Diodes HTMN5130SSD User Manual

Page 1
2
G
HTMN5130SSD
55V DUAL N-CHANNEL 175°C MOSFET
Product Summary
I
V
R
(BR)DSS
55V
130m @ V
200m @ VGS = 4.5V
DS(on) max
GS
= 10V
D
TA = +25°C
2.86 A
2.3 A
Description
This new generation MOSFET has been designed to minimize the on-
state resistance (R
performance, making it ideal for high efficiency power management
applications.
) and yet maintain superior switching
DS(ON)
Applications
DC-DC Converters
Power Management Functions
Backlighting
Top View Top View
G1
S2
G2
Pin Configuration
Features and Benefits
Low Input Capacitance
Low On-Resistance
Fast Switching Speed
Totally Lead-Free & Fully RoHS Compliant (Notes 1 & 2)
Halogen and Antimony Free. “Green” Device (Note 3)
Qualified to AEC-Q101 Standards for High Reliability
Mechanical Data
Case: SO-8
Case Material: Molded Plastic, “Green” Molding Compound.
UL Flammability Classification Rating 94V-0
Moisture Sensitivity: Level 1 per J-STD-020
Terminal Connections: See Diagram
Terminals: Finish – Tin Finish annealed over Copper leadframe.
Solderable per MIL-STD-202, Method 208
Weight: 0.074 grams (approximate)
D1S1
D1
e3
D
D1
D2
1
G2
D2
S1
Equivalent Circuit
S2
Ordering Information (Note 4)
Part Number Case Packaging
HTMN5130SSD-13 SO-8 2,500/Tape & Reel
Notes: 1. No purposely added lead. Fully EU Directive 2002/95/EC (RoHS) & 2011/65/EU (RoHS 2) compliant.
2. See http://www.diodes.com/quality/lead_free.html for more information about Diodes Incorporated’s definitions of Halogen- and Antimony-free, "Green" and Lead-free.
3. Halogen- and Antimony-free "Green” products are defined as those which contain <900ppm bromine, <900ppm chlorine (<1500ppm total Br + Cl) and <1000ppm antimony compounds.
4. For packaging details, go to our website at http://www.diodes.com/products/packages.html.
Marking Information
HTMN5130SSD
Document number: DS36319 Rev. 3 - 2
1 of 6
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November 2013
© Diodes Incorporated
Page 2
V
V
Maximum Ratings (@T
= +25°C, unless otherwise specified.)
A
Characteristic Symbol
Drain-Source Voltage
Gate-Source Voltage
Continuous Drain Current (Note 6) VGS = 10V
Pulsed Drain Current (10s pulse, duty cycle = 1%)
Continuous Source Current (Body Diode) (Note 6)
Pulsed Source Current (Body Diode)
Avalanche Current (Note 5) L =4.9mH
Avalanche Energy (Note 5) L = 4.9mH
Steady
State
t<10s
T
= +25°C ID
A
= +25°C
T
A
= +70°C
T
A
V
DSS
V
GSS
I
D
I
DM
I
S
I
SM
I
AS
E
AS
HTMN5130SSD
alue Units
55 V
±20 V
2.6 A
2.86
2.3
8 A
2.8 A
8 A
6 A
89 mJ
A
Thermal Characteristics (@T
Total Power Dissipation (Note 6)
Thermal Resistance, Junction to Ambient (Note 6)
Thermal Resistance, Junction to Case (Note 6)
Operating and Storage Temperature Range
= +25°C, unless otherwise specified.)
A
Characteristic Symbol
= +25°C
T
A
= +70°C
T
A
Steady state
t<10s 50
P
R
R
T
J, TSTG
JA
JC
D
alue Units
1.7
1.1
W
72
°C/W
11.2
-55 to +175 °C
Electrical Characteristics (@T
= +25°C, unless otherwise specified.)
A
Characteristic Symbol Min Typ Max Unit Test Condition
OFF CHARACTERISTICS (Note 7)
Drain-Source Breakdown Voltage
Zero Gate Voltage Drain Current
Gate-Source Leakage
55
BV
DSS
I
 
