Diodes DMG4435SSS User Manual

Product Summary
V
R
(BR)DSS
-30V
16m @ V 20m @ VGS = -10V
DS(on) max
= -20V
GS
TA = +25°C
Description
This new generation MOSFET has been designed to minimize the on-
state resistance (R
performance, making it ideal for high efficiency power management
applications.
) and yet maintain superior switching
DS(ON)
Applications
DC-DC Converters
Power management functions
Backlighting
SO-8
S
S
G
Top View
I
D
-7.3A
-6.0A
Internal Schematic
DMG4435SSS
P-CHANNEL ENHANCEMENT MODE MOSFET
Features
Low On-Resistance
Low Input Capacitance
Fast Switching Speed
Low Input/Output Leakage
Totally Lead-Free & Fully RoHS Compliant (Notes 1 & 2)
Halogen and Antimony Free. “Green” Device (Note 3)
Qualified to AEC-Q101 Standards for High Reliability
Mechanical Data
Case: SO-8
Case Material: Molded Plastic, "Green" Molding Compound.
UL Flammability Classification Rating 94V-0
Moisture Sensitivity: Level 1 per J-STD-020
Terminal Connections Indicator: See diagram
Terminals: Finish Matte Tin annealed over Copper leadframe.
Solderable per MIL-STD-202, Method 208
Weight: 0.074 grams (approximate)
e3
D
DS
D
D
G
D
S
Top View
Equivalent circuit
Ordering Information (Note 4)
Part Number Case Packaging
DMG4435SSS-13 SO-8 2500 / Tape & Reel
Notes: 1. No purposely added lead. Fully EU Directive 2002/95/EC (RoHS) & 2011/65/EU (RoHS 2) compliant.
2. See http://www.diodes.com/quality/lead_free.html for more information about Diodes Incorporated’s definitions of Halogen- and Antimony-free, "Green" and Lead-free.
3. Halogen- and Antimony-free "Green” products are defined as those which contain <900ppm bromine, <900ppm chlorine (<1500ppm total Br + Cl) and <1000ppm antimony compounds.
4. For packaging details, go to our website at http://www.diodes.com/products/packages.html.
Marking Information
DMG4435SSS
Document number: DS32041 Rev. 5 - 2
8 5
G4435SS
WW
YY
1 4
Chengdu A/T Site Shanghai A/T Site
8 5
G4435SS
YY
WW
1 4
= Manufacturer’s Marking G4435SS = Product Type Marking Code YYWW = Date Code Marking YY or YY = Year (ex: 13 = 2013) WW = Week (01 - 53) YY = Date Code Marking for SAT (Shanghai Assembly/ Test site) YY = Date Code Marking for CAT (Chengdu Assembly/ Test site)
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Maximum Ratings (@T
= +25°C, unless otherwise specified.)
A
Characteristic Symbol Value Unit
Drain-Source Voltage
Gate-Source Voltage
Continuous Drain Current (Note 5) VGS = -20
Pulsed Drain Current (Note 6)
Thermal Characteristics
Characteristic Symbol Value Unit
Power Dissipation (Note 5)
Thermal Resistance, Junction to Ambient @TA = +25°C
Operating and Storage Temperature Range
Electrical Characteristics (@T
= +25°C
T
Steady State
t < 10s
A
= +70°C
T
A
T
= +25°C
A
= +70°C
T
A
= +25°C
T
A
T
= +70°C
A
Steady state
t < 10s 55 °C/W
= +25°C, unless otherwise specified.)
A
DMG4435SSS
V
DSS
V
GSS
I
D
I
D
I
DM
P
D
R
θJA
T
, T
J
STG
-30 V
±25 V
-7.3
-5.7
-10
-7.5
A
A
-80 A
2.5 W
1.5 W
96.5 °C/W
-55 to +150 °C
Characteristic Symbol Min Typ Max Unit Test Condition
OFF CHARACTERISTICS (Note 7)
Drain-Source Breakdown Voltage
Zero Gate Voltage Drain Current TJ = +25°C I
Gate-Source Leakage
BV
DSS
I
GSS
DSS
-30
-1.0 µA
— V
±100 nA
VGS = 0V, ID = -1mA
VDS = -30V, VGS = 0V
VGS = ±25V, VDS = 0V
ON CHARACTERISTICS (Note 7)
Gate Threshold Voltage
Static Drain-Source On-Resistance
Forward Transfer Admittance
Diode Forward Voltage
V
GS(th)
R
DS (ON)
|Y
V
fs
SD
-1.0 -1.7 -2.5 V
13 16
15 20
21 29
22 — S
|
-0.74 -1.0 V
VDS = VGS, ID = -250μA
V
= -20V, ID = -11A
GS
m
V
= -10V, ID = -10A
GS
V
= -5V, ID = -5A
GS
VDS = -5V, ID = -10A
VGS = 0V, IS = -1A
DYNAMIC CHARACTERISTICS (Note 8)
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Gate Resistance
Total Gate Charge at 10V
Total Gate Charge at 5V
Gate-Source Charge
Gate-Drain Charge
Turn-On Delay Time
Turn-On Rise Time
Turn-Off Delay Time
Turn-Off Fall Time
Notes: 5. Device mounted on 1in. x 1in. FR-4 PCB with 2oz. Copper, and the testing is based on the t<10s. The value in any given application depends on the user’s specific board design.
