Fairchild FOD2200 service manual

FOD2200 — Low Input Current Logic Gate Optocouplers
August 2010
Features
1kV/µs minimum common mode rejection Compatible with LSTTL, TTL, and CMOS logic
Wide V
2.5Mbd guaranteed over temperature
Low input current (1.6mA) Three state output (no pullup resistor required)
Guaranteed performance from 0°C to 85°C
Hysteresis Safety and regulatory approved
– UL1577, 5000 V
range (4.5V to 20V)
CC
for 1 min.
RMS
– IEC60747-5-2
>8.0mm clearance and creepage distance (option ‘T’ or ‘TS’)
1,414V Peak Working Insulation Voltage (V
Applications
Isolation of high speed logic systems Computer peripheral interfaces
Microprocessor system interfaces Ground loop elimination
Pulse transformer replacement Isolated bus driver
High speed line receiver
IORM
Description
The FOD2200 is an optically coupled logic gate that combine an AlGaAs LED and an integrated high gain photo detector. The detector has a three state output stage and has a detector threshold with hysteresis. The three state output eliminates the need for a pullup resis­tor and allows for direct drive of data busses. The hyster­esis provides differential mode noise immunity and eliminates the potential for output signal chatter.
The Electrical and Switching Characteristics of the FOD2200 are guaranteed over the temperature range of 0°C to 85°C and a V wide V
range allow compatibility with TTL, LSTTL, and
CC
CMOS logic and result in lower power consumption compared to other high speed opto-couplers. Logic
)
signals are transmitted with a maximum propagation delay of 300ns. The FOD2200 is useful for isolating high speed logic interfaces, buffering of input and output lines, and implementing isolated line receivers in high noise environments.
Truth Table
LED Enable Output
On H Z Off H Z On L H Off L L
range of 4.5V to 20V. Low I
CC
(Positive Logic)
and
F
Functional Block Diagram and Schematic Package Outlines
I
CC
NC
1
NC
2
3
4
SHIELD
ANODE
CATHODE
©2004 Fairchild Semiconductor Corporation www.fairchildsemi.com FOD2200 Rev. 1.0.4
8
V
CC
I
V
7
O
6
V
E
5
GND
F
+
2
V
F
3
SHIELD
V
CC
8
I
O
V
O
7
I
E
V
E
6
GND
5
8
1
8
1
8
1
8
1
Safety and Insulation Ratings
As per IEC 60747-5-2. This optocoupler is suitable for “safe electrical insulation” only within the safety limit data. Compliance with the safety ratings shall be ensured by means of protective circuits.
Symbol Parameter Min. Typ. Max. Unit
Climatic Classification 40/85/21 Pollution Degree (DIN VDE 0110/1.89) 2
CTI Comparative Tracking Index 175
V
PR
V
IORM
V
IOTM
External Creepage 8 mm External Clearance 7.4 mm
Insulation Thickness 0.5 mm
T
Case
I
S,INPUT
P
S,OUTPUT
R
IO
Installation Classifications per DIN VDE 0110/1.89 Table 1 For Rated Mains Voltage < 150Vrms I–IV For Rated Mains Voltage < 300Vrms I–IV For Rated Mains Voltage < 450Vrms I–III For Rated Mains Voltage < 600Vrms I–III For Rated Mains Voltage < 1000Vrms (Option T, TS) I–III
Input to Output Test Voltage, Method b, V
x 1.875 = V
IORM
, 100% Production Test with
PR
2651
tm = 1 sec., Partial Discharge < 5pC Input to Output Test Voltage, Method a,
V
IORM
x 1.5 = V
, Type and Sample Test with
PR
2121
tm = 60 sec.,Partial Discharge < 5 pC Max Working Insulation Voltage 1,414 V Highest Allowable Over Voltage 6000 V
External Clearance (for Option T or TS - 0.4” Lead Spacing) 10.16 mm
Safety Limit Values – Maximum Values Allowed in the Event of a Failure
Case Temperature 150 °C Input Current 10 mA Output Power (Duty Factor 2.7%) 150 mW Insulation Resistance at T
, V
= 500V 10
S
IO
9
FOD2200 — Low Input Current Logic Gate Optocouplers
peak
peak
©2004 Fairchild Semiconductor Corporation www.fairchildsemi.com FOD2200 Rev. 1.0.4 2
FOD2200 — Low Input Current Logic Gate Optocouplers
Absolute Maximum Ratings
(T
= 25°C unless otherwise specified)
A
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be operable above the recommended operating conditions and stressing the parts to these levels is not recommended. In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability. The absolute maximum ratings are stress ratings only.
