©2001 Fairchild Semiconductor Corporati on HUF75623P3, HUF75623S3ST Rev. B
Electrical Specifications
TC = 25oC, Unless Otherwise Specified
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
OFF STATE SPECIFICATIONS
Drain to Source Breakdown Voltage BV
DSSID
= 250µA, VGS = 0V (Figure 11) 100 - - V
Zero Gate Voltage Drain Current I
DSS
VDS = 95V, VGS = 0V - - 1 µA
V
DS
= 90V, VGS = 0V, TC = 150oC - - 250 µA
Gate to Source Leakage Current I
GSS
VGS = ±20V - - ±100 nA
ON STATE SPECIFICATIONS
Gate to Source Threshold Voltage V
GS(TH)VGS
= VDS, ID = 250µA (Figure 10) 2 - 4 V
Drain to Source On Resistance r
DS(ON)ID
= 22A, VGS = 10V (Figure 9) - 0.054 0.064 Ω
THERMAL SPECIFICATIONS
Thermal Resistance Junction to Case R
θJC
TO-220 - - 1.76oC/W
Thermal Resistance Junction to
Ambient
R
θJA
--62oC/W
SWITCHING SPECIFICATIONS (V
GS
= 10V)
Turn-On Time t
ON
VDD = 50V, ID = 22A
V
GS
= 10V,
R
GS
= 13Ω
(Figures 18, 19)
- - 75 ns
Turn-On Delay Time t
d(ON)
-7.9-ns
Rise Time t
r
-42-ns
Turn-Off Delay Time t
d(OFF)
-47-ns
Fall Time t
f
- 39 - ns
Turn-Off Time t
OFF
- - 130 ns
GATE CHARGE SPECIFICATIONS
Total Gate Charge Q
g(TOT)VGS
= 0V to 20V VDD = 50V,
I
D
= 22A,
I
g(REF)
= 1.0mA
(Figures 13, 16, 17)
-4352nC
Gate Charge at 10V Q
g(10)
VGS = 0V to 10V - 23 28 nC
Threshold Gate Charge Q
g(TH)
VGS = 0V to 2V - 1.7 2 nC
Gate to Source Gate Charge Q
gs
-3.5-nC
Gate to Drain “Miller” Charge Q
gd
-8.7-nC
CAPACITANCE SPECIFICATIONS
Input Capacitance C
ISS
VDS = 25V, VGS = 0V,
f = 1MHz
(Figure 12)
- 790 - pF
Output Capacitance C
OSS
- 215 - pF
Reverse Transfer Capacitance C
RSS
-70-pF
Source to Drain Diode Specifications
PARAMETER SYMBOL TEST CONDITIONS M IN TYP MAX UNITS
Source to Drain Diode Voltage V
SD
ISD = 22A - - 1.25 V
I
SD
= 11A - - 1.00 V
Reverse Recovery Time t
rr
ISD = 22A, dISD/dt = 100A/µs - - 100 ns
Reverse Recovered Charge Q
RR
ISD = 22A, dISD/dt = 100A/µs - - 313 nC
HUF75623P3, HUF75623S3ST