FDP12N50F / FDPF12N50FT
TO-220
FDP Series
D
G
S
TO-220F
FDPF Series
G
S
D
G D S
N-Channel MOSFET
500V, 11.5A, 0.7Ω
FDP12N50F / FDPF12N50FT N-Channel MOSFET
November 2011
TM
UniFET
Features
•R
• Low gate charge ( Typ. 21nC)
• Low C
• Fast switching
• 100% avalanche tested
• Improve dv/dt capability
• RoHS compliant
MOSFET Maximum Ratings T
V
DSS
V
GSS
I
D
I
DM
E
AS
I
AR
E
AR
dv/dt Peak Diode Recovery dv/dt (Note 3) 20 V/ns
P
D
, T
T
J
T
L
*Drain current limited by maximum junction temperature
= 0.59Ω ( Typ.)@ VGS = 10V, ID = 6A
DS(on)
( Typ. 11pF)
rss
= 25oC unless otherwise noted
C
Symbol Parameter FDP12N50F FDPF12N50FT Units
Drain to Source Voltage 500 V
Gate to Source Voltage ±30 V
-Continuous (T
-Continuous (T
(T
= 25oC) 165 42 W
C
- Derate above 25
STG
D r a i n C u r r e n t
D r a i n C u r r e n t - P u l s e d (Note 1) 46 46* A
Single Pulsed Avalanche Energy (Note 2) 456 mJ
Avalanche Current (Note 1) 11.5 A
Repetitive Avalanche Energy (Note 1) 16.5 mJ
Power Dissipation
Operating and Storage Temperature Range -55 to +150
Maximum Lead Temperature for Soldering Purpose,
1/8” from Case for 5 Seconds
Description
These N-Channel enhancement mode power field effect transistors are produced using Fairchild’s proprietary, planar stripe,
DMOS technology.
This advance technology has been especially tailored to minimize on-state resistance, provide superior switching performance, and withstand high energy pulse in the avalanche and
commutation mode. These devices are well suited for high efficient switching mode power supplies and active power factor
correction.
= 25oC) 11.5 11.5*
C
= 100oC) 6.9 6.9*
C
o
C1.330.33W/
300
o
o
Thermal Characteristics
Symbol Parameter FDP12N50F FDPF12N50FT Units
R
θJC
θCS
R
θJA
Thermal Resistance, Junction to Case 0.75 3.0
Thermal Resistance, Case to Sink Typ. 0.5 -
Thermal Resistance, Junction to Ambient 62.5 62.5
o
C/WR
A
o
C
C
C
©2011 Fairchild Semiconductor Corporation
FDP12N50F / FDPF12N50FT Rev. C1
www.fairchildsemi.com1
FDP12N50F / FDPF12N50FT N-Channel MOSFET
Package Marking and Ordering Information T
= 25oC unless otherwise noted
C
Device Marking Device Package Reel Size Tape Width Quantity
FDP12N50F FDP12N50F TO-220 - - 50
FDPF12N50FT FDPF12N50FT TO-220F - - 50
Electrical Characteristics
Symbol Parameter Test Conditions Min. Typ. Max. Units
Off Characteristics
BV
DSS
ΔBV
DSS
/ ΔT
J
I
DSS
I
GSS
On Characteristics
V
GS(th)
R
DS(on)
g
FS
Dynamic Characteristics
C
iss
C
oss
C
rss
Q
g(tot)
Q
gs
Q
gd
Drain to Source Breakdown Voltage ID = 250μA, VGS = 0V, TJ = 25oC 500 - - V
Breakdown Voltage Temperature
Coefficient
Zero Gate Voltage Drain Current
Gate to Body Leakage Current VGS = ±30V, V
I
= 250μA, Referenced to 25oC-0.5-V/
D
V
= 500V, V
DS
= 400V, TC = 125oC - - 100
V
DS
= 0V - - 10
GS
= 0V - - ±100 nA
