UniFET
FDP8N50NZ / FDPF8N50NZT
N-Channel MOSFET
500V, 8A, 0.85Ω
FDP8N50NZ / FDPF8N50NZT N-Channel MOSFET
October 2009
TM
Features
•R
• Low Gate Charge ( Typ. 14nC)
• Low C
• Fast Switching
• 100% Avalanche Tested
• Improve dv/dt Capability
• ESD Improved Capability
• RoHS Compliant
MOSFET Maximum Ratings T
V
DSS
V
GSS
I
D
I
DM
E
AS
I
AR
E
AR
dv/dt Peak Diode Recovery dv/dt (Note 3) 10 V/ns
P
D
, T
T
J
T
L
*Drain current limited by maximum junction temperature
= 0.77Ω ( Typ.) @ VGS = 10V, ID = 4A
DS(on)
( Typ. 5pF)
rss
D
G
G D S
TO-220
S
FDP Series
o
= 25
C unless otherwise noted
C
Symbol Parameter FDP8N50NZ FDPF8N50NZT Units
Drain to Source Voltage 500 V
Gate to Source Voltage ±25 V
-Continuous (T
-Continuous (T
(T
= 25oC) 139 50 W
C
- Derate above 25
STG
Drain Current
Drain Current - Pulsed (Note 1) 30 30* A
Single Pulsed Avalanche Energy (Note 2) 122 mJ
Avalanche Current (Note 1) 8 A
Repetitive Avalanche Energy (Note 1) 13.9 mJ
Power Dissipation
Operating and Storage Temperature Range -55 to +150
Maximum Lead Temperature for Soldering Purpose,
1/8” from Case for 5 Seconds
Description
This N-Channel enhancement mode power field effect transistors
are produced using Fairchild's proprietary, planar stripe, DMOS
technology.
This advance technology has been especially tailored to
minimize on-state resistance, provide superior switching
performance, and withstand high energy pulse in the avalanche
and commutation mode. These devices are well suited for high
efficient switching mode power supplies and active power factor
correction.
G
G
TO-220F
FDPF Series
S
S
= 25oC) 8 8*
C
= 100oC) 4.8 4.8*
C
o
C1.10.4W/
300
Thermal Characteristics
Symbol Parameter FDP8N50NZ FDPF8N50NZT Units
R
θJC
θCS
R
θJA
Thermal Resistance, Junction to Case 0.96 3.1
Thermal Resistance, Case to Sink Typ. 0.5 Thermal Resistance, Junction to Ambient 62.5 62.5
A
o
C
o
C
o
C
o
C/WR
©2009 Fairchild Semiconductor Corporation
FDP8N50NZ / FDPF8N50NZT Rev. A
www.fairchildsemi.com1
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
FDP8N50NZ FDP8N50NZ TO-220 - - 50
FDPF8N50NZT FDPF8N50NZT TO-220F - - 50
FDP8N50NZ / FDPF8N50NZT N-Channel MOSFET
Electrical Characteristics T
= 25oC unless otherwise noted
C
Symbol Parameter Test Conditions Min. Typ. Max. Units
Off Characteristics
BV
∆BV
∆T
I
DSS
I
GSS
DSS
DSS
J
Drain to Source Breakdown Voltage ID = 250µA, VGS = 0V, TC = 25oC 500 - - V
Breakdown Voltage Temperature
Coefficient
Zero Gate Voltage Drain Current
Gate to Body Leakage Current VGS = ±25V, V
I
= 250µA, Referenced to 25oC-0.5-V/
D
V
= 500V, V
DS
= 400V, TC = 125oC--10
V
DS
= 0V - - 1
GS
= 0V - - ±10 µA
DS
On Characteristics
V
R
g
FS
GS(th)
DS(on)
Gate Threshold Voltage VGS = VDS, ID = 250µA3.0-5.0V
Static Drain to Source On Resistance VGS = 10V, ID = 4A - 0.77 0.85 Ω