DSS
I
GSS
100 nA
100
V
VGS = 0V, ID = 250µA
VDS = 55V, VGS = 0V
nA
VGS = 20V, VDS = 0V
ON CHARACTERISTICS (Note 7)
Gate Threshold Voltage
Static Drain-Source On-Resistance
Diode Forward Voltage
V
R
DS(ON)
V
GS(th)
SD
1
3 V
130
200
1.0 V
VDS = VGS, ID = 250µA
V
m
VGS = 4.5V, ID = 1.5A
VGS = 0V, IS = 1.5A
= 10V, ID = 3 A
GS
DYNAMIC CHARACTERISTICS (Note 8)
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Gate Resistance
Total Gate Charge (VGS = 10V) Qg
Total Gate Charge (VGS = 4.5V) Qg
Gate-Source Charge
Gate-Drain Charge
Turn-On Delay Time
Turn-On Rise Time
Turn-Off Delay Time
Turn-Off Fall Time
Body Diode Reverse Recovery Time
Body Diode Reverse Recovery Charge
Notes: 5. IAR and EAR rating are based on low frequency and duty cycles to keep TJ = +25°C.
6. Device mounted on FR-4 substrate PC board, 2oz copper, with 1inch square copper plate.
7. Short duration pulse test used to minimize self-heating effect.
8. Guaranteed by design. Not subject to product testing.
C
iss
C
oss
C
rss
R

G
Q
gs
Q
gd
t
D(on)
t
r
t
D(off)
t

f
t

rr
Q
rr


218.7
97.8
22.4
3.75
8.9
4.7
1.0
2.9
3
2.5
13.5
6.1
30.8
35.4





= 25V, VGS = 0V
V
pF
nC
nS
nS
nC
DS
f = 1.0MHz
VDS = 0V, VGS = 0V, f = 1.0MHz
= 40V, ID = 2A
V
DS
V
= 10V, VDD = 25V, RG = 6,
GS
= 1A
I
D
IF = 1.5A, dI/dt = 100A/s
= 1.5A, dI/dt = 100A/s
I
F
HTMN5130SSD
Document number: DS36319 Rev. 3 - 2
2 of 6
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November 2013
© Diodes Incorporated
Page 3
RAIN
C
URREN
T
R
CUR
R
T
O
O
R
R
OUR
ON-R
R
R
OUR
C
R
R
N-SO
U
R
C
O
N
R
T
N
C
HTMN5130SSD
10.0
8.0
(A)
6.0
V = 10VGS
V= 4.5V
GS
V= 3.5V
GS
V= 4.0V
GS
10
(A)
EN
V = 5.0VDS
T = 150°C
A
T = 125°C
A
T = 85°C
A
T = 25°C
A
T = -55°C
A
T = 175°C
A
AIN
D
I, D
I, D
4.0
V= 3.0V
D
GS
2.0
V= 2.5V
GS
0.0
V , DRAIN-SOURCE VOLTAGE (V)
DS
Figure 1 Typical Output Characteristics
0.30
0.25
0123456
V , GATE-SOURCE VOLTAGE (V)
GS
Figure 2 Typical Transfer Characteristics
0.3
0.25
V = 10VGS
T = 175°C
A
T = 150°C
T = 125°C
A
T = 25°C
A
A
T = 85°C
A
T = -55°C
A
0.20
V = 4.5VGS
N-RESISTANCE ( )
0.15
URCE
V= 10V
GS
0.10
0.05
DS(ON)
R , DRAIN-S
0.00 0246810
I , DRAIN-SOURCE CURRENT (A)D Figure 3 Typical On-Resistance vs.
Drain Current and Gate Voltage
2.2
ESISTANCE ( )
0.2
0.15
CE
0.1
AIN-S
, D
0.05
DS(ON)
0
0246810
I , DRAIN CURRENT (A)
D
Figure 4 Typical On-Resistance vs.
Drain Current and Temperature
0.4
2
1.8
E
1.6
V=V
10
GS
I= 5A
D
1.4
AIN-S
, D
1.2
1
DS(ON)
V = 4.5V
GS
I= 2A
D
0.8
ON-RESISTANCE (NORMALIZED)
0.6
0.4
-50 -25 0 25 50 75 100 125 150 175
HTMN5130SSD
Document number: DS36319 Rev. 3 - 2
T , JUNCTION TEMPERATURE ( C)
J
Figure 5 On-Resistance Variation with Temperature
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3 of 6
E ( )
0.35
A
ESIS
-
E
0.3
0.25
0.2
V = 4.5V
GS
I= 5A
D
0.15
V=V
10
GS
I= 10A
AI
0.1
D
, D
0.05
DS(ON)
0
-50 -25 0 25 50 75 100 125 150 175 T , JUNCTION TEMPERATURE ( C)
J
Figure 6 On-Resistance Variation wit h Temperature
November 2013
© Diodes Incorporated
Page 4
GATE THRESH
OLD VOLTAG
OUR
CE CUR
R
N
C
UNCTION CAPAC
C
GATE THRESH
O
OLTAG
HTMN5130SSD
3
10
2.9
E (V)
2.8
2.7
I= 1mA
2.6
2.5
I = 250µA
D
D
2.4
8
T (A) E
6
T= 25°C
A
4
2.3
S
2.2
GS(th)
2.1
V,
2
-50 -25 0 25 50 75 100 125 150 175
Figure 7 Gate Threshold Variation vs. Ambient Temperature
1000
E (pF)
T , JUNCTION TEMPERATURE ( C)
J
C
iss
I, S
2
0
V , SOURCE-DRAIN VOLTAGE (V)
SD
Figure 8 Diode Forward Voltage vs. Current
10
V= 40V
DS
I=A
2
D
8
E (V)
ITAN
100
C
oss
6
LD V
4
, J
T
f = 1MHz
10
0 5 10 15 20 25 30 35 40
V , DRAIN-SOURCE VOLTAGE (V)
DS
C
rss
Figure 9 Typical Junction Capacitance
2
GS
V
0
0246810
Q(nC)
, TOTAL GATE CHARGE
g
Figure 10 Gate Charge
HTMN5130SSD
Document number: DS36319 Rev. 3 - 2
4 of 6
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November 2013
© Diodes Incorporated
Page 5
HTMN5130SSD
Test Circuits
Package Outline Dimensions
Please see AP02002 at http://www.diodes.com/datasheets/ap02002.pdf for latest version.
E1
E
A1
Detail ‘A’
L
0.254 Gauge Plane
Seating Plane
7°~9
°
Detail ‘A’
A3
h
°
45
A2
e
b
D
A
Dim Min Max
SO-8
A - 1.75 A1 0.10 0.20 A2 1.30 1.50 A3 0.15 0.25
b 0.3 0.5
D 4.85 4.95
E 5.90 6.10
E1 3.85 3.95
e 1.27 Typ h - 0.35 L 0.62 0.82
0 8

