Fairchild FDMA1024NZ service manual

FDMA1024NZ
Dual N-Channel PowerTrench
20 V, 5.0 A, 54 m Features
Max r
Max r
Max r
Max r
HBM ESD protection level = 1.6 kV (Note 3)
Low profile - 0.8 mm maximum - in the new package
MicroFET 2x2 mm
RoHS Compliant
Free from halogenated compounds and antimony oxides
= 54 mΩ at VGS = 4.5 V, ID = 5.0 A
DS(on)
= 66 mΩ at VGS = 2.5 V, ID = 4.2 A
DS(on)
= 82 mΩ at VGS = 1.8 V, ID = 2.3 A
DS(on)
= 114 mΩ at VGS = 1.5 V, ID = 2.0 A
DS(on)
®
MOSFET
General Description
This device is designed specifically as a single package solution for dual switching requirements in cellular handset and other ultr N-Channel MOSFETs wi conduction losses.
The MicroFET 2X2 package offers exceptional thermal performance for its physical size and is well suited to linear mo de applications.
Applications
Baseband Switch
Loadswitch
DC-DC Conversion
a-portable applications. It features two
FDMA1024NZ Dual N-Channel Power Trench
May 2010
independent
th low on-state resistance for minimum
®
MOSFET
PIN 1
MicroFET 2x2
MOSFET Maximum Ratings T
Symbol Parameter Ratings Units
V
DS
V
GS
I
D
P
D
, T
T
J
STG
Drain to Source Voltage 20 V
Gate to Source Voltage ±8 V Drain Current -Continuous (Note 1a) 5.0
-Pulsed 6.0 Power Dissipation (Note 1a) 1.4
Power Dissipation (Note 1b) 0.7 Operating and Storage Junction Temperature Range –55 to +150 °C
S1 G1 D2
D1 D2
D1 G2
= 25 °C unless otherwise noted
A
S2
S1
G1
D2
1
2
3
6
5
4
Thermal Characteristics
R
θJA
R
θJA
R
θJA
R
θJA
Thermal Resistance, Junction to Ambient (Note 1a) 86 (Single Operation)
Thermal Resistance, Junction to Ambient (Note 1b) 173 (Single Operation)
Thermal Resistance, Junction to Ambient (Note 1c) 69 (Dual Operation)
Thermal Resistance, Junction to Ambient (Note 1d) 151 (Dual Operation)
Package Marking and Ordering Information
D1
S2
A
W
°C/W
Device Marking Device Package Reel Size Tape Width Quantity
024 FDMA1024NZ MicroFET 2X2 7 ” 8 mm 3000 units
©2010 Fairchild Semiconductor Corporation FDMA1024NZ Rev.B4
1
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FDMA1024NZ Dual N-Channel Power Trench
Electrical Characteristics T
= 25 °C unless otherwise noted
J
Symbol Parameter Test Conditions Min Typ Max Units
Off Characteristics
BV
BVT
I
DSS
I
GSS
DSS
DSS
J
Drain to Source Breakdown Voltage ID = 250 µA, VGS = 0 V 20 V
Breakdown Voltage Temperature Coefficient
Zero Gate Voltage Drain Current VDS = 16 V, V
Gate to Source Leakage Current VGS = ±8 V, V
I
= 250 µA, referenced to 25 °C 19 mV/°C
D
= 0 V 1 µA
GS
= 0 V ±10 µA
DS
On Characteristics
V
GS(th)
VT
r
DS(on)
g
FS
GS(th)
J
Gate to Source Threshold Voltage VGS = VDS, ID = 250 µA 0.4 0.7 1.0 V
Gate to Source Threshold Voltage Temperature Coefficient
Static Drain to Source On-Resistance
= 250 µA, referenced to 25 °C -3 mV/°C
I
D
V
= 4.5 V, ID = 5.0 A 37 54
GS
= 2.5 V, ID = 4.2 A 43 66
V
GS
= 1.8 V, ID = 2.3 A 52 82
V
GS
= 1.5 V, ID = 2.0 A 67 114
V
GS
= 4.5 V, ID = 5.0 A, TJ = 125 °C 51 75
V
GS
Forward Transconductance VDD = 5 V, ID = 5.0 A 16 S
Dynamic Characteristics
C
iss
C
oss
C
rss
R
G
Input Capacitance
Output Capacitance 70 95 pF
