ELANT EL7182CS, EL7182CN Datasheet

EL7182C

2-Phase, High Speed CCD Driver

EL7182C January 1996 Rev. B

Features

# 3V and 5V Input compatible
# Clocking speeds up to 10 MHz
# Reduced clock skew
# 20 ns Switching/delay time
# 2A Peak drive
# Low quiescent current
# Wide operating voltageÐ

4.5V–16V

Applications

# CCD Drivers requiring high-

contrast imaging

# Differential line drivers
# Push-pull circuits

Ordering Information

Part No. Temp. Range Pkg. Outline

EL7182CNb40§Ctoa85§C 8-Pin P-DIP MDP0031

EL7182CSb40§Ctoa85§C 8-Pin SO MDP0027

General Description

The EL7182C is extremely well suited for driving CCD’s, espe­cially where high contrast imaging is desirable. The 16V supply
rating is attractive for higher voltage CCD applications, as in
color fax machines. The input is TTL and 3V compatible. The
low quiescent current requirement is advantageous in portable/
battery powered systems. The EL7182 is available in 8-pin
P-DIP and 8-lead SO packages.

Connection Diagram

EL7182C

Ý

7182– 1

Manufactured under U.S. Patent Nos. 5,334,883,Ý5,341,047

Note: All information contained in this data sheet has been carefully checked and is believed to be accurate as of the date of publication; however, this data sheet cannot be a ‘‘controlled document’’. Current revisions, if any, to these
specifications are maintained at the factory and are available upon your request. We recommend checking the revision level before finalization of your design documentation.

©

1994 Elantec, Inc.

EL7182C

2-Phase, High Speed CCD Driver

Absolute Maximum Ratings

Supply (Vato Gnd) 16.5V
Input Pins

b

0.3V toa0.3V above V
Combined Peak Output Current 4A
Storage Temperature Range
Ambient Operating Temperature

Important Note:
All parameters having Min/Max specifications are guaranteed. The Test Level column indicates the specific device testing actually
performed during production and Quality inspection. Elantec performs most electrical tests using modern high-speed automatic test
equipment, specifically the LTX77 Series system. Unless otherwise noted, all tests are pulsed tests, therefore T

Test Level Test Procedure

I 100% production tested and QA sample tested per QA test plan QCX0002.

II 100% production tested at T

III QA sample tested per QA test plan QCX0002.
IV Parameter is guaranteed (but not tested) by Design and Characterization Data.

V Parameter is typical value at T

T

MAX

and T

MIN

DC Electrical Characteristics

Parameter Description

b

65§Ctoa150§C

b

40§Ctoa85§C

e

25§C and QA sample tested at T

A

per QA test plan QCX0002.

e

25§C for information purposes only.

A

e

T

A

Conditions Level

Input

V

I

V

I

V

IH

IH

IL

IL

HVS

Logic ‘‘1’’ Input Voltage 2.4 I V

@

Logic ‘‘1’’ Input Current

a

V

Logic ‘‘0’’ Input Voltage 0.8 I V

Logic ‘‘0’’ Input Current

@

0V 0.1 10 I mA

Input Hysteresis 0.3 V V

Output

R

OH

R

OL

I

PK

I

DC

Pull-Up Resistance I

Pull-Down Resistance I

OUT

OUT

Peak Output Current Source 2

Sink 2

Continuous Output Current Source/Sink 100 I mA

Power Supply

I

S

V

S

Power Supply Current Input High 2.5 5 I mA

Operating Voltage 4.5 16 I V

Operating Junction Temperature 125

a

Power Dissipation

SOIC 570 mW
PDIP 1050 mW

e

T

J

e

25§C,

A

25§C, Ve15V unless otherwise specified

Test

Min Typ Max

Test

0.1 10 I mA

eb

100 mA 3 6 I X

ea

100 mA 4 6 I X

IV A

§

e

TA.

C

Units

C

TD is 3.1in

2

EL7182C

2-Phase, High Speed CCD Driver

AC Electrical Characteristics

Parameter Description

Switching Characteristics

t

R

t

F

t

D-ON

t

D-OFF

Rise Time C

Fall Time C

Turn-On Delay Time 18 25 IV ns

Turn-Off Delay Time 20 25 IV ns

Timing Table

e

T

25§C, Ve15V unless otherwise specified

A

Test

Conditions Level

e

500 pF 7.5

L

e

C

1000 pF 10 20

L

e

500 pF 10

L

e

C

1000 pF 13 20

L

Min Typ Max

Test

Standard Test Configuration

Units

IV ns

IV ns

TD is 1.5in

7182– 3

7182– 2

Simplified Schematic

3

7182– 17