EMLSI EM681FU16 Service Manual

merging Memory & Logic Solutions Inc.merging Memory & Logic Solutions Inc.
EM681FU16 Series
Low Power, 512Kx16 SRAM
Document Title
512K x16 bit Low Power and Low Voltage Full CMOS Static RAM
Revision History
Revision No. History Draft Date Remark
0.1 2’nd Draft Changed Icc, Icc1 value & 55ns product tDW value
0.2 3’rd Draft Changed I
Changed VDR & IDR
measurement condition
0.3 4’th Draft Add Pb-free part number February 13 , 2004
test conditions,
SB1
November 11 , 2002
December 23 , 2002
Emerging Memory & Logic Solutions Inc.
IT Venture Tower Eastside 11F, 78, Karac-Dong, Songpa-Ku, Seoul, Rep.of Korea Zip Code : 138-160 Tel : +82-2-2142-1759~1766 Fax : +82-2-2142-1769 / Homepage : www.emlsi.com
The attached datasheets are provided by EMLSI reserve the right to change the specifications and products. EMLSI will answer to your questions about device. If you have any questions, please contact the EMLSI office.
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merging Memory & Logic Solutions Inc.merging Memory & Logic Solutions Inc.
EM681FU16 Series
Low Power, 512Kx16 SRAM
FEATURES
• Process Technology : 0.18µm Full CMOS
• Organization : 512K x 16 bit
• Power Supply Voltage : 2.7V ~ 3.3V
• Low Data Retention Voltage : 1.5V (Min.)
• Three state output and TTL Compatible
• Package Type : 48-FPBGA 8.0x10.0
PRODUCT FAMILY
Product Family
EM681FU16
1. The parameter is measured with 30pF test load.
Operating Temperature
Industrial (-40 ~ 85oC)
Vcc Range Speed
2.7V~3.3V
PIN DESCRIPTION
GENERAL DESCRIPTION
The EM681FU16 families are fabricated by EMLSI’s advanced full CMOS process technology. The families support industrial temperature range and Chip Scale Package for user flexibility of system design. The fami­lies also supports low data retention voltage for battery back-up operation with low data retention current.
Power Dissipation
PKG Type
55
1)
/ 70ns
Standby (I
, Typ.)
SB1
Operating (I
.Max)
CC1
2 µA 2 mA 48-FPBGA
FUNCTIONAL BLOCK DIAGRAM
1 2 3 4 5 6
A
LB OE A
B
I/O
9
C
I/O10I/O
D
V
SS
E
V
CC
F I/O
15
G
I/O16DNU A
H
A
18
UB A
A
11
I/O
12A17
I/O13 DNU A
I/O
14A14
A
A
8
A
0
A
3
A
5
A
A
A
12
A
9
1
4
6
7
16
15
13
10
A2DNU
CS I/O
I/O2I/O
I/O4V
I/O5V
I/O6I/O
WE I/O
A
DNU
11
1
3
CC
SS
7
8
48-FPBGA : Top view (ball down)
Name Function Name Function
CS Chip select input Vcc Power Supply
I/O9 ~ I/O16
WE
OE UB
LB
CS
A
0
A
1
A
2
A
3
A
4
A
5
A
6
A
7
A
8
A
9
A
10
I/O1 ~ I/O8
Control Logic
Cont
Cont
Data
Data
Row Select
Pre-charge Circuit
Memory Array
2048 x 4096
I/O Circuit
Column Select
A11A12A13A14A15A
V
CC
V
SS
A
A
16
17
18
OE Output Enable input Vss Ground
WE Write Enable input UB Upper Byte (I/O
A0~A18 Address Inputs LB Lower Byte (I/O
I/O1~I/O16 Data Inputs/outputs DNU Do Not Use
9~16
1~8
)
)
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merging Memory & Logic Solutions Inc.merging Memory & Logic Solutions Inc.