Reverse Transfer Capacitance 40 65 pF
= 10 V, VGS = 0 V,
V
DS
f = 1 MHz
Gate Resistance f = 1 MHz 4.3
375 500 pF
m
®
MOSFET
Switching Characteristics
t
d(on)
t
r
t
d(off)
t
f
Q
Q
Q
g
gs
gd
Turn-On Delay Time
Rise Time 2.2 10 ns
Turn-Off Delay Time 18 33 ns
Fall Time 2.3 10 ns
Total Gate Charge
Gate to Source Gate Charge 0.6 nC
Gate to Drain “Miller” Charge 0.9 nC
Drain-Source Diode Characteristics
I
S
V
SD
t
rr
Q
rr
Maximum Continuous Source-Drain Diode Forward Current
Source to Drain Diode Forward Voltage V
Reverse Recovery Time
Reverse Recovery Charge 5 10 nC
5.3 11 ns
V
= 10 V, ID = 5.0 A
DD
= 4.5 V, R
V
GS
V
= 4.5 V, VDD = 10 V,
GS
= 5.0 A
I
D
GEN
= 6
5.2 7.3 nC
1.1
= 0 V, IS = 1.1 A (Note 2) 0.7 1.2 V
GS
= 5.0 A, di/dt = 100 A/µs
I
F
19 35 ns
A
©2010 Fairchild Semiconductor Corporation FDMA1024NZ Rev.B4
2
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Notes:
1. R
is determined with the device mounted on a 1 in2 oz. copper pad on a 1.5 x 1.5 in. board of FR-4 material. R
θJA
user's board design. (a) R
(b) R
(c) R
(d) R
= 86 °C/W when mounted on a 1 in2 pad of 2 oz copper, 1.5 " x 1.5 " x 0.062 " thick PCB. For single operation.
θJA
= 173 °C/W when mounted on a minimum pad of 2 oz copper. For single operation.
θJA
= 69 oC/W when mounted on a 1 in2 pad of 2 oz copper, 1.5 ” x 1.5 ” x 0.062 ” thick PCB. For dual operation.
θJA
= 151 oC/W when mounted on a minimum pad of 2 oz copper. For dual operation.
θJA
is guaranteed by design while R
θJC
is determined by the
θJA
FDMA1024NZ Dual N-Channel Power Trench
o
a) 86
C/W when mounted on a 1 in2 pad of 2 oz copper.
2. Pulse Test : Pulse Width < 300 us, Duty Cycle < 2.0 %
3: The diode connected between the gate and source serves only as protection against ESD. No gate overvoltage rating is implied.
o
b) 173
C/W when mounted on a minimum pad of 2 oz copper.
c) 69 mounted on a 1 in2 pad of 2 oz copper.
o
C/W when
o
d) 151
C/W when mounted on a minimum pad of 2 oz copper.
®
MOSFET
©2010 Fairchild Semiconductor Corporation FDMA1024NZ Rev.B4
3
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Typical Characteristics T
= 25 °C unless otherwise noted
J
FDMA1024NZ Dual N-Channel Power Trench
6
5
4
3
VGS = 4.5 V
VGS = 3.5 V
VGS = 2.5 V
VGS = 1.8 V
VGS = 1.5 V
2
DRAIN CURRENT (A)
,
D
I
1
0
0.0 0.2 0.4 0.6 0.8 1.0
Figure 1.
1.6
1.4
PULSE DURATION = 80 µs DUTY CYCLE = 0.5% MAX
V
,
DRAIN TO SOURCE VOLTAGE (V)
DS
On-Region Characteristics Figure 2.
ID = 5 A
= 4.5 V
V
GS
1.2
1.0
NORMALIZED
0.8
DRAIN TO SOURCE ON-RESISTANCE
0.6
-75 -50 -25 0 25 50 75 100 125 150
T
,
JUNCTION TEMPERATURE
J
o
(
C
)
F i g u r e 3 . N o r m a l i z e d O n - R e s i s t a n c e
vs Junction Temperature
3.0
PULSE DURATION = 80 µs
2.5
DUTY CYCLE = 0.5% MAX
VGS = 1.5 V
2.0
V
GS
= 3.5 V
NORMALIZED
1.5
1.0
DRAIN TO SOURCE ON-RESISTANCE
0.5 123456
I
,
DRAIN CURRENT (A)
D
VGS = 1.8 V
V
GS
V
GS
N o r m a l i z e d O n - R e s i s t a n c e
vs Drain Current and Gate Voltage
200
)
m
160
(
120
DRAIN TO
,
80
DS(on)
r
40
SOURCE ON-RESISTANCE
0
1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5
V
,
GATE TO SOURCE VOLTAGE (V)
GS
Figure 4.
