FDMC4435BZ
P-Channel Power Trench® MOSFET
-30 V, -18 A, 20 m:
Features
Max r
Max r
Extended V
High performance trench technology for extremely low r
High power and current handling capability
HBM ESD protection level >7 kV typical (Note 4)
100% UIL Tested
Termination is Lead-free and RoHS Compliant
= 20 m: at VGS = -10 V, ID = -8.5 A
DS(on)
= 37 m: at VGS = -4.5 V, ID = -6.3 A
DS(on)
range (-25 V) for battery applications
GSS
DS(on)
September 2010
General Description
This P-Channel MOSFET is produced using Fairchild
Semiconductor’s advanced Power Trench
been especially tailored to minimize the on-state resistance. This
device is well suited for Power Management and load
switching applications common in Notebook Computers and
Portable Battery Packs.
®
process that has
Applications
High side in DC - DC Buck Converters
Notebook battery power management
Load switch in Notebook
FDMC4435BZ P-Channel Power Trench
®
MOSFET
Top
Pin 1
Bottom
5
G
S
S
S
D
D
D
D
D
6
D
7
D
8
D
MLP 3.3x3.3
MOSFET Maximum Ratings T
Symbol Parameter Ratings Units
V
DS
V
GS
I
D
E
AS
P
D
, T
T
J
STG
Drain to Source Voltage -30 V
Gate to Source Voltage ±25 V
Drain Current -Continuous (Package limited) TC= 25 °C -18
-Continuous (Silicon limited) T
-Continuous T
-Pulsed -50
Single Pulse Avalanche Energy (Note 3) 24 mJ
Power Dissipation TC = 25 °C 31
Power Dissipation T
Operating and Storage Junction Temperature Range -55 to +150 °C
= 25 °C unless otherwise noted
A
= 25 °C -32
C
= 25 °C (Note 1a) -8.5
A
= 25 °C (Note 1a) 2.3
A
Thermal Characteristics
G
4
3
S
2
S
S
1
A
W
R
TJC
R
TJA
Thermal Resistance, Junction to Case 4
Thermal Resistance, Junction to Ambient (Note 1a) 53
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
FDMC4435BZ FDMC4435BZ MLP 3.3X3.3 13 ’’ 12 mm 3000 units
©2010 Fairchild Semiconductor Corporation
FDMC4435BZ Rev.D2
°C/W
1
www.fairchildsemi.com
Electrical Characteristics T
Symbol Parameter Test Conditions Min Typ Max Units
= 25 °C unless otherwise noted
J
Off Characteristics
BV
'BV
'T
I
DSS
I
GSS
DSS
DSS
J
Drain to Source Breakdown Voltage ID = -250 PA, VGS = 0 V -30 V
Breakdown Voltage Temperature
Coefficient
Zero Gate Voltage Drain Current
I
= -250 PA, referenced to 25 °C - 22 mV/°C
D
V
= -24 V, -1
DS
= 0 V, TJ = 125 °C -100
V
GS
Gate to Source Leakage Current VGS = ±25 V, VDS= 0 V ±10 PA
On Characteristics
V
GS(th)
'V
'T
r
DS(on)
g
FS
GS(th)
J
Gate to Source Threshold Voltage VGS = VDS, ID = -250 PA -1.0 -1.9 -3.0 V
Gate to Source Threshold Voltage
Temperature Coefficient
Static Drain to Source On Resistance
I
= -250 PA, referenced to 25 °C 5.3 mV/°C
D
= -10 V, ID = -8.5 A 15 20
V
GS
V
= -4.5 V, ID = -6.3 A 23 37
GS
= -10 V, ID = -8.5 A,
V
GS
= 125 °C
T
J
21 28
Forward Transconductance VDD = -5 V, ID = -8.5 A 24 S
Dynamic Characteristics
C
iss
C
oss
C
rss
R
g
Input Capacitance
Output Capacitance 295 395 pF
Reverse Transfer Capacitance 260 385 pF
V
= -15 V, VGS = 0 V,
DS
f = 1 MHz
1540 2045 pF
Gate Resistance f = 1 MHz 5 :
FDMC4435BZ P-Channel Power Trench
PA
m:
®
MOSFET
Switching Characteristics
t
d(on)
t
r
t
d(off)
t
f
Q
Q
Q
Q
g
g
gs
gd
Turn-On Delay Time
Rise Time 612ns
Turn-Off Delay Time 34 55 ns
= -15 V, ID = -8.5 A,
V
DD
= -10 V, R
V
GS
GEN
= 6 :
Fall Time 20 36 ns
Total Gate Charge VGS = 0 V t o - 1 0 V
Total Gate Charge VGS = 0 V to -4.5 V 17 24 nC
Gate to Source Charge 5 nC
Gate to Drain “Miller” Charge 9 nC
Drain-Source Diode Characteristics
V
= 0 V, IS= -8.5A (Note 2) 0.92 1.5
V
SD
t
rr
Q
rr
NOTES:
1. R
is determined with the device mounted on a 1 in2 pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. R
TJA
the user's board design.
