EXTECH ELECTRONICS CO., LTD., certifies that the instrument listed in this manual meets
or exceeds published manufacturing specifications. This instrument was calibrated using
standards that are traceable to Chinese National Laboratory Accreditation (CNLA).
Your new instrument is warranted to be free from defects in workmanship and material for a
period of (3) years from date of shipment. During the warranty period, you must return the
instrument to EXTECH Electronics Co., or its branches or its authorized distributor for repair.
EXTECH Electronics Co., reserves the right to use its discretion on replacing the faulty parts or
replacing the assembly or the whole unit.
Any non-authorized modifications, tampering or physical damage will void your warranty.
Elimination of any connections in the earth grounding system or bypassing any safety systems
will void this warranty. This warranty does not cover batteries or accessories not of EXTECH
manufacture. Parts used must be parts that are recommended by EXTECH as an acceptable
specified part. Use of non-authorized parts in the repair of this instrument will void the
warranty.
This warranty does not cover accessories not of EXTECH manufacture.
Except as provided herein, EXTECH makes no warranties to the purchaser of this instrument
and all other warranties, express or implied (including, without limitation, merchantability or
fitness for a particular purpose) are hereby excluded, disclaimed and waived.
Product will be marked with this symbol when it is necessary to refer to the
operation and service manual in order to prevent injury or equipment damage.
Product will be marked with this symbol when hazardous voltages may be present.
Product will be marked with this symbol at connections that require earth grounding.
WARNING
CAUTION
Calls attention to a procedure, practice, or condition that could possibly
cause bodily injury or death.
Calls attention to a procedure, practice, or condition that could possibly
cause damage to equipment or permanent loss of data
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1.2 Glossary of Terms (As used in this manual)
Alternating Current, AC: Current that reverses direction on a regular basis, commonly in
the U.S.A. 60 per second, in other countries 50 times per second.
Breakdown: The failure of insulation to effectively prevent the flow of current sometimes
evidenced by arcing. If voltage is gradually raised, breakdown will begin suddenly at a
certain voltage level. Current flow is not directly proportional to voltage. Once breakdown
current has flown, especially for a period of time, the next gradual application of voltage will
often show breakdown beginning at a lower voltage than initially.
Conductive: Having a volume resistivity of no more than 103 ohm-cm or a surface
resistivity of no more than 105 ohms per square.
Conductor: A solid or liquid material which has the ability to let current pass through it, and
which has a volume resistivity of no more than 103 ohm-cm.
Current: The movement of electrons through a conductor. Current is measured in amperes,
milliamperes, microamperes, nanoamperes, or picoamperes. Symbol = I
Dielectric: An insulating material that is positioned between two conductive materials in
such a way that a charge or voltage may appear across the two conductive materials.
Direct Current, DC: Current that flows in one direction only. The source of direct current
is said to be polarized and has one terminal that is always at a higher potential than the other.
Hipot Tester: Common term for dielectric-withstand test equipment.
Insulation: Gas, liquid or solid material which has a volume resistivity of at least 10
ohm-cm and is used for the purpose of resisting current flow between conductors.
Insulation Resistance Tester: An instrument or a function of an instrument capable of
measuring resistance's in excess of 200 megohms. Usually employs a higher voltage power
supply than used in ohmmeters measuring up to 200 megohms.
Leakage: AC or DC current flow through insulation and over its surfaces, and AC current
flow through a capacitance. Current flow is directly proportional to voltage. The insulation
and/or capacitance are thought of as a constant impedance, unless breakdown occurs.
Resistance: That property of a substance that impedes current and results in the dissipation
of power, in the form of heat. The practical unit of resistance is the ohm. Symbol = R
Trip Point: A minimum or maximum parameter set point that will cause an indication of
unacceptable performance during a run test.
Voltage: Electrical pressure, the force which causes current through an electrical conductor.
Symbol = V
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1.3 Safety
• This product and its related documentation must be reviewed for familiarization with safety
markings and instructions before operation.
• This product is a Safety Class I instrument (provided with a protective earth terminal).
• Before applying power, please verify that the instrument is set to the correct line voltage
(115V or 230V) and the correct fuse is installed.
• Must connect with isolated oscilloscope to BNC connect to take waveform
WARNING
procedures must be strictly observed when handling and using the test instrument.
1.3.1 Service and Maintenance
A Hipot produces voltages and currents that can cause harmful or fatal
electric shock. To prevent accidental injury or death, these safety
User Service
To prevent electric shock do not remove the instrument cover. There are no user serviceable
parts inside. Routine maintenance or cleaning of internal parts is not necessary. Avoid the
use of cleaning agents or chemicals on the instrument, some chemicals may damage plastic
parts or lettering. Any external cleaning should be done with a clean dry or slightly damp
cloth. Schematics, when provided, are for reference only. Any replacement cables and high
voltage components should be acquired directly from EXTECH Electronics Co. Ltd.. Refer
servicing to EXTECH Electronics Co. Ltd. customer support department.
Unauthorized user modifications will void your warranty. EXTECH Electronics will not be
responsible for any injuries sustained due to unauthorized equipment modifications or use of
parts not specified by EXTECH Electronics. Instruments returned to EXTECH Electronics
with unsafe modifications will be returned to their original operating condition at the
customers expense.
1.3.2 Test Station
Location
Select an area away from the main stream of activity which employees do not walk through in
performing their normal duties. If this is not practical because of production line flow, then
the area should be roped off and marked for HIGH VOLTAGE TESTING. No employees
other than the test operators should be allowed inside.
If benches are placed back-to-back, be especially careful about the use of the bench opposite
the test station. Signs should be posted: "DANGER - HIGH VOLTAGE TEST IN
PROGRESS - UNAUTHORIZED PERSONNEL KEEP AWAY."
Power
Dielectric Voltage-Withstand Test Equipment must be connected to a good ground. Be
certain that the power wiring to the test bench is properly polarized and that the proper low
resistance bonding to ground is in place.
Power to the test station should be arranged so that it can be shut off by one prominently
marked switch located at the entrance to the test area. In case of an emergency, anyone can
cut off the power before entering the test area to offer assistance.
Work Area
Perform the tests on a non-conducting table or workbench, if possible. If you cannot avoid
using a conductive surface, be certain that it is connected to a good earth ground and the high
voltage connection is insulated from the grounded surface.
There should not be any metal in the work area between the operator and the location where
products being tested will be positioned. Any other metal in the work area should be
connected to a good ground, never left "floating".
Position the tester so the operator does not have to reach over the product under test to activate
or adjust the tester. If the product or component being tested is small, it may be possible to
construct guards or an enclosure around the device to be tested. Construct the guards of a
non-conducting material such as clear acrylic, so that the item being tested is within the guards
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or enclosure during the test. If possible, the guards or enclosure should also contain safety
switches that will not allow the tester to operate unless the guards are in place or the enclosure
closed.
Keep the area clean and uncluttered. All test equipment and test leads not necessary for the
test should be removed from the test bench and put away. It should be apparent to both the
operator and to any observers, the product that is being tested and the product that is waiting to
be tested, or has already been tested.
Do not perform Hipot tests in a combustible atmosphere or in any area where
combustible materials are present.
1.3.3 Test Operator
Qualifications
This instrument generates voltages and currents that can cause harmful or fatal electric
shock and must only be operated by a skilled worker trained in its use.
The operator should understand the electrical fundamentals of voltage, current, and resistance.
They should recognize that the test instrument is a variable high-voltage power supply with
the return circuit directly connected to earth ground, therefore, current from the high-voltage
output will flow through any available ground path.
Rules
Operators should be thoroughly trained to follow all of the aforementioned rules, in addition to
any other applicable safety rules and procedures. Defeating any safety system should be
considered a serious offense with severe penalties such as removal from the Hipot testing job.
Allowing unauthorized personnel in the area during a test should also be dealt with as a
serious offense.
Dress
Operators should not wear jewelry that could accidentally complete a circuit.
Medical Restrictions
Personnel with heart ailments or devices such as pacemakers should be informed that the
voltages and currents generated by the instrument are very dangerous. If contacted it may
cause heart-related problems that a person of good health may not experience. Please have
the test operator consult their physician for recommendations.
1.3.4 Instrument Connections
WARNING
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Never perform a hipot test on energized circuitry or equipment.
The instrument is equipped with a safety ground connection, be sure that this is connected to a
good earth ground.
Always connect the return lead first, regardless of whether the item under test is a sample of
insulating material, a component tested with the high voltage test lead, or a cord-connected
device with a two or three prong plug. The return lead should be connected first for any type
of hipot testing.
Plug in the high voltage test lead only when it is being used. Handle its clip only by the
insulator---never touch the clip directly. Be certain that the operator has control over any
remote test switches connected to the Hipot. Double check the return and high voltage
connections from the Hipot and the Line, Neutral, Ground and Case connections from the
Touch Current tester to be certain that they are proper and secure.
Device Under Test
WARNING
When testing with DC, always discharge the capacitance of the item under test and anything
the high voltage may have contacted--such as test fixtures--before handling it or disconnecting
the test leads.
HOT STICK probes can be used to discharge any capacitance in the device under test as a
further safety precaution. A hot stick is a non-conducting rod about two feet long with a
metal probe at the end that is connected to a wire. To discharge the device under test, two hot
sticks are required. First, connect both probe wires to a good earth ground. Then touch one
probe tip to the same place that the return lead was connected. While holding the first probe
in place, touch the second probe tip to the same place where the high voltage lead was
connected.
1.3.5 Key Safety Points to Remember
Never touch the Device Under Test (DUT) or anything connected to it while
high voltage is being applied by the hipot.
• Keep unqualified and unauthorized personnel away from the test area.
• Arrange the test station in a safe and orderly manner.
• Never touch the product or connections during a test.
• In case of any problem, turn off the high voltage first.
• Properly discharge any item tested with DC before touching connections.
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1.4 Introduction to Product Safety Testing
The Importance of Safety Testing
Product Safety Tests are specified during the design and development stages of a product as
well as in the production of the products to insure that it meets basic safety requirements.
These tests are designed to verify the safety of the electrical products in that they do not
jeopardize the safety of the people, domestic animals, and property of anyone who may come
in contact with these products. In an era of soaring liability costs, original manufacturers of
electrical and electronic products must make sure every item is as safe as possible. All
products must be designed and built to prevent electric shock, even when users abuse the
equipment or by-pass built in safety features.
To meet recognized safety standards, one common test is the "dielectric voltage-withstand
test". Safety agencies which require compliance safety testing at both the initial product
design stage and for routine production line testing include: Underwriters Laboratories, Inc.
(UL), the Canadian Standards Association (CSA), the International Electrotechnical
Commission (IEC), the British Standards Institution (BSI), the Association of German
Electrical Engineers (VDE) and (TÜV), the Japanese Standards Association (JSI). These
same agencies may also require that an insulation resistance test and high current ground bond
test be performed.
1.5 Safety Test
1.5.1 Dielectric Withstand Voltage Test
The principle behind a dielectric voltage - withstand test is simple. If a product will function
when exposed to extremely adverse conditions, it can be assumed that the product will
function in normal operating circumstances.
Common Applications of the Dielectric Withstand Test:
• Design (performance) testing: Determining design adequacy to meet service conditions.
• Production Line testing: Detecting defects in material or workmanship during processing.
• Acceptance testing: Proving minimum insulation requirements of purchased parts.
• Repair Service testing: Determine reliability and safety of equipment repairs.
The specific technique used to apply the dielectric voltage - withstand test to each product is
different. During a dielectric voltage - withstand test, an electrical device is exposed to a
voltage significantly higher than it normally encounters, for a specified duration of time.
During the test, all current flow from the high voltage output to the return is measured. If,
during the time the component is tested, the current flow remains within specified limits, the
device is assumed safe under normal conditions. The basic product design and use of the
insulating material will protect the user against electrical shock.
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The equipment used for this test, a dielectric-withstand tester, is often called a "hipot" (for
high potential tester). The "rule of thumb" for testing is to subject the product to twice its
normal operating voltage, plus 1,000 volts.
However, specific products may be tested at much higher voltages than 2X operating voltages
+ 1,000 volts. For example, a product designed to operate in the range between 100 to 240
volts can be tested between 1,000 to 4,000 volts or higher. Most "double insulated" products
are tested at voltages much higher than the "rule of thumb".
Testing during development and prototype stages is more stringent than production run tests
because the basic design of the product is being evaluated. Design tests usually are
performed on only a few samples of the product. Production tests are performed on every
item as it comes off the production line.
The hipot tester must also maintain an output voltage between 100% and 120% of
specification. The output voltage of the hipot must have a sinusoidal waveform with a
frequency between 40 to 70 Hz and has a peak waveform value that is not less than 1.3 and not
more than 1.5 times the root-mean-square value.
Types of Failures only detectable with a Hipot test
• Weak Insulating Materials
• Pinholes in Insulation
• Inadequate Spacing of Components
• Pinched Insulation
1.5.1.1 AC Dielectric Withstand Test
Please check with the Compliance Agency you are working with to see which of the two types
of voltages you are authorized to use. In some cases, a Compliance Agency will allow either
AC or DC testing to be done. However, in other cases the Compliance Agency only allows
for an AC test.
Many safety agency specifications allow either AC or DC voltages to be used during the hipot
test. When this is the case, the manufacturer must make the decision on which type of
voltage to utilize. In order to do this it is important to understand the advantages and the
disadvantages of both AC and DC testing.
AC testing characteristics
Most items that are hipot tested have some amount of distributed capacitance. An AC
voltage cannot charge this capacitance so it continually reads the reactive current that flows
when AC is applied to a capacitive load.
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AC testing advantages
1. AC testing is generally much more accepted by safety agencies than DC testing. The main
reason for this is that most items being hipot tested will operate on AC voltages. AC hipot
testing offers the advantage of stressing the insulation alternately in both polarities, which
more closely simulates stresses the product will see in real use.
2. Since AC testing cannot charge a capacitive load the current reading remains consistent
from initial application of the voltage to the end of the test. Therefore, there is no need to
gradually bring up the voltage since there is no stabilization required to monitor the current
reading. This means that unless the product is sensitive to a sudden application of voltage
the operator can immediately apply full voltage and read current without any wait time.
Another advantage of AC testing is that since AC voltage cannot charge a load there is no need
to discharge the item under test after the test.
AC testing disadvantages
One disadvantage of AC testing surfaces when testing capacitive products. Again, since AC
cannot charge the item under test, reactive current is constantly flowing. In many cases, the
reactive component of the current can be much greater than the real component due to actual
leakage. This can make it very difficult to detect products that have excessively high leakage
current.
Another disadvantage of AC testing is that the hipot has to have the capability of supplying
reactive and leakage current continuously. This may require a current output that is actually
much higher than is really required to monitor leakage current and in most cases is usually
much higher than would be needed with DC testing. This can present increased safety risks
as operators are exposed to higher currents.
1.5.1.2 DC Dielectric Withstand Test
DC testing characteristics
During DC hipot testing the item under test is charged. The same test item capacitance that
causes reactive current in AC testing results in initial charging current which exponentially
drops to zero in DC testing.
