
ZXMN6A09G
60V SOT223 N-channel enhancement mode MOSFET
Summary
V
(BR)DSS
60
R
DS(on)
0.040 @ V
0.060 @ V
() I
= 10V 7.5
GS
= 4.5V 6.2
GS
D
(A)
Description
This new generation of trench MOSFETs from Zetex utilizes a unique
structure that combines the benefits of low on-resistance with fast
switching speed. This makes them ideal for high efficiency, low voltage
power management applications.
Features
• Low on-resistance
• Fast switching speed
• Low threshold
• Low gate drive
• SOT223 package
Applications
• DC-DC converters
• Power management functions
D
G
S
S
• Disconnect switches
• Motor control
D
Pinout - top view
D
G
Ordering information
Device Reel size
(inches)
ZXMN6A09GTA 7 12 1000
Tape width
(mm)
Quantity
per reel
Device marking
ZXMN
6A09
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© Zetex Semiconductors plc 2007

ZXMN6A09G
Absolute maximum ratings
Parameter Symbol Limit Unit
Drain-source voltage V
Gate-source voltage V
Continuous drain current @ V
@ V
@ V
Pulsed drain current
(c)
=10V; T
GS
=10V; T
GS
=10V; T
GS
Continuous source current (body diode)
(a)
(c)
Pulsed source current (body diode)
Power dissipation at T
amb
=25°C
amb
amb
amb
(b)
=25°C
=70°C
=25°C
(b)
(b)
(a)
DSS
I
I
DM
I
I
SM
P
GS
D
S
D
Linear derating factor 16 mW/°C
Power dissipation at T
amb
=25°C
(b)
P
D
Linear derating factor 31 mW/°C
Operating and storage temperature range T
j
, T
stg
60 V
±20 V
7.5 A
6
5.4
33 A
3.5 A
33 A
2W
3.9 W
-55 to +150 °C
Thermal resistance
Parameter Symbol Limit Unit
Junction to ambient
Junction to ambient
NOTES:
(a) For a device surface mounted on 25mm x 25mm FR4 PCB with high coverage of single sided 1oz copper, in still air
conditions.
(b) For a device surface mounted on FR4 PCB measured at t 10 sec.
(c) Repetitive rating 25mm x 25mm FR4 PCB, D=0.02 pulse width=300s - pulse width limited by maximum junction
temperature.
(a)
(b)
R
R
JA
JA
62.5 °C/W
32.2 °C/W
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© Zetex Semiconductors plc 2007

Characteristics
ZXMN6A09G
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© Zetex Semiconductors plc 2007

ZXMN6A09G
Electrical characteristics (at T
= 25°C unless otherwise stated)
amb
Parameter Symbol Min. Typ. Max. Unit Conditions
Static
Drain-source breakdown voltage V
Zero gate voltage drain current I
Gate-body leakage I
Gate-source threshold voltage V
Static drain-source on-state
(*)
(‡)
(*)(‡)
resistance
Forward transconductance
Dynamic
Input capacitance C
Output capacitance C
Reverse transfer capacitance C
Switching
(†) (‡)
Turn-on-delay time t
Rise time t
Turn-off delay time t
Fall time t
Total gate charge Q
Total gate charge Q
Gate-source charge Q
Gate drain charge Q
(BR)DSS
DSS
GSS
GS(th)
R
DS(on)
g
fs
iss
oss
rss
d(on)
r
d(off)
f
g
g
gs
gd
60 V ID= 250A, VGS=0V
1 AVDS= 60V, VGS=0V
100 nA VGS=±20V, VDS=0V
1.0 3.0 V ID= 250A, VDS=V
0.040 VGS= 10V, ID= 8.2A
0.060 V
= 4.5V, ID = 7.4A
GS
15 S VDS= 15V, ID= 8.2A
1407 pF VDS= 40V, VGS=0V
121 pF
f=1MHz
59 pF
4.9 ns VDD= 15V, ID= 3.5A
≅6.0, VGS= 10V
R
5.0 ns
G
25.3 ns
4.6 ns
12.4 nC VDS= 15V, VGS= 5V
= 3.5A
I
D
24.2 nC VDS= 15V, VGS= 5V
= 3.5A
I
5.2 nC
D
3.5 nC
Source-drain diode
Diode forward voltage
Reverse recovery time
(*)
(‡)
Reverse recovery charge
(‡)
V
SD
t
rr
Q
rr
0.85 0.95 V Tj=25°C, IS= 6.6A,
=0V
V
GS
26.3 ns Tj=25°C, IS= 3.5A,
26.6 nC
di/dt=100A/s
GS
(*) Measured under pulsed conditions. Pulse width 300 s; duty cycle 2%.
(†) Switching characteristics are independent of operating junction temperature.
(‡) For design aid only, not subject to production testing.
Issue 3 - June 2007 4 www.zetex.com
© Zetex Semiconductors plc 2007

Typical characteristics
ZXMN6A09G
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© Zetex Semiconductors plc 2007

Typical characteristics
Current
regulator
Charge
Gate charge test circuit
Switching time test circuit
Basic gate charge waveform
Switching time waveforms
D.U.T
50k
12V
Same as
D.U.T
V
GS
V
GS
V
DS
V
G
Q
GS
Q
GD
Q
G
V
GS
90%
10%
t
(on)
t
(on)
t
d(on)tr
t
r
t
d(off)
V
DS
DD
V
R
D
R
G
V
DS
I
D
I
G
ZXMN6A09G
Issue 3 - June 2007 6 www.zetex.com
© Zetex Semiconductors plc 2007

