The H11AG1M device consists of a Gallium-AluminumArsenide IRED emitting diode coupled with a silicon
phototransistor in a dual in-line package. This device
provides the unique feature of the high current transfer
ratio at both low output voltage and low input current.
This makes it ideal for use in low power logic circuits,
telecommunications equipment and portable electronics
isolation applications.
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
SymbolParametersValueUnits
TOTAL DEVICE
T
STG
T
OPR
T
SOL
P
D
EMITTER
I
F
V
R
I
(pk)Forward Current – Peak (1µs pulse, 300pps) 3.0A
F
P
D
DETECTOR
P
D
I
C
Storage Temperature-55 to +150°C
Operating Temperature-40 to +100°C
Lead Solder Temperature (Wave Solder)260 for 10 sec°C
Total Device Power Dissipation @ 25°C (LED plus detector)
Derate Linearly From 25°C
260mW
3.5mW/°C
Continuous Forward Current50mA
Reverse Voltage6V
LED Power Dissipation 25°C Ambient
Derate Linearly From 25°C
Detector Power Dissipation @ 25°C
Derate Linearly from 25°C
As per IEC 60747-5-2, this optocoupler is suitable for “safe electrical insulation” only within the safety limit data.
Compliance with the safety ratings shall be ensured by means of protective circuits.
SymbolParameterMin.Typ.Max.Unit
H11AG1M — Phototransistor Optocoupler
Installation Classifications per DIN VDE 0110/1.89
Ta ble 1
For Rated Main Voltage < 150VrmsI-IVFor Rated Main voltage < 300VrmsI-IVClimatic Classification 55/100/21Pollution Degree (DIN VDE 0110/1.89)2
CTIComparative Tracking Index175
V
PR
Input to Output Test Voltage, Method b,
V
x 1.875 = V
IORM
, 100% Production Test
PR
1594V
peak
with tm = 1 sec, Partial Discharge < 5pC
Input to Output Test Voltage, Method a,
V
IORM
x 1.5 = V
, Type and Sample Test
PR
1275V
peak
with tm = 60 sec, Partial Discharge < 5pC
V
V
IORM
IOTM
Max. Working Insulation Voltage850V
Highest Allowable Over Voltage6000V
Figure 7. Collector-Emitter Dark Current vs. Ambient Temperature
10000
1000
100
10
- DARK CURRENT (nA)
CEO
I
0.1
R
AC
INPUT
VOLTAGE
1
1N4148
C
1
H11AG1M
4.7MΩ
(Continued)
IF = 0mA
= 10V
V
CE
1
0102030405060708090100
TA - AMBIENT TEMPERATURE (oC)
3V ≤ VCC ≤ 10V
47KΩ
C
0.1
4093 or
74HC14
4.7KΩ
2
InputR1C1Z
40-90 VRMS
20Hz
95-135 VRMS
60Hz
200-280 VRMS
50/60Hz
DC component of input voltage is ignored due to C1
75K
1/10W
180K
1/10W
390K
1/4W
0.1µF
100V
12 ηF
200 V
6.80 ηF
400 V
109K
285K
550K
Figure 8. Telephone Ring Detector/A.C. Line CMOS Input Isolator
The H11AG1M uses less input power than the neon bulb traditionally used to monitor telephone and line voltages.
Additionally. response time can be tailored to ignore telephone dial tap, switching transients and other undesired
signals by modifying the value of C2. The high impedance to line voltage also can simply board layout spacing
requirements.
The following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global subsidiaries,andis not
intended to be an exhaustive list of all such trademarks.
Auto-SPM™
Build it Now™
CorePLUS™
CorePOWER™
CROSSVOLT™
CTL™
Current Transfer Logic™
EcoSPARK
EfficentMax™
EZSWITCH™*
*Trademarks of System General Corporation, used under license by Fairchild Semiconductor.
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FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE
RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR
CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE
SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN,
WHICH COVERSTHESE PRODUCTS.
H11AG1M — Phototransistor Optocoupler
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FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE
EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or systems which, (a) are
intended for surgical implant into the body or (b) support or sustain life,
and (c) whose failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be reasonably
expected to result in a significant injury of the user.
2. A critical component in any component of a life support, device, or
system whose failure to perform can be reasonably expected to
cause the failure of the life support device or system, or to affect its
safety or effectiveness.
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PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification Product StatusDefinition
Advance InformationFormative / In Design
Preliminary
First Production
No Identification NeededFull Production
ObsoleteNot In Production
Datasheet contains the design specifications for product development. Specifications may change in
any manner without notice.
Datasheet contains preliminary data; supplementary data will be published at a later date. Fairchild
Semiconductor reserves the right to make changes at any time without notice to improve design.
Datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes
at any time without notice to improve the design.
Datasheet contains specifications on a product that is discontinued by Fairchild Semiconductor.
The datasheet is for reference information only.