DC testing advantages
Once the item under test is fully charged, the only current flowing is true leakage current.
This allows a DC hipot tester to clearly display only the true leakage of the product under test.
Another advantage to DC testing is that the charging current only needs to be applied
momentarily. This means that the output power requirements of the DC hipot tester can
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typically be much less than what would be required in an AC tester to test the same product.
DC testing disadvantages
1. Unless the item being tested has virtually no capacitance, it is necessary to raise the voltage
gradually from zero to the full test voltage. The more capacitive the item the more slowly
the voltage must be raised. This is important since most DC hipots have failure shut off
circuitry which will indicate failure almost immediately if the total current reaches the
leakage threshold during the initial charging of the product under test.
2. Since a DC hipot does charge the item under test, it becomes necessary to discharge the
item after the test.
3. DC testing unlike AC testing only charges the insulation in one polarity. This becomes a
concern when testing products that will actually be used at AC voltages. This is an
important reason that some safety agencies do not accept DC testing as an alternative to AC.
4. When performing AC hipot tests the product under test is actually tested with peak voltages
that the hipot meter does not display. This is not the case with DC testing since a sinewave
is not generated when testing with direct current. In order to compensate for this most
safety agencies require that the equivalent DC test be performed at higher voltages than the
AC test. The multiplying factor is somewhat inconsistent between agencies which can
cause confusion concerning exactly what equivalent DC test voltage is appropriate.
1.5.2 Insulation Resistance Test
Some "dielectric analyzers today come with a built in insulation resistance tester. Typically,
the IR function provides test voltages from 500 to 1,000 volts DC and resistance ranges from
kilohms to gigaohms. This function allows manufacturers to comply with special
compliance regulations. BABT, TÜV and VDE are agencies that may under certain
conditions, require an IR test on the product before a Hipot test is performed. This typically
is not a production line test but a performance design test.
The insulation resistance test is very similar to the hipot test. Instead of the go/no go
indication that you get with a hipot test the IR test gives you an insulation value usually in
Megohms. Typically, the higher the insulation resistance value the better the condition of the
insulation. The connections to perform the IR test are the same as the hipot test. The
measured value represents the equivalent resistance of all the insulation which exists between
the two points and any component resistance which might also be connected between the two
points.
Although the IR test can be a predictor of insulation condition it does not replace the need to
perform a dielectric withstand test.
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1.5.3 Ground Continuity Test or Ground Bond Test
The Ground Bonding test determines whether the safety ground circuit of the product under
test can adequately handle fault current if the product should ever become defective. A low
impedance ground system is critical in ensuring that in case of a product failure, a circuit
breaker on the input line will act quickly to protect the user from any serious electrical shock.
International compliance agencies such as CSA, IEC, TÜV, VDE, BABT and others, have
requirements calling out this test. This test should not be confused with low current
continuity tests that are also commonly called out in some safety agency specifications. A
low current test merely indicates that there is a safety ground connection. It does not
completely test the integrity of that connection.
Compliance agency requirements vary on how different products are to be tested. Most
specifications call for test currents of between 10 and 40 amps. Test voltages at these
currents are typically required to be less than 12 volts. Maximum allowable resistance
readings of the safety ground circuit are normally between 100 and 200 milliohms.
If you are testing a product that is terminated in a three-prong plug, you are required to
perform a continuity or ground bond test on the ground conductor to the chassis or dead metal
of the product.
1.5.4 RUN Test
All manufacturers of a product that runs on line power normally need to run the DUT (Device
Under Test) after final safety testing so that they can verify the functionality of their products.
In addition to running the DUT to test its basic functionality many customers also require
some basic test data to be recorded while the DUT is powered up. A Run Test System allows
the product to be powered up immediately after the safety tests are completed with a single
connection to the DUT. Measurements that are commonly made while the DUT is running
can include Amperage, Voltage, Watts and Power Factor.
1.5.5 Touch Current Test
The Touch Current test is one of many product safety tests that are normally specified for
electrical products by safety testing agencies such as Underwriters Laboratories (UL) and the
International Electrotechnical Committee (IEC). The Touch Current specifications vary as
well as the method in which the measurements are taken depending upon the application or
function of a product and the standard to which the product is being tested.
Current Leakage or Touch Current tests are general terms that actually describe three
different types of tests. These tests are Earth Leakage Current, Enclosure Leakage Current,
and Applied Part Leakage Current. The main differences in these tests are in the placement
of the probe for the measuring device. The Earth Leakage Current is the leakage current that
flows through the ground conductor in the line cord back to earth. The Enclosure Leakage
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Current is the current that flows from any enclosure part through a person back to ground if it
were contacted by a person. The Applied Part Leakage Current or Patient Lead Leakage
Current is any leakage that flows from an applied part, between applied parts or into an
applied part. The Applied Part Leakage Current test is required only for medical equipment.
All of these tests are used to determine if products can be safely operated or handled without
posing a shock hazard to the user.
Touch Current Testers provide the capability of meeting the Touch Current test specified in
the following standards; UL 544, IEC 950, UL 1950, IEC 601-1, UL 2601, UL 1563, UL 3101,
IEC 1010 and others. The Touch Current test, is a test which measures the leakage current
of a product, through a circuit that is designed to simulate the impedance of the human body.
The simulation circuit is called the Measuring Device (MD). The instrument has five
different MD circuits, selectable through the menu, which are representative circuits designed
to simulate the impedance of the human body under different conditions. The impedance of
the human body will vary depending upon point of contact, the surface area of the contact
and the path the current flows. For these reasons, the specifications of the Measuring
Devices are different depending upon the type of test being performed as well as the maximum
allowable leakage current. Leakage current measurements are performed on products under
normal conditions and single fault conditions as well as reversed polarity. This simulates
possible problems, which could occur if the product under test is faulted or misused while the
product is operating under high line conditions (110% of the highest input voltage rating of the
product).
Touch Current tests are normally specified as “Type Tests” or “Design Tests” which are
performed during the development of the product. This helps verify that the design is safe
but it does not guarantee the safety of the products being produced on the production line.
The only way to be sure you are shipping safe products is to test each product at the end of the
production line. The user may perform a Leakage Current test along with other common
safety test such as Dielectric Withstand, Insulation Resistance, and Ground Bond on the
production line with a single connection to the device under test.
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2. Getting Started
This section contains information for the unpacking, inspection, preparation for use and
storage of your EXTECH Electronics Co., Ltd. product.
2.1 Unpacking and Inspection
Packaging
Your instrument was shipped in a custom foam insulated container that complies with ASTM
D4169-92a Assurance Level II Distribution Cycle 13 Performance Test Sequence
If the shipping carton is damaged, inspect the contents for visible damage such as dents,
scratches or broken display. If the instrument is damaged, notify the carrier and EXTECH's
customer support department. Please save the shipping carton and packing material for the
carriers inspection. Our customer support department will assist you in the repair or
replacement of your instrument. Please do not return your product without first notifying us .
Please retain all of the original packaging materials.
Contents of the Carton
Inside the carton should be the following:
Description Part No.
7630
Operation Manual
Fuse *1 F2A-2S
10A Power Cord *1 WC-10-YP03
Interlock Key2-KEY-02-A00 (Please install the
interlock key in the rear panel
before instrument has been used.)
DUT Input Power Lead *1 1151
40A DUT Power Cable *1
1148
(For 7630 without OPT. 753)
Hipot Return Lead *2
1102
(For 7630 without OPT. 753)
OPT.753 HV & GB Link Module
TC Receptacle Adaptor Box *1 1932
Hipot Link Lead *1 1105
DUT Power & HV Cable 40A / 4KV *1 1149
Hipot Test Lead *2 1101
Y type terminal 3-TM-5.5-6-Y
Insulating sleeve (Black sleeve*1 & Green sleev *1) 3-V-5.5B, 3-V-5.5R
1931 & 1931S Series Transformer Box
RS485 cable 1220
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Returning the Instrument
When it is necessary to return the instrument for servicing or calibration, repackage the
instrument in its original container, please include all accessories and test leads. Indicate the
nature of the problem or type of service needed. Also, please mark the container
"FRAGILE" to insure proper handling.
If you do not have the original packaging materials, please follow these guidelines:
• Wrap the instrument in a bubble pack or similar foam. Enclose the same information as
above.
• Use a strong double-wall container that is made for shipping instrumentation. 350 lb. test
material is adequate.
• Use a layer of shock-absorbing material 70 to 100 mm (3 to 4 inch) thick around all sides
of the instrument. Protect the control panel with cardboard.
• Seal the container securely.
• Mark the container "FRAGILE" to insure proper handling.
2.2 Installation
2.2.1 Power Requirements
This instrument requires a power source of either 115 volts AC ± 15%, 47~63 Hz single phase
or 230 volts AC ±15%, 47~63 Hz single phase. Please check the rear panel to be sure the
proper switch setting is selected for your line voltage requirements before turning your
instrument on. AT the same time, please must use the sure fuse for the instrument. It’s
specification is marked in rear panel of instrument. Please must turn off input power to avoid
dangerous before replace the fuse.
CAUTION
represents a safety risk to the operator.
2.2.2 Basic Connections
Power Cable
WARNING
Do not switch the line voltage selector switch located on the rear panel while
the instrument is on or operating. This may cause internal damage and
Before connecting power to this instrument, the protective ground (Earth)
terminals of this instrument must be connected to the protective conductor of
the line (mains) power cord. The main plug shall only be inserted in a socket outlet
(receptacle) provided with a protective ground (earth) contact. This protective ground (earth)
must not be defeated by the use of an extension cord without a protective conductor
(grounding).
The instrument is shipped with a three-wire power cable. When the cable is connected to an
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appropriate AC power source, the cable will connect the chassis to earth ground. The type of
power cable shipped with each instrument depends on the country of destination.
Return Connection
CAUTION
The output power supplies of this instrument are referenced directly to earth
ground. Any conductor that completes a path between the high voltage and
earth ground will form a completed circuit.
When the instrument Return is grounded, any internal and external stray leakage will be
monitored due to currents that flow from High Voltage to earth ground (such as from HV to
the chassis of the instrument). This current is inherent and will cause errors when trying to
monitor very low leakage currents in the microamp range.
2.2.3 Environmental Conditions
Operation Environment
This instrument may be operated in environments with the following limits:
Temperature…………. 0° - 40° C
Relative humidity ……20 - 80%
Altitude ………………6,560 feet (2,000 meters)
Storage and Shipping Environment
This instrument may be stored or shipped in environments with the following limits:
DC, 15Hz < f < 100kHz : (± 2% of reading + 3 counts) + (2% of
reading + 0.2% of range)
100kHz < f < 1MHz : (± 5% of reading (> 10.0uA)) + (2% of reading
+ 0.5% of range)
DC, 15Hz < f < 100kHz: (± 5% of reading (> 10.0uA)) + (2% of
reading + 0.2% of range)
*2
15Hz < f <30Hz : (± 3% of reading + 5 counts) + (2% of reading +
0.2% of range)
30Hz < f <100kHz : (± 2% of reading + 3 counts) + (2% of reading +
0.2% of range)
100kHz < f < 1MHz : (± 5% of reading (> 10.0uA)) + (2% of reading
+ 0.5% of range)
15Hz < f <100kHz : (± 5% of reading (> 10.0uA)) + (2% of reading +
0.2% of range)
*3
DC : (± 2% of reading + 3 counts (> 10.0uA)) + (2% of reading +
reading + 0.2% of range)
100kHz < f < 1MHz : (± 5% of reading (> 10.0mV)) + (2% of
reading + 0.5% of range)
DC, 15Hz < f < 100kHz : (±5% of reading (> 10mV)) + (2% of
reading + 0.2% of range)
15Hz < f <30Hz : (± 3% of reading + 5 counts) + (2% of reading +
0.2% of range)
30Hz < f < 100kHz : (± 2% of reading + 3 counts) + (2% of reading +
0.2% of range)
100kHz < f < 1MHz : (± 5% of reading (> 10.0mV)) + (2% of
reading + 0.5% of range)
15Hz < f <100kHz : (± 5% of reading (> 10mV)) + (2% of reading +
0.2% of range)
DC : (± 2% of reading + 3 counts (> 10.0mV)) + (2% of reading +
0.5 - 999.9s for AC + DC; 1.8 - 999.9s for AC / DC only Auto range; 1.3 - 999.9s for
AC / DC only Fixed range
0, 0.5 - 999.9s for AC + DC, (0 = continuous); 0, 0.1 - 999.9s for AC / DC only, (0 =
continuous)
Input : Test, Reset, Interlock, Recall File 1 through10
Output : Pass, Fail, Test - in - Process, Start - Out, Reset - Out
AUTO Reverse ON / OFF parameter setting selection
Automatic Reverse polarity switch for normal condition in one step setting menu
Only display maximum leakage current value
At rear panel BNC type to connet scope for some IEC standards test requirement and
application
Alarm Volume Setting Range : 0 - 9; 0 = OFF, 1 is softest volume, 9 is loudest volume
Security Lockout capability to avoid unauthorized access to test set - up programs
Calibration
Results Display All test result information will be displayed on the screen
Interface USB & RS232 standard / GPIB option
Safety Product with TUV / GS certificate
Dimension (W x H x D), mm 430 x 133 x 300
Weight 12Kg
OPTION
RUN Test Function (Opt.752)
W Range : 0 - 1KW / 1 - 10KW, Resolution : 0.1W / 1W
A Range : 0.000 - 3.500A / 3.00 - 40.00A, Resolution : 0.001A/ 0.01A
PF 0.000 -1.000
Leakage
Current
AC Current
High / Low
Limit Setting
AC Current
Display
Range : 0.00 - 10.00mA, Resolution : 0.01mA
Range 0 - 40A
Resolution 0.01A / step
Range 0.000 - 3.500A / 3.00 - 40.00A
Resolution 0.001A / 0.01A
Accuracy ± (2% of reading + 5 counts) / ± (2% of reading + 2 counts)
Software and adjustments are made through front panel. Automatic Calibration alert
function to signal operator when calibration is due
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AC Power
High / Low
Limit Setting
AC Power
Display
Power Factor
High / Low
Limit Setting
Power Factor
Display
Leakage
Current
High/Low
Limit Setting
Leakage
Current
Display
Delay Timer
Setting
Dwell Timer
Setting
Timer display
Range 0 - 10KW
Resolution 1W
Range 0.0 - 1000.0W / 1000 - 10000W
Resolution 0.1W / 1W
Accuracy ± (5% of reading + 9 counts)
Range 0.000 - 1.000
Resolution 0.001
Range 0.000 - 1.000
Resolution 0.001
Accuracy ± (8% of reading + 2 counts), V > 60VAC & PF > 0.2
Range 0.00 - 10.00mA
Resolution 0.01mA
Range 0.00 - 10.00mA
Resolution 0.01mA
Accuracy ± (2% of reading + 2 counts)
Range 0.5 - 999.9s
Resolution 0.1s
Range 0, 0.1 - 999.9s (0 = Continuous)
Resolution 0.1s
Range 0.0 - 999.9s
Resolution 0.1s
Accuracy ± (0.1% of reading + 0.05s)
Power Control
Opt.752 option products
6800 Series Digital AC Power Source (6805, 6810, 6820, 6830, 6840 )
6700 Series Programmable AC Power Source (6705, 6710, 6720, 6730, 6740 )
6400 Series AC Power Source (6403, 6405, 6410)
1931 Series Transformer Box Multi - Tape of 1.0, 1.06 & 1.1 times of input voltage (500VA / 1KVA / 1.8KVA /
3.6KVA)
1931S Series Transformer Box Multi - Tape of 0.8, 0.85, 0.9, 1.0, 1.06 & 1.1 times of input voltage (500VA / 1KVA /
1.8KVA / 3.6KVA)
Opt. 753 HV & GB Link Module
Max. ACW 3500VAC, DCW 3500VDC & Max. Ground Bond 40A
Opt. 754 High Measurement Range 35mArms / 75mApeak
MD1
MD2
MD3 IEC 60601 - 1
MD5 UL544NP, UL484 , UL923, UL471, UL867, UL697
If the opt.754 function is enabled, the MD module MD4, MD6 & MD7 will be disabled.
