ELANT EL2252CN, EL2252CM Datasheet
EL2252C
Dual 50 MHz Comparator/Pin Receiver
EL2252C December 1995 Rev E
Features
# Fast responseÐ7 ns
# Inputs tolerate large overdrives
with no speed nor bias current
penalties
# Propagation delay is relatively
constant with variations of input
Slew Rate, overdrive,
temperature, and supply voltage
# Output provides proper CMOS or
TTL logic levels
# Hysteresis is available on-chip
# Large voltage gainÐ8000 V/V
# Not oscillation-prone
# Can detect 4 ns glitches
# MIL-STD-883 Rev. C compliant
Applications
# Pin receiver for automatic test
equipment
# Data communications line
receiver
# Frequency counter input
# Pulse squarer
Ordering Information
Part No. Temp. Range Package Outline
EL2252CN 0§Ctoa75§C 14-Pin P-DIP MDP0031
EL2252CM 0§Ctoa75§C 20-Lead SOL MDP0027
General Description
The EL2252 dual comparator replaces the traditional input
a
buffer
attenuatoraECL comparatoraECL to TTL translator circuit blocks used in digital equipment. The EL2252 provides a quick 7 ns propagation delay while complying with
g
10V inputs. Input accuracy and propagation delay is maintained even with input signal Slew Rates as great as 4000 V/ms.
The EL2252 can run on supplies as low as
b
5.2V anda9V and
comply with ECL and CMOS inputs, or use supplies as great as
g
18V for much greater input range.
The EL2252 has a /TTL pin which, when grounded, restricts
the output V
When left open, the output V
to a TTL swing to minimize propagation delay.
OH
increases to a valid CMOS
OH
level.
The comparators are well behaved and have little tendency to
oscillate over a variety of input and output source and load
impedances. They do not oscillate even when the inputs are
held in the linear range of the device. To improve output stability in the presence of input noise, an internal 60 mV of hysteresis is available by connecting the HYS pin to V
b
.
Elantec’s products and facilities comply with MIL-I-45208A,
and other applicable quality specifications. For information on
Elantec’s processing, see Elantec document, QRA-1; ‘‘Elantec’s
Processing, Monolithic Integrated Circuits’’.
Connection Diagrams
Ý
14-Pin DIP 20-Pin SOL
Top View
Note: All information contained in this data sheet has been carefully checked and is believed to be accurate as of the date of publication; however, this data sheet cannot be a ‘‘controlled document’’. Current revisions, if any, to these
specifications are maintained at the factory and are available upon your request. We recommend checking the revision level before finalization of your design documentation. Patent pending.
©
1995 Elantec, Inc.
2252– 1
2252– 2
Top View
EL2252C
Dual 50 MHz Comparator/Pin Receiver
Absolute Maximum Ratings
a
Voltage between V
Voltage at V
Voltage between
a
b
Output Current 12 mA
Current into
a
IN,bIN, HYS
b
and V
IN andaIN pins 36V
e
(T
25§C)
A
Internal Power Dissipation See Curves
36V
Operating Ambient Temperature Range
18V
Operating Junction Temperature 150
Storage Temperature Range
b
25§Ctoa85§C
b
65§toa150C
C
§
or /TTL 5 mA
Important Note:
All parameters having Min/Max specifications are guaranteed. The Test Level column indicates the specific device testing actually
performed during production and Quality inspection. Elantec performs most electrical tests using modern high-speed automatic test
equipment, specifically the LTX77 Series system. Unless otherwise noted, all tests are pulsed tests, therefore T
Test Level Test Procedure
I 100% production tested and QA sample tested per QA test plan QCX0002.
II 100% production tested at T
III QA sample tested per QA test plan QCX0002.
IV Parameter is guaranteed (but not tested) by Design and Characterization Data.
V Parameter is typical value at T
T
MAX
and T
per QA test plan QCX0002.
MIN
DC Electrical Characteristics
e
25§C and QA sample tested at T
A
e
25§C for information purposes only.
A
e
g
V
15V; HYS and /TTL grounded; T
S
e
25§C,
A
e
25§C unless otherwise specified
A
Parameter Description Temp Min Typ Max
e
T
J
Test Level
e
TA.
C
Units
EL2252C
V
OS
Input Offset Voltage 25§C19ImV
Full 13 III mV
TCV
I
B
OS
Average Offset Voltage Drift Full 7 V mV/C
Input Bias Current at Null 25§C 6 16 I mA
Full 21 III mA
I
OS
Input Offset Current 25§C 0.2 1 I mA
Full 2 III mA
RIN, diff Input Differential Resistance 25§C30 VkX
R
, comm Input Common-Mode Resistance 25§C10 VMX
IN
CINInput Capacitance 25§C2 VpF
a
V
CM
b
V
CM
A
VOL
Positive Common-Mode
Input Range
Negative Common-Mode
Input Range
Full 10 13 II V
Full
b
b
9
12 II V
Large Signal Voltage Gain 25§C 4000 8000 I V/V
e
V
0.8V to 2.0V
O
Full 3000 III V/V
TDis 3.3in
2
Dual 50 MHz Comparator/Pin Receiver
DC Electrical Characteristics
e
g
V
15V; HYS and /TTL grounded; T
S
Parameter Description Temp Min Typ Max
CMRR Common-Mode Rejection Ratio
(Note 1)
PSRR Power-Supply Rejection Ratio
(Note 2)
V
V
V
I
I
HYS
OH
OL
a
S
b
S
Peak-to-Peak Input Hysteresis
with HYS connected to V
High Level Output, CMOS Mode Full 4.0 4.6 5.1 II V
Low Level Output, I1e0 Full
Positive Supply Current Full 16 19 II mA
Negative Supply Current Full 17 20 II mA
AC Electrical Characteristics
e
g
V
S
Parameter Description Min Typ Max
T
PD
T
PD
T
PDSYM
Note 1: Two tests are performed with V
Note 2: Two tests are performed with V
15V; C
,T
a
,T
a
PD
PD
L
b
e
10 pF; T
e
25§C; TTL output threshold is 1.4V, CMOS output threshold is 2.5V; unless otherwise specified
A
Input to Output Propagation Delay,
k
0
V
IN
2000 V/ms Input Slew Rate
TTL Output Swing
CMOS Output Swing 8 V ns
Input to Output Propagation Delay,
b
b
2VkV
2 ns Input Rise Time
TTL Output Swing
CMOS Output Swing 9 V ns
Propagation Delay Change between
Positive and Negative Input Slopes
e
25§C unless otherwise specified Ð Contd.
A
Full 70 95 II dB
Full 70 90 II dB
25
C60 VmV
b
§
TTL Mode Full 2.4 2.7 3.2 II V
b
0.2 0.2 0.8 II V
I1e5 mA Full
k
5V, 500 mV Overdrive,
k
b
1V, 500 mV Overdrive,
IN
b
0.2 0.4 0.8 II V
6 9 III ns
5 9 III ns
1.25 V ns
e
0V tob9V and V
CM
ae
15V, Vbchanged fromb10V tob15V;
beb
15V, Vachanged from 10V to 15V.
V
CM
e
0V to 10V.
EL2252C
Test Level
EL2252C
Test Level
EL2252C
Units
Units
TDis 2.5inTDis 2.2in
3
EL2252C
Dual 50 MHz Comparator/Pin Receiver
AC Test Circuit
Burn-In Circuit
2252– 3
2252– 4
4
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