Fairchild FDB3502 service manual

tm
FDB3502
B
N-Channel Power Trench® MOSFET
75V, 14A, 47m
Features
Max r100% UIL TestedRoHS Compliant
= 47mΩ at VGS = 10V, ID = 6A
DS(on)
General Description
This N-Channel MOSFET is produced using Fairchild Semiconductor‘s advanced Power Trench been especially tailored to minimize the on-state resistance and yet maintain superior switching performance.
May 2008
®
process that has
FDB3502 N-Channel Power Trench
Application
Synchronous rectifier
D
D
G
S
MOSFET Maximum Ratings T
Symbol Parameter Ratings Units
V
DS
V
GS
I
D
E
AS
P
D
, T
T
J
STG
Thermal Characteristics
Drain to Source Voltage 75 V Gate to Source Voltage ±20 V Drain Current -Continuous (Package limited) TC = 25°C 14
-Continuous (Silicon limited) T
-Continuous T
-Pulsed 40 Single Pulse Avalanche Energy (Note 3) 54 mJ Power Dissipation TC = 25°C 41 Power Dissipation T Operating and Storage Junction Temperature Range -55 to +150 °C
TO-263A
FDB Series
= 25°C unless otherwise noted
C
= 25°C 22
C
= 25°C (Note 1a) 6
A
= 25°C (Note 1a) 3.1
A
G
S
MOSFET
A
W
R
θJC
R
θJA
Thermal Resistance, Junction to Case 3 Thermal Resistance, Junction to Ambient (Note 1a) 40
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
FDB3502 FDB3502 TO-263AB 330 mm 24 mm 800 units
©2008 Fairchild Semiconductor Corporation FDB3502 Rev.C2
°C/W
1
www.fairchildsemi.com
FDB3502 N-Channel Power Trench
Electrical Characteristics T
= 25°C unless otherwise noted
J
Symbol Parameter Test Conditions Min Typ Max Units
Off Characteristics
BV
DSS
BV
DSS
T
J
I
DSS
I
GSS
On Characteristics
V
GS(th)
V
GS(th)
T
J
r
DS(on)
g
FS
Drain to Source Breakdown Voltage ID = 250µA, VGS = 0V 75 V Breakdown Voltage Temperature
Coefficient Zero Gate Voltage Drain Current V Gate to Source Leakage Current VGS = ±20V, V
ID = 250µA, referenced to 25°C 70 mV/°C
= 0V, VDS = 60V, 1 µA
GS
= 0V ±100 nA
DS
Gate to Source Threshold Voltage VGS = VDS, ID = 250µA 2.5 3.8 4.5 V Gate to Source Threshold Voltage
Temperature Coefficient Static Drain to Source On Resistance Forward Transconductance VDD = 10V, ID = 6A 13 S
ID = 250µA, referenced to 25°C -10 mV/°C VGS = 10V, ID = 6A 37 47
VGS = 10V, ID = 6A, TJ = 125°C 63 80
Dynamic Characteristics
C
iss
C
oss
C
rss
R
g
Input Capacitance Output Capacitance 75 105 pF Reverse Transfer Capacitance 35 40 pF
VDS = 40V, VGS = 0V, f = 1MHz
615 815 pF
Gate Resistance f = 1MHz 1.5
Switching Characteristics
t
d(on)
t
r
t
d(off)
t
f
Q Q Q
g gs gd
Turn-On Delay Time Rise Time 3 10 ns Turn-Off Delay Time 13 22 ns
VDD = 40V, ID = 6A, VGS = 10V, R
GEN
= 6
9 17 ns
Fall Time 3 10 ns Total Gate Charge at 10V Gate to Source Charge 4 nC Gate to Drain “Miller” Charge 3 nC
VDD = 40V ID = 6A
11 15 nC
m
MOSFET
Drain-Source Diode Characteristics
V
SD
t
rr
Q
rr
Notes:
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins.
1: R
θJA
R
θJC
a. 40°C/W when mounted on a 1 in b. 62.5°C/W when mounted on a minimum pad.
2: Pulse Test: Pulse Width < 300µs, Duty cycle < 2.0%. 3: Starting TJ = 25°C, L = 3mH, IAS = 6A, VDD = 75V, VGS = 10V.
©2008 Fairchild Semiconductor Corporation FDB3502 Rev.C2
Source to Drain Diode Forward Voltage Reverse Recovery Time
Reverse Recovery Charge 17 32 nC
is guaranteed by design while R
is determined by the user’s board design.
θJA
2
pad of 2 oz copper
V
= 0V, IS = 2.6A (Note 2) 0.78 1.2
GS
V
= 0V, IS = 6A (Note 2) 0.83 1.3
GS
IF = 6A, di/dt = 100A/µs
2
25 41 ns
V
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