ABSOLUTE MAXIMUM RATINGS *
Parameter Symbol Minimum Unit
EM681FU16 Series
Low Power, 512Kx16 SRAM
Voltage on Any Pin Relative to Vss VIN, V Voltage on Vcc supply relative to Vss V Power Dissipation P Operating Temperature T
* Stresses greater than those listed above “Absolute Maximum Ratings” may cause permanent damage to the device. Functional oper-
ation should be restricted to recommended operating condition. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
OUT
CC
D
A
-0.2 to 3.6V V
-0.2 to 4.0V V
1.0 W
-40 to 85
o
C
FUNCTIONAL DESCRIPTION
CS OE WE LB UB I/O
H X X X X High-Z High-Z Deselected Stand by X X X H H High-Z High-Z Deselected Stand by
L H H L X High-Z High-Z Output Disabled Active L H H X L High-Z High-Z Output Disabled Active L L H L H Data Out High-Z Lower Byte Read Active
1-8
I/O
9-16
Mode Power
L L H H L High-Z Data Out Upper Byte Read Active L L H L L Data Out Data Out Word Read Active L X L L H Data In High-Z Lower Byte Write Active L X L H L High-Z Data In Upper Byte Write Active L X L L L Data in Data In Word Write Active
Note: X means don’t care. (Must be low or high state)
3
merging Memory & Logic Solutions Inc.merging Memory & Logic Solutions Inc.
EM681FU16 Series
Low Power, 512Kx16 SRAM
RECOMMENDED DC OPERATING CONDITIONS
1)
Parameter Symbol Min Typ Max Unit
Supply voltage Ground
Input high voltage Input low voltage
1. TA= -40 to 85oC, otherwise specified
2. Overshoot: VCC +2.0 V in case of pulse width < 20ns
3. Undershoot: -2.0 V in case of pulse width < 20ns
4. Overshoot and undershoot are sampled, not 100% tested.
CAPACITANCE
1)
(f =1MHz, TA=25oC)
Item Symbol Test Condition Min Max Unit
Input capacitance C Input/Ouput capacitance C
V
CC
V
SS
V
IH
V
IL
IN
IO
2.7 3.0 3.3 V 0 0 0 V
2.2 -
3)
-0.2
VCC + 0.2
- 0.6 V
2)
V
VIN=0V - 8 pF VIO=0V - 10 pF
1. Capacitance is sampled, not 100% tested
DC AND OPERATING CHARACTERISTICS
Parameter Symbol Test Conditions Min Typ Max Unit
I
Input leakage current
Output leakage current
Operating power supply
Average operating current
Output low voltage Output high voltage Standby Current (TTL)
Standby Current (CMOS)
LI
I
LO
I
CC
I
CC1
I
CC2
V
OL IOL
V
OH IOH
I
SB
I
SB1
VIN=VSS to V CS=VIH or OE=V
VIO=VSS to V
CC
IH
CC
IIO=0mA, CS=VIL, VIN=VIH or V Cycle time=1µs, 100% duty, IIO=0mA,
CS<0.2V, LB<0.2V or/and UB<0.2V, VIN<0.2V or VIN>VCC-0.2V
Cycle time = Min, IIO=0mA, 100% duty, CS=V
LB=VIL or/and UB=VIL, VIN=VIL or
IL,
V
IH
= 2.1mA
= -1.0mA 2.2 - - V CS=VIH, LB=UB =VIH Other inputs=VIH or V CS>VCC-0.2V(CS controlled) or
LB=UB VCC-0.2V, CS<0.2V(LB/UB Con-
trolled)
Other inputs=0~V
(Typ. condition : V
CC
CC
(Max. condition : VCC=3.3V @ 85oC)
or WE=VIL, LB=UB=V
IL
=3.0V @ 25oC)
-1 - 1 uA
,
IH
-1 - 1 uA
- - 2 mA
- - 2 mA
55ns - - 25 70ns - - 20
- - 0.4 V
IL
LL LF
- - 0.3 mA
- 2 15 uA
mA
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