It is applied to control Transformer Box (1931 / 1931S) or AC Power Source(6700 / 6800 / 6400
*1. If the final measured signal is >range 5 then the maximum composite signal that can be measure is 28 volts
peak. If the final measured signal is ≤ range 5 then the maximum composite signal that can be measure is 12
volts peak.
*2. AC cutoff frequency for High Pass Filter is 15Hz on AC only mode
*3. AC cutoff frequency for Low Pass Filter is 15Hz on DC only mode
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3.2 Front Panel Controls
11
1
8 9 10
2 3 4 5
7
6
1. POWER SWITCH
Rocker style power switch with international ON ( | ) and OFF (0) markings.
2. GRAPHIC LCD
320 X 240 Monographic LCD.
3. EXIT KEY
Key used to escape from parameter editing and returning to prior screens.
4. CURSOR KEY
Keys used to scroll the highlighted area or cursor, up and down, left and right. When more
than 5 steps are programmed in a test file, the left and right arrow keys will page through the
screens of steps. The screens where the paging function is available are as follows: Setup
Tests, Perform Tests, Results Summary, and Results
5. ENTER KEY
Key used to finalize parameter entries. The ENTER key may also be used to scroll the
highlighted area to different parameters in the parameter-setting screens.
6. ․KEY
Key used to key-in decimals.
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Front Panel Controls (Continuing)
11
1
2 3 4 5
8 9 10
7
6
7. Å KEY
Key used to delete key-in data or recover data.
8. NUMERIC DATA ENTRY
Keys used to enter numeric data.
9. SOFT KEYS
Multifunction parameter selection keys. Keys used to select screens and change parameters.
10. TEST BUTTON
Momentary contact switch used to start tests. Press the green button to activate the test that
is set up in the test buffer shown on the display.
11. RESET BUTTON
Momentary contact switch used to reset the instrument. If a failure condition occurs during a
test, you will need to reset the system to shut off the alarm and signal the system that you are
aware of a failure condition. The reset button must be pressed before you can proceed to the
next test or change any of the set-up parameters. This switch also serves as an abort signal to
stop any test in progress controlled by the 7630.
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3.3 Rear Panel Controls
17
1 2 3
16
4
5
1514
13
6
12
7 8 9
11
10
1. DUT POWER INPUT CONNECTOR
This connector provides the Line and Neutral input power connections on pin 1 and 2
respectively. An external single phase unbalanced AC power supply with a single Hot or Line
conductor should be connected here, to supply power to the DUT while performing the
leakage test. This input is rated for 0-277 volts 50/60 Hz.
2. L TERMINAL
This output terminal is where the LINE power connection from the adapter box is plugged into
the run test or Touch Current test. Line power is supplied to the DUT during the run test or
Touch Current test through this terminal and High Voltage is supplied to the DUT through this
terminal during the Dielectric Withstand or Insulation Resistance. This terminal and the “N”
Terminal are shorted together when Dielectric Withstand or Insulation Resistance are being
performed.
3. N TERMINAL
This output terminal is where the NEUTRAL power connection from the adapter box is
plugged into the run test or Touch Current test. Line power is supplied to the DUT during the
run test or Touch Current test through this terminal and High Voltage is supplied to the DUT
through this terminal during the Dielectric Withstand or Insulation Resistance. This terminal
and the “L” Terminal are shorted together when Dielectric Withstand or Insulation Resistance
are being performed.
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Rear Panel Controls (Continuing)
17
16
1514
13
12
1 2 3
4
5
7 8 9
6
4. GND TERMINAL
This terminal is where the Ground or Earth terminal from the adapter box is connected.
11
10
5. PROBE HI / PROBE LO
Probe HI terminal is an input to one side of the MD(measuring device) and will be enabled
during a Touch Current test when ever Probe-HI has been selected at setup. This terminal is
provided for performing Enclosure leakage or Applied Part leakage tests. When run tests and
Touch Current tests are not being performed, this terminal is isolated from the run test and
Touch Current test circuits.
Probe LO terminal is an input to one side of the MD(measuring device) and will be enabled
during a Touch Current test when ever Probe-LO has been selected at setup. This terminal is
provided for performing Applied Part leakage tests and is always used in conjunction with
the Probe-HI terminal. When run tests and Touch Current tests are not being performed, this
terminal is isolated from the run test and Touch Current test circuits.
6. CHASSIS GROUND (EARTH) TERMINAL
This terminal should be connected to a good earth ground before operation.
7. FUSE RECEPTACLE
To change the fuse, unplug the power (mains) cord and turn the fuse receptacle
counter-clockwise. The fuse compartment will be exposed. Please replace the fuse with
one of the proper rating.
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Rear Panel Controls (Continuing)
17
1 2 3
16
4
5
1514
13
6
12
7 8 9
11
10
8. INTERFACE
Standard connector for interconnection to the RS-232 Bus interface. Optional IEEE 488
interface or Opt.751 Multi-function Interface Card may be substituted for the RS-232.
Multi-function interface card including USB port A type, combination of RS-232,
RS-485 port, and Bar Code Input with internal memory capability.
9. INPUT POWER RECEPTACLE
Standard IEC 320 connector for connection to a standard NEMA style line power (mains)
cord.
10. INPUT POWER SWITCH
Line voltage selection is set by the position of the switch. In the up position it is set for 115
volt operation, in the down position it is set for 230 volt operation.
11. REMOTE SIGNAL INPUT
9-Pin D subminiature male connector for remote control of test, reset, and interlock functions,
as well as remote program file selection.
12. REMOTE SIGNAL OUTPUT
9-Pin D sub-miniature female connector for monitoring PASS, FAIL, and PROCESSING
output relay signals.
13. CALIBRATION BUTTON
To put the instrument into the calibration mode, push this button and turn on the power switch
simultaneously.
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Rear Panel Controls (Continuing)
17
16
1514
13
12
11
1 2 3
4
5
7 8 9
6
14. POWER CONTROL BUS (OPTION)
This is only for OPT.752 RUN Test Function. The power source must be connected to this
Connector, then it can supply power to DUT by 7128.
15. SCANNER OUTPUT
This is an I/O signal control bus. There are 7 signals are provided by seven normally open
internal relays. They can to used to control the HI/LO signals of Probe HI and Probe LO of
DUT by Scanner.
16. MD OUTPUT SIGNAL TERMINAL
With external voltage meter or oscillograph it is convenient for verifying the circuit of MD.
Optional OPT.754 High Measurement Range 35mArms / 70mApeak & 4MDS may be
substituted for built-in 7 kinds of common measuring devices。
NOTE:Must connect with isolated oscilloscope to BNC connect to take waveform
10
17. EXTERNAL MEASURING DEVICE
This compartment contains an external Measuring Device PCB. This device will enable
during a Touch Current test when the “External” is selected from the Meas. Device soft key.
The external measuring device allows the operator to test to a standard that calls for a custom
measuring device or easily change the measuring device if the standard requirements change.
The instrument is provided with a 1k ohm resistor on the measuring device PCB. The PCB
can easily be reconfigured for a simple resistive component or a complex two-pole measuring
device.
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3.4 OPT.753 HV & GB Link Module
1. PROBE HI / PROBE LO
Probe HI terminal is an input to one side of the MD(measuring device) and will be enabled
during a Touch Current test when ever Probe-HI has been selected at setup. This terminal is
provided for performing Enclosure leakage or Applied Part leakage tests. When run tests and
Touch Current tests are not being performed, this terminal is isolated from the run test and
Touch Current test circuits.
Probe LO terminal is an input to one side of the MD(measuring device) and will be enabled
during a Touch Current test when ever Probe-LO has been selected at setup. This terminal is
provided for performing Applied Part leakage tests and is always used in conjunction with
the Probe-HI terminal. When run tests and Touch Current tests are not being performed, this
terminal is isolated from the run test and Touch Current test circuits.
2. GND TERMINAL
This terminal is where the Ground or Earth terminal from the adapter box is connected.
1 2 3
4
5
6
3. CASE TERMINAL
This terminal is connected to the DUT case or dead metal and provides the return for the
Ground Bond, Dielectric Withstand, and Insulation Resistance tests. During a Run test or
Touch Current test, this terminal is isolated from the test circuits.
4. CURRENT OUTPUT JACK
Connector used to attach the high current output lead, adapter box high current lead or test
fixture high current lead to the instrument. This connection provides the output current for
the ground bond and continuity.
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OPT.753 HV & GB Link Module (continuing)
1 2 3
4
5
6
5. RETURN OUTPUT JACK
Connector used to attach the Return test lead, or test fixture return lead to the instrument.
This connection provides the return current path for the high voltage, ground bond and
continuity current.
6. HIGH VOLTAGE OUTPUT JACK
Connector used to attach the High Voltage test lead, adapter box high voltage lead, or test
fixture high voltage lead to the instrument. The connector is recessed for safety when not
being used.
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4. Description of Setting
Turn on the POWER switch located on the lower left-hand side of the front panel. The
initialization screen will appear as follows:
If any of the parameters at the Power-On Screens have been altered from their original settings,
the sequence of initialization screens may not follow suite with what was described in the
previous paragraph. Please refer to the section 4.1 Setup System Menu for a description of
the Power-On Screen parameters.
After pressing any key, the Main Menus screen will be displayed. The Main Menu screen
will appear as follows:
At the Main Menu screen, press the “Perform Tests” soft key. The Perform Tests screen will
now be displayed. The Perform Test screen will appear as follows:
The 7630 comes pre-loaded with one default test file , and the left side of the display shows
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the pre-loaded program step and the parameters stored with in it. If this test is unacceptable
for your DUT then refer to the section 4.5 Setting Up a Test, for instructions on how to
program tests into the instrument.
If these test file parameters are acceptable then connect an appropriate set of test leads to the
device under test (DUT) or test fixture. Make sure the safety ground of this instrument is
connected to a known good ground.
Refer to section 4.1.3 Hardware, Smart GFI, for an explanation of DUT grounding
configurations.
DO NOT TOUCH THE DEVICE UNDER TEST ONCE THE TEST HAS BEEN
WARNING
STARTED.
Remote Interlock
7630 is equipped with a featured referred to as “Remote Interlock”. Remote Interlock is a
feature that utilizes a set of closed contacts to enable the instruments output. In other words,
if the Interlock contacts open, the output of the instrument will be disabled. Remote
Interlock could also be referred to as a remote system lockout, utilizing “Fail When Open”
logic. If the Interlock contacts are open and the Test button is pushed, a pop-up message will
be displayed on the screen for two seconds. The message will appear as follows:
If the Interlock contacts are opened during a test, the pop-up message will be displayed and
the test will abort. The hardware and has been configured to provide the interlock
connections on pins 4 and 5 of the Remote Interface, Signal Input port. The instrument can
still be used without the external interlock device as long as the Interlock Connector (1505
provided with unit) is plugged into the Remote Interface, Signal Input port. If there is
nothing connected to the Remote Interface, Signal Input port to provide a connection to the
interlock, the instrument will not perform tests.
Please check your connections to be sure they are making good contact. Clear the area of
any debris that may create a hazardous situation and ask any unnecessary personnel to leave
the area. To initiate the test, press the GREEN test button on the front panel. This is a
momentary button and does not need to be held in the pressed position during the test. The
instrument will then initiate the test presently loaded from the selected default file.
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4.1Setup System Menu
From the Main Menu screen, press the “Setup System” soft key, the Setup System Menu will
now be displayed.
From the Setup System screen, six different Hardware and Software controls may be accessed;
Time and Date, Calibration Alert, Hardware, Security, and Power On Screens. Pressing the
EXIT key at any time will return you to the Main Menu. The Setup System screen will
appear as follows:
4.1.1 Time and Date
From the System Setup screen, press the “Time and Date” soft key. The Time and Date
setting screen will now be displayed. From the Time and Date setting screen, five different
parameters may be accessed, Set Date, Set Time, Set Day, Date Format and Time Format.
The Time and Date Setting screen will appear as follows:
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4.1.1.1 Set Date
From the Time and Date setting screen, highlight the Set Date parameter by using the up and
down arrow keys. The up and down arrow keys will toggle the highlighted area of the screen
between the Set Date and Set Time.
Within the Set Date parameter are three separate fields, month, day, and year. Using the left
and right arrow keys select the field within the date, you want to edit. Using the numeric
keypad enter the new number. Once you begin typing a new number, the parameter will
blank and the cursor will begin blinking. This indicates that the parameter is being edited.
Once a parameter is edited, it is necessary to complete the edit either by pressing the ENTER
key to accept the new number or the EXIT key to escape from the edit and return to the
original number.
4.1.1.2 Set Time
From the Time and Date setting screen, highlight the Set Time parameter by using the up or
down arrow keys. The up and down arrow keys will toggle the highlighted area of the screen
between the Set Date and Set Time.
Within the Set Time parameter are three separate fields, hours, minutes, and seconds. The
time must be set using 24-hour Military time. Using the left and right arrow keys to select
the field within the time parameter you want to edit. Using the numeric keypad enter the new
number. Once you begin typing a new number, the parameter will blank and the cursor will
begin blinking. This indicates that the parameter is being edited. Once a parameter is
edited, it is necessary to complete the edit either by pressing the ENTER key to accept the new
number or the EXIT key to escape from the edit and return to the original number.
4.1.1.3 Set Day
From the Time and Date setting Screen, press the “Set Day” soft key. As the soft key is
pressed, the day format will toggle from Sunday to Saturday.
4.1.1.4 Date Format
From the Time and Date setting Screen, press the “Date Format” soft key. As the soft key is
pressed, the displayed date will toggle between two different date formats, yyyy/mm/dd or
mm/dd/yyyy.
