ZXMC3A18DN8
Complementary 30V enhancement mode MOSFET
Summary
N-Channel = V
P-Channel = V
(BR)DSS
(BR)DSS
= 30V : R
= -30V : R
= 0.025⍀; ID= 7.6A
DS(on)
= 0.035⍀; ID= -6.3A
DS(on)
Description
This new generation of trench MOSFETs from Zetex
utilizes a unique structure that combines the benefits of
low on-resistance with fast switching speed. This makes
them ideal for high efficiency, low voltage, power
management applications.
Features
• Low on-resistance
• Fast switching speed
• Low threshold
• Low gate drive
• Low profile SOIC package
Applications
•Motor Drive
• LCD backlighting
D1
G1
G2
S1
Q1 N-Channel Q2 P-Channel
G1
S2
G2
SO8
D2
S2
D1 S1
D1
D2
D2
Ordering information
Device Reel size
(inches)
ZXMC3A18DN8TC 13 12 2500
Tape width
(mm)
Quantity
per reel
Device marking
ZXMC
3A18
Issue 2 - September 2007 1 www.zetex.com
© Zetex Semiconductors plc 2007
Absolute maximum ratings
ZXMC3A18DN8
Parameter Symbol
Drain-source voltage V
Gate-source voltage V
Continuous drain current (V
Pulsed drain current
(c)
(V
(V
= 10V; T
GS
= 10V; T
GS
= 10V; T
GS
amb
amb
amb
Continuous source current (body diode)
(a)(d)
(c)
Pulsed source current (body diode)
Power dissipation at T
amb
=25°C
=25°C)
=70°C)
=25°C)
(b)
(b)(d)
(b)(d)
(a)(d)
DSS
GS
I
I
I
D
DM
I
S
SM
P
N-channel P-channel
30 -30 V
±20 ±20 V
7.6 -6.3 A
6.1 -5.0
5.8 -4.8
37 -30 A
3.6 3.2 A
37 30 A
D
Unit
1.25 W
Linear derating factor 10 mW/°C
Power dissipation at T
amb
=25°C
(a)(e)
P
D
1.8 W
Linear derating factor 14 mW/°C
Power dissipation at T
amb
=25°C
(b)(d)
P
D
2.1 W
Linear derating factor 17 mW/°C
Operating and storage temperature range T
j
, T
stg
-55 to +150 °C
Thermal resistance
Parameter Symbol
Junction to ambient
Junction to ambient
Junction to ambient
NOTES:
(a) For a device surface mounted on 25mm x 25mm FR4 PCB with high coverage of single sided 1oz copper, in still air
conditions.
(b) For a device surface mounted on FR4 PCB measured at t 10 sec.
(c) Repetitive rating - pulse width limited by maximum junction temperature. Pulse width 300
transient thermal impedance graph.
(d) For device with one active die.
(e) For device with two active die running at equal power.
(a)(d)
(a)(e)
(b)(d)
R
R
R
JA
JA
JA
Value
Unit
100 °C/W
70 °C/W
60 °C/W
s, d<= 0.02. Refer to
Issue 2 - September 2007 2 www.zetex.com
© Zetex Semiconductors plc 2007
Characteristics
ZXMC3A18DN8
Issue 2 - September 2007 3 www.zetex.com
© Zetex Semiconductors plc 2007
ZXMC3A18DN8
N-channel
Electrical characteristics (at T
Parameter Symbol Min. Typ. Max. Unit Conditions
Static
Drain-source breakdown
voltage
Zero gate voltage drain current I
Gate-body leakage I
Gate-source threshold voltage V
Static drain-source on-state
(*)
resistance
Forward transconductance
(*)(‡)
V
R
g
= 25°C unless otherwise stated)
amb
(BR)DSS
DSS
GSS
GS(th)
DS(on)
30 V ID= 250A, VGS=0V
0.5 AVDS=30V, VGS=0V
100 nA VGS=±20V, VDS=0V
1.0 V ID= 250A, VDS=V
0.025 VGS= 10V, ID= 5.8A
0.030 V
fs
17.5 S VDS= 15V, ID= 5.8A
= 4.5V, ID= 5.3A
GS
GS
Dynamic
(‡)
Input capacitance C
Output capacitance C
Reverse transfer capacitance C
Switching
(†) (‡)
Turn-on-delay time t
Rise time t
Turn-off delay time t
Fall time t
Gate charge Q
Total gate charge Q
Gate-source charge Q
Gate drain charge Q
Source-drain diode
Diode forward voltage
Reverse recovery time
Reverse recovery charge
(*)
(‡)
(‡)
iss
oss
rss
d(on)
r
d(off)
f
g
g
gs
gd
V
SD
t
rr
Q
rr
1800 pF VDS= 25V, VGS=0V
289 pF
f=1MHz
178 pF
5.5 ns VDD= 15V, ID= 6A
≅ 6.0, VGS= 10V
R
8.7 ns
G
33 ns
8.5 ns
19.4 nC VDS= 15V, VGS= 5V
= 3.5A
I
D
36 nC VDS= 15V, VGS= 10V
I
= 3.5A
5.5 nC
D
7.0 nC
0.95 V Tj=25°C, IS= 6A, VGS=0V
20.5 ns Tj=25°C, IS= 6A,
41.5 nC
di/dt=100A/s
(*) Measured under pulsed conditions. Pulse width 300s; duty cycle 2%.
(†) Switching characteristics are independent of operating junction temperature.
(‡) For design aid only, not subject to production testing.
Issue 2 - September 2007 4 www.zetex.com
© Zetex Semiconductors plc 2007