Fairchild ISL9N306AD3, ISL9N306AD3ST, ISL9N306AD3, ISL9N306AD3ST Schematic [ru]

June 2003
ISL9N306AD3 / ISL9N306AD3ST
N-Channel Logic Level PWM Optimized UltraFET® Trench Power MOSFETs 30V, 50A, 6m
ISL9N306AD3 / ISL9N306AD3ST
General Description
This device employs a new advanced trench MOSFET
Features
•Fast switching technology and features low gate charge while maintaining low on-resistance.
Optim ized for swit ch ing appl icat ions , t his devi ce i mpr ove s the overall efficiency of DC/DC converters and allows operation to higher switching frequencies.
Applications
• DC/DC converters
DRAIN (FLANGE)
DRAIN
GATE
SOURCE
(FLANGE)
TO-252
MOSFET Maximum Ratings T
= 25°C unless otherwise noted
A
•r
•r
•Q
•Q
•C
TO-251
= 0.0052Ω (Typ), VGS = 10V
DS(ON)
= 0.0085Ω (Typ), VGS = 4.5V
DS(ON)
(Typ) = 30nC, VGS = 5V
g
(Typ) = 11nC
gd
(Typ) = 3400pF
ISS
SOURCE
DRAIN
GATE
D
G
S
Symbol Parameter Ratings Units
V
DSS
V
GS
Drain to Sou r c e Voltage 30 V Gate to Source Voltage ±20 V Drain Curr e nt Continuous (T
I
D
Continuous (T Continuous (T
= 25oC, VGS = 10V)
C
= 100oC, VGS = 4.5V) 50 A
C
= 25oC, VGS = V, R
C
= 52oC/W) 16 A
θJC
50 A
Pulsed Figure 4 A
P
D
T
, T
J
STG
Power dissipation Derate above 25
o
C
Operating and Storage Temperature -55 to 175
125
0.83
W
W/oC
o
C
Thermal Characteristics
R
θJC
R
θJA
R
θJA
Thermal Resistance Junction to Case TO-251, TO-252 1.2 Thermal Resistance Junction to Ambient TO-251, TO-252 100 Thermal Resistance Junction to Ambient TO-252, 1in2 copper pad ar ea 52
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
N306AD ISL9N306AD3ST TO-252AA 330mm 16mm 2500 units N306AD ISL9N306AD3 TO-25 1AA Tube N/A 75 unit s
©2003 Fairchild Semiconductor Corporation
ISL9N 306AD3 / ISL9N306AD3ST Rev. B2
o
C/W
o
C/W
o
C/W
ISL9N306AD3 / ISL9N306AD3ST
Electrical Characteristics T
= 25°C unless otherwise noted
A
Symbol Parameter Test Conditions Min Typ Max Units
Off Characteristics
B I
DSS
I
GSS
VDSS
Drain to Sou r c e Br ea kd ow n Voltage ID = 250µA, VGS = 0V 30 - - V
V
= 25V - - 1
Zero Gate Voltage Drain Current
DS
= 0V TC = 150
V
GS
o
--250
Gate to Source Leakage Current VGS = ±20V - - ±100 nA
On Characteristics
V
GS(TH)
r
DS(ON)
Gate to Source Threshold Voltage VGS = VDS, ID = 250µA1-3V
I
= 50A, VGS = 10V - 0.0052 0.0060
Drain to S ou r c e On Re si st ance
D
= 50A, VGS = 4.5V - 0.0085 0.0095
I
D
Dynamic Characteristics
C C C Q Q Q Q Q
ISS OSS RSS
g(TOT) g(5) g(TH) gs gd
Input Capacitance Output Capacitance - 650 - pF Reverse Transfer Capacitance - 300 - pF Total Gate Charge at 10V VGS = 0V to 10V Total Gate Charge at 5V VGS = 0V to 5V - 30 45 nC Threshold Gate Charge VGS = 0V to 1V - 3.0 4.5 nC Gate to Source Gate Charg e - 10 - n C Gate to Drain “Miller” Charge - 11 - nC
Switching Characteristics
t
ON
t
d(ON)
t
r
t
d(OFF)
t
f
t
OFF
Turn-On Time Turn-On Delay Time - 16 - ns Rise Time - 70 - ns Turn-Off Delay Time - 34 - ns Fall Time - 30 - ns Turn-Off T ime - - 97 ns
(VGS = 4.5V)
= 15V, VGS = 0V,
V
DS
f = 1MHz
V
= 15V, ID = 16A
DD
V
= 4.5V, RGS = 4.3
GS
= 15V
V
DD
I
= 50A
D
I
= 1.0mA
g
-3400- pF
-6090nC
--131ns
µA
Switching Characteristics (V
t
ON
t
d(ON)
t
r
t
d(OFF)
t
f
t
OFF
Turn-On Time Turn-On Delay Time - 10 - ns Rise Time - 43 - ns Turn-Off Delay Time - 62 - ns Fall Time - 29 - ns Turn-Off T ime - - 137 ns