4.1.1.5 Time Format
From the Time and Date setting Screen, press the “Time Format” soft key. As the soft key is
pressed, the time format will toggle between 12 hour and 24 hour modes. Although the time
format may be set to either 12 or 24-hour modes, the time must still be set using 24-hour
Military time.
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4.1.2 Calibration Alert
Calibration Alert is a feature that will allow the instrument to give an advanced alert that the
calibration for the instrument is coming due. From the System Setup screen, press the
“Calibration Alert” soft key. The Cal. Alert setting screen will now be displayed.
From the Cal. Alert setting screen, three different parameters may be accessed1, Cal Due,
Alert Date, Cal. Alert. The Cal. Alert setting screen also displays the date of the last
performed calibration. The Cal. Alert setting screen will appear as follows:
4.1.2.1 Calibration Due Date
It is recommended that calibration should be performed at least once a year. It is
recommended that the Calibration Due date not bet set greater than one year from the Cal.
Date displayed.
From the Cal. Alert setting screen, highlight the Cal. Due parameter by using the up or down
arrow keys. The up and down arrow keys will toggle the highlighted area of the screen
between the Cal Due and Alert Date.
Using the left and right arrow keys and the numeric keypad enter the Calibration Due date.
Press the ENTER key to finish.
4.1.2.2 Alert Date
The Alert date is like an alarm clock that will warn you in advance of the actual calibration
due date. After a calibration is performed, the Alert Date is automatically set 11 months after
the calibration date. For example, if the calibration is performed on 12/15/2001 the Alert
Date will automatically be set to 11/15/2002. Although this date is automatically written into
the Alert Date location, it may be manually overwritten to any advanced date desired.
At the Cal. Alert setting screen, highlight the Alert Date parameter by using the up or down
arrow keys. The up and down arrow keys will toggle the highlighted area of the screen
between the Cal Due and Alert Date.
Within the Alert Date parameter are three separate fields, month, day, and year. Using the
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left and right arrow keys select the field within the date, you want to edit. Using the numeric
keypad enter the new number. Once you begin typing a new number, the parameter will
blank and the cursor will begin blinking. This indicates that the parameter is being edited.
Once a parameter is edited, it is necessary to complete the edit either by pressing the ENTER
key to accept the new number or the EXIT key to escape from the edit and return to the
original number.
The Calibration Alert Warning screen appears as follows:
At the Calibration Alert Warning screen there are three options, “Show this screen again?”,
Password and OK. “Show this screen again?” is asking if you would like to continue seeing
the Calibration Alert Warning screen every time you power up the instrument. You may turn
this screen “OFF” by toggling to the word “No” using the soft key next to this parameter. If
the instrument is password protected you will need to enter the password in order to turn off
the “Show this screen again” parameter. Selecting the “Show this screen again” parameter
“OFF” will disable the Calibration Alert function. Pressing the OK soft key will exit the
Calibration Alert Warning screen and go to the standard introduction screen.
4.1.2.3 Calibration Alert On/Off
From the Cal. Alert setting screen, you may turn the Calibration Alert function ON and OFF
by pressing the “Cal. Alert” soft key. If the “Show this screen again?” function has been
turned “OFF” at the Calibration Alert Warning screen, this parameter will automatically be set
to “OFF”. Turning this parameter “ON” will activate the Cal Alert function and when the
date matches the Alert Date, the instrument will display the Calibration Alert warning screen
upon power up.
4.1.3 Hardware
From the System Setup screen, press the “Hardware” soft key. The Hardware setting screen
will now be displayed. From the Hardware setting screen, five different parameters may be
accessed: Alarm Volume, LCD Contrast, GPIB Address (Option GPIB Function) , and PLC
Remote. The Hardware setting screen will appear as follows:
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4.1.3.1 Alarm Volume
From the Hardware setting screen, highlight the Alarm Volume parameter by using the up or
down arrow keys. The up and down arrow keys will toggle the highlighted area of the screen
between the Alarm Volume, LCD Contrast, PLC Remote and GPIB Address.
Use the numeric keypad to set the Volume of the alarm in the instrument. Enter a number
between 0 and 9, 0 being the volume is off and 9 being the loudest setting. After the number
is entered, a momentary alarm chirp will occur to indicate the volume of the new setting.
4.1.3.2 LCD Contrast
From the Hardware setting screen, highlight the LCD Contrast parameter by using the up or
down arrow keys. The up and down arrow keys will toggle the highlighted area of the screen
between the Alarm Volume, LCD Contrast, PLC Remote and GPIB Address.
Using the up and down arrow keys and the numeric keypad set the Contrast of the display.
Enter a number between 0 and 9, 0 being the lightest color of displayed characters and 9 being
the darkest color of displayed characters. After the number is entered, the display will
automatically adjust to the new display setting.
4.1.3.3 GPIB Address (Option)
From the Hardware setting screen, highlight the GPIB Address parameter by using the up or
down arrow keys. The up and down arrow keys will toggle the highlighted area of the screen
between the Alarm Volume, LCD Contrast, PLC Remote and GPIB Address.
Use the numeric keypad to select the GPIB Address number between 0 and 30. Finish by
pressing the ENTER key.
4.1.3.4 PLC Remote
From the Hardware setting screen, you may turn the PLC remote ON and OFF by pressing the
“PLC Remote” soft key. Refer to the section 6. Connection of Remote I/O for details.
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If you attempt to start a test from the front panel Test button and the PLC remote function is
turned “ON”, a pop-up message will be displayed. The pop-up message will appear as
PLC remote
Control is ON
Front panel TEST button i s
disabled
follows:
4.1.4 Security
From the System Setup screen, press the “Security” soft key. One of two possible Security
screens will be displayed. The Security screens appear as follows:
.
or
Initially, the instrument will not have a password enabled and the Security setting screen will
appear (screen on the left, refer to the above illustrations). You may create a password from
this screen so that all security functions will require a password to access. From the Security
settings screen, three different parameters may be accessed, Create Password, Security and
File Recall.
If a password has already been created then the Security password screen (screen on the right)
will appear and typing in the correct password will be required to access the Security setting
screen. From the password protected Security settings screen, three different parameters may
be accessed, Change Password, Security and File Recall. The Security setting screen that
will appear after a password has been created and entered correctly, will appear as follows:
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4.1.4.1 Create Password
From the initial Security setting screen, you may create a password by pressing the “Create
Password” soft key. Press the “Create Password” soft key, the Password setting screen will
now be displayed. The Password setting screen will appear as follows:
You may now type in the new password using the numeric keypad, press the Enter key to
accept the new password or press the exit key to escape. After you type in your new
password, you will be required to confirm your new password by typing it again into the
“Confirm Password” field. Press the Enter key to confirm the new password or press the
EXIT key to escape.
Change Password
From the Security setting screen, you may change the security password by pressing the
“Change Password” soft key. Once you press the “Change Password” soft key the Password
setting screen will appear.
4.1.4.2 Security
From the Security setting screen, you may turn the Security function ON and OFF by pressing
the “Security” soft key. Selecting security “ON” restricts access to parameter settings. The
level of security is determined by the File Recall function.
Whenever security is selected “ON”, Single Step and Fail Stop soft keys will be disabled at the
Perform Test screen.
Whenever security is enabled, you may only start at Test file at Test step 1.
4.1.4.3 File Recall
File Recall is a sub-function of the security setting. In order for the File Recall function to
work, the Security must first be turned “ON”. From the Security setting screen, you may
turn the File Recall function ON and OFF by pressing the “File Recall” soft key. Selecting
the File Recall “ON” will allow the user to access all available test files but still restricts
access to file editing capability. Selecting the file recall “OFF” will allow the user to only
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run the currently loaded test file.
Disabling the password
To disable the password simply change the password to “0”. After the password is reset to
“0” all security functions may be access without the use of a password.
Forgotten Password
If you have forgotten your password you may access all security functions by typing in the
number “8000” into the password field. The old password can not be recovered. A new
password should be entered or enter “0” to disable the password.
4.1.5 Power-On Screen
The Power-On screen allows you to select the screen(s) that will be displayed when the
instrument is first powered up. From the System Setup screen, press the “Power-On
Screens” soft key. The Power-On screen will now be displayed. The Power-On screen will
appear as follows:
From the Power-On screen, two different parameters may be accessed, 7630 Info and Main
Menu.
4.1.5.1 7630 Info
The 7630 Information screen is the very first screen to appear when the instrument is powered
up. You have the option to PAUSE the instrument at this screen after power up or
CONTINUE through to the next screen after the Information screen is displayed for four
seconds. The option to PAUSE or CONTINUE may be selected by pressing the 7630 Info
soft key. When PAUSE is selected the words “Press any key to continue“ will appear at the
bottom of the 7630 Information screen.
4.1.5.2 Main Menu
When the Main Menu parameter is ON, the first display to appear after the 7630 Information
screen is the Main Menu. When the Main Menu parameter is OFF the first display to appear
after the 7630 Information screen is the Perform Test screen.
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Configure 7630 to go Directly to the Perform Test screen
Set 7630 Info to CONTINUE, and set the Main Menu selection to OFF. Now when the
instrument is powered on it will go directly to the Perform Test screen.
GPIB Interface
This option may be substituted for the RS232 interface. This option provides all of the
function control of the RS232 interface with the addition of SRQ functions. All commands
can be found in section 6.2 Bus Remote Interface GPIB/RS-232 of this manual.
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4.2 Setup Tests Menu
From the Main Menu screen, press the soft key “Setup Tests”.
The Setup Tests Menu will now be displayed. From the Setup Tests screen, six different
software controls may be accessed: Add, Edit, Delete, Prompt, File, and Fail Stop. The Setup
Tests screen will appear as follows:
The Setup Tests screen is the central starting point for programming tests into the instrument.
From this screen, test parameters are entered and edited, and the order of the test steps are
arranged and then stored to test files. The 7630 is capable of performing a 30 step sequential
test from a single test file.
The Setup Tests screen is separated into two main sections. The left half of the screen lists
the steps and the parameters contained within each step. The right half of the screen contains
the soft key menu. When more than 5 steps are programmed in a test file, the left and right
arrow keys will page through the screens of steps. Individual steps may be scrolled to using
the up and down arrow keys.
4.2.1 Add
From the Setup Tests screen, press the “Add” soft key. The Setup Tests, Test selection screen
will now be displayed. From the this screen you may select what type of test you wish to add
to a test sequence, Touch Current, Run Test(option). The Test selection screen will appear as
follows:
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For a detailed description of how to set up a test sequence, please refer to section 4.4 Setting
Up a Test.
For a detailed description of the screens and parameters that are associated with Test selection
softkeys on this screen please refer to section 4.4 Test Parameters.
4.2.2 Edit
From the Setup Tests screen, use the up, down arrow keys, and scroll the highlighted area to
the step you wish to edit. Press the “Edit” soft key. The Parameter-setting screen, for the
type of test that is in that location will now be displayed. The parameters for the test may
now be edited.
For a detailed description of the screens and parameters that are associated with the Edit
softkey on this screen please refer to section 4.4 Test Parameters.
4.2.3 Delete
From the Setup Tests screen, use the up, down arrow keys, and scroll the highlighted area to
the step you wish to delete. Pressing the “Delete” soft key will remove the step.
4.2.4 Prompt
The prompt function allows you to insert a short line of text in a step. The prompt will
appear on the screen before the step is initiated and remain on the screen until the TEST button
is pressed. After the TEST button is pressed, the Prompt will clear and the step will initialize.
Use the up, down arrow keys to scroll the highlighted area to the step where you would like to
insert the text prompt and press the “Prompt” soft key. The Prompt screen will now be
displayed. The Prompt screen will appear as follows:
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4.2.5 File
From the Setup Tests screen, press the “File” soft key. The File Setup screen will now be
displayed. From the File Setup screen, five different file-handling controls may be accessed:
New File, Save, Save As, Delete, and Load. The File Setup screen will appear as follows:
4.2.5.1 New File
From the File Setup screen, press the “New File” soft key. The Create File screen will now
be displayed. For a detailed description of creating a new file, refer to the section 4.4 Setting
Up a Test. The Create File screen will appear as follows:
4.2.5.2 Save
To save a file with its current name press the “Save” soft key from the File Setup screen.
4.2.5.3 Save As
To save an edited file without overwriting the original or to give a file a new name, press the
“Save As” soft key from the File Setup screen. The Create File screen will now be displayed.
For a detailed description of creating a new file, refer to the section 4.5 Setting Up a Test.
4.2.5.4 Delete
To delete a file, use the up, down arrow keys and scroll the highlighted area to the file you
wish to delete and press the “Delete” soft key. A warning will appear on the screen asking if
you want to delete the file. Press the ENTER key to complete the deletion or press the EXIT
key to escape.
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4.2.5.5 Load
To load a test file, use the up, down arrow keys and scroll the highlighted area to the file you
wish to load and press the “Load” soft key.
4.2.6 Fail Stop
Fail Stop is a function that will stop a sequence of tests at the step if a failure occurs. If this
function is turned off, the sequence of tests will continue to the end of the sequence regardless
of whether or not a failure has occurred. If the Fail stop is off and a failure occurs during the
test sequence, the RESET button will light and a short alarm will sound but the sequence will
continue to the end. At the end of the test sequence, the RESET button will light and alarm
will sound indicating failure during the sequence. Pressing the RESET button will silence
the alarm and reset the instrument. Turn the Fail Stop function ON and OFF by pressing the
“Fail Stop” soft key. Fail stop is a parameter that is stored within the test file but may also be
turned ON and OFF temporarily from the Perform Tests screen. If security is enabled you
may not turn Fail Stop ON and OFF using the “Fail Stop” soft key. Fail Stop automatically
defaults to the setting stored in the file when security is activated.
Fail Stop with Run and Touch Current tests
EXTECH recommends performing a Hipot test, with the Fail Stop “ON”, prior to
performing a Run Test or Touch Current test. Performing a Hipot test first can detect if a
DUT is shorted line to ground before applying line power to it.
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4.3 Test Parameters
From the Setup Tests screen, press the “Add” soft key. The Setup Test, Tests Selection
screen will now be displayed. From this screen, you may choose what type of test to perform,
Touch Current, or RUN Test. If you have OPT.754, you will also have the Run Test selection.
The Setup Test, Tests Selection screen will appear as follows:
Test Parameter Notes
Once you begin typing a new number, the parameter will blank and the cursor will begin
blinking. This indicates that the parameter is being edited. Once a parameter is edited, it is
necessary to complete the edit either by pressing the ENTER key to accept the new number or
the EXIT key to escape from the edit and return to the original number. The one exception to
this rule is the scanner parameter. The scanner parameter will not blank when being edited.
When the ENTER key is pressed to accept a parameter change the highlighted area of the
display will automatically move to the next parameter.
The lower left corner of the Test parameter-setting screen displays the “Range” of the
parameter that is highlighted. Use this as a guide when setting your parameters. All softkey
functions in the parameter menus toggle between two conditions and no data entry is required
i.e. The frequency softkey toggles between 50Hz and 60Hz.
