Fairchild FDA18N50 service manual

FDA18N50
500V N-Channel MOSFET
FDA18N50 500V N-Channel MOSFET
October 2006
TM
UniFET
• 19A, 500V, R
• Low gate charge ( typical 45 nC)
•Low C
•Fast switching
• 100% avalanche tested
• Improved dv/dt capability
( typical 25 pF)
rss
= 0.265 @VGS = 10 V
DS(on)
GSD
TO-3P
FDA Series
Description
These N-Channel enhancement mode power field effect transistors are produced using Fairchild’s proprietary, planar stripe, DMOS technology.
This advanced technology has been especially tailored to minimize on-state resistance, provide superior switching performance, and withstand high energy pulse in the avalanche and commutation mode. These devices are well suited for high efficient switched mode power supplies and active power factor correction.
D
G
S
Absolute Maximum Ratings
Symbol Parameter FDA18N50 Unit
V
DSS
I
D
I
DM
V
GSS
E
AS
I
AR
E
AR
dv/dt Peak Diode Recovery dv/dt P
D
T
J, TSTG
T
L
Drain-Source Voltage 500 V Drain Current - Continuous (TC = 25°C)
- Continuous (T Drain Current - Pulsed Gate-Source voltage ±30 V Single Pulsed Avalanche Energy Avalanche Current (Note 1) 19 A Repetitive Avalanche Energy (Note 1) 23 mJ
Power Dissipation (TC = 25°C)
- Derate above 25°C Operating and Storage Temperature Range -55 to +150 °C Maximum Lead Temperature for Soldering Purpose,
1/8” from Case for 5 Seconds
= 100°C)
C
(Note 1)
(Note 2)
(Note 3) 4.5 V/ns
19
11.4 76 A
945 mJ
239
1.92
300 °C
A A
W
W/°C
Thermal Characteristics
Symbol Parameter Min. Max. Unit
R
θJC
R
θCS
R
θJA
©2006 Fairchild Semiconductor Corporation 1 www.fairchildsemi.com
FDA18N50 Rev. A
Thermal Resistance, Junction-to-Case -- 0.52 °C/W Thermal Resistance, Case-to-Sink Typ. 0.24 -- °C/W Thermal Resistance, Junction-to-Ambient -- 40 °C/W
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
FDA18N50 FDA18N50 TO-3PN - - 30
FDA18N50 500V N-Channel MOSFET
Electrical Characteristics T
= 25°C unless otherwise noted
C
Symbol Parameter Conditions Min. Typ. Max Units
Off Characteristics
BV
DSS
BV / ∆T
I
DSS
I
GSSF
I
GSSR
On Characteristics
V
GS(th)
R
DS(on)
g
FS
Dynamic Characteristics
C
iss
C
oss
C
rss
Switching Characteristics
t
d(on)
t
r
t
d(off)
t
f
Q
g
Q
gs
Q
gd
Drain-Source Diode Characteristics and Maximum Ratings
I
S
I
SM
V
SD
t
rr
Q
rr
Drain-Source Breakdown Voltage VGS = 0V, ID = 250µA 500 -- -- V Breakdown Voltage Temperature
DSS
Coefficient
J
Zero Gate Voltage Drain Current VDS = 500V, VGS = 0V
I
= 250µA, Referenced to 25°C--0.5--V/°C
D
V
= 400V, TC = 125°C
DS
--
--
--
--
1
10
µA µA
Gate-Body Leakage Current, Forward VGS = 30V, VDS = 0V -- -- 100 nA Gate-Body Leakage Current, Reverse VGS = -30V, VDS = 0V -- -- -100 nA
Gate Threshold Voltage VDS = VGS, ID = 250µA3.0--5.0V Static Drain-Source
On-Resistance Forward Transconductance VDS = 40V, ID = 9.5A
Input Capacitance VDS = 25V, VGS = 0V, Output Capacitance -- 330 430 pF
V
= 10V, ID = 9.5A -- 0.220 0.265
GS
(Note 4)
-- 25 -- S
-- 2200 2860 pF
f = 1.0MHz
Reverse Transfer Capacitance -- 25 40 pF
Turn-On Delay Time VDD = 250V, ID = 19A
R
= 25
Turn-On Rise Time -- 165 340 ns
G
-- 55 120 ns
Turn-Off Delay Time -- 95 200 ns Turn-Off Fall Time -- 90 190 ns Total Gate Charge VDS = 400V, ID = 19A
V
= 10V
Gate-Source Charge -- 12.5 -- nC
GS
Gate-Drain Charge -- 19 -- nC
(Note 4, 5)
-- 45 60 nC
(Note 4, 5)
Maximum Continuous Drain-Source Diode Forward Current -- -- 19 A Maximum Pulsed Drain-Source Diode Forward Current -- -- 76 A Drain-Source Diode Forward Voltage VGS = 0V, IS = 19A -- -- 1.4 V Reverse Recovery Time VGS = 0V, IS = 19A
dI
/dt =100A/µs (Note 4)
Reverse Recovery Charge -- 5.4 -- µC
F
-- 500 -- ns
NOTES:
1. Repetitive Rating: Pulse width limited by maximum junction temperature
2. L = 4.7mH, IAS = 19A, VDD = 50V, RG = 25, Starting TJ = 25°C
3. ISD 19A, di/dt 200A/µs, VDD BV
4. Pulse Test: Pulse width 300µs, Duty Cycle 2%
5. Essentially Independent of Operating Temperature Typical Characteristics
, Starting TJ = 25°C
DSS
FDA18N50 Rev. A
2 www.fairchildsemi.com
Typical Performance Characteristics
Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics
FDA18N50 500V N-Channel MOSFET
, Drain Current [A] I
10
10
10
D
-1
10
V
2
Top : 15.0 V
10.0 V
8.0 V
7.0 V
6.5 V
6.0 V
1
Bottom : 5.5 V
0
-1
10
GS
0
10
V
, Drain-Source Voltage [V]
2
10
1
10
150oC
25oC
, Drain Current [A]
D
* Notes :
1. 250
2. T
1
10
µs Pulse Test
= 25oC
C
I
0
10
24681012
V
, Gate-Source Voltage [V]
-55oC
Figure 3. On-Resistance Variation vs. Figure 4. Body Diode Forward Voltage
Drain Current and Gate Voltage Variation vs. Source Current
and Temperatue
0.6
0.5
VGS = 10V
0.4
0.3
0.2
[], Drain-Source On-Resistance
DS(ON)
0.1
R
0 5 10 15 20 25 30 35 40 45 50 55 60 65 70
VGS = 20V
* Note : TJ = 25oC
ID, Drai n Curre nt [A]
2
10
1
10
150oC
, Reverse Drain Current [A]
DR
I
0
10
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0 2.2 2.4
25oC
VSD, Source-Drain voltage [V]
* Notes :
1. V
2. 250
* Notes :
1. V
2. 250
= 40V
DS
µs Pulse Test
= 0V
GS
µs Pulse Test
Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics
5000
4000
3000
2000
Capacitances [pF]
1000
0 10
FDA18N50 Rev. A
C
= Cgs + Cgd (Cds = shorted)
iss
C
= Cds + C
oss
gd
C
= C
rss
C
oss
C
iss
gd
* Note :
1. V
= 0 V
C
rss
-1
0
10
GS
2. f = 1 MHz
1
10
VDS, Drain-Source Voltage [V]
12
10
VDS = 100V
VDS = 250V
8
6
4
, Gate-Source Voltage [V]
2
GS
V
0
0 1020304050
VDS = 400V
* Note : ID = 18A
QG, Total Gate Charge [nC]
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