Fairchild FDME1034CZT service manual

FDME1034CZT
G2
S1
G1
D2
S2
D1
MicroFET 1.6x1.6 Thin
D1
D2
TOP
BOTTOM
Pin 1
Complementary PowerTrench® MOSFET
N-channel: 20 V, 3.8 A, 66 mΩ P-channel: -20 V, -2.6 A, 142 mΩ
FDME1034CZT Complementary PowerTrench
July 2010
Features
Q1: N-Channel
Max rMax rMax rMax r
Q2: P-Channel
Max rMax rMax rMax r
Low profile: 0.55 mm maximum in the new package
MicroFET 1.6x1.6 Thin
Free from halogenated compounds and antimony
oxides
HBM ESD protection level > 1600 V (Note 3)RoHS Compliant
= 66 mΩ at VGS = 4.5 V, ID = 3.4 A
DS(on)
= 86 mΩ at VGS = 2.5 V, ID = 2.9 A
DS(on)
= 113 mΩ at VGS = 1.8 V, ID = 2.5 A
DS(on)
= 160 mΩ at VGS = 1.5 V, ID = 2.1 A
DS(on)
= 142 mΩ at VGS = -4.5 V, ID = -2.3 A
DS(on)
= 213 mΩ at VGS = -2.5 V, ID = -1.8 A
DS(on)
= 331 mΩ at VGS = -1.8 V, ID = -1.5 A
DS(on)
= 530 mΩ at VGS = -1.5 V, ID = -1.2 A
DS(on)
General Description
This device is designed specifically as a single package solution for a DC/DC ‘Switching’ MOSFET in cellular handset and other ultra-portable applications. It features an independent N-Channel & P-Channel MOSFET with low on-state resistance for minimum conduction losses. The gate charge of each MOSFET is also minimized to allow high frequency switching directly from the controlling device.
The MicroFET 1.6x1.6 Thin package offers exceptional thermal performance for it's physical size and is well suited to switching and linear mode applications.
Applications
DC-DC ConversionLevel Shifted Load Switch
®
MOSFET
MOSFET Maximum Ratings T
Symbol Parameter Q1 Q2 Units
V
DS
V
GS
I
D
P
D
, T
T
J
STG
Thermal Characteristics
R
θJA
R
θJA
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
©2010 Fairchild Semiconductor Corporation 1 www.fairchildsemi.com FDME1034CZT Rev.C1
Drain to Source Voltage 20 -20 V Gate to Source Voltage ±8 ±8 V Drain Current -Continuous TA = 25 °C (Note 1a) 3.8 -2.6
-Pulsed 6 -6 Power Dissipation for Single Operation TA = 25 °C (Note 1a) 1.4 Power Dissipation for Single Operation T Operating and Storage Junction Temperature Range -55 to +150 °C
Thermal Resistance, Junction to Ambient (Single Operation) (Note 1a) 90 Thermal Resistance, Junction to Ambient (Single Operation) (Note 1b) 195
5T FDME1034CZT MicroFET 1.6x1.6 Thin 7 ’’ 8 mm 5000 units
= 25 °C unless otherwise noted
A
= 25 °C (Note 1b) 0.6
A
A
W
°C/W
FDME1034CZT Complementary PowerTrench
Electrical Characteristics T
= 25 °C unless otherwise noted
J
Symbol Parameter Test Conditions Type Min Typ Max Units
Off Characteristics
BV
ΔBV ΔT
I
DSS
I
GSS
DSS
DSS J
= 250 μA, VGS = 0 V
Drain to Source Breakdown Voltage Breakdown Voltage Temperature
Coefficient Zero Gate Voltage Drain Current
D
I
= -250 μA, VGS = 0 V
D
ID = 250 μA, referenced to 25 °C I
= -250 μA, referenced to 25 °CQ1Q2
D
V
= 16 V, V
DS
V
= -16 V, V
DS
Gate to Source Leakage Current VGS = ±8 V, V
= 0 V
GS
= 0 V
GS
= 0 V All ±10 μA
DS
Q1 Q220-20
Q1 Q2
V
16
-12
mV/°C
1
-1
I
On Characteristics
V
V
GS(th)
ΔV ΔT
r
DS(on)
g
FS
GS(th)
J
Gate to Source Threshold Voltage Gate to Source Threshold Voltage
Temperature Coefficient
Drain to Source On Resistance
Forward Transconductance
= VDS, ID = 250 μA
GS
V
= VDS, ID = -250 μA
GS
I
= 250 μA, referenced to 25 °C
D
V
= 4.5 V, ID = 3.4 A
GS
= 2.5 V, ID = 2.9 A 68 86
V
GS
= 1.8 V, ID = 2.5 A 85 113
V
GS
= 1.5 V, ID = 2.1 A 106 160
V
GS
= 4.5 V, ID = 3.4 A,
V
GS
T
=125°C
J
V
= -4.5 V, ID = -2.3 A
GS
= -2.5 V, ID = -1.8 A 120 213
V
GS
= -1.8 V, ID = -1.5 A 150 331
V
GS
= -1.5 V, ID = -1.2 A 190 530
V
GS
= -4.5 V, ID = -2.3 A ,
V
GS
T
= 125 °C
J
V
= 4.5 V, ID =3.4 A
DS
V
= -4.5 V, ID = -2.3 A
DS
Q1Q20.4
-0.4
Q1 Q2
Q1
Q2
Q1 Q2
0.7
-0.6
-3 2
1.0
-1.0
55 66
76 112 95 142
