FDMC86116LZ
D
D
D
D
S
S
S
G
1
2
3
4
5
D
D
D
D
G
S
S
S
Bottom
Top
MLP 3.3x3.3
6
7
8
N-Channel Power Trench® MOSFET
100 V, 7.5 A, 103 mΩ
Features
Max r
Max r
HBM ESD protection level > 3 KV typical (Note 4)
100% UIL Tested
RoHS Compliant
= 103 mΩ at VGS = 10 V, ID = 3.3 A
DS(on)
= 153 mΩ at VGS = 4.5 V, ID = 2.7 A
DS(on)
General Description
This N-Channel logic Level MOSFETs are produced using
Fairchild Semiconductor‘s advanced Power Trench
that has been special tailored to minimize the on-state
resistance and yet maintain superior switching performance.
G-S zener has been added to enhance ESD voltage level.
Application
DC - DC Conversion
December 2011
®
process
FDMC86116LZ N-Channel Power Trench
®
MOSFET
MOSFET Maximum Ratings T
Symbol Parameter Ratings Units
V
DS
V
GS
I
D
E
AS
P
D
, T
T
J
STG
Thermal Characteristics
R
θJC
R
θJA
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
FDMC86116Z FDMC86116LZ Power 33 13 ’’ 12 mm 3000 units
©2011 Fairchild Semiconductor Corporation
FDMC86116LZ Rev.C
Drain to Source Voltage 100 V
Gate to Source Voltage ±20 V
Drain Current -Continuous (Package limited) TC = 25 °C 7.5
-Continuous (Silicon limited) T
-Continuous T
-Pulsed 15
Single Pulse Avalanche Energy (Note 3) 12 mJ
Power Dissipation TC = 25 °C 19
Power Dissipation T
Operating and Storage Junction Temperature Range -55 to +150 °C
Thermal Resistance, Junction to Case 6.5
Thermal Resistance, Junction to Ambient (Note 1a) 53
= 25 °C unless otherwise noted
A
= 25 °C 9.6
C
= 25 °C (Note 1a) 3.3
A
= 25 °C (Note 1a) 2.3
A
1
A
W
°C/W
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FDMC86116LZ N-Channel Power Trench
Electrical Characteristics T
= 25 °C unless otherwise noted
J
Symbol Parameter Test Conditions Min Typ Max Units
Off Characteristics
BV
ΔBV
ΔT
I
DSS
I
GSS
DSS
DSS
J
Drain to Source Breakdown Voltage ID = 250 μA, VGS = 0 V 100 V
Breakdown Voltage Temperature
Coefficient
Zero Gate Voltage Drain Current VDS = 80 V, V
Gate to Source Leakage Current VGS = ±20 V, V
I
= 250 μA, referenced to 25 °C 73 mV/°C
D
= 0 V 1 μA
GS
= 0 V ±10 μA
DS
On Characteristics
V
GS(th)
ΔV
ΔT
r
DS(on)
g
FS
GS(th)
J
Gate to Source Threshold Voltage VGS = VDS, ID = 250 μA 1.0 1.8 2.2 V
Gate to Source Threshold Voltage
Temperature Coefficient
Static Drain to Source On Resistance
I
= 250 μA, referenced to 25 °C -6 mV/°C
D
V
= 10 V, ID = 3.3 A 79 103
GS
= 4.5 V, ID = 2.7 A 105 153
GS
= 10 V , ID = 3.3 A, TJ = 125 °C 136 178
V
GS
Forward Transconductance VDS = 5 V, ID = 3.3 A 11 S
Dynamic Characteristics
C
iss
C
oss
C
rss
R
g
Input Capacitance
Output Capacitance 45 60 pF
Reverse Transfer Capacitance 2.4 5 pF
Gate Resistance 0.7 Ω
Switching Characteristics
t
d(on)
t
r
t
d(off)
t
f
Q
g(TOT)
Q
g(TOT)
Q
gs
Q
gd
Turn-On Delay Time
Rise Time 1.3 10 ns
Turn-Off Delay Time 10 20 ns
Fall Time 1.4 10 ns
Total Gate Charge V
Total Gate Charge V
Total Gate Charge 0.8 nC
Gate to Drain “Miller” Charge 0.7 nC
= 50 V, VGS = 0 V,
V
DS
f = 1 MHz
= 50 V, ID = 3.3 A,
V
DD
V
= 10 V, R
GS
= 0 V to 10 V
GS
= 0 V to 4.5 V 2 3 nC
GS
GEN
= 6 Ω
V
DD
I
D
= 50 V,
= 3.3 A
232 310 pF
4.5 10 ns
46nC
mΩV
®
MOSFET
Drain-Source Diode Characteristics
V
= 0 V, IS = 3.3 A (Note 2) 0.85 1.3
V
SD
t
rr
Q
rr
NOTES:
is determined with the devi ce m ount ed on a 1 in2 pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. R
1. R
θJA
the user's board design.