Forward Transconductance VDS = 20V, ID = 4A (Note 4) -6.3-S
Dynamic Characteristics
C
C
C
Q
Q
Q
iss
oss
rss
g(tot)
gs
gd
Input Capacitance
Output Capacitance - 80 105 pF
Reverse Transfer Capacitance - 5 10 pF
= 25V, VGS = 0V
V
DS
f = 1MHz
Total Gate Charge at 10V
V
= 400V,ID = 8A
Gate to Source Gate Charge - 4 - nC
Gate to Drain “Miller” Charge - 6 - nC
DS
V
= 10V
GS
(Not e 4, 5)
- 565 735 pF
-1418nC
Switching Characteristics
t
d(on)
t
r
t
d(off)
t
f
Turn-On Delay Time
= 250V, ID = 8A
Turn-On Rise Time - 34 80 ns
Turn-Off Delay Time - 43 95 ns
Turn-Off Fall Time - 27 60 ns
V
DD
R
= 25Ω, VGS = 10V
G
(Note 4, 5)
-1745ns
µA
o
C
Drain-Source Diode Characteristics
I
S
I
SM
V
SD
t
rr
Q
rr
Notes:
1. Repetitive Rating: Pulse width limited by maximum junction temperature
2. L = 3.8mH, I
≤ 8A, di/dt ≤ 200A/µs, VDD ≤ BV
3. I
SD
4. Pulse Test: Pulse width ≤ 300µs, Duty Cycle ≤ 2%
5. Essentially Independent of Operating Temperature Typical Characteristics
FDP8N50NZ / FDPF8N50NZT Rev. A
Maximum Continuous Drain to Source Diode Forward Current - - 8 A
Maximum Pulsed Drain to Source Diode Forward Current - - 30 A
Drain to Source Diode Forward Voltage V
Reverse Recovery Time
Reverse Recovery Charge - 1.9 - µC
= 8A, VDD = 50V, RG = 25Ω, Starting TJ = 25°C
AS
, Starting TJ = 25°C
DSS
= 0V, I
GS
V
= 0V, I
GS
dI
/dt = 100A/µs (Note 4)
F
= 8A - - 1.4 V
SD
= 8A
SD
2
- 300 - ns
www.fairchildsemi.com
Typical Performance Characteristics
Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics
30
V
= 15.0 V
GS
10.0 V
10
8.0 V
7.0 V
6.5 V
6.0 V
5.5 V
1
, Drain Current[A]
D
I
0.1
0.03
0.03 0.1 1 10 20
*Notes:
1. 250
2. T
µs Pulse Test
= 25oC
C
VDS, Drain-Source Voltage[V]
Figure 3. On-Resistance Variation vs. Figure 4. Body Diode Forward Voltage
Drain Current and Gate Voltage Variation vs. Source Current
and Temperature
2.0
30
10
150oC
1
, Drain Current[A]
D
I
0.1
246810
-55oC
25oC
*Notes:
1. V
2. 250
= 20V
DS
µs Pulse Test
VGS, Gate-Source Voltage[V]
100
FDP8N50NZ / FDPF8N50NZT N-Channel MOSFET
1.6
[Ω],
1.2
DS(ON)
R
VGS = 10V
VGS = 20V
10
150oC
25oC
0.8
Drain-Source On-Resistance
0.4
0369121518
*Note: TC = 25oC
ID, Drain Current [A]
, Reverse Drain Current [A]
S
I
1
0.4 0.8 1.2 1.6 2.0 2.4
VSD, Body Diode Forward Volta ge [V]
*Notes:
1. VGS = 0V
µs Pulse Test
2. 250
Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics
Capacitances [pF]
1200
900
600
300
C
= Cgs + Cgd (Cds = shorted)
iss
C
= Cds + C
C
oss
C
iss
oss
C
rss
= C
gd
gd
*Note:
= 0V
1. V
GS
2. f = 1MHz
C
rss
10
VDS = 100V
V
= 250V
8
V
DS
= 400V
DS
6
4
, Gate-Source Voltage [V]
GS
V
2
0
0.1 1 10 30
VDS, Drain-Source Voltage [V]
FDP8N50NZ / FDPF8N50NZT Rev. A
0
03691215
*Note: ID = 8A
Qg, Total Gate Charge [n C]
3
www.fairchildsemi.com