FDMS4435BZ
Bottom
Power 56
Top
Pin 1
G
S
S
S
D
D
D
D
4
3
2
1
G
S
S
S
D
D
D
D
5
6
7
8
P-Channel PowerTrench® MOSFET
-30 V, -18 A, 20 mΩ
Features
Max r
Max r
Extended V
High performance trench technology for extremely low r
High power and current handling capability
HBM ESD protection level >7 kV typical (Note 4)
100% UIL tested
Termination is Lead-free and RoHS Compliant
= 20 mΩ at VGS = -10 V, ID = -9.0 A
DS(on)
= 37 mΩ at VGS = -4.5 V, ID = -6.5 A
DS(on)
range (-25 V) for battery applications
GSS
DS(on)
General Description
This P-Channel MOSFET is produced using Fairchild
Semiconductor’s advanced Power Trench
been especially tailored to minimize the on-state resistance. This
device is well suited for Power Management and load
switching applications common in Notebook Computers and
Portable Battery Packs.
Applications
High side in DC-DC Buck Converters
Notebook battery power management
Load switch in Notebook
March 2011
®
process that has
FDMS4435BZ P-Channel Power Trench
®
MOSFET
MOSFET Maximum Ratings T
Symbol Parameter Ratings Units
V
DS
V
GS
I
D
E
AS
P
D
, T
T
J
STG
Drain to Source Voltage -30 V
Gate to Source Voltage ±25 V
Drain Current -Continuous (Package limited) TC = 25 °C -18
-Continuous (Silicon limited) T
-Continuous T
-Pulsed -50
Single Pulse Avalanche Energy (Note 3) 18 mJ
Power Dissipation TC = 25 °C 39
Power Dissipation T
Operating and Storage Junction Temperature Range -55 to +150 °C
= 25 °C unless otherwise noted
A
= 25 °C -35
C
= 25 °C (Note 1a) -9.0
A
= 25 °C (Note 1a) 2.5
A
A
W
Thermal Characteristics
R
θJC
R
θJA
Thermal Resistance, Junction to Case 3.2
Thermal Resistance, Junction to Ambient (Note 1a) 50
°C/W
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
FDMS4435BZ FDMS4435BZ Power 56 13 ’’ 12 mm 3000 units
©2011 Fairchild Semiconductor Corporation
FDMS4435BZ Rev.C3
1
www.fairchildsemi.com
FDMS4435BZ P-Channel PowerTrench
Electrical Characteristics T
= 25 °C unless otherwise noted
J
Symbol Parameter Test Conditions Min Typ Max Units
Off Characteristics
BV
ΔBV
ΔT
I
DSS
I
GSS
DSS
DSS
J
Drain to Source Breakdown Voltage ID = -250 μA, VGS = 0 V -30 V
Breakdown Voltage Temperature
Coefficient
Zero Gate Voltage Drain Current VDS = -24 V, V
Gate to Source Leakage Current VGS = ±25 V, V
I
= -250 μA, referenced to 25 °C -23 mV/°C
D
= 0 V -1 μA
GS
= 0 V ±10 μA
DS
On Characteristics
V
GS(th)
ΔV
ΔT
r
DS(on)
g
FS
GS(th)
J
Gate to Source Threshold Voltage VGS = VDS, ID = -250 μA -1.0 -1.9 -3.0 V
Gate to Source Threshold Voltage
Temperature Coefficient
Static Drain to Source On Resistance
I
= -250 μA, referenced to 25 °C 6 mV/°C
D
= -10 V, ID = -9.0 A 15 20
V
GS
V
= -4.5 V, ID = -6.5 A 22 37
GS
= -10 V, ID = -9.0 A
V
GS
T
J
= 125 °C
21 28
Forward Transconductance VDS = -5 V, ID = -9.0 A 25 S
Dynamic Characteristics
C
iss
C
oss
C
rss
R
g
Input Capacitance
Output Capacitance 290 390 pF
Reverse Transfer Capacitance 260 385 pF
= -15 V, VGS = 0 V,
V
DS
f = 1 MHz
Gate Resistance 5 Ω
1540 2050 pF
mΩ
®
MOSFET
Switching Characteristics
t
d(on)
t
r
t
d(off)
t
f
Q
g
Q
g
Q
gs
Q
gd
Turn-On De lay Time
Rise Time 10 18 ns
Turn-Off Delay Time 35 56 ns
Fall Time 19 33 ns
Total Gate Charge VGS = 0 V to -10 V
Total Gate Charge VGS = 0 V to -4.5 V 18 25 nC
Gate to Source Charge 5 nC
Gate to Drain “Miller” Charge 9 nC
= -15 V, ID = -9.0 A,
V
DD
V
= -10 V, R
GS
GEN
Drain-Source Diode Characteristics
V
= 0 V, IS = -1.9 A (Note 2) 0.75 1.2
V
SD
t
rr
Q
rr
Notes:
is determined with the device mounted on a 1 in2 pad 2 oz copper pad on a 1 .5 x 1.5 in . boa rd o f FR- 4 m ateria l. R
1. R
θJA
the user's board design.