Pressing the “Default” soft key will set all of the test parameters to the preset default
parameters. Once the default soft key is pressed, it is necessary to complete the edit either by
pressing the ENTER key to accept the parameter overwrite or the EXIT key to escape from the
edit and return to the original values. Refer to section 4.4 for the preset default parameters.
When multiple screens of steps are programmed into a file, you may use the left and right
arrow keys to scroll through pages of screens.
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4.3.1 Description of Test Parameters
Voltage-HI: The maximum voltage allowable at the DUT Power Input Terminal that when
exceeded triggers a failure.
Voltage-LO: The minimum voltage allowable at the DUT Power Input Terminal that when not
exceeded triggers a failure.
Amp-HI: The maximum allowable current-flow through the DUT that when exceeded triggers
a failure.
Amp -LO: The minimum allowable current-flow through the DUT that when not exceeded
triggers a failure.
Dwell Time: A length of time that is allowed for all programmed parameters set to be applied.
Delay Time: A length of time needed to ensure the DUT has reached proper operating
conditions, during which the HI and LO limit detectors are disabled. The over current
judgment is activated at the end of the Delay Time. The instrument will not indicate that an
over current limit has been exceeded until the Delay Time period has expired.
Leakage-HI: The maximum leakage current allowable through the measuring device that
when exceeded triggers a failure.
Leakage-LO: The minimum leakage current allowable through the measuring device that
when not exceeded triggers a failure.
Power-HI: The maximum allowable power consumption by the DUT that when exceeded
triggers a failure.
Power-LO: The minimum allowable power consumption by the DUT that when not exceeded
triggers a failure.
PF-HI: The maximum allowable Power Factor that when exceeded triggers a failure.
PF-HI: The minimum allowable Power Factor that when not exceeded triggers a failure.
HI-Limit: A maximum threshold set point that when exceeded triggers a failure.
Offset: This function allows the instrument to compensate for leakage current during a touch
current test.
Scanner Setup: (This parameter will only be seen on units equipped with a scanner). This
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multiple parameter allows for set up of the scanner channels. The individual scanner channel
parameters may be accessed using the arrow keys and the state of the scanner channel may be
selected using a softkey labeled “Scanner Channel Output Select”. The three different
selectable scanner states are L (scanner channel set to the return point), H (scanner set to the
high voltage point) and O (OFF).
Defaults: Pressing this softkey will default all of the test parameters to the predetermined
default values. Once the default soft key is pressed, it is necessary to complete the edit either
by pressing the ENTER key to accept the parameter overwrite or the EXIT key to escape from
the edit and return to the original values.
4.3.2 Run Test (OPT.752)
From the Setup Tests, Tests Selection screen, press the “Run Test” soft key. The Run Test
parameter-setting screen will now be displayed. The Run test parameter-setting screen will
appear as follows:
From the Run Test parameter-setting screen, the following parameters may be controlled:
Voltage-HI, Voltage-LO, Amp-HI, Amp -LO, Delay Time, Dwell Time, Leakage-HI,
Leakage-LO, Power-HI, Power-LO, PF-HI, PF-LO and Continuous.
An additional parameter exclusive for DUT input power is Power Control.
4.3.2.1 Voltage Setting (Voltage-HI and Voltage-LO)
Please use the up and down arrow keys or the ENTER key and scroll the highlighted area to
the Voltage-HI or Vo ltag e- LO parameter. The display will appear as follows:
Voltage-HI Voltage-LO
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Enter the new voltage via the numeric keypad and then press the ENTER key to accept the
new parameter or press the EXIT key to escape from the edit.
4.3.2.2 Current Setting (Amp-HI and Amp-LO)
Please use the up and down arrow keys or the ENTER key and scroll the highlighted area to
the Amp-HI or Amp-LO parameter. The display will appear as follows:
Amp -HI Amp -LO
Enter the new current via the numeric keypad and then press the ENTER key to accept the
new parameter or press the EXIT key to escape from the edit.
4.3.2.3 Delay Time and Dwell Time setting
Please use the up and down arrow keys or the ENTER key and scroll the highlighted area to
the Delay Time or Dwell Time parameter. The display will appear as follows:
Delay Time Dwell Time
Enter the new time via the numeric keypad and then press the ENTER key to accept the new
parameter or press the EXIT key to escape from the edit.
If the dwell time is set to “0”, the instrument will operate in a continuous mode. It will stop
when the DUT (Device Under Test) goes into failure or the “RESET” button is pressed. The
minimum dwell time setting is 0.1 seconds.
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4.3.2.4 Leakage Setting (Leakage-HI and Leakage-LO)
Please use the up and down arrow keys or the ENTER key and scroll the highlighted area to
the Leakage-HI or Leakage-LO parameter. The display will appear as follows:
Leakage-HI Leakage-LO
Enter the new Leakage current via the numeric keypad and then press the ENTER key to
accept the new parameter or press the EXIT key to escape from the edit.
Line Configuration
Leakage in the Run Test mode refers to the amount of current, which flows from the enclosure
(case) of the DUT, to the neutral side of the line input. The Leakage-HI trip limit is used to
program the maximum allowable earth leakage current of the DUT before failure. The
Leakage-LO trip limit is used to program the minimum allowable earth leakage current of the
DUT before failure. The Leak HI trip limit also controls the earth leakage configuration as
shown in FIG.1.
When the Leakage-HI trip limit is set to 0, S3 is closed which disables the earth leakage test
and connects the neutral of the DUT input to the ground of the DUT.
4.3.2.5 Power Setting (Power-HI and Power-LO)
Please use the up and down arrow keys or the ENTER key and scroll the highlighted area to
the Power-HI or Power -LO parameter. The display will appear as follows:
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Power-HI Power-LO
Enter the new power via the numeric keypad and then press the ENTER key to accept the new
parameter or press the EXIT key to escape from the edit.
4.3.2.6 Power Factor (PF-HI and PF-LO)
Please use the up and down arrow keys or the ENTER key and scroll the highlighted area to
the PF-HI or PF -LO parameter. The display will appear as follows:
PF-HI PF-LO
Enter the new PF via the numeric keypad and then press the ENTER key to accept the new
parameter or press the EXIT key to escape from the edit.
Power Factor = W/VA where W =Watts (Real Power) and VA =Volts x Amps (apparent power).
It is important to note that the closer the power factor is to "1" the more resistive the DUT is.
The closer the power factor is to 0 the more reactive (inductive or capacitive) the DUT is.
4.3.2.7 PLC Control (Option for Opt. 752)
Please use the up and down arrow keys or the ENTER key and scroll the highlighted area to
the PLC Control parameter.
Please press PLC Control softkey to select the power mode. If option AC power source to be
the DUT input power, there are 7 memories M1 to M7 for selected. If option 1931 series, there
are three voltage rate 1.0, 1.06, and 1.1 times for selected. If option 1931S series, there are six
voltage rate 0.8, 0.85, 0.9, 1.0, 1.06, and 1.1 times for selected.
4.3.2.8 Continuous
The softkey can set the output power status for step link. When Continuous is on, and both two
link step are at the same line status, the power will continue output during two steps link. If
Continuous is on but two link step are not at the same line status, the power will stop output
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first after first step test is finished.
When Continuous is OFF, whenever two link steps are at the same line status or not, it will
stop output first after the step test is finished. Then it will restart to process next step.
4.3.3 Touch Current Test
From the Setup Tests, Tests Selection screen, press the “Touch Current” soft key. The Run
Test parameter-setting screen will now be displayed. The Touch Current parameter-setting
screen will appear as follows:
From the Touch Current parameter-setting screen, the following parameters may be controlled:
Leakage-HI, Leakage-LO, Voltage-HI, Delay Time, Dwell Time, Offset, Neutral, Reverse,
Ground, Meas. Device, Probe, Leakage. More. Pressing the “More” soft key will bring up
additional parameters: Leakage, Extended Meters, AC/DC, Ranging Mode and Continuous.
Pressing the “More” soft key will bring up additional parameters: PLC Control, Default, and
More.
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4.3.3.1 Leakage Setting (Leakage-HI and Leakage-LO)
Please use the up and down arrow keys or the ENTER key and scroll the highlighted area to
the Leakage-HI or Leakage-LO parameter. The display will appear as follows:
Leakage-HI Leakage-LO
Enter the new current via the numeric keypad and then press the ENTER key to accept the
new parameter or press the EXIT key to escape from the edit.
4.3.3.2 Voltage Setting (Voltage-HI and Voltage-LO)
Please use the up and down arrow keys or the ENTER key and scroll the highlighted area to
the Voltage-HI or Vo ltag e- LO parameter. The display will appear as follows:
Voltage-HI Voltage-LO
Enter the new voltage via the numeric keypad and then press the ENTER key to accept the
new parameter or press the EXIT key to escape from the edit.
4.3.3.3 Delay Time and Dwell Time setting
Please use the up and down arrow keys or the ENTER key and scroll the highlighted area to
the Delay Time or Dwell Time parameter. The display will appear as follows:
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Delay Time Dwell Time
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Enter the new time via the numeric keypad and then press the ENTER key to accept the new
parameter or press the EXIT key to escape from the edit.
If the dwell time is set to “0”, the instrument will operate in a continuous mode. It will stop
when the DUT (Device Under Test) goes into failure or the “RESET” button is pressed. The
minimum dwell time setting is 0.5 seconds.
4.3.3.4 Offset setting
Please use the up and down arrow keys or the ENTER key and scroll the highlighted area to
the Offset parameter. The display will appear as follows:
This function allows the instrument to compensate leakage current during a Touch Current test.
Using the up and down arrow keys or the ENTER key, scroll the highlighted area to the Offset
parameter. You may now manually or automatically set an Offset value.
To manually set an Offset value enter a milliohm value via the numeric keypad and then press
the ENTER key to accept the new value or press the EXIT key to escape from the edit.
To automatically set an Offset value, short circuit the ends of the test cables and press the
“TEST” button. The highlighted parameter field will briefly show the word “READING”
and then the display the new value. The new value is automatically updated in the field and
does not allow an escape to the original value or require that the ENTER key be used to accept
the new parameter.
Leakage Current and Offset measuring
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Unless the REVERSE parameter is “ON”, the OFFSET setting always and indicates the value
that S2 is on the A position(OFF). When the REVERSE parameter is “AUTO”, system will
display the offset value of A position and save the value of B position to RAM to further
calculate the leakage of A and B position then indicates the max. one. The calculation of
leakage is:
Leakage Current = READING2 - OFFSET2
The LCD always displays and indicates the max leakage current of test result. For an
example:
If the setting of REVERSE and OFFSET parameters are “AUTO”, the Offset and leakage
value are separately 5.0uA and 145.0uA for B position (ON) and the Offset and leakage value
are separately 8.0uA and 140.0u for A position (OFF) after “TEST” was pressed.
For A position (REVERSE=OFF):Leakage Current = 140.02 - 8.02 =139.8uA
For B position (REVERSE=ON) :Leakage Current = 145.02 - 5.02 =144.9uA
So the LCD will indicates the Leakage Current is 144.9uA and Offset is 8.0uA.
4.3.3.5 Line Configuration (NEUTRAL; REVERSE; GROUND)
Please use the up and down arrow keys or the ENTER key and scroll the highlighted area to
the NEUTRAL, REVERSE, or GROUND parameter. The display will appear as follows:
The LINE configuration is determined by the switches S1, S2 and S3 (refer to Figure 2) and is
set using the corresponding Line Configuration Soft keys. S1 relay is represented as
NEUTRAL and is controlled by the Neutral soft key. S2 relay is represented as REVERSE
and is controlled by the Reverse soft key. S3 relay is represented as GROUND and is
controlled by the Ground soft key.
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Figure 2
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Pressing NEUTRAL or GROUND softkey will toggle it between its two available states ON
and OFF. Pressing REVERSE softkey will toggle it between its three available states ON ,
OFF and AUTO. When REVERSE parameter is set to AUTO, system will measure the
circuits of REVERSE is ON and OFF and display the larger value after TEST key is pressed.
Line Configuration Setting
When the Neutral or Ground switches are set to the CLOSED position they are in a normal
operating condition. When the Neutral or Ground switches are set to the OPEN position they
are in a fault condition that represents a fault in the line input wiring.
When the REVERSE relay is set to ON, the relay is in position B (refer to Figure 2) and the
Line and Neutral conductors are reversed at the DUT power outputs. The power output is
represented as the power receptacle in Figure 2.
The three switches may be configured into eight different combinations of Line conditions.
The different combinations are represented in the table below (refer to Figure 2).
STEP NEUTRAL REVERSE GROUND DUT Line
S1 S2 S3
Configuration
1 CLOSED A (OFF) OPEN State 1
2 CLOSED B (ON) OPEN State 2
3 OPEN A (OFF) OPEN State 3
4 OPEN B (ON) OPEN State 4
5 CLOSED A (OFF) CLOSED State 5
6 CLOSED B (ON) CLOSED State 6
7 OPEN A (OFF) CLOSED State 7
8 OPEN B (ON) CLOSED State 8
9 CLOSED AUTO OPEN State 1 & 2
10 OPEN AUTO OPEN State 3 & 4
11 CLOSED AUTO CLOSED State 5 & 6
12 OPEN AUTO CLOSED State 7 & 8
State 1:S1:CLOSED、 S2:A 、 S3:OPEN
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State 2:CLOSED、 S2:B、S3:OPEN
State 3:S1:OPEN、 S2: A、 S3:OPEN
State 4:S1:OPEN、 S2: B 、S3:OPEN
State 5:S1:CLOSED、S2:A 、S3:CLOSED
State 6:S1:CLOSED、S2:B、S3:CLOSED
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State 7:S1:OPEN、S2:A 、S3:CLOSED
State 8:S1:OPEN、S2:B、S3:CLOSED
4.3.3.6 Meas. Device Setting
Please use the up and down arrow keys or the ENTER key and scroll the highlighted area to
the Meas. Device parameter. The display will appear as follows:
The Measuring Device is an impedance circuit that simulates the human body. The
Measuring device is specified differently for different agencies, applications and specifications.
Repeatedly pressing the Measure Device soft key will allow you to select one of the many
measuring devices listed in the table below. The table below indicates the available
measuring devices and the appropriate agency standard to which it correlates.
IEC60601-1 Medical Equipment.
UL544P Medical Equipment.
Weighted Touch Current,
Luminaries, Information Technology,
Audio & video, Laboratory Equipment,
Safety of household
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MD5 EM0
MD6 EM3
MD7
External EM8
Frequency
Check
EM9
UL544NP、UL484、UL923、UL471、
UL867、UL697
UL1563 Electric Spas,
IEC60950、IEC61010-1 Fig A.2 (2Kohm)
External External
The Touch Current test can be configured to
verify the bandwidth of the leakage current
“voltmeter”, by setting the Probe
configuration, Probe-HI to Probe-LO, and
selecting the medical device “Frequency
Check”.
Medical Equipment.
Equipment Assemblies and
Associated Equipment.
Information Technology.
Laboratory Equipment.
