Fairchild FDP75N08 service manual

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FDP75N08
75V N-Channel MOSFET
FDP75N08 75V N-Channel MOSFET
June 2006
TM
UniFET
• 75A, 75V, R
• Low gate charge ( typical 150 nC)
• Low Crss ( typical 85 pF)
•Fast switching
• 100% avalanche tested
• Improved dv/dt capability
= 0.011 @VGS = 10 V
DS(on)
G
D
S
TO-220
FDP Series
Description
These N-Channel enhancement mode power field effect transistors are produced using Fairchild’s proprietary, planar stripe, DMOS technology. This advanced technology has been especially tailored to minimize on-state resistance, provide superior switching performance, and withstand high energy pulse in the avalanche and commutation mode. These devices are well suited for high efficient switched mode power supplies, active power factor correction, electronic lamp ballast based on half bridge topology.
D
G
S
Absolute Maximum Ratings
Symbol Parameter FDP75N08 Units
V
DSS
I
D
I
DM
V
GSS
E
AS
I
AR
E
AR
dv/dt Peak Diode Recovery dv/dt P
D
T
, T
J
STG
T
L
Drain-Source Voltage 75 V Drain Current - Continuous (TC = 25°C) 75 A
- Continuous (T Drain Current - Pulsed Gate-Source Voltage ± 20 V Single Pulsed Avalanche Energy Avalanche Current Repetitive Avalanche Energy
Power Dissipation (TC = 25°C) 131 W
- Derate above 25°C 1 W/°C Operating and Storage Temperature Range -55 to +150 °C Maximum lead temperature for soldering purposes,
1/8" from case for 5 seconds
= 100°C) 47.7 A
C
(Note 1)
(Note 2) (Note 1) (Note 1) (Note 3)
300 A
1164 mJ
75 A
13.1 mJ
4.5 V/ns
300 °C
Thermal Characteristics
Symbol Parameter FDP75N08 Units
R
θJC
R
θCS
R
θJA
©2006 Fairchild Semiconductor Corporation 1 www.fairchildsemi.com
FDP75N08 Rev. A
Thermal Resistance, Junction-to-Case 0.95 °C/W Thermal Resistance, Case-to-Sink 0.5 °C/W Thermal Resistance, Junction-to-Ambient 62.5 °C/W
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
FDP75N08 FDP75N08 TO-220 -- -- 50
FDP75N08 75V N-Channel MOSFET
Electrical Characteristics T
= 25°C unless otherwise noted
C
Symbol Parameter Test Conditions Min Typ Max Units
Off Characteristics
BV
DSS
BVT
J
I
DSS
I
GSSF
I
GSSR
On Characteristics V
GS(th)
R
DS(on)
g
FS
Dynamic Characteristics C
iss
C
oss
C
rss
Switching Characteristics t
d(on)
t
r
t
d(off)
t
f
Q
g
Q
gs
Q
gd
Drain-Source Diode Characteristics and Maximum Ratings I
S
I
SM
V
SD
t
rr
Q
rr
NOTES:
1. Repetitive Rating : Pulse width limited by maximum junction temperature
2. L = 138µH, IAS = 75A, VDD = 50V, RG = 25 Ω, Starting TJ = 25°C
3. ISD 75A, di/dt 200A/µs, VDD BV
4. Pulse Test : Pulse width 300µs, Duty cycle 2%
5. Essentially independent of operating temp er at ur e
Drain-Source Breakdown Voltage VGS = 0 V, ID = 250 µA75----V
/
DSS
Breakdown Voltage Temperature Coefficient ID = 250 µA, Referenced to 25°C -- 0.6 -- V/°C Zero Gate Voltage Drain Current VDS = 75 V, VGS = 0 V -- -- 1 µA
= 60 V, TC = 125°C -- -- 10 µA
V
DS
Gate-Body Leakage Current, Forward VGS = 20 V, VDS = 0 V -- -- 100 nA Gate-Body Leakage Current, Reverse VGS = -20 V, VDS = 0 V -- -- -100 nA
Gate Threshold Voltage VDS = VGS, ID = 250 µA2.0--4.0V Static Drain-Source On-Resistance VGS = 10 V, ID = 37.5 A -- 9.5 11 m Forward Transconductance VDS = 40 V, ID =37.5 A (Note 4) -- 15 -- S
Input Capacitance VDS = 25 V, VGS = 0 V, Output Capacitance -- 680 890 pF
f = 1.0 MHz
-- 2940 3820 pF
Reverse Transfer Capacitance -- 85 125 pF
Turn-On Delay Time VDD = 37.5 V, ID = 75A,
R
= 25
Turn-On Rise Time -­Turn-Off Delay Time -­Turn-Off Fall Time --
G
(Note 4, 5)
Total Gate Charge VDS = 60 V, ID = 75A,
V
= 10 V
Gate-Source Charge -­Gate-Drain Charge --
GS
(Note 4, 5)
--
--
7.2 25 68 146 77 164 93 196 64 84 16 24
-- nC
-- nC
Maximum Continuous Drain-Source Diode Forward Current -- -- 75 A Maximum Pulsed Drain-Source Diode Forward Current -- -- 300 A Drain-Source Diode Forward Voltage VGS = 0 V, IS = 75 A -- -- 1.4 V Reverse Recovery Time VGS = 0 V, IS = 75 A,
dI
/ dt = 100 A/µs (Note 4)
Reverse Recovery Charge -- 150 -- nC
Starting TJ = 25°C
DSS,
F
-- 62 -- ns
ns ns ns ns
nC
FDP75N08 Rev. A
2 www.fairchildsemi.com
Typical Performance Characteristics
Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics
-550C
* Note :
1. V
=40V
DS
2. 250
µs Pulse Test
V
GS
Top: 15.0V
9.0V
7.5V
2
10
7.0V
6.5v
6.0V
5.5V
5.0V Bottom : 4.5V
100
150
25
0
C
0
C
10
, Drain Current [A]
D
I
1
10
* Note :
1. 250
µs Pulse Test
=250C
2. T
C
0
10
VDS, Drain-Source Voltage [V]
1
10
, Drain Current [A]
D
I
1
246810
VGS, Gate-Source Voltage [V]
Figure 3. On-Resistance Variation vs. Figure 4. Body Diode Forward Voltage
Drain Current and Gate Voltage Variation vs. Source Current
and Temperatue
FDP75N08 75V N-Channel MOSFET
0.012
0.011
VGS = 10V
0.010
[],
DS(ON)
0.009
R
0.008
Drain-Source On-Resistance
0.007 0 25 50 75 100 125 150 175 200
VGS = 20V
ID, Drain Current [A]
* Note : TJ = 25oC
2
10
1
10
, Reverse Drain Current [A]
DR
I
0
10
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6
1500C
VDS, Source-Drain Violtage [V]
250C
* Note :
1. V
=0V
GS
2. 250
µs Pulse Test
Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics
C
= Cgs + Cgd (Cds = shorted)
6000
C
5000
4000
3000
2000
Capacitances [pF]
1000
0
-1
10
oss
C
iss
C
rss
0
10
iss
C
oss
C
rss
= Cds + C
= C
gd
10
gd
* Note :
1. V
2. f = 1 MHz
1
GS
= 0 V
VDS, Drain-Source Voltage [V]
12
10
8
6
4
, Gate-Source Voltage [V]
2
GS
V
0
0 1020304050607080
VDS = 37.5V
VDS = 60V
* Note : ID = 75A
QG, Total Gate Charge [nC]
FDP75N08 Rev. A
3 www.fairchildsemi.com
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