FDMC8884
Bottom
D
D
D
D
S
S
S
G
Top
Pin 1
MLP 3.3x3.3
G
S
S
S
D
D
D
D
5
6
7
8
3
2
1
4
N-Channel Power Trench® MOSFET
30 V, 15 A, 19 mΩ
Features
Max r
Max r
High performance technology for extremely low r
Termination is Lead-free and RoHS Compliant
= 19 mΩ at VGS = 10 V, ID = 9.0 A
DS(on)
= 30 mΩ at VGS = 4.5 V, ID = 7.2 A
DS(on)
DS(on)
General Description
This N-Channel MOSFET is produced using Fairchild
Semiconductor’s advanced Power
been especially tailored to minimize the on-state resistance.
device is well suited for Power Management and load switching
applications common in Notebook Computers and Portable
Battery Packs.
Application
High side in DC - DC Buck Converters
Notebook battery power management
Load switch in Notebook
FDMC8884 N-Channel Power Trench
April 2012
Trench® process that has
This
®
MOSFET
MOSFET Maximum Ratings T
Symbol Parameter Ratings Units
V
DS
V
GS
I
D
E
AS
P
D
, T
T
J
STG
Thermal Characteristics
R
θJC
R
θJA
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
FDMC8884 FDMC8884 MLP 3.3x3.3 13 ’’ 12 mm 3000 units
©2012 Fairchild Semiconductor Corporation
FDMC8884 Rev.E3
Drain to Source Voltage 30 V
Gate to Source Voltage ±20 V
Drain Current -Continuous (Package limited) TC = 25 °C 15
-Continuous (Silicon limited) T
-Continuous T
-Pulsed 40
Single Pulse Avalanche Energy (Note 3) 24 mJ
Power Dissipation TC = 25 °C 18
Power Dissipation T
Operating and Storage Junction Temperature Range -55 to +150 °C
Thermal Resistance, Junction to Case 6.6
Thermal Resistance, Junction to Ambient (Note 1a) 53
= 25 °C unless otherwise noted
A
= 25 °C 24
C
= 25 °C (Note 1a) 9.0
A
= 25 °C (Note 1a) 2.3
A
1
A
W
°C/W
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Electrical Characteristics T
= 25 °C unless otherwise noted
J
Symbol Parameter Test Conditions Min Typ Max Units
Off Characteristics
BV
ΔBV
ΔT
I
DSS
I
GSS
DSS
DSS
J
Drain to Source Breakdown Voltage ID = 250 μA, VGS = 0 V 30 V
Breakdown Voltage Temperature
Coefficient
Zero Gate Voltage Drain Current
Gate to Source Leakage Current VGS = ±20 V, V
= 250 μA, referenced to 25 °C 22 mV/°C
I
D
V
= 24 V, V
DS
= 0 V 1
GS
= 125 °C 250
T
J
= 0 V ±100 nA
DS
FDMC8884 N-Channel Power Trench
μA
On Characteristics
V
GS(th)
ΔV
ΔT
r
DS(on)
g
FS
GS(th)
J
Gate to Source Threshold Voltage VGS = VDS, ID = 250 μA 1.4 1.9 2.5 V
Gate to Source Threshold Voltage
Temperature Coefficient
Static Drain to Source On Resistance
Forward Transconductance VDD = 5 V, ID = 9.0 A 24 S
Dynamic Characteristics
C
iss
C
oss
C
rss
R
g
Input Capacitance
Output Capacitance 110 150 pF
Reverse Transfer Capacitance 76 115 pF
Gate Resistance 1.4 2.1 Ω
Switching Characteristics
t
d(on)
t
r
t
d(off)
t
f
Q
g(TOT)
Q
gs
Q
gd
Turn-On Delay Time
Rise Time 2 10 ns
Turn-Off Delay Time 15 27 ns
Fall Time 2 10 ns
Total Gate Charge VGS = 0 V to 10 V
Total Gate Charge V
Total Gate Charge 1.8 nC
Gate to Drain “Miller” Charge 2.2 nC
I
= 250 μA, referenced to 25 °C -6 mV/°C
D
V
= 10 V, ID = 9.0 A 16 19
GS
= 4.5 V, ID = 7.2 A 22 30
GS
= 10 V, ID = 9.0 A, TJ = 125 °C 22 30
V
GS
= 15 V, VGS = 0 V,
V
DS
513 685 pF
f = 1 MHz
6 12 ns
= 15 V, ID = 9.0 A,
V
DD
V
= 10 V, R
GS
GEN
= 6 Ω
10 14 nC
= 0 V to 4.5 V 5.0 7.0 nC
GS
V
DD
I
= 9.0 A
D
= 15 V
mΩV
®
MOSFET
Drain-Source Diode Characteristics
V
= 0 V, IS = 9.0 A (Note 2) 0.86 1.2
V
SD
t
rr
Q
rr
NOTES:
1. R
is determined with the device mounted on a 1 in2 pad 2 oz copper pad on a 1.5 x 1. 5 in . bo ard of FR -4 ma teri al. R
θJA
the user's board design.