Symbol Parameter Value Units
T
STG
T
OPR
T
SOL
EMITTER
I
F (PK)
I
F
V P
DETECTOR
V
CC
I
O
V V P
Storage Temperature -40 to +125 °C Operating Temperature -40 to +85 °C Lead Solder Temperature (1.6mm below seating plane) 260 for 10 sec °C
Peak Transient Input Current ( 1µs PW, 300pps) 1.0 A Average Forward Input Current 10 mA Reverse Input Voltage 5.0 V
R
Output Power Dissipation (No derating required up to 85°C) 45 mW
D
Supply Voltage 0 to 20 V Average Output Current 25 mA Three State Enable Voltage -0.5 to 20 V
E
Output Voltage -0.5 to 20 V
O
Output Power Dissipation (No derating required up to 85°C) 150 mW
D
Recommended Operating Conditions
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not recommend exceeding them or designing to absolute maximum ratings.
Symbol Parameter Min. Max. Units
I
F(ON)
I
F(OFF)
V
CC
V
EL
V
EH
T
A
NFan Out (TTL Load) 4
*The initial switching threshold is 1.6mA or less. It is recommended that 2.2mA be used to permit at least a 20% CTR degradation guardband.
Forward Input Current 1.6* 5 mA Forward Input Current 0.1 mA Supply Voltage, Output 4.5 20 V Enable Voltage, LOW Level 0 0.8 V Enable Voltage, HIGH Level 2.0 20 V Operating Temperature 0 +85 °C
©2004 Fairchild Semiconductor Corporation www.fairchildsemi.com FOD2200 Rev. 1.0.4 3
FOD2200 — Low Input Current Logic Gate Optocouplers
Electrical Characteristics
= 2V to 20V, V
V
EH
= 0V to 0.8V, I
EL
(T
= 0°C to +85°C, V
A
= 0 mA to 0.1mA unless otherwise specified.)
F(OFF)
= 4.5V to 20V, I
CC
= 1.6mA to 5mA,
F(ON)
(1)
Individual Component Characteristics
Symbol Parameter Test Conditions Min. Typ.* Max. Unit
EMITTER
V
B
C
VF/ TA Input Diode Temperature
DETECTOR
I
CCH
I
CCL
I I
V V
Input Forward Voltage I
F
Input Reverse Breakdown
VR
= 5mA 1.75 V
F
T
= 25°C 1.40 1.7
A
I
= 10µA 5.0 V
R
Voltage Input Capacitance Pins 2 & 3, V
IN
I
= 5mA -1.4 mV/°C
F
= 0, f = 1MHz 60 pF
F
Coefficient
High Level Supply Current
Low Level Supply Current I
Low Level Enable Current V
EL
High Level Enable Current V
EH
High Level Enable Voltage 2.0 V
EH
Low Level Enable Voltage 0.8 V
EL
I
= 5mA, I
F
V
= Don’t Care
E
= 0, I
F
V
= Don’t care
E
= 0.4V -0.1 -0.32 mA
E
= 2.7V 20 µA
E
V
= 5.5V 100
E
= 20V 0.005 250
V
E
= Open,
O
= Open,
O
= 5.5V 3.5 4.5 mA
V
CC
V
= 20V 4.0 6.0
CC
= 5.5V 4.4 6.0 mA
V
CC
V
= 20V 5.2 7.5
CC
Switching Characteristics
(T
= 0°C to +85°C, I
A
= 1.6mA to 5mA, I
F(ON)
= 0 to 0.1mA, V
F(OFF)
= 4.5V to 20V
CC
unless otherwise specified.)
Symbol AC Characteristics Test Conditions Min. Typ.* Max. Unit
T
Propagation Delay Time
PLH
With Peaking Capacitor
to Output High Level
T
Propagation Delay Time
PHL
With Peaking Capacitor
to Output Low Level
(5)
(Fig. 1) 80 ns
(6)
(Fig. 1) 25 ns
(Fig. 2) 40 ns
t
t
r
t
PZH
Output Rise Time (10% to 90%) Output Fall Time (90% to 10%)
f
Enable Propagation Delay Time to Output High Level
t
PZL
Enable Propagation Delay Time
(Fig. 2) 50 ns
to Output Low Level
T
PHZ
Disable Propagation Delay Time from
(Fig. 2) 95 ns
Output High Level
T
Disable Propagation Delay Time from
PLZ
(Fig. 2) 80 ns
Output Low Level
| Common Mode Transient Immunity
|CM
H
(at Output High Level)
| Common Mode
|CM
L
Tr ansient Immunity (at Output Low Level)
*Typical values at T
©2004 Fairchild Semiconductor Corporation www.fairchildsemi.com FOD2200 Rev. 1.0.4 4
= 25°C, V
A
= 5V, I
CC
F(ON)
TA =25°C,
(Min.) = 2.0V,
V
OH
V
CC
= 5V
(7)
(Fig. 3)
TA =25°C, IF = 0mA
(Max.) = 0.8 V,
V
OL
V
CC
= 5V
(8)
(Fig. 3)
= 3mA unless otherwise specified.