O n - R es i s t a n c e vs G a t e t o
PULSE DURATION = 80 µs DUTY CYCLE = 0.5% MAX
ID = 2.5 A
TJ = 125 oC
TJ = 25 oC
Source Voltage
= 2.5 V
= 4.5 V
®
MOSFET
6
PULSE DURATION = 80 µs DUTY CYCLE = 0.5% MAX
5
V
= 5 V
DS
4
3
TJ = 125 oC
2
, DRAIN CURRENT (A)
D
I
1
0
0.0 0.5 1.0 1.5 2.0
VGS, GATE TO SOURCE VOLTAGE (V)
Figure 5. Transfer Characteristics
©2010 Fairchild Semiconductor Corporation FDMA1024NZ Rev.B4
10
V
= 0 V
GS
1
0.1
TJ = 25 oC
TJ = -55 oC
0.01
, REVERSE DRAIN CURRENT (A)
S
I
1E-3
0.0 0.2 0.4 0.6 0.8 1.0 1.2
Figure 6.
TJ = 125 oC
TJ = 25 oC
TJ = -55 oC
VSD, BODY DIODE FORWARD VOLTAGE (V)
S o u r ce t o D r a i n D io d e
Forward Voltage vs Source Current
4
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FDMA1024NZ Dual N-Channel Power Trench
Typical Characteristics T
5
ID = 5 A
4
3
V
= 8 V
DD
2
1
, GATE TO SOURCE VOLTAGE (V)
GS
V
0
Figure 7.
-2
10
-3
10
-4
10
-5
10
-6
10
-7
GATE LEAKAGE CURRENT (A)
10
,
g
I
-8
10
Figure 9.
0123456
Gate Charge Characteristics Figure 8 .
V
= 0 V
GS
03691215
V
GS
Gate Leakage Current vs Gate to Source
VDD = 12 V
Qg, GATE CHARGE (nC)
TJ = 125 oC
,
GATE TO SOURCE VOLTAGE (V)
Voltage
= 25 °C unless otherwise noted
J
VDD = 10 V
TJ = 25 oC
1000
C
iss
100
CAPACITANCE (pF)
f = 1 MHz
= 0 V
V
GS
10
0.1 1 10 20
VDS, DRAIN TO SOURCE VOLTAGE (V)
C
oss
C
rss
C a p a c i t a n c e v s D r a i n
to Source Voltage
10
100 us
1
THIS AREA IS LIMITED BY r
0.1
, DRAIN CURRENT (A)
D
I
0.01
0.1 1 10
DS(on)
SINGLE PULSE
= MAX RATED
T
J
R
= 173 oC/W
θ
JA
T
= 25 oC
A
VDS, DRAIN to SOURCE VOLTAGE (V)
Figure 10. Forward Bias Safe Operating Area
1 ms
10 ms
100 ms
1 s
10 s
DC
®
MOSFET
60
100
10
1
, PEAK TRANSIENT POWER (W)
(PK)
P
0.3
-3
10
©2010 Fairchild Semiconductor Corporation FDMA1024NZ Rev.B4
VGS = 4.5 V
-2
10
Figure 11.
SINGLE PULSE
R
θ
T
A
-1
10
t, PULSE WIDTH (sec)
0
10
1
10
Single Pulse Maximum Power Dissipation
5
= 173 oC/W
JA
= 25 oC
100 1000
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FDMA1024NZ Dual N-Channel Power Trench
Typical Characteristics T
2
1
JA
θ
Z
0.1
IMPEDANCE,
NORMALIZED THERMAL
0.01 10
DUTY CYCLE-DESCENDING ORDER
D = 0.5
0.2
0.1
0.05
0.02
0.01
SINGLE PULSE
R
θ
-3
-2
10
Figure 12. Junction to Ambient Transient Thermal Response Curve
JA
= 25 °C unless otherwise noted
J
= 173 oC/W
-1
10
t, RECTANGULAR PULSE DURATION (sec)
P
DM
NOTES: DUTY FACTOR: D = t1/t
PEAK TJ = PDM x Z
θJA
110
t
1
t
2
2
x R
+ T
θJA
A
100 1000
®
MOSFET
©2010 Fairchild Semiconductor Corporation FDMA1024NZ Rev.B4
6
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Dimensional Outline and Pad Layout
FDMA1024NZ Dual N-Channel Power Trench
®
MOSFET
©2010 Fairchild Semiconductor Corporation FDMA1024NZ Rev.B4
7
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TRADEMARKS
The following includes registered and unregistered tradema rks and service marks, owned by Fair child Semiconductor and/ or its global subsidiaries, and is no t intended to be an exhaustive list of all such trademarks.
