Diodes AF15N50 User Manual

50V N-Channel MOSFET AF15N50
Data Sheet
General Description
This N-Channel MOSFET has been designed specifically to improve the overall efficiency and to minimize switch node ringing of DC-DC converters using either synchronous or conventional switching PWM controllers. It has been optimized for low gate charge, low R diode reverse recovery performance.
The AF15N50 is available in PDFN-5×6-8 package.
, fast switching speed and body
DS(ON)
Features
Typ R
Typ R
• RoHS Compliant
=14.32m @ VGS=10V, ID=15A
DS(ON)
=16.36m @ VGS=4.5V, ID=15A
DS(ON)
Applications
Primary Switch in Isolated DC-DC
• Synchronous Rectifier
• Load Switch
Option 1 Option 2
Figure 1. Package Type of AF15N50
PDFN-5×6-8
Aug. 2013 Rev. 1. 0
BCD Semiconductor Manufacturing Limited
Data Sheet
50V N-Channel MOSFET AF15N50
Pin Configuration
DNP Package (PDFN-5×6-8)
Option 1 Option 2
Internal Structure
Figure 2. Pin Configuration of AF15N50 (Top View)
Figure 3. Internal Structure of AF15N50
Aug. 2013 Rev. 1. 0
BCD Semiconductor Manufacturing Limited
Data Sheet
50V N-Channel MOSFET AF15N50
Ordering Information
AF15N50 -
Circuit Type G1: Green
Package DNP:
PDFN-5×6-8 TR: Tape & Reel
Package Part Number Marking ID Packing Type
PDFN-5×6-8 AF15N50DNPTR-G1 15N50DNP-G1 Tape & Reel
BCD Semiconductor's Pb-free products, as designated with "G1" suffix in the part number, are RoHS compliant and green.
Absolute Maximum Ratings (Note 1)
TC=25°C, unless otherwise specified.
Parameter Symbol Value Unit
Drain to Source Voltage VDS 50 V
T
=25ºC 15
Continuous Drain Current ID
Pulsed Drain Current IDM 60 A Gate to Source Voltage VGS ±12 V Power Dissipation PD 31 W
C
TC=100ºC 15
A
Operating T em perature Range TOP -55 to 150 ºC Storage Temperature Range T
Note 1: Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “Recommended Operating Conditions” is not implied. Exposure to “Absolute Maximum Ratings” for extended periods may affect device reliability.
-55 to 150 ºC
STG
Aug. 2013 Rev. 1. 0
BCD Semiconductor Manufacturing Limited
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