(For Opt. 752)
The selection is intended to be used for
meter verification only and has no
application for normal testing.
Circuit Diagrams
The following diagrams show the equivalent circuit of the measuring devices. Leakage current
readings are generated by measuring the voltage drop across these networks and dividing by
the equivalent DC resistance. The voltmeter is placed across the entire network of the
measuring devices3、4、5、6 and 7. The voltmeter is placed across the points indicated by the
solid black dots on measuring device 1 and 2. The points are specified by the agencies that
require a particular measuring device to meet their specification.
MD7:IEC60950、IEC61010-1 Fig A.2 External MD(Option)
(2Kohm) for RUN Test MD Circuit
A B
AB
R
External Measuring Device
The 7630 has an access panel on the back of the instrument that can be removed to access the
MD external PCB. The MD external PCB may be configured for a simple resistive
measuring device or a two-pole measuring device similar to MD 7. The PCB comes
configured with a 1kΩ measuring device.
Frequency Check
The Touch Current test can be configured to verify the bandwidth of the leakage current
“voltmeter” by setting the Probe configuration, Probe-HI to Probe-LO, and selecting the
medical device “Frequency Check”. The selection is intended for meter verification
purposes only and has no application for normal testing. The calculation of the displayed
leakage current will use 1000 Ω for R in the calculation of V/R=I where I is the leakage
current displayed and V is voltage across the measuring device (MD). When an external
frequency generator is applied to the probe inputs, the current display will be equal to Voltage
generator/1000. The readings can then be correlated to verify the voltmeter bandwidth.
Since the voltage is being applied directly across the MD voltmeter amplifier inputs, it is not
necessary to actually install a 1KΩ resistor to the external MD input. It is necessary to have
the 0Ω resistors installed in position R1 and R3 on the external measuring device PCB to
operate in this mode. If the external measuring device has been populated in a different
configuration, it will be necessary to create a temporary short on R1 and R3 to operate in this
mode. Another option would be to acquire a spare external measuring device PCB for the
meter verification purpose.
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MD Block Diagram
MD7:RUN MD IEC60950、
IEC61010-1 Fig A.2 (2Kohm)
MD2:IEC60990(Fig 5 U1 &
U3) , IEC60598-1
MD1:IEC60990(Fig 4 U1 & U2)、
IEC60598-1、IEC60950-1、
IEC60065、 IEC61010、IEC60335-1
MD6:UL1563
MD5:UL544NP、UL484、UL923、
UL471、UL867、UL697
MD4:UL544P
MD3:IEC60601-1
4.3.3.7 Probe Configuration
Please use the up and down arrow keys or the ENTER key and scroll the highlighted area to
the Probe parameter. The display will appear as follows:
The Probe configuration is controlled by the relays SH, SL and Probe Switch shown in Figure
2 and are set by the Probe soft key. These three relays configure the current measuring
device into four possible positions. Repeatedly pressing the Probe soft key allows the
selection of the four different states. The four positions are described in the table below.
Probe (Measuring Device
Position)
SH SL Probe Switch
Switch Agency Test Application
Ground To Line A A A Earth Leakage Current
Probe-HI To Line B A A Surface to Touch Current
Probe-HI To Probe-LO B B A Surface to Surface Leakage Current
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Ground To Neutral A A B Earth Leakage Current
AUTO A A
Note:1. If REVERSE parameter is ON or AUTO, probe will not have the Ground To Neutral and AUTO
selection items.
2. It belongs to the application of Standard IEC 60335-1 Fig.2 that both the switch SH and SL are on the A
position.
A 、 B
Earth Leakage Current
When the Probe is set to AUTO, the system will measure the leakage current that probe switch
is on A and B position. Whichever is larger, the LCD always displays the larger value.
Leakage Measuring
1. Ground To Line (G-L):SH, SL and Probe Switch are on A position.
2. Ground To Neutral (G-N):SH and SL are on A position,Probe Switch is on B position.
3. Probe-HI To Line (PH-L):SH is on B position, SL and Probe Switch are on A position.
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4. Probe-HI To Probe-LO (PH-PL):SH and SL are on B position,Probe Switch is on A
position.
4.3.3.8 Leakage Setting
Please use the up and down arrow keys or the ENTER key and scroll the highlighted area to
the Leakage parameter. The display will appear as follows:
The Touch Current test can be configured to meter the leakage current in RMS or Peak. The
RMS/Peak configuration is set by the pressing the Leakage softkey while the Leakage-HI or
Leakage-LO parameter is highlighted.
RMS and Peak Definitions
RMS (Root-Mean-Square): For a sine wave, the RMS value is 0.707 times the peak value.
Peak: Peak (pk) is the maximum value, either positive (pk+) or negative (pk-), that the current
waveform attains.
For a sine wave without a DC component, the peak amplitude is equal to approximately 1.414
times the root-mean-square amplitude.
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4.3.3.9 Extended Meters
When Extended Meters is on, it can be switched to display I-maximum or MD Voltage by
press ENTER key during testing. When Extended Meters is off, the switch function is disable.
I-maximum function will measure and display the max. current for each test. MD Voltage
function will measure and display the voltage between two terminal of MD.
4.3.3.10 AC / DC Display Selection (Option)
Pressed AC/DC softkey, user can select the leakage current value to be AC+DC, AC or DC.
4.3.3.11 Ranging Mode Setting
When Ranging Mode is Auto, system will auto select the suitable current range. At the mode,
Dwell time can’t be shorter than Ranging judgment time. If Dwell time is shorter than
Ranging judgment time, the Dwell time will be forced to be changed to same as Ranging
judgment time.
When Ranging Mode is Manual, system will judge the current range depends on Leakage-HI
setting.
4.3.3.12 Continuous Setting
The softkey can set the output power status for step link. When Continuous is on, and both two
link step are at the same line status, the power will continue output during two steps link. If
Continuous is on but two link step are not at the same line status, the power will stop output
first after first step test is finished.
When Continuous is OFF, whenever two link steps are at the same line status or not, it will
stop output first after the step test is finished. Then it will restart to process next step.
PLC Control (Option for Opt. 752)
Please use the up and down arrow keys or the ENTER key and scroll the highlighted area to
the PLC Control parameter. The display will appear as follows:
Please press PLC Control softkey to select the power mode. If option AC power source to be
the DUT input power, there are 7 memories M1 to M7 for selected. If option 1931 series, there
are three voltage rate 1.0, 1.06, and 1.1 times for selected. If option 1931S series, there are six
voltage rate 0.8, 0.85, 0.9, 1.0, 1.06, and 1.1 times for selected.
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External Matrix Scanner
If External Matrix scanner, the 7630 can automatically detect and display its function option in
underclass of the LCD monitor. Please use the Scanner Select key to input setting of the status
of each channel Scanner as H (High) or L (Return), and then press ENTER, it will set value as
the following figure.
Scanner Select
H=High
L=Return
If the Scanner is over 8 channel, it must be add other external scanner, after the state of
Channe1 ~ 8 is setting, the external scanner indicator will show the setting state of each
Channel .
4.5 Setting Up a Test
1. Upon power up, 7630 will initialize with the test file that was last used before power down.
New instruments come loaded with one default file, this is the file that the instrument will
“Boot Up” with until it is changed.
2. From the Setup Tests screen, press the “File” soft key, The File Setup screen will now be
displayed.
3. From the File Setup screen, press the soft key “New File”. The Create File screen will
now be displayed.
4. The Create File screen is separated into three main sections, Alphabet and Symbols, File
Name edit, and soft key menu.
5. From the Create File screen, you must give your new test file a name. The file name can
be a maximum of ten characters in length and may use any combination of the character
set plus numbers. To name your file, use the arrow keys to scroll the highlighted area to
the character (or enter a number from the numeric keypad) you wish to use and then press
the “Select” soft key. At the File Name edit, the letter or symbol will be inserted at the
point where the cursor is flashing. The cursor will then increment to the next position
and wait for an additional character insertion. If you make a mistake or want to change
the character, press the backspace key in the numeric keypad. The cursor will decrement
and erase the character. When you have finished editing the file name press the ENTER
key.
6. From the Setup Tests screen, press the “Add” soft key. The Setup Test, Tests Selection
screen will now be displayed. From this screen you may choose what type of test to
perform, Touch Current, or Run Test.
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7. From the Setup Test, Test Selection screen, press the soft key next to the type of test you
wish to add to the test sequence. The Parameter-setting screen for the type of test you
have chosen will now be displayed.
8. From Parameter-setting screen, you may set your own custom set of parameters for the test
or choose the defaults from the soft key menu. All of the individual parameters for the
test may be accessed using the up and down arrow keys, and the ENTER key. As the
arrow keys are pressed, the highlighted area will scroll to the different parameters. The
ENTER key may also be used to scroll to the different parameters.
9. Scroll to a parameter you wish to edit. The parameter that is highlighted may now be
edited. (Refer to Section 4.3 of this manual for complete parameter entry instructions.)
Enter a new number via the numeric keypad. Once you begin typing a new number, the
parameter will blank and the cursor will begin blinking. This indicates that the parameter
is being edited. Once a parameter is edited, it is necessary to complete the edit either by
pressing the ENTER key to accept the new number or the EXIT key to escape from the
edit and return to the original number.
10. Press the EXIT key to “Add” this test to the sequence of tests. The Setup Tests screen
will now be displayed which will include the parameters for the test you have just added.
11. At this point, you may add more tests to the sequence, insert tests, insert prompts, perform
the test sequence, or store the sequence to the file name you created.
Adding More tests to the Sequence
To add more tests to the sequence simply repeat steps 5-10 of this section.
Performing a Test from the Setup Tests screen
To perform the test you have just created press the ENTER key. The Perform Tests screen
will now be displayed along with a pop-up message that appears as follows:
Pressing the Enter key will store the file with the file name you gave it and go to the Perform
Test screen. You may now perform a test (Refer to section 5.2 Performing Tests).
Pressing the Exit key will return you to the Main Menu and not save the file. Even though
the file has not been saved, the file will be retained in RAM until another file is loaded or
created, or until the instrument is powered down.
Saving the Test File
From the Setup Tests screen, press the “File” soft key. The File Setup screen will now be
displayed.
From the File Setup screen, press the “Save” soft key. The file will save to the name you
created and the Setup Tests screen will now be displayed with the new file loaded.
The instrument is now ready to perform tests with the new file. You may now press the
ENTER key to go to the Perform Tests screen or press the EXIT key to return to the Main
Menu.
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Inserting Tests
From the Setup Tests screen, scroll the highlighted area to the step in the sequence where you
would like to insert a test.
Press the “Add” soft key. The highlighted area will blank and the test that was originally at
this step in the sequence, as well as all of following steps, will increment. Simultaneously,
Setup Test, Tests Selection screen will now be displayed.
You may now select the type of test you wish to insert from the soft key menu.
Inserting a Text Prompt
Refer to section 4.2.4 Prompt for a detailed description of inserting text prompts.
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5. Operating Instructions
5.1 Instrument Connections
The following diagrams (Fig.3 & Fig.4) show how to connect Safety Tester to the 7630 to the
device under test.
Figure 3: 7742, DUT and 1931 Series connect to 7630 with Opt.752 & Opt.753
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Figure 4: 7440, DUT and 1931 Series connect to 7630 with Opt.752 & Opt.753
The PLC Remote setting of 7630 must set to OFF and safety Tester must set to ON.
DUT Input Voltage Connections for OPT.752
WARNING
carry any large voltage potential. The 220 - 240V US style line power IS NOT suitable to
connect to the DUT inputs. This style of power distribution is a balanced type with two HOT
or LINE conductors. Be sure that the hot lead of the power source is connected to pin 1, L
(line) terminal of the DUT input connector and the Reference or low voltage lead is connected
to pin 2, N (neutral) terminal of the DUT input connector. DO NOT connect a line
conductor to the N or Neutral terminal of the DUT inputs. This condition can be very
dangerous to the LINECHEK user.
If voltage is applied to pin 2, N (neutral) terminal of the DUT input and you attempt to execute
a Run Test or Touch Current test, a warning message will appear in the displayed messages
portion of the screen. If you see this message, you will need to correct the voltage problem
before the instrument will allow you to execute Run Tests or Touch Current tests.
The Power Source to the device under test (DUT) inputs must be an
unbalanced single-phase supply. This means that there is only one
HOT or LINE conductor and the other conductor of the power source
must be at a low voltage reference potential. The low voltage
reference does not need to be physically earth grounded but should not
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5.2 Perform Tests
From the Main Menu screen, press the soft key “Perform Tests”.
The Perform Tests Menu will now be displayed. From the Perform Tests screen, four
different software controls may be accessed, Load File, Single Step (ON/OFF), Fail Stop
(ON/OFF), Results. The arrow keys may also be used to scroll the highlighted area to a
specific test or page of tests if the file is larger than 5 steps. The Perform Tests screen will
appear as follows:
The Perform Tests screen is the main operational screen of instrument. From this screen,
individual steps are monitored while the test is being performed. At the end of a sequence of
tests, all of the step results may be recalled via the “Results” soft key on this screen. This
screen may also be used to debug test files with the use of the single step and fail stop
functions.
5.2.1 Load File
From the Perform Tests screen, press the “Load File” soft key. The Load File screen will
now be displayed. The Load File screen will appear as follows:
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Using the up and down arrow keys, scroll the highlighted area to the File you would like to
load and press the “Load” soft key. The file you selected will now load and the screen will
revert to the Perform Tests screen.
5.2.2 Single Step
Single step is a function that allows you to run one step at a time from a sequence of tests. At
the Perform Tests screen, use the up and down arrow keys or the ENTER key to scroll the
highlighted area to the step you wish to perform. Press the TEST button and the instrument
will initiate the single step and stop when finished without continuing to the next step. If you
press Test again without first pressing Reset, the next step will initiate, run to completion and
then stop. If a step fails and you wish to continue to the next step do not press Reset, if you
press Reset it will return you to the original starting step. After running a single step test, a
prompt will appear below the test file name telling you to Press TEST button to continue.
You may single step through an entire sequence in this way as long as you do not press Reset.
Once Reset is pressed it will return you to the originally selected step.
Turn the Single Step function ON and OFF by pressing the “Single Step” soft key. However,
if Security is enabled, single step may not be turned ON and OFF at the Perform Test screen.
Whatever state single step is in at the time security is enabled, is the state at which it shall
remain.
5.2.3 Fail Stop
Fail Stop is a function that will stop a sequence of tests at the step if a failure occurs. If the
fail stop is turned “ON” and a failure occurs (stopping the test), pressing the Test button again
will start the test sequence at the next step. If a step fails and you wish to continue to the
next step do not press Reset, if you press Reset it will return you to the original starting step.
If this function is turned off, the sequence of tests will continue to the end of the sequence
regardless of whether or not a failure has occurred. If the Fail stop is off and a failure occurs
during the test sequence, the RESET button will light and a short alarm will sound but the
sequence will continue to the end. At the end of the test sequence, the RESET button will
light and alarm will sound indicating failure during the sequence. Pressing the RESET
button will silence the alarm and reset the instrument. Turn the Fail Stop function ON and
OFF by pressing the “Fail Stop” soft key. If security is enabled you may not turn Fail Stop
ON and OFF using the “Fail Stop” soft key. Fail Stop automatically defaults to the setting
stored in the file when security is activated.
