EL7154C
High Speed, Monolithic Pin Driver
EL7154C January 1996 Rev B
Features
# Comparatively low cost
# 3-State output
# 3V and 5V Input compatible
# Clocking speeds up to 10 MHz
# 20 ns Switching/delay time
# 4A Peak drive
# Isolated drains
# Low output impedanceÐ2.5X
# Low quiescent currentÐ5 mA
# Wide operating voltageÐ
4.5V– 16V
# Isolated P-channel device
# Separate ground and V
L
pins
Applications
# Loaded circuit board testers
# Digital testers
# Level shifting below GND
# IGBT drivers
# CCD drivers
Ordering Information
Part No. Temp. Range Pkg. Outline
EL7154CNb40§Ctoa85§C 8-Pin P-DIP MDP0031
EL7154CSb40§Ctoa85§C 8-Pin SOIC MDP0027
General Description
The EL7154C 3-state pin driver is particularly well suited for
ATE and level shifting applications. The 4A peak drive capability, makes the EL7154C an excellent choice when driving high
speed capacitive lines.
The p-channel MOSFET is completely isolated from the power
supply, providing a high degree of flexibility. Pin (7) can be
grounded, and the output can be taken from pin (8) when a
‘‘source follower’’ output is desired. Then n-channel MOSFET
has an isolated drain, but shares a common bus with pre-drivers
and level shifter circuits. This is necessary to ensure that the
n-channel device can turn off effectively when V
L
GND. In some power-FET and IGBT applications, negative
drive is desirable to insure effective turn-off. The EL7154 can be
used in these applications by returning V
to a moderate nega-
L
tive potential.
Connection Diagram
Ý
goes below
Nominal Operating
Voltage Range
Pin Min Max
V
L
V
DD–VL
V
–V
H
L
V
DD–VH
V
DD
Note: All information contained in this data sheet has been carefully checked and is believed to be accurate as of the date of publication; however, this data sheet cannot be a ‘‘controlled document’’. Current revisions, if any, to these
specifications are maintained at the factory and are available upon your request. We recommend checking the revision level before finalization of your design documentation.
©
1995 Elantec, Inc.
b
30
515
215
b
0.5 15
515
Top View
7154– 1
Truth Table
3-State Input P
0 0 Open Open
0 1 Open Open
1 0 HIGH Open
1 1 Open LOW
Manufactured under U.S. Patent Nos. 5,334,883,Ý5,341,047,Ý5,352,578,
Ý
5,352,389,Ý5,351,012,Ý5,374,898
OUT
N
OUT
EL7154C
High Speed, Monolithic Pin Driver
Absolute Maximum Ratings
Supply (VDDto VL;VH–VL,VHto GND),
a
V
to V
V
to GND
L
Input Pins
H
b
0.3V below VLto
a
0.3V above V
16.5V
b
Peak Output Current 4A
Storage Temperature Range
Important Note:
All parameters having Min/Max specifications are guaranteed. The Test Level column indicates the specific device testing actually
performed during production and Quality inspection. Elantec performs most electrical tests using modern high-speed automatic test
equipment, specifically the LTX77 Series system. Unless otherwise noted, all tests are pulsed tests, therefore T
Test Level Test Procedure
I 100% production tested and QA sample tested per QA test plan QCX0002.
II 100% production tested at T
III QA sample tested per QA test plan QCX0002.
IV Parameter is guaranteed (but not tested) by Design and Characterization Data.
V Parameter is typical value at T
T
MAX
and T
MIN
b
65§Ctoa150§C
e
25§C and QA sample tested at T
A
per QA test plan QCX0002.
e
25§C for information purposes only.
A
Ambient Operating Temperature
Operating Junction Temperature 125
Power Dissipation
5V
SOIC 570 mW
DD
PDIP 1050 mW
e
25§C,
A
DC Electrical Characteristics
e
T
25§C, V
A
Parameter Description
Input
V
IH
I
IH
V
IL
I
IL
V
HVS
Output
R
OH
R
OL
I
OUT
I
PK
I
DC
Power Supply
I
S
V
S
I
G
I
H
DD
ea
12V, V
H
ea
12V, V
eb
3V, unless otherwise specified
L
Test
Conditions Level
Min Typ Max
Logic ‘‘1’’ Input Voltage 2.4 I V
Logic ‘‘1’’ Input Current V
e
V
IH
DD
0.1 10 I mA
Logic ‘‘0’’ Input Voltage 0.6 I V
Logic ‘‘0’’ Input Current V
e
0V 0.1 10 I mA
IL
Input Hysteresis 0.3 V V
Pull-Up Resistance I
Pull-Down Resistance I
OUT
OUT
eb
100 mA 1.5 4 I X
ea
100 mA 2 4 I X
Output Leakage Current VDD/GND 0.2 10 I mA
Peak Output Current Source 4.0
Sink 4.0
Continuous Output Current Source/Sink 200 I mA
Power Supply Current InputseV
DD
1 2.5 I mA
Operating Voltage 4.5 16 I V
Current to GND (Pin 4) 1 10 I mA
Off Leakage at V
H
Pin 8e0V 1 10 I mA
b
40§Ctoa85§C
§
e
e
T
TA.
J
C
Test
VA
Units
C
TDis3.6in
2
EL7154C
High Speed, Monolithic Pin Driver
AC Electrical Characteristics
Parameter Description
e
Switching Characteristics (V
t
R
t
F
t
D-1
t
D-2
t
D-1
t
D-2
Rise Time C
Fall Time C
Turn-Off Delay Time C
Turn-On Delay Time C
3-State Delay 25 IV ns
3-State Delay 25 IV ns
DD
e
V
12V; V
H
Standard Test Configuration
e
T
25§C unless otherwise specified
A
Test
Conditions Level
eb
3V)
L
e
100 pF 4 25
L
e
C
2000 pF 20
L
e
100 pF 4
L
e
C
2000 pF 20
L
e
2000 pF 20 25 IV ns
L
e
2000 pF 10 25 IV ns
L
Min Typ Max
25 IV ns
Test
IV ns
Timing Table
7154– 2
Units
TDis1.9in
7154– 3
3