FDP75N08A
75V N-Channel MOSFET
FDP75N08A 75V N-Channel MOSFET
July 2006
TM
UniFET
Features
• 75A, 75V, R
• Low gate charge ( typical 145nC)
• Low Crss ( typical 86pF)
•Fast switching
• Improved dv/dt capability
= 0.011Ω @VGS = 10 V
DS(on)
G
D
S
TO-220
FDP Series
Description
These N-Channel enhancement mode power field effect
transistors are produced using Fairchild’s proprietary, planar
stripe, DMOS technology.
This advanced technology has been especially tailored to
minimize on-state resistance, provide superior switching
performance, and withstand high energy pulse in the avalanche
and commutation mode. These devices are well suited for high
efficient switched mode power supplies, active power factor
correction, electronic lamp ballast based on half bridge
topology.
D
G
S
Absolute Maximum Ratings
Symbol Parameter FDP75N08A Units
V
DSS
I
D
I
DM
V
GSS
E
AS
I
AR
E
AR
dv/dt Peak Diode Recovery dv/dt
P
D
, T
T
J
STG
T
L
Drain-Source Voltage 75 V
Drain Current - Continuous (TC = 25°C) 75 A
- Continuous (T
Drain Current - Pulsed
Gate-Source Voltage ± 20 V
Single Pulsed Avalanche Energy
Avalanche Current
Repetitive Avalanche Energy
Power Dissipation (TC = 25°C) 137 W
- Derate above 25°C 1.09 W/°C
Operating and Storage Temperature Range -55 to +150 °C
Maximum lead temperature for soldering purposes,
1/8" from case for 5 seconds
= 100°C) 47 A
C
(Note 1)
(Note 2)
(Note 1)
(Note 1)
(Note 3)
300 A
1738 mJ
75 A
13.7 mJ
4.5 V/ns
300 °C
Thermal Characteristics
Symbol Parameter FDP75N08A Units
R
θJC
R
θJA
©2006 Fairchild Semiconductor Corporation 1 www.fairchildsemi.com
FDP75N08A Rev. A2
Thermal Resistance, Junction-to-Case 0.91 °C/W
Thermal Resistance, Junction-to-Ambient 62.5 °C/W
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
FDP75N08A FDP75N08A TO-220 -- -- 50
FDP75N08A 75V N-Channel MOSFET
Electrical Characteristics T
= 25°C unless otherwise noted
C
Symbol Parameter Test Conditions Min Typ Max Units
Off Characteristics
BV
DSS
∆BV
∆T
J
I
DSS
I
GSSF
I
GSSR
On Characteristics
V
GS(th)
R
DS(on)
g
FS
Dynamic Characteristics
C
iss
C
oss
C
rss
Switching Characteristics
t
d(on)
t
r
t
d(off)
t
f
Q
g
Q
gs
Q
gd
Drain-Source Diode Characteristics and Maximum Ratings
I
S
I
SM
V
SD
t
rr
Q
rr
NOTES:
1. Repetitive Rating : Pulse width limited by maximum junction temperature
2. L = 206µH, IAS =75A, VDD = 50V, RG = 25 Ω, Starting TJ = 25°C
3. ISD ≤ 75A, di/dt ≤200A/µs, VDD ≤ BV
4. Pulse Test : Pulse width ≤ 300µs, Duty cycle ≤ 2%
5. Essentially independent of operating temp er at ur e
Drain-Source Breakdown Voltage VGS = 0 V, ID = 250 µA75----V
/
DSS
Breakdown Voltage Temperature Coefficient ID = 250 µA, Referenced to 25°C -- 0.6 -- V/°C
Zero Gate Voltage Drain Current VDS = 75 V, VGS = 0 V -- -- 1 µA
= 60 V, TC = 125°C -- -- 10 µA
V
DS
Gate-Body Leakage Current, Forward VGS = 20 V, VDS = 0 V -- -- 100 nA
Gate-Body Leakage Current, Reverse VGS = -20 V, VDS = 0 V -- -- -100 nA
Gate Threshold Voltage VDS = VGS, ID = 250 µA2.0--4.0V
Static Drain-Source On-Resistance VGS = 10 V, ID = 37.5 A -- 9.4 11 mΩ
Forward Transconductance VDS = 40 V, ID = 37.5 A (Note 4) -- 15 -- S
Input Capacitance VDS = 25 V, VGS = 0 V,
Output Capacitance -- 738 959 pF
f = 1.0 MHz
-- 3437 4468 pF
Reverse Transfer Capacitance -- 86 129 pF
Turn-On Delay Time VDD = 37.5 V, ID = 75A,
R
= 25 Ω
Turn-On Rise Time -Turn-Off Delay Time -Turn-Off Fall Time --
G
(Note 4, 5)
Total Gate Charge VDS = 60 V, ID = 75A,
V
= 10 V
Gate-Source Charge -Gate-Drain Charge --
GS
(Note 4, 5)
--
--
43 95
212 434
273 556
147 303
80 104
20
24
-- nC
-- nC
Maximum Continuous Drain-Source Diode Forward Current -- -- 75 A
Maximum Pulsed Drain-Source Diode Forward Current -- -- 300 A
Drain-Source Diode Forward Voltage VGS = 0 V, IS = 75 A -- -- 1.4 V
Reverse Recovery Time VGS = 0 V, IS = 75 A,
dI
/ dt = 100 A/µs (Note 4)
Reverse Recovery Charge -- 145 --
Starting TJ = 25°C
DSS,
F
-- 62 -- ns
ns
ns
ns
ns
nC
nC
FDP75N08A Rev. A2
2 www.fairchildsemi.com
Typical Performance Characteristics
Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics
-550C
* Note :
1. V
=40V
DS
2. 250
µs Pulse Test
V
GS
Top: 15.0V
9.0V
7.5V
2
10
, Drain Current [A]
D
I
1
10
7.0V
6.5v
6.0V
5.5V
5.0V
Bottom : 4.5V
0
10
* Note :
1. 250
µs Pulse Test
=250C
2. T
C
VDS, Drain-Source Voltage [V]
1
10
100
10
, Drain Current [A]
D
I
1
246810
150
25
0
C
0
C
VGS, Gate-Source Voltage [V]
Figure 3. On-Resistance Variation vs. Figure 4. Body Diode Forward Voltage
Drain Current and Gate Voltage Variation vs. Source Current
and Temperatue
FDP75N08A 75V N-Channel MOSFET
0.012
0.011
VGS = 10V
0.010
[Ω],
DS(ON)
0.009
R
0.008
Drain-Source On-Resistance
0.007
0 25 50 75 100 125 150 175 200
VGS = 20V
ID, Drain Current [A]
* Note : TJ = 25oC
2
10
1
10
, Reverse Drain Current [A]
DR
I
0
10
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6
1500C
VDS, Source-Drain Violtage [V]
250C
* Note :
1. V
=0V
GS
2. 250
µs Pulse Test
Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics
C
= Cgs + Cgd (Cds = shorted)
6000
5000
4000
3000
2000
Capacitances [pF]
1000
0
-1
10
C
oss
C
iss
C
rss
0
10
iss
C
oss
C
rss
= Cds + C
= C
gd
10
gd
* Note :
1. V
2. f = 1 MHz
1
GS
= 0 V
VDS, Drain-Source Voltage [V]
12
10
VDS = 15V
VDS = 37.5V
8
6
4
, Gate-Source Voltage [V]
2
GS
V
0
0 10203040506070
VDS = 60V
* Note : ID = 75A
QG, Total Gate Charge [nC]
FDP75N08A Rev. A2
3 www.fairchildsemi.com