The ACQ/ACTQ37 4 is a high-speed, low-po wer octal Dtype flip-flop featuring separate D-t ype inputs for each flipflop and 3-STATE outputs for bus-oriented app lications. A
buffered Clock (CP) and Output Enable (OE
to all flip-flops.
The ACQ/ACTQ374 utilizes FACT Quiet Series technology to guarantee quiet output switching and improve
dynamic threshold performance. FACT Quiet Series features GTO output control and undershoot corrector in
addition to a split ground bus for superior performance.
) are common
Features
■ ICC and IOZ reduced by 50%
■ Guaranteed simultaneous switching noise level and
dynamic threshold performan ce
■ Guaranteed pin-to-pin skew AC performance
■ Improved latch-up immunity
■ Buffered positive edge-triggered cl ock
■ 3-STATE outputs drive bus lines or buffer memory
address registers
■ Outputs source/sink 24 mA
■ Faster prop delays than the standard AC/ACT374
Ordering Code:
Order Number Package NumberPackage Description
74ACQ374SCM20B20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300” Wide Body
74ACQ374SJM20D20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
74ACQ374PCN20A20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300” Wide
74ACTQ374SCM20B20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300” Wide Body
74ACTQ374SJM20D20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
74ACTQ374QSCMQA2020-Lead Quarter Size Outline Pa ckag e (QSOP ), JED EC MO -13 7, 0.15 0” Wide
74ACTQ374PCN20A20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300” Wide
Device also available in Tape and Reel. Specify by appending suffix letter “X” to the or dering code.
Connection DiagramPin Descriptions
Pin NamesDescription
D
0–D7
CPClock Pulse Input
OE
O
0–O7
Data Inputs
3-STATE Output Enable Input
3-STATE Outputs
FACT, Q u i et Serie s, FACT Quiet Series, and GT O are trademarks of Fairchild Semiconductor Corporation.
The ACQ/ACTQ374 consists of eight edge-trigger ed flipflops with individual D- type inputs and 3-STATE true outputs. The buffered clock a nd buffered Output Enable a re
common to all flip-flops. The eight flip-flops will store the
state of their individ ual D-type inputs that mee t the setup
and hold time requirements on the LOW-to-HIGH Clock
(CP) transition. With the Output Enable (OE
contents of the eight flip-flops are avai lable at th e outputs.
When the OE
ance state. Operation of the OE
state of the flip-flops.
is HIGH, the outputs go to the high imped-
input does not affect the
) LOW, the
Truth Table
InputsOutputs
D
n
H
L
XXH Z
H = HIGH Voltage Level
L = LOW Voltage Level
X = Immaterial
Z = High Impedance
= LOW-to-HIGH Transition
CPOEO
LH
LL
n
Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.
www.fairchildsemi.com2
Absolute Maximum Ratings(Note 1)Recommended Operating
Supply Voltage (VCC)−0.5V to +7.0V
DC Input Diode Current (I
V
=−0.5V−20 mA
I
= VCC + 0.5V+20 mA
V
I
DC Input Voltage (V
DC Output Diode Current (I
=−0.5V−20 mA
V
O
V
= VCC + 0.5V+20 mA
O
DC Output Voltage ( V
)
IK
)−0.5V to VCC + 0.5V
I
)
OK
)−0.5V to VCC + 0.5V
O
DC Output Source
or Sink Current (I
DC V
or Ground Current
CC
per Output Pin (I
Storage Temperature (T
)±50 mA
O
or I
CC
)±50 mA
GND
)−65°C to +150°C
STG
DC Latch-Up Source or Sink Current±300 mA
Junction Temperature (T
)
J
PDIP140°C
Conditions
Supply Voltage (V
ACQ2.0V to 6.0V
ACTQ4.5V to 5.5V
Input Voltage (V
Output Voltage (VO)0V to V
Operating Temperature (TA)−40°C to +85°C
Minimum Input Edge Rate ∆V/∆t
Note 1: Absolute max imum ratings are those values beyond which damage
to the device may occu r. The databook spe cificatio ns shou ld be met, w ithout exception, to ensure that the system de sign is relia ble over its p ower
supply, temperature, and output/input loading variables. Fairchild does not
recommend operation of FACT circuits outside datab ook s pecifications.