6. Repetitive rating, pulse width limited by junction temperature.
7. Short duration pulse test used to minimize self-heating effect.
8. Guaranteed by design. Not subject to production testing.
C
C
C
R
Q
Q
Q
Q
t
D(on)
t
D(off)
iss
oss
rss
gd
t
t
g
g
g
gs
r
f
DMG4435SSS
Document number: DS32041 Rev. 5 - 2
1614 — pF
35.4 — nC
5.7 — nC
44.9 — ns
226
214
6.8
18.9
4.6
8.6
12.7
22.8
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V
= -15V, VGS = 0V,
pF
pF
DS
f = 1.0MHz
VDS = 0V, VGS = 0V, f = 1MHz
VGS = -10V, VDS = -15V, ID = -10A
nC
nC
ns
ns
ns
V
= -5V, VDS = -15V,
GS
= -10A
I
D
= -15V, VGS = -10V,
V
DS
= 1.5Ω, R
R
L
GEN
= 3Ω,
September 2013
© Diodes Incorporated
R
CUR
RENT
R
CUR
RENT
R
R
OUR
CE ON-R
TANC
R
RAIN-SOUR
CE O
N-R
TAN
C
R
R
OUR
C
30
V = -10V
GS
25
(A)
20
15
AIN
10
D
-I , D
V = -4.5V
V = -4.0V
GS
V = -3.5V
GS
GS
V = -3.0V
GS
5
V = -2.2V
0
0 0.5 1 1.5 2
-V , DRAIN-SOURCE VOLTAGE (V)
DS
GS
V = -2.5V
GS
Fig. 1 Typical Output Characteristic
0.05
E ( )
0.04
30
V = -5V
25
(A)
20
DS
15
AIN
10
D
-I , D
5
T = 150°C
A
T = 125°C
A
0
0 0.5 1 1.5 2 2.5 3 3.5 4
-V , GATE-SOURCE VOLTAGE (V)
GS
Fig. 2 Typical Transfer Characteristic
0.06
E ( )
0.05
V = -4.5V
GS
DMG4435SSS
T = 85°C
A
T = 25°C
A
T = -55°C
A
ESIS
0.03
V = -4.5V
0.02
AIN-S
0.01
, D
DS(ON)
0
0 5 10 15 20 25 30
-I , DRAIN-SOURCE CURRENT (A)
D
Fig. 3 Typical On-Resistance
GS
V = -10V
GS
vs. Drain Current and Gate Voltage
1.6
1.4
V = -4.5V
GS
I = -10A
D
1.2
V = -10V
GS
I = -20A
D
1.0
DSON
R , DRAIN-SOURCE
0.8
ON-RESISTANCE (NORMALIZED)
ESIS
0.04
0.03
0.02
, D
0.01
DS(ON)
0
0 5 10 15 20 25 30
-I , DRAIN CURRENT (A)
D
Fig. 4 Typical On-Resistance
vs. Drain Current and Temperature
0.04
0.03
E
V = -4.5V
GS
I = -10A
D
0.02
AIN-S
, D
DSON
0.01
V = -10V
GS
I = -20A
D
ON-RESISTANCE (NORMALIZED)
T = 150°C
A
T = 125°C
A
T = 85°C
A
T = 25°C
A
T = -55°C
A
0.6
-50 -25 0 25 50 75 100 125 150 T , AMBIENT TEMPERATURE (°C)
A
Fig. 5 On-Resistance Variation with Temperature
0
-50 -25 0 25 50 75 100 125 150
T , AMBIENT TEMPERATURE (°C)
A
Fig. 6 On-Resistance Variation with Temperature
DMG4435SSS
Document number: DS32041 Rev. 5 - 2
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OUR
C
CUR
R
T
GE CUR
RENT
DMG4435SSS
3.0
2.5
30
25
(A)
2.0
I = -1mA
D
1.5
I = -250µA
D
1.0
0.5
GS(TH)
-V , GATE THRESHOLD VOLTAGE (V) 0
-50 -25 0 25 50 75 100 125 150 T , AMBIENT TEMPERATURE (°C)
A
Fig. 7 Gate Threshold Variation vs. Ambient Temperature
10,000
1,000
C
iss
C
oss
C
rss
f = 1MHz
20
EN
15
E
T = 25°C
A
10
S
-I , S 5
0
0 0.2 0.4 0.6 0.8 1.0 1.2
-V , SOURCE-DRAIN VOLTAGE (V)
SD
Fig. 8 Diode Forward Voltage vs. Current
10,000
T = 150°C
1,000
(µA)
100
T = 125°C
T = 85°C
10
A
A
A
100
10
0 5 10 15 20 25 30
-V , DRAIN-SOURCE VOLTAGE (V)
DS
Fig. 9 Typical Total Capacitance
10
DSS
-I , LEAKA
1
0.1 0102030
-V , DRAIN-SOURCE VOLTAGE (V)
DS
Fig. 10 Typical Leakage Current vs. Drain-Source Voltage
T = 25°C
A
9
8
7
6
5
4
3
2
1
GS(TH)
V , GATE-THRESHOLD VOLTAGE (V)
0
0 5 10 15 20 25 30 35 40
Q , TOTAL GATE CHARGE (nC)
g
Fig. 11 Gate Threshold Voltage vs. Total Gate Charge
DMG4435SSS
Document number: DS32041 Rev. 5 - 2
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T