2. Pulse Test: Pulse Width < 300 μs, Duty cycle < 2.0%.
3. Starting TJ = 25 °C; N-ch: L = 1.0 mH, IAS = 5.0 A, VDD = 90 V, VGS = 10 V.
4. The diode connected between gate and source serves only as protection against ESD. No gate overvoltage rating is implied.
©2011 Fairchild Semiconductor Corporation
FDMC86116LZ Rev.C
Source to Drain Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge 23 38 nC
a.
53 °C/W when mounted on a
1 in2 pad of 2 oz copper
SF
SS
DS
DF
G
GS
= 0 V, IS = 2 A (Note 2) 0.82 1.2
V
GS
= 3.3 A, di/dt = 100 A/μs
I
F
2
V
33 54 ns
is guaranteed by design while R
θJC
b.
125 °C/W when mounted on
a minimum pad of 2 oz copper
SF
SS
DS
DF
G
is determined by
θCA
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FDMC86116LZ N-Channel Power Trench
012345
0
3
6
9
12
15
PULSE DURATION = 80 μs
DUTY CYCLE = 0.5% MAX
VGS = 3.5 V
VGS = 4.5 V
VGS = 10 V
VGS = 4 V
VGS = 3 V
I
D
, DRAIN CURRENT (A)
V
DS
, DRAIN TO SOURCE VOLTAGE (V)
03691215
0
1
2
3
4
5
VGS = 3.5 V
PULSE DURATION = 80 μs
DUTY CYCLE = 0.5% MAX
NORMALIZED
DRAIN TO SOURCE ON-RESISTA NCE
I
D
, DRAIN CURRENT (A)
V
GS
= 4 V
VGS = 4.5 V
VGS = 3 V
V
GS
= 10 V
-75 -50 -25 0 25 50 75 100 125 150
0.6
0.8
1.0
1.2
1.4
1.6
1.8
2.0
2.2
ID = 3.3 A
V
GS
= 10 V
NORMALIZED
DRAIN TO SOURCE ON-RESIST ANCE
T
J
, JUNCTION TEMPERATURE (
o
C)
246810
0
100
200
300
400
500
TJ = 125 oC
ID = 3.3 A
TJ = 25 oC
V
GS
, GATE TO SOURCE VOLTAGE (V)
r
DS(on)
,
DRAIN TO
SOURCE ON-RESISTANCE
(mΩ)
PULSE DURATION = 80 μs
DUTY CYCLE = 0.5% MAX
123456
0
3
6
9
12
15
TJ = 150 oC
V
DS
= 5 V
PULSE DURATION = 80 μs
DUTY CYCLE = 0.5% MAX
TJ = -55 oC
TJ = 25 oC
I
D
, DRAIN CURRENT (A)
VGS, GATE TO SOURCE VOLTAGE (V)
0.0 0.2 0.4 0.6 0.8 1.0 1.2
0.001
0.01
0.1
1
10
20
TJ = -55 oC
TJ = 25 oC
TJ = 150 oC
V
GS
= 0 V
I
S
, REVERSE DRAIN CURRENT (A)
VSD, BODY DIODE FORWARD VOLTAGE (V)
Typical Characteristics T
Figure 1.
On Region Characteristics Figure 2.
= 25 °C unless otherwise noted
J
Norma l i z e d O n - Resistance
vs Drain Current and Gate Voltage
®
MOSFET
Fig ure 3. Norm a lized On Re s ista n ce
vs Junction Temperature
©2011 Fairchild Semiconductor Corporation
FDMC86116LZ Rev.C
Figure 5. Transfer Characteristics
Figure 4.
On-Resis tance vs Gate to
Source Voltage
Figure 6.
Source to Drain Diode
Forward Voltage vs Source Current
3
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