Fail Stop with Run and Touch Current tests
EXTECH recommends performing a Hipot test, with the Fail Stop “ON”, prior to performing
a Run Test or Touch Current test. Performing a Hipot test first can detect if a DUT is shorted
line to ground before applying line power to it.
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5.2.4 Results
At the end of a test sequence or single step test, you may review the measurements of each test
by pressing the “Results” soft key. Results may be accessed from the end of test Summary
screen or from the Perform Tests screen. The end of test Summary screen appears as follows:
Using the up and down arrow keys, scroll the highlighted area to the step results you wish to
review. The left and right arrow keys may be used to page through results if the test contains
more than five steps. When the highlighted area is on the step you are reviewing, the test
settings will be displayed in the highlighted area and the results will appear on the right in the
form of metering screens. The result screens will appear differently for each type of test.
The results screens are based on the Performing Tests metering screens and are identical in
appearance except for the title.
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5.3 Displayed Messages
Directly above the Metering screens is the Test status display. This portion of the display is
active during the test and allows you to view the type of test being performed and status of the
test step. At the end of a test, the Test status display will either inform you that the test has
passed or give a direct indication of the kind of failure that occurred during the test.
5.3.1 Test Status Messages
Dwell
This message appears on the display while a test is in process, the values update in real time.
Delay
This message appears on the display while a test is in process, the values update in real time.
Pass
This message appears on the display when the test process is complete and the DUT passed
the test.
Abort
This message appears on the display if the test in process is aborted with the RESET button or
remote Reset control.
Short
This message appears on the display if the DUT current is well beyond the metering range of
the test.
Output-Error
This message appears on the display, if the instruments output reading does not match the
setting. This message will only be seen if the Exit key is press at the Output Error screen.
If the instrument has an output problem when the TEST button is pressed, the Output Error
screen will appear .
The RESET button is not active in this situation. Only the Exit soft key will allow you to
return to the Perform Test screen.
OTP-Fail
This message appears on the display if the Power Amplifier has overheated. This is abnormal
condition; please call to the factory for assistance.
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Vol t -H I
This message appears on the display if the DUT/IP voltage exceeds the Volt-HI Trip setting.
Volt -LO
This message appears on the display if the DUT/IP voltage drops below the Volt-LO Trip
setting.
Amp-HI
This message appears on the display if the current exceeds the Amp-HI Trip setting
Amp-LO
This message appears on the display if the current drops below the Amp-LO Trip setting.
Line-OC
This message appears on the display if the 20 Amp < 1 s, short circuit protection is tripped.
Power-HI
This message appears on the display if the DUT input wattage exceeds the Power-HI Trip
setting.
Power-LO
This message appears on the display if the DUT input wattage drops below the Power-LO Trip
setting.
PF-HI
This message appears on the display if the Power Factor exceeds the PF-HI Trip setting.
PF-LO
This message appears on the display if the Power Factor drops below the PF-LO Trip setting.
Leak-HI
This message appears on the display if the enclosure to neutral leakage current exceeds the
Leak-HI Trip setting.
Leak-LO
This message appears on the display if the enclosure to neutral leakage current drops below
the Leak-LO Trip setting.
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Neutral-V
This message appears on the display if there is voltage present on the Neutral of the DUT
input receptacle.
Leak-OC
This message appears on the display if the voltage of MD circuit exceeds the rating voltage.
5.3.2 Fatal Error
All of the buttons and keys are not active in this situation. This type of failure permanently
locks the instrument in the “Fatal Error” mode and requires that the instrument be serviced by
EXTECH . The customer should contact EXTECH Electronics Co., Ltd. to receive further
instruction.
The following Fatal Error identification numbers will represent type of the failure that has
occurred:
Error Code 9001 will appear on the display, if the instrument has a recognizable internal
component failure.
Error Code 9002 will appear on the display, if the instrument’s System data or the
Model/Option/Serial Number data are corrupted and do not match the settings.
Error Code 9003 will appear on the display, if the instrument’s Calibration data is corrupted.
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6. Interface
6.1 Connection of Remote I/O
Two 9-pin “D” type connectors are mounted on the rear panel that provide
REMOTE-INPUT-OUTPUT control and information. These connectors mate with standard
9 pin D-sub-miniature connector provided by the user. The output mates to a male (plug)
connector while the input mates to a female (receptacle) connector. For best performance, a
shielded cable should be used. To avoid ground loops the shield should not be grounded at
both ends of the cable. Suggested AMP part numbers for interconnecting to the Remote I/O
are shown below:
6.1.2 Signal Outputs on Remote I/O
The rear panel connector provides three output signals to remotely monitor PASS, FAIL, and
PROCESSING conditions. The monitoring signals are provided by three normally open
internal relays, that switch on to indicate the current condition of the tester. These are
normally open free contacts and will not provide any voltage or current. The ratings of the
contacts are 1A / 125 VAC ( 0.5 ADC ). The signal outputs are provided on the 9-pin female
D connector. Below is a listing that indicates what conditions activate each pin. When a
terminal becomes active the relay closes thereby allowing the external voltage to operate an
external device.
Pins 1 and 2 provide the PASS signal.
Pins 3 and 4 provide the FAIL signal.
Pins 5 and 6 provide the PROCESSING signal.
Pins 7 and 8 provide the RESET OUT signal.
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Pins 7 and 9 provide the START OUT signal.
The following describes how the relays operate for each test condition.
PROCESSING - The relay contact closes the connection between pin (5) and pin (6) while
the instrument is performing a test. The connection is opened at the end of
the test.
PASS - The relay contact closes the connection between pin (1) and pin (2) after
detecting that the item under test passed all tests. The connection is
opened when the next test is initiated or the reset function is activated.
FAIL - The relay contact closes the connection between pin (3) and pin (4) after
detecting that the item under test failed. The connection will open when
the next test is initiated or the reset function activated.
RESET OUT- The relay contact closes the connection between pin (8) and pin (7) while
the RESET bottom is pressed.
START OUT- The relay contact closes the connection between pin (9) and pin (7) while
the TEST bottom is pressed.
6.1.2 Signal Inputs of Remote I/O and Programmed Test Files
The 7630 remote connector enables remote operation of the TEST, RESET and REMOTE
INTERLOCK functions, and allows the operator to select one of 10 pre-programmed test files.
When the PLC Remote mode is on, the 7630 will respond to simple switch or relay contacts
closures. A normally open momentary switch can be wired across pins 3 and 5 to allow
remote operation of the TEST function. A normally open momentary switch can be wired
across pins 2 and 5 to allow remote operation of the RESET function. When the PLC remote
function is (ON) the TEST switch on the front panel will be disabled to prevent a test from
being activated through this switch. For safety, the front panel RESET switch remains active
even when a remote reset switch is connected so that high voltage can be shut down from
either location.
The Remote File Select function gives the user the capability to quickly change parameters
and initiate a test remotely. Ten pre-programmed test files can be accessed by connecting
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pins 1,6,8, and 9 to the common pin 7, in different combinations. The Remote File Select Truth Table (binary) shows the different combinations of momentary switch (relay) closures,
and which memory programs that will be selected as the result. It may be necessary to "OR"
the momentary switches (relay contacts) to prevent incorrect program selection due to timing
errors.
REMOTE FILE SELECT TRUTH TABLE
BIT 4 BIT 3 BIT 2 BIT 1 FILE #
1= Momentary Contact closure between BIT and COMMON
0= No Contact closure between BIT and COMMON
WARNING
0 0 0 1
0 0 1 0
0 0 1 1
0 1 0 0
0 1 0 1
0 1 1 0
0 1 1 1
1 0 0 0
1 0 0 1
1 0 1 0
01
02
03
04
05
06
07
08
09
10
Activating file program functions through the remote connector selects the
file and starts the test that is pre-programmed into that file.
CAUTION
Do not connect voltage or current to the signal inputs. Applying voltage to
the signal input could result in damage to the control circuitry.
Remote Interlock
7630 is equipped with a featured referred to as “Remote Interlock”. Remote Interlock is a
feature that utilizes a set of closed contacts to enable the instruments output. In other words,
if the Interlock contacts open, the output of the instrument will be disabled. Remote
Interlock could also be referred to as a remote system lockout, utilizing “Fail When Open”
logic. If the Interlock contacts are open and the Test button is pushed, a pop-up message will
be displayed on the screen for two seconds. The message will appear as follows:
Interlock is
Open
Please check the Remote Interl ock
connection
.
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If the Interlock contacts are opened during a test, the pop-up message will be displayed and
the test will abort. The hardware and has been configured to provide the interlock
connections on pins 4 and 5 of the Remote Interface, Signal Input port. The instrument can
still be used
If the Interlock contacts are opened during a test, the pop-up message will be displayed and
the test will abort. The hardware and has been configured to provide the interlock
connections on pins 4 and 5 of the Remote Interface, Signal Input port. The instrument can
still be used without the external interlock device as long as the Interlock Connector (1505
provided with unit) is plugged into the Remote Interface, Signal Input port. If there is
nothing connected to the Remote Interface, Signal Input port to provide a connection to the
interlock, the instrument will not perform tests.
PLC Remote Pop-up message
If you attempt to start a test from the front panel Test button and the PLC remote function is
turned “ON”, a pop-up message will be displayed. The pop-up message will appear as
follows:
PLC remote
Control is ON.
Front panel TEST button is
disabled
.
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6.2 Scanner & Input Source I/O Signal Control Interface
One 9-pin “D” type and one 25-pin connectors are mounted on the rear panel to be the
signal control interface of SCANNER and input power .There are 7 I/O control signal for
REMOTE OUTPUT and SCANNER interface, and the signal cable must be prepared by user.
All of the I/O signal can be used at the same time, but REMOTE OUTPUT can control 4
4 signal and SCANNER can only control 3 signal.
6.2.1 Input Source I/O Signal Control Interface
One 9-pin “D” type connector is mounted on the rear panel that provides 4 I/O signal control.
It can control the input power of DUT POWER INPUT terminal through the interface.
6.2.2 Scanner I/O Signal Control Interface
One 25-pin connector is mounted on the rear panel that provides 4 I/O signal control.
It can control the HI and LO signal of Probe HI and Probe LO through the interface.
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6.3 Bus Remote Interface GPIB / RS-232
This section provides information on the proper use and configuration of bus remote interface.
The RS-232 remote interface is standard on 7630 but the GPIB (IEEE-488) interface option
can be substituted for the RS-232 interface. Please refer to the Option section of this manual
for details on the 7630 options. The RS-232 interface also uses the same command set as the
GPIB interface for setting of test parameters. However there are many functions of the GPIB
488.2 interface that are not available through RS-232. The IEEE-488 interface included with
7630 conforms to the requirements of the IEEE-488.2 standard.
6.2.1 GPIB Messages
There are typically two types of messages that GPIB devices use to communicate with other
interconnected GPIB devices;
Interface messages: Often called commands or command messages and Device dependent
messages often called data or data messages.
Data Messages: Contain information such as programming instructions or measurement
results. Command Messages perform functions such as initializing the bus and addressing
and unaddressing devices.
6.2.2 Functions
A GPIB device can be a Listener, Talker and/or Controller. A Talker sends data messages to
one or more Listeners, which receive data. A Controller manages the information flow on
the GPIB by sending commands to all devices. The GPIB bus is much like a computer bus
except a computer has circuit cards connected via a backplane and the GPIB has stand-alone
devices connected via a cable.
6.2.3 Signals and Lines
The GPIB consists of 16 signal lines and 8 ground-return or shield drain lines. The 16 signal
lines are grouped into 8 data lines, 3 handshake lines and 5 interface management lines.
Data Lines: The eight data lines, DI01 through DI08 carry data and command messages.
The 7-bit ASCII or ISO code set is used and the eighth bit DI08 is unused.
Handshake Lines: The transfer of message bytes between devices is done via three
asynchronously control lines. Referred to as three-wire interlocked handshake. This
guarantees that message bytes on the data lines are sent and received without transmission
error.
NRFD (not ready for data) indicates when a device is ready or not ready to receive a
message byte.
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NDAC (not data accepted) indicates when a device has or has not accepted a message byte.
DAV (data valid) tells when the signals on the data lines are stable (valid) and can be accepted
safely by devices.
Interface Management Lines: Five lines are used to manage the flow of information across
the interface.
ATN (attention) ATN is driven true by the controller when it uses the data lines to send
commands, and drivers ATN false when a Talker can send data messages.
IFC (interface clear) IFC is driven by the system controller to initialize the bus and become
CIC.
REN (remote enable) The REN line is driven by the controller that is used to place devices
in remote or local program mode.
SRQ (service request) The SRQ line can be driven by any device to asynchronously request
service from the Controller.
EOI (end or identify) This line has two purposes- the Talker uses this line to mark the end of
a message string, and the Controller uses it to tell devices to identify their response in a
parallel poll.
6.2.4 GPIB Connector
Connection is usually accomplished with a 24-conductor cable with a plug on one end and a
connector at the other end. Devices may be connected in a linear, star or a combination
configuration.
The standard connector is the Amphenol or Cinch Series 57 Microribbon or AMP CHAMP
type. The GPIB uses negative logic with standard transistor-transistor logic (TTL) levels.
When DAV is true, for example, it is a TTL low level (≤ 0/8 V), and when DAV is false, it is a
TTL high level (≥ 2.0 V).
Restrictions and Limitations on the GPIB
A maximum separation of 4 m between any two devices and an average separation of 2 m over
the entire bus. A maximum total cable length of 20 m.
No more than 15 device loads connected to each bus, with no less than two-thirds powered on.
For example 1 GPIB controller and a maximum of 14 GPIB instruments.
Note: A bus extender, which is available from numerous manufacturers, is available to
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overcome these limitations.
6.2.5 GPIB Address
This interface is optional on the 7630. Each device on the GPIB (IEEE-488) interface must
have a unique address. You can set the address of the 7630 to any value between 0 and 30.
The address is set to 9 when the instrument is shipped from the factory. The address can only
be set from the front panel. The address is stored in non-volatile memory and does not
change when the power has been off or after a remote reset.
6.2.6 Interface Functions
The capability of a device connected to the bus is specified by its interface functions. These
functions provide the means for a device to receive, process, and send messages over the bus.
The interface functions are listed in the chart below.
GPIB 488.1 INTERFACE FUNCTIONS
Interface Function Subset Description
Source Handshake SH1 Complete Source handshake capability
Acceptor Handshake AH1 Complete Acceptor handshake capability
Talker T6 Talker functions (unaddress if MLA)
Listener L4 Listener functions (unaddress if MTA)
Service Request SR1 Complete Service request capability
Remote Local RL0 No remote/local capability
Parallel Poll PP0 No parallel poll capability
Device Clear DC1 Complete Device clear capability
Device Trigger DT0 No device trigger capability
Controller C0 No controller capability
Electrical Interface E2 Three-state drivers
Controllable Items Test and Reset control.
