The MM74HC540 and MM74HC541 3-STATE buffers utilize advanced silicon-gate CMOS technology. They possess high drive current outp uts which enable high speed
operation even when driving large bus capacitances.
These circuits achieve speed s comparable to low power
Schottky devices, while r etaining the advantage of CMOS
circuitr y, i.e., high noise immuni ty, and low power consump tion. Both devices have a fano ut of 15 LS-TTL equivalent
inputs.
The MM74HC540 is an inverting buffer and the
MM74HC541 is a non-inverti ng buffer. The 3-STATE control gate operates as a two-input NOR such that if either G1
or G2 are HIGH, all eigh t outputs are in the high-impedance state.
In order to enhance PC board layout, the MM74HC540 and
MM74HC541 offers a pino ut having inputs a nd outputs on
opposite sides of the package. All inputs are protected from
damage due to static discharge by diodes to V
ground.
CC
Features
■ Typical propagation delay: 12 ns
■ 3-STATE outputs for connection to system buses
■ Wide power supply range: 2–6V
■ Low quiescent current: 80
■ Output current: 6 mA
and
P
A maximum (74HC Series)
Ordering Code:
Order Number Package NumberPackage Description
MM74HC540WMM20B20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300" Wide
MM74HC540SJM20D20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
MM74HC540MTCMTC2020-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide
MM74HC540NN20A20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide
MM74HC541WMM20B20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300" Wide
MM74HC541SJM20D20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
MM74HC541MTCMTC2020-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide
MM74HC541NN20A20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide
Devices also availab l e in Tape and Reel. Specify by appending the suffix let t er “X” to the ordering code.
Supply Voltage (VCC)
DC Input Voltage (V
DC Output Voltage (V
Clamp Diode Current (I
DC Output Current, per pin (I
DC V
or GND Current,
CC
per pin (I
CC
)
IN
)
OUT
)
CD
OUT
)
Storage Temperature Range (T
Power Dissipation (P
MM74HC540 • MM74HC541
(Note 3)600 mW
)
D
S.O. Package only500 mW
Lead Temperature (T
)
L
(Soldering 10 seconds)260
STG
1.5 to V
0.5 to V
)
)
65q
0.5 to 7.0V
CC
CC
r
20 mA
r
35 mA
r
70 mA
C to 150qC
Recommended Operating
Conditions
1.5V
0.5V
DC Input or Output Voltage
, V
(V
IN
OUT
Operating Temperature Range (T
Input Rise or Fall Times
, tf) V
(t
r
CC
V
CC
V
Supply Voltage (V
Note 1: Absolute Maximum Ratings a re those va lues beyon d which d amage to the device may occur.
Note 2: Unless otherwise specifie d all voltages are referenced to ground.
Note 3: Power Dissipation temp erature de rating — plastic “N” package:
12 mW/qC from 65qC to 85qC.
q
C
CC
)26V
CC
)0V
)4085qC
A
2.0V1000ns
4.5V500ns
6.0V400ns
MinMax Units
CC
DC Electrical Characteristics (Note 4)
TA
SymbolParameterConditions
V
Minimum HIGH Level2.0V1.51.51.5V
IH
Input Voltage4.5V3.153.153.15V
V
Maximum LOW Level2.0V0.50.50.5V
IL
Input Voltage 4.5V1.351.351.35V
V
Minimum HIGH LevelV
OH
Output Voltage|I
V
Maximum LOW LevelV
OL
Output Voltage|I
I
Maximum InputV
IN
Current
I
Maximum 3-STATEV
OZ
Output LeakageV
Current
I
Maximum QuiescentV
CC
Supply CurrentI
Note 4: For a power supply of 5V r10% the worst ca se out put voltag es (VOH, and VOL) occur for HC a t 4.5V. Thus the 4.5V values s hould be used w hen
designing with this supply. Worst case V
, ICC, and IOZ) occur for CMOS at the higher voltage and so th e 6.0V values should be used.
rent (I
IN
VIH or V
IN
OUT
V
IN
|I
OUT
|I
OUT
IN
OUT
V
IN
|I
OUT
|I
OUT
IN
IN
OUT
IN
OUT
and VIL occur at V
IH
IL
| d 20 PA2.0V2.01.91.91.9V
VIH or V
IL
| d 6.0 mA4.5V4.23.983.843.7V
| d 7.8 mA6.0V5.75.485.345.2V
VIH or V
IL
| d 20 PA2.0V00.10.10.1V
VIH or V
IL
| d 6.0 mA4.5V0.20.260.330.4V
| d 7.8 mA6.0V0.20.260.330.4V
VCC or GND6.0V
VIH or VIL, G VIH6.0V
VCC or GND
VCC or GND6.0V8.080160
0 PA
CC
V
CC
6.0V4.24.24.2V
6.0V1.81.81.8V
4.5V4.54.44.44.4V
6.0V6.05.95.95.9V
4.5V00.10.10.1V
6.0V00.10.10.1V
5.5V and 4.5V respectively. (The VIH value at 5.5V is 3.85V.) The worst case leakage c ur-
25qCTA
TypGuaranteed Limits
r
0.1
r
0.5
40 to 85qCTA
r
1.0
r
5
55 to 125qC
r
1.0
r
10
V
Units
P
P
P
A
A
A
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AC Electrical Characteristics
V
5V, T
25qC, t
t
CC
A
6 ns
r
f
SymbolParameterConditionsTyp
t
PHL
, t
PLH
Maximum PropagationCL
45 pF1218ns
Delay (540)
t
PHL
, t
PLH
Maximum PropagationCL
45 pF1420ns
Delay (541)
t
t
PZH
PHZ
, t
PZL
, t
PLZ
Maximum Output EnableRL
TimeCL
Maximum Output DisableRL
TimeCL
1 k
45 pF
1 k
5 pF
:
:
AC Electrical Characteristics
V
2.0V to 6.0V, C
CC
SymbolParameterConditions
t
, t
Maximum PropagationCL
PHL
PLH
Delay (540)C
t
, t
Maximum PropagationCL
PHL
PLH
Delay (541)C
t
, t
Maximum Output EnableRL
PZH
PZL
TimeC
, t
t
Maximum Output DisableRL
PHZ
PLZ
TimeCL
t
, t
Maximum Output RiseCL
THL
TLH
and Fall Time4.5V7121518ns
C
Power DissipationG V
PD
Capacitance (Note 5)G V
C
Maximum Input5101010pF
IN
Capacitance
C
Maximum Output Capacitance15202020pF
OUT
Note 5: CPD determines the no load dynamic power consumption, P
Fairchild does not assume any responsibility for use of any circ uitry described, no circuit patent licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are dev ic es or syste ms
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provide d in the l abe ling, can be reasonably expected to result in a significant injury to the
user.
Package Number N20A
2. A critical compo nent in any com ponen t of a life s upp ort
device or system whose failure to perform can be reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
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7www.fairchildsemi.com
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