Features
Low On-Resistance
Low Gate Threshold Voltage
Low Input Capacitance
Fast Switching Speed
Low Input/Output Leakage
Totally Lead-Free & Fully RoHS Compliant (Notes 1 & 2)
Halogen and Antimony Free. “Green” Device (Note 3)
Qualified to AEC-Q101 Standards for High Reliability
NEW PRODUCT
TOP VIEW
N-CHANNEL ENHANCEMENT MODE MOSFET
Mechanical Data
Case: SOT-23
Case Material: Molded Plastic, “Green” Molding Compound.
UL Flammability Classification Rating 94V-0
Moisture Sensitivity: Level 1 per J-STD-020
Terminals: Finish Matte Tin annealed over Copper leadframe.
Solderable per MIL-STD-202, Method 208
Terminals Connections: See Diagram Below
Weight: 0.008 grams (approximate)
Drain
D
Gate
Source
Internal Schematic TOP VIEW
G
DMN2041L
S
Ordering Information (Note 4)
Part Number Case Packaging
DMN2041L-7 SOT-23 3000/Tape & Reel
Notes: 1. No purposely added lead. Fully EU Directive 2002/95/EC (RoHS) & 2011/65/EU (RoHS 2) compliant.
2. See http://www.diodes.com/quality/lead_free.html for more information about Diodes Incorporated’s definitions of Halogen- and Antimony-free, "Green"
and Lead-free.
3. Halogen- and Antimony-free "Green” products are defined as those which contain <900ppm bromine, <900ppm chlorine (<1500ppm total Br + Cl) and
<1000ppm antimony compounds.
4. For packaging details, go to our website at http://www.diodes.com/products/packages.html.
Marking Information
Date Code Key
Year 2009 2010 2011 2012 2013 2014 2015
Code W X Y Z A B C
Month Jan Feb Mar Apr May Jun Jul Aug Sep Oct Nov Dec
Code 1 2 3 4 5 6 7 8 9 O N D
MN9
Chengdu A/T Site
YM
MN9
Shanghai A/T Site
MN9 = Product Type Marking Code
YM = Date Code Marking for SAT (Shanghai Assembly/ Test site)
= Date Code Marking for CAT (Chengdu Assembly/ Test site)
YM
YM
Y or = Year (ex: A = 2013)
Y
M = Month (ex: 9 = September)
DMN2041L
Document number: DS31962 Rev. 2 - 2
1 of 6
www.diodes.com
October 2013
© Diodes Incorporated
Maximum Ratings (@T
= +25°C, unless otherwise specified.)
A
Characteristic Symbol Value Units
Drain-Source Voltage
Gate-Source Voltage
= +25°C
Continuous Drain Current (Note 5)
Steady
State
T
A
T
= +70°C
A
Pulsed Drain Current (Note 6)
Thermal Characteristics
Characteristic Symbol Value Unit
Power Dissipation (Note 5)
NEW PRODUCT
Thermal Resistance, Junction to Ambient @ TA = +25°C R
Operating and Storage Temperature Range
Notes: 5. Device mounted on FR-4 PCB with minimum recommended pad layout.
6. Repetitive rating, pulse width limited by junction temperature.
Electrical Characteristics (@T
= +25°C, unless otherwise specified.)
A
Characteristic Symbol Min Typ Max Unit Test Condition
OFF CHARACTERISTICS (Note 7)
Drain-Source Breakdown Voltage
Zero Gate Voltage Drain Current TJ = 25°C I
Gate-Source Leakage
BV
DSS
I
GSS
DSS
ON CHARACTERISTICS (Note 7)
Gate Threshold Voltage
Static Drain-Source On-Resistance
Forward Transfer Admittance
Diode Forward Voltage
V
GS(th)
R
DS (ON)
|Y
V
SD
|
fs
DYNAMIC CHARACTERISTICS (Note 8)
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Gate Resistance
Total Gate Charge (10V)
Total Gate Charge (4.5V)
Gate-Source Charge
Gate-Drain Charge
Turn-On Delay Time
Turn-On Rise Time
Turn-Off Delay Time
Turn-Off Fall Time
Notes: 7. Short duration pulse test used to minimize self-heating effect.
8. Guaranteed by design. Not subject to production testing.
DMN2041L
Document number: DS31962 Rev. 2 - 2
C
iss
C
oss
C
rss
R
g
Q
g
Q
g
Q
gs
Q
gd
t
D(on)
t
r
t
D(off)
t
f
www.diodes.com
V
V
I
P
T
J, TSTG
DSS
GSS
I
D
DM
D
θJA
20 V
±12 V
6.4
4.5
30 A
0.78 W
161 °C/W
-55 to +150 °C
20 — — V
— —
— —
1.0 µA
±100 nA
0.5 — 1.2 V
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
20
26
28
41
mΩ
6 — S
0.7 1.2 V
550
88
81
1.34
15.6
7.2
1.0
1.9
4.69
13.19
22.10
6.43
—
—
—
—
—
—
—
—
—
—
—
—
pF
Ω
nC
nC
ns
2 of 6
DMN2041L
A
VGS = 0V, ID = 250μA
VDS = 20V, VGS = 0V
VGS = ±12V, VDS = 0V
VDS = VGS, ID = 250μA
= 4.5V, ID = 6.0A
V
GS
VGS = 2.5V, ID = 5.2A
VDS = 10V, ID = 6A
VGS = 0V, IS = 1.7A
= 10V, VGS = 0V,
V
DS
f = 1.0MHz
VDS = 0V, VGS = 0V, f = 1MHz
VGS = 10V, VDS = 10V, ID = 6A
V
= 4.5V, VDS = 10V, ID = 6A
GS
V
= 10V, V
DD
= 1Ω, ID = 6.7A
R
GEN
= 4.5V,
GEN
October 2013
© Diodes Incorporated