Setting of test parameters for tests.
Reading of instrument status and test results.
Data Codes ASCII
Delimiter NL (+ EOI)
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6.2.7 RS-232 Interface
This interface is standard on 7630. This interface provides all of the control commands and
parameter setting commands of the GPIB interface with the exception of the 488.2 Common
Command the Status Reporting commands and SRQ capability. The identification command
*IDN is also available through RS-232.
The RS-232 cabling should be configured as follows for a 9 pin serial port interface:
Instrument RS-232 Port PC / Bus Controller
RD
TD
SIG
GND
2
3
5
2
RD
3
TD
SIG
5
GND
The COM port should have the following configuration. 9600 baud, 8 data bits, 1 stop bit,
no parity. This interface does not support XON/XOFF protocol or any hardware
handshaking. The controller should be configured to ignore the handshaking lines DTR (pin
4), DSR (pin 6) CTS (pin 8) and RTS (pin 7). If the port can not be configured through
software to ignore the lines then the handshake lines should be jumpered together in two
different sets. Pins 4 and 6 jumpered together and pins 7 and 8 jumpered together at the
controller end of the cable.
When sending command over the RS232 bus the instrument will send a response string of 06
hex or 6 decimal, the Acknowledge (ACK) ASCII control code if the transfer was recognized
and completed by the instrument. If there is an error with the command string that is sent,
the instrument will respond with 15 hex or 21 decimal, the Not Acknowledge (NAK) ASCII
control code. The ACK or NAK response allows for software handshaking, to monitor and
control data flow. When requesting data from the instrument, it will automatically send the
data back to the controller input buffer. The controller input buffer will accumulate data
being sent from the instrument including the ACK and NAK response strings, until it has been
read by the controller.
6.2.8 GPIB / RS-232 Interface Command List
A GPIB read command must be sent after the command strings, to retrieve any data from a
query command (?). The 7630 GPIB bus will not send any data to the controller without
being queried. The RS-232 bus will automatically send any response back to the controller's
input buffer. Each command string should be terminated by the ASCII control code, New
Line <NL>, OAh or the end of line EOL message for GPIB.
The following conventions are used to describe the commands syntax for 7630. Braces
({ })enclose each parameter for a command string. Triangle brackets (< >) indicate that you
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must substitute a value for the enclosed parameter. The Pipe ( | ) is used to separate different
parameter options for a command. Do not include any of the above characters when sending
the commands. The command and the value should be separated with a space.
All commands that end with a question mark (?) are query commands and required an
IEEE-488 read command to retrieve the data from the device's output buffer.
SETTING COMMAND DESCRIPTION COMMAND
TEST TEST
RESET RESET
HARD COPY Testing data TD?
mode,state,meter1,2,3…
STEP RESULTS nn nn=Step number,nn=1~30 RD nn?
Result Memory (Memory link
enable)
Read Scanner port status?
FILE:LOAD nn nn=01-50 FL nn
FILE:NEW nn,xxx nn=01-50,xxx=name FN nn,xxxx
LIST:FILE NAME? work file now LF?
LIST:FILE NAME nn? LF nn?
FILE:DELETE work file now FD
FILE:DELETE nn nn=01-50 FD nn
FILE:SAVE
FILE:SAVEAS nn,xxx nn=01-50,xxx=name FSA nn,xxxx
File memory link enable
Files memory link disable. FMD
File Momory state.1=enable 0=disable. FM?
STEP:SELECT nn nn=01-30 SS nn
STEP:SELECT? nn=01-30 SS?
STEP:ADD:RUN
STEP:ADD:TCT
STEP:DELETE work STEP now SD
STEP:DELETE nn nn=01-30 SD nn
STEP:PROMPT clr prompt SP
STEP:PROMPT xxxxxx xxxx=word SP xxxxx
LIST:PROMPT? work STEP now LP?
LIST:PROMPT nn? LP nn?
LIST:STEP? work STEP now LS?
LIST:STEP nn? LS nn?
Example: 1,RUN,600.0,0.0,10.00,0.00,0.5,0.5,0.00,0.00,1000,00,1.000,0.000,ON
State :STEP number,Type,Voltage-HI,Voltage-LO,Amp-HI,Amp-LO,Delay,Dwell,Leakage-HI,
Leakage-LO,Power-HI,Power-LO,PF-HI,PF-LO,Continuous,Mn
work file now (The file number must
be bigger than 0.)
Files memory link enable. (Step should
be 30 steps, and not last files.)
(The file number must be bigger than
0.)
(The file number must be bigger than
0.)
RD xx,nn?
RS?
FS
FME
SAR
SAL
RUN TCT
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Example:1,LLT,10000,0.0,125.0,0.0,99.0,2.5,CLOSED,OFF,OPEN,UL544NP,Probe-HI To
Probe-LO,RMS,OFF,MANUAL,AC,OFF
State :STEP number,Type,Leakage-HI,Leakage-LO,Voltage-HI,Voltage-LO,Delay,Dwell,(offset,)
Neutral,Reverse,Ground,Meas.Device,Probe,Peak-RMS,Extended meter,Ranging
mode,AD/DC,Continuous,Mn,Scanner
STEP:EDIT:DWELL nnn.n 0.0~999.9s EDW nnn.n
EDIT:DWELL? S EDW?
STEP:EDIT:DELAY nnn.n 0.0~999.9s EDE nnn.n
EDIT:DELAY? S EDE?
STEP:EDIT:Leakage OFFSET nnnn 0~999.9uA ELO nnn.n
EDIT:OFFSET? ELO?
STEP:Automatic offset setting. 0~999.9uA SAO
STEP:EDIT:SCANNER-HLO xxxxx xxxxxxxx=H,L,O ES xxxxxxxxxxx
EDIT:SCANNER-HLO? X ES?
READ:RESET? 1=OPEN,0=CLOSE RR?
READ:INTERLOCK? 1=OPEN,0=CLOSE RI?
STEP:EDIT:VOLTAGE-HI nnnn 0.0~277.0V EVH nnnn
EDIT:VOLTAGE-HI? V EVH?
STEP:EDIT:VOLTAGE-LO nnnn 0.0~277.0V EVL nnnn
EDIT:VOLTAGE-LO? V EVL?
STEP:EDIT:CURRENT-HI nnnn 0.00~40.00A ECH nnnn
EDIT:CURRENT-HI? A ECH?
STEP:EDIT:CURRENT-LO nnnn 0.00~40.00A ECL nnnn
EDIT:CURRENT-LO? A ECL?
EDIT:PF-LO n 1 EPFLnnnn
EDIT:PF-LO? X EPFL?
STEP:EDIT:REVERSE n n=0~2,1=on,0=off,2=auto ER n
EDIT:REVERSE? X ER?
STEP:EDIT:CONTINUOUS n N=0~1, 0=off, 1=on ETCN n
EDIT:CONTINUOUS? 1/0 ECTN?
STEP:EDIT:PROBE n n=0,1,2,3,4 EP n
EP 0=Ground To Line, EP 1=Probe-HI To Line EP, 2=Probe-HI To Probe-LO,
3= Ground To Neutral, 4=Auto
EDIT:PROBE? X EP?
STEP:EDIT:NEURAL n n=0,1 open=1,close=0 EN n
EDIT:NEURAL? X EN?
STEP:EDIT:GROUND n n=0,1 open=1,close=0 EG n
EDIT:GROUND? X EG?
STEP:EDIT:MEAS-DEVICE n n=0~9 EM n
EDIT:MEAS-DEVICE? 0=UL544NP EM?
EM 0=UL544NP
EM 1=UL544P
EM 2=IEC601-1,UL2601-1
EM 3=UL1563
EM 4=IEC60990 Fig4,U2 IEC60950
EM 5=IEC60990 Fig4,U1 IEC60950
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EM 6=IEC60990 Fig5,U3
EM 7=IEC60990 Fig5,U1
EM 8=External
EM 9=Frequency Check
EDIT:PLC MEM n n=1~7 EPM n
1: Recall Memory1 for AC Source; 0.8 times for 1931S
2: Recall Memory2 for AC Source; 0.85 times for 1931S
3: Recall Memory3 for AC Source; 0.9 times for 1931S
4: Recall Memory4 for AC Source; 1 times for 1931S and 1931
5: Recall Memory5 for AC Source; 1.06 times for 1931S and 1931
6: Recall Memory6 for AC Source; 1.1 times for 1931S and 1931
7: Recall Memory7 for AC Source
EDIT:PLC MEM? EPM?
STEP:EDIT:LEAKAGE-HI nnnn 0.000~10.00(RUN unit mA /TCT uA) ELH nnnnn ◎ ◎
EDIT:LEAKAGE-HI? mA ELH? ◎
STEP:EDIT:LEAKAGE-LO nnnn 0.000~10.00(RUN unit mA /TCT uA) ELL nnnnn ◎ ◎
EDIT:LEAKAGE-LO? mA ELL? ◎
STEP:EDIT:POWER-HI nnnn 0~10000W EPOH nnnnn ◎
EDIT:POWER-HI? W EPOH? ◎
STEP:EDIT:POWER-LO nnnn 0~10000W EPOL nnnnn ◎
EDIT:POWER-LO? W EPOL? ◎
STEP:EDIT:PF-HI nnnn 0.000~1.000 EPFH nnnn ◎
EDIT:PF-HI? X EPFH? ◎
STEP:EDIT:PF-LO nnnn 0.000~1.000 EPFL nnnn ◎
EDIT:PF-LO? X EPFL? ◎
Edit:Leakage Mode n 1=Peak,0=RMS ELM n ◎
Edit:Leakage Mode? ELM? ◎
STEP:Edit:AC/DC 0=ACDC,1=AC, 2=DC EACDC ◎
Edit:AC/DC EACDC? ◎
STEP-EDIT Extended meter 0: OFF 1:ON EEM ◎
EDIT Extended meter? 0: OFF 1:ON EEM? ◎
STEP-EDIT Ranging mode 0: Manual 1:Auto ERM ◎
EDIT Ranging mode? 0: Manual 1:Auto ERM? ◎
STEP:TOTAL;? ST? ◎ ◎
FILE:TOTAL;? FT? ◎ ◎
System:PLC:Remote n 1=on,0=off SPR n ◎ ◎
System:PLC:Remote? SPR? ◎ ◎
System:SINGLE:STEP n 1=on,0=off SSI n ◎ ◎
System:SINGLE:STEP? SSI? ◎ ◎
System:FAIL:STOP n 1=on,0=off SF n ◎ ◎
System:FAIL:STOP? SF? ◎ ◎
System:Alarm n n=0-9 SAL n ◎ ◎
System:Alarm? SAL? ◎ ◎
System:Contrast n n=1-9 SC n ◎ ◎
System:Contrast ? SC? ◎ ◎
System:Security n (System:Lock n) 1=on,0=off SL n ◎ ◎
System:Security? (System:Lock?) X SL? ◎ ◎
System:File Recall
n(System:Mem:Lock n)
System:File
Recall?(System:Mem:Lock?)
System:Cal:Alert n 1=on,0=off SCA n ◎ ◎
System:Cal:Alert? X SCA? ◎ ◎
1=on,0=off SML n ◎ ◎
X SML? ◎ ◎
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System:Date:Format n 0=ymd,1=mdy,2=dmy SDF n ◎ ◎
System:Date:Format? X SDF? ◎ ◎
System:Cal:Date mm,dd,yy or
yy,mm,dd
System:Cal:Date? Date Format by SDF SCDA? ◎ ◎
System:Cal:Due mm,dd,yy or
yy,mm,dd
System:Cal:Due? Date Format by SDF SCDU? ◎ ◎
System:Alert:Date mm,dd,yy or
yy,mm,dd
System:Alert:Date? Date Format by SDF SA? ◎ ◎
System:Date mm,dd,yy or
yy,mm,dd
System:Date? Date Format by SDF SDT? (U3 SD?) ◎ ◎
System:Time:Format n 0=12hr, 1=24hr STF n ◎ ◎
System:Time:Format? STF? ◎ ◎
System:Time hh:mm Time Format by STF
System:Time? Time Format by STF STM? ◎ ◎
System:Day n 0=Sunday,…3=Wednesday,..6=Saturday SDAY n ◎ ◎
System:Day? SDAY? ◎ ◎
System:Verification n 1=on,0=off SV n ◎ ◎
System:Verification? SV? ◎ ◎
System:Omnia Info n 1=Pause,0=Continue SOI n ◎ ◎
System:Omnia Info? SOI? ◎ ◎
System:Main Menu n 1=on,0=off SMM n ◎ ◎
System:Main Menu n SMM? ◎ ◎
*1
This function will not be existence if option OPT.754 High Measurement Range 35mArms / 70mApeak &
4MDs.
Date Format by SDF SCDA mm,dd,yy ◎ ◎
Date Format by SDF SCDU mm,dd,yy ◎ ◎
Date Format by SDF SA mm,dd,yy ◎ ◎
Date Format by SDF
SDT mm,dd,yy (U3
SD mm,dd,yy)
STM hh,mm (U3 ST
hh,mm)
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6.3 IEEE 488.2 Common Commands
These commands are required by the IEEE-488.2 standard with the exception of *PSC, *PSC?.
Most of these commands are not available over the RS-232 bus except for the *IDN?
command which can be used to retrieve the instrument identification information, and the four
status reporting commands *ESR?, *ESE, *ESE? and *STB?.
Command Name Description
*IDN? Identification Query EXTECH, Model Number, Serial
*PSC? Power-on Status Clear Query
*ESR? Standard Event Status Register Query 0 - 255
*ESE <value> Standard Event Status Enable
Command
*ESE? Standard Event Status Enable Query 0 - 255
*STB? Read Status Byte Query Read Status Byte
*SRE <value> Service Request Enable Command value = 0 - 255
*SRE? Service Request Enable Query 0 - 255
*IDN?
Read the instrument identification string. Company =EXTECH.
*RST
Reset the instrument to original power on configuration. Does not clear Enable register for
Standard Summary Status or Standard Event Registers. Does not clear the output queue.
Does not clear the power-on-status-clear flag.
*TST?
Performs a self test of the instrument data memory. Returns 0 if it is successful or 1 if the
test fails.
value = 0 - 255
*CLS
Clears the Status Byte summary register and event registers. Does not clear the Enable
registers.
*OPC
Sets the operation complete bit (bit 0) in the Standard Event register after a command is
completed successfully.
*OPC?
Returns an ASCII "1" after the command is executed.
*WAI
After the command is executed, it prevents the instrument from executing any further query or
commands until the no-operation-pending flag is TRUE.
*PSC {1|0}
Sets the power-on status clear bit. When set to 1 the Standard Event Enable register and
Status Byte Enable registers will be cleared when power is turned ON. 0 setting indicates the
Enable registers will be loaded with Enable register masks from non-volatile memory at power
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