Fairchild 74ACTQ74 service manual

74ACTQ74 Quiet Series Dual D-Type
Positive Edge-Triggered Flip-Flop
74ACTQ74 Quiet Series Dual D-Type
March 1993 Revised November 1999
General Description
The ACTQ74 utilizes Fairchild Quiet Series technology to guarantee quiet output switching and improved dynamic threshold performance. FACT Quiet Series features GTO output control and unde rshoot corre ctor in add ition to a split ground bus for superior performance.
) out-
Asynchronous Inputs:
LOW input to S LOW input to C Clear and Set are independent of clock
Simultaneous LOW on C
both Q and Q
(Set) sets Q to HIGH level
D
(Clear) sets Q to LOW level
D
and SD makes
D
HIGH
Features
ICC reduced by 50%
Guaranteed simultaneous switching noise level and
dynamic threshold performan ce
Guaranteed pin-to-pin skew AC performance
Improved latch-up immunity
4 kV minimum ESD immunity
TTL-compatible inputs
Ordering Code:
Order Number Package Number Package Description
74ACTQ74SC M14A 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow 74ACTQ74SJ M14D 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 74ACTQ74PC N14A 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Device also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering form.
Connection Diagram Pin Descriptions
Pin Names Description
D
, D
1
2
CP
, CP
1
C
, C
D1
S
, S
D1
Q
, Q1, Q2, Q
1
2
D2
D2
2
Data Inputs Clock Pulse Inputs Direct Clear Inputs Direct Set Inputs Outputs
FACT, FACT Quiet Series and GTO are trademarks of Fairchild Semiconductor Corporation.
© 1999 Fairchild Semiconductor Corporation DS010920 www.fairchildsemi.com
Truth Table
(Each Half)
Inputs Outputs
74ACTQ74
S
C
D
LHXXHL HLXXLH LLXXHH HH HH HHLXQ
H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial
= LOW-to-HIGH Clo c k Transi ti on
) = Previous Q(Q) before LOW-to-HIGH Transition of Clock
Q
0(Q0
CP D Q Q
D
HHL LLH
Logic Symbols
Q
0
0
IEEE/IEC
Block Diagram
Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.
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Absolute Maximum Ratings(Note 1) Recommended Operating
Supply Voltage (VCC) −0.5V to +7.0V DC Input Diode Current (I V
= 0.5V 20 mA
I
= VCC + 0.5V +20 mA
V
I
DC Input Voltage (V DC Output Diode Current (I
= 0.5V 20 mA
V
O
V
= VCC + 0.5V +20 mA
O
DC Output Voltage (V
)
IK
) −0.5V to VCC + 0.5V
I
)
OK
) −0.5V to VCC + 0.5V
O
DC Output Source
or Sink Current (I
DC V
or Ground Current
CC
per Output Pin (I Storage Temperature (T
) ± 50 mA
O
or I
CC
) ± 50 mA
GND
) −65°C to +150°C
STG
DC Latch-Up Source or Sink Current ± 300 mA Junction Temperature (T
) PDIP 140°C
J
Conditions
Supply Voltage (V Input Voltage (V Output Voltage (VO) 0V to V Operating Temperature (TA) 40°C to +85°C Minimum Input Edge Rate ∆V/∆t V
from 0.8V to 2.0V
IN
@ 4.5V, 5.5V 125 mV/ns
V
CC
Note 1: Absolute maximu m rating s are thos e values be yond wh ich dam­age to the device may occur. The databook specifications should be met, without exception, to ensure that the system design is reliable over its power supply, temperature, an d output/input loading variables. Fair child does not re c om m end operation of FACT circuit s outside databook s pecifi­cations.
) 4.5V to 5.5V
CC
) 0V to V
I
DC Electrical Characteristics
V
Symbol Parameter
V
Minimum HIGH Level 4.5 1.5 2.0 2.0
IH
Input Voltage 5.5 1.5 2.0 2.0 or VCC 0.1V
V
Maximum LOW Level 4.5 1.5 0.8 0.8
IL
Input Voltage 5.5 1.5 0.8 0.8 or VCC 0.1V
V
Minimum HIGH Level 4.5 4.49 4.4 4.4
OH
Output Voltage 5.5 5.49 5.4 5.4
V
Maximum LOW Level 4.5 0.001 0.1 0.1
OL
Output Voltage 5.5 0.001 0.1 0.1
Maximum Input Leakage Current 5.5 ± 0.1 ± 1.0 µAVI = VCC, GND
I
IN
I
Maximum 3-STATE
OZ
Leakage Current VO = VCC, GND
I
Maximum ICC/Input 5.5 0.6 1.5 mA VI = VCC 2.1V
CCT
I
Minimum Dynamic 5.5 75 mA V
OLD
I
Output Current (Note 2) 5.5 −75 mA V
OHD
I
Maximum Quiescent Supply Current 5.5 2.0 20.0 µAVIN = VCC or GND
CC
V
Quiet Output Maximum
OLP
Dynamic V
V
OLV
V
IHD
V
ILD
Note 2: All outputs loaded; thres holds on input associated with output under test. Note 3: Maximum test duration 2.0 ms, one output loaded at a time. Note 4: PDIP package. Note 5: Max number of outputs defined as (n). Data inputs are driven 0V to 3V. One output @ GND. Note 6: Max number of data input s (n ) s w it c hing. (n 1) inputs switching 0V to 3V. Input-under-test swit ch ing:
OL
Quiet Output Minimum Dynamic V
OL
Minimum HIGH Level Dynamic Input Voltage 5.0 1.9 2.2 V (Note 4)(Note 6) Maximum LOW Level Dynamic Input Voltage 5.0 1.2 0.8 V (Note 4)(Note 6)
3V to threshold (V
), 0V to threshold (V
ILD
IHD
CC
(V) Typ Guaranteed Limits
4.5 3.86 3.76
5.5 4.86 4.76
4.5 0.36 0.44
5.5 0.36 0.44
5.5 ± 0.5 ± 5.0 µA
5.0 1.1 1.5 V
5.0 0.6 1.2 V
), f = 1 MHz.
TA = +25°C TA = 40°C to +85°C
Units Conditions
V
V
VI
V
VI
V
CC CC
V
= 0.1V
OUT
V
= 0.1V
OUT
= 50 µA
OUT
VIN = V
or V
IL
IOH = 24 mA IOH = 24 mA (Note 2)
OUT
VIN = VIL or V IOL = 24 mA I
OL
VI = VIL, V
OLD OHD
Figure 1, Figure 2 (Note 4)(Note 5) Figure 1, Figure 2 (Note 4)(Note 5)
IH
= 50 µA
IH
= 24 mA (Note 2)
IH
= 1.65V Max = 3.85V Min
74ACTQ74
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