GS
= 10V)
V
= 15V, ID = 16A
DD
V
= 10V, RGS = 4.3
GS
- - 80 ns
Unclamped Inductive Switching
t
AV
Avalanche Tim e ID = 30A, L = 200µH428--µs
Drain-Source Diode Characteristics
I
= 50A - - 1.25 V
V
SD
t
rr
Q
RR
©2003 Fairchild Semiconductor Corporation ISL9N 306AD3 / ISL9N306AD3ST Rev. B2
Source to Drain Diode Voltage Reverse Recovery Time ISD = 50A, dISD/dt = 100A/µs- - 35 ns
Reverse Recovered Charge ISD = 50A, dISD/dt = 100A/µs- - 30 nC
SD
= 25A - - 1.0 V
I
SD
Typical Cha racteristic
ISL9N306AD3 / ISL9N306AD3ST
1.2
1.0
0.8
0.6
0.4
0.2
POWER DISSIPATION MULTIPLIER
0
0 25 50 75 100 175
125
150
TC, CASE TEMPERATURE (oC)
Figure 1. Normalized Power Dissipation vs
Ambient Temperature
2
DUTY CYCLE - DESCENDING ORDER
0.5
1
0.2
0.1
0.05
0.02
0.01
0.1
, NORMALIZED
θJC
Z
THERMAL IMPEDANCE
0.01
-5
10
-4
10
SINGLE PULSE
-3
10
t, RECTANGULAR PULSE DURATION (s)
60
50
VGS = 10V
40
VGS = 4.5V
30
20
, DRAIN CURRENT (A)
D
I
10
0
25 50 75 100 125 150 175
TC, CASE TEMPERATURE (oC)
Figure 2. Maximum Continuous Drain Curr ent vs
Case Temperature
P
DM
t
1
t
0
x R
θJC
+ T
2
C
1
10
NOTES: DUTY FACTOR: D = t
PEAK TJ = PDM x Z
-2
10
-1
10
1/t2
θJC
10
Figure 3. Normalize d Maxim um transient Thermal Impedance
2000
1000
, PEAK CURRENT (A)
DM
I
100
TRANSCONDUCTANCE MAY LIMIT CURRENT IN THIS REGION
40
-5
10
VGS = 10V
VGS = 5V
-4
10
-3
10
-2
10
-1
10
t, PULSE WIDTH (s)
TC = 25oC
FOR TEMPERATURES
o
ABOVE 25 CURRENT AS FOLLOWS:
I = I
25
C DERATE PEAK
175 – T
150
0
10
C
1
10
Figure 4. Peak Current Capability
©2003 Fairchild Semiconductor Corporation ISL9N 306AD3 / ISL9N306AD3ST Rev. B2
Typical Cha racteristic (Conti nued)
ISL9N306AD3 / ISL9N306AD3ST
100
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
V
= 15V
DD
75
50
, DRAIN CURRENT (A)
25
D
I
TJ = 25oC
0
12345
TJ = 175oC
TJ = -55oC
VGS, GATE TO SOURCE VOLTAGE (V)
100
VGS = 10V
75
50
, DRAIN CURRENT (A)
25
D
I
0
0 0.5 1.0 1.5 2.0
VDS, DRAIN TO SOURCE VOLTAGE (V)
VGS = 4.5V
T
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
Figure 5. Transfer Characteristics Figure 6. Saturation Characteristics
25
20
15
, DRAIN TO SOURCE
DS(ON)
r
ID =5A
ON RESISTANCE (mΩ)
10
5
246810
ID = 25A
ID = 50A
V
, GATE TO SOURCE VOLTAGE (V)
GS
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
T
= 25oC
C
2.0
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
1.5
ON RESISTANCE
1.0
NORMALIZED DRAIN TO SOURCE
0.5
-80 -40 0 40 80 120 160 200 TJ, JUNCTION TEMPERATURE (oC)
= 25oC
C
VGS = 10V, ID = 50A
VGS = 3.5V
VGS = 3V
Figure 7. Drain to Source O n Resistance vs Gate
Voltage and Drain Current
1.4
1.0
0.6
NORMALIZED GATE
THRESHOLD VOLTAGE
0.2
-80 -40 0 40 80 120 160 200 TJ, JUNCTION TEMPERATURE (oC)
VGS = VDS, ID = 250µA
Figure 9. Normali zed Gate Threshold Voltage vs
Junction Temperatur e
©2003 Fairchild Semiconductor Corporation ISL9N 306AD3 / ISL9N306AD3ST Rev. B2
Figure 8. Normalized Drain to Source On
Resistance vs Junction Temperature
1.2
1.1
1.0
BREAKDOWN VOLTAGE
NORMALIZED DRAIN TO SOURCE
0.9
-80 -40 0 40 80 120 160 200 T
, JUNCTION TEMPERATURE (oC)
J
ID = 250µA
Figure 10. Normalized Drain to Source
Breakdown Voltage vs Junction Temperature
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