Diodes DMN1019USN User Manual

Y
Product Summary
V
R
(BR)DSS
10m @ V 12m @ VGS = 2.5V
12V
14m @ VGS = 1.8V 18m @ VGS = 1.5V 41m @ VGS = 1.2V
DS(ON) MAX
= 4.5V
GS
TA = +25°C
Description
This new generation MOSFET has been designed to minimize the on-
state resistance (R
performance, making it ideal for high efficiency power management
applications.
) and yet maintain superior switching
DS(ON)
Applications
Load Switch
DC-DC Converters
Power Management Functions
ESD PROTECTED
SC59
Top View
I
D
9.3A
8.5A
7.9A
6.9A
4.6A
DMN1019USN
12V N-CHANNEL ENHANCEMENT MODE MOSFET
Features
Low On-Resistance
ESD Protected Gate
Totally Lead-Free & Fully RoHS compliant (Notes 1 & 2)
Halogen and Antimony Free. “Green” Device (Note 3)
Qualified to AEC-Q101 Standards for High Reliability
Mechanical Data
Case: SC59
Case Material – Molded Plastic. UL Flammability Rating 94V-0
Moisture Sensitivity: Level 1 per J-STD-020
Terminals: Finish - Matte Tin Solderable per MIL-STD-202,
Method 208
Terminal Connections: See Diagram
Weight: 0.014 grams (approximate)
D
G
Top View
Pin Configuration
e3
D
G
S
Gate Protect ion
Diode
Equivalent Circuit
S
Ordering Information (Note 4)
Part Number Case Packaging
DMN1019USN-7 SC59 3,000/Tape & Reel
DMN1019USN-13 SC59 10,000/Tape & Reel
Notes: 1. No purposely added lead. Fully EU Directive 2002/95/EC (RoHS) & 2011/65/EU (RoHS 2) compliant.
2. See http://www.diodes.com/quality/lead_free.html for more information about Diodes Incorporated’s definitions of Halogen- and Antimony-free, "Green" and Lead-free.
3. Halogen- and Antimony-free "Green” products are defined as those which contain <900ppm bromine, <900ppm chlorine (<1500ppm total Br + Cl) and <1000ppm antimony compounds.
4. For packaging details, go to our website at http://www.diodes.com/products/packages.html.
Marking Information
Date Code Key
Year 2013 2014 2015 2016 2017 2018 2019 2020
Code A B C D E F G H
Month Jan Feb Mar Apr May Jun Jul Aug Sep Oct Nov Dec
Code 1 2 3 4 5 6 7 8 9 O N D
N7
DMN1019USN
Document number: DS36999 Rev. 2 - 2
M
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N7 = Product Type Marking Code YM = Date Code Marking Y = Year ex: A = 2013 M = Month ex: 9 = September
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May 2014
© Diodes Incorporated
)
g
g
)
)
DMN1019USN
Maximum Ratings (@T
= +25°C, unless otherwise specified.)
A
Characteristic Symbol Value Units
Drain-Source Voltage Gate-Source Voltage
Continuous Drain Current (Note 6) VGS = 4.5V
Pulsed Drain Current (10µs pulse, duty cycle = 1%) Maximum Body Diode Forward Current (Note 6)
Steady
State
t<10s
T
= +25°C
A
= +70°C
T
A
T
= +25°C
A
T
= +70°C
A
V
DSS
V
GSS
I
D
I
D
I
DM
I
S
12 V ±8 V
9.3
7.4
11
8.8
A
A
70 A
2 A
Thermal Characteristics
Characteristic Symbol Value Units
= +25°C
T
Total Power Dissipation (Note 5)
Thermal Resistance, Junction to Ambient (Note 5)
Total Power Dissipation (Note 6)
Thermal Resistance, Junction to Ambient (Note 6)
Thermal Resistance, Junction to Case (Note 6) Operating and Storage Temperature Range
A
TA = +70°C
Steady state
t<10s 115 °C/W
= +25°C
T
A
TA = +70°C
Steady state
t<10s 68 °C/W
P
R
P
R
R
T
J, TSTG
θJA
θJA
θJC
D
D
Electrical Characteristics (@T
= +25°C, unless otherwise specified.)
A
Characteristic Symbol Min Typ Max Unit Test Condition
OFF CHARACTERISTICS (Note 7)
Drain-Source Breakdown Voltage Zero Gate Voltage Drain Current Gate-Body Leakage
BV
I
DSS
I
GSS
DSS
12 V
1 µA — ±2 µA
ON CHARACTERISTICS (Note 7)
Gate Threshold Voltage
V
GS(th
0.35 0.53 0.8 V — 7 10
Static Drain-Source On-Resistance
R
DS(ON)
— — —
8 12 10 14 14 18
m
28 41 Forward Transfer Admittance Diode Forward Voltage
IYfsI V
SD
28 S
0.8 1.2 V
DYNAMIC CHARACTERISTICS (Note 8)
Input Capacitance Output Capacitance Reverse Transfer Capacitance Gate Resistance
C C C
oss
rss
Rg
iss
Total Gate Charge (VGS = 8V) Qg Total Gate Charge (VGS = 4.5V) Qg Gate-Source Charge Gate-Drain Charge Turn-On Delay Time Turn-Off Delay Time Turn-On Rise Time Turn-Off Fall Time
Notes: 5. Device mounted on FR-4 PCB with minimum recommended pad layout, single sided. The power dissipation PD is based on t<10s R
6. Device mounted on 1” x 1” FR-4 PCB with high coverage 2 oz. Copper, single sided. The power dissipation P
7. Short duration pulse test used to minimize self-heating effect.
8. Guaranteed by design. Not subject to production testing.
DMN1019USN
Document number: DS36999 Rev. 2 - 2
Q
s
Q
d
t
D(ON
t
D(OFF
tr
tf
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2426
396 375
1.1
50.6
27.3
3.4
5.2
7.6
22.2
57.6
16.8
pF — pF — pF — — — —
nC
— — ns — ns — ns — ns
D
0.68
0.4
160 °C/W
1.2
0.83 96 °C/W
18 °C/W
-55 to +150 °C
VGS = 0V, ID = 250µA V
=12V, VGS = 0V
DS
VGS = ±8V, V
DS
= 0V
VDS = VGS, ID = 250µA VGS = 4.5V, ID = 9.7A VGS = 2.5V, ID = 9A VGS = 1.8V, ID = 8.1A VGS = 1.5V, ID = 4.5A VGS = 1.2V, ID = 2.4A VDS = 4V, ID = 9.7A VGS = 0V, IS = 10A
VDS = 10V, VGS = 0V, f = 1MHz
V
= 0V, VGS = 0V, f = 1MHz
DS
V
= 4V, ID = 10A
DS
VDD = 4V, V
= 5V, ID = 10A,
GEN
RG = 1Ω, RL = 0.4
.
is based on t<10s R
θJA
.
θJA
© Diodes Incorporated
W
W
May 2014
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