Source to Drain Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge 12 21 nC
50 °C/W when mounted on a
a)
2
1 in
pad of 2 oz copper
GS
= 0 V, IS = -9.0 A (Note 2) 0.86 1.5
V
GS
= -9.0 A, di/dt = 100 A/μs
I
F
= 6 Ω
V
DD
I
= -9.0 A
D
= -15 V,
θJC
917ns
34 47 nC
25 39 ns
is guaranteed by design while R
b) 125 °C/W when mounted
on a minimum pad of 2 oz copper.
is determined by
θCA
V
2. Pulse Test: Pulse Width < 300 μs, Duty cycle < 2.0%.
3. E
of 18 mJ is based on starting TJ = 25 °C, L = 1 mH, IAS = -6 A, VDD = -27 V, VGS = -10 V. 100% tested at L = 0.3 mH, IAS = -8 A.
AS
4. The diode connected between the gate and source serves only as protection against ESD. No gate overvoltage rating is implied.
©2011 Fairchild Semiconductor Corporation
FDMS4435BZ Rev.C3
2
www.fairchildsemi.com
FDMS4435BZ P-Channel PowerTrench
01234
0
10
20
30
40
50
VGS = -6 V
VGS = -3.5 V
VGS = -10 V
VGS = -4 V
VGS = -4.5 V
PULSE DURATION = 80 μs
DUTY CYCLE = 0.5% MAX
-I
D
, DRAIN CURRENT (A)
-VDS, DRAIN TO SOURCE VOLTAGE (V)
0 1020304050
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
VGS = -4 V
VGS = -3.5 V
VGS = -6 V
PULSE DURATION = 80 μs
DUTY CYCLE = 0.5% MAX
NORMALIZED
DRAIN TO SOURCE ON-RESISTA NCE
-ID, DRAIN CURRENT (A)
VGS = -4.5 V
V
GS
= -10 V
-75 -50 -25 0 25 50 75 100 125 150
0.6
0.8
1.0
1.2
1.4
1.6
ID = - 9 A
V
GS
= -10 V
NORMALIZED
DRAIN TO SOURCE ON-RESISTANCE
T
J
, JUNCTION TEMPERATURE (
o
C)
246810
0
20
40
60
80
TJ = 125 oC
ID = -9 A
TJ = 25 oC
-V
GS
, GATE TO SOURCE V OLTAGE (V )
r
DS(on)
,
DRAIN TO
SOURCE ON-RESISTANCE
(mΩ)
PULSE DURATION = 80 μs
DUTY CYCLE = 0.5% MAX
12345
0
10
20
30
40
50
TJ = 25 oC
V
DS
= -5 V
PULSE DURATION = 80 μs
DUTY CYCLE = 0.5% MAX
TJ = -55 oC
TJ = 125 oC
-I
D
, DRAIN CURRENT (A)
-VGS, GATE TO SOURCE VO LTAGE (V)
0.00.20.40.60.81.01.21.4
0.001
0.01
0.1
1
10
50
TJ = -55 oC
TJ = 25 oC
TJ = 125 oC
V
GS
= 0 V
-I
S
, REVERSE DRAIN CURRENT (A)
-VSD, BODY DIODE FORWARD VOLTAGE (V)
Typical Characteristics T
Figure 1.
On-Region Characteristics Figure 2.
= 25 °C unless otherwise noted
J
Nor mal ize d On-R esi sta nce
vs Drain Current and Gate Voltage
®
MOSFET
Figur e 3. No rma li zed On - Re si sta nc e
vs Junction Temperature
©2011 Fairchild Semiconductor Corporation
FDMS4435BZ Rev.C3
Figure 5. Transfer Characteristics
Figure 4.
On-Resist ance vs Gate to
Source Voltage
Figure 6.
Source to D rain Diode
Forward Voltage vs Source Current
3
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