Fairchild FDP12N50U, FDPF12N50UT service manual

tm
May 2012
D
G
S
TO-220F FDPF Series
G
S
D
TO-220 FDP Series
G D S
Ultra FRFET
FDP12N50U / FDPF12N50UT
N-Channel MOSFET, FRFET
500V, 10A, 0.8Ω
FDP12N50U / FDPF12N50UT N-Channel MOSFET
Features
•R
• Low gate charge ( Typ. 21nC)
• Low C
• Fast switching
• 100% avalanche tested
• Improved dv/dt capability
• RoHS compliant
MOSFET Maximum Ratings T
V
DSS
V
GSS
I
D
I
DM
E
AS
I
AR
E
AR
dv/dt Peak Diode Recovery dv/dt (Note 3) 20 V/ns
P
D
, T
T
J
T
L
*Drain current limited by maximum junction temperature
= 0.65Ω ( Typ.)@ VGS = 10V, ID = 5A
DS(on)
( Typ. 11pF)
rss
Symbol Parameter FDP12N50U FDPF12N50UT Units
Drain to Source Voltage 500 V
Gate to Source Voltage ±30 V
Drain Current
Drain Current - Pulsed (Note 1) 40 40* A
Single Pulsed Avalanche Energy (Note 2) 456 mJ
Avalanche Current (Note 1) 10 A
Repetitive Avalanche Energy (Note 1) 16.5 mJ
Power Dissipation
STG
Operating and Storage Temperature Range -55 to +150 Maximum Lead Temperature for Soldering Purpose,
1/8” from Case for 5 Seconds
= 25oC unless otherwise noted*
C
-Continuous (T
-Continuous (T
(T
= 25oC) 165 42 W
C
- Derate above 25
Description
These N-Channel enhancement mode power field effect transis­tors are produced using Fairchild’s proprietary, planar stripe, DMOS technology.
This advance technology has been especially tailored to mini­mize on-state resistance, provide superior switching perfor­mance, and withstand high energy pulse in the avalanche and commutation mode. These devices are well suited for high effi­cient switching mode power supplies and active power factor correction.
= 25oC) 10 10*
C
= 100oC) 6 6*
C
o
C 1.33 0.3 W/oC
300
o
o
Thermal Characteristics
Symbol Parameter FDP12N50U FDPF12N50UT Units
R
θJC
θCS
R
θJA
Thermal Resistance, Junction to Case 0.75 3.0
Thermal Resistance, Junction to Ambient 0.5 -
Thermal Resistance, Junction to Ambient 62.5 62.5
o
C/WR
A
C
C
©2012 Fairchild Semiconductor Corporation FDP12N50U / FDPF12N50UT Rev.C1
www.fairchildsemi.com1
FDP12N50U / FDPF12N50UT N-Channel MOSFET
Package Marking and Ordering Information T
= 25oC unless otherwise noted
C
Device Marking Device Package Reel Size Tape Width Quantity
FDP12N50U FDP12N50U TO-220 - - 50
FDPF12N50UT FDPF12N50UT TO-220F - - 50
Electrical Characteristics
Symbol Parameter Test Conditions Min. Typ. Max. Units
Off Characteristics
BV
DSS
ΔBV
DSS
ΔT
J
I
DSS
I
GSS
On Characteristics
V
GS(th)
R
DS(on)
g
FS
Dynamic Characteristics
C
iss
C
oss
C
rss
Q
g(tot)
Q
gs
Q
gd
Drain to Source Breakdown Voltage ID = 250μA, VGS = 0V, TJ = 25oC 500 - - V Breakdown Voltage Temperature
Coefficient
Zero Gate Voltage Drain Current
Gate to Body Leakage Current VGS = ±30V, V
I
= 250μA, Referenced to 25oC-0.7-V/
D
V
= 500V, V
DS
= 400V, TC = 125oC - - 250
V
DS
= 0V - - 25
GS
= 0V - - ±100 nA
DS
