Dual 1A, 1.5MHz PWM Step-down DC-DC Converter with OVP AUR9717
Data Sheet
General Description
The AUR9717 is a high efficiency step-down
DC-DC voltage converter. The chip operation is
optimized using constant frequency, peak-current
mode architecture with built-in synchronous power
MOSFET switchers and internal compensators to
reduce external part counts. It is automatically
switching between the normal PWM mode and LDO
mode to offer improved system power efficiency
covering a wide range of loading conditions.
The oscillator and timing capacitors are all built-in
providing an internal switching frequency of 1.5MHz
that allows the use of small surface mount inductors
and capacitors for portable product implementations.
Additional features including Soft Start (SS), Under
Voltage Lock Out (UVLO), Input Over Voltage
Protection (IOVP) and Thermal Shutdown Detection
(TSD) are integrated to provide reliable product
applications.
The device is available in adjustable output voltage
versions ranging from 1V to 3.3V, and is able to
deliver up to 1A.
The AUR9717 is available in WDFN-3×3-10
package.
Features
• Dual Channel High Efficiency Buck Power
Converter
Dual 1A, 1.5MHz PWM Step-down DC-DC Converter with OVP AUR9717
Absolute Maximum Ratings (Note 1)
Parameter Symbol Value Unit
Supply Input Voltage V
Enable Input Voltage V
Switch Output Voltage V
V
IN1-VIN2
Voltage (Note 2) VDF
IN1, VIN2
EN1, VEN2
LX1, VLX2
Power Dissipation (On PCB, TA=25°C) PD
Thermal Resistance (Junction to Ambient, Simulation) θJA
Thermal Resistance (Junction to Case, Simulation) θJC
Operating Junction Temperature TJ
Operating Temperature TOP
Storage Temperature T
ESD (Human Body Model) V
ESD (Machine Model) VMM
Note 1: Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to
the device. These are stress ratings only, and functional operation of the device at these or any other conditions
beyond those indicated under “Recommended Operating Conditions” is not implied. Exposure to “Absolute
Maximum Ratings” for extended periods may affect device reliability.