Package outline - SOT223
ZXMN6A09G
DIM Millimeters Inches DIM Millimeters Inches
Min Max Min Max Min Max Min Max
A - 1.80 - 0.071 e 2.30 BSC 0.0905 BSC
A1 0.02 0.10 0.0008 0.004 e1 4.60 BSC 0.181 BSC
b 0.66 0.84 0.026 0.033 E 6.70 7.30 0.264 0.287
b2 2.90 3.10 0.114 0.122 E1 3.30 3.70 0.130 0.146
C 0.23 0.33 0.009 0.013 L 0.90 - 0.355 -
D 6.30 6.70 0.248 0.264 - - - - -
Note: Controlling dimensions are in millimeters. Approximate dimensions are provided in inches
Issue 3 - June 2007 7 www.zetex.com
© Zetex Semiconductors plc 2007

ZXMN6A09G
Definitions
Product change
Zetex Semiconductors reserves the right to alter, without notice, specifications, design, price or conditions of supply of any product or
service. Customers are solely responsible for obtaining the latest relevant information before placing orders.
Applications disclaimer
The circuits in this design/application note are offered as design ideas. It is the responsibility of the user to ensure that the circuit is fit for
the user’s application and meets with the user’s requirements. No representation or warranty is given and no liability whatsoever is
assumed by Zetex with respect to the accuracy or use of such information, or infringement of patents or other intellectual property rights
arising from such use or otherwise. Zetex does not assume any legal responsibility or will not be held legally liable (whether in contract,
tort (including negligence), breach of statutory duty, restriction or otherwise) for any damages, loss of profit, business, contract,
opportunity or consequential loss in the use of these circuit applications, under any circumstances.
Life support
Zetex products are specifically not authorized for use as critical components in life support devices or systems without the express written
approval of the Chief Executive Officer of Zetex Semiconductors plc. As used herein:
A. Life support devices or systems are devices or systems which:
1. are intended to implant into the body
or
2. support or sustain life and whose failure to perform when properly used in accordance with instructions for use provided in the
labeling can be reasonably expected to result in significant injury to the user.
B. A critical component is any component in a life support device or system whose failure to perform can be reasonably expected to
cause the failure of the life support device or to affect its safety or effectiveness.
Reproduction
The product specifications contained in this publication are issued to provide outline information only which (unless agreed by the
company in writing) may not be used, applied or reproduced for any purpose or form part of any order or contract or be regarded as a
representation relating to the products or services concerned.
Terms and Conditions
All products are sold subjects to Zetex’ terms and conditions of sale, and this disclaimer (save in the event of a conflict between the two
when the terms of the contract shall prevail) according to region, supplied at the time of order acknowledgement.
For the latest information on technology, delivery terms and conditions and prices, please contact your nearest Zetex sales office.
Quality of product
Zetex is an ISO 9001 and TS16949 certified semiconductor manufacturer.
To ensure quality of service and products we strongly advise the purchase of parts directly from Zetex Semiconductors or one of our
regionally authorized distributors. For a complete listing of authorized distributors please visit: www.zetex.com/salesnetwork
Zetex Semiconductors does not warrant or accept any liability whatsoever in respect of any parts purchased through unauthorized sales channels.
ESD (Electrostatic discharge)
Semiconductor devices are susceptible to damage by ESD. Suitable precautions should be taken when handling and transporting devices.
The possible damage to devices depends on the circumstances of the handling and transporting, and the nature of the device. The extent
of damage can vary from immediate functional or parametric malfunction to degradation of function or performance in use over time.
Devices suspected of being affected should be replaced.
Green compliance
Zetex Semiconductors is committed to environmental excellence in all aspects of its operations which includes meeting or exceeding regulatory requirements with respect to the use of hazardous substances. Numerous successful programs have been implemented to reduce
the use of hazardous substances and/or emissions.
All Zetex components are compliant with the RoHS directive, and through this it is supporting its customers in their compliance with
WEEE and ELV directives.
Product status key:
“Preview” Future device intended for production at some point. Samples may be available
“Active” Product status recommended for new designs
“Last time buy (LTB)” Device will be discontinued and last time buy period and delivery is in effect
“Not recommended for new designs”
“Obsolete” Production has been discontinued
Datasheet status key:
“Draft version” This term denotes a very early datasheet version and contains highly provisional information, which
“Provisional version” This term denotes a pre-release datasheet. It provides a clear indication of anticipated performance.
“Issue” This term denotes an issued datasheet containing finalized specifications. However, changes to
Zetex sales offices
Europe
Zetex GmbH
Kustermann-park
Balanstraße 59
D-81541 München
Germany
Telefon: (49) 89 45 49 49 0
Fax: (49) 89 45 49 49 49
europe.sales@zetex.com
© 2007 Published by Zetex Semiconductors plc
Device is still in production to support existing designs and production
may change in any manner without notice.
However, changes to the test conditions and specifications may occur, at any time and without notice.
specifications may occur, at any time and without notice.
Americas
Zetex Inc
700 Veterans Memorial Highway
Hauppauge, NY 11788
USA
Telephone: (1) 631 360 2222
Fax: (1) 631 360 8222
usa.sales@zetex.com
Asia Pacific
Zetex (Asia Ltd)
3701-04 Metroplaza Tower 1
Hing Fong Road, Kwai Fong
Hong Kong
Telephone: (852) 26100 611
Fax: (852) 24250 494
asia.sales@zetex.com
Corporate Headquarters
Zetex Semiconductors plc
Zetex Technology Park, Chadderton
Oldham, OL9 9LL
United Kingdom
Telephone: (44) 161 622 4444
Fax: (44) 161 622 4446
hq@zetex.com
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© Zetex Semiconductors plc 2007