Gate Threshold Voltage VGS = VDS, ID = 250μA3.0-5.0V
Static Drain to Source On Resistance VGS = 10V, ID = 5A - 0.65 0.8 Ω
Forward Transconductance VDS = 40V, ID = 5A (Note 4) -11 -S
Input Capacitance
Output Capacitance - 140 190 pF
Reverse Transfer Capacitance - 11 17 pF
= 25V, VGS = 0V
V
DS
f = 1MHz
Total Gate Charge at 10V
V
= 400V, ID = 10A
Gate to Source Gate Charge - 6 - nC
Gate to Drain “Miller” Charge - 9 - nC
DS
V
= 10V
GS
( Note 4 , 5)
- 1050 1395 pF
-2130nC
μA
o
C
Switching Characteristics
t
d(on)
t
r
t
d(off)
t
f
Turn-On Delay Time
Turn-On Rise Time - 45 100 ns
Turn-Off Delay Time - 60 130 ns
Turn-Off Fall Time - 35 80 ns
Drain-Source Diode Characteristics
I
S
I
SM
V
SD
t
rr
Q
rr
Notes:
1. Repetitive Rating: Pulse width limited by maximum junction temperature
2. L = 9mH, I
3. I
10A, di/dt 200A/μs, VDD BV
SD
4. Pulse Test: Pulse width 300μs, Duty Cycle 2%
5. Essentially Independent of Operating Temperature Typical Characteristics
Maximum Continuous Drain to Source Diode Forward Current - - 10 A
Maximum Pulsed Drain to Source Diode Forward Current - - 40 A
Drain to Source Diode Forward Voltage V
Reverse Recovery Time
Reverse Recovery Charge - 0.1 - μC
= 10A, VDD = 50V, RG = 25Ω, Starting TJ = 25°C
AS
, Starting TJ = 25°C
DSS
= 250V, ID = 10A
V
DD
R
= 25Ω
G
(N ote 4, 5)
= 0V, I
GS
V
= 0V, I
GS
dI
/dt = 100A/μs (Note 4)
F
= 10A - - 1.6 V
SD
= 10A
SD
-3580ns
-65-ns
FDP12N50U / FDPF12N50UT Rev.C1
2
www.fairchildsemi.com
Typical Performance Characteristics
110
1
10
30
*Notes:
1. 250
μs Pulse Test
2. T
C
= 25oC
V
GS
= 15.0 V
10.0 V
8.0 V
7.0 V
6.5 V
6.0 V
5.5 V
I
D
,Drain Current[A]
VDS,Drain-Source Voltage[V]
20
4.0 4.5 5.0 5.5 6.0 6.5 7.0
1
10
150oC
*Notes:
1. V
DS
= 20V
2. 250
μs Pulse Test
25oC
I
D
,Drain Current[A]
VGS,Gate-Source Voltage[V]
30
0 5 10 15 20 25
0.6
0.8
1.0
1.2
1.4
*Note: TJ = 25oC
VGS = 20V
VGS = 10V
R
DS(ON)
[Ω],
Drain-Source On-Resistance
ID, Drain Current [A]
0.0 0.5 1.0 1.5 2.0 2.5
1
10
100
*Notes:
1. VGS = 0V
2. 250
μs Pulse Test
150oC
I
S
, Reverse Drain Current [A]
VSD, Body Diode Forward Voltage [V]
25oC
0.1 1 10
0
500
1000
1500
2000
C
oss
C
iss
C
iss
= Cgs + Cgd (Cds = shorted)
C
oss
= Cds + C
gd
C
rss
= C
gd
*Note:
1. V
GS
= 0V
2. f = 1MHz
C
rss
Capacitances [pF]
VDS, Drain-Source Voltage [V]
30
0 5 10 15 20 25
0
2
4
6
8
10
*Note: ID = 10A
VDS = 100V V
DS
= 250V
V
DS
= 400V
V
GS
, Gate-Source Voltage [V]
Qg, Total Gate Charge [nC]
Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics
Figure 3. On-Resistance Variation vs. Figure 4. Body Diode Forward Voltage
Drain Current and Gate Voltage Variation vs. Source Current
and Temperature
FDP12N50U / FDPF12N50UT N-Channel MOSFET
Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics
FDP12N50U / FDPF12N50UT Rev.C1
3
www.fairchildsemi.com
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