These dual N & P Channel logic level enhancement mode
field effect transistors are produced using Fairchild's
proprietary, high cell density, DMOS technology. This very
high density process is especially tailored to minimize
on-state resistance. This device has been designed
especially for low voltage applications as a replacement for
digital transistors in load switching applications. Since bias
resistors are not required this dual digital FET can replace
several digital transistors with different bias resistors.
N-Ch 25 V, 0.68 A, R
P-Ch -25 V, -0.46 A, R
= 0.45 Ω @ VGS= 4.5 V
DS(ON)
= 1.1 Ω @ VGS= -4.5 V.
DS(ON)
Very low level gate drive requirements allowing direct
operation in 3 V circuits. V
GS(th)
< 1.0V.
Gate-Source Zener for ESD ruggedness.
>6kV Human Body Model
Replace multiple dual NPN & PNP digital transistors.
SOT-23
SuperSOTTM-6
Mark:.321
SuperSOTTM-8
SO-8
SOT-223
SOIC-16
D2
S1
4
3
D1
5
2
G2
SuperSOT -6
TM
Absolute Maximum RatingsT
SymbolParameterN-ChannelP-ChannelUnits
V
, VCCDrain-Source Voltage, Power Supply Voltage 25-25V
DRAIN-SOURCE DIODE CHARACTERISTICS AND MAXIMUM RATINGS
I
S
Maximum Continuous Drain-Source Diode Forward CurrentN-Ch0.3A
P-Ch-0.5
V
SD
Drain-Source Diode Forward VoltageVGS = 0 V, IS = 0.5 A
(Note)N-Ch0.831.2V
TJ =125°C0.690.85
VGS = 0 V, IS = -0.5 A
(Note)P-Ch-0.89-1.2
TJ =125°C-0.75-0.85
Notes:
1. R
is the sum of the junction-to-case and case-to-ambient thermal resistance where thecase thermal reference is defined as the solder mounting surface of the drain pins. R