Fairchild FODM8061 service manual

FODM8061 — High Noise Immunity, 3.3V/5V, 10Mbit/sec Logic Gate Output (Open Collector) Optocoupler

May 2010

FODM8061
High Noise Immunity, 3.3V/5V, 10Mbit/sec
Logic Gate Output (Open Collector) Optocoupler

Features

High Noise Immunity characterized by common mode

■

transient immunity (CMTi)
– 20kV/µs Minimum CMTi

High Speed

■

– 10Mbit/sec Date Rate (NRZ)
– 80ns max. Propagation Delay
– 25ns max. Pulse Width Distortion
– 40ns max. Propagation Delay Skew

■

3.3V LVTTL/LVCMOS Compatibility
Specifications guaranteed over 3V to 5.5V supply

■

voltage and -40°C to +110°C temperature range

■

Safety and regulatory approvals
– UL1577, 3750 VAC

– IEC60747-5-2 (pending approval)

RMS

for 1 min.

Applications

Microprocessor system interface

■

– SPI, I
Industrial fieldbus communications

■

– DeviceNet, CAN, RS485

■

Programmable logic control
Isolated data acquisition system

■

■

Voltage level translator
Isolating MOSFET/IGBT gate drivers

■

2

C

Description

The FODM8061 is a 3.3V/5V high-speed logic gate
output (open collector) optocoupler, which supports
isolated communications allowing digital signals to
communicate between systems without conducting
ground loops or hazardous voltages. It utilizes Fairchild’s
proprietary coplanar packaging technology, Optoplanar
and optimized IC design to achieve high noise immunity,
characterized by high common mode transient immunity
specifications.

This optocoupler consists of an AlGaAS LED at the
input, optically coupled to a high speed integrated photo­detector logic gate. The output of the detector IC is an
open collector schottky-clamped transistor. The coupled
parameters are guaranteed over the wide temperature
range of -40°C to +110°C. A maximum input signal of
5mA will provide a minimum output sink current of 13mA
(fan out of 8).

Related Resources

www.fairchildsemi.com/products/opto/

■

■

www.fairchildsemi.com/pf/FO/FODM611.html
www.fairchildsemi.com/pf/FO/FODM8071.html

■

®

,

Functional Schematic

Truth Table

ANODE

CATHODE

©2009 Fairchild Semiconductor Corporation www.fairchildsemi.com
FODM8061 Rev. 1.0.3

1

3 4

6

5

V

CC

V

O

GND

LED Output

Off High
On Low

°

Pin Definitions

Number Name Function Description

1 ANODE Anode
3CATHODE Cathode
4 GND Output Ground
5V
6V

O

CC

Output Voltage
Output Supply Voltage

Safety and Insulation Ratings for Mini-Flat Package (SO5 Pin)

As per IEC60747-5-2 (Pending Certification). This optocoupler is suitable for “safe electrical insulation” only within the
safety limit data. Compliance with the safety ratings shall be ensured by means of protective circuits.

Symbol Parameter Min. Typ. Max. Unit

Installation Classifications per DIN VDE 0110/1.89 Table 1
For rated main voltage < 150Vrms I-IV
For rated main voltage < 300Vrms I-III
Climatic Classification 40/110/21
Pollution Degree (DIN VDE 0110/1.89) 2

CTI Comparative Tracking Index 175

V

V

T

V

PR

V

PR

IORM

IOTM

Case

R

IO

Input to Output Test Voltage, Method b,
VIORM x 1.875 = V
t

= 1 sec, Partial Discharge < 5 pC

m

, 100% Production Test with

PR

Input to Output Test Voltage, Method a,
VIORM x 1.5 = V
t

= 60 sec, Partial Discharge < 5 pC

m

, Type and Sample Test with

PR

Max Working Insulation Voltage 565 V
Highest Allowable Over Voltage 4000 V
External Creepage 5.0 mm
External Clearance 5.0 mm
Insulation thickness 0.5 mm
Safety Limit Values, Maximum Values allowed in the event

of a failure, Case Temperature
Insulation Resistance at T

, V

= 500V 10

S

IO

1060

848

150

peak

peak

C

9

Ω

FODM8061 — High Noise Immunity, 3.3V/5V, 10Mbit/sec Logic Gate Output (Open Collector) Optocoupler

©2009 Fairchild Semiconductor Corporation www.fairchildsemi.com
FODM8061 Rev. 1.0.3 2

1.

≤

Ω

FODM8061 — High Noise Immunity, 3.3V/5V, 10Mbit/sec Logic Gate Output (Open Collector) Optocoupler

Absolute Maximum Ratings

(T

=25ºC unless otherwise specified)

A

Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended. In
addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.

Symbol Parameter Value Units

T
T

T

V

PD

PD

STG

OPR

T

J

SOL

I

F

V

R

CC

V

O

I

O

I

O

Storage Temperature -40 to +125 ºC
Operating Temperature -40 to +110 ºC
Junction Temperature -40 to +125 ºC
Lead Solder Temperature

260 for 10sec ºC

(Refer to Reflow Temperature Profile)
Forward Current 50 mA
Reverse Voltage 5.0 V
Supply Voltage 0 to 7.0 V
Output Voltage -0.5 to V

+0.5 V

CC

Average Output Current 50 mA
Input Power Dissipation
Output Power Dissipation

(1)(2)

(1)(2)

100 mW

85 mW

Recommended Operating Conditions

The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended
operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not
recommend exceeding them or designing to Absolute Maximum Ratings.