Source to Drain Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge 11 nC
a. 53 °C/W when mounted on
2
pad of 2 oz copp er
a 1 i n
GS
= 0 V, IS= -1.9 A (Note 2) 0.75 1.2
V
GS
= -8.5 A, di/dt = 100 A/Ps
I
F
V
DD
= -8.5 A
I
D
= -15 V,
is guaranteed by design while R
TJC
b.125 °C/W when mounted on
a minimum pad of 2 oz copper
10 20 ns
33 46 nC
22 ns
is determined by
TCA
V
2. Pulse Test: Pulse Width < 300 Ps, Duty cycle < 2.0 %.
3.
E
of 24 mJ is based on starting T = 25 °C, L = 1 mH, I = -4 A.
AS
4. The diode connected betwe en the gate and source servers only as protection against ESD. No gate overvolt age rating is implied.
©2010 Fairchild Semiconductor Corporation
FDMC4435BZ Rev.D2
J
= -7 A, V = -27 V, V = -10 V. 100% test at L = 3 mH, I
AS AS
DD
GS
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FDMC4435BZ P-Channel Power Trench
Typical Characteristics T
50
40
30
20
, DRAIN CURRENT (A)
D
10
-I
0
01234
Figure 1.
-V
DS
On-Region Characteristics Figure 2.
1.6
ID = -8.5A
V
= -10V
GS
1.4
1.2
1.0
NORMALIZED
0.8
DRAIN TO SOURCE ON-RESISTANCE
0.6
-75 -50 -25 0 25 50 75 100 125 150
, JUNCTION TEMPERATURE (
T
J
VGS = -5V
VGS = -10V
PULSE DURATION = 80Ps
DUTY CYCLE = 0.5%MAX
,
DRAIN TO SOURCE VOLTAGE (V)
= 25°C unless otherwise noted
J
VGS = -4.5V
VGS = - 4V
VGS = -3.5V
o
C)
4.0
3.5
3.0
VGS = -3.5V
PULSE DURATION = 80Ps
DUTY CYCLE = 0.5%MAX
VGS = -4V
2.5
VGS = -4.5V
V
=-5V
GS
NORMALIZED
2.0
1.5
1.0
V
= -10V
DRAIN TO SOURCE ON-RESISTANCE
0.5
0 1020304050
DRAIN CURRENT(A)
-I
,
D
GS
N o r m a l i z e d O n - R e s i s t a n c e
vs Drain Current and Gate Voltage
60
PULSE DURATION = 80Ps
50
(m:)
40
30
, DRAIN TO
DS(on)
r
20
SOURCE ON-RESISTANCE
10
246810
TJ= 25oC
-V
, GATE TO SOURCE VOLTAGE (V)
GS
DUTY CYCLE = 0.5%MAX
ID= -8.5A
TJ= 125oC
®
MOSFET
F i g u r e 3 . N o r m a l i z e d O n - R e s i s t a n c e
vs Junction Temperature
50
PULSE DURATION = 80Ps
DUTY CYCLE = 0.5%MAX
40
VDS= -5V
30
20
, DRAIN CURRENT (A)
D
10
-I
0
12345
TJ= 150oC
-VGS, GATE TO SOURCE VOLTAGE (V)
Figure 5. Transfer Characteristics
©2010 Fairchild Semiconductor Corporation
FDMC4435BZ Rev.D2
TJ = 25oC
TJ = -55oC
Figure 4.
O n - R es i s t a n c e vs G a t e t o
Source Voltage
50
V
= 0V
GS
10
TJ= 150oC
1
TJ = 25oC
0.1
0.01
, REVERSE DRAIN CURRENT (A)
S
-I
0.001
0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6
-VSD, BODY DIODE FORWARD VOLTAGE (V)
Figure 6.
S o u r ce t o D r a i n Di o d e
TJ = -55oC
Forward Voltage vs Source Current
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