Fairchild Semiconductor FM25C160U Datasheet

FM25C160U 16K-Bit SPI™ Interface Serial CMOS EEPROM
FM25C160U 16K-Bit SPI Interface Serial CMOS EEPROM
General Description
The FM25C160U is a 16K bit serial interface CMOS EEPROM (Electrically Erasable Programmable Read-Only Memory). This device fully conforms to the SPI 4-wire protocol which uses Chip Select (/CS), Clock (SCK), Data-in (SI) and Data-out (SO) pins to synchronously control data transfer between the SPI microcontroller and the EEPROM. In addition, the serial interface allows a minimal pin count, packaging designed to simplify PC board layout re­quirements and offers the designer a variety of low voltage and low power options.
This SPI EEPROM family is designed to work with the 68HC11 or any other SPI-compatible, high-speed microcontroller and offers both hardware (/WP pin) and software ("block write") data protec­tion. For example, entering a 2-bit code into the STATUS REGIS­TER prevents programming in a selected block of memory and all programming can be inhibited by connecting the /WP pin to VSS; allowing the user to protect the entire array or a selected section. In addition, SPI devices feature a /HOLD pin, which allows a temporary interruption of the datastream into the EEPROM.
Fairchild EEPROMs are designed and tested for applications requiring high endurance, high reliability, and low power con­sumption for a continuously reliable non-volatile solution for all markets.
Block Diagram
/CS
/HOLD
SCK
SI
Instruction
Register
Functions
SPI MODE 0 interface
16K bits organized as 2048 x 8
Extended 2.7V to 5.5V operating voltage
2.1 MHz operation @ 4.5V - 5.5V
Self-timed programming cycle
"Programming complete" indicated by STATUS REGISTER
polling
/WP pin and BLOCK WRITE protection
Features
Sequential read of entire array
16 byte "Page write" mode to minimize total write time per
byte
/WP pin and BLOCK WRITE protection to prevent inadvert­ent programming as well as programming ENABLE and DISABLE opcodes.
/HOLD pin to suspend data transfer
Typical 1µA standby current (ISB) for "L" devices and 0.1µA
standby current for "LZ" devices.
Endurance: Up to 1,000,000 data changes
Data retention greater than 40 years
V
Instruction
Decoder
Control Logic
and Clock
Generators
V
/WP
CC
SS
SPI™ is a trademark of Motorola Corporation
© 2002 Fairchild Semiconductor Corporation
FM25C160U Rev. B
Address Counter/ Register
Decoder
Program Enable
V
EEPROM Array
Read/Write Amps
Data In/Out Register
8 Bits
Non-Volatile
Status Register
1
PP
High Voltage
Generator
and
Program
Timer
Data Out
Buffer
SO
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Connection Diagram
FM25C160U 16K-Bit SPI Interface Serial CMOS EEPROM
Dual-In-Line Package (N) and SO Package (M8)
Pin Names
/CS
SO
1
2
V
8
7
CC
/HOLD
FM25C160U
/WP
V
SS
3
4
SCK
6
SI
5
Top View
See Package Number N08E (N) and M08A (M8)
/CS Chip Select Input
SO Serial Data Output
/WP Write Protect
V
SS
SI Serial Data Input
SCK Serial Clock Input
/HOLD Suspends Serial Data
V
CC
Ground
Power Supply
Ordering Information
FM 25 C XX U LZ E XX Letter Description
Package N 8-pin DIP
M8 8-pin SO
Temp. Range None 0 to 70°C
Voltage Operating Range Blank 4.5V to 5.5V
Density/Mode 160 16K, mode 0
Interface 25 SPI
V -40 to +125°C E -40 to +85°C
L 2.7V to 5.5V LZ 2.7V to 5.5V and
<1µA Standby Current
Ultralite CS100UL Process
C CMOS technology
FM Fairchild Nonvolatile
Memory Prefix
FM25C160U Rev. B
2
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Standard Voltage 4.5 VCC 5.5V Specifications
FM25C160U 16K-Bit SPI Interface Serial CMOS EEPROM
Absolute Maximum Ratings (Note 1)
Ambient Storage Temperature -65°C to +150°C
All Input or Output Voltage with
Respect to Ground +6.5V to -0.3V
Lead Temp. (Soldering, 10 sec.) +300°C
Operating Conditions
Ambient Operating Temperature
FM25C160U 0°C to +70°C FM25C160UE -40°C to +85°C FM25C160UV -40°C to +125°C
Power Supply (VCC) 4.5V to 5.5V
ESD Rating 2000V
DC and AC Electrical Characteristics 4.5V V
5.5V (unless otherwise specified)
CC
Symbol Parameter Conditions Min Max Units
I
I
CCSB
I
V
V
V
V
f
t
t
t
CLH
t
CLL
t
CSH
t
CSS
t
DIS
t
HDS
t
CSN
t
DIN
t
HDN
t
t
t
t
t
t
WP
CC
I
OL
OP
PD
DH
DF
HZ
IL
IL
IH
OL
OH
RI
FI
LZ
Operating Current /CS = V
Standby Current /CS = V
IL
CC
Input Leakage VIN = 0 to V
Output Leakage V
= GND to V
OUT
CC
CC
-1 +1 µA
-1 +1 µA
3mA
50 µA
CMOS Input Low Voltage -0.3 VCC * 0.3 V
CMOS Input High Voltage 0.7 * V
CCVCC
+ 0.3 V
Output Low Voltage IOL = 1.6 mA 0.4 V
Output High Voltage IOH = -0.8 mA VCC - 0.8 V
SCK Frequency 2.1 MHz
Input Rise Time 2.0 µs
Input Fall Time 2.0 µs
Clock High Time (Note 2) 190 ns
Clock Low Time (Note 2) 190 ns
Min /CS High Time (Note 3) 240 ns
/CS Setup Time 240 ns
Data Setup Time 100 ns
/HOLD Setup Time 90 ns
/CS Hold Time 240 ns
Data Hold Time 100 ns
/HOLD Hold Time 90 ns
Output Delay CL = 200 pF 240 ns
Output Hold Time 0 ns
/HOLD to Output Low Z 100 ns
Output Disable Time CL = 200 pF 240 ns
/HOLD to Output High Z 100 ns
Write Cycle Time 1–16 Bytes 10 ms
Capacitance T
Symbol Test Typ Max Units
C
OUT
C
IN
Note 1: Stress above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only, and functional operation of the device at these or any other conditions above those indicated in the operational sections of the specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
Note 2: The fOP frequency specification specifies a minimum clock period of 1/fOP. Therefore, for every fOP clock cycle, t example, for a fOP of 2.1MHz, the period equals 476ns. In this case if t CLH = is set to 190ns, then t
Note 3: /CS must be brought high for a minimum of t
Note 4: This parameter is periodically sampled and not 100% tested.