2. Pulse Test: Pulse Width < 300 μs, Duty cycle < 2.0 %.
3. EAS of 24 mJ is based on starting TJ = 25 °C, L = 1 mH, IAS = 7 A, VDD = 30 V, VGS = 10 V. 100% test at L = 3 mH, IAS = 4 A .
©2012 Fairchild Semiconductor Corporation
FDMC8884 Rev.E3
Source to Drain Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge 3 10 nC
a. 53 °C/W when mounted on
2
pad of 2 oz copper
a 1 in
SS
SF
DS
DF
G
GS
= 0 V, IS = 1.6 A (Note 2) 0.76 1.2
V
GS
IF = 9.0 A, di/dt = 100 A/μs
SS
SF
DF
DS
G
2
13 18 ns
is guaranteed by design while R
θJC
b.125 °C/W when mounted on
a minimum pad of 2 oz copper
V
is determined by
θCA
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FDMC8884 N-Channel Power Trench
0123
0
10
20
30
40
VGS = 6 V
VGS = 3.5 V
VGS = 4.5 V
PULSE DURATION = 80 μs
DUTY CYCLE = 0.5% MAX
VGS = 4 V
VGS = 3 V
VGS = 10 V
I
D
, DRAIN CURRENT (A)
V
DS
, DRAIN TO SOURCE VOLTAGE (V)
0 10203040
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
V
GS
= 6 V
VGS = 3.5 V
PULSE DURATION = 80 μs
DUTY CYCLE = 0.5% MAX
NORMALIZED
DRAIN TO SOURCE ON-RESISTANCE
I
D
, DRAIN CURRENT (A)
V
GS
= 4 V
VGS = 4.5 V
VGS = 3 V
V
GS
= 10 V
-75 -50 -25 0 25 50 75 100 125 150
0.6
0.8
1.0
1.2
1.4
1.6
ID = 9.0 A
V
GS
= 10 V
NORMALIZED
DRAIN TO SOURCE ON-RESISTANCE
T
J
, JUNCTION TEMPERATURE (
o
C)
246810
10
20
30
40
50
60
70
80
TJ = 125 oC
ID = 9.0 A
TJ = 25 oC
V
GS
, GATE TO SOURCE VOLTAGE ( V )
r
DS(on)
,
DRAIN TO
SOURCE ON-RESISTANCE
(mΩ)
PULSE DURATION = 80 μs
DUTY CYCLE = 0.5% MAX
12345
0
10
20
30
40
TJ = 150 oC
V
DS
= 5 V
PULSE DURATION = 80 μs
DUTY CYCLE = 0.5% MAX
TJ = -55 oC
TJ = 25 oC
I
D
, DRAIN CURRENT (A)
VGS, GATE TO SOURCE VOLTAGE (V)
0.00.20.40.60.81.01.21.4
0.001
0.01
0.1
1
10
100
TJ = -55 oC
TJ = 25 oC
TJ = 150 oC
V
GS
= 0 V
I
S
, REVERSE DRAIN CURRENT (A)
VSD, BODY DIODE FORWARD VOLTAGE (V)
Typical Characteristics T
Figure 1.
On-Region Characteristics Figure 2.
= 25 °C unless otherwise noted
J
Nor ma liz ed O n- Res istan ce
vs Drain Current and Gate Voltage
®
MOSFET
Figur e 3 . Norm al ized O n- Resis ta nce
vs Junction Temperature
©2012 Fairchild Semiconductor Corporation
FDMC8884 Rev.E3
Figure 5. Transfer Characteristics
Figure 4.
On-Resistan ce vs Gate to
Source Voltage
Figure 6.
Source to Dra in Diode
Forward Voltage vs Source Current
3
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