DS
Gate Threshold Voltage VGS = VDS, ID = 250μA3.0-5.0V
Static Drain to Source On Resistance VGS = 10V, ID = 6A - 0.59 0.7 Ω
Forward Transconductance VDS = 40V, ID = 6A (Note 4) -12-S
Input Capacitance
Output Capacitance - 135 180 pF
Reverse Transfer Capacitance - 11 17 pF
= 25V, VGS = 0V
V
DS
f = 1MHz
Total Gate Charge at 10V
V
= 400V, ID = 11.5A
Gate to Source Gate Charge - 6 - nC
Gate to Drain “Miller” Charge - 9 - nC
DS
V
= 10V
GS
( Note 4 , 5)
- 1050 1395 pF
-2130nC
μA
o
C
Switching Characteristics
t
d(on)
t
r
t
d(off)
t
f
Turn-On Delay Time
Turn-On Rise Time - 45 100 ns
Turn-Off Delay Time - 50 110 ns
Turn-Off Fall Time - 35 80 ns
Drain-Source Diode Characteristics
I
S
I
SM
V
SD
t
rr
Q
rr
Notes:
1. Repetitive Rating: Pulse width limited by maximum junction temperature
2. L = 6.9mH, I
≤ 11.5A, di/dt ≤ 200A/μs, VDD ≤ BV
3. I
SD
4. Pulse Test: Pulse width ≤ 300μs, Duty Cycle ≤ 2%
5. Essentially Independent of Operating Temperature Typical Characteristics
Maximum Continuous Drain to Source Diode Forward Current - - 11.5 A
Maximum Pulsed Drain to Source Diode Forward Current - - 46 A
Drain to Source Diode Forward Voltage V
Reverse Recovery Time
Reverse Recovery Charge - 0.37 - μC
= 11.5A, VDD = 50V, RG = 25Ω, Starting TJ = 25°C
AS
, Starting TJ = 25°C
DSS
= 250V, ID = 11.5A
V
DD
R
= 25Ω
G
(N ote 4, 5)
= 0V, I
GS
= 0V, I
V
GS
dI
/dt = 100A/μs (Note 4)
F
= 11.5A - - 1.5 V
SD
= 11.5A
SD
-2150ns
- 134 - ns
FDP12N50F / FDPF12N50FT Rev. C1
2
www.fairchildsemi.com
Typical Performance Characteristics
0.1 1 10
0.1
1
10
0.05
20
*Notes:
1. 250
μs Pulse Test
2. T
C
= 25oC
V
GS
= 10.0 V
8.0 V
7.0 V
6.5 V
6.0 V
5.5 V
I
D
,Drain Current[A]
VDS,Drain-Source Voltage[V]
30
45678
1
10
150oC
* Notes :
1. V
DS
= 20V
2. 250
μs Pulse Test
25oC
I
D
,Drain Current[A]
VGS,Gate-Source Voltage[V]
30
0.0 0.5 1.0 1.5 2.0
1
10
100
Notes:
1. VGS = 0V
2. 250
μs Pulse Test
150oC
I
S
, Reverse Drain Current [A]
VSD, Body Diode Forward Voltage [V]
25oC
061218
0.5
0.6
0.7
0.8
0.9
* Note : TJ = 25oC
VGS = 20V
VGS = 10V
R
DS(on)
[Ω],
Drain-Source On-Resistance
ID, Drain Current [A]
0.1 1 10
0
500
1000
1500
2000
C
oss
C
iss
C
iss
= Cgs + Cgd (Cds = shorted)
C
oss
= Cds + C
gd
C
rss
= C
gd
* Note:
1. V
GS
= 0V
2. f = 1MHz
C
rss
Capacitances [pF]
VDS, Drain-Source Voltage [V]
30
0 4 8 12 16 20 24
0
2
4
6
8
10
* Note : ID = 11.5A
VDS = 100V
V
DS
= 250V
V
DS
= 400V
V
GS
, Gate-Source Voltage [V]
Qg, Total Gate Charge [nC]
Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics
Figure 3. On-Resistance Variation vs. Figure 4. Body Diode Forward Voltage
Drain Current and Gate Voltage Variation vs. Source Current
and Temperature
FDP12N50F / FDPF12N50FT N-Channel MOSFET
Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics
FDP12N50F / FDPF12N50FT Rev. C1
3
www.fairchildsemi.com