm 800 units
75433S3HUFA75433S3STO-263TubeN/A50 units
HUFA75433S3S
Electrical Characteristics
TC = 25°C unless otherwise noted
SymbolParameterTest ConditionsMinTypMaxUnits
Off Characteristics
B
I
DSS
I
GSS
VDSS
Drain to Source Breakdown VoltageID = 250µA, VGS = 0V60--V
= 55V, VGS = 0V--1
V
Zero Gate Voltage Drain Current
V
V
DS
DS
GS
= 45V
= 0V
= 150oC --250
T
C
Gate to Source Leakage CurrentVGS = ±20V--±100nA
On Characteristics
V
GS(TH)
r
DS(ON)
Gate to Source Threshold VoltageVGS = VDS, ID = 250µA2-4V
I
= 64A, VGS = 10V -0.0130.016
Drain to Source On Resistance
D
= 64A, VGS = 10V,
I
D
= 175oC
T
J
-0.0290.035
Dynamic Characteristics
C
ISS
C
OSS
C
RSS
Q
g(TOT)
Q
g(10)
Q
g(TH)
Q
gs
Q
gd
Input Capacitance
Output Capacitance-540-pF
Reverse Transfer Capacitance-150-pF
V
= 25V, VGS = 0V,
DS
f = 1MHz
Total Gate Charge at 20VVGS = 0V to 20V
Total Gate Charge at 10VVGS = 0V to 10V-5065nC
Threshold Gate ChargeVGS = 0V to 2V-33.9nC
Gate to Source Gate Charge-6-nC
V
DD
= 64A
I
D
I
= 1.0mA
g
= 30V
-1550-pF
90117nC
Gate to Drain “Miller” Charge-20-nC
µA
Ω
Switching Characteristics
t
ON
t
d(ON)
t
r
t
d(OFF)
t
f
t
OFF
Turn-On Ti me
Turn-On Delay Time-11-ns
Rise Time-9 2-ns
Turn-Off Delay Time-39-ns
Fall Time-26-ns
Turn-Off Time--9 8ns