FOD814 Series, FOD817 Series
4-Pin High Operating Temperature
Phototransistor Optocouplers
FOD814 Series, FOD817 Series — 4-Pin High Operating Temperature Phototransistor Optocouplers
December 2011
Features
■
AC input response (FOD814 only)
■
Applicable to Pb-free IR reflow soldering
Compact 4-pin package
■
■
Current transfer ratio in selected groups:
FOD814: 20–300% FOD817: 50–600%
FOD814A: 50–150% FOD817A: 80–160%
FOD817B: 130–260%
FOD817C: 200–400%
FOD817D: 300–600%
■
C-UL, UL and VDE approved
High input-output isolation voltage of 5000Vrms
■
Minimum BV
■
■
Higher operating temperatures (versus H11AXXX
of 70V guaranteed
CEO
counterparts)
Applications
FOD814 Series
■
AC line monitor
Unknown polarity DC sensor
■
Telephone line interface
■
FOD817 Series
Power supply regulators
■
■
Digital logic inputs
Microprocessor inputs
■
Description
The FOD814 consists of two gallium arsenide infrared
emitting diodes, connected in inverse parallel, driving a
silicon phototransistor output in a 4-pin dual in-line
package. The FOD817 Series consists of a gallium
arsenide infrared emitting diode driving a silicon
phototransistor in a 4-pin dual in-line package.
Functional Block Diagram
1ANODE, CATHODE
2
FOD814 FOD817
©2006 Fairchild Semiconductor Corporation www.fairchildsemi.com
FOD814 Series, FOD817 Series Rev. 1.1.5
4
COLLECTOR
3CATHODE, ANODE
EMITTER
CATHODE
1
2
4
COLLECTORANODE
3 EMITTER
4
1
Absolute Maximum Ratings
(TA = 25°C Unless otherwise specified.)
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Value Units
Symbol Parameter
TOTAL DEVICE
T
STG
T
OPR
T
SOL
T
J
θ
JC
P
TOT
EMITTER
I
F
V
R
P
D
DETECTOR
V
CEO
V
ECO
I
C
P
C
Storage Temperature -55 to +150 °C
Operating Temperature -55 to +105 -55 to +110 °C
Lead Solder Temperature 260 for 10 sec °C
Junction Temperature 125 Max. °C
Junction-to-Case Thermal Resistance 210 °C/W
Total Power Dissipation 200 mW
Continuous Forward Current ±50 50 mA
Reverse Voltage 6
Power Dissipation
Derate above 100°C
Collector-Emitter Voltage 70 V
Emitter-Collector Voltage 6 V
Continuous Collector Current 50 mA
Collector Power Dissipation
Derate above 90°C
FOD814 FOD817
70
1.7
150
2.9
mW
mW/°C
mW
mW/°C
FOD814 Series, FOD817 Series — 4-Pin High Operating Temperature Phototransistor Optocouplers
©2006 Fairchild Semiconductor Corporation www.fairchildsemi.com
FOD814 Series, FOD817 Series Rev. 1.1.5 2
FOD814 Series, FOD817 Series — 4-Pin High Operating Temperature Phototransistor Optocouplers
Electrical Characteristics
(TA = 25°C Unless otherwise specified.)
Individual Component Characteristics
Symbol Parameter Device Test Conditions Min. Typ.* Max. Unit
EMITTER
V
I
C
DETECTOR
I
CEO
BV
CEO
BV
ECO
DC Transfer Characteristics
Symbol
CTR Current Transfer
V
CE (sat)
Forward Voltage FOD814 IF = ±20mA 1.2 1.4 V
F
FOD817 IF = 20mA 1.2 1.4
Reverse Leakage Current FOD817 VR = 4.0V 10 µA
R
Te r minal Capacitance FOD814 V = 0, f = 1kHz 50 250 pF
t
FOD817 V = 0, f = 1kHz 30 250
Collector Dark Current FOD814 VCE = 20V, IF = 0 100 nA
FOD817 VCE = 20V, IF = 0 100
Collector-Emitter Breakdown
Voltage
Emitter-Collector Breakdown
Voltage
FOD814 IC = 0.1mA, IF = 0 70 V
FOD817 IC = 0.1mA, IF = 0 70
FOD814 IE = 10µA, IF = 0 6 V
FOD817 IE = 10µA, IF = 0 6
DC
Characteristic Device Test Conditions Min. Typ.* Max. Unit
(1)
(1)
20 300 %
50 600
Ratio
FOD814 IF = ±1mA, VCE = 5V
FOD814A 50 150
FOD817 IF = 5mA, VCE = 5V
FOD817A 80 160
FOD817B 130 260
FOD817C 200 400
FOD817D 300 600
Collector-Emitter
Saturation Voltage
FOD814 IF = ±20mA, IC = 1mA 0.1 0.2 V
FOD817 IF = 20mA, IC = 1mA 0.1 0.2
AC Transfer Characteristics
Symbol AC Characteristic Device Test Conditions Min. Typ.* Max. Unit
f
Cut-Off Frequency FOD814 VCE = 5V, IC = 2mA, RL = 100Ω,
C
-3dB
Response Time (Rise) FOD814,
t
r
VCE = 2 V, IC = 2mA, RL = 100
(2)
Ω
FOD817
t
Response Time (Fall) FOD814,
f
FOD817
*Typical values at TA = 25°C
©2006 Fairchild Semiconductor Corporation www.fairchildsemi.com
FOD814 Series, FOD817 Series Rev. 1.1.5 3
15 80 kHz
418µs
318µs
Electrical Characteristics
(TA = 25°C Unless otherwise specified.)
(Continued)
Isolation Characteristics
Symbol Characteristic Device Test Conditions Min. Typ.* Max. Units
V
R
C
*Typical values at TA = 25°C
Notes:
1. Current Transfer Ratio (CTR) = IC/IF x 100%.
2. For test circuit setup and waveforms, refer to page 7.
3. For this test, Pins 1 and 2 are common, and Pins 3 and 4 are common.
Input-Output Isolation
ISO
ISO
ISO
(3)
Voltage
Isolation Resistance FOD814,
Isolation Capacitance FOD814,
FOD814,
FOD817
FOD817
FOD817
f = 60Hz, t = 1 min,
I
≤ 2µA
I-O
V
= 500VDC 5x10
I-O
V
= 0, f = 1 MHz 0.6 1.0 pf
I-O
5000 Vac(rms)
10
1x10
11
Ω
FOD814 Series, FOD817 Series — 4-Pin High Operating Temperature Phototransistor Optocouplers
©2006 Fairchild Semiconductor Corporation www.fairchildsemi.com
FOD814 Series, FOD817 Series Rev. 1.1.5 4