All Dimensions in mm
HTMN5130SSD
Document number: DS36319 Rev. 3 - 2
5 of 6
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November 2013
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Page 6
HTMN5130SSD
Suggested Pad Layout
Please see AP02001 at http://www.diodes.com/datasheets/ap02001.pdf for the latest version.
DIODES INCORPORATED MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARDS TO THIS DOCUMENT, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE
(AND THEIR EQUIVALENTS UNDER THE LAWS OF ANY JURISDICTION).
Diodes Incorporated and its subsidiaries reserve the right to make modifications, enhancements, improvements, corrections or other changes without further notice to this document and any product described herein. Diodes Incorporated does not assume any liability arising out of the application or use of this document or any product described herein; neither does Diodes Incorporated convey any license under its patent or trademark rights, nor the rights of others. Any Customer or user of this document or products described herein in such applications shall assume all risks of such use and will agree to hold Diodes Incorporated and all the companies whose products are represented on Diodes Incorporated website, harmless against all damages.
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This document is written in English but may be translated into multiple languages for reference. Only the English version of this document is the final and determinative format released by Diodes Incorporated.
Diodes Incorporated products are specifically not authorized for use as critical components in life support devices or systems without the express written approval of the Chief Executive Officer of Diodes Incorporated. As used herein:
A. Life support devices or systems are devices or systems which:
1. are intended to implant into the body, or
2. support or sustain life and whose failure to perform when properly used in accordance with instructions for use provided in the
labeling can be reasonably expected to result in significant injury to the user.
B. A critical component is any component in a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or to affect its safety or effectiveness.
Customers represent that they have all necessary expertise in the safety and regulatory ramifications of their life support devices or systems, and acknowledge and agree that they are solely responsible for all legal, regulatory and safety-related requirements concerning their products and any use of Diodes Incorporated products in such safety-critical, life support devices or systems, notwithstanding any devices- or systems-related information or support that may be provided by Diodes Incorporated. Further, Customers must fully indemnify Diodes Incorporated and its representatives against any damages arising out of the use of Diodes Incorporated products in such safety-critical, life support devices or systems.
Copyright © 2013, Diodes Incorporated
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X
Dimensions Value (in mm)
X 0.60 Y 1.55
C1
C2
Y
IMPORTANT NOTICE
LIFE SUPPORT
C1 5.4 C2 1.27
HTMN5130SSD
Document number: DS36319 Rev. 3 - 2
6 of 6
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November 2013
© Diodes Incorporated
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