)
CC
)0V to V
I
CC
DC Electrical Characteristics for ACQ
V
SymbolParameter
V
IH
V
IL
V
OH
V
OL
IIN (Note 4) Maximum Input Leakage Current5.5±0.1±1.0µAVI = VCC, GND
I
OLD
I
OHD
I
CC
I
OZ
V
OLP
Minimum HIGH Level3.01.52.12.1V
Input Voltage4.52.253.153.15Vor VCC − 0.1V
Maximum LOW Level3.01.50.90.9V
Input Voltage4.52.251.351.35Vor VCC − 0.1V
Minimum HIGH Level3.02.992.92.9
Output Voltage4.54.494 .44.4VI
Maximum LOW Level3.00.0020.10.1
Output Voltage4.50.0010.10.1VI
Minimum Dynamic5.575mAV
Output Current (Note 3)5.5−75mAV
(Note 4) Maximum Quiescent Supply Current5.54.040.0µAVIN = VCC or GND
Maximum 3-STATEVI (OE) = VIL, V
Leakage Current5.5±0.25±2.5µAVI = VCC, GND
Quiet Output5.01.11.5VFigure 1, Figure 2
Maximum Dynamic V
OL
CC
(V)TypGuaranteed Limits
5.52.753.853.85
5.52.751.651.65
5.55.495.45.4
3.02.562.46IOH =−12 mA
4.53.863.76VI
5.54.864.76I
5.50.0010.10.1
3.00.360.44IOL = 12 mA
4.50.360.44VIOL = 24 mA
5.50.360.44IOL = 24 mA (Note 2)
TA =+25°CTA =−40°C to +85°C
UnitsConditions
= 0.1V
OUT
= 0.1V
OUT
=−50 µA
OUT
VIN = VIL or V
=−24 mA
OH
=−24 mA (Note 2)
OH
= 50 µA
OUT
= 1.65V Max
OLD
= 3.85V Min
OHD
VO = VCC, GND
(Note 5)(Note 6)
74ACQ374 • 74ACTQ374
CC
CC
IH
IH
3www.fairchildsemi.com
DC Electrical Characteristics for ACQ (Continued)
V
SymbolParameter
V
OLV
V
IHD
Quiet Output5.0−0.6−1.2VFigure 1, Figure 2
Minimum Dynamic V
OL
Minimum HIGH Level
Dynamic Input Voltage
V
ILD
Maximum LOW Level
Dynamic Input Voltage
Note 2: All outputs loaded; thresholds on input associated with output under test.
74ACQ374 • 74ACTQ374
Note 3: Maximum test dura tio n 2. 0 ms, one output loaded at a time.
and ICC @ 3.0V are guaranteed to be less than or eq ual to the respective lim it @ 5. 5V VCC.
Note 4: I
IN
Note 5: DIP Package .
Note 6: Max number of output s d ef i ned as (n). Data inputs are driven 0V to 5V. One output @ GND .
Note 7: Max number of data inputs (n) switching. (n−1) inputs switching 0V to 5V (ACQ). Input-under-test switching: 5V to threshold (V
0V to threshold (V
), f = 1 MHz.
IHD
CC
(V)TypGuaranteed Limits
5.03.13.5V(Note 5)(Note 7)
5.01.91.5V(Note 5)(Note 7)
TA =+25°CTA =−40°C to +85°C
UnitsConditions
(Note 5)(Note 6)
DC Electrical Characteristics for ACTQ
V
SymbolParameter
V
IH
Minimum HIGH Level4.51.52.02.0
CC
(V)TypGuaranteed Limits
Input Voltage5.51.52.02.0or VCC − 0.1V
V
IL
Maximum LOW Level4.51.50.80.8
Input Voltage5.51.50.80.8or V
V
OH
Minimum HIGH Level4.54.494.44.4
Output Voltage5.55.495.45.4
4.53.863.76V IOH =−24 mA
5.54.864.76I
V
OL
Maximum LOW Level4.50.0010.10.1
Output Voltage5.50.0010.10.1
4.50.360.44V IOL = 24 mA
5.50.360.44IOL = 24 mA (Note 8)
I
(Note 4) Maximum Input Leakage Current5.5±0.1±1.0µAV
IN
I
OZ
I
CCT
I
OLD
I
OHD
I
CC
(Note 4)Supply Currentor GND
V
OLP
V
OLV
V
IHD
V
ILD
Note 8: All outputs loaded; thresholds on input associated with output under test.
Note 9: Maximum test dura tio n 2. 0 ms, one output loaded at a time.
Note 10: DIP package.
Note 11: Max number of outputs defined as (n). Data inputs are driven 0V to 3V. One output @ GND
Note 12: Max number of data inp ut s (n) s w it c hing. (n−1) inputs sw it c hing 0V to 3V (ACTQ). In put -under-test switching: 3V to threshold (V
0V to threshold (V
Maximum 3-STATE
CurrentVO = VCC, GND
Maximum
ICC/Input (Note 4)
5.5±0.25±2.5µA
5.50.61.5mA V
Minimum Dynamic5.575mA V
Output Current (Note 8)5.5−75mA V
Maximum Quiescent
Quiet Output
Maximum Dynamic V
Quiet Output
Minimum Dynamic V
OL
OL
5.54.040.0µA
5.01.11.5V
5.0−0.6−1.2V
Minimum HIGH Level Dynamic Input Voltage5.01.92.2V (Note 10)(Note 12)
Maximum LOW Level Dynamic Input Voltage5.01.20.8V (Note 10)(Note 12)