R
T T
HER
R
TANC
DMG4435SSS
1
E
D = 0.7
D = 0.5
D = 0.3
ESIS
0.1
MAL
0.01
ANSIEN
r(t),
D = 0.1
D = 0.05
D = 0.02
D = 0.01
D = 0.005
D = Sin gle Pulse
D = 0.9
R (t) = r(t) *
JA
R = 98°C/W
JA
P(pk)
t
1
t
2
T - T = P * R (t)
JA JA12
Duty Cycle, D = t /t
R
JA
0.001
0.00001 0.0001 0.001 0.01 0.1 1 10 100 1,000 t , PULSE DURATION TIME (s)
1
Fig. 12 Transient Thermal Response
Package Outline Dimensions
Please see AP02002 at http://www.diodes.com/datasheets/ap02002.pdf for latest version.
Dim Min Max
e
b
D
E1
A2
E
A1
Detail ‘A’
h
°
45
A3
A
L
0.254 Gauge Plane
Seating Plane
7°~9
°
Detail ‘A’
SO-8
A - 1.75 A1 0.10 0.20 A2 1.30 1.50 A3 0.15 0.25
b 0.3 0.5
D 4.85 4.95
E 5.90 6.10 E1 3.85 3.95
e 1.27 Typ h - 0.35 L 0.62 0.82
0 8

All Dimensions in mm
Suggested Pad Layout
Please see AP02001 at http://www.diodes.com/datasheets/ap02001.pdf for the latest version.
DMG4435SSS
Document number: DS32041 Rev. 5 - 2
X
C1
Dimensions Value (in mm)
X 0.60 Y 1.55
C2
C1 5.4 C2 1.27
Y
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DIODES INCORPORATED MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARDS TO THIS DOCUMENT, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE (AND THEIR EQUIVALENTS UNDER THE LAWS OF ANY JURISDICTION).
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This document is written in English but may be translated into multiple languages for reference. Only the English version of this document is the
final and determinative format released by Diodes Incorporated.
Diodes Incorporated products are specifically not authorized for use as critical components in life support devices or systems without the express written approval of the Chief Executive Officer of Diodes Incorporated. As used herein:
A. Life support devices or systems are devices or systems which:
1. are intended to implant into the body, or
labeling can be reasonably expected to result in significant injury to the user.
B. A critical component is any component in a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or to affect its safety or effectiveness.
Customers represent that they have all necessary expertise in the safety and regulatory ramifications of their life support devices or systems, and acknowledge and agree that they are solely responsible for all legal, regulatory and safety-related requirements concerning their products and any use of Diodes Incorporated products in such safety-critical, life support devices or systems, notwithstanding any devices- or systems-related information or support that may be provided by Diodes Incorporated. Further, Customers must fully indemnify Diodes Incorporated and its representatives against any damages arising out of the use of Diodes Incorporated products in such safety-critical, life support devices or systems.
Copyright © 2013, Diodes Incorporated
www.diodes.com
2. support or sustain life and whose failure to perform when properly used in accordance with instructions for use provided in the
IMPORTANT NOTICE
LIFE SUPPORT
DMG4435SSS
DMG4435SSS
Document number: DS32041 Rev. 5 - 2
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