Fairchild 74LVQ374 service manual

74LVQ374 Low Voltage Octal D-Type Flip-Flop
with 3-STAT E Outputs
74LVQ374 Low Voltage Octal D-Type Flip-Flop with 3-STATE Outputs
February 1992 Revised June 2001
General Description
) are common to all flip-
Features
Ideal for low power/low noise 3.3V applications
Implements patented EMI reduction circuitry
Available in SOIC JEDEC, SOIC EIAJ a nd QS OP pack-
ages
Guaranteed simultaneous switching noise level and dynamic threshold performan ce
Improved latch-up immunity
Guaranteed incident wave switching into 75
4 kV minimum ESD immunity
Buffered positive edge-triggered cl ock
3-STATE outputs drive bus lines or buffer memory
address registers
Ordering Code:
Order Number Package Number Package Description
74LVQ374SC M20B 20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300" Wide 74LVQ374SJ M20D 20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 74LVQ374QSC MQA20 20-Lead Quarter Size Outline Package (QSOP), JEDEC MO-137, 0.150" Wide
Devices also availab l e in Tape and Reel. Specify by appending su ffix let te r “X” to the ordering code .
Logic Symbols
Connection Diagram
IEEE/IEC
Truth Table
Pin Descriptions
Pin Names Descriptio n
D
0–D7
CP Clock Pulse Input OE 3-STATE Output Enable Input O
0–O7
© 2001 Fairchild Semiconductor Corporation DS011360 www.fairchildsemi.com
Data Inputs
3-STATE Outputs
D
n
H L XXH Z
H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial Z = High Impedance
= LOW-to-HIGH Transition
Inputs Outputs
CP OE O
LH LL
n
Functional Description
The LVQ374 consists of eight ed ge -tri g ge red fli p -flo ps w ith individual D-type inputs and 3-STATE true outputs. The buffered clock and buffered Outp ut Enable ar e common to
74LVQ374
all flip-flops. The eight flip-flops will store the state of their individual D-type i nputs that meet the setup and hol d time requirements on the LOW-to-HIGH Clock (CP) transition.
With the Output Enable (OE eight flip-flops are available at the outputs. When the OE HIGH, the outputs go to the h igh imped ance state. O pera­tion of the OE flops.
input does not affect the state of the flip-
) LOW, the contents of the
Logic Diagram
Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.
is
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Absolute Maximum Ratings(Note 1) Recommended Operating
Supply Voltage (VCC) 0.5V to +7.0V DC Input Diode Current (I
V
= 0.5V 20 mA
I
= VCC + 0.5V +20 mA
V
I
DC Input Voltage (V DC Output Diode Current (I
= 0.5V 20 mA
V
O
V
= VCC + 0.5V +20 mA
O
DC Output Voltage (V
)
IK
) 0.5V to VCC + 0.5V
I
)
OK
) 0.5V to VCC + 0.5V
O
DC Output Source
or Sink Current (I
DC V
or Ground Current
CC
or I
(I
CC
GND
Storage Temperature (T
) ±50 mA
O
) ±400 mA
) 65°C to +150°C
STG
DC Latch-Up Source or
Sink Current ±300 mA
Conditions
Supply Voltage (V Input Voltage (V Output Voltage (VO)0V to V Operating Temperature (TA) 40°C to +85°C Minimum Input Edge Rate (
V
from 0.8V to 2.0V
IN
@ 3.0V 125 mV/ns
V
CC
Note 1: The Absolute Maximum Ratings are those value s beyond which the safety of the d evice cannot b e guaranteed . The device sh ould not be operated at these limit s. The parametric values defi ned in the Electrical Characteristics tables are not gu aranteed at the absolute m ax imum ratings . The Recomm ended O peratin g Cond itions table will defin e the condition s for actual device operation.
Note 2: Unused inputs must be held HIGH or LOW. They may not float.
(Note 2)
) 2.0V to 3.6V
CC
)0V to V
I
V/t)
DC Electrical Characteristics
V
Symbol Parameter
V
IH
V
IL
V
OH
V
OL
I
IN
I
OLD
I
OHD
I
CC
I
OZ
V
OLP
V
OLV
V
IHD
V
ILD
Note 3: All outputs loaded; thres holds on input associated with output unde r te s t . Note 4: Maximum test duration 2.0 ms, one output loaded at a time. Note 5: Incident wave switching on transmission lines with impedances as low as 75 for commercial temperature range is guaranteed for 74LVQ. Note 6: Worst case package. Note 7: Max number of outputs def ined as (n). Data inputs are driven 0V to 3.3V; one ou tp ut at GN D . Note 8: Max number of Data Inputs (n) switching. (n 1) inputs switching 0V to 3.3 V. Input-under-test s witchin g: 3.3V to thres hold (V
(V
Minimum High Level Input Voltage or VCC 0.1V Maximum Low Level Input Voltage or VCC 0.1V Minimum High Level 3.0 2.99 2.9 2.9 V I Output Voltage
Maximum Low Level 3.0 0.002 0.1 0.1 V I Output Voltage
Maximum Input Leakage Current 3.6 ±0.1 ±1.0 µAVI = VCC, GND Minimum Dynamic 3.6 36 mA V Output Current (Note 4) 3.6 −25 mA V Maximum Quiescent Supply Current or GND Maximum 3-STATE VI (OE) = VIL, V Leakage Current 3.6 ±0.25 ±2.5 µAVI = VCC, GND
Quiet Output
), f = 1 MHz.
IHD
Maximum Dynamic V Quiet Output
Minimum Dynamic V Maximum High Level
Dynamic Input Voltage Maximum Low Level
Dynamic Input Voltage
OL
OL
CC
(V) Typ Guaranteed Limits
3.0 1.5 2.0 2.0 V
3.0 1.5 0.8 0.8 V
3.0 2.58 2.48 V
3.0 0.36 0.44 V
3.6 4.0 40.0 µA
3.3 0.5 0.8 V (Note 6)(Note 7)
3.3 0.3 0.8 V (Note 6)(Note 7)
3.3 1.7 2.0 V (Note 6)(Note 8)
3.3 1.6 0.8 V (Note 6)(Note 8)
TA = +25°CTA = 40°C to +85°C
Units Conditions
V
= 0.1V
OUT
V
= 0.1V
OUT
= 50 µA
OUT
= VIL or VIH (Note 3)
V
IN
IOH = 12 mA
= 50 µA
OUT
= VIL or VIH (Note 3)
V
IN
IOL = 12 mA
= 0.8V Max (Note 5)
OLD
= 2.0V Min (Note 5)
OHD
VIN = VCC
VO = VCC, GND
), 0V to threshold
ILD
74LVQ374
CC CC
IH
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