Extended industrial temperate range, -40 to +110˚C
temperature range
■
Safety and regulatory approvals
– UL1577, 3750 VAC
– DIN EN/IEC60747-5-2 (approval pending)
RMS
for 1 min.
Applications
■
Industrial fieldbus communications
– DeviceNet, CAN, RS485, RS232
■
Microprocessor System Interface
2
– SPI, I
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Programmable Logic Control
Isolated Data Acquisition System
■
■
Voltage Level Translator
C
Description
The FOD8012 is a full duplex, bi-directional, high-speed
logic gate Optocoupler, which supports isolated communications allowing digital signals to communicate
between systems without conducting ground loops or
hazardous voltages. It utilizes Fairchild’s proprietary co-
planar packaging technology, Optoplanar
IC design to achieve minimum 20kV/µs Common Mode
Noise Rejection (CMR) rating.
This high-speed logic gate optocoupler is highly integrated with 2 optically coupled channels arranged in
bi-directional configuration, and housed in a compact
8-pin small outline package. Each optocoupler channel
consists of a high-speed AlGaAs LED driven by a CMOS
buffer IC coupled to a CMOS detector IC. The detector
IC comprises of an integrated photodiode, a high-speed
trans-impedance amplifier and a voltage comparator
with an output driver. The CMOS technology coupled to
the high efficiency of the LED achieves low power consumption as well as very high speed (60ns propagation
delay, 15ns pulse width distortion).
®
Related Resources
■
FOD8001, High Noise Immunity, 3.3V/5V Logic Gate
Optocoupler Datasheet
FOD8012 — High CMR, Bi-Directional, Logic Gate Optocoupler
Pin
Number
1V
2V
3V
4GND
5GND
6V
7V
8V
Absolute Maximum Ratings
Pin
NameDescription
DD1
OA
INB
OB
INA
DD2
Supply V oltage to Channel-A detector IC and Channel-B buffer IC
Output V oltage from Channel-A detector IC
Input V oltage to Channel-B buffer IC
Ground for Channel-A detector IC and Channel-B buffer IC
1
Ground for Channel-A buffer IC and Channel-B detector IC
2
Output V oltage from Channel-B detector IC
Input V oltage to Channel-A buffer IC
Supply V oltage to Channel-A buffer IC and Channel-B detector IC
(T
=25ºC unless otherwise specified)
A
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
SymbolParameterValueUnits
V
DD1
V
V
I
T
T
T
I
OA
OA
OPR
T
IA
IA
PD
PD
STG
J
SOL
, V
, V
, I
, V
, I
DD2
IB
IB
OB
OB
I
O
Storage Temperature-40 to +125ºC
Operating Temperature-40 to +110ºC
Junction Temperature-40 to +130ºC
Lead Solder Temperature
260 for 10secºC
(Refer to Reflow Temperature Profile)
Supply Voltage0 to 6.0V
Input Voltage-0.5 to VDD+0.5V
Input DC Current-10 to +10µA
Output Voltage-0.5 to VDD+0.5V
Average Output Current10mA
Input Power Dissipation
Output Power Dissipation
(1)
(1)
60mW
60mW
Recommended Operating Conditions
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended
operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not
recommend exceeding them or designing to Absolute Maximum Ratings.
Apply over all recommended conditions, typical value is measured at V
SymbolParameterConditionsMin.Typ.Max.Units
Data Rate15Mbit/s
DD1
= V
= +3.3V, TA=25ºC
DD2
FOD8012 — High CMR, Bi-Directional, Logic Gate Optocoupler
t
PHL
Propagation Delay Time
PW = 66.7ns, CL = 15pF3760ns
to Logic Low Output
t
PLH
Propagation Delay Time
PW = 66.7ns, CL = 15pF4060ns
to Logic High Output
PWDPulse Width Distortion,
| t
– t
PLH
|
t
PSK(CC)
t
PSK(PP)
t
R
PHL
Channel-Channel SkewPW = 66.7ns, CL = 15pF
Part-Part SkewPW = 66.7ns, CL = 15pF
Output Rise Time
PW = 66.7ns, C
= 15pF
L
PW = 66.7ns, CL = 15pF6.5ns
(5)
(6)
(7)
315ns
1225ns
30ns
(10% to 90%)
t
F
Output Fall Time
PW = 66.7ns, CL = 15pF6.5ns
(90% to 10%)
|Common Mode Transient
|CM
H
Immunity at Output High
|Common Mode Transient
|CM
L
Immunity at Output Low
VI = V
V
CM
VI = 0V, VO < 0.8V,
V
CM
, VO > 0.8V
DD1
= 1000V
= 1000V
(8)
(8)
DD1
,
2040kV/µs
2040kV/µs
Notes:
1. No derating required.
2. 0.1µF bypass capacitor must be connected between Pin 1 and 4, and 5 and 8. The capacitors should be kept close
to the supply pins.
3. Device is considered a two terminal device: Pins 1, 2, 3 and 4 are shorted together and Pins 5, 6, 7 and 8 are shorted
together.
4. 3,750 VAC
for 1 minute duration is equivalent to 4,500 VAC
RMS
5. PWD is equal to the magnitude of the worst case difference in t
for 1 second duration.
RMS
PHL
and/or t
that will be seen for one channel
PLH
switching, while holding the other channel output at a low or high state, or while both channels are in synchronous
data transmission mode.
6. t
is equal to the magnitude of the worst case difference in t
PSK(CC)
PHL
and/or t
that will be seen between the two
PLH
channels within a single device.
7. t
is equal to the magnitude of the worst case difference in t
PSK(PP)
PHL
and/or t
that will be seen between any two
PLH
units from the same manufacturing date code that are operated at same case temperature, at same operating
conditions, with equal loads.
8. Common mode transient immunity at output high is the maximum tolerable positive dVcm/dt on the leading edge of
the common mode impulse signal, Vcm, to assure that the output will remain high. Common mode transient
immunity at output low is the maximum tolerable negative dVcm/dt on the trailing edge of the common pulse signal,
Vcm, to assure that the output will remain low.