(2)(4)
(Fig. 1) 120 300 ns
(3)(4)
(Fig. 1) 180 300 ns
I
= 1.6mA,
F
| = 50V
|V
CM
= 5mA,
I
F
| = 1,000V
|V
CM
|V
| = 50V 1,000 V/µs
CM
| = 1,000V 10,000
|V
CM
1,000 V/µs
10,000
Electrical Characteristics (Continued)
FOD2200 — Low Input Current Logic Gate Optocouplers
Transfer Characteristics (T
V
= 0V to 0.8V, I
EL
= 0mA to 0.1mA unless otherwise specified.)
F(OFF)
= 0°C to +85°C, VCC = 4.5V to 20V, I
A
= 1.6mA to 5mA, VEH = 2V to 20V,
F(ON) (1)
Symbol DC Characteristics Test Conditions Min. Typ.* Max. Unit
I
OHH
V
I
V I
OZL
I
OZH
I
OSL
I
OSH
I
HYS
FT
OH
Output Leakage Current (V
> VCC)
OUT
Low Level Output Voltage VCC = 4.5 V, IF = 0mA, VE = 0.4 V,
OL
= 4.5V, IF = 5mA VO = 5.5V 2.0 100 µA
V
CC
V
= 20V 2.5 500
O
0.33 0.5 V
I
= 6.4mA
OL
(2)
Input Threshold Current VCC = 4.5V, VO = 0.5V, VE = 0.4V,
I
= 6.4mA
OL
Logic High Output Voltage IOH = -2.6mA 2.4 VCC – 1.8 V High Impedance State
VO = 0.4V, VEN = 2V, IF = 5mA -20 µA
Output Current High Impedance State
Output Current
Logic Low Short Circuit Output Current
Logic High Short Circuit Output Current
(10)
(10)
VO = 2.4 V, VEN = 2 V, IF = 5mA 20 µA V
= 5.5 V, VEN = 2 V, IF = 5mA 100
O
V
= 20 V, VEN = 2 V, IF = 5mA 500
O
VO = VCC = 5.5V, IF = 0mA 25 mA V
= VCC = 20V, IF = 0mA 40
O
VCC = 5.5V, IF = 5mA, VO = GND -10 mA V
= 20V, IF = 5mA, VO = GND -25
CC
Input Current Hysteresis VCC = 4.5V 0.03 mA
1.6 mA
Isolation Characteristics (T
= 0°C to +85°C unless otherwise specified)
A
Symbol Characteristics Test Conditions Min. Typ.* Max. Unit
V
R C
*Typical values at T
Withstand Insulation Test Voltage RH < 50%, TA = 25°C, t = 1 min.
ISO
Resistance (Input to Output) V
I-O
Capacitance (Input to Output) V
I-O
= 25°C, VCC = 5V, I
A
= 500 VDC
I-O
= 0V, f = 1MHz
I-O
= 3mA unless otherwise stated.
F(ON)
(9)
(9)
Notes:
1. The V
supply to each optoisolator must be bypassed by a 0.1µF capacitor or larger. This can be either a ceramic
CC
or solid tantalum capacitor with good high frequency characteristic and should be connected as close as possible to the package V
2. t
– Propagation delay is measured from the 50% level on the LOW to HIGH transition of the input current pulse
PLH
and GND pins of each device.
CC
to the 1.3V level on the LOW to HIGH transition of the output voltage pulse.
3. t
– Propagation delay is measured from the 50% level on the HIGH to LOW transition of the input current pulse
PHL
to the 1.3V level on the HIGH to LOW transition of the output voltage pulse.
4. When the peaking capacitor is omitted, propagation delay times may increase by 100ns. – Rise time is measured from the 10% to the 90% levels on the LOW to HIGH transition of the output pulse.
5. t
r
– Fall time is measured from the 90% to the 10% levels on the HIGH to LOW transition of the output pulse.
6. t
f
7. CM
8. CM
– The maximum tolerable rate of fall of the common mode voltage to ensure the output will remain in the high
H
state (i.e., V
– The maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the low
L
state (i.e., V
OUT
OUT
> 2.0V).
< 0.8V).
9. Device considered a two-terminal device: Pins 1, 2, 3 and 4 shorted together, and Pins 5, 6, 7 and 8 shorted together.
10. Duration of output short circuit time should not exceed 10ms.
(9)
5000 V
12
10
0.6 pF
RMS
©2004 Fairchild Semiconductor Corporation www.fairchildsemi.com FOD2200 Rev. 1.0.4 5
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