128 190
9 7
mV/°C
μA
V
mΩ
S
®
MOSFET
Dynamic Characteristics
C
iss
C
oss
C
rss
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Switching Characteristics
t
d(on)
t
r
t
d(off)
t
f
Q
Q
g
gs
gd
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Total Gate Charge
Gate to Source Gate Charge
Gate to Drain “Miller” Charge
Q1 V
= 10 V, VGS = 0 V, f = 1 MHz
DS
Q2 V
= -10 V, VGS = 0 V, f = 1 MHz
DS
Q1 Q2
Q1 Q2
Q1 Q2
225 305
40 55
25 50
300 405
55 75
40 75
pF
pF
pF
Q1 V
= 10 V, ID = 1 A,
DD
V
= 4.5 V, R
GS
Q2 V
= -10 V, ID = -1 A,
DD
V
= -4.5 V, R
GS
Q1
= 10 V, ID = 3.4 A,
V
DD
V
= 4.5 V
GS
Q2 V
= -10 V, ID = -2.3 A,
DD
V
= -4.5 V
GS
GEN
GEN
= 6 Ω
= 6 Ω
Q1 Q2
Q1 Q2
Q1 Q2
Q1 Q2
Q1 Q2
Q1 Q2
Q1 Q2
4.5
4.7
2.0
4.8 15
33
1.7 16
3
5.5
0.4
0.6
0.6
1.4
10 10
10 10
27 53
10 29
4.2
7.7
ns
nCQ
©2010 Fairchild Semiconductor Corporation 2 www.fairchildsemi.com FDME1034CZT Rev.C1
Electrical Characteristics T
= 25 °C unless otherwise noted
J
Symbol Parameter Test Conditions Type Min Typ Max Units
Drain-Source Diode Characteristics
V
SD
t
rr
Q
rr
Notes:
1. R
is determined with the device moun ted on a 1 in2 pad 2 oz copper pad on a 1.5 x 1.5 in. boa rd of FR-4 mate rial. R
θJA
the user's board design.
Source to Drain Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Time
V
= 0 V, IS = 0.9 A (Note 2)
GS
V
= 0 V, IS = -0.9 A (Note 2)Q1Q2
GS
Q1 I
= 3.4 A, di/dt = 100 A/μS
F
Q2 I
= -2.3 A, di/dt = 100 A/μs
F
0.7
-0.8
Q1 Q2
Q1 Q2
is guaranteed by design while R
θJC
8.5 16
1.4
4.4
1.2
-1.2 17
29 10
10
is determined by
θCA
FDME1034CZT Complementary PowerTrench
V
ns
nC
a. 90 °C/W when mounted on a 1 in2 pad of 2 oz copper.
2. Pulse Test: Pulse Width < 300 μs, Duty cycle < 2.0%.
3. The diode connected between the gate and source serves only as protection ESD. No gate overvoltage rating is implied.
b. 195 °C/W when mounted on a minimum pad of 2 oz copper.
®
MOSFET
©2010 Fairchild Semiconductor Corporation 3 www.fairchildsemi.com FDME1034CZT Rev.C1
FDME1034CZT Complementary PowerTrench
0.0 0.5 1.0 1.5
0
2
4
6
VGS = 1.8 V
VGS = 3 V
VGS = 4.5 V
VGS = 1.5 V
VGS = 2.5 V
PULSE DURATION = 80 μs DUTY CYCLE = 0.5% MAX
I
D
, DRAIN CURRENT (A)
V
DS
, DRAIN TO SOURCE VOLTAGE (V)
0246
0.5
1.0
1.5
2.0
2.5
3.0
VGS = 2.5 V
VGS = 3 V
NORMALIZED
DRAIN TO SOURCE ON-RESISTANCE
I
D
, DRAIN CURRENT (A)
VGS = 4.5 V
VGS = 1.8 V
VGS = 1.5 V
PULSE DURATION = 80 μs DUTY CYCLE = 0.5% MAX
-75 -50 -25 0 25 50 75 100 125 150
0.6
0.8
1.0
1.2
1.4
1.6
ID = 3.4 A V
GS
= 4.5 V
NORMALIZED
DRAIN TO SOURCE ON-RESISTANCE
T
J
, JUNCTION TEMPERATURE (
o
C)
1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5
0
50
100
150
200
250
300
TJ = 125 oC
ID = 3.4 A
TJ = 25 oC
V
GS
, GATE TO SO U RCE VOLTAGE (V)
r
DS(on)
,
DRAIN TO
SOURCE ON-RESISTANCE
(mΩ)
PULSE DURATION = 80 μs DUTY CYCLE = 0.5% MAX
0.0 0.5 1.0 1.5 2.0
0
2
4
6
TJ = 150 oC
V
DS
= 5 V
PULSE DURATION = 80 μs DUTY CYCLE = 0.5% MAX
TJ = -55 oC
TJ = 25 oC
I
D
, DRAIN CURRENT (A)
VGS, GATE TO SOURCE VOLTAGE (V)
0.0 0.2 0.4 0.6 0.8 1.0 1.2
0.001
0.01
0.1
1
10
TJ = -55 oC
TJ = 25 oC
TJ = 150 oC
V
GS
= 0 V
I
S
, REVERSE DRAIN CURRENT (A)
VSD, BODY DIODE FORWARD VOLTAGE (V)
Typical Characteristics (Q1 N-Channel) T
Figure 1.
On Region Characteristics Figure 2.
= 25°C unless otherwise noted
J
Norm a l i z e d O n -Resistan c e
vs Drain Current and Gate Voltage
®
MOSFET
Fi g ure 3 . Nor m aliz e d On R esis t ance
vs Junction Temperature
©2010 Fairchild Semiconductor Corporation 4 www.fairchildsemi.com FDME1034CZT Rev.C1
Figure 5. Transfer Characteristics
Figure 4.
On-Resistance vs Gate to
Source Voltage
Figure 6.
Source to Drain Diode
Forward Voltage vs Source Current
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