FM25C160U Rev. B
= 25°C, f = 2.1/1 MHz (Note 4)
A
Output Capacitance 3 8 pF
Input Capacitance 2 6 pF
between consecutive instruction cycles.
CSH
AC Test Conditions
Output Load CL = 200 pF
Input Pulse Levels 0.1 * VCC – 0.9 * V
Timing Measurement Reference Level 0.3 * VCC - 0.7 * V
+ t
must be equal to or greater than 1/fOP. For
CLH
must be set to a minimum of 286ns.
CLL
3
CLL
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CC
Low Voltage 2.7V VCC 4.5V Specifications
FM25C160U 16K-Bit SPI Interface Serial CMOS EEPROM
Absolute Maximum Ratings (Note 5)
Ambient Storage Temperature -65°C to +150°C
All Input or Output Voltage with
Respect to Ground +6.5V to -0.3V
Lead Temp. (Soldering, 10 sec.) +300°C
ESD Rating 2000V
DC and AC Electrical Characteristics 2.7V V
Operating Conditions
Ambient Operating Temperature
FM25C160UL/LZ 0°C to +70°C FM25C160ULE/LZE -40°C to +85°C FM25C160ULV -40°C to +125°C
Power Supply (V
4.5V (unless otherwise specified)
CC
) 2.7V–4.5V
CC
25C160UL/LE 25C160ULV
25C160ULZ/ZE
Symbol Parameter Part Conditions Min. Max. Min Max Units
I
CC
I
CCSB
I
IL
I
OL
V
IL
V
IH
V
OL
V
OH
f
OP
t
RI
t
FI
t
CLH
t
CLL
t
CSH
t
CSS
t
DIS
t
HDS
t
CSN
t
DIN
t
HDN
t
PD
t
DH
t
LZ
t
DF
t
HZ
t
WP
Operating Current /CS = V Standby Current L /CS = V
LZ 1 N/A µA
IL
CC
Input Leakage VIN = 0 to V
Output Leakage V
= GND to V
OUT
CC
-1 1 -1 1 µA
-1 1 -1 1 µA
CC
33mA
10 10 µA
Input Low Voltage -0.3 VCC * 0.3 -0.3 VCC * 0.3 V
Input High Voltage VCC * 0.7 VCC + 0.3 VCC * 0.7 VCC + 0.3 V
Output Low Voltage I
Output High Voltage I
= 0.8 mA 0.4 0.4 V
OL
= –0.8 mA VCC - 0.8 VCC - 0.8 V
OH
SCK Frequency 1.0 1.0 MHz
Input Rise Time 2.0 2.0 µs
Input Fall Time 2.0 2.0 µs
Clock High Time (Note 6) 410 410 ns
Clock Low Time (Note 6) 410 410 ns
Min. /CS High Time (Note 7) 500 500 ns
/CS Setup Time 500 500 ns
Data Setup Time 100 100 ns
/HOLD Setup Time 240 240 ns
/CS Hold Time 500 500 ns
Data Hold Time 100 100 ns
/HOLD Hold Time 240 240 ns
Output Delay CL = 200 pF 500 500 ns
Output Hold Time 0 0 ns
/HOLD Output Low Z 240 240 ns
Output Disable Time CL = 200 pF 500 500 ns
/HOLD to Output Hi Z 240 240 ns
Write Cycle Time 1-16 Bytes 15 15 ms
Capacitance T
Symbol Test Typ Max Units
C
OUT
C
IN
Note 5: Stress above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only, and functional operation of the device at these or any other conditions above those indicated in the operational sections of the specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
Note 6: The fOP frequency specification specifies a minimum clock period of 1/fOP. Therefore, for every fOP clock cycle, t example, for a fOP of 1MHz, the period equals 1000ns. In this case if t
Note 7: /CS must be brought high for a minimum of t
Note 8: This parameter is periodically sampled and not 100% tested.
FM25C160U Rev. B
= 25°C, f = 2.1/1 MHz (Note 8)
A
Output Capacitance 3 8 pF
Input Capacitance 2 6 pF
= is set to 410ns, then t
between consecutive instruction cycles.
CSH
CLH
AC Test Conditions
Output Load CL = 200pF
Input Pulse Levels 0.1 * VCC - 0.9 * V
Timing Measurement Reference Level 0.3 * VCC - 0.7 * V
+ t
must be equal to or greater than 1/fOP. For
CLH
must be set to a minimum of 590ns.
CLL
4
CLL
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CC
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