GP401DDS18
GP401DDS18
FEATURES
■ Low V
■ Non Punch Through Silicon
■ Isolated Copper Baseplate
■ Low Inductance Internal Construction
CE(SAT)
APPLICATIONS
■ High Reliability Inverters
■ Motor Controllers
■ Traction Drives
■ Resonant Converters
The Powerline range of high power modules includes dual
and single switch configurations covering voltages from 600V to
3300V and currents up to 4800A.
Low V
CE(SAT)
Dual Switch IGBT Module
KEY PARAMETERS
V
V
I
C
I
C(PK)
CES
CE(sat)
(typ) 2.6V
(max) 400A
(max) 800A
2
12(C
)
2(C
)
2
1
7(C
)
Preliminary Information
DS5272-3.0 January 2001
1800V
2
)
11(G
4(E2)
1(E1)
10(E2)
3(C1)
1
5(E
1
6(G
)
)
The GP401DDS18 is a dual switch 1800V, n channel
enhancement mode, insulated gate bipolar transistor (IGBT)
module. Designed with low V
losses, the module is of particular relevance in low to medium
to minimise conduction
CE(SAT)
frequency applications. The IGBT has a wide reverse bias safe
operating area (RBSOA) ensuring reliability in demanding
applications.
The module incorporates an electrically isolated base plate
and low inductance construction enabling circuit designers to
optimise circuit layouts and utilise earthed heat sinks for safety.
ORDERING INFORMATION
Order As:
GP401DDS18
Note: When ordering, please use the whole part number.
Fig. 1 Dual switch circuit diagram
5
6
13
7
8
9
12
11
10
24
Outline type code: D
(See package details for further information)
Fig. 2 Electrical connections - (not to scale)
Caution: This device is sensitive to electrostatic discharge. Users should follow ESD handling procedures. 1/10
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GP401DDS18
ABSOLUTE MAXIMUM RATINGS - PER ARM
Stresses above those listed under 'Absolute Maximum Ratings' may cause permanent damage to the device. In extreme
conditions, as with all semiconductors, this may include potentially hazardous rupture of the package. Appropriate safety
precautions should always be followed. Exposure to Absolute Maximum Ratings may affect device reliability.
T
= 25˚C unless stated otherwise
case
Symbol
V
CES
V
GES
I
C
I
C(PK)
P
max
V
isol
Collector-emitter voltage
Gate-emitter voltage
Continuous collector current
Peak collector current
Max. transistor power dissipation
Isolation voltage
Parameter
THERMAL AND MECHANICAL RATINGS
Symbol
R
th(j-c)
R
th(j-c)
Thermal resistance - transistor (per arm)
Thermal resistance - diode (per arm)
Parameter
Test Conditions
= 0V
V
GE
-
= 70˚C
T
case
1ms, T
T
case
= 110˚C
case
= 25˚C, Tj = 150˚C
Commoned terminals to base plate. AC RMS, 1 min, 50Hz
Test Conditions
Continuous dissipation -
junction to case
Continuous dissipation -
Min.
-
-
Max.
1800
±20
400
800
3000
4000
Max.
42
80
Units
V
V
A
A
W
V
Units
˚C/kW
˚C/kW
junction to case
R
th(c-h)
Thermal resistance - case to heatsink (per module)
Mounting torque 5Nm
-
˚C/kW
8
(with mounting grease)
T
Junction temperature
j
Transistor
Diode
T
stg
-
Storage temperature range
Screw torque
Mounting - M6
-
Electrical connections - M4
Electrical connections - M8
-
-
–40
-
-
-
150
125
125
5
2
10
˚C
˚C
˚C
Nm
Nm
Nm
2/10 Caution: This device is sensitive to electrostatic discharge. Users should follow ESD handling procedures.
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ELECTRICAL CHARACTERISTICS
T
= 25˚C unless stated otherwise.
case
GP401DDS18
Symbol
I
CES
I
GES
V
GE(TH)
V
CE(sat)
I
F
I
FM
V
F
C
ies
L
M
Parameter
Collector cut-off current
Gate leakage current
Gate threshold voltage
Collector-emitter saturation voltage
Diode forward current
Diode maximum forward current
Diode forward voltage
Input capacitance
Module inductance
Test Conditions
= 0V, VCE = V
V
GE
VGE = 0V, VCE = V
= ±20V, VCE = 0V
V
GE
= 20mA, VGE = V
I
C
CES
CES
, T
CE
VGE = 15V, IC = 400A
= 15V, IC = 400A, , T
V
GE
DC
= 1ms
t
p
IF = 400A
= 400A, T
I
F
= 25V, VGE = 0V, f = 1MHz
V
CE
= 125˚C
case
-
= 125˚C
case
case
= 125˚C
Min.
-
-
-
4.5
-
-
-
-
-
-
-
-
Typ.
-
-
-
5.5
2.6
3.3
-
-
2.2
2.3
45
20
Max.
1
12
±2
6.5
3.2
4
400
800
2.5
2.6
-
-
Units
mA
mA
µA
V
V
V
A
A
V
V
nF
nH
Caution: This device is sensitive to electrostatic discharge. Users should follow ESD handling procedures. 3/10
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GP401DDS18
ELECTRICAL CHARACTERISTICS
T
= 25˚C unless stated otherwise
case
Symbol
t
d(off)
t
f
E
OFF
t
d(on)
t
r
E
ON
Q
rr
I
rr
E
REC
T
= 125˚C unless stated otherwise
case
Turn-off delay time
Fall time
Turn-off energy loss
Turn-on delay time
Rise time
Turn-on energy loss
Diode reverse recovery charge
Diode reverse current
Diode reverse recovery energy
Symbol
Parameter
Parameter
Test Conditions
= 400A
I
C
= ±15V
V
GE
= 900V
V
CE
R
G(ON)
= R
G(OFF)
= 2.2Ω
L ~ 100nH
= 400A, VR = 50% V
I
F
/dt = 3000A/µs
dI
F
Test Conditions
CES
Min.
,
Min.
Typ.
900
-
330
-
180
-
500
-
200
-
200
-
-
-
-
80
250
70
Typ.
Max.
1100
400
250
650
400
230
100
Max.
Units
ns
ns
mJ
ns
ns
mJ
µC
-
-
A
mJ
Units
E
E
t
t
E
d(off)
d(on)
Q
I
REC
t
f
OFF
t
r
ON
rr
= 400A
R
G(ON)
I
C
= ±15V
V
GE
= 900V
V
CE
= R
G(OFF)
L ~ 100nH
= 2.2Ω
Turn-off delay time
Fall time
Turn-off energy loss
Turn-on delay time
Rise time
Turn-on energy loss
rr
Diode reverse recovery charge
Diode reverse current
IF = 400A, VR = 50% V
/dt = 2500A/µs
dI
F
CES
,
Diode reverse recovery energy
1010
-
450
-
250
-
600
-
310
-
200
-
110
-
300
-
190
-
1200
500
320
800
400
270
150
-
-
ns
ns
mJ
ns
ns
mJ
µC
A
mJ
4/10 Caution: This device is sensitive to electrostatic discharge. Users should follow ESD handling procedures.
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