AccuPower™ Auto-SPM™ Build it Now™ CorePLUS™ CorePOWER™ CROSSVOLT™ CTL™ Current Transfer Logic™ DEUXPEED Dual Cool™ EcoSPARK EfficentMax™ ESBC™
Fairchild Fairchild Semiconductor FACT Quiet Series™ FACT FAST FastvCore™ FETBench™ FlashWriter FPS™
®
®
®
tm
®
® ®
®
*
F-PFS™
®
FRFET Global Power Resource Green FPS™ Green FPS™ e-Series™ Gmax™ GTO™ IntelliMAX™ ISOPLANAR™ MegaBuck™ MICROCOUPLER™ MicroFET™ MicroPak™ MicroPak2™ MillerDrive™
®
MotionMax™ Motion-SPM™ OptiHiT™ OPTOLOGIC OPTOPLANAR
®
tm
®
SM
®
PDP SPM™
Power-SPM™ PowerTrench PowerXS™ Programmable Active Droop™ QFET QS™ Quiet Series™ RapidConfigure™
Saving our world, 1mW/W/kW at a time™ SignalWise™ SmartMax™ SMART START™ SPM STEALTH™ SuperFET™ SuperSOT™-3 SuperSOT™-6 SuperSOT™-8 SupreMOS™ SyncFET™ Sync-Lock™
®
®
®
®* The Power Franchise
TinyBoost™ TinyBuck™ TinyCalc™ TinyLogic TINYOPTO™ TinyPower™ TinyPWM™ TinyWire™ TriFault Detect™ TRUECURRENT™* µSerDes™
UHC Ultra FRFET™ UniFET™ VCX™ VisualMax™ XS™
®
tm
®
®
®
*Trademarks of System General Corporation, used under license by Fairchild Semiconductor.
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FDMA1024NZ Dual N-Channel Power Trench
®
MOSFET
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used here in:
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into t he body or (b ) support or sustain life, and (c) whose failure to perform when properly used in acco rdance with instructions for use provided in the labeling, can be reasonably
2. A critical component in any component of a life support, device, or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
expected to result in a significant injury of the user.
ANTI-COUNTERFEITING POLICY
Fairchild Semiconductor Corporation’s Anti-Counterfeiting Policy. Fairchild’s Anti-Counterfeiting Policy is also stated on our external website, www.Fairchildsemi.com, under Sales Support Counterfeiting of semiconductor parts is a growing problem in the industry. All manufact ures of semiconductor products are experien cing counterfeiting of their
parts. Customers who inadvertently purchase counterfe it par ts exp erien ce many problems such a s loss of b rand rep ut ation, substa nda rd perf orman ce, failed application, and increased cost of production and manufacturing delays. Fairchild is taking strong measures to protect ourselve s and our customers from the proliferation of counterfeit parts. Fairch ild strongly encourage s custom ers to purch ase Fairchi ld parts either directly from Fa irchild or from Authorized Fairchild Distributors who are listed by country on our web page cited above. Products customers buy either from Fairchild directly or from Authorized Fairchild Distributors are genuine parts, have full traceability, meet Fairchild’s quality standards for handing and storage and provide access to Fairchild’s full range of up-to-date technical and product information. Fairchild and our Authorized Distributors will stand behind all warranties and will appropriately address and warranty issues that may arise. Fairchild will not provide any warranty coverage or other assistance for parts bought from Unauthorized Sources. Fairchild is
.
committed to combat this global problem and encourage o ur customers to do their part in stopping this practice b y buying direct or from authorized dist ributors.
PRODUCT STATUS DEFINITIONS Definition of Terms
Datasheet Identification Product Status Definition
Advance Information Formative / In Design
Preliminary First Production
No Identification Needed Full Production
Obsolete Not In Production
©2010 Fairchild Semiconductor Corporation 8 FDMA1024NZ Rev.B4
Datasheet contains the design specifications for product development. Specifications may change in any manner without notice.
Datasheet contains preliminary data; supplement ary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design.
Datasheet contains final specifications. Fairchild Semiconduct or reserves the right to make changes at any time without notice to improve the design.
Datasheet contains specifications on a product that is discontinued by Fai r child Semiconductor. The datashe et is for reference information only.
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Rev. I48
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