Symbol Parameter Min. Max. Unit

T

A

V

V

CC,

V

FL

I

FH

I

FL

NFan Out (at R

R

L

Isolation Characteristics

Ambient Operating Temperature -40 +110 ºC

DD

Supply Voltages

(3)

3.0 5.5 V
Logic Low Input Voltage 0 0.8 V
Logic High Input Current

(4)

6.3 15 mA
Logic Low Input Current 250 µA

= 1k Ω )5TTL Loads

L

Output Pull-up Resistor 330 4k

(T

=25ºC)

A

Ω

Symbol Parameter Test Conditions Min. Typ. Max. Units

V

R
C

Notes:

No derate required to 110 ºC.

2. Functional operation under these conditions is not implied. Permanent damage may occur if the device is subjected

to conditions outside these ratings.

3. 0.1µF bypass capacitor must be connected between pins 4 and 6.

4. Recommended I

5. Device is considered a two terminal device: Pins 1 and 3 are shorted, and Pins 4, 5, and 6 are shorted together.

6. 3,750 VAC

Input-Output Isolation Voltage freq= 60Hz, t = 1.0min,

ISO

Isolation Resistance V

ISO

Isolation Capacitance V

ISO

is 9.3mA for operation above T

FH

for 1 minute duration is equivalent to 4,500 VAC

RMS

I

10µA

I-O

= 500V

I-O

= 0V, freq=1.0MHz

I-O

=100ºC.

A

(5)(6)

(5)

3750 Vac

(5)

for 1 second duration.

RMS

12

10

0.6 pF

RMS

©2009 Fairchild Semiconductor Corporation www.fairchildsemi.com
FODM8061 Rev. 1.0.3 3

≤

≤

FODM8061 — High Noise Immunity, 3.3V/5V, 10Mbit/sec Logic Gate Output (Open Collector) Optocoupler

Electrical Characteristics

(T

= -40ºC to +110ºC, 3.0V ≤ V

A

Typical value is measured at T

(Apply over all recommended conditions)

5.5V), unless otherwise specified.

CC

= 25ºC and V

A

CC

= 3.3V.

Symbol Parameter Test Conditions Min. Typ. Max. Units

INPUT CHARACTERISTICS

V

BV
I

FHL

OUTPUT CHARACTERISTICS

V

I

I

CCL

I

CCH

Forward Voltage I

F

Input Reverse Breakdown Voltage I

R

Threshold Input Current V

Logic LOW Output Voltage IF = rated I

OL

Logic HIGH Output Current IF = 250µA, VO = 3.3V, Fig. 4 8.0 50.0 µA

OH

Logic LOW Output Supply Current IF = 10mA, V

Logic HIGH Output Supply Current IF = 0mA, V

= 10mA, Fig. 1 1.05 1.45 1.8 V

F

= 10µA 5.0 V

R

= 0.6V, I

O

T

< 85ºC, Fig. 2 3.4 5.0 mA

A

T

= 85ºC to 110 ºC 4.2 7.5

A

I

(sinking) = 13mA, Fig.3

OL

I

= 250µA, VO = 5.0V, Fig. 4 2.1 30.0 µA

F

I

= 10mA, V

F

I

= 0mA, V

F

(sinking) = 13mA,

OL

,

FHL

= 3.3V, Fig. 5, 7 6.0 8.5 mA

CC

= 5.0V, Fig. 5, 7 7.5 10.0 mA

CC

= 3.3V, Fig. 6, 7 4.0 7.0 mA

CC

= 5.0V, Fig. 6, 7 6.0 9.0 mA

CC

0.4 0.6 V

Switching Characteristics

(T

= -40ºC to +110ºC, 3.0V ≤ V

A

Typical value is measured at T

(Apply over all recommended conditions)

5.5V, I

CC

= 25ºC and V

A

= 7.5mA), unless otherwise specified.

F

= 3.3V

CC

Symbol Parameter Test Conditions Min. Typ. Max. Units

Date Rate RL = 350Ω 10 Mbps

t

PHL

t

PLH

PWD Pulse Width Distortion,

t

PSK

t

R

t

F

|CM

|CM

Notes

7. t

PSK

from the same manufacturing date code that are operated at same case temperature (±5°C), at same operating
conditions, with equal loads (R

8. Common mode transient immunity at output high is the maximum tolerable positive dVcm/dt on the leading edge of
the common mode impulse signal, Vcm, to assure that the output will remain high. Common mode transient immunity
at output low is the maximum tolerable negative dVcm/dt on the trailing edge of the common pulse signal, Vcm, to
assure that the output will remain low.

©2009 Fairchild Semiconductor Corporation www.fairchildsemi.com
FODM8061 Rev. 1.0.3 4

Propagation Delay Time to Logic
Low Output

Propagation Delay Time to Logic
High Output

- t

| t

PHL

PLH

|

RL = 350Ω, CL = 15pF,
Fig. 8 and 11

RL = 350Ω, CL = 15pF,
Fig. 8 and 11

= 350Ω, CL = 15pF,

R

L

Fig. 9

Propagation Delay Skew RL = 350Ω, CL = 15pF

Output Rise Time, (10% to 90%) RL = 350Ω, CL = 15pF,

Fig. 10 and 11

Output Fall Time, (90% to 10%) RL = 350Ω, CL = 15pF,

Fig. 10 and 11

| Common Mode Transient

H

Immunity at Output High

| Common Mode Transient

L

Immunity at Output Low

IF = 0mA, VO > 0.8 x VCC,
V

= 1000V

CM

IF = 7.5mA, VO < 0.8V,
V

= 1000V

CM

is equal to the magnitude of the worst case difference in t

= 350 Ω and C

L

= 15pF), and with an input rise time less than 5ns.

L

(8)

, Fig. 12

(8)

, Fig. 12

PHL

(7)

and/or t

43 80 ns

50 80 ns

725ns

40 ns

20 ns

10 ns

20 40 kV/µs

20 40 kV/µs

that will be seen between any two units

PLH